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ANSI C37.

51-2003 (R2010) American National Standard


For Switchgear Metal-Enclosed Low-Voltage AC Power Circuit Breaker Switchgear Assemblies Conformance Test Procedures

ANSI C37.51-2003 (R2010)

American National Standard for Switchgear Metal-Enclosed Low-Voltage AC Power Circuit Breaker Switchgear Assemblies Conformance Test Procedures

Secretariat:

National Electrical Manufacturers Association


Approved October 31, 2003 Reaffirmed November 17, 2010 Contains February 2011 Errata

American National Standards Institute, Inc.

ANSI C37.51-2003 (R2010)

NOTICE AND DISCLAIMER The information in this publication was considered technically sound by the consensus of persons engaged in the development and approval of the document at the time it was developed. Consensus does not necessarily mean that there is unanimous agreement among every person participating in the development of this document. ANSI standards and guideline publications, of which the document contained herein is one, are developed through a voluntary consensus standards development process. This process brings together volunteers and/or seeks out the views of persons who have an interest in the topic covered by this publication. While NEMA administers the process to promote fairness in the development of consensus, it does not write the document and it does not independently test, evaluate, or verify the accuracy or completeness of any information or the soundness of any judgments contained in its standards and guideline publications. NEMA disclaims liability for any personal injury, property, or other damages of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, application, or reliance on this document. NEMA disclaims and makes no guaranty or warranty, express or implied, as to the accuracy or completeness of any information published herein, and disclaims and makes no warranty that the information in this document will fulfill any of your particular purposes or needs. NEMA does not undertake to guarantee the performance of any individual manufacturer or sellers products or services by virtue of this standard or guide. In publishing and making this document available, NEMA is not undertaking to render professional or other services for or on behalf of any person or entity, nor is NEMA undertaking to perform any duty owed by any person or entity to someone else. Anyone using this document should rely on his or her own independent judgment or, as appropriate, seek the advice of a competent professional in determining the exercise of reasonable care in any given circumstances. Information and other standards on the topic covered by this publication may be available from other sources, which the user may wish to consult for additional views or information not covered by this publication. NEMA has no power, nor does it undertake to police or enforce compliance with the contents of this document. NEMA does not certify, test, or inspect products, designs, or installations for safety or health purposes. Any certification or other statement of compliance with any health or safetyrelated information in this document shall not be attributable to NEMA and is solely the responsibility of the certifier or maker of the statement.

ANSI C37.51-2003 (R2010)

AMERICAN NATIONAL STANDARD

Approval of an American National Standard requires verification by ANSI that the requirements for due process, consensus, and other criteria for approval have been met by the standards developer. Consensus is established when, in the judgment of the ANSI Board of Standards Review, substantial agreement has been reached by directly and materially affected interests. Substantial agreement means much more than a simple majority, but not necessarily unanimity. Consensus requires that all views and objections be considered, and that a concerted effort be made toward their resolution. The use of American National Standards is completely voluntary; their existence does not in any respect preclude anyone, whether he has approved the standards or not, from manufacturing, marketing, purchasing, or using products, processes, or procedures not conforming to the standards. The American National Standards Institute does not develop standards and will in no circumstances give an interpretation of any American National Standard. Moreover, no person shall have the right or authority to issue an interpretation of an American National Standard in the name of the American National Standards Institute. Requests for interpretations should be addressed to the secretariat or sponsor whose name appears on the title page of this standard. Caution Notice: This American National Standard may be revised or withdrawn at any time. The procedures of the American National Standards Institute require that action be taken periodically to reaffirm, revise, or withdraw this standard. Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Institute.

Published by

National Electrical Manufacturers Association 1300 North 17th Street, Rosslyn, VA 22209
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ANSI C37.51-2003 (R2010)

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ANSI C37.51-2003 (R2010)

CONTENTS

Foreword ....................................................................................................................................................... v Section 1 SCOPE....................................................................................................................................... 1 1.1 1.2 1.3 Control and instrumentation componentsprotection requirements............................................. 1 Installations not covered................................................................................................................. 1 Purpose .......................................................................................................................................... 1

Section 2 REFERENCED STANDARDS .................................................................................................. 2 Section 3 DEFINITIONS ............................................................................................................................ 3 3.1 3.2 3.3 Conformance tests ......................................................................................................................... 3 Design tests (type tests) ................................................................................................................. 3 Production tests (routine tests)....................................................................................................... 3

Section 4 GENERAL TEST CONDITIONS ............................................................................................... 4 4.1 Ambient conditions ......................................................................................................................... 4 4.2 Protection requirements ................................................................................................................. 4 4.2.1 General.................................................................................................................................... 4 4.2.2 Control power transformers..................................................................................................... 4 4.2.3 Voltage transformers ............................................................................................................... 5 Section 5 CONFORMANCE TEST REQUIREMENTS.............................................................................. 6 5.1 General ........................................................................................................................................... 6 5.2 Test requirements........................................................................................................................... 6 5.3 Test arrangements ......................................................................................................................... 6 5.3.1 Arrangement to be used.......................................................................................................... 6 Specifics of test arrangement.................................................................................................. 7 5.3.2 5.3.3 Representation ........................................................................................................................ 7 5.4 Dielectric tests ................................................................................................................................ 7 5.5 Continuous current test .................................................................................................................. 8 5.5.1 Duration of Tests ..................................................................................................................... 8 5.5.2 Measurement of Ambient Air Temperature ............................................................................. 9 5.5.3 Method of Measuring Temperature......................................................................................... 9 5.5.4 Copper Conductors for Use in Continuous Current Tests ...................................................... 9 5.5.5 Performance ..........................................................................................................................11 5.6 Short-time withstand current tests................................................................................................ 11 5.6.1 General.................................................................................................................................. 11 5.6.2 Primary phase bus and connections ..................................................................................... 11 5.6.3 Neutral bus and connections (if design includes a neutral bus) ........................................... 13 5.6.4 Ground bus and connections ................................................................................................ 14 5.7 Short-circuit withstand current tests ............................................................................................. 14 5.7.1 General.................................................................................................................................. 14 5.7.2 Primary phase bus and connections ..................................................................................... 15 5.7.3 Neutral bus (if applicable), ground bus, and connections..................................................... 16 5.8 Mechanical performance testsremovable circuit breakers ....................................................... 16 5.8.1 Test Procedure...................................................................................................................... 16 5.8.2 Cycles of Operation............................................................................................................... 16 5.8.3 Performance ..........................................................................................................................17

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ANSI C37.51-2003 (R2010)

Section 6 TREATMENT OF NONCONFORMING RESULTS................................................................. 18 Section 7 PRODUCTION TESTS ............................................................................................................ 19 7.1 General ......................................................................................................................................... 19 7.2 Dielectric withstand voltage tests ................................................................................................. 19 7.3 Mechanical operation tests........................................................................................................... 19 7.4 Grounding of instrument transformer cases test .......................................................................... 19 7.5 Electrical operation and wiring tests............................................................................................. 19 7.5.1 Control wiring continuity ........................................................................................................ 19 7.5.2 Control wiring insulation test .................................................................................................19 7.5.3 Polarity verification ................................................................................................................ 20 7.5.4 Sequence tests...................................................................................................................... 20 Section 8 RETESTING............................................................................................................................. 21

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ANSI C37.51-2003 (R2010)

Foreword

(This Foreword is not part of American National Standard C37.51-2003.)

