Professional Documents
Culture Documents
Surendra Singh with Raj Gupta, Ray Hughes, and Reeta Vyas
Department of Physics, University of Arkansas
2005
How to use this manual
This manual is to help you perform the experiments described herein and
develop an understanding of the basic principles of Optics. Refer to your
textbook for additional discussion of these principles. You should familiarize
yourself with both the details of the procedure and the physics involved in
each of these experiments before you come to the laboratory.
We invite your comments to improve the manual.
ii
Contents
How to use this manual ii
1 Thin Lenses 1
1.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 3
1.2.1 Converging Lens . . . . . . . . . . . . . . . . . . . . . 3
1.2.2 Diverging Lens . . . . . . . . . . . . . . . . . . . . . . 5
1.3 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 7
2 Optical Instruments 11
2.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.1.1 The Magnifying Lens . . . . . . . . . . . . . . . . . . . 11
2.1.2 The Telescope . . . . . . . . . . . . . . . . . . . . . . . 13
2.1.3 The Compound Microscope . . . . . . . . . . . . . . . 15
2.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 16
2.2.1 The Magnifying Lens . . . . . . . . . . . . . . . . . . . 16
2.2.2 The Telescope . . . . . . . . . . . . . . . . . . . . . . . 18
2.3 Beam Expanders (optional) . . . . . . . . . . . . . . . . . . . 20
2.4 Other Instruments . . . . . . . . . . . . . . . . . . . . . . . . 20
2.5 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 21
2.5.1 The Magnifying Lens . . . . . . . . . . . . . . . . . . . 21
2.5.2 The Telescope . . . . . . . . . . . . . . . . . . . . . . . 21
3 Measurement of Refractive Index 23
3.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.1.1 The Prism . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.1.2 Inteferometric Refractometer . . . . . . . . . . . . . . . 25
3.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 26
3.2.1 The Prism . . . . . . . . . . . . . . . . . . . . . . . . . 26
iii
3.2.2 The Refractometer . . . . . . . . . . . . . . . . . . . . 31
3.3 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 33
3.3.1 The Prism . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.3.2 The Interferometirc Refractometer . . . . . . . . . . . 34
4 Interference by the Division of the Wavefront 38
4.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
4.1.1 Lloyds Mirror . . . . . . . . . . . . . . . . . . . . . . . 38
4.1.2 Fresnels Biprism . . . . . . . . . . . . . . . . . . . . . 40
4.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 40
4.2.1 Determination of . . . . . . . . . . . . . . . . . . . . 42
4.3 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 44
4.3.1 Lloyds Mirror . . . . . . . . . . . . . . . . . . . . . . . 44
4.3.2 Fresnels Biprism . . . . . . . . . . . . . . . . . . . . . 45
5 Michelson Interferometer 46
5.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
5.1.1 Coherenc Time and Coherence Length . . . . . . . . . 49
5.1.2 Polarization Dependence of Interference . . . . . . . . 50
5.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 51
5.2.1 Wavelength of HeNe Laser . . . . . . . . . . . . . . . . 51
5.2.2 Wavelength of Sodium D Lines . . . . . . . . . . . . . 52
5.3 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 53
6 Polarization of Light 55
6.1 States of Polarization . . . . . . . . . . . . . . . . . . . . . . . 56
6.1.1 Unpolarized light . . . . . . . . . . . . . . . . . . . . . 56
6.1.2 Polarized Light . . . . . . . . . . . . . . . . . . . . . . 57
6.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 58
6.2.1 Linear Polarization . . . . . . . . . . . . . . . . . . . . 58
6.2.2 Brewster Angle (Optional) . . . . . . . . . . . . . . . . 60
6.2.3 Circular Polarization . . . . . . . . . . . . . . . . . . . 61
6.2.4 Optical Diode : Optical Isolator . . . . . . . . . . . . . 62
6.2.5 Polarization Rotator . . . . . . . . . . . . . . . . . . . 63
6.2.6 Elliptically Polarized Light . . . . . . . . . . . . . . . . 63
6.2.7 An Amusement . . . . . . . . . . . . . . . . . . . . . . 64
7 Resolving Power of a Grating and Limit of Resolution 67
7.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
7.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 68
7.2.1 Resolving Power of a Grating . . . . . . . . . . . . . . 68
7.2.2 Determination of the Grating Constant d . . . . . . . . 69
7.3 Limit of Resolution . . . . . . . . . . . . . . . . . . . . . . . . 69
7.4 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 71
8 Image Formation and Spatial Filtering 73
8.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
8.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 76
8.3 Experimental Data . . . . . . . . . . . . . . . . . . . . . . . . 79
9 Holography 80
9.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
9.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 81
9.2.1 Transmission and Reection Holograms . . . . . . . . . 82
9.2.2 Darkroom Chemicals Preparation . . . . . . . . . . . . 85
9.2.3 Viewing a Transmission Hologram . . . . . . . . . . . . 86
10 Photoelectric Eect 89
10.1 Theory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
10.2 Experimental Procedure . . . . . . . . . . . . . . . . . . . . . 91
A Error Analysis 95
A.1 Signicant Figures . . . . . . . . . . . . . . . . . . . . . . . . 96
A.2 Classication of Errors . . . . . . . . . . . . . . . . . . . . . . 98
A.3 Normal Distribution . . . . . . . . . . . . . . . . . . . . . . . 98
A.4 Sample Mean and Variance . . . . . . . . . . . . . . . . . . . 100
A.5 Propagation of Errors . . . . . . . . . . . . . . . . . . . . . . . 101
A.6 Standard Deviation of an Average . . . . . . . . . . . . . . . . 103
A.7 Special Rules for Combining Errors . . . . . . . . . . . . . . . 104
A.7.1 Sum and dierence: V = ax by . . . . . . . . . . . . 104
A.7.2 Product of various powers: V = x
p
y
q
. . . . . . . . . . 104
A.7.3 Logarithm of a quantity: V = Aln x . . . . . . . . . . 105
A.7.4 Exponential of a quantity: V = Ae
bx
. . . . . . . . . . 105
Chapter 1
Thin Lenses
1.1 Theory
The object and image distances, s
o
and s
i
, both measured from the center
of a thin lens, are related by the lens formula
1
s
o
+
1
s
i
=
1
f
, (1.1)
where f is the focal length of the lens. The image distance s
i
is positive for
a real image and negative for a virtual image. Similarly, the object distance
s
o
is positive for a real object and negative for a virtual object. A real image
is formed by light rays that converge after passing through the lens. A real
image can be projected onto a screen. A virtual image is formed by light
rays that diverge after passing through the lens. To the eye viewing these
refracted rays, they appear to come from an image located on the other side
of the lens. A virtual image cannot be projected onto a screen.
Q1 : What kind of rays are associated with real and virtual
objects?
Lenses can be divided into two categories : converging and diverging.
A converging lens is thicker in the middle than at the edges. A diverging
lens is thinner in the middle than at the edges.
Q2 : When are these two statements about converging and
diverging lenses false?
Light rays incident parallel to the axis of a converging lens converge to-
ward a point on the axis after refraction by the lens
1
. This point is called
1
For a diverging lens the refracted rays appear to diverge from a point.
1
2 CHAPTER 1. THIN LENSES
Qty. Description
1 optical bench with stages
1 positive lens
1 negative lens
1 lens holder
1 laboratory telescope with a holder
1 circular frame with vertical wire attached
1 image screen with holder
1 plane mirror with holder
1 illuminated object (could use a desk lamp and a pin or aperture)
Table 1.1: Apparatus for the Thin Lenses experiment.
the image focal point of the lens. Thus the focal point is the image of an
axial object at innity. There is another axial point which is such that the
rays starting from an object placed there emerge parallel to the axis of the
lens
2
. This point is called the object focal point. The distance from the cen-
ter of the lens to the focal point is called the focal length of the lens. For a
lens surrounded by the same medium on the two sides, the object and image
focal points are located symmetrically on the opposite sides of a lens. Their
distances from the lens have the same value and we will denote this length
by f.
A converging lens has a positive focal length, f > 0, and is therefore also
called a positive lens. A diverging lens has a negative focal length, f < 0.
For this reason a diverging lens is also called a negative lens. Algebraic signs
should be observed carefully in Eq. (1.1).
Q3 : Focal length f is one of the two characteristic parameters
of a lens. What is the other parameter?
From Eq. (1.1), we see that the object and image locations are inter-
changeable. This means if an object at a distance s
o
produces an image at
s
i
, then the same object placed at a distance s
i
from the lens will produce
an image at at s
o
. Two such points that an object at one produces an image
at the other, are called conjugate points.
2
For a diverging lens the rays are incident on the lens converging toward the object
focal point and emerge parallel to the axis.
1.2. EXPERIMENTAL PROCEDURE 3
1.2 Experimental Procedure
1.2.1 Converging Lens
In this portion of the experiment, you will determine the focal length of a
positive lens. For every procedure described below, make at least three
determinations of the focal length. Sample tables for recording
your measurements have been provided at the end of this Chapter.
Be sure to record the correct number of signicant gures, for
example, 50.0cm0.1cm. Report your results along with uncertainties.
Focal length by parallel rays
Method I
Form a sharp image of a distant object (10 m or farther) upon a screen and
measure the distance from the center of the lens to the screen [ Fig 1.1(I)].
This distance is equal to the focal length (f) of the lens. Draw a ray diagram
for this method. Make several independent measurements. Record your
measurements in a Table in INK. Take the average of your results and assign
uncertainties.
Method II
Focus a telescope on a distant object and without changing the adjustment
of the telescope, place it on an optical bench. Aim it toward the converging
lens. Place an illuminated object on the other side of the lens [Fig 1.1 (II)].
Keep the telescope, the lens, and the object at the same height above the
bench. Look through the telescope and move the lens either toward or away
from the object until you get a sharp image of the object in the telescope.
Measure the distance from the center of the lens to the object. This distance
is equal to the focal length of the lens. Make three or more independent
measurements for the lens provided and take the average of your results.
Assign uncertainty. Draw a ray diagram to explain this method.
Focal length by parallax
Place a vertical plane mirror just behind the lens [ Fig 1.1 (III)]. Set an
illuminated object (a pin or short vertical wire) in front of the lens. Look
past the illuminated object toward the lens. You should see an inverted
image of the object. Move the object toward or away from the lens until
its image appears to oat directly above the object. When this happens,
the object and its image are a focal length away from the lens. Draw a ray
4 CHAPTER 1. THIN LENSES
Mirror Lens Object Distant Lens Image
Object on a screen
f
Distant Lens Telescope
Object
f
(I) (II) (III)
Image
Observer
Figure 1.1: Measurement of the focal length of a positive lens by (I) the
image of a distant object; (II) using a telescope focused for parallel rays;
(III) the method of parallax.
diagram and explain how this method works. Take several measurements,
calculate the average of your measurements and assign errors.
Focal length by conjugate points
Place an illuminated object near one end of the optical bench. Place the lens
before the object and put a screen on the other side of the lens to receive
the image of the object. Adjust the positions of both the lens and the screen
until a sharp image appears on the screen. The object and its image dene
a pair of conjugate points (Fig. 1.2).
Record the object and image distances s
o
and s
i
. Measure the distance b
between the object and its image.
Without moving the object or the screen, move the lens until another
sharp image is cast on the screen. Record the distance a between the new
and the old positions of the lens. Also record the object and image distances
s
o
and s
i
for the new position of the lens. In terms of a and b the focal length
of the lens is given by
f =
b
2
a
2
4b
. (1.2)
Q4 : Derive this relation in your report.
Repeat the measurements described above for at least ve values of b and
calculate the focal length in each case using Eq. (1.2). Take the average and
assign uncertainty.
Use the data recorded above for object and image distances to plot 1/s
i
(yaxis ) against 1/s
o
(xaxis). The points should lie on a straight line.
1.2. EXPERIMENTAL PROCEDURE 5
s
o
s
i
a
b
s'
o
s'
i
O
L
I
F
O
L
I'
F
Figure 1.2: Focal length by conjugate points
Note that you should have at least 10 pairs of data from ve measurements
of b. Intercept of this straight line with the x or the y axis is 1/f.
