Om - Usm 25 en

Contents
1 Introduction ....................................... 1-1

1.1 Safety information ................................... Batteries .................................................... Software .................................................... Defects/errors and exceptional stresses .... 1.2 Important information on ultrasonic testing ..................................... Preconditions for testing with ultrasonic test equipment ........................... Operator training ........................................ Technical test requirements ....................... Limits of testing ......................................... Ultrasonic wall thickness measurement ..... Effect of the test objects material ............. Effect of temperature variations ................. Measurement of remaining wall thickness .. Ultrasonic evaluation of flaws .................... Flaw boundary method ............................... Echo display comparison method .............. 1-2 1-3 1-3 1-3 1-4 1-4 1-4 1-5 1-5 1-5 1-6 1-6 1-6 1-7 1-7 1-7
1.3 The USM 25 family ................................... 1-9 The different instrument versions ............... 1-9 Special features ........................................1-10 1.4 How to use this manual .......................... 1-11 For a quick grasp of the operating manual ...................................... 1-11 1.5 Layout and presentation in this manual ......................................... 1-12 Attention and Note symbols ......................1-12 Listings ..................................................... 1-12 Operating steps ........................................1-12
2 Standard package and accessories........................................ 2-1

2.1 Standard package .................................... 2-3 2.2 Recommended accessories .................... 2-5
Krautkramer USM 25
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Contents
3 Initial start-up ..................................... 3-1

3.1 Power supply ........................................... 3-2 Operation using the power supply unit ........ 3-2 Operation using batteries ........................... 3-3 3.2 Connecting a probe ................................. 3-5 3.3 Starting the USM 25 ................................. Switching on/off ......................................... Reset ......................................................... Information lines in the startup screen ....... 3-6 3-6 3-6 3-6
4.4 Operational concept ................................ 4-7 Setting the functions .................................. 4-7 4.5 Important basic settings .......................... 4-9 Selecting the language ............................... 4-9 Selecting units ........................................... 4-9 Setting the backlight .................................4-10
5 Operation ........................................... 5-1

5.1 Overview of the functions ........................ Function groups first operating level........... Function groups second operating level ..... Function groups third operating level .......... 5-2 5-3 5-3 5-4
4 Principles of operation ...................... 4-1

4.1 Operators controls .................................. 4-2 4.2 Screen display ......................................... 4-3 Functions on the display ............................ 4-4 Other displays ........................................... 4-5 4.3 Keys .......................................................... 4-6
5.2 Setting the gain ........................................ 5-5 V Defining the dB incrementation for gain ..................................................... 5-5 5.3 Adjusting the display range (function group BASE) ............................ 5-6 RANGE (Display range) ............................. 5-7 MTLVEL (Material velocity) ........................ 5-8
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D-DELAY (Display starting point) ............... 5-9 P-DELAY (Probe delay) ............................ 5-10 5.4 Adjusting the pulser (function group PULS) ............................5-10 DAMPING (Probe matching) .....................5-11 POWER (Intensity) ................................... 5-11 DUAL (Pulser-receiver separation) ............5-12 PRF-MOD (Pulse repetition frequency) ..... 5-12 5.5 Adjusting the receiver (function group RECV) ...........................5-13 FINE G (fine adjustment of gain) ...............5-13 dBSTEP ...................................................5-14 REJECT ...................................................5-14 FREQU (Frequency range) ........................5-15 RECTIFY (rectification) ............................. 5-15 5.6 Setting the gates (function groups aGAT and bGAT) ......... 5-16 Tasks of the gates ....................................5-16 aLOGIC / bLOGIC (Evaluation logic of the gates) ...................5-17
Krautkramer USM 25
aSTART / bSTART (Starting points of the gates) ..................... 5-18 aWIDTH / bWIDTH (Width of the gates) ..................................5-18 aTHRSH / bTHRSH (Response and measurement threshold of the gates) .............................. 5-18 5.7 Calibrating the USM 25 ........................... 5-19 Calibrating the display range ..................... 5-19 Choosing the measuring point ...................5-19 Calibration with straight- and angle-beam probes.................................... 5-20 Calibration with dual-element (TR) probes ............................................... 5-23 5.8 Measuring ................................................ 5-26 General notes ...........................................5-26 5.9 Measurement of dB difference (function group REF) .............................. 5-27
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5.10 Calculation of flaw position (function group TRIG) .............................5-30 ANGLE (angle of incidence) ......................5-31 X-VALUE (X-value of the probe) ...............5-31 THICKNE (material thickness) ..................5-32 DIAMET (outside diameter of the test object) ..........5-32 5.11 Data saving (function group MEM) .............................5-33 Storing a data set .....................................5-34 Deleting a data set ....................................5-34 Recalling a stored data set ....................... 5-35 5.12 Dataset management (function group DATA).............................5-36 TESTINF (storing additional information) ...5-37 Editing additional information ....................5-38 Storing additional information ....................5-39 PREVIEW (dataset preview) .....................5-39 DIR (dataset directory) ..............................5-40 SETTING (function list) .............................5-40
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5.13 Configuring the USM 25 for a test application ..............................................5-41 TOF (selecting the measuring point) .........5-42 S-DISP (zoomed display of reading) .........5-42 MAGNIFY (gate spreading) ....................... 5-44 A-Scan (setting the A-scan) ......................5-44 Configuring the measurement line .............5-45 Setting the display ....................................5-46 FILLED (Echo display mode) .................... 5-47 LIGHT (LCD backlight) .............................. 5-47 CONTR (LCD contrast) ............................. 5-48 SCALE (configuring the measurement line) ........... 5-48 5.14 General configuration ............................. 5-49 UNIT (Selecting units of measurement) ....5-49 DIALOG (Selecting the language) .............5-50 PRINTER (Printer for test report) .............. 5-51 COPYMOD (assignment of the Y key) ....5-51 TIME / DATE (setting the time and date) ........................5-52
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Krautkramer USM 25
Contents
HORN .......................................................5-53 ANAMOD .................................................. 5-53 EVAMOD (echo evaluation) ......................5-54 5.15 Other functions with special keys .............................................5-55 W Freeze ................................................ 5-55 X Enlarged echo display .........................5-55 5.16 Status symbols and LEDs ......................5-56 Status symbols ......................................... 5-56 LED ..........................................................5-56 5.17 Distance-amplitude curve (only USM 25 DAC and USM 25S) ........... 5-58 DACMOD (activating DAC/TCG) ...............5-59 DACECHO (recording reference curve) ..... 5-60 T-CORR (sensitivity correction) ................5-61 OFFSET (distance of multiple DAC) .........5-62 Echo evaluation with DAC.........................5-62 5.18Evaluation according to the DGS method (only USM 25S) ................. 5-63 Measuring with DGS ................................. 5-63 Selecting the DGS mode .......................... 5-64 Default settings for the DGS measurement ................................... 5-65 Recording the reference echo and displaying the DGS curve ...................5-67 Evaluation of reflectors ............................. 5-68 Transfer correction .................................... 5-69 Sound attenuation .....................................5-70 Locks, error messages ............................. 5-73 Validity of the DGS method ......................5-73
6 Documentation .................................. 6-1

6.1 Printing data ............................................. Preparing the printer ................................... Preparing the USM 25 ................................ Printing ...................................................... 6-2 6-2 6-2 6-3
6.2 Documentation with UltraDOC ................. 6-4

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Contents
7 Maintenance and care ....................... 7-1

7.1 Care .......................................................... Care of the instrument ............................... Care of NiCd batteries ................................ Charging the NiCd batteries ....................... 7-2 7-2 7-2 7-2
Other remote control codes ....................... 8-13 Control codes for the function keys ........... 8-14
9 Appendix ............................................ 9-1

9.1 Function directory ................................... 9-2 9.2 EC declaration of conformity .................. 9-6 9.3 Manufacturer/Service addresses ............. 9-7
7.2 Maintenance ............................................. 7-4
8 Interface and peripherals .................. 8-1

8.1 I/O interface .............................................. 8-2 Contact assignment of the LEMO-1B socket ....................................... 8-2 8.2 RS232 interface ........................................ 8-3 Contact assignment of the Sub-D socket ... 8-3 8.3 Data exchange .......................................... 8-4 Connecting a printer or a PC ...................... 8-4 Printing data .............................................. 8-4 8.4 Remote control ......................................... 8-5 Functions and remote control codes .......... 8-6
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10 Changes ........................................... 10-1 11 Index ................................................. 11-1 Option Data Logger .......................... O-1 Technical Specifications according to EN 12668-1 Assembly Instructions, Spare Parts List
Krautkramer USM 25
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Introduction
Krautkramer USM 25
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1-1
Introduction
Safety information
1.1 Safety information

The USM 25 has been designed and tested according to DIN EN 61 010 Part 1, March 1994, Safety requirements for electrical measuring, control and lab equipment, and was technically in perfectly safe and faultless condition when leaving the manufacturing works. In order to maintain this condition and to ensure a safe operation, you should urgently read the following safety information before putting the instrument into operation. The USM 25 can be operated with batteries or a power supply unit. The power supply unit has the electrical safety class II.
A Attention:
The USM 25 is an instrument for materials testing. Any use for medical applications or other purposes is not allowed! The USM 25 may only be used in industrial environments!
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Krautkramer USM 25
Safety information
Introduction
Batteries
The USM 25 can be operated with NiCd, AlMn or NiMH batteries or a power supply unit. Please only use the products recommended by us for the battery operation. If you want to use NiCd or NiMH batteries, you have to charge them in an external battery charger. As soon as you connect the power supply unit to the USM 25, the power supply to the batteries is interrupted. For information on how to handle the batteries, please refer to chapter 7 Maintenance and care.
Defects/errors and exceptional stresses

If you have reason to believe that a safe operation of your USM 25 is no longer possible, you have to disconnect the instrument and secure it against unintentional reconnection. Remove the batteries if necessary. A safe operation is e.g. no longer possible if the instrument shows visible damages, if the instrument no longer operates perfectly, after prolonged storage under adverse conditions (e.g. exceptional temperatures and/or especially high air humidity, or corrosive environmental conditions), after being subjected to heavy stresses during transportation.
Software
According to the current state of the art, software is never completely free from errors. Before using any software-controlled test equipment, please make sure that the required functions operate perfectly in the intended combination. If you have any questions about the use of your Krautkramer test equipment, please contact your nearest representative of Krautkramer Ultrasonic Systems.
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Introduction
Important information on ultrasonic testing
1.2 Important information on ultrasonic testing

Please read the following information before using your USM 25. It is important that you understand and observe this information to avoid any operator errors that might lead to false test results. This could result in personal injuries or damages to property.
Operator training
The operation of an ultrasonic test device requires a proper training in ultrasonic test methods. A proper training comprises for example adequate knowledge of: the theory of sound propagation the effects of sound velocity in the test material the behavior of the sound wave at interfaces between different materials the propagation of the sound beam the influence of sound attenuation in the test object and the influence of surface quality of the test object. Lack of such knowledge could lead to false test results with unforeseeable consequences. You can contact for example NDT societies or organizations in your country (DGZfP in Germany; ASNT in the USA), or also Krautkramer Ultrasonic Systems, for information concerning existing possibilities for the training of ultrasonic inspectors as well as on the qualifications and certificates that can finally be obtained.
Krautkramer USM 25
Preconditions for testing with ultrasonic test equipment

This operating manual contains essential information on how to operate your test equipment. In addition, there are a number of factors which affect the test results. A description of these factors would go beyond the scope of an operating manual. The following list therefore only mentions the three most important conditions for a safe and reliable ultrasonic inspection: the operator training the knowledge of special technical test requirements and limits the choice of appropriate test equipment.
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Introduction
Technical test requirements

Every ultrasonic test is subject to specific technical test requirements. The most important ones are: the definition of the scope of inspection the choice of the appropriate test method the consideration of material properties the determination of limits for recording and evaluation. It is the task of those with overall responsibility for testing to ensure that the inspector is fully informed about these requirements. The best basis for such information is experience with identical test objects. It is also essential that the relevant test specifications be clearly and completely understood by the inspector. Krautkramer Ultrasonic Systems regularly holds specialized training courses in the field of ultrasonic testing. The scheduled dates for these courses will be given to you on request.
Limits of testing
The information obtained from ultrasonic tests only refers to those parts of the test object which are covered by the sound beam of the probe used. Any conclusions from the tested parts to be applied to the untested parts of the test object should be made with extreme caution. Such conclusions are generally only possible in cases where extensive experience and proven methods of statistical data acquisition are available. The sound beam can be completely reflected from boundary surfaces within the test object so that flaws and reflection points lying deeper remain undetected. It is therefore important to make sure that all areas to be tested in the test object are covered by the sound beam.
Ultrasonic wall thickness measurement

All ultrasonic wall thickness measurements are based on a time-of-flight measurement. Accurate measurement results require a constant sound velocity in the
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Krautkramer USM 25
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Introduction
test object. In test objects made of steel, even with varying alloying constituents, this condition is mostly fulfilled. The variation in sound velocity is so slight that it is only of importance for high-precision measurements. In other materials, e.g. nonferrous metals or plastics, the sound velocity variations may be even larger and thus affect the measuring accuracy.
Effect of temperature variations

The sound velocity within the test object also varies as a function of the materials temperature. This can cause appreciable errors in measurements if the instrument has been calibrated on a cold reference block and is then used on a warm or hot test object. Such measurement errors can be avoided either by warming the reference block to the same temperature before calibrating, or by using a correction factor obtained from tables.
Effect of the test objects material

If the test objects material is not homogeneous, the sound may propagate at different sound velocities in different parts of the test objects. An average sound velocity should then be taken into account for the range calibration. This is achieved by means of a reference block whose sound velocity corresponds to the average sound velocity of the test object. If substantial sound velocity variations are to be expected, then the instrument calibration should be readjusted to the actual sound velocity values at shorter time intervals. Failure to do so may lead to false thickness readings.
Measurement of remaining wall thickness

The measurement of the remaining wall thickness on plant components, e.g. pipes, tanks and reaction vessels of all types which are corroded or eroded from the inside, requires a perfectly suitable gauge and special care in handling the probe. The inspectors should always be informed about the corresponding nominal wall thicknesses and the likely amount of wall thickness losses.
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Krautkramer USM 25
Introduction
Ultrasonic evaluation of flaws

In present-day test practice, there are basically two different methods of flaw evaluation: If the diameter of the sound beam is smaller than the extent of the flaw, then the beam can be used to explore the boundaries of the flaw and thus determine its area. If, however, the diameter of the sound beam is larger than the size of the flaw, the maximum echo response from the flaw must be compared with the maximum echo response from an artificial flaw provided for comparison purposes.
Echo display comparison method

The echo from a small, natural flaw is usually smaller than the echo from an artificial comparison flaw, e.g. circular disc flaw of the same size. This is due, for instance, to the roughness of the surface of a natural flaw, or to the fact that the beam does not impinge on it at right angles. If this fact is not taken into account when evaluating natural flaws, there is a danger of underestimating their magnitude. In the case of very jagged or fissured flaws, e.g. shrink holes in castings, it may be that the sound scattering occurring at the boundary surface of the flaw is so strong that no echo at all is produced. In such cases, a different evaluation method should be chosen, e.g. use of the backwall echo attenuation in the evaluation. The distance sensitivity of the flaw echo plays an important part when testing large components. Attention should be paid here to choosing artificial comparison flaws which are as far as possible governed by the same distance laws as the natural flaws to be evaluated.
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Flaw boundary method

The smaller the diameter of the probes sound beam, the more accurately the boundaries (and therefore the flaw area) can be determined by the flaw boundary method. If, however, the sound beam is relatively broad, the flaw area determined can substantially differ from the actual flaw area. Care should therefore be taken to select a probe which will give a sufficiently narrow beam at the position of the flaw.
Krautkramer USM 25
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Introduction
The ultrasonic wave is attenuated in any material. This sound attenuation is very low, e.g. in parts made of fine-grained steel, likewise in many small parts made of other materials. However, if the sound wave travels larger distances through the material, a high cumulative sound attenuation can result even with small attenuation coefficients. There is then a danger that echoes from natural flaws appear too small. For this reason, an estimate must always be made of the effects of attenuation on the evaluation result and taken into account if applicable. If the test object has a rough surface, part of the incident sound energy will be scattered at its surface and is not available for the test. The larger this initial scattering, the smaller the flaw echoes appear, and the more errors occur in the evaluation result. It is therefore important to take the effect of the test objects surfaces on the height of the echo into account (transfer correction).
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Krautkramer USM 25
The USM 25 family
Introduction
1.3 The USM 25 family

The USM 25 is a lightweight and compact ultrasonic flaw detector especially suitable for locating and evaluating material defects measuring wall thicknesses saving and documenting test results. With its frequency range from 0.5 to 20 MHz and a maximum calibration range of 10 m (steel), the USM 25 is designed for use on large workpieces and in highresolution measurements.
The different instrument versions

The USM 25 is available in several versions which are desgined for different applications: USM 25 Standard version for universal ultrasonic test applications. USM 25 DAC The multiple DAC curves enable a field-oriented display evaluation according to international test specifications. USM 25S Either DAC/TCG or DGS evaluation mode. DGS curves are stored for all narrow-band singleelement probes; amplitude evaluation is carried out either in dB above DAC curve or equivalent reflector size (ERS). Data Logger option This option is available for all USM 25 versions and is used for the recording and documentation of thickness readings.
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Introduction
Special features
Special features
low weight (1.6 kg including batteries) and compact size handy equipped with a non-slip, ratcheting prop-up stand, also used as handle rotary knobs for direct adjustment of gain as well as for changing the currently selected function two independant gates for accurate wall thickness measurements from the workpiece surface up to the first echo, or between two backwall echoes, including measurement on coated workpieces with a resolution of 0.01 mm (up to 100 mm), referred to steel Magnify gate: spreading of the gate range over the entire screen width fast, high-contrast LCD to display the digitized echo signals (320 240 pixels, 96 72 mm) data memory: 200 data sets, including alphanumeric description, documentation possibility via a printer increased calibration range: up to 9999 mm (steel), depending on the frequency range semiautomatic two point calibration
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pulse repetition frequency variable in ten steps to avoid phantom echoes when testing large workpieces choice of frequency range for the connected probe. signal display mode: full-wave rectification, positive half-wave or negative halv-wave and radio frequency display of 4 readings plus 1 reading zoomed in the A-scan, user-configurable
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Krautkramer USM 25
How to use this manual
Introduction
The Data Logger option, which can be applied to all USM 25 versions, is described in a chapter of its own at the end of the operating manual. All functions referring to the Data Logger and the tolerance monitor are described here. At the same time, the standard operating manual applies to all other functions.
1.4 How to use this manual

For a quick grasp of the operating manual
Before operating the USM 25 for the first time, it is absolutely necessary that you read the chapters 1, 3 and 4 of this manual. They will inform you about the necessary preparations of the instrument, give you a description of all keys and screen displays, and explain the operating principle. In doing this, you will avoid any errors or failures of the instrument and be able to use the full range of instrument functions. You will find the latest changes to this operating manual in chapter 10 Changes. It describes corrections that have become necessary at short notice and have not yet been included in the general manual. If no corrections have become necessary, this chapter is empty. The specifications / Technical Specifications according to EN 12668-1 for the USM 25 family can be found in the attachment at the end of this operating manual.
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Introduction
Layout and presentation in this manual
1.5 Layout and presentation in this manual

To make it easier for you to use this manual, all operating steps, notes, etc., are always presented in the same way. This will help you find individual pieces of information quickly.
Listings
Listings are presented in the following form: Variant A Variant B ...
Attention and Note symbols
Operating steps
Operating steps appear as shown in the following example: Loosen the two screws at the bottom. Remove the cover. ...
A Attention:
The Attention symbol indicates peculiarities and special aspects in the operation which could affect the accuracy of the results. H Note: Note contains e.g. references to other chapters or special recommendations for a function.
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Krautkramer USM 25
Standard package and accessories
Krautkramer USM 25
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2-1
Scope of supply and accessories

This chapter informs you about the standard package and the accessories available for the USM 25. It describes accessories included in the standard package, recommended accessories
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Krautkramer USM 25
Standard package
2.1 Standard package

Product code Description Ultrasonic testing kit consisting of: USM 25 Compact Ultrasonic Flaw Detector, basic version with Lemo connectors or with BNC connectors or Compact Ultrasonic Flaw Detector, DAC version with Lemo connectors or with BNC connectors or Compact Ultrasonic Flaw Detector, DA/TCGC and DGS evaluation with LEMO connectors or with BNC connectors Transport case Plug-in power supply unit
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Order number
35 050 35 052
USM 25 DAC
35 049 35 051
USM 25S
35 054 35 053 34 913 18 348

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UM 20

Product code Description Operating manual in German or operating manual in English
Standard package
Order number 28 661 28 662
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Krautkramer USM 25
Recommended accessories
2.2 Recommended accessories