This standard has been developed to describe selected tests and procedures to demonstrate conformance in accordance with Section 6, Tests, of ANSI/IEEE C37.20.1-2002 Metal-Enclosed LowVoltage AC Power Circuit Breaker Switchgear. It is published separately from ANSI/IEEE C37.20.1-2002 to facilitate its use and to permit timely revisions based on experience. Revisions have been made to this edition to coordinate with revisions made to ANSI/IEEE C37.20.1. This standard is one of several in a series of test procedures for conformance testing of switchgear products. While this standard is written for general guidance, performance criteria are established so that this standard can be adopted as the basis for certification of metal-enclosed low-voltage alternating current power circuit breaker switchgear for use in non-utility installations subject to regulation by public authorities and similar agencies concerned with laws, ordinances, regulations, administrative orders, and similar instruments. This standard has been prepared by a Working Group sponsored by the Power Switchgear Assemblies Technical Committee of the Switchgear Section of the National Electrical Manufacturers Association (NEMA 8-SG-V). During the course of its preparation, coordination has been maintained with the Switchgear Committee of the Power Engineering Society of the Institute of Electrical and Electronics Engineers. Proposed or recommended revisions should be submitted to: Vice President, Technical Services National Electrical Manufacturers Association 1300 North 17th Street Rosslyn, VA 22209 This standard was processed and approved for submittal to ANSI by Accredited Standards Committee on Power Switchgear C37. Committee approval of the standard does not necessarily imply that all committee members voted for its approval. At the time of its approval, the C37 Committee had the following members: T. Olsen, Chair J. Collins, Secretary Organization Represented: Electric Light and Power Group Name of Representative: D. E. Galicia J. L. Koepfinger G. J. Martuscello Y. Musa E. Worland A. Dixon J. Jerabek T. E. Royster M. D. Sigmon J. G. Wood D. Lemmerman (Alt) R. W. Long (Alt) G. Jones

Institute of Electrical and Electronics Engineers

National Electrical Manufacturers Association

ANSI C37.51-2003 (R2010)

R. W. Long T. W. Olsen G. J. Sakats D. Stone D. Swindler E. Byron (Alt) International Electrical Testing Association National Electrical Contractors Association Testing Laboratory Group A. Peterson D. Harwood A. Harkness P. Notarian J. Nelson T. Roscoe J. A. Gilson

Tennessee Valley Authority U.S. Dept. of Agriculture U.S. Dept. of the Army, Office of the Chief of Engineers

U.S. Dept. of the Navy, Naval Construction Battalion Center D. L. Mills Technical Liaison W. Laubach C. Wagner

The following members of the NEMA Power Switchgear Assemblies Technical Committee worked on this standard prior to its publication: T. W. Olsen, Chair J. Collins, Secretary C. Ball P. Dwyer H. Hirz W. Long T. Olsen G. Sakats S. Slattery J. Wiseman

Errata issued February 2011 Replace disconnected with connected in 5.8.2, Step 4: 5.8.2 Cycles of Operation

Step 4. Move the circuit breaker to a position approximately midway between the test and disconnected positions or as close as possible to a midpoint position as the removable secondary test coupler (if required) will permit. If required, install a secondary test coupler. Check to ensure that the circuit breaker cannot be closed, either electrically or mechanically.

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AMERICAN NATIONAL STANDARD

ANSI C37.51-2003 (R2010)

For SwitchgearFor Metal-Enclosed Low-Voltage AC Power Circuit Breaker Switchgear AssembliesConformance Test Procedures

1 Scope
This Standard is a conformance testing standard optionally applicable to all metal-enclosed lowvoltage ac power circuit breaker switchgear assemblies designed, tested, and manufactured in accordance with ANSI/IEEE C37.20.1-2002, Metal-Enclosed Low-Voltage AC Power Circuit Breaker Switchgear. This standard covers selected tests to demonstrate conformance of the basic switchgear section (which includes the structure, circuit breaker compartments, instrument compartments, buses, and internal connections) with Section 6, Tests, of ANSI/IEEE C37.20.12002. See ANSI/IEEE C37.20.1-2002 for assigned ratings and usual service conditions. 1.1 CONTROL AND INSTRUMENTATION COMPONENTSPROTECTION REQUIREMENTS LV switchgear assemblies usually include control and instrumentation components unique for the application that are not individually evaluated under this standard. However, these components, when utilized in circuits that obtain their energy from primary sources within the LV switchgear, must be suitably protected in accordance with 4.2.
NOTEIn this standard, the use of the term "LV switchgear" shall be considered to mean "metal-enclosed low-voltage alternating current power circuit breaker switchgear assemblies." The use of the term "circuit breaker" shall be considered to mean "low voltage alternating current power circuit breaker," unless qualified by other descriptive terms.

1.2

INSTALLATIONS NOT COVERED

This standard does not cover equipment intended for use in installations under the exclusive control of electric utilities for the purposes of communication or metering, or for generation, control, transformation, transmission, and distribution of electric energy located in buildings used exclusively by utilities for such purposes, or located outdoors on property owned or leased by the utility or on public highways, street, roads, and the like, or located outdoors by established rights on private property.
NOTEAn electric utility is an entity that is overseen by a public utility commission, a public service commission, or other regulatory agency having jurisdiction for such installations.

1.3

PURPOSE

This standard specifies the tests that shall be performed to demonstrate that the LV switchgear being tested conforms with the ratings assigned to it and meets the mechanical and electrical performance requirements specified in ANSI/IEEE C37.20.1-2002.