Determine f from the intercept.
1.2.2 Diverging Lens
A diverging lens by itself does not form a real image. Therefore the methods
described for positive lenses cannot be used to determine the focal length of
a diverging lens. In this part of the experiment, we will learn two methods
for determining the focal length of a negative lens.
Focal length by virtual object
Set up an illuminated object, positive lens, and screen as in the Focal length
by conjugate foci subsection of Sec. 1.2.1 and obtain a sharp image I
1
on
the screen. Record the image distance from the positive lens as s
i1
in the
table provided at the end of this Chapter. Now place the diverging lens
between the converging lens and the screen. The original image I
1
serves as
a virtual object (negative object distance) for the diverging lens. Without
moving the screen record the distance s
o2
with due care for the algebraic
signs. The diverging lens will cause the image to lie farther from the positive
lens (see Figure 1.3). Now move the screen until the new image I
2
is in
focus. Record the distance of the screen from the negative lens as s
i2
in the
6 CHAPTER 1. THIN LENSES
O
s
o1
s
i1
s
o2
s
i2
L
1
L
2
F
1
I
1
I
2
Figure 1.3: Measurement of focal length of a negative lens.
table provided. This arrangement results in a real image if the converging
lens focal length is shorter than the magnitude of the focal length of the
diverging lens. The two positions of the screen recorded above are a pair of
conjugate points of the diverging lens. Compute the focal length of the lens
using Eq. (1.1). Make at least three measurements.
Focal length by parallax
Mount the diverging lens on the optical bench. On the side opposite the
viewer place an illuminated object. Looking through the lens, determine the
general location of the image. At the approximate site of the image, mount
the image locator. The image locator is a short vertical wire attached to a
circular frame (see Fig. 1.4). The image locator wire frame should be directly
visible outside the eld of view of the lens. Use the tip of the wire frame to
locate the image of the object. Adjust the position of the image locator wire
frame viewed above the lens until its position coincides with the image of the
object formed by the lens. Measure the distances from the center of the lens
to both the wire frame (d
i
) and the object (d
o
).
Q5 : How are d
i
and d
o
related to s
o
and s
i
?
Repeat this procedure three times for the given lens. Record the data in
the table provided and calculate the focal length of the lens.
1.3. EXPERIMENTAL DATA 7
Image of
object wire
Curved wire
Field of View
Figure 1.4: Special image locator; circular frame with vertical wire.
1.3 Experimental Data
Converging Lens
Q6 : In Method I of the Focal length by parallel rays subsection
of Sec. 1.2.1, why will the image formed lie in the principal focal
plane of the lens?
trial 1 trial 2 trial 3 average std dev
focal length f
Table 1.2: Focal length by parallel rays, method I.
Q7 : In Method II of the Focal length by parallel rays, Sec. 1.2.1,
why is the distance measured equal to the focal length of the lens ?
Q8 : In the Focal length by parallax,Sec. 1.2.1, why are the
object and its image a focal length away from the lens when the
8 CHAPTER 1. THIN LENSES
trial 1 trial 2 trial 3 average std dev
focal length f
Table 1.3: Focal length by parallel rays, method II.
trial 1 trial 2 trial 3 average std dev
focal length f
Table 1.4: Focal length by parallax.
virtual image lies directly above the object? Draw a ray diagram.
Q9 : In the Focal length by conjugate points, Sec. 1.2.1, how
does the second set of measurements ( s
o
, s
i
) compare with the rst
set (s
o
, s
i
)?
Q10 : Compare the values of the focal length determined above.
Which method gives more reliable result ? Give reasons.
Use equation (1) to make a plot of s
i
versus s
o
for a positive lens. You
may nd it convenient to plot s
o
and s
i
in units of the focal length of the
lens. Remember that s
o
and s
i
can be positive or negative. Label regions
of graph by the type of image that would be formed (magnied/reduced,
upright/inverted, real/virtual). Your data for the positive lens correspond to
one branch (real objects and images) of this curve. There is another branch
of this curve that corresponds to virtual objects and images.
1.3. EXPERIMENTAL DATA 9
trial 1 trial 2 trial 3 trial 4 std dev
s
o
s
i
s
o
s
i
a
b
f
Table 1.5: Focal length by the method of conjugate points
Q11 : What arrangement would you use to explore this branch?
Diverging Lens
10 CHAPTER 1. THIN LENSES
trial 1 trial 2 trial 3 std dev
s
o1
s
i1
s
o2
s
i2
f
focal length f =
Table 1.6: Focal length of a negative lens by virtual object.
trial 1 trial 2 trial 3 std dev
d
f
d
v
f
focal length f =
Table 1.7: Focal length of a negative lens by parallax.
Chapter 2
Optical Instruments
2.1 Theory
The simple magnier, telescope, and microscope are examples of optical in-
struments. Optical instruments aid the eye by increasing the angular size
of the retinal image of an object. The angular size of the retinal image, in
turn, is equal to the angle subtended at the eye by the object or the image
under view. This angle increases as the object under view approaches the
eye. The shortest object distance for which the eye can comfortably produce
a sharp retinal image is called the near point N of the eye. Thus with the
unaided eye the largest retinal image is obtained when the object is at the
near point. For the normal eye N 25 cm. With an optical instrument, the
eye sees the magnied image of the object formed by the instrument. It is
this magnifying power (M.P.) that makes an optical instrument useful. It is
dened as the ratio of the angle subtended at the eye by the image produced
by the instrument to the angle subtended at the unaided eye by the object
when it is placed at the near point of the eye. In this experiment we study
how two common instruments aid the eye.
2.1.1 The Magnifying Lens
Suppose a small object OO
as shown
in Fig. 2.1(b). The lens forms a virtual, upright, and magnied image II
of
the object. The eye placed behind the lens sees the image II
. If the eye is
11
12 CHAPTER 2. OPTICAL INSTRUMENTS
O
O'
I'
I
L'
L
s
i
= - q
s
o
= p
(b)
F
O'
O
N = 25 cm
(a)
Figure 2.1: Magnifying power of a simple magnier.
placed immediately behind the lens, the angle in Fig. 2.1(b) is very nearly
equal to the angle subtended at the eye by the image II
, (2.1)
which for small angles and (tan , sin ), becomes [see Fig. 2.1]
M.P. =
N
p
. (2.2)
Using the relation between object location s
o
p, image location s
i
q
(notice that we have a virtual image), and the focal length f
1
p
1
q
=
1
f
, (2.3)
we can express the magnifying power as
M.P. =
N
p
= N
f + q
fq
. (2.4)
Since q lies in the interval N q < , the magnifying power may vary in
the interval
N
f
M.P.
N
f
+ 1. (2.5)
2.1. THEORY 13
It is clear that for the magnifying power to exceed unity the focal length f
must be smaller than N.
Note that, in general, magnifying power and ordinary magnication (ratio
of image size to object size) are dierent. Also, since the eye is relaxed
when looking at distant objects, it is better to focus the magnifying lens
so that the virtual image appears far from it. In this case the magnifying
power is M.P.= N/f. When the image is at N, the magnifying power is
(M.P.= N/f + 1). This small gain in magnifying power is seldom worth the
eye strain that accompanies it.
A simple magnier described here (or some sophisticated version of it
called an eyepiece) is part of many other instruments such as compound mi-
croscopes and telescopes. For microscopic objects a simple magnier does
not have enough magnifying power. In such cases we use a compound mi-
croscope. A compound microscope uses a short focal length lens, called the
objective, to produce a real enlraged image of the microscopic entity under
investigation. The image formed by the objective is further enlarged by the
eyepiece.
2.1.2 The Telescope
The telescope is an instrument for viewing objects hundreds of meters to
millions of kilometers away. Such objects subtend small angles at the eye
and cannot be brought closer to the eye for direct inspection. We shall see
that a telescope aides the eye in such cases.
A simple telescope consists of a large aperture objective lens L
o
of long
focal length f
o
> 0, and an eyepiece lens L
e
of short focal length f
e
> 0.
Figure 2.2 shows the optical paths of two sets of rays propagating through a
telescope. Rays 1 and 2 originate from a point on the lower edge and rays 3
and 4 originate from the upper edge of some distant object ( s
o
f
o
angular
size ). The objective forms a real, inverted ( and minied) image PP
of
the distant object in its focal plane.
1
Image PP
at innity. Image II
objective
Entrance Pupil
diameter D
1
2
3
4
to infinity
f
o
f
e
3
4
1
2
Exit Pupil
Diameter d
L
o
L
e
I
I'
Figure 2.2: Telescope; optical paths of two sets of rays.
has eectively increased the angle subtended by the object at the eye. Note
that the nal image II
. (2.6)
These angles, greatly exaggerated in the gure, are quite small in the cases
of practical interest. By tracing a ray incident through the rst focal point of
the objective you can show that, for relaxed viewing, the magnifying power
is also given by
M.P. =
f
o
f
e
. (2.7)
It might appear from Eq. 2.7 that eyepieces of smaller focal lengths f
e
would
result in bigger and better images, but this is not true because diraction
by the objective lens which you may not have studied yet ultimately
limits the resolving power (ability to see details) of a telescope.
There is another way for determining the magnifyiong power of a tele-
scope. An examination of Fig. 2.2 shows that all rays emerging from the
eyepiece pass through a small circle at HH
Objective
Virtual image formed by
the eyepiece of the real
image produced by the
objective
Figure 2.4: Determination of the magnifying power of a telescope.
We make another determination of the magnifying power of the telescope.
Illuminate the objective of the telescope from the side and project its real
image formed by the eyepiece lens on a white screen placed behind the eye-
piece. This real image is the eye ring HH
HH
=
D
d
,
22 CHAPTER 2. OPTICAL INSTRUMENTS
where LL
, HH
(D)
measured HH
(d)
Calculated M.P.
Table 2.4: Measurements of the telescope eye ring.
Chapter 3
Measurement of Refractive
Index
3.1 Theory
The refractive index n of a medium is dened by
n =
c
v
, (3.1)
where c is the speed of light in free space and v is the speed of light inside
the medium. The refractive index n depends on the wavelength (strictly
speaking, frequency) of light traversing the medium. For most transparent
materials the dependence of n on wavelength is given by the Sellmeiers
formula
n() = n
0
+
B
2
2
0
2
0
. (3.2)
The constant B is given by
B =
Ne
2
8
2
0
m
e
c
2
, (3.3)
where N is the eective number of electrons per unit volume participating
in the polarization process,
o
= c/
0
is their characteristic frequency, and e
and m
e
are the electronic charge and mass. In the limit
0
Eq. (3.2)
can be approximated as
n() A +
B
2
, (3.4)
23
24 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
where constants A = n
o
+ B
2
o
and B
= B
4
o
. It follows from Eq. (3.2)
that the refractive index increases as the wavelength of light decreases. This
behavior of the refractive index is referred to as normal dispersion. For a
dilute gas n
0
1 and the electron density N is proportional to the molecular
density . It follows that the refractive index is proportional to the density
of molecules,
n 1 = const . (3.5)
From the ideal gas law, = p/k
B
T, and it follows from Eq. (4) that at
constant temperature
n 1 = C p , (3.6)
where p is the absolute pressure of the gas, C is a constant of proportionality,
and k
B
is the Boltzmann constant.
A knowledge of the refractive index of a material is important in many
applications involving optical fabrication and design. For example in fabri-
cating antirefelection coating on lenses for ne optical instruments requires a
knowledge of the refractive indices of the materials of the substrate and thin
lms. Many studies involving phase changes are carried out using measure-
ment of n and its relation to macroscopic properties. Here we will study two
methods for determining the refractive index. The rst method is more suit-
able for liquids and solids. The second method is an interferometric method
used for raried media such as gases.
3.1.1 The Prism
A convenient method for determining the refractive index is to use the mate-
rial in the form of a prism. Refractive index of the material of a prism using
the method of angle of minimum deviation is given by
n() =
sin [(A + D
m
()) /2]
sin (A/2)
. (3.7)
Here A is the Prism angle and D
m
() is the angle of minimum deviation.