Product code UM 23 NCA 1-4 Description NiMH battery pack 4 NiCd cells Quick charger for external charging of the NiCds UM 21 UM 22 UM 25 UD 20 UD 31 UD 30 UD 32 Transport case for instrument and accessories Weatherproof protection with neckstrap Lemo plug (8 pin) with open ended cable PC cable, 25-pin (PC), 9-pin (instrument) PC cable, 9-pin (PC), 9-pin (instrument) Seiko Printer cable, 9-pin (instrument) / 9-pin (printer) Epson Printer cable, 9-pin (instrument) / 25-pin (printer) Adapter 25/9-pin for printer cable UD 19-1 on USM 25 UM 27 DL
Krautkramer USM 25
Order number 25 274 34 910 18 673 25 255 35 254 35 268 32 291 34 943 18 495 34 944 16 121 35 455
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Option: Data Logger (retrofittable to all versions)

Issue 07, 07/2003

Product code Epson LX Seiko DPU UM 200 W PZ-USM Description
Recommended accessories
Order number
Matrix printer for mains operation, single sheet and continuous stationary Thermal printer for mains and battery operation UltraDOC data communication software for USM Test certificate according to EN 12668-1
17 995 17 993 35 024 35 263
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Krautkramer USM 25
Initial start-up
Krautkramer USM 25
Issue 07, 07/2003
3-1
Initial start-up
Power supply
3.1 Power supply

The USM 25 can be operated with a plug-in power supply unit or with batteries. You can connect the USM 25 to the mains supply system even if it carries batteries. The battery power is then automatically interrupted.
Connecting the instrument Use the corresponding power supply unit to connect the USM 25 to the mains socket-outlet. The socket-contact is at the top left of the USM 25.
Operation using the power supply unit

Power pack adaptor The power supply unit is delivered with two different plug adaptors - for Euro and USA standard. If the adaptor plugged in your power supply unit does not correspond to your plug connector standard, you can exchange it. To do this, just pull out the attached adaptor and replace it with the required one. H Note: You should exchange the plug adaptor only once because the plug-in power supply unit is not meant for frequent changing.
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The power supply unit is automatically set to any nominal voltage between 100 VAC and 240 VAC.
A Attention:
Always press the U key in order to switch the instrument off correctly. If power is interrupted (battery
Krautkramer USM 25
Issue 07, 07/2003
Power supply
Initial start-up
Insert the four C-size cells one by one into the battery compartment, with the positive pole to the left. Notice the information on the instrument back. After that, close the battery compartment by tightening the Bayonet lock up to the limit stop again. Charge indicator The measurement line of the USM 25 indicates an inverted B if the battery voltage is too low. H Note: If the symbol for low battery voltage appears, you should urgently end your test job and exchange the batteries. Please take spare batteries with you if you aim to carry out measurements on site. Charging NiCd or NiMH batteries NiMH batteries can be charged in the instrument (using the NiMH battery pack UM 23) or using an external battery charger (single NiCd or NiMH batteries). open closed
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compartment cover open, mains plug pulled) the instrument will not correctly switch off, therefore the last A-scan will remain on the display for about 10 minutes.
Operation using batteries

Please only use the products recommended by us for the battery operation. Inserting batteries The battery compartment is located at the bottom of the instrument; the opening with the Bayonet lock cap is on the right. Loosen the Bayonet lock. Half a quarter turn of the lock is enogh to open or close it.
Krautkramer USM 25
Initial start-up
Internal charging H Note: Internal charging option will be available for instruments from serial number 2501. Requirements: NiMH battery pack, product code UM 23 Plug-in power supply unit Operation: A check is made at each charging start to find out whether a battery pack has been inserted or not. If not, the three LEDs on the USM 25 (A, R, D) flash at a slow pace. If the battery pack UM 23 is in the instrument, charging will start automatically: with the instrument turned off if you connect the plug-in power supply unit with the plug-in power supply unit connected if you turn the instrument off During charging, the three LEDs are constantly lit. On
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Power supply
completion of the charging process, the three LEDs flash at a quick pace. Carging time: The charging time is < 3 hours at an ambient temperature ranging from 25 C to 30 C. Please note that the batteries are not recharged to their full capacity at higher temperatures. Interruption of charging: 1. Normal case: monitoring after gradual temperature rise 2. Safety precaution: Interruption at an excess temperature (approx. 50 C) 3. Saftey precaution: Interruption approx. 6 hours after charging start. After each interruption of charging, the timer is restarted. H Note: If the USM 25 is turned on during the charging process, charging is interrupted and the timer is reset. The temperature monitoring is maintained.
Krautkramer USM 25
Issue 07, 07/2003
Connecting a probe
Initial start-up
If this is not taken into account, the consequence would be a mismatching which may lead to considerable power losses or even to echo waveform distortions. Receiver Transmitter
3.2 Connecting a probe

To prepare the USM 25 for operation, you have to connect a probe to it. Any Krautkramer probe can be used for the USM 25, provided the appropriate cable is available and the operating frequency is within an adequate range. The USM 25 is available with the probe connectors LEMO 1 or BNC. The probe is connected to the sockets at the top right on the instrument casing. Both connector sockets are equally suitable (connected in parallel) for connecting probes equipped with only one ultrasonic element (ultrasonic transducer) so that it does not matter which one of the two sockets is used. When connecting a dual-element (TR) probe (having one transmitter element and one receiver element), or two probes (of which one is transmitting and the other one receiving), attention should be paid to connecting the transmitter element to the right-hand socket (transmitter, marked with black circle at the rear of the instrument case) and the receiver element to the lefthand socket (receiver, marked with red circle).
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Initial start-up
Starting the USM 25
3.3 Starting the USM 25

Switching on/off
To start the USM 25, press the switch-on key U. The start display of the USM 25 appears; here you will also see the current software version of the instrument. The instrument carries out a self-check and then switches over to stand-by mode. The settings of all function values and the basic settings (language and units) are the same as before switching-on of the instrument. H Note: The LCD contrast is always set to the medium value CONTR = 50 after switch-on. If another value is already required during the switch-on, e.g. because of a higher or lower ambient temperature, press one of the five function group keys u while pressing the switch-on key U. CONTR = 10 u 30 u 50 u 70 u 90 u
Reset
If any functions can no longer be operated after a warm start, or if you want to reset the instrument to the basic setup, then you should carry out a cold start by simultaneously pressing the Y and the U key. The cold start message Basic Initialization is displayed. The instrument is initialized and reset to its basic setup (dialog language: English, for more details on how to select the language, please refer to chapter 4).
A Attention:
All saved data are deleted.
Information lines in the startup screen

You can enter two lines (each with up to 39 characters) for information purposes in the startup screen. For this use the remote function (codes I1 and I2, refer to chapter 8.4).
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Krautkramer USM 25
Principles of operation
Krautkramer USM 25
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4-1
Operators controls
4.1 Operators controls

Special keys for special instrument functions
LED A: Gate alarm R: Rejection D: Dual on
Keys for selecting a function
Rotary knob for direct gain setting
Rotary knob for direct setting of the current function
Key for changing the operation level
On/Off key
Keys for selecting a function group
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Krautkramer USM 25
Screen display
4.2 Screen display

The USM 25 has a digital screen for the display of A-scan in the normal mode
A-scan in the zoom mode The zoom mode is activated using the X-key.
The screen display always shows the gain and the adjusted dB step value. All other functions are locked.
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Functions on the display
Functions on the display

The names of the five function groups are displayed at the bottom of the screen. The currently selected function group is highlighted.
Indicated at the right of the display, next to the A-scan, are the functions of the corresponding function group. The display of the functions disappears in the zoom mode.
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Other displays
Other displays
A line below the screen display indicates settings and readings as well as status symbols.
H Note: Every measurement value can also be shown in an enlarged display at the top right corner of the A-scan (setting in the function group MEAS, function S-DISP).
H Note: You can configure the four positions of the measurement line for set and measured values as required (function group MSEL). Please refer to chapter 5.12, section Configuring the measurement line on this subject.
Amplitude height Gate A (%)t
Amplitude height Gate B (%)
Status indicator: TOF = Flank
Sound path Gate A
Sound path Gate B
Example of a measurement line

Keys
4.3 Keys
Function keys for changing between operation levels (below), for selection of the function groups (below) and for selection of the functions (right). Special keys for direct activation of particularly important instrument functions: Key Function Step size for gain setting Storage (freezing) of screen display Enlarged echo display over the entire screen Printing/transferring data Switching instrument on/off
Issue 07, 07/2003 Krautkramer USM 25
V dB-step W Freeze X Zoom Y Copy U On/Off

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Operational concept
4.4 Operational concept

The USM 25 is an easy-to-use instrument. It has three operating levels, and you can change between them by pressing the E key. You will recognize your currently active operating level by the number on the separation line between the first and the second function group. If the instrument is equipped with the Data Logger option, a fourth operating level is added to the existing ones. Each operating level contains five function groups. First operating level
Setting the functions

Shown below the A-scan are five function groups that you can directly select using the corresponding u-key. The selected function group is highlighted and the corresponding four functions are displayed next to the A-scan on the right. You can likewise directly select the individual functions using the corresponding v-keys. Coarse and fine adjustment of functions You can choose between coarse and fine adjustment for some functions. You can toggle between these two adjustment modes by pressing the corresponding v-key several times. The fine adjustment is identified by an asterisk preceding the function value. The following functions offer a choice between coarse and fine adjustment:
Second operating level
Third operating level
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Function RANGE MTLVEL D-DELAY aSTART aWIDTH bWIDTH S-REF1 S-REF2 ANGLE THICKNE Function group BASE BASE BASE aGAT aGAT bGAT CAL CAL TRIG TRIG
Operational concept
Rotary knobs for function adjustment In addition, the USM 25 is equipped with two rotary knobs. You can use the left-hand rotary knob to directly adjust the gain; use the right-hand rotary knob to adjust the current function selected. The rotary knobs also enable an accelerated adjustment. You can make an adjustment step by step by slightly turning the rotary knob, it will lock into place with the next adjustment. In the case of functions having a larger adjustment range, you can quickly bridge major differences between values by turning the rotary knob correspondingly faster.
For more details on the adjustment possibilities, please read from page 5-5 onward.
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Important basic settings
Operation: Use E to change over to the third operating level.
4.5 Important basic settings

Selecting the language
Select the language in which the function names should be displayed on the screen in the function DIALOG (Function group CFG1). The following languages are available: German English (default setting) French Italian Spanish Portuguese Dutch Swedish Slovenian Romanian Finnish Czech Danish Hungarian Croatian Russian Slovakian Norwegian Polish
Use u to select the function group CFG1 and v to select the function DIALOG. Select the required language by means of the righthand rotary knob.
Selecting units
In the function UNIT (function group CFG1) you can choose your favorite units between mm or inch. Operation: Use E to change over to the third operating level. Use u to select the function group CFG1 and then use v to select the function UNIT Set the required unit by means of the right-hand rotary knob.
H Note: More dialog languages can be added on request.

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A Attention:
Select your units immediately when you start working with the USM 25 because if you change the unit, all current settings are deleted, and the basic setup is loaded again. In order not to delete anything by accident, a safety prompt is displayed in the measurement line: Change unit? If you are sure that you want to change the unit, press the v key belonging to the function UNIT one more time. The unit is now changed, the current data are deleted. If you want to abort the process, press any other key. The previous setting is kept in that case.
Setting the backlight

You can switch the backlight for the display on and off in the function LIGHT (function group LCD). Apart from this, you can also use a simple key combination to witch it on and off. H Note: The operating time is reduced by 25 to 30 % with the backlight switched on in battery operation! You should therefore ensure that the light is always switched off when not needed. Operation: Use E to change over to the third operating level. Use u to select the function group LCD and then use v to select the function LIGHT. Use the right-hand rotary knob to switch the backlight on or off.
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H Note: The higher the ambient temperature, the lower you have to set the contrast. With extremely intense sunlight, the screen display is inverted. You can now set the display using the contrast setting so that you will see the A-scan as well as all functions and values appearing white against a black background. The screen inversion with high ambient temperatures is typical of LCD displays. The effect vanishes at normal temperatures and is no risk to the screen.
Or: Press the two keys u + u on the left both at the same time in order to switch the backlight on and off:
Press both keys
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Operation
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5-1
Operation
Overview of the functions
5.1 Overview of the functions

The functions of the USM 25 are combined to form function groups on two operating levels. Press the E key to change between the two operating levels. Press the u key to select the function group shown above it. Press the v key to select the function shown next to it. The setting of the selected function is carried out via the right-hand rotary knob. The Gain function is always directly available via the left-hand rotary knob. You can carry out important functions (switch on/off, dB-step, freeze, zoom and report printout) by pressing the special keys (ref. chapter 4). You will also find an overview of the function groups and their functions on the fold-out page. Each operating level contains five function groups.You will recognize your currently active operating level by the number on the separation line between the first and the second function group. First operating level
Second operating level
Third operating level
H Note: If the instrument is equipped with the Data Logger option, a fourth operating level is added. For this, refer to the corresponding chapter Option Data Logger.
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Operation
Function groups first operating level

BASE The functions that you find here are required for the basic adjustment of the screen displays. Combined in this group are the functions that serve for the adjustment of pulser. Combined in this group are the functions that serve for the adjustment of receiver. All functions for setting the gate A can be found in this group. All functions for setting the gate B can be found in this group.
Function groups second operating level

CAL This function group makes functions for the semiautomatic calibration available to you. This function group serves for measuring the dB difference between a reference echo and the reflector echo. This is the function group where you can set the functions for the DAC (only USM 25 DAC and USM 25S). This function group serves for the amplitude evaluation according to the DGS method (only USM 25S). Combined in this group are the functions required for angle beaming using anglebeam probes for the display of a (reduced) projection distance and depth position of a reflector (for plane-parallel and circular curved test components).
PULS RECV aGAT bGAT
REF
DAC
DGS
TRIG
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Operation
MEM DATA These functions serve for storing, loading and deleting of data sets. The functions of this group serve for the dataset management and documentation.
Function groups third operating level

MEAS In this group, you can define the measuring point, select a parameter for the zoomed measured-value display in the A-scan as well as for the setting of the Magnify function, and you can select different settings for the A-scan. This is where you configure your measurement line. You can choose one display for each of the four positions. This is the function group where you can set the LCD contrast and backlight as well as the echo display mode on the screen. Functions for the configuration: unit, dialog language, printer driver and assignment of the Y key. Other functions for configuration: time and date, alarm horn; plus the changeover between the evaluation modes
MSEL
LCD
CFG1
CFG2
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Setting the gain
Operation
5.2 Setting the gain

This function, operated via the left-hand rotary knob, enables you to quickly and directly set the gain. You can use the gain to adjust the required sensitivity in order to control the echo amplitudes. Operation: Turn the left-hand rotary knob to set the gain. The current gain is indicated in the top left corner of the screen. H Note: The setting 0.0 dB locks the gain in this way preventing any accidental change of setting. You can determine the step size of the sixth step using the function dBSTEP in the function group RECV. Operation: You can use the V-key to select a certain incrementation for setting the gain. You have a choice between 6 steps: Press V to change between the six steps. The corresponding step size setting is indicated below the current gain on the screen. 0.0 dB (locked) 0.5 dB 1.0 dB 2.0 dB 6.0 dB 12.0 dB
V Defining the dB incrementation for gain
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Operation
Adjusting the display range (function group BASE)
5.3 Adjusting the display range (function group BASE)

The function group BASE enables you to make the basic adjustment of the display range. If required, use E to change the operating level. Use u to select the function group BASE.
The display on the screen must be adjusted for the material to be tested (function MTLVEL) and for the probe used (function P-DELAY). In addition, you must choose the range for your measurement and the display start point. H Note: In order to accurately adjust the material velocity and the probe delay, please read the section Calibrating the USM 25, chapter 5.7, beforehand.
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Operation
Fine adjustment: up to 99.9 mm in steps of 0.1 mm up to 999 mm in steps of 1 mm up to 9999 mm in steps of 10 mm Operation: Use v to select the function RANGE and adjust the required value by means of the right-hand rotary knob. Toggle between coarse and fine adjustment by repeatedly pressing v. The function value is always marked with an asterisk in the fine adjustment. H Note: The range limits are also dependent on the set sound velocities (function MTVEL): with small values for c, the range limits are shifted downwards, with large values upwards.
RANGE (Display range)

You can adjust the range for your measurement in RANGE. H Note: The adjustment range for the display range depends on the frequency range setting (function FREQU). Frequency range 0.2 to 1 MHz 0.5 to 4 MHz 0.8 to 8 MHz 2 to 20 MHz Adjustment range (c = 5920 m/s) 0.5 to 9999 mm / 0.02 to 390 0.5 to 9999 mm / 0.02 to 390 0.5 to 1420 mm / 0.02 to 50 0.5 to 1420 mm / 0.02 to 50
You can select between coarse and fine adjustment of the values. Coarse adjustment: from 0.5 mm to 1400 (9999) mm in even steps
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Operation
MTLVEL (Material velocity)

In MTLVEL, you can set the sound velocity in the test object. You can select one of two predefined fixed values, or you can continuously vary the value. Adjustment range: 1000 - 15000 m/s 40 - 600 /ms You can choose between coarse and fine adjustment of the values. Coarse adjustment: in steps as follows (m/s): 15000 14000 13000 12000 11000 10000 9000 8000 7000 6320 6000 5920 5000 4000 3250 3130 3000 2730 2000 1600 1450 1000
Operation: Use v to select the function MTLVEL and adjust the required value by means of the right-hand rotary knob. Toggle between coarse and fine adjustment by repeatedly pressing v. The function value is always marked with an asterisk in the fine adjustment.
A Attention:
Always ensure that the function MTLVEL is correctly set. The USM 25 calculates all range and distance indications on the basis of the value adjusted here.
Fine adjustment: in steps of 1 m/s (0.1 /ms)
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Operation
up to 9.999 in steps of 0.001 from 10 in steps of 0.01 Operation: Use v to select the function D-DELAY and adjust the value for the display starting point by means of the right-hand rotary knob. Toggle between coarse and fine adjustment by repeatedly pressing v. The function value is marked with an asterisk in the fine adjustment.
D-DELAY (Display starting point)

In D-DELAY you can choose whether to display the adjusted range (for example 250 mm) starting from the surface of the test object, or in a section of the test object starting at a later point. This allows you to shift the complete screen display and consequently also the display zero. If the display should for example start from the surface of the test object, the value in D-DELAY must be set to 0. Adjustment range: -10 mm to +1024 mm -0.3 to +40 You can choose between coarse and fine adjustment of the values. Coarse adjustment: -10 mm to +1024 mm / -0.3 to +40 in even steps Fine adjustment: up to 99.9 mm in steps of 0.01 mm up to 1024 mm in steps of 0.1 mm /
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Operation
Adjusting the pulser (function group PULS)
P-DELAY (Probe delay)

Every probe has a delay line between the transducer element and the coupling face. This means that the initial pulse must first pass through this delay line before the sound wave can enter the test object. You can compensate for this influence of the delay line in the function P-DELAY. Operation: Use v to select the function P-DELAY and adjust the value for the probe delay by means of the righthand rotary knob. H Note: If the value for P-DELAY is not known, read the section Calibrating the USM 25, chapter 5.7, in order to determine this value.
5.4 Adjusting the pulser (function group PULS)

You will find all functions for the adjustment of the pulser in the function group PULS. If required, use E to change the operating level. Use u to select the function group PULS.
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Operation
DAMPING (Probe matching)

This function serves for matching the probe. You can use it to adjust the damping of the probes oscillating circuit and to consequently change the height, width and resolution of the echo display. You can choose between the settings high and low. The setting low has a lower damping effect and produces higher and broader echoes, the setting high reduces the echo height but mostly also produces narrow echoes with higher resolution. Operation: Use v to select the function DAMPING and set the required value by means of the right-hand rotary knob.
POWER (Intensity)
The function POWER allows you to adjust the intensity of the initial pulse. Choose low if you need a higher resolution and high if you are mainly interested in the penetration (with large components). Operation: Use v to select the function POWER and set the required value by means of the right-hand rotary knob.
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Operation
DUAL (Pulser-receiver separation)

You can activate the pulser-receiver separation in the function DUAL. This function must be set to off in pulse-echo mode using a single-element probe. Set the function to on if you intend to work in through-transmission mode or with a dual-element (TR) probe. Operation: Use v to select the function DUAL and set the function to on or off by means of the right-hand rotary knob. The LED D (Dual) is lit with active DUAL function.
PRF-MOD (Pulse repetition frequency)

The pulse repetition frequency indicates the number of times an initial pulse is triggered per second. You can determine whether you need the highest possible PRF value, or whether you are satisfied with a low value. You have 10 steps available for the setting; step 1 means the lowest PRF value. The larger your workpiece, the smaller PRF values are needed in order to avoid phantom echoes. In the case of smaller PRF values, however, the A-scan update rate becomes lower; for this reason, high values are required if a workpiece should be scanned fast. The best way to determine the suitable PRF value is by experimenting: start from the highest step and reduce the value until there are no more phantom echoes. Operation: Use v to select the function PRF-MOD and adjust the required value by means of the right-hand rotary knob.
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Adjusting the receiver (function group RECV)
Operation
5.5 Adjusting the receiver (function group RECV)

