EHT.

dst:
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Test Object - Device Settings

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Substation/Bay:
Substation:
Bay:

220KV HAL
ISRO 66kv LINE

Substation address:
Bay address:

Manufacturer:
Device address:

SIEMENS
DISTANCE

Number of phases:
V primary:
I primary:

3
110.00 V
1.00 A

IN / I nom:

1.000

I max:

10.00 A

Deglitch time:

0.000 s

Line angle:
CT starpoint:

75.00
dir. line

Tol T abs. -:
Tol Z abs.:

100.0 ms

5.000 %

0.930000
no

XE/XL:

0.180000

100.0 ms

CB close time:
52b%:

100.0 ms

Device:
Name/description:
Device type:
Serial/model number:
Additional info 1:
Additional info 2:

HAL-EHT 66kv LINE

7SA522
BF-0603049753

.
Nominal Values:
f nom:
V nom (secondary):
I nom (secondary):

50.000 Hz
110.00 V
1.000 A

.
Residual Voltage/Current Factors:
VLN / VN:

1.732

.
Limits:
V max:

120.00 V

.
Debounce/Deglitch Filters:
Debounce time:

0.005 s

Test Object - Distance Settings

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.
System
Parameters:
Line length:
PT connection:
Impedance
correction 1A/I nom:
Impedances in
primary values:

9.530 m
at line
no
no

Tolerances:
Tol. T rel.:
Tol. T abs. +:
Tol. Z rel.:

1.000 %
100.0 ms

100.0 m

Grounding Factor:
RE/RL:
Separate arc
resistance:

.
CB Simulation:
CB trip time:
52a%:

0.000 %

100.0 %

Zone Settings:
Label

Type

Trip time

Tol.T rel

tripping

Fault
loop
L-L

Tol.T
abs100.0 ms

Tol.Z rel

Tol.Z abs

1.000 %

Tol.T
abs+
100.0 ms

Z1

0.000 s

5.000 %

0.000 s

1.000 %

100.0 ms

100.0 ms

5.000 %

L-L

440.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

tripping

L-E

350.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

Z3

tripping

L-L

840.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

Z3

tripping

L-E

840.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

Z4

tripping

L-L

1.040 s

1.000 %

100.0 ms

100.0 ms

5.000 %

Z4

tripping

L-E

1.040 s

10.00 %

100.0 ms

100.0 ms

5.000 %

100.0
m
100.0
m
100.0
m
100.0
m
100.0
m
100.0
m
100.0
m
100.0
m

Z1

tripping

L-E

Z2

tripping

Z2

X/m
2000

1500

1000

500

-0

-500

-1000

-1500

-2000

-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Allow reduction of
ITest/VTest:
VTest:
ZS angle:
kS angle:

no

Fault inc. angle:

0.00

Max-fault time:
Time reference:

6.000 s
fault inception

Default Test Settings:

Test model:

constant test current

ITest:
ZS mag.:
kS mag.:
kS = kL:
Fault inc. mode:
DC-offset:
Pre-fault time:
Post-fault time:

2.000 A
1.000
1.000
no
random
no
1.000 s
500.0 ms

10.00 V
74.99
0.00

Test Settings
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Test Model:
Test model:
Allow reduction of
ITest/VTest:

constant test current

no

ITest

2.000 A

.
Fault Inception:
Mode:
DC-offset:

random
no

n/a

.
Times:
Pre-fault:
Post-fault:

1.000 s
500.0 ms

Max-fault:
Time reference:

6.000 s
fault inception

off
yes

Extended zones:

not active

.
Other:
CB simulation:
Switch off at zero
crossing:

Test Results
Shot Test: Fault Type L1-E
|Z|
14.80
m
43.61
m
69.22
m
100.0
m
321.3
m