Since n depends on the wavelength (strictly speaking, frequency), each wave-
length has a slightly dierent angle of minimum deviation. We will use this
to study the variation of the refractive index as a function of wavelength.
3.1. THEORY 25
M
1
M
2
BS
diffuse screen
or a lens
*
Source
L
n
Figure 3.1: Setup of the refractometer experiment.
3.1.2 Inteferometric Refractometer
This refractometer is a variation of Rayleigh refractometer and uses two-
beam interference of light to determine the refractive index of a gas. This
method is very sensitive and is excellent for measuring small changes in the
refractive index of a material. We will use this method to study the pressure
dependence of the refractive index of air. Refractive index of air at room
tempertaure and pressure is n 1.000. As shown in Fig. 3.1, a beam splitter
divides the incident light into two and directs them along separate arms of
an interferometer. One beam travels in air at room temperture and pressure.
The second beam traverses a gas tube at room temperature, but where the
pressure can be varied. Two beams are brought together at the beam splitter.
The resulting interference pattern depends on the relative path dierence
between the two arms of the interferometer. If a laser is being used as the
source you may be able to project these fringes on a wall or screen. In our
experiment we change the refractive index of the gas in the cell by altering
the gas pressure inside the cell.
Suppose initially the cell is open to the atmosphere so that its pressure
is the atmospheric pressure (p
0
) and then it is evacuated with a vacuum
pump. As the pressure in the tube drops the refractive index of air in the
cell decreases (cf Eq. (5)) from its initial value n
0
and the interference fringes
will be observed to shift.
Let the refractive indices of air in the open arm and the cell be n
0
and
n, respectively. Then the dierence in the optical paths of the two beams is
26 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
(n
0
n) 2L where L is the cell length. When the refractive index of the air
in the cell changes by n, the total number of fringes m, that are shifted, is
given by
m = n
2L
,
= C [p]
2L
, (3.8)
where p is the change in the pressure of the evacuated compartment from
its initial pressure p
0
. Equation (3.8) has the form of the equation of a
straight line, where m would be plotted along the ordinate (vertical axis)
and p along the abscissa (horizontal axis). The slope of this straight line is
(m/p) = 2CL/ . Assuming we know the wavelength of the light and
the length of the cell L, we can determine the value of the proportionality
constant C. Substituting this result into Eq. (3.6), we nd that the refractive
index of air is given by
n = 1 +
_
m
p
_
2L
p . (3.9)
Absolute pressure p is given by p
0
p. By counting the number of fringes m
that pass a reference point as the pressure changes by p, we can determine
n for any pressure p.
3.2 Experimental Procedure
Make at least three measurements of each quantity and then de-
termine the average and its standard deviation.
3.2.1 The Prism
The spectrometer consists of a collimator, a dispersing element, and a tele-
scope. Two types of student spectrometer are available. Their working is
similar. The locations of various controls are listed in Table 3.2.
Note that in order to use any of the ne adjust features the corresponding
lock screw must be tightened. Do not force rotation of the instrument when
the lock screw is tightened. Placed the prism upon the spectrometer table
and clamp it to the table. A built-in magnifying glass is used to read the
Gaertner vernier, while the Pasco spectroscope has a separate magnifying
glass. If you are unfamiliar with reading vernier scales ask your instructor
for help.
3.2. EXPERIMENTAL PROCEDURE 27
Qty. Description
1 Pasco or Gaertner student spectrometer
1 glass prism
1 helium discharge tube
1 desklamp or other white-light source
Table 3.1: Apparatus for the Prism Experiment.
Control Gaertner Pasco
telescope rotation lock screw on telescope base directly beneath telescope
telescope rotation ne adjust directly beneath telescope beneath and to right of telescope
spectrometer table lock screw directly beneath table directly beneath table
spectrometer table height lock screw directly beneath table n/a
spectrometer table leveling screws underneath table underneath table
table rotation lock screw n/a base
table rotation ne adjust n/a base
collimator slit width adjust input of collimator input of collimator
telescope focus sliding eyepiece focus knob on telescope
collimator focus sliding lens focus knob on collimator
Table 3.2: Comparison of Gaertner and Pasco spectrometers.
28 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
A
2A
collimated
beam
prism
Figure 3.2: Determination of the prism angle A.
Determination of Prism Angle
To determine the refractive index of a material in the form of a prism requires
that we know the angle of the prism. A white light source is used for this
measurement. Place the prism onto the spectroscope table so that it splits
the collimated beam into two as in Fig. 3.2. With the telescope rotation lock
screw loosened, swing the telescope to view one of these beams. Tighten the
telescope rotation lock screw and use the telescope rotation ne adjust control
to place the crosshairs on one of the edges of the image of the collimator slit
seen through the telescope. Focus the crosshairs if necessary. Record the
angular position of the telescope using the degree scale and vernier, and then
loosen the lock screw and swing the telescope to the other side to receive the
second beam. Using the technique described above, record the position of
the telescope again. As shown in Fig. 3.2, the angle of the prism, A, is simply
half the angle between the two beams. Repeat this measurement three times
and calculate the average value of A and its standard deviation.
Determination of Refractive Index
Once the prism angle A is known the refractive index of the prism is deter-
mined by measuring the angle of minimum deviation suered by the light
beam from the collimator in passing through the prism. When the prism
is set for minimum deviation, the light passes symmetrically through the
prism. Using the Helium light source, move the telescope and prism about
until the spectrum of light appears as shown in Fig. 3.3(a). You will see dif-
ferent colored images of the slit. The collimator, prism, and telescope should
be placed as shown in Fig. 3.3(b). Rotate the prism table and observe the
3.2. EXPERIMENTAL PROCEDURE 29
D
colllimator
prism
angle of
deviation
telescope telescope
D
angle of
deviation
(b)
blue red
next order -2 -1 0 1 2 next order
(a)
Figure 3.3: (a) Spectrum as viewed through the spectroscope eyepiece. (b)
Measurement of angle of minimum deviation.
30 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
Helium spectral lines
Color (nm)
red 706.5
red 667.8
yellow 587.5
green 500.1
blue-green 492.2
blue 471.3
violet 447.1
Table 3.3: Helium spectral lines.
motion of slit images. You will notice that as the prism table is rotated slit
images rst move closer to the original undeected beam direction direction
and then move away from the original beam direction as we continue to ro-
tate the prism table in the same direction. This means that the angle of
deviation D rst decreases and then increases. At some point the angle of
deviation D (see Fig. 3.3(b)) is minimized. This happens at dierent posi-
tions for dierent colored images. While viewing a particular color image of
the slit through the telescope, and using the cross hairs measure the angle of
minimum deviation D you can produce.
Rotate the prism and the telescope so that the angle of deviation changes
sign. Measure the angle of minimum deviation again. Note that D is mea-
sured from the undeviated beam from the collimator. Repeat this measure-
ment for a total of three readings for each of the six to eight colors of the
spectrum. Calculate averages and standard deviations as usual.
From measured A and Ds calculate the refractive index at dierent wave-
lengths by using Eq. (3.7). The wavelengths for each spectral line may be
obtained from the Table 3.3. Plot a n vs curve by using the data collected
above drawing error bars for each data point. Fit a smooth curve of the form
given by Eq. (2) through these points. What are the values of B,
0
and n
0
.
3.2. EXPERIMENTAL PROCEDURE 31
Qty. Description
1 optical bench with translating stage for eyepiece
1 Helium-Neon laser ( 632.8nm)
1 laser mount that will attach to optical bench
1 beam expander to provide spatially broad beam of light
1 double slit with large slit separation
1 gas cell
1 vacuum pump for evacuating tube compartment
1 pressure gauge
Table 3.4: Apparatus for the Refractometer experiment.
3.2.2 The Refractometer
Determination of Refractive Index
The He:Ne laser, beam expander or diuser, interferometer, and eyepiece
are placed on the optical bench so that they are aligned vertically and hor-
izontally. Adjust the interferometer arm lengths to be approximately the
same. Measure the tube length L, recording the data in the place provided
in Sec. 3.3.2.
When the system is properly aligned, the interference fringes should ap-
pear similar to those seen in the Michelson interferometer.
Connect the vacuum pump and the gauge to the cell. Adjust the rate of
change of pressure in the compartment for ease of counting fringes. One way
to achieve this is to restrict the evacuation valve. Another method is to rst
evacuate the compartment, record the gauge reading, and then turn o the
vacuum pump, allowing air to leak slowly back into the compartment. One
person should count the fringes, while the other reads the gauge. Record
fringe count m and p in the table provided. Note that m recorded in the
data table is the running count of the fringes passing the reference point. A
convenient pressure interval to record m is 2cm of mercury, although you may
use any interval that is convenient. If fringe shift is being recorded during
evacuation the rst nonzero table entry will be for p = 2cm, followed by
p = 4cm, etc. If m is being recorded while the air is leaking back into the
tube the rst reading should be the maximum gauge pressure p
m
. The rst
nonzero entry will be p
m
2cm, followed by p
m
4cm etc. It is suggested
32 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
that you convert all pressure readings from cm of mercury to Torr using
that 76.0cm of Hg = 760Torr. Take three sets of data, as indicated by the
data-table headings m
trial1
, m
trial2
, and m
trial3
. Then nd the average and
standard deviation for each p, entering these values in the table, too. Plot
the averages of these readings and from the slope of the resulting straight
line C
_
2L
_
determine the value of C, which should be on the order of 10
7
( 632.8nm). Please note that you are to plot p and not p.
The absolute pressure within the evacuated compartment of the refrac-
tometer is needed for the nal portion of this lab. This may be obtained
from the gauge pressure as follows (all units are cm of mercury):
p
abs
= p
atm
p
gauge
, (3.10)
where p
abs
is the absolute pressure of the compartment, p
atm
is atmostpheric
pressure which well assume is 76.0cm of mercury or 760 Torr, p
gauge
is
the gauge pressure. Using this relationship and (n 1) = Cp
abs
, calculate
(n 1) for various absolute tube pressures (in Torr) that were encountered
during your experiment. A table has been provided for this purpose. Note
that n should increase with pressure.
Now plot (n 1) versus p
abs
and extrapolate the resulting straight line
to p
abs
760 Torr. Record the extrapolated value in the table referred to in
the preceding paragraph.
3.3. EXPERIMENTAL DATA 33
3.3 Experimental Data
3.3.1 The Prism
trial 1 trial 2 trial 3 average std dev
left beam
right beam
prism angle A
Table 3.5: Determination of prism angle A.
(nm) trial 1 trial 2 trial 3 average std dev
706.5
667.8
587.5
500.1
492.2
471.3
447.1
Table 3.6: Determination of D
.
Plot n as a function of
34 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
3.3.2 The Interferometirc Refractometer
Plot of m as a function of p (Torr)
3.3. EXPERIMENTAL DATA 35
Plot of (n 1) versus p
abs
(Torr)
36 CHAPTER 3. MEASUREMENT OF REFRACTIVE INDEX
p m statistics
cm Torr m
trial1
m
trial2
m
trial3
< m >
m
0 0 0 0 0 0 0
2 20
4 40
6 60
8 80
10 100
12 120
14 140
16 160
18 180
20 200
22 220
24 240
26 260
28 280
30 300
Table 3.7: Determination of m. L = .
3.3. EXPERIMENTAL DATA 37
p
abs
(Torr) (n 1)
760
Table 3.8: Absolute pressure versus refractive index.
Chapter 4
Interference by the Division of
the Wavefront
4.1 Theory
There are two methods for producing two coherent sources. One method
involves the division of the wavefront as in the Youngs double slit experi-
ment and the second method involves the division of the amplitude as in the
Micheslson interferometer. In this experiemnt we study two arrangements
for producing inteference by wavefront division and use these to determine
the wavelength of light. Refer to Chapter 13 of Jenkins and White or Section
9.3 of Hecht for a discussion of Lloyds Mirror and Fresnels Biprism.