You will find all functions for the adjustment of the pulser in the function group RECV. If required, use E to change the operating level. Use u to select the function group RECV.
FINE G (fine adjustment of gain)

This function serves for the fine adjustment of the current gain value. The fine adjustment is possible over a range of 40 steps within the range of approx. 4 dB. The displayed gain value will not change. Adjustment range: -10 to +30 Operation: The function FINE G / dBSTEP has a double assignment (icon >). Toggle between the two functions by repeatedly pressing the corresponding key v. Use v to select the function FINE G, and then use the right-hand rotary knob to adjust the value for the fine gain.
H Note: Double assignment of the function FINE G / dBSTEP. For operation (changeover), please see the operation of the corresponding function.
Operation
dBSTEP
Use this function to set a step size for the gain variation by means of the key V. The value set here is subsequently available to you as the sixth step for the stepwise gain variation. You have a free choice of the value within the setting range. Operation: Setting range: 6.5 to 20 dB The function FINE G / dBSTEP has a double assignment (icon >). Toggle between the two functions by repeatedly pressing the corresponding key v. Use v to select the function dBSTEP and set the value for the gain by means of the right-hand rotary knob.
REJECT
The function REJECT allows you to suppress unwanted echo indications, for example structural noise from your test object. The % screen height setting indicates the minimum height that the echoes should attain in order for them to be displayed on the screen at all. The Reject setting cannot be higher than the lowest threshold setting (minus 1 %) of any gate. Operation: Use v to select the function REJECT and set the required percentage value by means of the right-hand rotary knob.
A Attention:
You should handle this function with great caution, as it may of course happen that you suppress echoes from flaws as well. Many test specifications expressly forbid using the Reject function. The LED R is therefore lit with active REJECT function.
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Operation
FREQU (Frequency range)

In this function, you can adjust the operating frequency according to the frequency of your probe. You have a choice between four frequency ranges: 0.2 1 MHz 0.5 4 MHz 0.8 8 MHz 2 20 MHz Operation: Use v to select the function FREQU and adjust the required value by means of the right-hand rotary knob.
RECTIFY (rectification)
You can select the rectification mode of the echo pulses according to your application in the function RECTIFY. You have the following options to choose from: full-w (= full-wave) All half-waves are displayed above the baseline. pos hw (= positive half-wave) Only positive halfwaves are displayed. neg hw (= negative half-wave) Only negative halfwaves are displayed. rf (= radio frequency). Only applies to the display range up to 50 mm (steel). Operation: Use v to select the function RECTIFY, and then use the right-hand rotary knob to adjust the required setting.
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Operation
Setting the gates (function groups aGAT and bGAT)
5.6 Setting the gates (function groups aGAT and bGAT)

All functions for setting the (dual) gate are arranged in the function group aGAT and bGAT. If required, use E to change the operating level. Use u to select the function group aGAT or bGAT.
H Note: If you have an instrument equipped with the Data Logger option at your disposal, youll be additionally able to use the C gate including all corresponding functions.
Tasks of the gates

It monitors the range of the test object where you expect to detect a flaw. If an echo exceeds or falls below the gate, an alarm signal is output via the LED A. H Note: Error alarms can be triggered unter certain circumstances. These are caused by intermediate conditions in instrument operation occuring when the instrumet is used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored.
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Operation
neg Anticoincidence The alarm (LED A) is on if the preset response threshold of the gate is not reached within the displayed range. a trig Triggering by interface echo When using gate A as echo-start gate (setting of the evaluation logic for gate B) Operation:
The gates A and B are independant of one another. Gate A can also have the function of an echo-start gate. The gate chooses the echo for the digital time-offlight or amplitude measurement. The measured value is indicated in the measurement line.
aLOGIC / bLOGIC (Evaluation logic of the gates)

This function allows you to choose the method for triggering the gate alarm. The alarm is output to the LED A on the front panel of the USM 25. There are four setting options available: off Evaluation logic off The alarm and measurement capability are switched off. The gate is not visible. pos Coincidence The alarm (LED A) is on if the preset response threshold of the gate is exceeded within the displayed range.
Krautkramer USM 25
Use v to select the function aLOGIC or bLOGIC and set the required alarm logic by means of the right-hand rotary knob. Then determine the position of the gate. This is defined by means of three parameters:
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Operation
aSTART / bSTART (Starting points of the gates)

You can fix the starting point of the gates A or B within the adjustment range of 0 to max. 9999 mm / 250. Use v to select the function aSTART or bSTART, and then use the right-hand rotary knob to adjust the required setting.
aTHRSH / bTHRSH (Response and measurement threshold of the gates)

You can determine the threshold value of the gates within the range of 10 to 90 % screen height for triggering the LED alarm if this value is exceeded or not reached, depending on the setting of the aLOGIC function. In the RF mode, the threshold can be additionally set from -90 % to -10 %. Operation: Select the function aTHRSH or bTHRSH usting the corresponding v-key and by set the required value using the right-hand rotary knob.
aWIDTH / bWIDTH (Width of the gates)

You can determine the gate width within the range of 0.2 to 9999 mm / 0.008 to 250 . Use v to select the function aWIDTH or bWIDTH, and then use the right-hand rotary knob to adjust the required value. H Note: The alarm and measurement function of the gates is only active within the display range.
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Krautkramer USM 25
Calibrating the USM 25
Operation
5.7 Calibrating the USM 25

Calibrating the display range
Before working with the USM 25, you have to calibrate the instrument: you have to adjust the material velocity and display range and allow for the probe delay depending on the material and dimensions of the test object. To ensure a safe and proper operation of the USM 25, it is necessary that the operator be adequately trained in the field of ultrasonic testing technology. Below you will find some examples of common calibration methods for certain test tasks. In addition, the USM 25 has a semiautomatic calibration function which is described as Case B: With unknown material velocity.
Choosing the measuring point

The sound path measurement in the calibration process or in the subsequent echo evaluation process depends on the choice of the measuring point which can be set either to flank or to peak in the USM 25. In principle, the peak measurement should be preferred because the measured distances do not depend on the echo height in that case. However, there are application cases in which the flank measurement is either specified, or it must be applied for technical reasons, e.g. in many tests using dual-element (TR) probes.
A Attention:
In any case, the setting of the measuring point must always be identical for the calibration and for the subsequent test application. Otherwise measurement errors might occur.
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Operation
Calibration with straight- and angle-beam probes

Case A: With known material velocity Calibration process Set the known material velocity in MTLVEL (function group BASE). Couple the probe to the calibration block. Set the required display range in RANGE (function group BASE). The calibration echo must be displayed on the screen. Position the gate on one of the calibration echoes until the sound path of the echo is indicated in the measurement line. After this, change the adjustment of the function P-DELAY (function group BASE) until the correct sound path for the selected calibration echo is indicated in the measurement line.
Example: You are carrying out the calibration for the calibration range of 100 mm / 5 via the function group BASE using the calibration block V1 (thickness 25 mm/1 ) which is laid flatwise. Set RANGE to 100 mm/5. Set the known material velocity of 5920 m/s (233 /ms) in MTLVEL. Set the gate so that it is positioned on the first calibration echo (from 25 mm/1). Read the sound path in the measurement line. If this value is not equal to 25 mm/1, change the adjustment for the function P-DELAY until it is at 25 mm/1. This completes the calibration of the USM 25 to the material velocity of 5920 m/s (233 /ms) with a calibration range of 100 mm / 5 for the probe used.
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Operation
Calibration process Set the required display range in RANGE (function group BASE). The two calibraion echoes selected must be displayed on the screen. Set the range so that the second calibration echo is located on the right edge of the screen. Select the function group CAL using u. Enter the distances of the two calibation echoes in S-REF1 and S-REF2. Position the gate (function aSTART) on the first calibration echo. Press Y to record the first calibration echo.
Case B: With unknown material velocity Use the semiautomatic calibration function of the USM 25 via the function group CAL for this calibration case.
The distances between 2 calibration echoes must be entered as default data. The USM 25 will then carry out a plausibility check, calculate the material velocity and the probe delay, and automatically set the parameters.
The recording of the first calibration echo is confirmed by the message Echo is recorded, and the function CAL indicates the value 1. Move the gate to the second calibration echo. Press Y to record the second calibration echo. The correct calibration is confirmed by the message Calibration is done. The material velocity and probe
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Operation
delay are calculated and set. The value of the CAL function goes back to 0. H Note: If the instrument is not able to carry out any valid calibration on the basis of the input values and the echoes recorded, a corresponding error message is displayed. In that case, please check the values of your calibration lines and repeat the process of recording the calibration echoes. Example
Position the gate on the first calibration echo. Press Y to record the first calibration echo.
Position the gate on the second calibration echo: Enter the distances (thicknesses) of the two calibration lines S-REF1 (20 mm) and S-REF2 (40 mm).
Press Y.
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Operation
The second echo is stored, the calibration is carried out, and the CAL function is reset to 0. The valid calibration is briefly confirmed and carried out. If you select the function group BASE, you can read the material velocity and probe delay.
Calibration with dual-element (TR) probes

Dual-element (TR) probes are especially used for wall thickness measurement. The following peculiarities must be taken into account when using these probes: Echo flank Most dual-element (TR) probes have a roof angle (transducer elements with inclined orientation toward the test surface). This causes mode conversions both at beam index (sound entry into the material) and at the reflection from the backwall, which can result in very jagged echoes. V-path error Dual-element (TR) probes produce a v-shaped sound path from the pulser via the reflection from the backwall to the receiver element. This so-called V-path error affects the measuring accuracy. You should therefore choose two wall thicknesses that cover the expected thickness measurement range for the calibration. In this way, the V-path error can be corrected to the greatest possible extent.
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Operation
Higher material velocity Due to the V-path error, a higher material velocity than that of the test material is given during calibration, especially with small thicknesses. This is typical of dual-element (TR) probes and serves for compensation of the V-path error. With small wall thicknesses, the above-described effect leads to an echo amplitude drop which has to be especially taken into account with thicknesses less than 2 mm / 0.08. A stepped reference block having different wall thicknesses is required for calibration. The wall thicknesses must be selected so that they cover the expected readings. Calibration process: We recommend to use the semiautomatic calibration function for the calibration with T/R probes. Set the required test range. Increase the probe delay (P-DELAY) until the two calibration lines are displayed within the range.
5-24
Set the pulser and receiver functions according to the probe used and the test application. Set the function TOF (function group MEAS) to flank. Vary the gain so that the highest echo reaches approximately the full screen height. Set the gate threshold to the required height for measuring the sound paths at the echo flanks. Select the function group CAL using u. Enter the distances of the two calibration echoes in S-REF1 and S-REF2. Position the gate (function aSTART) on the first calibration echo. Press Y to record the first calibration echo. Couple the probe to the calibration block containing the second calibration line, and set the height so that its about as high as the first calibration echo. Move the gate to the second calibration echo.
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Operation
Press Y to record the second calibration echo. The correct calibration is confirmed by the message Calibration is done. The material velocity and probe delay are set. The value of the CAL function goes back to 0. If necessary, check the calibration on one or several known calibration lines, e.g. using the stepped reference block VW. H Note: Always keep in mind that the measured value is determined at the intersection point of gate and echo flank when the function TOF was set to flank. A correct setting of the echo height and gate threshold is therefore decisive for accurate calibration and measurement! Calibrations or measurements in the peak mode are mostly not possible when using dual-element (TR) probes. As the echoes are often very broad and jagged, a clear echo peak cannot always be found in these cases.
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Operation
Measuring
5.8 Measuring
General notes
Please pay attention to the following notes when measuring with the USM 25. Condition for measurements is the correct instrument calibration (sound velocity, probe delay). All amplitude measurements are carried out at the highest signal in the gate. All distance measurements are carried out at the intersection point of gate and the first echo flank (TOF = flank), or at the peak of the highest echo (TOF = peak). The following example shows the dependency of distance measurement on the echo waveform, i.e. on the height of the gate threshold and thus on the selection of the intersection point at the signal. H Note: The point of measurement is marked with a small triangle on the corresponding gate bar.
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Gate threshold at 20 % measured sound path: 24.44 mm
Gate threshold at 80 % measured sound path: 24.91 mm

Measurement of dB difference(function group REF)
Operation
H Note: Depending on the instrument version used, the function group DAC or DGS may also be displayed at this point. Please also see chapter 5.14 General configuration. You will find the following function: REFECHO Storing or deleting the reference echo REFMOD aSTART Activating the measurement of dB difference Positioning the A gate
5.9 Measurement of dB difference (function group REF)

You can evaluate reflector echoes by means of reference echoes. The function group REF makes all functions for the echo comparison between a reflector echo and a reference echo available to you. If necessary, change the operation level using the key E. Use u to select the function group REF.
The functions are described in the order in which you need them during your work.
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Operation
Recording a reference echo Before using the measurement of dB difference, you have to first record a reference echo.
The reference echo is now recorded. An inverted R is shown in the measurement line.
A Attention:
When recording a reference echo, an already stored reference echo is overwritten after a corresponding warning. Peak the reference echo according to the test specification. Position the A gate over the reference echo using the function aSTART. Use v to select the function REFECHO. Turn the right-hand rotary knob upward in order to store the echo in gate A as a reference echo. If necessary, confirm the warning message in order to overwrite a stored reference echo.
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Operation
Use v to select the function REFMOD. Activate the function by means of the right-hand rotary knob. The dB difference between the reference echo and the reflector echo is now displayed as the measured value.
Deleting a reference echo You can delete stored reference echoes. Use v to select the function REFECHO. Turn the right-hand rotary knob downward in order to delete the reference echo. If necessary, confirm the warning message in order to delete the stored reference echo.
Echo comparison You can compare the echo of any reflector of your choice with the reference echo. The displayed result is the dB difference of the two echoes. H Note: The dB difference is independent of any possible gain variation. Choose Ha dB or Hb dB as measured value. Position the A gate over the echo.
Operation
Calculation of flaw position (function group TRIG)
5.10 Calculation of flaw position (function group TRIG)

In the function group TRIG you will find the functions for setting the flaw position calculation when using anglebeam probes. If necessary, use E to change the operating level. Use u to select the function group TRIG.
depth of the flaw in addition to the sound path S, and to digitally display them in the measurement line. Projection distance PD: distance of probe index (sound exit point) from the position of the flaw, projected on the surface Reduced projection distance rPD: distance of the probes leading face from the position of the flaw, projected on the surface Depth d: Distance between flaw position and surface
The functions in the group TRIG enable to automatically calculate the (reduced) projection distance and the real
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Operation
When using angle-beam probes, the instrument can additionally calculate the sound path section or socalled leg L up to the next reflection point. This sound path section or leg can be displayed as the measured value La, Lb, or Lc.
ANGLE (angle of incidence)

The ANGLE function enables you to adjust the angle of incidence of your probe for the material used. This value is required for the automatic calculation of the flaw position. Adjustment range: 0 to 90 Operation: Use v to select the ANGLE function, and then use the right-hand rotary knob to select the required setting.
X-VALUE (X-value of the probe)

The function X-VALUE enables you to set the X-value (distance between the probes leading face and probe index/sound exit point) of the probe used. This value is required for the automatic calculation of the reduced projection distance. Adjustment range: 0 to 100 mm / 0 to 40
Operation
Operation: Use v to select the function X-VALUE, and then use the right-hand rotary knob to set the required value.
DIAMET (outside diameter of the test object)

You will need the DIAMET function for tests on circular curved surfaces, for example when testing longitudinally welded tubes. In order to make the USM 25 carry out the corresponding correction of (reduced) projection distance and depth, you should enter the outside diameter of your test object in this function. Adjustment range: 10 to 2000 mm / 0.4 - 800 If you plan to carry out the flaw position calculation for plane-parallel (flat) test objects, the DIAMET function should be set to flat. Operation: Use v to select the DIAMET function, and then use the right-hand rotary knob to set the required value.
THICKNE (material thickness)

Use the THICKNE function to set the materials wall thickness. This value is required for the automatic calculation of the real depth. Adjustment range: 1 to 1000 mm / 0.05 to 400 Operation: Use v to select the THICKNE function, and then use the right-hand rotary knob to set the required value.
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Data saving (function group MEM)
Operation
A data set contains all instrument settings as well as the A-scan. This means that whenever you recall a stored data set, your instrument is again set up exactly the same as it was at the moment when the data set was stored. This makes each one of your tests reproducible. You will find the following functions: SET-# RECALL STORE DELETE selecting number of a data set recalling a stored data set storing a data set deleting a data set
5.11 Data saving (function group MEM)

You will find all functions for storing, recalling and deleting complete data sets in the function group MEM. If necessary, use E to change the operating level. Use u to select the function group MEM.
The functions are described in the order in which you need them during your work.
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Operation
Storing a data set

You can save your current setup to a data set. Operation: Use v to select the function SET-# and then use the right-hand rotary knob to set the number where you would want to store the current data set (1 to 100). Use v to select the function STORE and use the right-hand rotary knob to set it to on. The USM 25 stores the current data set. When the storage process is completed, the function STORE is automatically reset to off. H Note: The asterisk (*) before a selected data set number indicates that this data set is already occupied. It is not possible to overwrite an occupied data set; selet another data set which is still empty, or delete the occupied data set. All active entries in the information table (TESTINF) are automatically allocated to the data set being stored.
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Deleting a data set

An occupied data set is marked with an asterisk (*) before the data set number. You can delete these data sets if you no longer need them. Operation: Use v to select the function SET-# and then use the right-hand rotary knob to set the number of the data set that you want to delete. Use v to select the function DELETE and use the right-hand rotary knob to set it to on. The measurement line will then prompt: Delete data set? Confirm by pressing the v key of the function DELETE one more time (all other keys would abort the process). The data set is now deleted; the asterisk preceding the data set number is no longer there. The function DELETE is automatically reset to off.
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Operation
The data set is now loaded and the current setup is overwritten. When the loading process is completed, the function RECALL is automatically reset to off. H Note: The gate for surveying the echo can be moved in the recalled A-scan. However, as the evaluation is made in the frozen A-scan, the measurement resolution is only 0.5 % of the adjusted calibration range.
Recalling a stored data set

You can recall a stored data set; your instrument will then be provided with all the test-relevant technical features that existed at the moment of the setup. A frozen display of the stored A-scan appears. Operation: Use v to select the function SET-# and then use the right-hand rotary knob to set the number of the data set that you want to recall. Use v to select the function RECALL and then use the right-hand rotary knob to set it to on. The measurement line will then prompt: Recall data set?
A Attention:
Please observe this safety prompt as the current setup is overwritten if a stored data set is loaded. Confirm by pressing the v key of the function RECALL one more time (all other keys would abort the process).
Operation
Dataset management (function group DATA)
5.12 Dataset management (function group DATA)

The USM 25 offers comprehensive functions for an easy dataset management. If necessary, use E to change the operating level. Use u to select the function group DATA.
The following functions are available: TESTINF You can save a lot of additional information for every data set, e.g. data on the test object, on the flaw detected, or comments. In this dataset preview you will see the A-scan, the dataset name and the storage date of each data set. This function enables you to display a list of all stored data sets, including the corresponding dataset names. This is where you will see a list of functions including all settings of the current data set.
PREVIEW
DIR
SETTING
The functions in the function group DATA enable you to easily manage the data sets stored in the USM 25.
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Operation
You can save the current settings - together with the edited additional information - at a new and still empty dataset number (analogously to function STORE in the function group MEM), subsequently enter and save additional information for an already stored data set, overwrite the already saved additional information of a data set. Operation: Use u to select the function group DATA. Use v to select the function TESTINF. The table will now show the additional information saved for the currently selected data set (please see field SET-#). Use u (INFO 3) and v to select the field SET-#. You can now use the right-hand rotary knob to view the additional information for other data sets and to edit this information if required.
TESTINF (storing additional information)

For every data set, you can store additional information which will support you in the easy management of the data sets. You have 9 fields at your disposal for this purpose. You can enter a maximum of 24 alphanumeric characters in the following fields: DATNAME OBJECT FLAWIND OPERAT SURFACE Dataset name Object description Flaw indication Name of the person carrying out the test Surface quality
COMMENT Comments You can enter numerical values in these fields: FLAWLEN X-POS Y-POS Flaw length x-position coordinate y-position coordinate
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Operation
transferred. However, the data in the numerical fields FLAWLEN, X-POS and Y-POS are deleted. This means that you only have to edit the variable fields in test applications which include continuous saving of results. All alphanumerical field data are automatically transferred but can also be edited if necessary.
A Attention:
As long as the field data edited in this table have not been saved, the previous entries remain valid. Please keep this in mind, e.g. before selecting a new dataset number: all changes in the current data set are lost! Use u and v to select the required field.
Editing additional information

Use u (INFO 3) and v to select the field SET-#, and then use the right-hand rotary knob to select the required data set. All stored data are displayed for data sets which are already occupied. If you have selected an empty data set, the field data of the previously displayed data set are automatically
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Use the left-hand rotary knob to mark the required character position. Use the right-hand rotary knob to select the character for this position. You only need the righthand rotary knob to enter the numerical values in FLAWLEN, X-POS and Y-POS.
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Operation
The function STO-INF is automatically reset to off at the end of data storage. If necessary, press one of the keys V, W or X to go back to the A-scan without storing the data.
H Note: You cannot edit the field SET-#. The number of the current data set is displayed here.
Storing additional information