ANSI C37.51-2003 (R2010)

Section 2 REFERENCED STANDARDS


When there is a conflict between this standard and these referenced standards, this standard shall apply. This standard is intended to be used in conjunction with the following American National Standards. When these referenced standards are superseded by a revision approved by the American National Standards Institute, Inc., the revisions shall apply. ANSI C37.16-2000, Switchgear - Low-Voltage Power Circuit Breakers and AC Power Circuit Protectors - Preferred Ratings, Related Requirements, and Application Recommendations ANSI C37.50-1989 (R2000), Switchgear - Low-Voltage AC Power Circuit Breakers Used in Enclosures Test Procedures ANSI/IEEE C37.09-1999, Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis ANSI/IEEE C37.13-1990 (R1995), Low-Voltage AC Power Circuit Breakers Used in Enclosures ANSI/IEEE C37.20.1-2002, Metal-Enclosed Low-Voltage Power Circuit Breaker Switchgear ANSI/IEEE C37.26-2003, Standard Guide for Methods of Power Factor Measurement for LowVoltage Inductive Test Circuits ANSI/IEEE C37.100-1992 (R2000), Definitions for Power Switchgear ANSI/IEEE Std 4-1995, Standard Techniques for High Voltage Testing, including ANSI/IEEE Standard 4a-2001, Amendment to IEEE Standard Techniques for High-Voltage Testing

ANSI C37.51-2003 (R2010)

Section 3 DEFINITIONS
The definitions of terms contained in this standard, or in other standards referred to in this standard, are not intended to embrace all legitimate meanings of the terms. They are applicable only to the subject treated in this standard. If a term is not defined in this standard, the definition in ANSI/IEEE C37.100-1992 applies. An asterisk (*) following a definition indicates that the definition in this standard is not contained in ANSI/IEEE C37.100-1992, while a dagger () indicates that the definition differs from that in ANSI/IEEE C37.100-1992. 3.1 CONFORMANCE TESTS

Certain tests to demonstrate compliance with the applicable standards. The test specimen is normally subjected to all planned production tests prior to initiation of the conformance test program.
NOTE Conformance tests may, or may not, be similar to certain design tests. Demonstration of margin (capabilities) beyond the standards is not required.

3.2

DESIGN TESTS (TYPE TESTS)

Tests made by the manufacturer to determine the adequacy of the design of a particular type, style, or model of equipment or its component parts to meet its assigned ratings and to operate satisfactorily under normal service conditions or under special conditions if specified, and may be used to demonstrate compliance with applicable standards of the industry.
NOTES 1 Design tests are made on representative apparatus or prototypes to verify the validity of design analysis and calculation methods and to substantiate the ratings assigned to all other apparatus of basically the same design. These tests are not intended to be made on every design or to be used as part of normal production. The applicable portion of these design tests may also be used to evaluate modifications of a previous design and to ensure that performance has not been adversely affected. Test data from previous similar designs may also be used for current designs, where appropriate. Once made, the tests need not be repeated unless the design is changed so as to modify performance. 2 "Design Tests" are sometimes called "type tests".

3.3

PRODUCTION TESTS (ROUTINE TESTS)

Tests made for quality control by the manufacturer on every device or representative samples, or on parts or materials as required to verify during production that the product meets the design specifications and applicable standards.
NOTES 1 Certain quality assurance tests on identified critical parts of repetitive high-production devices may be tested on a planned statistical sampling basis. 2 "Production Tests" are sometimes called "routine tests".

ANSI C37.51-2003 (R2010)

Section 4 GENERAL TEST CONDITIONS


4.1 AMBIENT CONDITIONS

Tests shall be conducted under conditions prevailing at the test site which shall conform to Usual Service Conditions in accordance with clause 4 of ANSI/IEEE C37.20.1-2002, except that the temperature of the air surrounding the assembly (ambient) for the continuous current tests shall be within the ambient temperature range of 10C (50F) to 40C (104F). 4.2 4.2.1 PROTECTION REQUIREMENTS General

All voltage circuits used for control, relaying, or metering shall be protected within the LV switchgear as follows: a. All circuits supplied from external sources (alternating current or direct current) shall have short-circuit protection within the control source incoming section. This may be provided by a single set of short-circuit protective devices. b. All circuits supplied from internal sources (alternating current or direct current) shall have short-circuit protection within the same section as the supply source. If these circuits are supplied by a control power transformer, this protection may be in the primary circuit only. c. Overcurrent protection of voltage circuits may be provided in addition to the required short-circuit protection. d. Voltage transformers, current transformers, or other suitable means, shall be used for all instruments, meters, and relays connected to AC circuits over 254 V in order to reduce the voltage on instrument wiring to 254 V or less. Wiring feeding such devices and connected directly to the bus at greater than 254 V shall be as short as is practicable and shall be grouped separately from other components and wiring. e. Other circuits supplying loads, such as heaters, lights, or receptacles, shall have overload and short-circuit protection. f. Overcurrent protection is not permitted in current transformer secondary circuits. 4.2.2 Control power transformers

Control power transformers shall be protected in the primary circuits with current-limiting fuses in accordance with Table 4-1.

ANSI C37.51-2003 (R2010)

Table 4-1 Control Power Transformer Short-Circuit Protection Single phase (kVA) Up to 1 2 3 5 7.5 10 15 Primary maximum current-limiting fuses (A) 240 V 480 V 600 V 10* 5* 4* 20 10* 8* 30 15* 12* 50 25 20 70 35 30 100 50 40 150 70 60

*Due to inrush currents, certain types of current-limiting fuses may require larger ratings than those shown, but the ratings shall not exceed 20 A.

4.2.3

Voltage transformers

Voltage transformers shall be protected in the primary circuit with current-limiting fuses not larger than 10 A.

ANSI C37.51-2003 (R2010)

Section 5 CONFORMANCE TEST REQUIREMENTS


5.1 GENERAL

Tests are made on representative test arrangements of LV switchgear as described in 5.3 to demonstrate the capability of the LV switchgear design to meet its assigned ratings and to operate under normal service conditions as outlined in clause 4 of ANSI/IEEE C37.20.1-2002. The circuit breaker designs utilized shall have been previously qualified in accordance with ANSI C37.50-1989 or shall be tested to those requirements simultaneously with the requirements of this standard. The test specimen shall have been subjected to production tests in accordance with clause 7 prior to initiation of conformance tests.