4.1.1 Lloyds Mirror
Lloyds mirror is a mirror or a glass plate used to produce interference fringes
by superposing the light from a slit source with the light from the virtual
image of that slit source, as shown in Fig. (4.1). A part of the incident wave-
front from source S
1
is intercepted by the mirror and is reected back. The
reected wavefront overlaps the wavefront coming directly from the source S
1
in the region shaded region and produces interference. The reected wave-
front appears to come from the virtual image S
2
of S
1
. Thus in the shaded
region we have two source interference. Line EF is the perpendicular bisec-
tor of S
1
S
2
. F is therefore equidistant from S
1
and S
2
. If the distance y of
point P from F is small compared to D the angle is small and will be given
38
4.1. THEORY 39
S
2
P
glass plate
or mirror
F
E
a
D
y
S
1
Figure 4.1: Formation of fringes in the Lloyds mirror setup.
by
=
a
=
y
D
, (4.1)
or
= y
_
a
D
_
. (4.2)
Since the reected beam suers a phase change of upon reection from
the mirror the location of the bright fringe of order m ( corresponding to
2/ + = 2m) on the screen EF will be
y
m
=
_
m
1
2
_
a
D
, (4.3)
where a is the separation between the sources S
1
and S
2
, and D is the
source to screen distance. We can determine the wavelength of light from
measurements of the fringe separation. If y
m
and y
n
denote the locations of
fringes of order m and n, respectively,
_
2
n
_
+ = 2 n, (4.4)
_
2
m
_
+ = 2 m, (4.5)
40 CHAPTER 4. INTERFERENCE BY THE DIVISION OF THE WAVEFRONT
where is the wavelength of the light. Rearranging and subtracting these
equations, we nd that
=
n
m
n m
=
_
y
n
y
m
n m
_
a
D
, (4.6)
or
= (fringe width)
_
a
D
_
. (4.7)
Hence, to determine , we simply measure the width of an interfer-
ence fringe (center-to-center distance between two successive fringes), the
separation a between S
1
and S
2
, and the distance D.
The extra phase change of experienced by the reected beam may be
veried by placing a screen ush with the end of the mirror or the glass plate.
Since the real slit S
1
and its virtual image S
2
are equidistant from the line
where the mirror and receptor touch, we might expect to see a bright fringe
due to constructive interference. The dark fringe one sees instead veries the
relative phase change suered by the beam reected by the mirror.
4.1.2 Fresnels Biprism
The arrangement from Fresnel biprism is shown in Fig. (4.2). The biprism
consists of two small angle prisms joined together at their bases. When a
wavefront from the source S is incident, the upper portion of the wavefront is
refracted downward and the lower portion is refracted upward. The refracted
wavefronts appear to come from virtual sources S
1
and S
2
. They overlap
in the shaded region and produce inteference fringes. If a be the separation
beteween S
1
and S
2
and d+D be the source to screen separation, the location
of the m-th bright fringe is given by
y
m
= m
_
D + d
a
_
, (4.8)
where y is measured from the center of the interference pattern. Just as in
the Lloyds mirror experiment, the wavelength of light can be determined
from measurements of fringe separation in the interference pattern.
4.2 Experimental Procedure
Make at least three measurements of each quantity and then de-
termine its average and the standard deviation.
4.2. EXPERIMENTAL PROCEDURE 41
S
1
S
2
S
d D
a
a = d
y
P
d D
Primary
source
slit
Filter
eye piece
Figure 4.4: Outline of the experimental setup.
As always, make at least three measurements of the fringe width for each
wavelength. Be sure to note the uncertainty in all of your measurements,
especially that of measuring the fringe width. Record these measurements in
Table 4.2. You will nd it convenient to count several fringes at a time while
moving the cross hairs across the eld of view. Then divide the distance
traveled by the number of fringes counted to obtain fringe separation. The
accepted value for the green line of mercury is
Hg
546.1 nm.
Also study colored interference fringes in this experiment by removing the
green lter. Notice the order of colors in interference fringes and comment
on their visibility.
Experimental arrangement for Fresnels biprism is shown in Fig. 4.4. Re-
place the mercury source with a sodium lamp. Adjust slit orientation and
width to obtain sharp fringes. Use micrometer to determine fringe separa-
tion. Distances d and D are directly measurable. It remains now to measure
the linear separation a between the virtual sources S
1
and S
2
. Since the
prism angle is small ( 1
o
) source separation is given by
a d. (4.10)
The angular separation between the virtual sources can be measured using
a spectrometer. If parallel light from the collimator illuminates both halves of
the biprisms, two images are produced and the angular separation between
them is easily measured. Virtual source separation is also given by
a 2d(n 1) , (4.11)
where n is the refractive index of the prism. Prism angle can again be
determined by using a spectrometer. Use one of these methods to deter-
mine a. The accepted value of wavelength for the yellow line of sodium is
Na
589.3 nm. Record your data in Table 4.3
44 CHAPTER 4. INTERFERENCE BY THE DIVISION OF THE WAVEFRONT
4.3 Experimental Data
4.3.1 Lloyds Mirror
trial 1 trial 2 trial 3 average std dev
R
before
s
o,before
s
i,before
a
before
# of fringes
distance traveled
fringe width
R
after
s
o,after
s
i,after
a
after
Hg
Table 4.2: Determination of the wavelength of mercury green line. D = .
4.3. EXPERIMENTAL DATA 45
Draw a sketch and explain the technique used to determine a.
4.3.2 Fresnels Biprism
trial 1 trial 2 trial 3 average std dev
# of fringes
distance traveled
fringe width
a
Na
Table 4.3: Determination of wavelength by Fresnels biprism. D = ; d = .
Chapter 5
Michelson Interferometer
5.1 Theory
Michelson interferometer is the best known example of amplitude splitting
interferometers. An outline of this interferometer is shown in Fig. 5.1. Light
from the source S is divided into two beams of nearly equal amplitudes by
a thin aluminum coating on the back side of the plane parallel plate M.
The two beams are reected back by two highly reecting mirrors M
1
and
M
2
and return to beam splitter M. The transmitted portion of the beam
from M
1
and the reected portion of the beam from M
2
overlap and produce
interference fringes. The compensator plate C is an exact replica (other
than that it is not coated) of the beam splitter M and serves to equalize
the optical paths in the two arms for all wavelengths. This is not essential
for producing fringes with monochromatic light, but it is indispensible when
a white light source ( or some other source with short coherence length) is
used. The mirror M
1
translates on straight, parallel ways by turning a screw
whose pitch is quite accurately 1 mm. The mirror M
2
is provided with tilt
adjustment screws to make its image in M either parallel to M
1
or at a small
angle with M
1
. The coated surfaces of the plates and mirrors must never be
touched, as they cannot be cleaned without damaging them.
The interferometer is aligned by rst making the optical paths MM
1
and MM
2
approximately equal with the aid of dividers or a ruler. Looking
into the interferometer, one sees several images of a wire placed between
the diuser screen and M. The strongest of these images will be due to
reections originating at the aluminized surface of M. The tilt screws on M
2
are adjusted until the strong images coincide in the eld of view. It should
46
5.1. THEORY 47
M
1
M
2
BS
C
S
*
light
source
2d
d
M
1
M
2
S
1
S
S
2
2d cos
*
(a) (b)
Figure 5.1: (a) Ray paths in the Michelson interferometer ; (b) Two-source
interference arrangement equivalent to the Michelson interferometer.
then be possible to see interference bands. On rening the orientation of
M
2
one obtains a set of concentric circles (Haidingers fringes) which do
not expand or contract as the position of the eye is changed sideways or
vertically. As M1 is translated, the interference rings expand or contract.
Let d be the dierence in the optical lengths of the two arms. Then the path
dierence between the two interfering beams at the center of the interference
pattern will be 2d because both beams traverse the inteferometer twice. As
d decreases interference rings shrink and each time d decreases by /2 a ring
disappears at the center. As d increases interference rings expand and each
time d increases by /2 a ring grows out from the center. This provides a
simple method for determining the wavelength of monochromatic light. If N
rings appear or disappear at the center as d changes by D, the wavelength
of light will be given by
=
2D
N
. (5.1)
Michelson inteferometer can also be used to determine the wavelength of
two closely spaced spectral lines emitted by a source. If the incident light
contains two wavelengths, each wavelength will produce its own interference
48 CHAPTER 5. MICHELSON INTERFEROMETER
L
2
2
1
2
Figure 5.2: Relative locations of the fringes at the center for the two wave-
lengths
1
and
2
as d is varied.
2
is assumed to be smaller of the two
wavelengths. The minima in the two patterns (or the maxima) coincide at
the center each time d changes by L.
pattern. As d is varied the two interference patterns will shift relative to one
another. The intensity at the center will be simultaneously a minimum for
both patterns when
2d
0
= p
1
1
, (5.2)
2d
0
= p
2
2
, (5.3)
where p
1
and p
2
are two integers, and 2d
0
is the optical path dierence at
the center of the pattern. As d is increased the minima of the two interfer-
ence patters will at rst shift farther apart and then come closer together
again. The visibility of the total fringe pattern accordingly falls o and then
increases to a second maximum. Figure 5.2 shows the relative positions of
the minima (dark bands) in the two interference patterns as the position of
M
1
is varied. The two patterns are seen to resemble a vernier and a scale.
When the minima of the two patterns at the center coincide, the fringes
have high visibility; half way between the positions of maximum visibility,
fringe visibility falls to a minimum and if both lines have equal intensity one
sees a uniform illumination across the eld of view because the minimum of
one fringe pattern coincides with the maximum of the other. At the next
occurrence of maximum visibility,
2 (d
0
+ L) = (p
1
+ N)
1
, (5.4)
2 (d
0
+ L) = (p
2
+ N + 1)
2
, (5.5)
5.1. THEORY 49
where L represents the displacement of M
1
between successive visibility max-
ima, and N is the number of fringes
1
that pass by during the displacement
of M
1
. By using Eqs. (2)-(5) we nd that
2L = N
1
, (5.6)
2L = (N + 1)
2
. (5.7)
From these equations we nd that the ratio of the wavelengths is
2
=
N + 1
N
. (5.8)
If one wavelength is known, the other can be determined with the help of this
equation, in principle. Even when the two wavelengths cannot be determined
the dierence between the wavelengths can always be determined. From Eqs.
(6) and (7) the wavelength dierence is
2
=
2L
N(N + 1)
. (5.9)
Usually L can be measured with good accuracy. It is easier to locate visibility
minima than the maxima. The value of L is, therefore, best determined
by observing at least two successive minima of visibility and obtaining the
average of many such observations. It is usually too tedious and not very
accurate to determine N by direct count. For example for sodium D-lines
typically 1000 fringes must be counted. We can cast Eq. (9) in a form that
does not involve N. Using Eqs.(5) and (6) on the right hand side of Eq.(9)
to eliminate N and N + 1 we nd
1
N(N + 1)
=
1
1
(2L)
2
2
rmav
(2L)
2
, (5.10)
where
rmav
is the average wavelength. It can be determined by adjusting
the Michelson interferometer for maximum fringe visibility and counting the
number of fringes that disappear or appear at the center as the path dierence
is varied. Thus one may obtain a value for a wave-length interval which is
not easily resolved.
5.1.1 Coherenc Time and Coherence Length
Michelson interferometer can also be used to illustrate several other con-
cepts important for interference. In all experiments involving interference we
50 CHAPTER 5. MICHELSON INTERFEROMETER
have considered, the two interfering beams are always derived from the same
source. We nd by experiments that it is impossible to produce interference
fringes from two separate sources, such as two incandescent laments side by
side. This is due to the fact that the light from any one source is not an in-
nite train of waves. There are sudden changes in phase occurring on a very
short time scale of the order of 10
8
s. Thus although interference fringes
may exist for such short intervals, they shift their position each time there is
a phase change, with the result that no fringes at all will be seen. In essence
these sources produce wavetrains of average duration 10
8
s. This time is
called the coherence time
c
of the source. The average length,
c
= c
c
, of
the wavetrains emitted by the source, is called the coherence length of the
source. Successive wavetrains even from the same source, in general, have
no denite phase relation with one another. Special arrangements are nec-
essary to produce sources of light that have a denite phase relationship to
one another. In Youngs experiment, Lloyds mirror, Fresnels biprism, and
Michelson interferometer the two sources always have a point to point phase
correspondence since they are both derived from the same source. If the
phase of the light from a point in S
1
suddenly changes, that of the light from
the corresponding point in S
2
will shift simultaneously. The result is that
the dierence in phase between any pair of points in the two sources remains
constant, and so the interference pattern remains stationary. Sources that
have this point to point phase relation are called coherent sources.