Phi
75.00

t nom
0.000 s

t act
14.40 ms

Dev.
14.40 ms

ITest
2.000 A

Result
passed

75.00

0.000 s

33.60 ms

33.60 ms

2.000 A

passed

75.00

350.0 ms

433.8 ms

23.94 %

2.000 A

passed

75.00

840.0 ms

833.1 ms

-0.8214 %

2.000 A

passed

-176.93

1.040 s

1.034 s

-0.5865 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L2-E

|Z|
14.80
m
43.61
m
69.22
m
100.0
m
321.3
m

Phi
75.00

t nom
0.000 s

t act
17.00 ms

Dev.
17.00 ms

ITest
2.000 A

Result
passed

75.00

0.000 s

16.80 ms

16.80 ms

2.000 A

passed

75.00

350.0 ms

433.8 ms

23.94 %

2.000 A

passed

75.00

840.0 ms

843.5 ms

0.4167 %

2.000 A

passed

-176.93

1.040 s

1.033 s

-0.6442 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L3-E

|Z|
14.80
m
43.61
m
69.22
m
100.0
m
321.3
m

Phi
75.00

t nom
0.000 s

t act
14.80 ms

Dev.
14.80 ms

ITest
2.000 A

Result
passed

75.00

0.000 s

17.20 ms

17.20 ms

2.000 A

passed

75.00

350.0 ms

443.1 ms

26.60 %

2.000 A

passed

75.00

840.0 ms

843.9 ms

0.4643 %

2.000 A

passed

-176.93

1.040 s

1.044 s

0.3750 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L1-L2

|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
16.70 ms

Dev.
16.70 ms

ITest
2.000 A

Result
passed

75.00

440.0 ms

439.1 ms

-0.2045 %

2.000 A

passed

75.00

840.0 ms

833.8 ms

-0.7381 %

2.000 A

passed

-170.00

1.040 s

1.044 s

0.3558 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L2-L3

|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
39.00 ms

Dev.
39.00 ms

ITest
2.000 A

Result
passed

75.00

440.0 ms

443.3 ms

0.7500 %

2.000 A

passed

75.00

840.0 ms

833.6 ms

-0.7619 %

2.000 A

passed

-170.00

1.040 s

1.043 s

0.3365 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L3-L1

|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
23.90 ms

Dev.
23.90 ms

ITest
2.000 A

Result
passed

75.00

440.0 ms

433.0 ms

-1.591 %

2.000 A

passed

75.00

840.0 ms

1.484 s

76.63 %

2.000 A

passed

-170.00

1.040 s

1.044 s

0.3558 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L1-L2-L3

|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
no trip

Dev.
n/a

ITest
2.000 A

Result
passed

75.00

440.0 ms

no trip

n/a

2.000 A

passed

75.00

840.0 ms

no trip

n/a

2.000 A

passed

-170.00

1.040 s

no trip

n/a

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Details:

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Parameters:
Fault Type:
|Z|:
R:
ITest

L1-L2-L3
124.5 m
-122.6 m
2.000 A

Phi:
X:

-170.00

no trip
1.040 s
940.0 ms

Assessment:
Dev.:
t max:

passed
n/a
no trip

-21.62 m

.
Results:
t act:
t nom:
t min:

.
Fault Quantities (natural):
VL1:
VL2:
VL3:
IL1:
IL2:
IL3:
VFault:
IFault:

249.0 mV
249.0 mV
249.0 mV
2.000 A
2.000 A
2.000 A
249.0 mV
2.000 A

Fault

0.00
-120.00
120.00
170.00
50.00
290.00
0.00
170.00

V/V
75
50
25
0
0.001

-25

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

0.006

0.007

0.008

0.009

t/s

-50
-75
-100

VL1

VL2

VL3

I/A
75
50
25
0
0.001

-25

0.002

0.003

0.004

0.005

t/s

-50
-75
-100

IL1

IL2

IL3

Trip
Start
0.001

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

0.001

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

t/s

CB 52a
CB 52b
Ext. zones active

.
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Test State:
Test
passed

t/s