5.2

TEST REQUIREMENTS

Representative test arrangements shall be subjected to the following tests as described in the sub-clauses indicated in parentheses: a. b. c. d. e. 5.3 5.3.1 Dielectric tests (5.4) Continuous current test (5.5) Short-time withstand current test (5.6) Short-circuit withstand current test (5.7) Mechanical performance tests (5.8) TEST ARRANGEMENTS Arrangement to be used

For the tests specified in 5.4 through 5.7, the test arrangement construction shall consist of an indoor vertical section of circuit breaker compartments plus an additional representative structure (to simulate actual installation of two adjacent sections), so that the main bus extends through both sections and includes a main bus splice. Other than as modified in 5.3.3, the tests specified in 5.4 through 5.7 shall be conducted on each of the following test arrangements: Test arrangement 1: Test arrangement 2: Test arrangement 3: Test arrangement 4: Test arrangement 5: Test arrangement 6: Test arrangement 7: Test arrangement 8: one 600A frame circuit breaker with 1600A main bus one 800A frame circuit breaker with 1600A main bus one 1600A frame circuit breaker with 1600A main bus one 2000A frame circuit breaker with 2000A main bus one 3000A frame circuit breaker with 3000A main bus one 3200A frame circuit breaker with 3200A main bus one 4000A frame circuit breaker with 4000A main bus one 5000A frame circuit breaker with 5000A main bus

For frame and bus ratings not covered above, the test arrangement will include a circuit breaker of the frame size to be tested. The main bus shall be of equal ampacity. The Mechanical Performance Tests specified in 5.8 shall be conducted in any representative housing intended to receive the circuit breaker frame size under test. This is permitted to be, but not required to be, one of the compartments in the above test arrangements.

ANSI C37.51-2003 (R2010)

5.3.2

Specifics of test arrangement

For the tests specified in 5.5 through 5.7, the test circuit shall be configured with the test power source connected to the main bus in such a manner that the test current passes through a main bus splice. For the tests specified in 5.5 through 5.7, the section (riser) bus shall be the minimum size furnished by the manufacturer for the frame size of the circuit breaker used in the test arrangement. The intent is to perform the continuous current and short-circuit current tests with the smallest bus configuration. For the tests specified in 5.4 and 5.8, the circuit breaker may be in any compartment. Tests specified in 5.5 shall be conducted with a single circuit breaker in the uppermost circuit breaker compartment of any arrangement used by the manufacturer for the rating being tested, with all other compartments in that vertical section bused to receive circuit breakers, but with circuit breakers, if installed in these compartments, disconnected for the test. Tests specified in 5.6 and 5.7 shall be made with a circuit breaker in the uppermost compartment, unless it is determined that circuit breakers need not be included in the short-time and shortcircuit withstand current tests. Voltage transformers, control power transformers, and associated disconnecting means and fuses are not required for the tests specified in 5.5 through 5.7. If they are present in the sample, they should not have any effect on the test and need not be removed. Such devices are permitted to be disconnected during the dielectric tests (see 5.4). 5.3.3 Representation

If the switchgear is manufactured in both stationary and drawout designs and the bus design is identical for both, the stationary design may be qualified by testing only the drawout design. The tests specified in 5.8 apply only to the drawout design. If any of the test arrangements shown in 5.3.1 has the same construction as another, tests on one arrangement are permitted to represent the other arrangement under the following conditions: a. Continuous current tests (5.5) are to be run on the arrangement having the higher ampere rating and the greatest current density. b. Short-time withstand current tests (5.6) and short-circuit withstand current tests (5.7) are to be conducted on the arrangement having the smallest bus configuration for the current level involved. Incoming bus structure used in LV switchgear and other busing required for customization shall be considered as meeting the short-circuit current requirements if its construction is physically equivalent to that of the main bus structure that was tested and found to meet the short-circuit current and short-time current requirements. If the construction is not physically equivalent, this busing shall be tested in a manner that will subject it to the requirements of those tests. 5.4 DIELECTRIC TESTS

Power frequency withstand tests on LV switchgear shall be made to determine the ability of the insulation to withstand overvoltage. Voltages shall be measured in accordance with ANSI/IEEE Std 4-1995. The voltage is to be increased gradually from zero to the required test value within 5 s to 10 s and shall be held at that value for 1 min.

ANSI C37.51-2003 (R2010)

The test voltage shall be essentially sinusoidal and applied with a minimum crest value equal to 1.414 times the specified values. The frequency of the test voltage shall be within 20 percent of the rated power frequency of the LV switchgear being tested. If a test transformer of less than 500 volt-amperes is used, a suitable voltmeter shall be provided to measure the applied output voltage directly. A dielectric test voltage of 2200 volts shall be applied for a period of 1 min to the primary circuit of the LV switchgear in the following manner: a. For equipment with stationary devices and for equipment with drawout-mounted devices with the removable elements in the connected position, apply the test voltage between the primary circuit and ground, as follows: 1. With the circuit breaker contacts closed between each phase of the switchgear assembly individually with the frame and the other phases and the neutral bus (if present) grounded 2. With the circuit breaker contacts open between each terminal of the switchgear assembly with the frame and all other terminals grounded b. With the drawout circuit breaker in the test position and with its contacts closed, apply the test voltage between the primary circuit and ground, as follows: 1. Simultaneously to all the incoming terminals of the switchgear assembly with the frame and outgoing terminals grounded. 2. Simultaneously to all the outgoing terminals of the switchgear assembly with the frame and incoming terminals grounded. c. For equipment having a neutral bus, apply test voltage between neutral and ground, except at 1800V instead of 2200V. Except for the main switching or interrupting device, other devices such as voltage transformers that are mounted in the LV switchgear assemblies may be disconnected during the dielectric test. Such devices are individually tested in accordance with the standards applying to them. 5.5 CONTINUOUS CURRENT TEST

The continuous current test shall be performed to ensure that the LV switchgear test arrangement can carry the rated continuous current of the circuit breaker at rated frequency without exceeding the allowable temperature rises specified in 5.5 of ANSI/IEEE C37.20.1-2002 and Table 2 of ANSI/IEEE C37.13-1990. Circuit breakers shall be equipped with overcurrent trip devices having a continuous current rating equal to the continuous current rating of the circuit breaker frame size. The overcurrent trip device shall be prevented from opening the circuit breaker during the test. The LV switchgear test arrangement shall be tested using a three-phase source of power of any convenient voltage at a test frequency no less than rated frequency. Each individual phase current shall be maintained at no less than the rated continuous current. A single-phase source of power (all phases in series with flow of current reversed with adjacent phases) may be used at the option of the manufacturer. If testing in accordance with ANSI C37.50-1989 clearly demonstrates that either the fused or unfused terminal connections have higher temperature rises, continuous current testing of the unit with the lower temperature rises is not required. 5.5.1 Duration of Tests