Even when there is point to point phase correspondence between sources
one further condition must be satised if stationary fringes are to be observed.
The path dierence between the light coming from the two sources must not
exceed the coherence length (average length of the wavetrains emitted by the
sources) of the light emitted by the sources. If the path dierence exceeds
the coherence length the two interfering waves are derived from dierent
wavetrains that have no denite phase relation to one another. Cohertence
length of lasers can be several meters. On the other hand for mercury and
sodium lamp it is only about 10
2
m. Using Michelson interferometer we can
actually measure the length of the wavetrains emitted by a source !
5.1.2 Polarization Dependence of Interference
Interference of light also depends on the vector nature (polarization) of light.
Thus two beams having orthogonal polarization will not produce interference.
This is easily illustrated by placing two linear polarizers in the two arms of
5.2. EXPERIMENTAL PROCEDURE 51
Qty. Description
1 Michelson interferometer
1 sodium discharge tube
1 Helium-Neon laser
1 white-light source
Table 5.1: Apparatus for the Michelson interferometer experiment.
the interferometer.
1
Keep one polarizer xed and rotate the other polarizer.
It will be seen that no interference fringes occur when the transmission axes
of the polarizers are orthogonal. On the other hand, sharp fringes with good
contrast are produced when the transmission axes are parllel.
5.2 Experimental Procedure
Make at least three measurements of each quantity and then deter-
mine the average and the standard deviation of that quantity.
A simple technique for adjusting the angles of mirrors M
1
and M
2
is to
look into the output port of the interferometer while holding a thin object
like a mechanical pencil between a white-light or sodium light source and the
input port of the interferometer. Ghost images of the object will be seen
unless the mirrors are aligned correctly. Be sure to place the tip of the object
in the middle of the eld of view.
5.2.1 Wavelength of HeNe Laser
In this step of the experiment, we use a HeNe laser as the light source, casting
the fringes formed by the interferometer onto the wall or perhaps a sheet of
some sort. DO NOT LOOK DIRECTLY INTO THE INTERFER-
OMETER ITSELF.
These fringes are distinct enough that they may be counted as the path
length of the Michelson interferometer is changed. While one person carefully
turns the micrometer to move mirror M
1
a distance D
HeNe
, the other person
counts the number of fringes N
HeNe
that either collapse into the central bright
1
If the source produces polarized light you may need only one polarizer.
52 CHAPTER 5. MICHELSON INTERFEROMETER
spot or grow out from it. These data are recorded in Table 5.2, which
includes entries for the initial and nal locations of the mirror M
1
.
Insert a linear polarizer in each arm. Keep one polarizer xed and rotate
the other polarizer until a fringe pattern with good contrast is obtained.
Record this position of the polarizer. Rotate this polarizer slowly and notice
the brightness of the fringe pattern. When the fringe pattern vanishes record
the polarizer reading. Compute the angular separation between the two
positions of the polarizer.
Explain your observations. Estimate the coherence length of
the laser by moving one mirror and nding the distance at which
fringes disappear.
5.2.2 Wavelength of Sodium D Lines
Next we use the sodium discharge lamp as a light source. Light from sodium
lamp consists of two closely spaced wavelengths. We will determine the
dierence between the two wavelengths. First we determine the average
wavelength. Translate the movable mirror until you get fringes with good
contrast. This happens when the minimum (or the maximum) of the two
fringe patterns coincide at the center. Determine the average wavelength
by counting, say 50, fringes that disappear at the center and recording the
corresponding mirror displacement. Wavelength is then given by Eq. (1). To
determine the wavelength dierence between the two sodium D lines measure
the distance L
Na
between the fringe visibility minima as described in Sec. 5.1.
Note that the eld of view will be evenly illuminated when the visibility of
the fringes is at a minimum. Fringe visibility maxima correspond to the
most distinct fringes. It is easier to determine when the eld of view is free
of fringes than it is to decide when the fringes are most distinct.
While looking into the output port of the interferometer, carefully rotate
the micrometer until you recognize a fringe visibility minimum. Record the
micrometer setting in Table 5.4 and then translate mirror M
1
until you arrive
at a second minimum, record that mirror position, and repeat for a third
and nal time. Now you may determine a value for L
Na
using these three
mirror positions. Repeat this procedure for a total of three trials, and then
determine the average and standard deviation of L
Na
. Using the formulae
given in Sec. 5.1, determine
D2
and compare it with the accepted value 589.0
nm.
Estimate the coherence length of the sodium lamp.
5.3. EXPERIMENTAL DATA 53
5.3 Experimental Data
trial 1 trial 2 trial 3 average std dev
initial M
1
nal M
1
d
HeNe
N
HeNe
HeNe
Table 5.2: Wavelength of HeNe laser. The number of fringes N that pass
by when mirror M
1
is displaced by d allows a determination the wavelength
via = 2d/N.
trial 1 trial 2 trial 3 average std dev
Initial setting P
i
Final setting P
f
Angular separation |P
f
P
i
|
Table 5.3: Polarization dependence of interference.
The coherence length of the laser was found to be
c
54 CHAPTER 5. MICHELSON INTERFEROMETER
trial 1 trial 2 trial 3 average std dev
min
1
min
2
min
3
d
Na
N
Na
D2
Table 5.4: Wavelength of Sodium D lines. Distances d
Na
separating fringe
visibility minima are recorded. Then N
Na
= 2L
Na
/
D1
.
Chapter 6
Polarization of Light
Light waves are transverse electromagnetic waves. This means the electric
and magnetic eld vectors
E (V/m) and
B (T) lie in a plane perpendicular to
the direction of propagation characterized by the energy ux density vector
(Poynting vector)
S (W/m
2
). The relative orientation of
E,
B and
S is given
by
S =
E
B
0
. (6.1)
Given the direction of propagation and the direction of the electric vector,
the direction of the magnetic vector is determined. Polarization of light is
related to the orientation of the electric eld. If the electric vector points
along a xed direction, light is said to be linearly polarized. Many other
possibilities exist. If the electric vector rotates as a function of time we
E
B
S
Direction of propagation
Figure 6.1: Relative orientation of the electric and magnetic elds and the
Poynting vector for an electromagnetic wave.
55
56 CHAPTER 6. POLARIZATION OF LIGHT
have elliptically polarized wave. If the orientation of the electric eld vector
changes at random, the wave is said to be unpolarized. What state of polar-
ization is produced depends on the source. In laboratory, of course, we can
produce any state of polarization. In this experiment we will study dierent
states of polarization and how they are produced and detected.
6.1 States of Polarization
Consider a plane wave propagating in the z direction. Then the electric eld
vector lies in the x y plane. We can then write its x and y components in
the form
E
x
= E
01
cos(kz t +
1
), (6.2)
E
y
= E
02
cos(kz t +
2
). (6.3)
Here is the angular frequency of the wave, k = n/c is the wave number,
n is the refractive index of the medium and
1
and
2
are the initial phases
for the two components of the wave. Dierent states of polarization are
realized for dierent choices of the phase dierence =
2
1
and the
relative magnitudes of E
01
and E
02
. At all times the relation
E
B =
0
S
is satised.
6.1.1 Unpolarized light
Light from natural sources, such as the sun or an incandescent solid, is unpo-
larized. For natural light
1
and
2
vary over a time scale of the order of 10
8
s in an uncorrelated manner. Therefore, the phase dierence also varies
at random. There are uctuations in the amplitude as well. The electric
eld takes all possible orientations in the x y plane and on average, the
amplitudes of the x and y components are equal E
01
= E
02
E
0
. Such
a wave can be represented by two orthogonal linear polarizations of equal
amplitude but random phases.
E
x
= E
0
cos[kz t +
1
(t)], (6.4)
E
y
= E
0
cos[kz t +
2
(t)] , (6.5)
where
1
(t) and
2
(t) are random functions of time.
6.1. STATES OF POLARIZATION 57
6.1.2 Polarized Light
Even when
1
and
2
vary at random, the phase dierence =
2
(t)
2
(t)
could still be constant provided that
1
and
2
vary in a completely correlated
manner. If =
2
(t)
1
(t) is a constant we can write the electric eld,
without the loss of generality, as
E
1
= E
01
cos(kz t), (6.6)
E
2
= E
02
cos(kz t + ). (6.7)
Let us consider some special values of the phase dierence in the interval
[, ]. For = 0 we have a wave linearly polarized in a direction making
an angle = tan
1
(E
02
/E
01
) with the x axis. For = we have a linearly
polarized wave in a direction making an angle = tan
1
(E
02
/E
01
)
tan
1
(E
02
/E
01
) with the x axis. For E
02
= 0 we have a wave
E
1
= xE
01
cos(kz t) , (6.8)
polarized in the x-direction and for E
01
= 0 we have a wave
E
2
= yE
02
cos(kz t) , (6.9)
polarized in the y direction. Waves in Eqs. (6.8) and (6.9) are said to have
orthogonal polarizations because
E
1
E
2
= 0. In general, a wave of amplitude
E
0
linearly polarized in a direction making an angle with the xaxis can
be expressed as a superposition of two orthogonal linearly polarized waves as
E = ( xE
0
cos + yE
0
sin) cos(kz t). (6.10)
If the wave amplitudes are equal, E
01
= E
02
= E
0
, and = /2 90
o
the electric eld components can be written as
E
1
= E
0
cos(kz t) (6.11)
E
2
= E
0
sin(kz t) . (6.12)
In this case the x and y components of the eld satisfy
E
1
2
+ E
2
2
= E
2
0
(6.13)
which is the equation of a circle with radius E
0
. Thus the tip of the electric
eld vector traces a circle with angular frequency . The rotation of the
electric eld vector is counterclockwise for = /2 and clockwise for =
58 CHAPTER 6. POLARIZATION OF LIGHT
/2 for an approaching wave. The former is referred to as left circularly
polarized (positive helicity) and the latter as right circularly polarized wave
(negative helicity).
For values of and E
01
and E
02
other than those discussed in the preced-
ing two paragraphs we have an elliptically polarized wave because the tip of
the electric eld vector traces an ellipse in the x y plane. For example, for
E
01
> E
02
and = /2 the electric eld vector rotates in an ellipse with
major axis along the x direction and minor axis along the y direction.
Similarly for E
01
= E
02
= E
0
and = /4 we have a left elliptically polarized
light with the axes of the ellipse rotated 45
o
with respect to the co-ordinate
axes. Since straight line and circle are special cases of an ellipse, elliptical
polarization is the most general state of polarization of light. We now study
how these states are produced and detected.
6.2 Experimental Procedure
CAUTION : Handle all optical elements by their frames. Do not touch
any optical surfaces. Linear polarizers are marked by the direction of their
transmission axis and wave plates ( also referred to as retarders) by their fast
axis.
6.2.1 Linear Polarization
Mount a laser close to one end of the optical table so that the beam is
traveling parallel to and on top of a line of tapped holes in the table. If
necessary, use a beam expander (3) to obtain a beam of 2-3 mm diameter.
Mount two mirrors M
1
and M
2
at the two far corners of the table as shown
in the diagram.
1
Adjust mirror heights until the beam is incident very nearly
at the centers of the mirrors and it is traveling parallel to the surface of the
optical table.
Place the detector about 100 cm from the second mirror M
2
and make
sure that the detectors intercepts the whole laser beam. Insert a polarizer P
1
between M
2
and the detector so that the beam is incident normally on the
polarizer. Rotate the polarizer and observe the variation of light intensity
as recorded by the detector. From your observations what can you conclude
about the polarization of the light from the laser? Leave this polarizer P
1
1
These mirrors are not essential; they do provide better control over beam height and
beam pointing.
