Professional Documents
Culture Documents
Key words defect diagonsis, expert system, artificial intelligence, casting defect, knowledge representation, inference technology
W ; I P W ~ S & d F l # ~(G56013)
R
0-7803-7268-9/01/$10.00 02001 IEEE.
455
4 56
457
*LP*fiBA
[11 Roshman
Trans. 1989.601
[31
&4Hi5, E%%.
MFEP%%%~WW~~~WPC~LI
a%%.
%%SSA%%,
141
#fi@.%4'A@ffi%UBb74%.
.brlHI&Yii%$r;Ef.
1986.