Use u and v to highlight the field STO-INF, and then use the right-hand rotary knob to set this function on. The currently displayed data of the fields are now stored as follows: Only the edited field data are stored for the previously occupied data sets.
PREVIEW (dataset preview)

This function enables you to view the A-scans of all stored data sets. Operation: Use v to select the PREVIEW function, and then use the right-hand rotary knob to set the function to on. The A-scan and the name of the first data set are displayed. Viewing other data sets: Use v to to select the SET-# function, and then use the right-hand rotary knob to select the number of the required data set.
A Attention:
If you have edited already existing additional information, all previous additional information is overwritten when the data are stored. In the case of previously empty data sets, all instrument settings and the current A-scan are stored simultaneously with the edited field data.
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Operation
Use v to to select the RECALL function, and then use the right-hand rotary knob to set the function to on. The selected data set is displayed. If necessary, press one of the keys V, W or X to go back to the currently active A-scan.
Turn the right-hand rotary knob to have other data sets displayed. The list always advances by one line each. If necessary, press one of the keys V, W or X to go back to the currently active A-scan.
DIR (dataset directory)

This function enables you to get an overview of all stored data sets, including their names and numbers. Operation: Use v to to select the DIR function, and then use the right-hand rotary knob to set the function to on. The directory list of the stored data sets is displayed (dataset numbers and names). The display shows 12 data sets at a time. An occupied data set is marked with an asterisk (*) before the data set number.
SETTING (function list)

This function provides you with an overview of all set functions of the current data set. Operation: Use v to to select the SETTING function, and then use the right-hand rotary knob to set the function to on. The list of the currently set functions is displayed. Turn the right-hand rotary knob to have other lines displayed. The list is advanced by one line each. If necessary, press one of the keys V, W or X to go back to the currently active A-scan.
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Configuring the USM 25 for a test application
Operation
If necessary, use E to change the operating level. Use u to select the function group MEAS.
5.13 Configuring the USM 25 for a test application

Besides the default settings for the instrument operation, you have to configure the USM 25 for calibration and test tasks. You will find the corresponding functions in the function groups MEAS, MSEL and LCD. In addition, you have to check the current time and date, and set them if required, so that they are correctly stored together with the test results. Please look up the function groups CFG1 and CFG2 for more functions for the general instrument setup (please refer to chapter 5.14 General configuration).
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Operation
TOF (selecting the measuring point)

The sound path measurement in the calibration process or in the subsequent echo evaluation process depends on the selected measuring point which can be adjusted either to flank or to peak in the USM 25. In principle, the peak measurement should be preferred because the measured distances do not depend on the echo height in that case. However, there are application cases in which the flank measurement is either specified, or it must be applied for technical reasons, e.g. in many tests using dual-element (TR) probes. The point of measurement is marked by a small triangle on the corresponding gate bar.
S-DISP (zoomed display of reading)

You can have a selected reading zoomed in the A-scan display. The following readings can be selected for the zoomed display (in the second column the indication of the readings in the measurement line, see. page 5-45): H Note: If you use the Data Logger option, values for the C gate as well as a few special values for the Data Logger are added to the existing ones, see chapter Option Data Logger. Sa Sb Sb-a Ha % Hb % Ha dB Hb dB R-start R-end Sa Sb S Ha Hb ha hb Rs Re Sound path for gate A Sound path for gate B Difference of single measurements for sound path gate B - gate A Echo height gate A in % screen height Echo height gate B in % screen height Echo height gate A in dB Echo height gate B in dB Range start Range end
Krautkramer USM 25
A Attention:
In any case, the adjustment of the measuring point for calibration and for the subsequent test use must always be identical. Otherwise measurement errors may occur. Operation: Use v to select the TOF function, and then use the right-hand rotary knob to select the required setting.
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Operation
General: Alarm Al Choice of gates for alarm triggering: Gate A, B or A+B
La Lb Lc
La Lb Lc
Number of legs in gate A Number of legs in gate B Number of legs in gate C
Only for flaw position calculation: Da Db Pa Pb Ra Rb Da Db Pa Pb Ra Rb Depth for gate A Depth for gate B Projection distance for gate A Projection distance for gate B Reduced projection distance for gate A Reduced projection distance for gate B
Operation: Use v to select the function S-DISP, and then use the right-hand rotary knob to select the required value for the zoomed display. H Note: You can likewise configure all readings to be displayed below the A-scan at the four corresponding positions. Please refer to Configuring the measurement line, page 5-45, on this subject.
Only for DGS: ERS Gt dB ER Gt Equivalent reflector size DGS test sensitivity
Only for DGS and DAC: Ha %crv Ca Hb %crv Cb DGS-Crv Dc Echo height gate A in % referred to curve Echo height gate B in % referred to curve Diameter of the DGS curve
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Operation
MAGNIFY (gate spreading)

The setting of the MAGNIFY function causes a spreading of the gate over the entire display width. You can choose the gate to be used for the Magnify function. Operation: Use v to select the function MAGNIFY. Use the right-hand rotary knob to set the function to aGATE or bGATE if you want to spread the range of gate A or B over the entire display range.
compare (A-scan comparison) You can compare a current echo display with a stored one. The display last stored using W either from the current application or from a stored data set is displayed in the background as a dotted line. H Note: Read chapter 5.11 to learn how to load a saved data set. As a restored data set is displayed with a frozen A-scan, press the W key first. envelop (echo dynamics) The echo envelope is shown as a dotted line additionally to the A-scan. peak b (maximum display) You can use this function to record and document (as well as to save if required) the peaked, maximum echo display. With the B gate active, the A-scan with the highest echo amplitude (recording of maximum display) is shown as a dotted line additionally to the live Ascan when peaking an echo display (in B gate). This A-scan becomes the statically frozen A-scan by pressing the W key, and it can then be evaluated accordingly.
Krautkramer USM 25
A-Scan (setting the A-scan)

This function offers you several options for setting your A-scan. stndard Normal A-scan setting. The Y key effects a static freeze.
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Operation
afreeze / bfreeze (automatic freeze) Whenever you select this function, an echo display connected with the A or B gate will automatically switch over to A-scan freeze (automatic freeze). This setting is especially well suited e.g. for hightemperature measurements, for measurements involving difficult coupling conditions, or for spot weld testing. H Note: If you are using a Data Logger option, you also have the function cfreeze (for C gate) at your disposal.
Configuring the measurement line

The configuration of your measurement line is carried out in the function group MSEL, this means that you can choose the reading for one of the four possible positions of the measurement line for direct measuredvalue display during the test. If necessary, use E to change the operating level. Use u to select the function group MSEL.
Operation: Use v to select the function A-SCAN. Use the right-hand rotary knob to choose the required setting. Pay attention to the additional information referring to the corresponding setting options (see preceeding page).
Functions of the function group MSEL: MEAS-P1 MEAS-P2 MEAS-P3 Measured values at positions 1 to 4 MEAS-P4
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Operation
All measured values which have also been described for the zoomed display of the function S-DISP (please refer to page 5-42) are availabe to you at each position. Operation: Use v to select the function MEAS-P1 to MEAS-P4. Use the right-hand rotary knob to set the required measured value for each position in the corresponding function. H Note: As an alternative, you can display a scale in the measurement line (ref. function SCALE).
Setting the display

In the function group LCD, you will find setting options for the display screen itself and for the echo display. If necessary, use E to change the operating level. Use u to select the function group LCD.
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Operation
FILLED (Echo display mode)

The function FILLED toggles between the filled and the normal echo display mode. The filled echo display mode improves the echo perceptibility due to the strong contrast, especially in cases where workpieces are scanned more quickly. Operation: Use v to select the function FILLED. Use the right-hand rotary knob to set the function to on or off. H Note: With the setting FILLED = on the A-scan refresh rate is considerably reduced.
LIGHT (LCD backlight)

In this function you can switch the backlight for the display on or off. H Note: The operating time is reduced by 25 to 30 % with the backlight switched on in battery operation! You should therefore make sure that the light is always switched off when not needed. Operation: Use v to select the function LIGHT. Use the right-hand rotary knob to set the backlight to on or off. H Note: In addition, the LCD backlight can be switched on and off by simultaneously pressing the two function group keys u + u on the left.
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Operation
CONTR (LCD contrast)

You can adjust the LCD contrast in this function. An adjustment range from 0 to 100 is available; try and find out your favorite setting. Operation: Use v to select the function CONTR. Use the right-hand rotary knob to adjust the required contrast. H Note: The ambient temperature affects the contrast of the LCD screen. It may therefore become necessary to adjust the contrast in case of strong temperature variations. In order to set the contrast to another value directly during switch-on, press one of the five function group keys u while pressing the switch-on key U: CONTR = 10 u 30 u 5o u 70 u 90 u
SCALE (configuring the measurement line)

As an alternative to the measured values, the USM 25 enables to display a scale in the measurement line. The scale gives you an overview of the position of echoes. You have a choice between a dimensionless ten-division scale and a scale showing the real position of the echoes. The following settings are possible: measval Display of measured values snd-pth div. Operation: Use v to select the function SCALE. Use the right-hand rotary knob to set the required display mode. Display of sound path scale Display of a dimensionless scale
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General configuration
Operation
H Note: Double assignment of the function EVAMOD / ANAMOD. For operation (changeover), please see the operation of the corresponding function.
5.14 General configuration

More functions for the basic configuration of the USM 25 may be found in the function groups CFG1 and CFG2. If necessary, use E to change the operating level. Use u to select the function group CFG1 or CFG2.
UNIT (Selecting units of measurement)

You can choose the required units between mm or inch in the function UNIT. Operation: Use v to select the function UNIT. Use the right-hand rotary knob to select the required unit.
Functions of CFG1 Unit Dialog language Printer selection Assignment of the Y key
Krautkramer USM 25
CFG2: Time Date Horn Evaluation mode/ analog output
A Attention:
You should always make your decision on the units immediately when starting to work with the USM 25. If you change the unit, all current settings are deleted, and the basic setup is loaded.
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Operation
To avoid any accidental deleting of values, the measurement line will display a safety prompt: Change unit? If you are sure that you want to change the unit of measurement, press the corresponding v key of the function UNIT (any other key would abort the process). The unit of measurement is now changed; the current data are deleted. Spanish Portuguese Dutch Swedish Slovakian Polish
Danish Hungarian Croatian Russian Norwegian
H Note: More dialog languages can be added on request. Operation: Use v to select the function DIALOG.
DIALOG (Selecting the language)

In this function you can select the language for displaying the function names on the screen and for the test report. The following languages are available: German English (default setting) French Italian
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Use the right-hand rotary knob to select the required language.
Slovenian Romanian Finnish Czech

Operation
PRINTER (Printer for test report)

In this function you can select the connected printer for printing out your test report. You have a choice between the following printer types: Epson HP LaserJet HP DeskJet Seiko DPU-41x Operation: Use v to select the function PRINTER and then use the right-hand rotary knob to select the required printer. H Note: For more details on the how to print out a test report, please refer to chapter 6 Documentation.
COPYMOD (assignment of the Y key)

When the Y key is pressed, data are output to the RS232 interface and transferred to a printer or a PC. You can use the function COPYMOD to choose the data to be transferred when the Y key is pressed. You have the following setting options: hardcpy Hardcopy of the screen contents report Test report with A-scan, all relevant settings for the inspection and space for hand-written remarks meas P1 The measured value given at position 1 in the measurement line pardump All instrument functions with the current settings PCX Screen contents as a PCX-format file. To transfer the data to the PC, you will need a terminal program.
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store The current instrument setting is stored to the selected (free) data set, and the data set number (DAT-#) is automatically increased. datalog (only with Data Logger option) The selected job is printed out as a report including all measured values. off The Y key is deactivated. special as setting hardopy. After printout of the screen contents no form feed, every press on the Y key prints out the next hardcopy on the same page (three or four hardcopies depending on the printer). H Note: Please also refer to chapter 6 Documentation. Operation: Use v to select the function COPYMOD. Use the right-hand rotary knob to set the required assignment for the Y key.
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TIME / DATE (setting the time and date)

You have to check the current date and time and, if required, set them so that these data are correctly saved together with the test results.
A Attention:
Always make sure that you are using correctly set time and date values. Otherwise test results might be corrupted. Be aware that the USM 25 displays the year as a two digit number! Operation: Use v to select the function TIME. Use the left-hand rotary knob to highlight the value that you want to change, e.g. the hour. Use the right-hand rotary knob to change the highlighted value. Use v to select the function DATE, and then use the right-hand rotary knob to select the required setting.
Krautkramer USM 25
Operation
in instrument operation occuring when the instrumet is used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored.
Use the left-hand rotary knob to highlight the value that you want to change, e.g. the day. Use the right-hand rotary knob to change the highlighted value.
HORN
In this function, you can decide whether or not an acoustic alarm should be given in addition to the visual alarm (LED A). Operation:
ANAMOD
You can output results of measurements at the analog output for external further processing. Use the function ANAMOD to configure the analog output in case there is no echo in the evaluation gate and the analog voltage has been selected for the sound path at the output. You have the following setting options:
Use v to select the function HORN. Use the left-hand rotary knob to set the horn to on or off. H Note: Error alarms can be triggered unter certain circumstances. These are caused by intermediate conditions lo volt The analog output supplies 0 volt. hi volt The analog output supplies 5 volts.
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Operation
Operation: The function ANAMOD / EVAMOD has a double assignment (icon >). Toggle between the two functions by repeatedly pressing the corresponding key v . Use v to select the function ANAMOD. Use the right-hand rotary knob to choose the required value. DGS (only USM 25S) Evaluation using the DGS method Operation:
The function ANAMOD / EVAMOD has a double assignment (icon >). Toggle between the two functions by repeatedly pressing the corresponding key v . Use v to select the function EVAMOD. Use the right-hand rotary knob to choose the required method.
EVAMOD (echo evaluation)

This is where you can choose a method for the evaluation of the measured reflector echo. Depending on the instrument version used, you have various methods to choose from. REF (default setting) Evaluation using the measurement of dB difference, available for all instrument versions DAC (only USM 25 DAC and USM 25S) Evaluation using the Distance-Amplitude Curve
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Other functions with special keys
Operation
5.15 Other functions with special keys

H Note: You will find a description of the V key (setting of the dB incrementation for gain) on page 5-5; the Y key, which you will need for printing out your test report, is described in chapter 6 Documentation.
X Enlarged echo display

If you press X, the echo display is enlarged (zoom function) and overlaps the function group. The functions are not accessible in this mode, except for the gain which continues to be adjustable via the left-hand rotary knob. Press X again in order to return to normal mode.
W Freeze
The W key enables you to store (freeze) the displayed image on the screen. Gate parameters may still be changed in order to evaluate any signal being displayed in the frozen screen. The measurement resolution is only 0.5 % of the displayed range. Operation: Press W if you want to store (freeze) a current display. Press W again in order to return to normal mode.
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Operation
Status symbols and LEDs
5.16 Status symbols and LEDs

Status symbols can be displayed in the line below the screen display to inform about certain settings and conditions of the USM 25. The LEDs above the display give you further information.
T R A
Function T-CORR is active. Reference echo has been recorded. Function ATT-OBJ / ATT-REF (sound attenuation) is active.
LED Status symbols

Symbol Description Symbol Description
A R D
Gate alarm. Function REJECT is active. Function DUAL (pulser-receiver separation) is active.
Display memory is enabled (freeze), display is stored. Data transfer active, (printing or remote control). Battery indicator, an inverted blinking B indicates that the batteries are empty and must be charged. Function TOF is set to flank. Function TOF is set to peak.
!
B
H Note: Error alarms can be triggered unter certain circumstances. These are caused by intermediate conditions in instrument operation occuring when the instrumet is
F P
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Status symbols and LEDs
Operation
used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored. H Note: If you are using the Data Logger option, youll find more status symbols, see chapter Option Data Logger.
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Operation
Distance-amplitude curve (only USM 25 DAC and USM 25S)
5.17 Distance-amplitude curve (only USM 25 DAC and USM 25S)

H Note: The DAC function is available as a fixed function in the second operating level on the USM 25 DAC. With the USM 25S, the DAC function can be additionally switched over to DGS evaluation mode. Due to the angle of the sound beam spread and to the sound attenuation in the material the echo height of reflectors of equal size depends on the distance to the probe. A distance-amplitude curve, which is recorded with defined reference reflectors, graphically displays these influences. If you use a reference block having artificial flaws when recording a DAC you will be able to apply these echo amplitudes for the evaluation of discontinuities without any further correction. The reference block should be made of the same material as the test object.
5-58
You will find the functions for the distance-amplitude curve in the function group DAC. If necessary, use E to change the operating level. If necessary with the USM 25S, switch the function EVA-MOD (function group CFG2) over to the setting DAC using the right-hand rotary knob. Use u to select the function group DAC.
H Note: Double-allocation of the lower function T-CORR / OFFSET. For information on the operation (switchover), please see following pages.
Krautkramer USM 25
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Operation
reference echoes recorded are brought (lifted or lowered) to the same echo height. H Note: No reference echoes can be recorded with DACMODE = TCG. TCG can only be activated if the reference echoes recorded are situated within a dynamic range of 40 dB. Otherwise an error message is output. If the TCG setting should be nevertheless be used in this case, then the DAC must be reduced (by deleting the last reference points) until TCG can be switched on.
DACMOD (activating DAC/TCG)

You can use this function to activate the DAC. The following settings are available: off DAC No DAC is active. The already saved distance-amplitude curve is displayed on the screen, or a new DAC is recorded. An existing DAC (at least 2 reference points) is displayed as a horizontal TCG line.
TCG
Operation: Use v to select the function DACMOD, and then use the right-hand rotary knob to select the DAC setting. If there is a DAC stored, it will now be active. Use v to select the TCG setting. The TCG function is activated so that the DAC becomes a horizontal recording threshold. This means: all Use v to select the function DACMOD, and then use the right-hand rotary knob to select the setting off in order to deactivate the DAC again.
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Operation
DACECHO (recording reference curve)
A Attention:
Before starting to record a reference curve, the instrument must be correctly calibrated (ref. section 5.7 Calibrating the USM 25). The moment a new curve is recorded, a possibly already existing curve must be deleted. If necessary, make sure that the old curve has been stored in a free data set before starting to record a new curve! Operation: Use v to select the function DACMOD, and then use the right-hand rotary knob to set the function to DAC. The function DACECHO is set to 0 since there is no previously recorded echo. Couple the probe to the reference block, and peak the first reference echo. Use the left-hand rotary knob to bring the echo to approx. 80% screen height.
Use v to select the function aSTART, and then move the gate so that the selected echo is the highest of the echo sequence within the gate range. Press Y to record the first reference echo. Peak the next reference echo, and repeat the recording process for other curve points. The number in the function DACECHO is increased by 1 with each recording. H Note: If the message Echo is not valid appears, the reference point could not be recorded. Check the gate position as well as the height of the reference echo and repeat the recording. As soon as you have recorded at least two curve reference points. Your DAC is already acive (please see previous section). You can record a maximum of 10 curve reference points; the more echoes you record, the more accurate the DAC will be.
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Operation
Deleting reference points or the complete DAC You can delete the reference point which was recorded last in each case, or the complete DAC. Operation: Use v to select the function DACECHO. Turn the right-hand rotary knob downward (counterclockwise). The message Do you want to delete the DAC echo? appears in the measurement line. Press the v key for DACECHO now in order to delete the last echo, or press another key in order to cancel the process of deleting. In this way, you can record one or several new reference points. In order to delete the complete DAC, all curve points are successively deleted one by one.
T-CORR (sensitivity correction)

This function enables you to compensate for the transfer losses in the material under test. This correction is necessary if test object and reference block have different surface qualities. You have to find out the adjustment value for the compensation of transfer losses by experiments. The gain is varied accordingly in this connection, the curve line remains the same. Adjustment range: -24 to +24 dB Operation: The function T-CORR / OFFSET has a double allocation (symbol >). You can toggle between the two functions by repeatedly pressing the corresponding v key. Use v to select the function T-CORR, and then use the right-hand rotary knob to select the required setting.
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Operation
OFFSET (distance of multiple DAC)

You can activate a multiple DAC and at the same time determine the distance from the original curve. The setting 0 dB doesnt generate any multiple DAC, any setting different from 0 dB generates four other curves at a set distance from the original curve, two of the additional curves being below the original curve and two at an equal distance above it each. Adjustment range: 0 dB to 14 dB in steps of 0.5 dB Operation: The function T-CORR / OFFSET has a double allocation (symbol >). You can toggle between the two functions by repeatedly pressing the corresponding v key. Use v to select the function OFFSET, and then use the right-hand rotary knob to select the required setting.
Echo evaluation with DAC