6.2. EXPERIMENTAL PROCEDURE 59
Laser
Beam
Expander
M
1
M
2
P
1
P
2
Detector/Meter
( Power Meter )
Figure 6.2: Experimental setup for producing and analyzing linear polariza-
tion.
with the notch in the polarizer frame pointing vertically up. Mount a second
polarizer P
2
(it will be called the analyzer) in a rotation stage and place it
in line with the laser beam between the rst polarizer P
1
and the detector.
Rotate the analyzer P
2
and monitor the intensity falling on the photodetec-
tor until a maximum in intensity is reached. Record both the intensity and
the angular position of P
2
. This angular position of P
2
will be the reference
for measuring angles. Rotate the analyzer in 5
o
increments between 0
o
and
180
o
. For each setting of P
2
, record the angular displacement from the
reference position, and the output of the detector as measured by the volt-
meter. The output of the detector is proportional to the irradiance of the
light (Watts/m
2
) falling on the detector which in turn is proportional to the
square of the amplitude of the electric eld transmitted by P
2
.
Maximum intensity I( = 0) I
0
Plot the results of your measurements and compare them to the Law of
Malus
I() = I
0
cos
2
. (6.14)
Q1 : Derive this in your report. In your comparison you may nd it
convenient to plot I()/I
0
. You may have to adjust your plots to make the
comparison, but you should justify any adjustment in your notebook.
Q2 : What does this tell you about the nature of light ? What
is the state of polarization of light after it emerges from the rst
polarizer? Record your comments on the comparison in your laboratory
notebook.
60 CHAPTER 6. POLARIZATION OF LIGHT
Laser
Beam
Expander
M
1
M
2
P
1
Rotation
Stage
Detector/Meter
( Power Meter )
Figure 6.3: Polarization in reection.
6.2.2 Brewster Angle (Optional)
A polarizer is one way of producing linearly polarized light from an unpo-
larized beam. Reection can also produce polarized light. The degree of
polarization depends on the angle of incidence. At one particular angle,
called Brewster angle (polarization angle), reected light is completely po-
larized perpendicular to the plane of incidence. At this angle of incidence,
the reection coecient is zero for light polarized parallel to the plane of
incidence.
To study polarization in the process of reection, remove the analyzer
P
2
and mount a lens holder in a rotation stage. Attach the rotation stage
to the table such that the laser beam passes through the center of the lens
holder. Tape a microscope glass slide to the lens holder so that the slide is
held rmly in place and the beam does not pass through the tape.
Rotate the lens holder so that the beam reected from the slide is sent
back along the input beam. Adjust the screws at the back of the lens holder
if necessary. You may want to use an index card with a hole in it to set the
beam. Set the rotation stage to 0
o
and tighten the screw on the lens holder
to x it in the holder.
Rotate P
1
so that its transmission axis is horizontal (notch horizontal).
This means the light incident on the microscope slide is polarized horizontally
and the electric vector lies in the plane of incidence. Remove the detector
and attach an index card to it since you are going to have to follow the beam
on the table.
6.2. EXPERIMENTAL PROCEDURE 61
Turn the rotation stage away from 0
o
and record the reection. Observe
how the intensity depends on the angle of incidence. Locate accurately any
maximum or minimum. By successive approximations, bring the stage to
produce the extremum. (You may nd that you can improve the minimum
by slightly tweaking the input polarizer by a small amount) Record the angle
of the rotation stage and determine the angle between the beam and the
normal to the reecting surface.
What is the refractive index of the material of the microscope
slide ? Make a plot of the irradiance as a function of the angle of
incidence.
Rotate the input polarizer P
1
to the orthogonal position so that the elec-
tric vector is perpendicular to the plane of incidence. Observe the angular
dependence of the irradiance of the reected beam. Make a plot of irradiance
as a function of the angle of incidence. Compare the plots for parallel and
perpendicular polarizations and comment on the similarities and dierences.
Q3 : When is the reected light completely polarized? What
is the state of polarization of the transmitted light then? Make
predictions and check them experimentally.
6.2.3 Circular Polarization
Polarization of light can be used to control the passage of light through an
optical system and to impress information on a light wave modulating the
amount of light passing through a birefringent material.
In this project a birefringent material will be used to change the polar-
ization of the laser. Using a quarter-wave plate and a polarizer we will build
an optical isolator. When we add a second quarter-wave plate, a polarization
rotator results.
Mount the beamsplitter (BS) in a lens holder and place the unit about
10 cm to the right from mirror M
2
. Orient the beamsplitter such that the
beamsplitter surface is inclined at 45
o
to the beam.
Place a white index card to monitor the reection (of the return beam)
from the beam splitter. Mount a polarizer P
1
on the optical breadboard in
line with the laser beam and several centimeter to the right of the beam-
splitter (BS). Set the polarizer with its transmission axis up. Adjust the
polarizer mount slightly so that the reection o this polarizer can be seen
on the index card.
Mount a second polarizer P
2
into a rotation stage about 15 cm to the right
of the rst polarizer. Rotate the second polarizer P
2
until it completely blocks
the light from the rst polarizer (i.e. Polarization axes crossed). Adjust
62 CHAPTER 6. POLARIZATION OF LIGHT
Laser
Beam
Expander
M
1
M
2
P
1
P
2
BS QWP
Detector/Meter
( Power Meter )
Index Card
Figure 6.4: Experimental arrangement for producing circular polarization.
the second polarizer so that the reection from this can be recognized as a
separate beam on the index card.
Insert a quarter-wave plate QWP into a rotating mount and place the
assembly between the two polarizers P
1
and P
2
. Slowly rotate the quarter-
wave plate until the output through the second polarizer is a maximum.
Rotate the second polarizer and observe the variation of the output irra-
diance.
Q4 : What state of polarization have you produced ? What
are the states of polarization at the output of P1, QWP, and P2 ?
How would you distinguish between this state and an unpolarized
beam? The quarter-wave plate has converted the linear input beam to a
circularly polarized beam.
6.2.4 Optical Diode : Optical Isolator
Remove P
2
and replace it with a mirror M
3
that reects light back on to
itself (Fig. 9-2). Observe the light reections on the index card. There will
be surface reections o the surfaces of the polarizer and the quarter-wave
plate, but there will be no strong reection from the mirror because the
mirror reverses the circularly polarized light and on second passage through
the quarter-wave plate, the beam is again linearly polarized but at right
angles to the original polarization. When the beam reected by M
3
hits
the polarizer P
1
again, it is absorbed. This is equivalent to saying that the
outgoing beam has been isolated from reections after the quarter-wave
plate.
6.2. EXPERIMENTAL PROCEDURE 63
Laser
Beam
Expander
M
1
M
2
P
1
M
3
BS QWP
Index Card
Figure 6.5: Experimental arrangement for an optical diode (optical isolator).
Q5 : How would you test that this is indeed what is happening?
6.2.5 Polarization Rotator
Start with the arrangement for producing circularly polarized light with a
single quarter-wave plate. Hold a second quarter-wave plate between the
crossed polarizers without disturbing the orientation of the rst. Rotate the
second quarter-wave plate until the light passing through the second polarizer
P
2
is a maximum. You have now created a half-wave plate which rotates the
input polarization by 90
o
. Instead of two QWPs you may also use a single
half wave plate (HWP).
Q6 : How would you check this out? The device that you have
constructed is a polarization rotator.
6.2.6 Elliptically Polarized Light
Elliptically polarized light is the most general type of polarized light. Con-
sider a set of crossed polarizers. A QWP is introduced between them with
its optic axis at an angle to the transmission axis of the polarizer. We can
resolve the light incident on the QWP into components parallel and perpen-
dicular to the optic axis of the QWP. After passing through the QWP the
two components have a relative phase dierence of /2. Light incident on
64 CHAPTER 6. POLARIZATION OF LIGHT
Laser
Beam
Expander
M
1
M
2
P
1
P
2
BS
QWP
1
QWP
2
or
a Single HWP
Index Card
Detector/Meter
( Power Meter )
Figure 6.6: Experimental arrangement for polarization rotator.
the analyzer is described by
E
e
= Acos cos t (6.15)
E
o
= Asin(cos t /2) (6.16)
Show that this represents an elliptically polarized light. Determine the prin-
cipal axes of the ellipse by rotating the analyzer. Start with the QWP optic
axis aligned with the transmission axis of the polarizer. Increment the angle
between the QWP axis and P
1
in steps of 10
o
and record how much do you
have to rotate the analyzer from its crossed position to nd the major and
minor axes of the polarization ellipse.
Q7 : How would you determine the direction of rotation of the
electric vector?
Finally take the unknown retarder and place it between the crossed po-
larizers with its axis making angles of 10
o
, 20
o
, 30
o
, 40
o
80
o
with P
1
.
Determine the maximum or minimum by rotating the analyzer. Find the
retardation introduced by the unknown plate.
6.2.7 An Amusement
Starting with the arrangement in the previous section, rotate the rst po-
larizer by some specic angle, say 10
o
, and then determine the amount by
which the second polarizer must be rotated to extinguish the beam.
6.2. EXPERIMENTAL PROCEDURE 65
Q8 : You will nd that the analyzer must rotate through twice
the angle of the initial polarizer. Is this really true? What is the
state of polarization in this case after P1, QWP1, and QWP2?
66 CHAPTER 6. POLARIZATION OF LIGHT
Ang. Disp. () Intensity (Volts) I/I
0
cos
2
0
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
75
80
85
90
Table 6.1: Law of Malus
Chapter 7
Resolving Power of a Grating
and Limit of Resolution
7.1 Theory
For a discussion of diraction gratings, refer to Chapter 17 of Jenkins and
White or Chapter 10 of Hecht and Zajac.
The resolving power of a grating or a prism is given by
R
, (7.1)
where is the wavelength resolved from the wavelength + . Consider
an assembly of N slits with a separation of d between each slit (d is referred
to as the grating constant). If the mth maximum in intensity occurs at an
angle , then the extreme optical path dierence between waves leaving slit
1 and the Nth slit is mN. The rst minimum occurs at + when the
extreme path dierence is mN + since waves from the Nth slit will be
/2 wavelengths out of phase with the wave from the N/2 slit.
The Rayleigh criterion for resolution requires that if two sources are just
resolved, the central maximum of the diraction pattern from one source falls
upon the minimum of the other. Then if we are to resolve a second compo-
nent diering in wavelength by , it must produce a maximum at the rst
minimum described above. For the ray of wavelength + , mN ( + )
must be the extreme path length dierence for a maximum so that
mN + = mN ( + ) . (7.2)
67
68CHAPTER 7. RESOLVING POWER OF A GRATING AND LIMIT OF RESOLUTION
Qty. Description
1 transmission grating (2000 lines/inch or 300 lines/mm)
1 student spectrometer focused for parallel light
1 vernier calipers for adjusting eective size of grating
1 mercury vapor source
Table 7.1: Apparatus for the Resolving Power of a Diraction Grating ex-
periment.
This equation then leads to the following expression for the resolving power
of the diraction grating
R =
= mN . (7.3)
7.2 Experimental Procedure
Make at least three measurements of each quantity and then deter-
mine the average and the standard deviation of that quantity.
7.2.1 Resolving Power of a Grating
Mount the transmission grating so that the incident light is normal and the
caliper lies between the collimator and the grating. The caliper jaws should
be parallel to the lines of the grating and as close to the grating as possible.
The jaws of the caliper provide a variable aperture which determines the
number of lines on the grating which are used. With the calipers fully open
the spectral orders are scanned. You should be able to see several orders
present on either side of the central image. Set the scope on the yellow lines
of the rst orders and vary the calipers until the lines are resolved. Record
the order and the width of the slit. Repeat, going to higher orders, until the
last observable order is resolved for both sides of the central image. Record
your measurements in Table 7.3. Table 7.2 provides the wavelengths of the
mercury spectrum.