The continuous current test shall be made for such a period of time that the temperature rise of any monitored point in the test arrangement has not increased by more than 1.0C over a one hr

ANSI C37.51-2003 (R2010)

period, with readings being taken at not greater than 30-min intervals. If the temperature rise at the end of the second interval is equal to the established limits and if the temperature rise has increased since the previous reading, the test shall be continued. 5.5.2 Measurement of Ambient Air Temperature

Indoor ambient air temperatures shall be determined by taking the average of the readings of three temperature-measuring devices, such as thermometers or thermocouples, placed as follows: a. One level with the top of the structure b. One 30 cm above the bottom of the structure c. One midway between the two above positions All temperature-measuring devices shall be placed 30 cm from the structure, not in front of ventilators, and in locations unaffected by drafts caused by the structure or appreciable radiation from the equipment. When the ambient air temperature is subject to variations that might result in errors in measuring the temperature rise, the temperature-measuring devices should be immersed in suitable liquid, such as oil, in a suitable container, or reliably attached to a suitable mass of metal.
NOTEA convenient form for such a container consists of a metal cylinder with a hole drilled partly through it. This is filled with liquid and the temperature measuring device placed therein. The size of the container should be at least 2.5 cm in diameter and 5 cm high.

5.5.3

Method of Measuring Temperature

Thermocouples shall be used to measure the temperature at the required locations on the LV switchgear test arrangement. Thermocouples, when used for measuring the temperature of insulation, shall be located on the current-carrying member or other metal part adjacent to the insulation. Thermocouples used for measuring the temperature of the circuit breaker primary disconnecting devices shall be located on the current-carrying member approximately 13 mm to the housing side of the primary disconnecting devices. For cable terminations, the thermocouples shall be located at the junction of the conductor and its insulation. Thermocouples shall be held in intimate contact with the conductor surface by such methods as welding, drilling and peening, or cementing. 5.5.4 Copper Conductors for Use in Continuous Current Tests

Bus bars as described in Table 5-1 shall be utilized for connection to the main bus. Cables or bus bars as specified in Table 5-2 shall be utilized for connection to the feeder circuit breaker outgoing terminals or extensions. If test arrangement internal bus sizes differ from those specified in Tables 5-1 and 5-2, external bus sizes equal to internal bus sizes may be substituted at the option of the manufacturer. The conductors connected to the terminals shall be a minimum of 1.2 m long.

ANSI C37.51-2003 (R2010)

Table 5-1 Copper Conductors for Connection to the Main Bus for Use in Continuous Current Tests Main Bus Rating (A) 1600 2000 3000 3200 4000 5000 5000
a b

Copper Bus per Terminal a,b,c Size Quantity 2 2 3 3 4 5 6 in. 0.25 x 3 0.25 x 4 0.25 x 5 0.25 x 5 0.25 x 5 0.25 x 6 0.25 x 5 mm 6.4 x 76.2 6.4 x 102 6.4 x 127 6.4 x 127 6.4 x 127 6.4 x 152 6.4 x 127

d d d

Where multiple bus bars are used, they are to be spaced 0.25 in. (6.4 mm) apart. Vertical or horizontal configuration shall be the option of the manufacturer. c Bus sizes (and the spacing in note a) are expressed in trade sizes (in.), with approximate metric conversion. d For LV ac switchgear, the 4000 and 5000A groups are to be two sets of two or three bars with not more than 102 mm between pair centers.

Table 5-2 Copper Conductors for Connection to Feeder Circuit Breaker Outgoing Terminals or Extensions for Use in Continuous Current Tests Size of Copper Conductor Circuit Breaker Frame Size (A) 600 800 1600 2000 3000 3200 4000 5000 5000
a b

Bus per Terminal b,c,d Cable size a 2-350 kcmil 2-500 kcmil 4-600 kcmil 5-600 kcmil Quantity 3 3 4 5 6 size in. 0.25 x 5 0.25 x 5 0.25 x 5 0.25 x 6 0.25 x 5 mm 6.4 x 127 6.4 x 127 6.4 x 127 6.4 x 152 6.4 x 127

e e e

Tests based on cross-sectional area, not cable insulation classification. Where multiple bus bars are used, they are to be spaced 0.25 in. (6.4 mm) apart. c Vertical or horizontal configuration shall be the option of the manufacturer. d Bus sizes (and the spacing in note b) are expressed in trade sizes (in.), with approximate metric conversion. e For LV ac switchgear, the 4000 and 5000A groups are to be two sets of two or three bars with not more than 102 mm between pair centers.

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ANSI C37.51-2003 (R2010)

5.5.5

Performance

The LV switchgear test arrangement shall be considered as having passed this test if temperature rises specified in Table 3 and Table 4 of ANSI/IEEE C37.20.1-2002 and Table 2 of ANSI/IEEE C37.13-1990 are not exceeded. The terminal connection limit of 55C rise in Table 2 of ANSI/IEEE C37.13-1990 is not applicable. The results of previous design tests may be used to establish points of temperature measurement and the phase with the greatest temperature rise. The temperature rises of that phase only and the hot spot of the other phases shall be measured. 5.6 5.6.1 SHORT-TIME WITHSTAND CURRENT TESTS General

Short-time withstand current tests shall be made to demonstrate the thermal and mechanical capability of the buses and connections in LV switchgear to withstand the rated short-time withstand current of the assembly. See Table 2 in ANSI C37.16-2000 for preferred values. Single-phase testing is permitted. 5.6.1.1 Circuit breaker compartment represented by the circuit breaker test enclosure

When the circuit breaker compartment in the LV switchgear is physically equivalent to the test enclosure used during the circuit breaker evaluation (as required by ANSI C37.50-1989), no additional withstand current testing of the circuit breaker, circuit breaker compartment, or associated conductors is required. For the withstand current tests in this situation, the uppermost circuit breaker compartment incoming terminals shall be connected together by a shorting bar or bars, effectively eliminating the circuit breaker compartment from the test. 5.6.1.2 Circuit breaker compartment NOT represented by the circuit breaker test enclosure If the circuit breaker compartment is not physically equivalent to the circuit breaker test enclosure, the withstand current tests shall include a circuit breaker and compartment. The test shall be made under the same conditions that resulted in the highest let-through current during the circuit breaker short-circuit current tests described in ANSI C37.50-1989. The circuit breaker shall be of a type that has previously met the design test performance requirements as specified in ANSI C37.50-1989, and shall be one of the following: a. a circuit breaker without direct acting trip devices b. a circuit breaker in which the overcurrent trip device has been made inoperative c. an equivalently sized dummy breaker provided its primary disconnecting devices are identical to the circuit breaker, and the circuit breaker has been qualified by previous testing. The circuit breaker shall be located in the uppermost compartment, and for the tests, the circuit breaker compartment outgoing terminals shall be connected together by a shorting bar or bars. 5.6.1.3 Fused circuit breaker compartments