In order to be able to evaluate a flaw indication by means of the DAC, certain conditions must be met: The distance-amplitude curve must already be recorded. It only applies to the same probe that was used when recording the curve. Not even another probe of the same type must be used! The DAC only apply to the material corresponding to the material of the reference block. All functions affecting the echo amplitude must be set the same way as they were when the curve was recorded. This applies in particular to the following functions: POWER, FREQU, RECTIFY, MTLVEL and REJECT. TOF is automatically set to peak.
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Krautkramer USM 25
Evaluation according to the DGS method (only USM 25S)
Operation
Distance D between the probe and circular diskshaped equivalent reflector. Difference in gain G between various large circular disk-shaped equivalent reflectors and an infinitely large backwall. Size S of the circular disk-shaped equivalent reflector. The influencing variable S always remains constant for one curve of the set of curves. The advantage of the DGS method lies in the fact that you can carry out reproducible evaluations of small discontinuities. The reproducibility is most of all important, for example, whenever you aim to carry out an acceptance test. Apart from the influencing variables already mentioned, there are other factors determining the curve shape: sound attenuation transfer losses amplitude correction value probe.
5.18 Evaluation according to the DGS method (only USM 25S)

With the USM 25S, you can use both the DAC and the DGS method of amplitude evaluation.
Measuring with DGS

Using the DGS function (Distance-Gain-Size), you can compare the reflecting power of a natural flaw in the test object with that of a theoretical flaw (circular diskshaped equivalent reflector) at the same depth.
A Attention:
You are comparing the reflecting power of a natural flaw with that of a theoretical flaw. No definite conclusions may be drawn on the natural flaw (roughness, inclined position, etc.). The so-called DGS diagram forms the basis for this comparison of the reflecting power. This diagram consists of a set of curves showing the correlation of three influencing variables:
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Operation
The following probe parameters affect the curve shape: element or crystal diameter frequency delay length delay velocity You can adjust these parameters on the USM 25S in such a way that you can use the DGS method with many different probes and on different materials. H Note: Before setting the DGS function, the instrument must first be calibrated because all functions affecting the DGS evaluation mode (MTLVEL, P-DELAY, DAMPING, POWER, FINE G, FREQU, RECTIFY) can no longer be changed after the reference echo has been recorded. Please also refer to chapter 5.7 Calibrating the USM 25 on this subject.
Selecting the DGS mode

If necessary (if the function DAC is selected), set the EVA-MOD function (function group CFG2) to DGS. The function group DGS now replaces the function group DAC.
Use the E key to change the operating level, and then use v to select the function group DGS.
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Operation
Define your settings: PROBE-#: probe number Fixed-programmed probes with all settings (PRBNAME, DEL-VEL, D eff and PRBFREQ cannot be changed in the case of these probes); PROBE-# = 0 is user-programmable with reference to all parameters. PRBNAME: probe name The name belongs to the selected probe number and cannot be changed; the individual probe name can be entered only with PROBE-# = 0. DGS-CRV: recording curve for DGS evaluation This enables you to select the circular disk-shaped equivalent reflector diameter to be used for displaying the DGS curve and used as recording threshold for echo evaluations. DEL-VEL: delay material velocity of the probe; predefined with programmed probes. D eff: effective element diameter of the probe used; predefined with programmed probes.
Double allocation of functions: DGSMEN> Calling the DGS menu T-CORR> Setting the transfer correction DGSMEN> Switching on/off the DGS evaluation mode OFFSET> Activating the multi-curve display mode
Default settings for the DGS measurement

In the next step, the DGS menu is called enabling to select the corresponding probe and to set the other DGS parameters: Use v to select the function DGSMEN> and then use the right-hand rotary knob to call the DGS menu.
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Operation
PRBFREQ: probe frequency Frequency of the transducer; predefined with programmed probes. REFECHO: type of the reference reflector used BW: backwall SDH: side drilled hole FBH: flat bottom hole REFSIZE: size of the reference reflector ATT-REF: sound attenuation in the reference block ATT-OBJ: sound attenuation in the test object AMPLCOR: value for the amplitude correction. This is required whenever you are using an angle probe and the quadrant echo from the calibration standards K1 or K2 as a reference reflector.
Example
In this example, the probe MB 4 S is selected. Reference reflector = backwall, the 3mm circular disc is to be displayed as curve. The sound attenuation corrections ATT-REF and ATT-OBJ and the amplitude correction AMPLCOR (for angle probes and calibration standard K1 / K2) remain at 0. To return to the A-scan, press one of the following keys: en: E, V, W oder X.
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Operation
Confirm by pressing v again. After the successful recording of the reference echo, a highlighted R will be displayed in the measurement line. Switch the DGS curve on now by using v to select the function DGSMOD> and by using the right-hand rotary knob to set the function to on.
Recording the reference echo and displaying the DGS curve

To be able to display the required DGS curve, you have to first record the reference echo. You have to start by optimizing the echo of the reference reflector, in this case the backwall echo from the test object. Continue by positioning the gate on the reference echo. Then use v to select the function DGS-REF, and use the right-hand rotary knob to switch the function on. The message: Do you want to change the DGS reference echo? appears.
Taking the general DGS diagram as a basis, the instrument calculates the required test sensitivity for displaying the 3mm curve with its maximum at 80% screen height, and sets this value. The current gain is set to 0 during this. In the case of subsequent gain variations, the curve is automatically adapted.
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Operation
Evaluation of reflectors
Every echo situated within the gate can be immediately evaluated:
S-DISP = Ha%, i.e. echo height evaluation as a percentage. At the same time, the multiple-curve display mode is also active with a curve distance of OFFSET = 6 dB.
The measurement line has been configured in such a way that the sound path S, the echo height in dB referred to the DGS curve, the equivalent reflector size (ERS) of the flaw echo and the calibration range are displayed. The measured value to be zoomed in the A-scan is chosen by means of the function S-DISP in the function group MEAS. ERS was chosen in the above example. Also refer to Configuring the measurement line, p. 5-45.
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Operation
S-DISP = Ha%Crv, the evaluation result is now the value exceeding the curve in %.
Transfer correction
The transfer correction is activated by means of the function T-CORR. The test sensitivity is varied by this value without recalculating the curve.
S-DISP = Gt is a special case: the value displayed is the DGS test sensitivity with which the maximum of the specified curve is at 80%. This value serves for the purpose of checking and documenting. This means that the test sensitivity is increased by 6 dB in the example in order to compensate for a possibly existing surface roughness. The echo is consequently drawn higher by 6 dB on the left, i.e. evaluated with ERS 3.2. Status indicator in the measurement line: a highlighted T.
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Operation
Sound attenuation
If necessary, the DGS curve can take the components effective sound attenuation (ATT-OBJ) into account. With the value set here, the curve shape is recalculated so that the effect of sound attenuation is now taken into consideration when evaluating reflectors.
made to change the value because, in fact, a valid reference echo already exists. In addition, a different reference reflector type has been used in the DGS menu below: instead of a backwall, a circular disk (flat-bottom hole) having a diameter of 3 mm has been set in this case. In this case, of course, the reference echo has to be received from a 3mm circular disk.
The DGS curve now includes the effect of sound attenuation. An active sound attenuation correction is indicated in the measurement line by a highlighted A. The sound attenuation in the reference block can only be set prior to recording the reference echo. Therefore, an error message is displayed here if an attempt is
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Operation
Conditions for the use of side-drilled holes as reference reflectors in steel. For other materials, the values must be converted accordingly.
After switching on the DGS curve, the reference echo must therefore clearly touch the 3mm curve.
A side-drilled hole can also be used as a further reference reflector with some limitations. It must have a diameter corresponding to at least 1.5 times the wavelength used, and the distance must be 1.5 times the near-field length. The USM 25S will check these conditions if you aim to use a side-drilled hole as reference reflector, and will issue an error message if required. The table on the next page indicates these minimum data for the existing probes in steel:
Operation
Probe Wavelength in steel [mm] 6.0 3.0 1.5 3.0 1.5 1.2 1.6 0.8 1.6 0.7 3.3 1.6 Minimum Diameter [mm] 9.0 4.5 2.3 4.5 2.3 1.8 2.4 1.2 2.4 1.1 5.0 2.4
Near Feld Length in steel [mm] 23 45 90 8 15 20 15 30 39 98 45 90
Minimum Distance in steel [mm] 35 68 135 12 23 30 23 45 59 147 68 135
B1S B2S B4S MB 2 S MB 4 S MB 5 S MWB ...-2 MWB ...-4 SWB ...-2 SWB ...-5 WB ...-1 WB ...-2
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Operation
Locks, error messages

As long as a valid reference echo is stored, no functions can be changed which could cause an incorrect DGS evaluation. If an attempt is made to change such a function, the corresponding error message will appear, e.g. P-DELAY locked by DGS-REF = on The DGS evaluation must likewise be switched off and the reference echo deleted in the case of selecting a new probe, e.g. for a new test application.
Validity of the DGS method

Echo amplitude evaluations according to the DGS method are only reliable and reproducible in cases when the reference echo is received from the test object if possible. If this is not possible, it should be ensured that the reference block is made of the same material as the test object. the evaluation is carried out using the same probe which was also used for recording the reference echo. Another probe of the same type can be used after recording a new reference echo.
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Krautkramer USM 25
Documentation
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6-1
Documentation
Printing out the report
6.1 Printing data

Direct printing of the following data via the RS232 interface is possible using the USM 25: test report containing the A-scan and the adjustment data A-scan single reading (position 1 of the measurement line) function list (including all current settings) Data Logger (if the version is available) To do this, you need a printer with serial interface RS 232 a printer cable (please see chapter 2)
Preparing the printer

The transfer parameter settings are fixed in the USM 25 and cannot be changed. Baud rate Word length Parity 9600 8 data bits none
In order to ensure a perfect communication, set the printer to the parameters of the USM 25.
Preparing the USM 25

You decide on the type of printout by assigning the Y key. If necessary, use the E key to change the operating level. Use u to select the function group CFG1. Use v to select the function PRINTER, and then use the right-hand rotary knob to select the correct printer driver.
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Printing out the report
Documentation
Use v to select the function COPYMOD, and then use the right-hand rotary knob to select the setting: hardcpy, report, meas P1 (measured value at position 1), pardump (function list), datalog (Data Logger job including measured values), special (3 - 4 hardcopies on one page). H Note: The setting PCX generates a PCX-format file which you can transfer to a PC by means of a suitable program capable of receiving and storing data.
Printing
If you have connected, prepared and activated the printer, just press the Y key. The report is printed out. If you have selected the setting special, press the Y key again for each hardcopy that you want to print out.
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Documentation
6.2 Documentation with UltraDOC

The special application program UltraDOC from Krautkramer Ultrasonic Systems enables you to remote-control the USM 25 and to include instrument settings in ASCII format or screen contents in PCX or IMG format in your test report. All data can be further processed using commerical word processing or DTP programs. You will receive information about the reliable use of the program in a detailed operating manual.
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Maintenance and care
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Care
7.1 Care
Care of the instrument
Clean the instrument and its accessories using a moist cloth. Use water or a mild household cleaner.
Care of NiCd batteries

Capacity and life of batteries mainly depend on the correct handling. Please therefore observe the tips below. You should charge the NiCd batteries in the following cases: before the initial startup after a storage time of 3 months or longer after frequent partial discharge
Attention:
Do not use any solvents! The plastic parts can be damaged or embrittled by this.
Charging the NiCd batteries

The quick charger recommended by us (order no. 18673) enables you to charge NiCds batteries. Please observe the notes on the operation of the battery charger for this.
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Care
Charging of partially discharged NiCd batteries If NiCd batteries are only partially discharged (less than 50 % of operating time), the full capacity is not reached by normal charging. Start by fully discharging the NiCd batteries. You can use the discharging function of the charger for this. For more details, please read the notes on the operation of the battery charger. The NiCd batteries are automatically charged after that. Charging of exhausted NiCd batteries If NiCd batteries are exhausted, e.g. after a prolonged storage time in empty state, they often reach their full capacity only after repeated discharge/charge cycles. The charger identifies defective batteries. In that case, replace the batteries by a new set. Otherwise there is the danger that individual cells have different capacities so that you will no longer obtain the normal operating time with the instrument in battery operation.
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Maintenance
7.2 Maintenance
The USM 25 requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of authorized Service staff of Krautkramer Ultrasonic Systems.
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Interface and peripherals
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8-1
Interface and Peripherals
RS 232 interface
8.1 I/O interface

The USM 25 has an 8-way I/O interface (LEMO-1B socket) for different input and output signals: SAP output (transmitter trigger pulse) Alarm output (TTL): switching delay approx. 50 ms, hold time approx. 500 ms. TDR input (test data release) View of the 8-way LEMO-1B socket H Note:
You are able to externally process the alarm condition with the alarm output, e.g. for sorting and other control purposes. Error alarms can be triggered under certain circumstances. These are caused by intermediate conditions in instrument operation occuring when the instrumet is used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored.
Krautkramer USM 25
Contact assignment of the LEMO-1B socket

Contact Description 1 SAP 2 alarm gate a 3 alarm gate b 4 unassigned 5 unassigned 6 TDR 7 Analog output, amplitude or time of flight (selectable via remote-control code, see chapter 8.4 Remote Control) 8 GND
8-2
Signal direction Output Output Input Output
Level TTL TTL TTL active high 0-5V
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Data exchange
8.2 RS232 interface

The USM 25 has a RS232 interface for remote control and documentation (report printout).
Contact assignment of the Sub-D socket

Contact Designation Level Signal direction
View of the 9-way Sub-D socket RS 232 RS 232 RS 232 RS 232 RS 232 RS 232
1 2 3 4 5 6 7 8 9
unassigned RXD TXD DTR Ground DSR RTS CTS unassigned
Input Output Output Input Output Input
H Note: Switch off the instrument before connecting a cable to the RS232 socket or before withdrawing any plugs.
Data exchange
8.3 Data exchange

Connecting a printer or a PC
You can connect the USM 25 to a printer or a PC using the special Krautkramer cables: PC: Printer: UD 20 (25-pin) or UD 31 (9-pin) UD 31 (Seiko DPU) or UD 32 (Epson)
Printing data
The USM 25 enables a direct printout of data, for example a report including the echo display and the instrument settings. To do this, select the printer driver in the function PRINTER (function group CFG1) and just press the Y key after having initialized and activated the printer. The data selected by you in the function COPYMOD (function group CFG1) are printed. For more details on this, please refer to chapter 6.
Please refer to chapter 2.
The data transmission parameters are fixed in the USM 25 and cannot be changed: Baud rate: 9600 Word length: 8 data bits Parity: none The settings on the USM 25 apply to most of the printers and PCs. To ensure a perfect communication, please check the settings of the connected peripherals and adjust them to the parameters of the USM 25.
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Remote control

The USM 25 transmits the value of the current setting. Entry of a new value or state of a function using the command structure:
<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>
8.4 Remote control

You can use a connected PC for the remote control of the USM 25. The data transfer is carried out by means of a remote control program and the corresponding remote control commands. These commands represent instructions referring to the individual functions of the USM 25. The program Crosstalk can for example be used as remote control program under DOS. In Windows based systems it is possible to use e.g. the Terminal program. After the remote control program has been started and the program interface has been configured, the commands are input via the keyboard of the computer. In this connection, please observe the following differentiation: Interrogation of a value or state of a USM 25 function using the command structure:
<ESC><COMMAND> <RETURN> Krautkramer USM 25
All values are entered or transmitted by the USM 25 without a comma or a point. The resolution of the function should therefore be observed with all values. The resolution of a function applies to the entire value range of that function. A resolution of 0.01 means: The USM 25 transmits the value of a function multiplied by the factor of 100. The entry of a value must be done multiplied by the factor of 100. Examples Setting of the display delay to 72.39 mm: <ESC>dd 7239 <RETURN>
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8-5

Setting of the display width to 72.3 mm: <ESC>dw 7230 <RETURN> Setting of the display width to 192 mm; <ESC>dw 19200 <RETURN> A resolution of 0.1 means: The USM 25 transmits the value of a function multiplied by the factor of 10. The entry of a value must be done multiplied by the factor of 10. Example: Setting of the gain to 51.5 dB <ESC>db 515 <RETURN> A resolution of 1 means: The USM 25 transmits the value of a function without multiplication. The entry of a value must be done without any multiplication. Example:
Remote control
Setting the response threshold of gate a to 41 %: <ESC>at 41 <RETURN>
Functions and remote control codes

Presettings are in bold-face type. You will find a brief description of all functions in chapter 9.1 Function directory. If not otherwise stated, all values refer to steel, C = 5920 m/s. The functions marked with * are only available in the USM 25 DAC and USM 25S (DAC evaluation), the functions marked with ** are only available in the USM 25S (DGS evaluation). Functions which are only availabe in connection with the Data Logger option are marked with *** (please also refer to the section Remote control in chapter Option Data Logger on this subject).
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Remote control Function aLOGIC Code Range / Default M 0 = off 1 = pos 2 = neg -25 to +25 dB / 0 0 = 0 volt 1 = 5 volts 0 - 90 / 0 0 1 2 3 4 5 6 = stndard = compare = envelop = peak b = afreeze = bfreeze = cfreeze*** 0.1 bSTART A-SCAN AS 1 bTHRSH 2T 2D Resolution 1 Function ATT-OBJ** aWIDTH 0.1 bLOGIC ANAMODE AQ 2L

Code Range / Default AO AW 0 - 100 dB/m / 0 0.1 - 9999 mm / 40 0.004 - 250 / 1.500 0 = aus 1 = pos 2 = neg 3 = a trig 0 - 9999 mm / 85 0 - 250 / 3.500 10 - 90 % / 30 -90 - -10 % additionally with rf 0.1 - 9999 mm / 40 0.004 - 250 / 1.500 read only alphanumerical input 0 = off 1 = on 1 Resolution 0.1 0.01 0.001 1
AMPLCOR** AC
ANGLE
PA
0.01 0.001 1
bWIDTH
2W
0.01 0.001
aSTART
AD
0 - 9999 mm / 35 0 - 250 / 1.500 10 - 90 % / 40 -90 - -10 % additionally with rf 0 - 100 dB/m / 0
0.01 0.001 1
CAL COMMENT
CA CO CP
aTHRSH
AT
COMPARE 0.1
ATT-REF**
AR
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Function CONTR COPYMOD Code Range / Default LC CM 0 - 100 / 50 0 = hardcpy 1 = report 2 = meas P1 3 = pardump 4 = PCX 5 = store 6 = datalog*** 7 = off 8 = special 0 = off 1 = DAC 2 = TCG 0 - 10 / 0 0 = low 1 = high alphanumerical input numerical input e.g. 26-01-99 6.5 ... 20 dB 0.1 Issue 07, 07/2003 Resolution 1 1 D-DELAY DD -10 - 1024 mm / 0 -0.3 - 40 / 0 0 = off 1 = on 1000 - 15000 m/s /2730 Function Code Range / Default 3 - 35 mm / 9.7 inch 0.120 - 1.400 / 0.380
Remote control Resolution 0.01 0.001 0.01 0.001 1
D eff** XD only for probe-# 0
DELETE
EA
DEL-VEL** VV only for probe-# 0 1 DIAMET OD
DACMOD *
TM
10 - 2000 mm / 0.4 - 800 800.01 = flat 0.5 - 35 mm / 3.0 0.02 - 1.400 / 0.1 0 = off 1 = on 0 = off 1 = on
0.1 / 0.01
DGS-CRV** DACECHO * TE DAMPING PG 1 1 DGSMOD**
DU DS
0.01 0.001 1
DATNAME DATE
DN DE
DGS-REF**
DR
DBSTEP 8-8
ST
Krautkramer USM 25
Remote control Function DIALOG Code Range / Default DG 0 = German 1 = English 2 = French 3 = Italian 4 = Spanish 5 = Portuguese 6 = Dutch 7 = Swedish 8 = Slovenian 9 = Romanian 10 = Finnish 11 = Czech 12 = Danish 13 = Hungarian 14 = Croatian 15 = Russian 16 = Slovakian 17 = Norwegian 19 = Polish 0 = off 1 = on 0 = DAC 1 = DGS 2 = REF Resolution 1 Function FILLED