7.3. LIMIT OF RESOLUTION 69
Color Wavelength (nm)
Red 623.4
Yellow 579.0
Yellow 577.0
Green 546.1
Blue 435.8
Violet 407.8
Violet 404.7
Table 7.2: The mercury spectrum.
7.2.2 Determination of the Grating Constant d
Measure the angular position of several known lines of a given light source
and record your measurements in Table 7.4. Knowing the angular position,
the order, and the wavelength, d may be determined from
m = d sin . (7.4)
7.3 Limit of Resolution
Set the the long vertical lament lamp securely on the table. Place a red
lter in front of the lamp followed by the resolution source object (RSO) slit
plate as shown. The RSO consists of rows of slits. The long dimension of
the resolution object plate should be vertical. The top row has slits with
largest separation. Slits in each successive row have half as much separation
as the row above it. Make sure you do not place the lter too close to the
lamp. Stand back about 3-4 m from the plate. Hold the slide with the slitlm
slide with the long dimension vertical such that the CAL monogram is in the
upper right corner. Hold the lm close to the eye (almost touching the eye)
and look through the slide at the resolution source object. In the rst column
on the slitlm you will see single slits of dierent widths. Choose a slit with
some aperture size, say D, and focus your attention on one particular row of
object slits on the RSO plate. Move back and forth until you are just able
to resolve two adjacent slits. Determine the distance where you are just
able to resolve two adjacent slits. Compute the angle subtended at the eye
by two adjacent slits. Compare this to /D.
70CHAPTER 7. RESOLVING POWER OF A GRATING AND LIMIT OF RESOLUTION
D
l
Lamp
Filter
Resolution Slit
Object Plate
Slitfilm
Apertures
Figure 7.1: Limit of resolution set up
Looking through the same aperture replace the red lter by blue. What
qualitative change do you see? Move back and forth and determine the
distance where you are just able to resolve two adjacent slits. Once again
compute the angle subtended at your eye by two adjacent slits. Compare
this to /D.
Change D and repeat the steps outlined above. Choose a dierent row
of slits and repeat the steps in the previous two paragraphs.
Q1 : For a xed D and which color allows you better resolu-
tion? How does resolution change with ? Your eye has a nite
aperture too (the pupil). Are you limited by the pupil or by the
slitwidth in your experiment? How do you decide? What do you
learn from this experiment?
Remove the RSO. You can now use the slitlm to observe dozens of
diraction patterns. Investigate at least two of these qualitatively and include
them in your report.
7.4. EXPERIMENTAL DATA 71
7.4 Experimental Data
Caliper Width
order m trial 1 trial 2 trial 3 average std dev N
1
2
3
4
5
6
Table 7.3: Resolving Power of a Grating. Using yellow lines of of each spectral
order to determine R. Caliper width is recorded when lines are just resolved.
Eective number of slits N may be obtained from this measurement and
known number of slits per inch.
Q2 : Rederive the relationship for resolution using a diagram
showing all quantities. Compute the resolution necessary to re-
solve the mercury 579.07 nm and 576.98 nm doublet. Compare
the observed and the computed resolutions.
72CHAPTER 7. RESOLVING POWER OF A GRATING AND LIMIT OF RESOLUTION
Angular Position
order m trial 1 trial 2 trial 3 average std dev d
Table 7.4: Determination of the grating constant d. d may be determined
from m = d sin .
Chapter 8
Image Formation and Spatial
Filtering
8.1 Theory
For discussions of the diraction theory of image formation and/or spatial
ltering, see Sec. 28.12 of Jenkins and White or Sec. 14.1 of Hecht and
Zajac.
Every image is a synthesis of a diraction pattern. The purpose of an
optical instrument is to synthesize a diraction pattern to form an images of
an object. The image that you see in the eyepiece of an optical instrument is
always an accurate synthesis of some diraction pattern but not necessar-
ily the diraction pattern of the real object you are trying to see. The nal
image delivered by these instruments is critically dependent on how much of
the real objects diraction pattern is utilized. Since optical elements have
nite apertures no instrument utilizes all of an objects diraction pattern.
It follows that the images formed by optical instruments are to some extent
false. This includes images formed by the naked eye.
In this experiment we study how the image of a real object may be falsied
when only a part of its diraction pattern is utilized. For our investigations,
we will use a simple object that has a repetitive structure a piece of screen
mesh. The diraction pattern of this object is simple and repetitive.
The form of the above pattern may be understood by considering the
wire mesh as a pair of diraction gratings with their lines crossed at 90
.
The rst grating of the pair provides, say, the familiar horizontal row of
dots. The second grating disperses each of these dots into a vertical column
73
74 CHAPTER 8. IMAGE FORMATION AND SPATIAL FILTERING
a
1
a
2
a
2
a
1
b
2
b
2
b
1
b
1
0
c
1
c
1
c
2
c
2
d
2
d
2
d
1
d
1
Screen
Diffraction Pattern
Figure 8.1: Diraction pattern of a wire mesh.
of dots, thus building up the pattern of Fig. 8.1.
Consider now the eect of suppressing certain parts of the full dirac-
tion pattern of Fig. 8.1, and using a lens to synthesize the remaining orders
into an image. We rst use a mask that accepts only the orders a
n
of Fig. 8.1,
as shown in Fig. 8.2. Since a
n
is the diraction pattern of a set of vertical
wires, we will see in our eyepiece nothing but a eld of vertical wires the
horizontal wires will have wholly disappeared. Similarly, when we pick o
and synthesize the vertical orders b
n
we will see only horizontal wires. Most
interesting is the case in which we pick o only diagonal orders, say c
n
. This
time we will see a very real-looking set of wires at 45
mercury light
source
filter grating
S
C AMP
Voltmeter
Figure 10.2: An outline of the experimental setup.
with currents of this size. For this reason, in the experiment we measure the
stopping voltage directly with the help of an high impedance amplier.
The photoelectrons emitted from the photocathode move toward the an-
ode producing a small photo-current. This photocurrent is used to charge a
small capacitance. When the potential on this capacitance reaches the stop-
ping potential for the photoelectrons, the current decreases to zero and the
anode-to-cathode potential stabilizes. This nal voltage between the anode
and the cathode is therefore the stopping potential of the photoelectrons.
This voltage is measured with the help of a high input impedance ( > 10
12
), unity gain amplier [Fig. 2].
The procedure for recording the data is as follows. Turn the mercury
vapor lamp on and allow about 5 minutes for it to stabilize. Attach the
grating and lens sliding mount to the mercury lamp housing. Place a card
in front of the grating. You should see sharp mercury line spectra. Mount
the photoelectric cell on the support rod on the support assembly. Place
the support assembly over the pin at the end of the coupling bar assembly
[Fig. 3]. Set the photocell directly in front of the light source and adjust the
grating/lens assembly so that a sharp image of the source aperture is seen on
the mask on the photocell. Rotate support assembly until the light in one of
spectral lines in the rst order enters the photo cell. If you select the green
10.2. EXPERIMENTAL PROCEDURE 93
Hg Source
Grating
Photocell
Mask and
Filter Holder
Coupling Bar
Assembly
Support Base
Assembly
Figure 10.3: Details of the experimental setup.
or yellow spectral line, place the corresponding colored lter over the White
Reective Mask on the h/e apparatus. Place the Variable Transmission Filter
so that the light passes through the section marked 100% and reaches the
photodiode.
Depress momentarily the zero switch S on the photocell to discharge any
accumulated charge on the storage capacitor. Read the output voltage on
the voltmeter and approximately how much time is required to recharge the
instrument to the maximum voltage. The maximum voltage is the stopping
voltage. Move the Variable Transmission Filter so that next section is directly
in front of the incoming light. Record the stopping voltage and approximate
charge time for dierent transmission fractions. Repeat the procedure for
all available lines in the spectrum and record these observations in your
notebook. Repeat the procedure for the second order spectral lines.
Plot a graph of intensity versus stopping potential, and intensity versus
charging time. Explain the eect of intensity on the stopping potential and
charging time.
Plot a graph of the stopping potential V vs light frequency ( = c/).
The stopping potential gives us the kinetic energy of the electrons via K =
eV . Using this in Eq. (2) and rearranging it we obtain
V = (h/e) W
0
/e . (10.4)
Thus the slope of the V vs. graph determines the ratio h/e and the intercept
determines the ratio W
0
/e. If V
0
is the intercept in volts then W
0
= eV
0
.
We will automatically get the work function W
0
in electron volts by dropping
e: W
0
= -V
0
eV (electron-volts). Assign experimental error to your measured
94 CHAPTER 10. PHOTOELECTRIC EFFECT
values of h and W
0
. The following constants are given :
e = 1.602 10
19
C (10.5)
c = 2.998 10
8
m/s (10.6)
Appendix A
Error Analysis
Scientic knowledge is based on the results of measurements of physical quan-
tities. Therefore we must understand how to express the results of mea-
surements and how to analyze and draw meaningful conclusions from them.
Since all measurements are subject to errors or uncertainties, the result of
any physical measurement must consists of two essential components: (1) a
numerical value (in a specied system of units) giving the best possible esti-
mate of the quantity measured, and (2) the degree of uncertainty associated
with this value. For example, a measurement of the width of a table would
give a result such as 85.3 0.1 cm. We can minimize the error by using
more sophisticated apparatus or techniques but we cannot eliminate it.
It is important to keep in mind that error is not the dierence between
the measurement and some accepted exact value. Accepted values are not
right answers. They are just measurements made by other people which
have errors associated with them as well. For example, the true value of
the ratio of the proton mass to that of the electron is 1836.153 .001.
Error does not mean mean blunder. Reading a scale backwards, or
reading a centimeter scale as inches are blunders which can be caught and
should be avoided. One should never refer to human error as an excuse for
deviation of your measured results from an accepted value.
Error refers to the uncertainty in measurements. It is an intrinsic part of
95
96 APPENDIX A. ERROR ANALYSIS
the measurement. Although we cannot eliminate error, it can be character-
ized. For instance, the repeated measurements may cluster tightly together
or they may spread widely. This pattern can be analyzed systematically.
It is also important to distinguish between the accuarcy and precision of
a result. The accuracy of an experiment is a measure of how close the result
of the experiment comes to the true value. The precision of an experiment,
on the other hand, refers to how exactly is the result determined without
reference to what the result means. For example, if in an experiment de-
termining the length of a table, the table is found to be 1.752 m long, the
measurement indicates a high precision on the order of 1 mm. The correc-
tions to this result due to thermal expansion will improve the accuracy but
not the precision.
The way in which the result of an experiment is written should reect the
precision. To indicate the precision we write a number with as many digits
as are signicant.
A.1 Signicant Figures
The signicant gures of a measured or calculated quantity are the meaning-
ful digits in it - digits which can be trusted, even if some are zeros. There are
conventions for expressing the results of measurements to properly indicate
their signicant gures.
Any digit that is not zero is signicant. Thus 639 has three signicant
gures and 1.492 has four signicant gures.
Zeros between non zero digits are signicant. Thus 1023 has four sig-
nicant gures.
Zeros to the left of the rst non zero digit are not signicant. Thus
0.000069 has only two signicant gures. This is more easily seen if
scientic notation is used to write it as 6.910
5
.
For numbers with decimal points, zeros to the right of a non zero digit
are signicant. Thus 3.00 has three signicant gures and 0.040 has two
signicant gures. For this reason it is important to keep the trailing
zeros to indicate the actual number of signicant gures.
A.1. SIGNIFICANT FIGURES 97
For numbers without decimal points, trailing zeros may or may not be
signicant. Thus, 400 indicates only one signicant gure. To indicate
that the trailing zeros are signicant a decimal point must be added or
use scientifc notaton to write it. For example, 400. or 4.0010
2
has
three signicant gures, and 4 10
2
has one signicant gure.
Exact numbers have an innite number of signicant digits. For exam-
ple, if there are two oranges on a table, then the number of oranges is
2.000... . Dened numbers are also like this. For example, the num-
ber of centimeters per inch (2.54) has an innite number of signicant
digits, as does the speed of light (299792458 m/s).