Since fused circuit breakers do not have a short-time withstand current rating, fused circuit breaker compartments do not require short-time current testing. 5.6.2 5.6.2.1 Primary phase bus and connections Prospective current determination

The prospective current shall be the rms value calculated in accordance with ANSI/IEEE C37.091999, measured at a time one-half cycle after initiation of the current. For three-phase circuits, the symmetrical current value shall be the average of the phase currents. The prospective

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current will be determined by calibrating the test circuit with a short circuit placed directly across the bus connection at the incoming switchgear terminals. 5.6.2.2 Power factor determination

The power factor of the test circuit shall be 15% lagging or less (X/R ratio of 6.6 or greater) with X and R in series connection. The power factor shall be determined in accordance with ANSI/IEEE C37.26-2003. 5.6.2.3 Test voltage and frequency

The test circuit voltage prior to the inception of current flow shall be no less than the rated maximum voltage, and the frequency of the test current shall be the rated power frequency 20%. 5.6.2.4 Test connections

Two test configurations are required. The main bus terminals shall be connected to the test circuit power source, and three-phase tests shall be made with a short at the following locations: a. At the end of the main bus opposite from the terminals, to cause a short-circuit current to pass through the main bus and splice. b. At the circuit breaker compartment terminals as covered in 5.6.1.1 or 5.6.1.2, as is appropriate to the construction. Insofar as possible, the connections shall not add intentional bracing to the bus structure being tested. If the test circuit current path includes primary disconnect devices, the circuit resistance shall be measured prior to the test as a baseline for performance evaluation. This measurement shall be made with a DC current of at least 100 A flowing.

5.6.2.5

Test duration

The test current shall continue for two periods of 0.5 s separated by a 15 s interval of zero current. At the option of the manufacturer, a single period of 1 s duration may be used if circuit breakers are not included in the test current path of the assembly. 5.6.2.6 Test current

The current shall be initiated in test circuits in a manner to ensure that the peak current available is no less than 2.3 times: a. the single-phase rms symmetrical value, for single-phase tests, or b. the three-phase rms symmetrical value in one phase, for three-phase tests. The alternating component of the current at the end of each 0.5 s period (or 1 s period if manufacturer elects to use 1 s duration) shall be no less than 80% of the alternating component measured at one-half cycle after the initiation of the current. 5.6.2.7 Performance

After the test, the switchgear shall have: a. no breakage of insulation or structural components b. no permanent deformation of bus or its supports c. no separation of bus or bus connections, and no reduction in the cross section of the bus or bus connections

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d. the removable element shall be capable of moving from the connected to the disconnected position and back to the connected position via its intended means e. no signs of pitting or welding of primary disconnect devices If the switchgear has not met the requirements of item b) at the conclusion of the test, the dielectric tests described in 5.4 shall be repeated. The switchgear shall be considered to have passed this portion of the short-time withstand current test if it successfully passes the dielectric tests. If the switchgear has not met the requirements of item e) at the conclusion of the test, a DC resistance test across the tested circuit shall be made with a minimum of 100 A flowing through the circuit. The switchgear shall be considered to have passed this portion of the short-time withstand current test if the DC resistance of the equipment after the short-time withstand current test does not exceed 200% of the circuit resistance of the circuit prior to the test. 5.6.3 Neutral bus and connections (if design includes a neutral bus)

A single-phase short-time withstand current test shall be made on the neutral bus. The test parameters shall be as described in 5.6.2.1 through 5.6.2.6, except that a. The test voltage is to be applied between the neutral and nearest phase bus. (Incoming connection shall be made from the neutral bus to one phase of the source and from the nearest phase bus to another phase of the source.) b. The voltage shall be at least rated maximum voltage divided by 3 . c. The short-circuit connection shall be made between the ends of the main and neutral bus bars at the end opposite the test source connection, using bolted bars of minimum length and having cross section equal to the bus being tested. Insofar as possible, the connections shall not add intentional bracing to the bus structure being tested. If the test circuit current path includes primary disconnect devices, the circuit resistance shall be measured prior to the test as a baseline for performance evaluation. This measurement shall be made with a DC current of at least 100 A flowing. 5.6.3.1 Performance

After the test, the switchgear shall have a. no breakage of insulation or structural components b. no permanent deformation of bus or its supports c. no separation of bus or bus connections, and no reduction in cross section of the bus or bus connections d. the removable element shall be capable of moving from the connected to the disconnected position and back to the connected position via its intended means e. no signs of pitting or welding of primary disconnect devices. If the switchgear has not met the requirements of item b) at the conclusion of the test, the dielectric tests described in 5.4 shall be repeated. The switchgear shall be considered to have passed this portion of the short-time withstand current test if it successfully passes the dielectric tests. If the switchgear has not met the requirements of item e) at the conclusion of the test, a DC resistance test across the tested circuit shall be made with a minimum of 100 A flowing through the circuit. The switchgear shall be considered to have passed this portion of the short-time withstand current test if the DC resistance of the equipment after the short-time withstand current test does not exceed 200% of the circuit resistance of the circuit prior to the test.
NOTEd) and e) are applicable only to assemblies that may include four-pole power circuit breakers.