Code Range / Default FI 0 = off 1 = on 10 - +30 / 0 alphanumerical input 0 - 999 mm / 0 0 - 40 / 0 0 1 2 3 = = = = 0.5 - 4 MHz 2 - 20 MHz 0.8 - 8 MHz 0.2 - 1 MHz 0.01 0.001 1 Resolution 1
FINE G FLAWIND FLAWLEN
FG FB FL
FREQU
FR
GAIN HORN 1 LIGHT 1 MAGNIFY
DB HO
0 - 110 dB / 30 0 = off 1 = on 0 = off 1 = on 0 = off 1 = aGAT 2 = bGAT
0.1 1
DUAL
DM
LT
EVA-MOD
EM
MA
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Function MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4 MTLVEL Code Range / Default M1 M2 M3 M4 SV Setting range see S-DISP Resolution Function PRF-MOD Code Range / Default PF 10 steps: 0 = step 1 1 = step 2 2 = step 3 3 = step 4 4 = step 5 5 = step 6 6 = step 7 7 = step 8 8 = step 9 9 = step 10
Remote control Resolution
1000 - 15000 m/s / 5920 40 - 600 /ms / 233 alphanumerical input 0 - 14 dB / 0 alphanumerical input 0 - 199.99 s / 0 0 = low 1 = high 0.5 - 10.0 MHz alphanumerical input
1 0.1
OBJECT OFFSET * OPERAT P-DELAY POWER
OB TO PE PD PI
0.5 PROBE-#** 0.01 1 PB
PRBFREQ** XF PRBNAME** PN
0.04
0 = variable / alphanumerical input 1 = B1-S 15 = SWB70-2 2 = B2-S 16 = SWB45-5 3 = B4-s 17 = SWB60-5 4 = MB2-S 18 = SWB70-5 5 = MB4-S 19 = WB45-1 6 = MB5-S 20 = WB60-1 7 = MWB45-2 21 = WB70-1 8 = MWB60-2 22 = WB45-2 9 = MWB70-2 23 = WB60-2 10 = MWB45-4 24 = WB70-2 11 = MWB60-4 12 = MWB70-4 13 = SWB45-2 14 = SWB60-2
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Remote control Function PRINTER Code Range / Default PR 0 1 2 3 = Epson = HP Laserjet = HP Deskjet = DPU-41x Resolution 1 Function REFMODE

Code Range / Default RO 0 = off 1 = on 0.5 - 10 mm / 3 0 - 80 % / 0 0 = measval 1 = snd-pth. 2 = div. 0 = off 1 = Sa 2 = Sb 3 = Sc*** 4 = Sc-a*** 5 = Sc-b*** 6 = Sc-c*** 7 = Ha % 8 = Hb % 9 = Hc %*** 10 = Ha dB 11 = Hb dB 12 = HC dB*** 13 = R-start 14 = R-end 15 = Da 1 0.01 1 Resolution
REFSIZE** REJECT 0.01 0.001 SCALE
RS RJ SE
RANGE
DW
0.5 - 4 MHz / 0.2 - 1 MHz: 0.5 - 9999 mm / 250 0.02 - 390 / 10 2 - 20 / 0.8 - 8 MHz: 0.5 - 1420 mm / 250 0.02 - 56 / 10
0.01 0.001 1
S-DISP
VS
RECALL
RD
0 = off 1 = on 0 = full-w 1= pos hw 2 = neg hw 3 = rf 0 = no ref. 1 = ref. stored 0 = BW 1 = SDH 2 = FDH
RECTIFY
RF
REFECHO
RC
REFECHO** RE
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8-11

Function Code Range / Default 16 = Db 17 = Dc*** 18 = Pa 19 = Pb 20 = Pc*** 21 = Ra 22 = Rb 23 = Rc*** 24 = ERS 25 = Gt dB 26 = Ha %Crv 27 = Hb % Crv 28 = Hc % Crv*** 29 = alarm 30 = DGS-crv 31 = freeJob 32 = freeLoc 33 = freeAsc 34 = freeLoJ 35 = lastLoc 36 = La 37 = Lb 38 = Lc Resolution Function SET-# S-REF1 Code Range / Default ND R1 1 - 200 / 1 0 - 5000 mm / 50 0 - 200 / 2.0 0 - 5000 mm / 100 0 - 200 / 4.0 0 = off 1 = on 0 = off 1 = on alphanumerical input -24 - +24 dB / 0 1 - 9999 mm / 25 0.05 - 400 / 1
Remote control Resolution 1 0.01 0.001 0.01 0.001 1
S-REF2
R2
STO-INF
SC
STORE
SD
SURFACE T-CORR * THICKNE
SU DC TH
0.5 0.01 0.001
TIME TOF
TI AF
numerical input, e.g. 12:30:00 0 = flank 1 = peak 1
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Krautkramer USM 25
Remote control Function UNIT Code UN Range / Default 0 = mm 1 = inch 0 - 999 mm / 0 0 - 40 / 0 0 - 30 mm / 0 0 - 40 / 0 0 - 999 mm / 0 0 - 40 / 0 Resolution 1
Other remote control codes

Code AP Function/description Analog output setting 0 = amplitude 1 = time of flight A-scan amplitudes transferred as binary data Read Read Read Read Read value value value value value form measurement line (position form measurement line (position form measurement line (position form measurement line (position displayed in the A-scan 1) 2) 3) 4)
X-POS
XP
0.01 0.001 0.01 0.001 0.01 0.001 DA E1 E2 E3 E4 E5 EV
X-VALUE
XV
Y-POS
YP
Read alarm LED status: 0 = no alarm 1 = alarm in A 2 = alarm in B 3 = alarm in A+B Editable header data from report transferred as ASCII-format data Set information line in the startup screen Set information line in the startup screen (up to 39 characters)
HD
I1 I2
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8-13

Code ID TF Function/description Read instrument software version Freeze on/off: 0 = off 1 = on Zoom on/off: 0 = off 1 = on Send data set as binary data Read data set as binary data Scroll home: selection of the first function in every function group and of the left function group in every function group line.
Remote control
Control codes for the function keys

Function Key Code Range
Left-hand rotary knob/ G+ gain GRight-hand rotary knob dB-STEP V K+ KDP
increment decrement increment decrement 0 = 0.0 1 = 0.5 2 = 1.0 3 = 2.0 4 = 6.0 5 = 6.5 - 20 off / on off / on off / on 1st/2nd operation level
Krautkramer USM 25
TZ
UD UR SL
FREEZE ZOOM MTLVEL level

8-14 Issue 07, 07/2003
W X Y E
F Z C 10
Remote control Function Key Code Function Key

Code MSEL
BASE PULS RECV aGAT bGAT CAL DAC/DGS TRIG MEM DATA MEAS
u u u u u u u u u u u
5 6 7 8 9 5 6 7 8 9 5
MSEL LCD CFG1 CFG2
u u u u
6 7 8 9
Function
Key
Code
first second third fourth
v v v v
1 2 3 4
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8-15
Remote control
A Attention:
In rare cases concerning remote control sequences, reading measurement values directly after changing a function value in the USM 25, there could be errors as long as the instrument has not ended setting the value. In such cases, additional commands must be inserted into the remote control sequence before the measurement values are read. Example: If you create a remote control sequence, by which the sound path of an echo is read after freezing the A-scan, the command chain would be as follows:
Command <ESC>F<RETURN> <ESC>E3<RETURN> <ESC>F<RETURN> ... Answer Description A-scan freeze Read sound path Disable A-scan freeze
In the interests of security, insert additional read commands before reading the sound path, e.g.:
Command ... <ESC>F<RETURN> <ESC>DB<RETURN> <ESC>DB<RETURN> <ESC>DB<RETURN> <ESC>DB<RETURN> <ESC>E3<RETURN> <ESC>F<RETURN> ... Answer Description
580 580 580 580 50,74
A-scan freeze Read dB setting Read dB setting Read dB setting Read dB setting Read sound path Disable A-scan freeze
50,74
With these measures you ensure that sufficient time has passed in order to completely execute the previous command (display freeze) before transferring the sound path. Finally, check your remote control sequence to see that the measurement values can be correctly read, and add further read commands if necessary.
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Appendix
Krautkramer USM 25
Issue 07, 07/2003
9-1
Appendix
Function directory Function ATT-OBJ** Function group DGS Description Sound attenuation in the test object Width of the gate A Evaluation logic in the gate B Starting point of the gate B Starting point of the gate B Width of the gate B Semiautomatic calibration Setting the LCD contrast Assignment of the Y key Recording of a reference echo for the DAC Activating/deactivating DAC Damping of the probes oscillating circuit
9.1 Function directory

The functions marked with * are only available on the USM 25 DAC / USM 25S (DAC evaluation mode), those market with ** are exclusively available on the USM 25S (DGS evaluation mode).
Function aLOGIC AMPLCOR** ANAMOD ANGLE Function group aGAT DGS CFG2 TRIG Description Evaluation logic of the gate A Amplitude correction Setting of the analog output Entry of the angle for calculating the (reduced) projection distance (angle-beam probes) Settings of the A-scan
aWIDTH bLOGIC bSTART bTHRSH bWIDTH CAL CONTR COPYMOD DACECHO *
aGAT bGAT bGAT bGAT bGAT CAL LCD CFG1 DAC
A-SCAN aSTART aTHRSH ATT-REF**
MEAS aGAT aGAT DGS
Starting point of the gate A Threshold of the gate A Sound attenuation in the reference block DACMOD * DAMPING DAC PULS
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Function directory Function DATE dBSTEP D-DELAY D eff** Function group CFG2 RECV BASE DGS Description Current date User-programmable gain step EVA-MOD Setting of the display start FILLED Effective element diameter of the probe used FINE G DELETE DEL-VEL** DGS-CRV** MEM DGS DGS Deleting a stored data set steps Material velocity for prbe delay FREQU Recording curve for DGS evaluation mode GAIN DGS-REF** DGS Recording of DGS reference echo HORN DIALOG DIAMET CFG1 TRIG Selecting the language Change between plane-parallel and circular curved test components Dataset directory LIGHT MAGNIFY LCD MEAS left-hand rotary knob CFG2 RECV RECV LCD CFG2 Function DUAL Function group PULS Description
Appendix
Separation of pulser and receiver Switchover REF DAC DGS Selecting the echo display mode (filled or normal) Fine adjustment of gain within a range of approx. 4 dB in 40
Selecting the frequency range for the connected probe Setting of the gain
Switching the acoustic alarm signal on/off Switching the backlight on/off Gate spreading
DIR
DATA
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9-3
Appendix
Function MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4 MTLVEL Function group MSEL Description Selection of measured values at four positions of the measurment line Function RANGE Function group BASE Description
Function directory
Setting of the range in which the measurement is made. Retrieving a stored data set Selection of rectification For storing a reference echo for the measurement of dB difference Type of the reference reflextor used Activation of echo comparison Size of the reference reflector Suppression of unwanted or spurious echo indications Choice of display mode for the measurement line Zoomed display of a selected parameter
RECALL BASE Setting of the material sound velocity Compensating for the probe delay line Setting the power of the initial pulse Probe frequency Dataset preview with A-scan Setting the pulse repetition frequency Probe number Selecting the printer for the test report REFECHO** RECTIFY REFECHO
MEM RECV REF
P-DELAY
BASE
POWER
PULS
DGS
PRBFREQ** PREVIEW PRF-MOD
DGS DATA PULS
REFMOD REFSIZE** REJECT
REF DGS RECV
PROBE-#** PRINTER
DGS CFG1
SCALE
LCD
S-DISP
MEAS
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Krautkramer USM 25
Function directory Function SET-# SETTING S-REF1 S-REF2 STORE T-CORR * Function group MEM Data CAL CAL MEM DAC Description Number of the data set Display of a function list X-VALUE Reference echo 1 for calibration Reference echo 2 for calibration Saving the data set Sensitivity correction, e.g. to compensate for transfer losses Saving additional information Entry of workpiece thickness for calculation of real flaw depth Current time Selection of the measuring point for the gate TRIG Function UNIT Function group CFG1 Description
Appendix
Selecting the unit of measurement mm or inch Entry of the distance between probe index (sound exit point) and leading face of the angle-beam probe
TESTINF THICKNE
DATA TRIG
TIME TOF
CFG2 MEAS
Krautkramer USM 25
Issue 07, 07/2003
9-5
Appendix
EC declaration of conformity
9.2 EC declaration of conformity

We declare that the USM 25 conforms to the following European directives: 1. 89/336EEC -Electromagnetic compatibility2. 73/23/EEC, amended by the directive 93/68/EEC Low-voltage directiveThe conformity of the above-mentioned product with the regulations of the directive 89/336EEC is proven by the observance of the standard specifications EN 55011 12/1998 Class A, Group 2 and EN 50082-2 02/1996. The conformity of the above-mentioned product with the regulations of the directive 73/23/EEC, amended by the directive 93/68/EEC, is proven by the observance of the standard specifications EN 61010 Part 1 03/1994 and EN 61010-1/A2 05/1996.
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Krautkramer USM 25
Manufacturer/Service addresses
Appendix
If there is anything special that you would like to know about the use, handling, operation and specifications of the instruments, please contact your nearest Krautkramer Ultrasonic Systems representative or directly: Agfa NDT GmbH Krautkramer Ultrasonic Systems Service-Center Robert-Bosch-Str. 3 D 50354 Hrth or: Postfach 1363 D 50330 Hrth Phone +49 (0) 22 33 - 601 111 Fax +49 (0) 22 33 - 601 402 E-Mail Hotline@AgfaNDT.de
9.3 Manufacturer/ Service addresses

The Krautkramer USM 25 is manufactured by: Agfa NDT GmbH Robert-Bosch-Str. 3 D 50354 Hrth Phone +49 (0) 22 33 - 601 111 Fax +49 (0) 22 33 - 601 402 The USM 25 is manufactured according to state-of-theart methods using high-quality components. Thorough in-process inspections or intermediate tests and a quality management system certified to DIN EN ISO 9001 ensure an optimum quality of conformance of the instrument. Should you nevertheless detect an error on your instrument, switch the instrument off and remove the batteries. Inform your local Krautkramer Ultrasonic Systems Service indicating the error and describing it. Keep the shipping container for any repairs possibly required which cannot be made on the spot.
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9-7
Appendix
France Agfa NDT S.A. SAC Sans Souci 68, Chemin des Ormeaux F 69760 Limonest Phone +33 4 72 - 17 92 20 Fax +33 4 78 - 47 56 98 USA
Manufacturer/Service addresses
Agfa NDT Inc. 50 Industrial Park Road USA Lewistown, PA 17044 Phone +1 717 - 242 03 27 Fax +1 717 - 242 26 06
Great Britain Agfa NDT Ltd. Milburn Hill Road University of Warwick Science Park GB Coventry CV4 7HS Phone +44 24 - 7669 00 69 Fax +44 24 - 7669 30 32
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Changes
10
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10-1
Changes
This chapter contains the latest changes or additions if any. Otherwise this chapter remains empty.
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Index
11
Krautkramer USM 25
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11-1
Index
A
a trig triggering by an interface echo ............................5-17 A-Scan setting the A-scan ..............................................5-44 Accessories ............................................................ 2-5 Addresses............................................................... 9-7 Adjustment range function directory ................................................. 9-2 Adustment coarse and fine .................................................... 4-7 aGAT (function group) ............................................5-16 aLOGIC evaluation logic gate A .......................................5-17 Analog output ................................................. 5-54, 8-2 ANAMOD ...............................................................5-53 ANGLE angle of incidence ..............................................5-31 Anticoincidence .....................................................5-17
11-2
aSTART ................................................................. 5-27 starting point of gate A .......................................5-18 aTHRSH Threshold of gate A ............................................ 5-18 aWIDTH width of gate A ...................................................5-18
B
Backlight ................................................................5-47 BASE (function group) ............................................ 5-6 Basic settings ......................................................... 4-9 Batteries ................................................................. Care .................................................................... Charging the NiCd batteries ................................. Inserting batteries ................................................ 1-3 7-2 7-2 3-3
bGAT (function group) ............................................ 5-16 bLOGIC evaluation logic gate B ....................................... 5-17 bSTART starting point of gate B .......................................5-18
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Index
bTHRSH Threshold of gate B ............................................ 5-18 bWIDTH width of gate B ...................................................5-18 Codes Codes for function keys ...................................... 8-14 Function codes .................................................... 8-6 Remote control .................................................... 8-5 Coincidence ........................................................... 5-17
C
CAL semiautomatic calibration ......................... 5-21, 5-24 Calibration .............................................................. 5-19 Dual-element (TR) probes ................................... 5-23 Straight-beam probes ......................................... 5-20 with unknown materials ...................................... 5-21 Care ........................................................................ 7-2 CFG1 (function group) ............................................ 5-49 CFG2 (function group) ............................................ 5-49 Changes ................................................................10-1 Charge indicator ...................................................... 3-3 Charging batteries ................................................... 3-3
Configuration ..........................................................5-49 for test applications ............................................ 5-41 Connecting a probe ................................................. 3-5 CONTR ................................................................... 3-6 LCD contrast ...................................................... 5-48 Controls .................................................................. 4-2 COPYMOD ...................................................... 6-3, 8-4 assignment of the COPY key ............................. 5-51
D
D-DELAY (Display starting point) ............................ 5-9 DAC (function group) ..............................................5-58 DACECHO recording reference curve ................................... 5-60
11-3
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Index
DACMOD activating DAC/TCG ...........................................5-59 DACMOD (activating DAC) ....................................5-58 DAMPING (Probe matching) ..................................5-11 DATA (function group) ............................................5-36 Data exchange ........................................................ 8-4 Data saving ............................................................5-33 Data set Deleting ..............................................................5-34 Management ......................................................5-36 Storing ................................................................5-34 Data transfer ........................................................... 6-4 DATE setting the gate ..................................................5-52 Date set Recalling ............................................................5-35 dBCORR (sensitivity correction) .............................5-61 DBSTEP ................................................................5-14 Defects ................................................................... 1-3
Deleting a reference echo ...................................... 5-29 Depth .....................................................................5-30 DGS evaluation (USM 25S) ....................................5-63 DIALOG selecting the language ......................................... 4-9 DIALOG (Selecting the language) .......................... 5-50 DIR directory of stored data sets ...............................5-36 DIR (dataset directory) ...........................................5-40 Display .................................................................... 4-3 Backlight ............................................................ 4-10 Display range .......................................................... 5-6 Display starting point .............................................. 5-9 Distance-amplitude curve .......................................5-58 DUAL pulser-receiver separation ................................... 5-12 DUAL (Pulser-receiver separation) .........................5-11
Index
E
EC declaration ........................................................ 9-6 Echo display ..........................................................5-47 Enlarged echo display ........................................5-55 Zoom mode ......................................................... 4-3 Enlarged display of measurement value ......................................... 4-5 Errors ...................................................................... 1-3 Evaluation logic of the gates .................................. 5-17 EVAMOD ...............................................................5-54
Freeze function ...................................................... 5-55 FREQU Frequency range .................................................5-15 Frequency range ....................................................5-15 Function directory ................................................... 9-2 Function groups ....................................... 4-4, 4-7, 5-3 Functions ................................................................ 4-4 Function directory ................................................ 9-2 Overview ............................................................. 5-2 Setting the functions ........................................... 4-7 Special keys ...................................................... 5-55
F
FILLED echo display .......................................................5-47 FILLED (Echo display mode) .................................5-47 FINE G (fine adjustment of gain) ............................5-13 Flaw evaluation ....................................................... 1-7 Flaw position calculation ........................................5-30
Krautkramer USM 25
G
Gain ........................................................................ 5-5 Fine adjustment .................................................. 5-13 Incrementation ..................................................... 5-5 Gate setting ........................................................... 5-16 Gates ..................................................................... 5-16 starting point ...................................................... 5-18 width ...................................................................5-18
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Index
H
HORN acoustic alarm ....................................................5-53
L
Language ................................................................ 4-9 LCD (function group) ..............................................5-46 LCD contrast ........................................................... 3-6
I
Instrument versions ................................................ 1-9 Intefaces RS232 interface ................................................... 8-3 Interface echo ........................................................5-17 Interfaces I/O interface ........................................................ 8-2
Lemo socket ........................................................... 8-2 LIGHT LCD backlight ..................................................... 5-47 switching the backlight .......................................4-10 Limits ...................................................................... 1-5
M
MAGNIFY gate spreading ....................................................5-44 Maintenance ........................................................... 7-4 Manufacturer ........................................................... 9-7 Material velocity ...................................................... 5-8 MEAS-P1 to P4 ...................................................... 4-5
K
Keys ....................................................................... 4-6 Special keys ......................................................5-55
11-6
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Krautkramer USM 25
Index
Measurement line ........................................... 4-5, 5-42 configuration .......................................................5-45 Measuring .............................................................. 5-26 Measuring point ..................................................... 5-19 MEM (function group) .............................................5-33 MSEL (function group) ...........................................5-45 MTLVEL (Material velocity) ..................................... 5-8 Multiple DAC ..........................................................5-61
P
P-DELAY (Probe delay) ......................................... 5-10 POWER (Intensity) ................................................ 5-11 Power supply .......................................................... 3-2 PREVIEW dataset preview ........................................ 5-36, 5-39 PRF-MOD pulse repetition frequency ................................... 5-12 PRF-MOD (Pulse repetition frequency) .................. 5-12
O
OFFSET distance of multiple DAC ....................................5-62 OFFSET (distance of multiple DAC) ......................5-61 Operating levels overview .............................................................. 5-2 Operator training ..................................................... 1-4 Operator's controls .................................................. 4-2
PRINTER selecting the printer driver ..................................5-51 Printer preparing ............................................................. 6-2 PRINTER (Printer for test report)............................5-47 Printer connection ................................................... 8-4 Printing ................................................................... 8-4 Printing data ............................................................ 6-2 Probe connection .................................................... 3-5
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Index
Probe delay ............................................................5-10 Probe matching ......................................................5-11 Projection distance ................................................5-30 PULS (function group) ............................................5-10 Pulse repetition frequency ......................................5-12 Pulser adjustment ..................................................5-10 Pulser-receiver separation ......................................5-12 REFECHO .............................................................5-27 REFMOD ...............................................................5-27 REJECT ................................................................5-14 Remote control ........................................................ 8-5 Reset ...................................................................... 3-6 Rotary knobs........................................................... 4-8
S R
RANGE (Display range) .......................................... 5-7 Recalling a data set ...............................................5-35 Receiver adjustment ..............................................5-13 RECORD (recording reference curve) .....................5-59 RECTIFY ...............................................................5-15 RECTIFY (rectification) ..........................................5-15 RECV (function group) ...........................................5-13 Reduced projection distance ..................................5-30
S-DISP ................................................................... 4-5 S-DISP (zoomed display of reading) ......................5-42 Safety information ................................................... 1-2 SCALE ...................................................................5-48 Screen .................................................................... 4-3 Semiautomatic calibration ............................ 5-21, 5-24 Sensitivity correction .............................................5-61 Service ................................................................... 9-7
Index
SETTING function list .........................................................5-40 setting function list .........................................................5-36 Sound attenuation (DGS) .......................................5-70 Standard package ................................................... 2-3 Start-up ................................................................... 3-6 Storing a data set ...................................................5-34 Sub-D socket .......................................................... 8-3 SVEL1 (fixed sound velocity) .................................5-43 Switching on/off ...................................................... 3-6 Symbols in this manual ..................................................... 1-12 LED .................................................................... 5-56 Status symbols .......................................... 4-5, 5-56
T
T-CORR sensitivity correction (DAC) ................................ 5-61 transfer correction (DGS) .................................... 5-69 TCG ....................................................................... 5-59 Temperature ............................................................ 1-6 Test report .............................................................. 6-3 Test requirements ................................................... 1-5 TESTINF additional information for stored data sets ..........5-36 THICKNE material thickness ..............................................5-32 Threshold of the gates ........................................... 5-18 TIME setting the time .................................................. 5-52 TOF selecting the measuring point ............................. 5-42 Transfer correction (DGS) ...................................... 5-69 TRIG (function group) ............................................. 5-30
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Index
U
Ultrasonic testing .................................................... 1-4 UNIT Units of measurement ........................................5-49 Units ....................................................................... 4-9
W
Wall thickness ........................................................ 1-6 Width of the gates ..................................................5-18
X
X-position ...............................................................5-38 X-VALUE of the probe ........................................................ 5-31
Z
Zoom mode ............................................................. 4-3
Option Data Logger
Krautkramer Option Data Logger (USM family)
Issue 03, 06/2003
O-1
Contents
1 Introduction ...................................... O-5