There are also specic rules for consistently expressing the uncertainty
associated with a number. In general, the last signicant gure in any result
should be of the same order of magnitude (i.e.. in the same decimal position)
as the uncertainty. Also, the uncertainty should be rounded to one or two
signicant gures. Always work out the uncertainty after nding the number
of signicant gures for the actual measurement.
Thus the correct format for reporting the focal length of a lens is:
14.82 0.02 cm OR 15.01.5 cm OR 15 1 cm
By the same token
14.82 0.02385 cm is wrong but 14.82 0.02 is acceptable
10.0 2 cm is wrong but 10.0 2.0 cm is acceptable
4 0.5 is wrong but 4.0 0.5 is acceptable
In practice, when doing mathematical calculations, it is a good idea to
keep an extra digit than is signicant to reduce rounding errors. But in the
end, the answer must be expressed with only the proper number of signicant
gures. After addition or subtraction, the result is signicant only to the
place determined by the largest last signicant place in the original numbers.
For example,
89.332 + 1.1 = 90.432
should be rounded to get 90.4 as the tenths place is the last signicant place in
the second number. After multiplication or division, the number of signicant
gures in the result is determined by the original number with the smallest
number of signicant gures. For example,
(2.80) (4.5039) = 12.61092
98 APPENDIX A. ERROR ANALYSIS
should be rounded o to 12.6 since 2.80 has three signicant gures.
Read any good introductory physics textbook for an explanation for work-
ing out signicant gures.
A.2 Classication of Errors
Errors of measurement can be classied into two categories.
Systematic errors are errors which tend to shift all measurements in a
systematic way so their mean value is displaced. This may be due to incorrect
calibration of equipment, consistently improper use of equipment or failure
to properly account for some eect. In a sense, a systematic error is rather
like a blunder. Large systematic errors can and must be eliminated in a good
experiment. Small systematic errors will always be present. For instance, no
instrument can ever be calibrated perfectly.
Other sources of systematic errors are external eects which can change
the results of the experiment, but for which the corrections are not well
known. In science, the reasons why several independent conrmations of
experimental results are often required (especially using dierent techniques)
is because dierent apparatus at dierent places may be aected by dierent
systematic eects.
Random errors are the uctuations in observations which yield results
that dier from experiment to experiment. These errors are beyond the
control of the observer. If we are measuring the decay rate of a radioactive
sample we get dierent results from one time interval to another. This is due
to the inherently random nature of the process being investigated.
A.3 Normal Distribution
When a quantity x is measured a large number of times a pattern will begin
to emerge from the data. A picture of the distribution of measurements
might look like the histogram in Fig. 1. To obtain such a plot we divide
A.3. NORMAL DISTRIBUTION 99
P(x)
-3
-2
-
-
-2
-3
x
Figure A.1: A typical histogram of measured values of x and the normal
(Gaussian) distribution.
the range of observed values of x into many intervals of equal size, compute
the fraction of observations that lie within each interval, and then plot this
fraction against the average of the observations in each respective interval.
Figure A.1 shows one such plot.
If make an innite number of measurements, we can determine the true
distribution (called the parent distribution) that governs the probability of
getting any particular result in one measurement. Making an innite number
of measurements is costly and time consuming. So we must decide at some
stage that the measurement is complete. It should be kept in mind that
repeating the experiment is the only way to gain condence in the accuracy
of our result.
In the absence of any specic information or theoretical basis we assume
the parent distribution to be a Gaussian . This assumption will tend to be
valid for random errors because of the law of large numbers. The Gaussian
distribution, also called the Normal distribution, has the form :
P(x) =
1
2
e
(x)
2
/2
2
, (A.1)
100 APPENDIX A. ERROR ANALYSIS
where is the center (the most probable value), and is the width (stan-
dard deviation) of the distribution. The normal distribution is shown by the
continuous curve in Fig. A.1. In terms of this distribution P(x)dx is the
probability that a measurement of x will yield a result between x and x+dx.
For a Gaussian distribution, the measured values are distributed symmetri-
cally around the true value . Approximately 68% of the measurements will
fall within of , while 95% will be within 2 and only 5% will be more
than 2 away from .
A.4 Sample Mean and Variance
In an actual experiment we measure a physical quantity a nite number of
times, say N, with the results x
1
, x
2
, x
3
, x
N
. These measurements repre-
sent a nite sample from the parent population. All of our calculations must
be made from this sample. Then the average or mean of the our measure-
ments
x =
1
N
N
k=1
x
k
. (A.2)
is our best estimate of the true value of the parent distribution.
1
This is a reasonable estimate of the mean because random errors would
dier in sign and magnitude from measurement to measurement. So in the
calculation of the average or mean value of our sample, some of the random
variations could be expected to cancel out the others. This is the best that
can be done to deal with random errors: repeat the measurement many
times, varying as many parameters as possible and use the sample average
as the best estimate of the true value of x. For example, in the case of
the measurement of the focal length of a lens by using a distant object, use
several dierent distant objects -large and small, dierent helpers to read the
scale, etc.
We are also interested in an estimate of the standard deviation . In
terms of our measurements the best estimate for would be the sample
1
This estimate for nite N will dier from the true mean value; though, of course, for
larger N it will be closer to the parent mean.
A.5. PROPAGATION OF ERRORS 101
standard deviation s given by
s
2
1
N 1
N
k=1
(x
k
)
2
. (A.3)
Note that this formula has N1 in the denominator. This is because we need
at least one observation to determine x. That leaves only N 1 independent
observations to determine . What these numbers x and s mean is that if
we made one more measurement of x, there is 68% probability that it will
lie within x s (and therefore 32% probability that it will disagree with the
accepted value x by more than s).
In addition to the uncertainty of one measurement, we are also interested
in the error of the mean, that is, how close is our estimate x to the true value
. This uncertainty in estimating is given by
x
=
s
N
, (A.4)
where N is the number of independent measurements [ See Sec. 1.7 for a
proof]. The uncertainty in the determination of the mean is equal to the
standard deviation of an individual measurement divided by the square root
of the number of independent measurements. This means that the accuracy
of our estimate improves in proportion to the square root of the number of
measurements in the sample. This is a fundamental principle of statistics.
Similarly, we could estimate the uncertainty in
xy
= lim
N
1
N
x
y
N
k=1
(x
k
x
)(y
k
y
) , (A.5)
102 APPENDIX A. ERROR ANALYSIS
where
x
,
y
,
x
and
y
are given by equations similar to (2) and (4). For
N pairs of measurements of x and y the best estimate of
xy
is
xy
=
1
(N 1)
x
y
N
k=1
(x
k
y
k
) ,
=
1
(N 1)
x
y
_
N
k=1
x
k
y
k
N x y
_
(A.6)
For independent errors
xy
is equal to zero. For completely correlated errors,
xy
is either +1 or -1. We can now estimate errors in V .
From N measurements of x and y we can compute x and y and N values
of V = f(x, y): V
1
= f(x
1
, y
1
), V
2
= f(x
2
, y
2
), . . . , V
N
= f(x
N
, y
N
). We shall
make the fundamental assumption that the most probable value of V is
V = f( x, y). (A.7)
Then the deviation of V
k
can be expressed in terms of the deviations of x
k
and y
k
by
V
k
V
k
V
V
x
x
k
+
V
y
y
k
, (A.8)
where x
k
= x
k
x and y
k
= y
k
y, respectively, are the deviations of x
k
and y
k
. It is easy to check that the sum of the deviations
N
k=1
V
k
vanishes.
The average of the squares of deviations of V will be
1
N
N
k=1
(V
k
)
2
=
1
N
N
k=1
_
_
V
x
_
2
(x
k
)
2
+
_
V
y
_
2
(y
k
)
2
+ 2
_
V
x
__
V
y
_
x
k
y
k
_
.
(A.9)
Taking the square root of both sides in the limit N , we obtain the
standard deviation of V
V
=
_
V
x
_
2
2
x
+
_
V
y
_
2
2
y
+ 2
xy
_
V
x
__
V
y
_
y
. (A.10)
Equation (A.10) may be generalized for the case when V is a function of
A.6. STANDARD DEVIATION OF AN AVERAGE 103
many measured quantities. For example, if V = V (x, y, z), then
V
=
_
_
V
x
_
2
2
x
+
_
V
y
_
2
2
y
+
_
V
z
_
2
2
z
+ 2
xy
_
V
x
__
V
y
_
y
+ 2
xz
_
V
x
__
V
z
_
z
+ 2
yz
_
V
y
__
V
z
_
z
_1
2
. (A.11)
With a nite number of measurements N, we obtain the best estimate of
V
by substituting in Eq. (A.10) the best estimates s
x
and s
y
of
x
and
y
,
and the best estimates of
xy
from Eq. (A.6). If measurements are known a
priori to be independent,
xy
is set equal to zero.
A.6 Standard Deviation of an Average
We are now in a position to derive Eq. (A.4) for the standard deviation
x
of the average. We make use of the fact that the average x is a quantity
computed from the measured quantities x
1
, x
2
, . . . , x
N
by means of Eq. (A.2).
Then
x
x
1
=
x
x
2
= =
x
x
N
=
1
N
, (A.12)
and since we are considering only the random errors in the measurements
x
k
, they may be considered independent, so that we may take their mutual
correlation equal to zero. Eq. (A.10) modied for this case then gives the
result stated in Eq. (A.4)
x
=
_
1
N
_
s
2
x
1
+ s
2
x
2
+ s
2
x
3
+ + s
2
x
N
_
=
s
N
, (A.13)
where we have used the fact that s
x
k
= s
x
s for each value of k.
We can also estimate the standard deviation
V
of the average of V . We
expect the averages x and y to have the same degree of correlation as the
individual pairs of measurements. In fact, it is shown in advance treatises
that
xy
=
x y
. Therefore we expect the standard deviations of averages
104 APPENDIX A. ERROR ANALYSIS
to combine in the same way as the standard deviations of the individual
measurements:
V
=
_
V
x
_
2
2
x
+
_
V
y
_
2
2
y
+ 2
xy
_
V
x
__
V
y
_
y
. (A.14)
A.7 Special Rules for Combining Errors
The rules expressed by Eqs. (A.10) and (A.14) are valid regardless of the
mathematical form of V = V (x, y). In the following special cases a and b are
some constants, x and y are independent (
xy
= 0) variables and
x
and
y
are the corresponding uncertainties.
A.7.1 Sum and dierence: V = ax by
V
x
= a ,
V
y
= b , (A.15)
V
=
_
a
2
2
x
+ b
2
2
y
. (A.16)
For example, for V = x + y with x = 100 3 and y = 6 4,
V = 106
3
2
+ 4
2
= 106 5
A.7.2 Product of various powers: V = x
p
y
q
V
x
= px
p1
y
q
,
V
y
= qx
p
y
q1
, (A.17)
V
=
_
p
2
x
2(p1)
y
2q
2
x
+ q
2
x
2p
y
2(q1)
2
y
. (A.18)
A.7. SPECIAL RULES FOR COMBINING ERRORS 105
For fractional standard deviation we can write
V
=
p
2
_
x
x
_
2
+ q
2
_
y
y
_
2
. (A.19)
For the special cases V = xy or V = x/y corresponding to p = 1 and q = 1,
we obtain
V
=
x
x
_
2
+ q
2
_
y
y
_
2
. (A.20)
For example, for V = xy and x = 100 3 and y = 6 4, we nd
_
0.3
100.0
_
2
+
_
0.4
6.0
_
2
= 600 40.
On the other hand, for V = x
2
with x = 10 1, we nd
V = (101)
2
= 10
2
_
1 2
1
10
_
= 10020 and not
V = 10
2
_
1
2
1
10
_
= 10014
A.7.3 Logarithm of a quantity: V = Aln x
In this case dV /dx = A/x. Then from Eq. (19) we obtain
V
= A
x
x
. (A.21)
A.7.4 Exponential of a quantity: V = Ae
bx
Using dV /dx = Abe
bx
= bV in Eq.(19) we obtain
V
= B
x
. (A.22)
Reference:
John R. Taylor, An Introduction to Error Analysis : The Study of Un-
certainties in PhysicalMeasurements ( University Science Books, 1982).