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5.6.4

Ground bus and connections

A single-phase short-time withstand current test shall be made on the ground bus. The test parameters shall be as described in 5.6.2.1 through 5.6.2.6, except that: a. The test voltage is to be applied between the ground bus and nearest phase bus. (Incoming connection shall be made from the ground bus to one phase of the source and from the nearest phase bus to another phase of the source.) b. The test voltage shall be at least rated maximum voltage. c. The short-circuit connection shall be made between the ends of the main and ground bus bars at the end opposite the test source connection, using bolted bars of minimum length and having cross section equal to the bus being tested. Insofar as possible, the connections shall not add intentional bracing to the bus structure being tested. d. Only a single 1/2 second test current period is required. The circuit resistance shall be measured with a DC current of at least 100 A flowing prior to the test as a baseline for performance evaluation. 5.6.4.1 Performance

After the test, the ground bus, joints, and connections shall have a. no breakage of insulation or structural components b. no reduction in phase-to-ground or phase-to-phase clearance c. no separation of bus or bus connections, and no reduction in cross section of bus or bus connections. A DC resistance test across the tested circuit shall be made with a minimum of 100 A flowing through the circuit. The DC resistance of the circuit after the short-time withstand current test shall not exceed 200% of the circuit resistance prior to the short-time withstand current test. If the switchgear has not met the requirements of item b) at the conclusion of the test, the dielectric tests described in 5.4 shall be repeated. The switchgear shall be considered to have passed this portion of the short-time withstand current test if it successfully passes the dielectric tests. 5.7 5.7.1 SHORT-CIRCUIT WITHSTAND CURRENT TESTS General

Short-circuit withstand current tests shall be made to demonstrate the mechanical adequacy of the structure, buses, and connections when the bus is subjected to a high current for a specified time. The current for these tests is to be equal to the short-circuit rating of the circuit breakers intended for use in the tested switchgear. Refer to Table 1 of ANSI C37.16-2000 for the preferred current levels. 5.7.1.1 Short-time withstand current test may cover short-circuit withstand current test

When the current and voltage level of the short-time and short-circuit tests are the same, and the test circuit characteristics meet the requirements for each test, satisfactory completion of the short-time withstand current test also covers the need for a short-circuit withstand current test. 5.7.1.2 Tests possibly required at multiple voltage levels

Some circuit breakers have higher short-circuit current ratings at their lower voltage ratings (240 V or 480 V) than they have at the 600 V level. In that case, in addition to the test at maximum rated voltage, additional tests shall be made at any lower voltage for which the short-circuit current rating is higher.

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5.7.1.3

Circuit breaker compartment involvement

Determination of need for including circuit breakers and circuit breaker compartments in the short-circuit withstand current tests, along with criteria for required tests, shall be in accordance with 5.6.1.1 and 5.6.1.2. For fused circuit breakers, if it can be demonstrated that the maximum peak let-through current of the fuse for a given frame size is less than the peak let-through current for which the LV switchgear has been tested, then testing with fused circuit breakers of that frame size is not required. When it is necessary to test fused circuit breaker compartments, the short-circuit current connections shall be made on the outgoing side of the fused circuit breaker. The fuses shall be the maximum current rating supplied by the manufacturer for the circuit breaker frame size. 5.7.2 5.7.2.1 Primary phase bus and connections Circuit characteristics

Prospective current determination, power factor determination (other than for fused circuit breaker equipment), test voltage and frequency shall be in accordance with 5.6.2.1 through 5.6.2.3. For fused circuit breaker equipment, the power factor shall be 20% lagging or less (X/R ratio of 5 or greater), determined in accordance with ANSI/IEEE C37.26-2003. 5.7.2.2 Test connections

Two test configurations are required. The main bus terminals shall be connected to the test circuit power source, and three-phase tests shall be made with a short at the following locations: a. At the end of the main bus opposite from the terminals, to cause a short-circuit current to pass through the main bus and splice. b. At the circuit breaker compartment terminals as covered in 5.6.1.1 or 5.6.1.2, as is appropriate to the construction. Insofar as possible, the connections shall not add intentional bracing to the bus structure being tested. 5.7.2.3 Test duration

The duration of current flow during the short-circuit withstand current test shall be for no less than four cycles on a 60 Hz basis (0.067 s), unless the bus is protected by a current-limiting device, in which case the duration shall be for the time permitted by that device.
NOTEFour cycles is the maximum duration of short-circuit current when circuit breakers with instantaneous trip devices are installed on 600-volt alternating current systems.

5.7.2.4

Test current

The current shall be initiated in test circuits in a manner to ensure that the peak current available is no less than 2.3 times a. the single-phase rms symmetrical value, for single-phase tests, or b. the three-phase rms symmetrical value in one phase, for three-phase tests. For fused circuit breakers, the multiplier is 2.16, instead of 2.3. The rms value of the alternating component of current at the end of three cycles shall be not less than 90 percent of the value measured at one-half cycle after initiation of the current. 5.7.2.5 Performance

Performance shall be in accordance with 5.6.2.7

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5.7.3

Neutral bus (if applicable), ground bus, and connections

Single-phase tests shall be made to prove the strength of the ground bus and the neutral bus with respect to the nearest phase bus. Other than the current level, which shall be based upon the short-circuit withstand current rating, these tests shall be in accordance with 5.6.3 (neutral bus) and 5.6.4 (ground bus). Performance shall be in accordance with 5.6.3.1 (neutral bus) and 5.6.4.1 (ground bus). 5.8 5.8.1 MECHANICAL PERFORMANCE TESTSREMOVABLE CIRCUIT BREAKERS Test Procedure

LV switchgear with drawout circuit breakers shall be subjected to mechanical performance tests consisting of ten complete cycles of operation as described in 5.8.2. These tests shall be conducted on each frame size and type of circuit breaker, without repair or replacement of any functional parts, to demonstrate proper sequential operation and to demonstrate proper operation of the following elements: a. b. c. d. e. f. g. Primary disconnecting devices Secondary disconnecting devices Circuit breaker removable element position interlocks Stored-energy mechanism interlocks, as applicable Structure-mounted circuit breaker position switches (TOC) Auxiliary switches mounted on stationary structure (MOC) Shutters (as applicable)

All primary power shall be disconnected during these mechanical tests. The tests shall be performed either with an electrically operated circuit breaker or with a manually operated circuit breaker having a stored-energy closing mechanism and equipped with secondary disconnecting devices, if the design of the drawout mechanism and the interlocks are the same for both. If they are not the same, both manually and electrically operated designs shall be tested. Mechanical performance tests of fused circuit breakers are not required when the drawout mechanisms, including primary and secondary disconnecting devices, are of equivalent design on fused and unfused circuit breakers. Proper operation of structure-mounted breaker position switches (TOC) and auxiliary switches mounted on stationary structure (MOC) shall be verified during the tests by monitoring the contact position of these switches as applicable. At the beginning of the test, the circuit breaker shall be open and in the disconnected position with the stored-energy mechanism discharged. Primary and secondary disconnecting devices shall be lubricated according to the manufacturers recommendations. 5.8.2 Cycles of Operation

Each complete cycle of operation shall consist of movement of the circuit breaker, by its intended means, from the disconnected position to the connected position, followed by movement of the circuit breaker from the connected position to the disconnected position. The following seven steps shall be performed in each cycle: Step 1. Move the breaker from the disconnected position to the test position and, if required, install a secondary test coupler. a. Close the circuit breaker. b. Check to ensure that the circuit breaker cannot be moved to the connected position while closed. c. Open the circuit breaker.