1.1 The option Data Logger ........................... O-6 1.2 The Data Logger ....................................... O-6 1.3 Monitoring measured values ................... O-7 1.4 The third gate ........................................... O-7 1.5 Acoustic acknowledgement .................... O-7 1.6 Overview of the functions ........................ O-8
2.2 Recording measured values (LOGG) .... O-16 Choosing a test job (JOB) ........................ O-16 Choosing a location (LOCAT) ................... O-16 Choosing a result (COMMENT) ................ O-16 Saving a measured value (MEASVAL) ..... O-17 2.3 Displaying measured values (VIEW) ..... O-20 Choosing a test job (JOB) ........................ O-20 Choosing a location (LOCAT) ................... O-20 Reading the result (COMMENT) ............... O-21 Reading the measured value (MEASVAL) ............................................. O-21 2.4 Clearing or deleting all jobs .................. O-21 Clearing all jobs (CLR-ALL) ...................... O-21 Deleting all jobs (DEL-ALL) ...................... O-22
2 Operating the Data Logger .............. O-9

2.1 Managing a test job (JOBS) ................... O-10 The screen panel JOBEDIT ..................... O-10 Setting up a test job ................................. O-12 Creating a test job .................................... O-13 Clearing a test job .................................... O-14 Deleting a test job .................................... O-15 Activating the Data Logger (DAT-LOG) ...... O-15
3 Other functions ............................... O-23

3.1 Monitoring the measured values (TOL) O-24 Defining the lower limit value (MIN-TOL) .. O-25 Defining the upper limit value (MAX-TOL) O-25
O-2
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Contents
Activating the tolerance monitor (TOL-MON) .............................................. O-26 Activating the minimum reading capture mode (MIN-CAP) ......................... O-27 3.2 Setting the gate (cGAT) .......................... O-28 Evaluation logic of the gate C (cLOGIC) .. O-28 Starting point of the gate (cSTART) ......... O-29 Width of the gate (cWIDTH) ..................... O-29 Response and measuring threshold of the gate (cTHRSH) .............................. O-29
4 Documentation ............................... O-31

4.1 Printing out the test report .................... O-32
5 Remote control ............................... O-33

5.1 Remote control....................................... O-34 5.2 Functions and remote control codes .... O-34
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Contents
O-4
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Introduction
Issue 03, 06/2003
O-5
Introduction
The Data Logger
1.1 The option Data Logger

The option Data Logger makes an additional operating level available to you. It includes the five function groups JOBS, LOGG, VIEW, TOL and cGAT. The groups JOBS, LOGG and VIEW serve for the operation of the Data Logger. The group TOL enables the monitoring of the measured values by means of a tolerance monitor and minimum reading capture mode. The group cGAT serves for the configuration of a third gate. The option Data Logger can be added to all instrument versions of the ultrasonic flaw detectors USM 25 (from serial number 1500 up), USM 23, USM 23Ex and USM 35.
1.2 The Data Logger

The Data Logger gives you the possibility of easily managing test jobs as well as storing and documenting the test results. Using test jobs that you have clearly and explicitly named and described, you can record, display, and print out measured values. In this way, you can selectively access readings that yourre looking for. You can create up to 100 test jobs. The total storage capacity is 5000 measurement values plus 500 A-scans. Further you can create an individual comment list with 10 text lines (results) for each job. These results are linked to the measured values.
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Monitoring measured values
Introduction
1.3 Monitoring measured values

The Data Logger option provides you with an individually configurable tolerance monitor and the minimum reading capture mode to monitor measured values. The tolerance monitor will help you to ensure that the measured values are within an individually variable tolerance range. If this is not the case, an alarm is triggered. The minimum reading capture mode serves for the storage of the smallest sound path or the smallest sound path difference. The value remains stored until an even smaller value occurs. This function is useful with remaining wall thickness measurements on tubes.
1.4 The third gate

The Data Logger option makes an additional third gate available to you. The gate C is configured and used analogously to the two gates A and B that you already know. You can use the gate C e.g. for measurements of sound path differences between the gates B and C if the gate a is already occupied by another job (e.g. monitoring of the interface echo).
1.5 Acoustic acknowledgement

You can activate an acoustic acknowledgement for recording your measured values. Adjust the option beep in the function HORN. Recording of measured values is now acknowledged by a short acoustic acknowledgement signal. After saving the measured value with A-scan, a long acoustic acknowledgement signal will sound.
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O-7
Introduction
1.6 Overview of the functions

The functions of the Data Logger are located at the 4th operating level. You will recognize the 4th operating level by the small number 4 between the first and the second function field.
Function groups of the 4th operating level JOBS This is where youll find functions required for setting up and for editing your test jobs. LOGG This menu serves for the logging or recording of measured values in a test job. VIEW This menu serves for the representation of all measured values of a test job, including A-scan. TOL Functions for monitoring the measured values.
Besides the function groups of the Data Logger, there are two more function groups at the 4th operating level. The functions of the group TOL serve for the monitoring of measured values by means of a tolenrance monitor and a minimum reading capture mode. You can use the functions of the group cGAT to configure a third gate.
cGAT All functions for setting the gate C are to be found in this function group.
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Operating the Data Logger
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Managing a test job
2.1 Managing a test job (JOBS)

The functions of this group enable you to create, save, and delete test jobs. Moreover, you can use this function group to switch the Data Logger on or off. Use the Use key to go to the 4th operating level. to select the function group JOBS.
The screen panel JOBEDIT

This section gives you an overview of the functions that you can operate using the screen panel JOBEDIT. For information on how to create test jobs step by step, please read the next section. Select on in the function JOBEDIT. The screen panel JOBEDIT is displayed. The screen panel shows the settings belonging to the current test job.
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Managing a test job

Use these functions to manage your test jobs: DELETE CLEAR CREATE Deletes the test job having the current job number Clears all readings in the current test job, the test job itself is maintained Creates the test job with the current job number and the current settings
You can create and save the test jobs by means of the JOBEDIT screen panel. You can provide the test jobs with additional information in order to selectively access individual test jobs at a later date. This will offer you an easy way of data management. You have 9 data input fields at your disposal for creating test jobs. Enter numerical values in these fields: JOB-# ROW Number of the current test job Number of rows
H Note: Detailed information about entering charactes into field is given in chapter 5.11 or 5.12 in the operating manual of your ultrasonic flaw detector USM.
COLUMN Number of columns You can enter a maximum of 24 alphanumerical characters each in the following fields: JOB-NAM LOC-NAM Name of the current test job Name of the test location
COM-NAM The result text belonging to the result number
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Managing a test job
Setting up a test job

You can use the JOB-MEN screen to define a new test job. As an option, you can identify the test job with a name (24 characters) and link it to a stored instrument setting (data set). The job number is required for the job management. Job numbers that have already been assigned to a job are indicated by an asterisk. The new test job uses either no fixed instrument setting (DATA-# = 0) or the instrument settings of the data set assigned to it. Data sets that have already been created are indicated by an asterisk. Data sets used in test jobs are identified by a # sign. All data form an integral part of the test report. The name serves for an easy identification of the test job during the further course of work with the Data Logger. You should therefore choose a name which is as clear and definite as possible for the test job. You have to assign the number of the corresponding test locations, i.e. rows and columns, to every test job. In addition, you can give every test location a name. These data likewise form an integral part of the test report and facilitate the access to the measurement data.
You can file a maximum of 10 result texts at the result numbers 1 ... 10 for every test job. Every measured value can be linked to one of the result texts existing for this job. Proceed as follows in order to define a new test job: H Note: Please check that the job number is not occupied. Occupied jobs cannot be overwritten with new test jobs. If necessary, choose another job number. Adjust the required job number in the field JOB-#. Adjust the required job name in the field JOB-NAM. Choose the number of rows for the present test job in the field ROW. Choose the number of columns for the present test job in the field COLUMN.
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Managing a test job

H Note: The new test job uses the instrument settings saved to the data set (DATA-# not 0). Data sets that have already been created are indicated with an asterisk. If required, create a corresponding data set assigned to the test job you are about to generate. If you are recording measured values on the Data Logger, the default result number indicated is 1 for the result. You should therefore store the text for a positive result at the result number 1.
H Note: The maximum number of rows is 5,000 if no test job exists as yet and if the number of columns is set to A (= 1 column). The maximum number of columns is 26 (COLUMN = Z) with the product from the number of rows and the number of columns not being larger than the remaining free memory space. All inputs are checked immediately, and if the memory capacity is exceeded, there is a warning message No more free locations. Select a result number in the field COM-#. Enter the result text for the result number previously selected in the field COM-NAM. Type in the texts for other result numbers if necessary. Select the data set that you want to assign to this job in the field DATA-#. Keep DATA-# = 0 if you dont want to have any linking.
Creating a test job

After you have set all parameters for the new test job, you can create the test job. Only the test job whose job number is currently indicated in the field JOB-# is created in each case. Choose the option on in the field CREATE to create the new test job. The creation of the test job is confirmed by the following display message: Job is created
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H Note: After the test job has been created, the names of test locations are automatically generated according to the following pattern: LOC-# LOC-NAM 1, 2, 3, 4, ... A1, A2, A3, ... B1, B2, B3, ... Xn No more free locations
Managing a test job
This message indicates that the memory capacity would be exceeded with the specified values for ROW and COLUMN. Change the values or delete single or all jobs in order to obtain more free memory space.
Clearing a test job

You have the possibility of clearing the current test job. In this process, all readings are deleted from the test job. The test job itself is maintained. H Note:
You can now edit the names of the test locations as required. If one of the following error messages is shown, the test job could not be successfully created. CREATE blocked by JOB-# = *n This message indicates that a test job is already stored at the selected job number. Assign a free job number to the current test job, and create the test job. CREATE blocked by DAT-LOG = row (column) This message indicates that you can not create a new test job when the data logger is active. Switch off the data logger at first (DAT-LOG = off).
After clearing a job, you will not obtain any new memory location. This will continue to be reserved for the job. The reserved memory location will not be enabled again until after deleting the test job. Choose the option on in the field CLEAR in order to delete all readings from the test job. Clear job? is displayed. Confirm by pressing the corresponding function key once again.
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Managing a test job

If the Data Logger is on and a test job with a data set linked to it has been selected, many instrument functions will be blocked so that you can no longer operate them (interlocking). In the case of test jobs without data sets linked to them (DATA-# = 0) you can operate all instrument functions during the recording of measured values. H Note: The moment the Data Logger is activated, the test job currently selected in the menu LOGG is also activated. If applicable, the corresponding data set is loaded and the A-scan is displayed in the FREEZE mode. Release the A-scan using the key in order to start with the recording of measured values.
Deleting a test job

The field DELETE serves for the deletion of the current test job. The complete test job is deleted. Choose the option on in the field DELETE in order to delete the current test job. Delete job? is displayed. Confirm by pressing the corresponding function key once again.
Activating the Data Logger (DAT-LOG)

You have to switch on the Data Logger in order to work with the test jobs. The recording mode Row means that the location in the next row of the same column is selected after saving a measured value. The recording mode Column means that the location in the next column of the same row is selected after saving a measured value. Use the key to go to the 4th operating level.
Select Row or Column in the function DAT-LOG.
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Recording measured values
2.2 Recording measured values (LOGG)

This function group serves for the recording of measured values in previously created test jobs. Use the key Use to go to the 4th operating level.
Choosing a test job (JOB)

This is where you can choose the name of the test job for which you want to record measured values. Choose the required test job in the function JOB.
Choosing a location (LOCAT)

This is where you can choose a test location within the current test job. Choose the required test location in the function LOCAT.
to select the function group LOGG.
Choosing a result (COMMENT)

This is where you can choose a result for the current measurement. Choose the required result in the function COMMENT.
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Ha % Hb % Hc % Ha dB Hb dB Hc dB R-start R-end Da Db Dc Pa Pb Pc Echo height in the gate a in percentage of screen height Echo height in the gate B in percentage of screen height Echo height in the gate C in percentage of screen height Echo height in the gate A in dB Echo height in the gate B in dB Echo height in the gate C in dB Start of calibration range End of calibration range Depth in gate A Depth in gate B Depth in gate C Projection distance in gate A Projection distance in gate B Projection distance in gate C
Saving a measured value (MEASVAL)

You can display and save a selected measured value. The measured value to be stored must already be selected in the data set assigned to the test job. In the case of test jobs with no data set linked to them, you can freely choose the type of measured value to be stored even during the recording of measured values. The selected type of measured value is stored together with each measured value. You can choose between the following measured values in the function S-DISP (menu MEAS in the third operating level): Sa Sb Sc Sc-a Sc-b Sb-a Sound path in the gate A Sound path in the gate B Sound path in the gate C Sound path difference between the gates C and A Sound path difference between the gates C and B Sound path difference between the gates B and A
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Ra Rb Rc ERS Gt dB Ha %CRV Hb %CRV Hc %CRV Alarm DGS-crv freeJob freeLoc freeAsc Reduced projection distance in gate A Reduced projection distance in gate B Reduced projection distance in gate C Equivalent reflector size in gate C DGS reference gain Echo height in gate A in percentage referred to the DAC/DGS curve Echo height in gate B in percentage referred to the DAC/DGS curve Echo height in gate C in percentage referred to the DAC/DGS curve Gate alarms Diameter of the represented DGS curve Remaining memory capacity for free jobs Remaining memory capacity for free test locations Remaining memory capacity for free A-scans LastLoc La Lb Lc freeLoJ
Number of free locations in the current test job Last stored measurement value Number of legs in gate A Number of legs in gate B Number of legs in gate C
Attention!
When saving measured values, already stored values of the same location are overwritten after previous warning and confirmation with the storage key. H Note: After storing a measured value, the next test location is selected automatically. When reaching the last location of a test job this location will remain selected. You can store additional measured values by selecting new test locations with the function LOCAT coming from the last test location. Activate the function DAT-LOG in the function group JOBS.
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H Note: Due to the characteristics of the membrane key pad, it may be possible that one single press on a key may lead to a double or even multiple contact. Subsequently multiple storage of readings may occur, especially when a key is pressed not centrally.
Use
to select the function group LOGG
Select the desired test job in the function JOB. If necessary choose the test location for saving the measured value in the function LOCAT. Carry out the measuring. If necessary choose the result saved with the measured value in the function COMMENT. To save the measured value only press the storage key (key at USM 25 and USM 23, key in at USM 35). or Keep the storage key pressed down for more than 1 second in order to save the measured value and the A-scan (key at USM 25 and USM 23, key in at USM 35).
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Displaying measured values
2.3 Displaying measured values (VIEW)

This function group serves for displaying previously stored measured values. When you go to this menu, the screen display changes over to the preview mode. The A-scan (without gates) is shown on the left-hand side, when it has been stored with the selected measurement value. The functions of the current group are shown on the right-hand side. Use the key Use to go to the 4th operating level.
Choosing a test job (JOB)

This is where you can choose a test job in order to display the corresponding measured values. Choose the required test job in the function JOB.
Choosing a location (LOCAT)

This is where you can choose a location in order to display its measured values. Choose the required test location in the function LOCAT.
to select the function group VIEW.
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Displaying measured values
Reading the result (COMMENT)

Read the result for the current test location here.
2.4 Clearing or deleting all jobs

Clearing all jobs (CLR-ALL)
H Note: You can only read the result in this menu, but not edit it.
You have the possibility of clearing all test jobs. In this process, all measured values are removed from all test jobs. The test jobs themselves are maintained.
Reading the measured value (MEASVAL)

Read the currently measured value here. H Note: You can only read the measured values in this menu, but not record any new measured values.
Attention!
If you use the function CLR-ALL, youll delete all measured values from all test jobs. Use the key Use the key to go to the 4th operating level. to select the function group JOBS.
Choose the option on in the function CLR-ALL in order to delete all measured values. Clear all jobs? is displayed. Confirm by pressing the corresponding function key once again.
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Clearing or deleting all jobs
Deleting all jobs (DEL-ALL)

The function DEL-ALL serves for the deletion of all test jobs. All test jobs are completely deleted and are no longer available to you for subsequent tests. Use this function only if you are sure that all test jobs should be deleted.
Attention!
If you use the function DEL-ALL, youll irrevocably delete the test jobs. Before deleting, you should therefore check if all test jobs really should be deleted. Use the key Use the key to go to the 4th operating level. to select the function group JOBS.
Choose the option on in the function DEL-ALL in order to delete all test jobs. Delete all jobs? is displayed. Confirm by pressing the corresponding function key once again.
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Other functions
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Other functions
Monitoring the measured values
3.1 Monitoring the measured values (TOL)

Once the option Data Logger has been installed, youll have the function group TOL at your disposal for monitoring the measured values. You can set an upper and a lower tolerance limit, and in this way define a tolerance range for the measured value. If the measured value is outside this tolerance range, an alarm is triggered. The functions of this group enable you to monitor the following measured values. Sa Sb Sc Sound path in gate A Sound path in gate B Sound path in gate C Use the key Use to go to the 4th operating level.
to select the function group TOL.
Sc-a Sound path difference between gate C and gate A Sc-b Sound path difference between gate C and gate B Sb-a Sound path difference between gate B and gate A
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Other functions
Defining the lower limit value (MIN-TOL)

You have the possibility of entering a value for the lower limit of the tolerance monitor. If a measured value falls below this limit, an alarm is triggered. H Note: You can only change the values of the functions MIN-TOL and MAX-TOL, if the selected job is not linked to a data set. Adjust the required value in the function MIN-TOL.
Defining the upper limit value (MAX-TOL)

You have the possibility of entering a value for the upper limit of the tolerance monitor. If a measured value exceeds this limit, an alarm is triggered. H Note: You can only change the values of the functions MIN-TOL and MAX-TOL, if the selected job is not linked to a data set. Adjust the required value in the function MAX-TOL.
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Other functions
Activating the tolerance monitor (TOL-MON)

You can use this function to activate the tolerance monitor. The tolerance range is displayed as a line below the gate threshold. In this way, you can see whether the measured value is within the tolerance limits. H Note: The tolerance monitor may be blocked if the function FREEZE is switched on. Press the key in order to remove the blocking. If the tolerance monitor should be used in a test job that has a data set linked to it, the corresponding settings must be saved to the linked data set. The monitor alarm (LED A) now refers to the undertolerance or overtolerance values. That means that the alarm is only triggered if the measured value is outside the tolerance limits. If the measured value is within the tolerance limits, no alarm is triggered.
The choice of the option Alarm in the function S-DISP or MEAS-Px additionally enables the display of the undertolerance (Al = L) or overtolerance (Al = H) values. Set the required option in the function TOL-MON.
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Other functions
If the minimum reading capture mode should be used in a test job that has a data set linked to it, the corresponding settings must be saved to the linked data set. Set the required option in the function MIN-CAP. The activated minimum value capture is indicated by the status indicator M (inverted) to the right in the measurement row.
Activating the minimum reading capture mode (MIN-CAP)