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ANSI C37.51-2003 (R2010)

NOTEThe disconnected position may correspond to the test position.

Step 2. Move the circuit breaker to a position approximately midway between the test and connected positions or as close to a mid-position as the removable secondary test coupler (if required) will permit. Check to ensure that the circuit breaker cannot be closed, either electrically or mechanically. Step 3. Remove the secondary test coupler if present, and move the circuit breaker to the connected position. a. Close the circuit breaker. b. Check to ensure that the circuit breaker cannot be moved out of the connected position while closed. c. Open the circuit breaker. Step 4. Move the circuit breaker to a position approximately midway between the test and connected positions or as close as possible to a midpoint position as the removable secondary test coupler (if required) will permit. If required, install a secondary test coupler. Check to ensure that the circuit breaker cannot be closed, either electrically or mechanically.1 Step 5. Move the circuit breaker to the test position. a. Close the circuit breaker. b. Check to ensure that the circuit breaker cannot be moved to the connected position while closed. c. Open the circuit breaker. Step 6. Remove the secondary test coupler, if present, and move the circuit breaker to the disconnected position. Step 7. Check to ensure that, when the mechanism is in the fully charged condition, the closing function is blocked or the interlocks ensure mechanism discharge before or during withdrawal of the circuit breaker from the housing. (Automatic discharge is a commonly accepted method.)
NOTEThis step is not required if the stored-energy mechanism and contact assembly are fully enclosed within the breaker element and access for service is not possible.

5.8.3

Performance

At the completion of these tests: a) No maintenance shall have been necessary b) All interlocks shall function in the intended manner c) The removable element shall be capable of moving from connected to disconnected positions by its intended means without difficulty d) The switchgear shall be structurally intact and in a condition to continue in service e) The plating of the contact areas (silver-surfaced or the equivalent) of the primary disconnecting devices shall not have worn through to the underlying layer at the surfaces where the primary disconnecting devices make contact when in the connected position f) The contact areas of secondary disconnecting devices, if plated, shall not have worn through to the underlying layer at the surfaces where the secondary disconnecting devices make contact when in either the test or connected positions.

February 2011 Errata: replaced disconnect with connect.

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ANSI C37.51-2003 (R2010)

Section 6 TREATMENT OF NONCONFORMING RESULTS


When nonconforming results occur during testing, the nonconformance shall be evaluated and corrected, and the equipment shall be retested. A design change made to the LV switchgear to correct a nonconformance shall be evaluated for its effect on preceding tests. When analysis indicates that a particular corrective action would not have affected results obtained in previous tests, it shall be permitted to take the corrective action without repeating the previously completed tests. When analysis indicates that a particular corrective action may have caused a nonconformance in tests previously completed, only those potentially affected tests shall be repeated on the LV switchgear to which the corrective action has been applied. In deciding whether or not to repeat a previous test, it is important that the decision be based on the corrective action taken and not on the nonconformance that occurred.

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ANSI C37.51-2003 (R2010)

Section 7 PRODUCTION TESTS


7.1 GENERAL

Unless otherwise specified, all production tests shall be made by the manufacturer at the factory on the complete LV switchgear or its component parts for the purpose of checking the correctness of manufacturing operations and materials (See ANSI/IEEE C37.20.1-2002). Drawout circuit breakers need not be tested in the assembly if they are tested separately. Production tests shall include the following: a. b. c. d. 7.2 Dielectric withstand voltage tests (7.2) Mechanical operation tests (7.3) Grounding of instrument transformer cases test (7.4) Electrical operation and wiring tests (7.5) DIELECTRIC WITHSTAND VOLTAGE TESTS

Power frequency withstand tests shall be made on each LV switchgear in accordance with the general requirements of 5.4 with the exception that tests in item b) of 5.4 are not required. Tests shall be made between each phase and ground with the other phases grounded, and between neutral and ground. The duration of the tests may be reduced to 1 second if a voltage 20% greater than that specified in 5.4 is used. Control devices, voltage transformers and control power transformers, which are connected to the primary circuit, may be disconnected during this test. 7.3 MECHANICAL OPERATION TESTS

Mechanical tests shall be performed to ensure the proper functioning of mechanical interlocks, etc. These tests shall ensure the interchangeability of removable elements designed to be interchangeable. 7.4 GROUNDING OF INSTRUMENT TRANSFORMER CASES TEST

The effectiveness of grounding of each instrument transformer case or frame shall be checked with a low potential source, such as 10 V or less, by using bells, buzzers, or lights. This test is required only when instrument transformers are of metal case design. 7.5 7.5.1 ELECTRICAL OPERATION AND WIRING TESTS Control Wiring Continuity

The correctness of the control wiring of a LV switchgear assembly shall be verified by either or both of the following: 1. Actual electrical operation of the component control devices 2. Individual circuit continuity checks by electrical circuit testers 7.5.2 Control Wiring Insulation Test

A 60 Hz test voltage shall be applied after all circuit grounds have been disconnected. Either 1500V for 1 min or 1800 V for 1 s may be utilized, except that wires connected directly to the main power circuit shall be subjected to the test voltage applicable to the main power circuit (see 7.2). All wires shall be tested either individually or in groups. Small bare copper wire may be

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ANSI C37.51-2003 (R2010)

used to short-circuit voltage sensitive components such as coil windings and electronic devices. At the option of the manufacturer, switchgear-mounted devices that have been individually tested may be disconnected during the test. 7.5.3 Polarity Verification

Tests or inspections shall be made to ensure that connections between instrument transformers and meters or relays, etc., are correctly connected with proper polarities in accordance with circuit diagrams. Instruments shall be tested to ensure that pointers move in the proper direction. This does not require tests using primary voltage and current. 7.5.4 Sequence Tests

LV switchgear involving the sequential operation of devices shall be tested to ensure that the devices in the sequence function properly and in the order intended. This sequence test need not include remote equipment controlled by the LV switchgear assembly. However, this equipment may be simulated, where necessary.

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ANSI C37.51-2003 (R2010)

Section 8 RETESTING
Retesting is not required if the design has not changed. A design change made to the LV switchgear shall be evaluated for its effect on rated performance. If it is determined that performance may be affected by the change, the relevant conformance tests shall be repeated.

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