You can use this function to activate the minimum reading capture mode. The smallest sound path or the smallest sound path difference of a measurement is stored in the minimum reading capture mode. The minimum reading is overwritten as soon as an even smaller value is measured. After the probe has been uncoupled, the minimum reading capture mode remains active for another 3 seconds. If you couple the probe back to the test object during this time and measure a smaller value, the previous minimum reading is automatically overwritten by the smaller value. If you do not couple the probe back again, the actual minimum readings is displayed inverted. With new coupling of the probe a new minimum value will be determined. The function MIN-CAP always stores the smallest measured value of a measurement, which is useful e.g. in the case of remaining wall thickness measurements on tubes. H Note: The minimum reading capture mode may be blocked if the function FREEZE is switched on. Press the key in order to remove the blocking.
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Other functions
Setting the gate
3.2 Setting the gate (cGAT)

Once you have installed the option Data Logger, you will have a third gate at your disposal. You will find all functions for the setting of the third gate in the function group cGAT. Use the key Use to go to the 4th operating level.
Evaluation logic of the gate C (cLOGIC)

In this function, you can choose the mode for triggering the gate alarm. The alarm is output via LED A on the front panel of the instrument. The five available setting options are: off Evaluation logic is off Alarm option and measurement functions are switched off; the gate is no longer visible. +koi Coincidence If the preset response threshold of the gate on the screen is exceeded, the alarm is output. -koi Anticoincidence If the preset response threshold of the gate on the screen is not reached, the alarm is output. a trig Triggered by gate A The gate C is attached to the event in gate A. b trig Triggered by gate B The gate C is attached to the event in gate B. Select the required setting in the function cLOGIC.
to select the function group cGAT.
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Setting the gate
Other functions
Determine the position of the gate at this point. The position is defined by means of three parameters: start, width and threshold.
Response and measuring threshold of the gate (cTHRSH)

You can determine the threshold value of the gate C which triggers the LED alarm when exceeded or not reached, depending on the setting of the function cLOGIC, viz. within the range from 10 to 90 % screen height. Adjust the required value in the function cTHRSH.
Starting point of the gate (cSTART)

You can determine the starting point of the gate C within the adjustment range from 0 to 9999 mm. Adjust the required value in the function cSTART.
Width of the gate (cWIDTH)

You can determine the width of the gate C within the range from 0.02 to 9999 mm. Adjust the required value in the function cWIDTH.
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Documentation
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Documentation
Printing out the test report
4.1 Printing out the test report

The ultrasonic flaw detector USM enables you to directly print out the currently selected test jobs from the Data Logger, or to send them to a PC. To do this, you have to set the value of the function COPYMOD to datalog and deactivate the function DAT-LOG. After that, you can choose a test job from the Data Logger in order to print it out. Use the key Use to go to the 3rd operating level.
Press the key
to print out the test job.
If necessary, select other test jobs, as described above, in order to print them out.
to select the function group CFG1.
Select datalog in the function COPYMOD. Use the key Use to go to the 4th operating level.
to select the function group JOBS.
Deactivate the function DAT-LOG in the function group JOBS. Use to select the function group LOGG.
Select the test job that you want to print out in the function JOB.
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Funktionen und Ferbediencodes
Fernbedienung
Remote control
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O-33
Remote control
Functions and remote control codes
5.1 Remote control

You can operate the functions of the option Data Logger in remote control mode via a connected PC. The data transfer is carried out by means of a remote control program and corresponding remote control commands. These commands represent instructions referring to the individual functions of the instrument. You will find more details on the remote control of the instrument in chapter 8 in the operation manual of your ultrasonic flaw detector.
5.2 Functions and remote control codes

Default settings are printed in bold type.
Attention!
Some functions use the same names. You should therefore make sure that you enter the correct codes. You should pay special attention to the correct entry of the codes for the following functions: LJ DJ JC JD for clearing the current test job (screen panel JOBEDIT) for deleting the current test job (screen panel JOBEDIT) for clearing all test jobs (function group JOBS) for deleting all test jobs (function group JOBS)
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Functions and remote control codes Function A-scan CLR-ALL Code Settings/Description D$ JC A-scan in menu VIEW (binary) 0 = off 1 = on 0 = off 1 = on number of columns in menu EDIT 1 (JOBEDIT) 1 ... 10 result no. in menu EDIT 2 (JOBEDIT) 1 ... 10 result no. in menu VIEW 1 ... 10 result no. in menu LOGG alphanumerical entry in menu EDIT 2 (JOBEDIT) 0 = off 1 = on 1 Resolution Function cLOGIC
Remote control
Code Settings/Description 3L 0 1 2 3 4 = = = = = off pos neg A trig B trig Resolution 1
CLEAR
LJ
cSTART cTHRSH cWIDTH
3D 3T 3W D# DL
0 ... 9999 mm 10 - 90 % / 30 0.02 ... 9999 mm 1 ... 200 0 = off 1 = row 2 = column 0 = off 1 = on 0 = off 1 = on job no. in menu VIEW job no. in menu LOGG
0.01 1 0.01 1
COLUMN
CL
COM-#
R#
1 DATA-# DAT-LOG
COMMENT
R$
COMMENT
R_
DEL-ALL
JD
COM-NAM
RN
DELETE
DJ
CREATE
CJ
JOB JOB
J$ J_
1 1
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Remote control
Function JOB-# Code Settings/Description J# job no. in menu EDIT 1 (JOBEDIT) 0 = off 1 = on alphanumerical entry in menu EDIT 1 (JOBEDIT) ROW LOC-# L# location no. in menu EDIT 2 (JOBEDIT) alphanumerical entry in menu EDIT 2 (JOBEDIT) location no. in menu VIEW location no. in menu LOGG 1 1 1 TOL-MON LOC-NAM LN TN RW Resolution 1 Function MIN-CAP
Functions and remote control codes Code Settings/Description MC 1 2 3 4 5 6 7 = = = = = = = off Sa Sb Sc Sc-a Sc-b Sb-a 1 Resolution
JOBEDIT
T6
JOB-NAM
JN
number of rows in menu EDIT 1 (JOBEDIT) 1 2 3 4 5 6 7 = = = = = = = off Sa Sb Sc Sc-a Sc-b Sb-a
LOCAT LOCAT LOCAT MAX-TOL MEASVAL MIN-TOL
L$ L_ JV T+ E$ T
reading in measured value (menu LOGG) 0 ... 5000 mm reading out measured value (menu VIEW) 0 ... 5000 mm
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Technical specifications according to EN 12668-1
USM 25 USM 25DAC USM 25S
Krautkramer
USM 25S_TM035041005_D - 1

Description Symbol Dimension Min Average Max Comment
Transmitter
Shape Spectrum Spectrum Spectrum Spectrum Damping 342 45 1000 50 Capacity Pulse Repetition Frequency PRF Mode PRF step Operating Modes Characteristics of Transmitter Pulse Pulse voltage V Hz pF Hz 20% -288 220 1000 4-1000 4 100 -261 20% -235 1000 Hz DAMPING = low POWER = high
Krautkramer
Spike pulse Picture: 1 Picture: 2 Picture: 3 Picture: 4
DUAL = off DAMPING = low DAMPING = high DUAL = on DAMPING = low DAMPING = high POWER = low POWER = high Manual, automatically linked to range in 10 steps >1,5m <1,5m Single-, dual mode
USM 25S_TM035041005_D-2

Pulse rise time Pulse duration Effective output impedance Pulse voltage Pulse rise time Pulse duration Effective output impedance Pulse voltage Pulse rise time Pulse duration Effective output impedance Pulse voltage Pulse rise time Pulse duration Effective output impedance
ns ns V ns ns V ns ns V ns ns
13,86 141 36 -183 14,91 102 28 -189 9,84 43 64 -114 9,47 33 29
15,40 156 44 -166 16,56 114 34 -172 10,95 47 80 -103 10,55 36 35
16,93 172 50 -150 18,22 125 40 -155 12,03 52 95 -93 11,57 40 42 1000 Hz DAMPING = high POWER = low 1000 Hz DAMPING = low POWER = low 1000 Hz DAMPING = high POWER = high
Krautkramer
USM 25S_TM035041005_D-3

Receiver
Amplifier Setting Range Increments dB dB 110 0,5 1 2 6 12 4 0 ~0,1 0,197 1,253 0,496 1,057 0,514 >110 25,0 90 -
Attenuator uncal. range Accuracy of calibrated attenuator Uncalibrated increments Amplifier Frequency Frequency spectrum (-3dB) Frequency ranges Lower frequency range Upper frequency range Center frequency Bandwidth Maximum frequency Dynamic range Noise level Gain for 80% SH Minimum input voltage
dB dB dB MHz MHz MHz MHz MHz MHz MHz dB nV dB V
-0,6 0,177 1,128 0,471 0,951 0,437 1 24,0 60
0,6 (-3dB) 0,2 - 1 MHz Filter 4 0,216 1,378 0,521 1,162 0,592 80 26,0 120
0,2 - 20 -
USM 25S_TM035041005_D-4
Krautkramer

Maximum input voltage Frequency ranges Lower frequency range Upper frequency range Center frequency Bandwidth Maximum frequency Gain for 80% SH Minimum input voltage Maximum input voltage Dynamic range Noise level Frequency ranges Lower frequency range Upper frequency range Center frequency Bandwidth Maximum frequency Gain for 80% SH Minimum input voltage Maximum input voltage Dynamic range
V MHz MHz MHz MHz MHz MHz dB V V dB nV MHz MHz MHz MHz MHz MHz dB V V dB
0,352 3,913 1,239 3,560 1,141 23,5 90 1 0,669 9,707 2,690 9,037 2,288 24,0 130 -
0,391 4,347 1,304 3,956 1,426 24,5 110 >110 0,744 10,785 2,832 10,042 2,692 25,0 165 >105
40 0,431 4,782 1,370 4,351 1,711 25,5 120 40 80 0,818 11,864 2,973 11,046 3,096 26,0 200 40 0,8 - 8 MHz Filter 3 0,5 - 4 MHz Filter 1
Krautkramer
USM 25S_TM035041005_D-5

Noise level Frequency ranges Lower frequency range Upper frequency range Center frequency Bandwidth Maximum frequency Gain for 80% SH Minimum input voltage Maximum input voltage Dynamic range Noise level Deadtime after transmitter pulse Receiver input impedance
nV MHz MHz MHz MHz MHz MHz dB V V dB nV s
1 1,841 18,999 6,242 17,159 10,567 24,5 200 1 -
2,045 21,110 6,570 19,065 12,432 25,5 260 >100 <5 us
80 2,250 23,221 6,899 20,972 14,297 26,5 320 40 80 1nF,125 Ohm,0,5-4MHz Single mode 2 - 20 MHz Filter 2
Single probe (combined transmitter and receiver) Rmax Rmin Cmax Cmin pf pf 343 343 36 36 516 516 -
Dual-probe (separate transmitter and receiver) -
Dual mode
USM 25S_TM035041005_D-6
Krautkramer

Signal Mode Full Wave Negative Halfwave Positive Halfwave RF Suppression Adjustable
pf pf
21 21 Yes Yes Yes Yes Yes 1 - 80
To 50 mm steel -
Krautkramer
USM 25S_TM035041005_D-7

Monitor
Number of Gates Alarm logic 2 off, pos, neg, trigger 0 to 9999 0,2 to 9999 10 - 90 flank, peak Yes LED, horn Yes Yes -
Start
mm
Width
mm
Threshold Measurement points Magnifier Alarm Interface echo start Switch output
Display of A-scan on full screen width Horn switchable Control of Gate B by Gate A See interface
USM 25S_TM035041005_D-8
Krautkramer

Display
Type Dimensions of the Display Resolution Backlight A-scan display Linearity of time base Sampling error Display jitter Amplitude Position Measurement resolution Sound path mm % % % % -0,5 -5 -2 -1 0,01 0 0 0 0,5 5 2 1 1 0,01: 0 to 99 mm 0,1: 100 mm to 999 mm 1: From 1000 mm At 2 MHz mm acitve LCD 72 x 96 240 x 320 Yes (HxW) Number of pixels Switchable
Amplitude ,
% ns ns
0,5 100 250
Following an interface echo
Krautkramer
USM 25S_TM035041005_D-9

Display width
mm
0,5 to 9999 55 -10 to 900 0 to 199,99 Yes 1000 to 15000 mm, inch 0 0 - 90 0,1 0 - 100
Fixed ranges Display start
mm mm
Display start
Probe delay
Automatic Calibration Material velocity m/s
2 step calibration Resolution 1m/s
Unit of measurement Linearity of time base Trigonometry Angle of incidence Increments X-value Object thickness mm mm %
0,5 -
0,5 Distance: index point to probe front edge To calculate Sound Reflection Resolution 0,1
1 - 9999 -
USM 25S_TM035041005_D-10
Krautkramer

Diameter Image processing Readings to be displayed Time of flight Sound path difference Surface distance Red. surface distance Depth position Amplitude in % Amplitude in dB
mm/inch -
10 - 2000 flat 0,40 - 800 flat 5 Yes B-A Yes Yes Yes Yes Yes --
mm inch
For Gate A,B For Gate A,B For Gate A,B For Gate A,B For Gate A,B For Gate A,B to gate threshold to reference (REF) for USM 25 DAC/S to reference curve * Only USM 25 DAC and S for gate A,B to reference curve * Only USM 25 S for gate A For Gate A,B * only for USM 25 S * only for USM 25 S Number of legs
Amplitude in % curve
Yes
Amplitude as ERS Alarm Evaluation curve (DGS) Test sensitivity Number of legs
Yes Yes Yes Yes Yes
Krautkramer
USM 25S_TM035041005_D-11

Signal display mode Signal processing Screen freeze Auto freeze A-scan Compare Envelope mode Peak Freeze Zoom Status information Dialog languages Function lock
standard,filled Yes Yes Yes Yes Yes -Yes Yes 19 Yes In zoom mode Echo envelope For Gate B A-scan on full screen width Freeze Auto freeze
USM 25S_TM035041005_D-12
Krautkramer

Amplitude evaluation
DAC Number of reference echoes Dynamic range Slope maximum DGS Number of probes Free programmable probe Reference reflectors dB dB/s Yes 10 40 6 Yes 24 Yes SDH BE FBH * Only USM 25 DAC and S Distance amplitude curve Reference echoes For TCG For TCG * Only USM 25 S In memory One probe for data set
Attenuation correction Transfer correction Quadrant correction DAC Mode Curve TCG Additional curves Curve offset dB
0,1 - 14 0,1 - 14 0,1 - 14 0,1 - 14 0,1 - 14 0,1 - 14 4 Multicurve 0,1 - 14 * Only USM 25 DAC and S display of curve Evaluation curve Depth compasation
Krautkramer
USM 25S_TM035041005_D-13

Data processing
Analog-to-Digital Conversion Sample frequency Storage of data Number of datasets Contents of datasets Dataset description String Length (Dataset name) Notes, No. of fields Memo, No. of characters Date and time Measurement results Sound path (TOF) Trigiometric values Amplidute Hardcopy Function list Test Report Yes For Gate A and B selectable selectable Yes Yes Yes Format PCX MHz 30 ja 200 24 9 24 Yes 240 6 alphanumerical + 3 numerical A-scan + instrument setup Numerical and alphanumerical From internal memory
USM 25S_TM035041005_D-14
Krautkramer

Interfaces
Outputs Alarms Horn Alarm gate A/B Switching voltage Max. switching current Hysteresis Accuracy of the threshold Hold time Analog output Amplitude Gate A or B Time of flight Gate A or B Max. switch current Output impedance Linearity Rise time Fall time Hold time Digital input U U V= V= mA % V/s V/s ms 0,5 0-5 0-5 0,5 100 0 2,5 2,5 8 - 250 0,5 Depending on PRF 8 Bit +/- 1/2 LSB Corresponding to 100% SH Corresponding to gate width t U I V= mA % % ms 0,5 2 20% TTL Yes Yes 3 6 0 500 0,5 2 20% Correspondig to actual threshold Hold time Logical OR HCT level with 100 Ohm serial
Krautkramer
USM 25S_TM035041005_D-15

Control Test data release Digital interface Types RS-232 Printer Output/type Driver Data Time of flight Amplitude Alarms A-Scan Trigger Remote control Yes Yes Yes ja TTL RS 232 A-Scan RS 232 Epson HP Seiko Redable about RS232 Yes Yes TTL
USM 25S_TM035041005_D-16
Krautkramer

General
Instrument Size (HxWxD) Weight Storage temperature Temperate range for mains operation Temperature range for battery operation Warm-up period Possible power supplies Voltage range for battery operation Voltage range with power supply Power consumption Low battery warning Environmental Protection Shock resistivity V= V= VA mm kg C C C h -20 0 0 4,2 8 2,5 Yes IP 54 1,6 +60 50 50 6 12 4,5 -Shock resistance according to DIN IEC 68, 6 ms, 60g shocks per axis Vibration resistance according to DIN IEC 68, 1-150 Hz, 2g, 20 cycles per axis Min(without lights) Max(with lights) Status display 10 minutes at 25 C Battery, mains (external power supply) incl. Batteries 176 x 255 - x 65
Vibration
Stability against temperature change
Krautkramer
USM 25S_TM035041005_D-17

Amplitude Echo position Stability against voltage change Amplitude Time of flight Power supply Battery operation time Stability after warm-up time Low battery display Amplitude Time of flight Change in amplitude over time base position with battery c Types of Sockets Probe connection I/O interface RS-232 External power supply Case Documentation
%/10 C %/10 C % % h
-5 -1 -2 -1 -
0 0 0 0 6 0 0 -
5 1 2 1 2 1 Battery NiMH 3/Ah After 30 minutes Status symbol +/-0,5% +/- 0,5mm
%/10 C % %
-2 -1 -
Lemo, BNC Lemo DSUB Plastic -
Selectable 8-pin 9-pin
DIN 45323 Technical reference manual
USM 25S_TM035041005_D-18
Krautkramer

Other
Software update procedure Options Download via RS 232 Data logger
Krautkramer
USM 25S_TM035041005_D-19

Picture: 1
USM 25S_TM035041005_D-20
Krautkramer

Picture: 2
Krautkramer
USM 25S_TM035041005_D-21

Picture: 3
USM 25S_TM035041005_D-22
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Picture: 4
Krautkramer
USM 25S_TM035041005_D-23
Assembly Instructions, Spate Parts List 13
Krautkrmer USM 25
Issue 04.09/03
13-1
Assembly Instructions, Spare Parts List
13-2
Issue 04, 09/03
Krautkrmer USM 25
Krautkrmer USM 25
Issue 04, 09/03
13-3
13-4
Issue 04, 09/03
Krautkrmer USM 25
Krautkrmer USM 25
Issue 04, 09/03
13-5
13-6

Issue 04, 09/03 Krautkrmer USM 25

Om - Usm 25 en

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Contents

1 Introduction ....................................... 1-1

2 Standard package and accessories........................................ 2-1

Issue 07, 07/2003

3 Initial start-up ..................................... 3-1

5 Operation ........................................... 5-1

4 Principles of operation ...................... 4-1

Issue 07, 07/2003

Issue 07, 07/2003

Issue 07, 07/2003

6 Documentation .................................. 6-1

6.2 Documentation with UltraDOC ................. 6-4

7 Maintenance and care ....................... 7-1

9 Appendix ............................................ 9-1

7.2 Maintenance ............................................. 7-4

8 Interface and peripherals .................. 8-1

Issue 07, 07/2003

Issue 07, 07/2003

1.1 Safety information

Issue 07, 07/2003

Defects/errors and exceptional stresses

Issue 07, 07/2003

Important information on ultrasonic testing

1.2 Important information on ultrasonic testing

Preconditions for testing with ultrasonic test equipment

Issue 07, 07/2003

Important information on ultrasonic testing

Technical test requirements

Ultrasonic wall thickness measurement

Issue 07, 07/2003

Important information on ultrasonic testing

Effect of temperature variations

Effect of the test objects material

Measurement of remaining wall thickness

Issue 07, 07/2003

Important information on ultrasonic testing

Ultrasonic evaluation of flaws

Echo display comparison method

Flaw boundary method

Issue 07, 07/2003

Important information on ultrasonic testing

Issue 07, 07/2003

The USM 25 family

1.3 The USM 25 family

The different instrument versions

Issue 07, 07/2003

Issue 07, 07/2003

How to use this manual

1.4 How to use this manual

Issue 07, 07/2003

Layout and presentation in this manual

1.5 Layout and presentation in this manual

Attention and Note symbols

Issue 07, 07/2003

Standard package and accessories

Issue 07, 07/2003

Scope of supply and accessories

Issue 07, 07/2003

Scope of supply and accessories

2.1 Standard package

35 054 35 053 34 913 18 348

Scope of supply and accessories

Order number 28 661 28 662