MGA-23003

Reliability Data Sheet

Description
The MGA-23003 is a fully matched 3.3GHz 3.8GHz WiMax Linear Amplifier Module. The power amplifier is based on Avago Technologies E-PHEMT technology associated with 3x3x1 coreless laminate substrate, which is designed to provide output power of 25dBm with 8dB of Gain Step. Various reliability stress tests have been conducted and the results are shown below:

Reliability Prediction Model

An exponential cumulative failure function (constant failure rate) model was used to predict the failure rate and mean time to failure (MTTF). The wear-out mechanism is therefore not considered. The Arrhenius temperature de-rating equation is used. It is assumed that no failure mechanism changes between stresses and the use conditions. Bias and temperature condition are alterable stresses and must be considered with the thermal resistance of the devices when determining the stress condition. The failure rate will have a direct relationship to the bias life stress. The E-PHEMT has been tested to determine the activation energy of 1.58 eV and was used to predict the MTTF and FIT rate for the E-PHEMT. Confidence intervals are based upon the chi-squared prediction method associated with exponential distribution.

Table 1. Life Prediction: Demonstrated Performance

Test Name
RF-High Temperature Operating Life

Stress Test Condition

Tj = 150C RF Bias

Total Units Tested

64

Total Device Hours

64,000

No. Of Failed Units

0/64

Table 2. Estimated for Various Channel Temperatures are as follows:

Channel Temp. (C)
150 125 100 85 60

Point Typical Performance MTTF (yrs)

7.30 111.14 2437.06 19114.55 893869.06

90% Confidence MTTF (yrs)

3.17 48.22 1057.29 8292.65 387795.69

Point Typical Performance FIT

15625.00 1026.44 46.81 5.97 0.13

90% Confidence FIT

36015.63 2365.93 107.90 13.76 0.29

Point typical MTTF is simply the total device hours divided by the number of failures. Since no failures were observed, the point estimate is calculated under the assumption that one unit failed. FIT rates shown are relatively high due to the limited device hours at product release.

CAUTION: THESE DEVICES ARE ESD SENSITIVE. THE FOLLOWING PRECAUTIONS ARE STRONGLY RECOMMENDED. ENSURE THAT AN ESD APPROVED CARRIER IS USED WHEN UNITS ARE TRANSPORTED FROM ONE DESTINATION TO ANOTHER. PERSONAL GROUNDING IS TO BE WORN AT ALL TIMES WHEN HANDLING THESE DEVICES. THE MANUFACTURER ASSUMES NO RESPONSIBILITY FOR ESD DAMAGE DUE TO IMPROPER STORAGE AND HANDLING OF THESE DEVICES.

Table 3. Environmental Test Results:

Stress
Temperature Cycling High temperature storage Autoclave Biased HAST Solderability

Reference & Conditions

JESD22-A104 : Condition C: -65C/+150C, 15mins dwell, 10mins transfer JESD22-A103: Ta= +150C 121C/100%RH, 15psig JESD22-A110: 110C/85%RH, Vcc = 4.7V JESD22-B102: Steamage 1hr at +245C for 5 secs

Duration
500 cycles 1008 hours 192 hours 288hrs 2x

Failures/ number tested

0/50 0/50 0/50 0/50 0/272

Table 4. Operating Life Test Results:

Stress
RF High Temperature Operating Life

Reference & Conditions

JESD22-A108C: Tj=150C, Ta=100C, Vcc=4.5V, Pout=25.5dBm, middle frequency: 3.5GHz

Duration
1000 hours

Failures/ number tested

0/64

Table 5. Mechanical Tests Information:

Stress
Drop Test (auto) [1]

Reference & Conditions

JESD22-B111 Peak acceleration: 1500Gs. Pulse duration: 0.5ms half-sine pulse. Deflection: 1mm, Bending Rate: 80mm/min Shear force: 10N for 60 secs JESD22-B103, Condition B RMS acceleration: 3.13Grms, Frequency: 5Hz 500Hz JESD22-B104, Condition G G level: 163G, Half Sine, 5 shocks/axis JESD22-A104 -40C/+85C, 15mins dwell, 5mins transfer

Duration
30 drops

Failures/ number tested

0/120

Cycle Bending Test [1] Shear Test [1] Vibration Test [1]

75 cycles 4-sided 3-axis (X, Y, Z) 30 shocks 1000x

0/49 0/20 0/120

Mechanical Shock [1] Temperature Cycling [1]

Note 1. Tested on daisy chain unit.

0/120 0/120

Table 6. Thermal Resistance Information:

Stress
Thermal Resistance

Reference & Conditions

Vcc = 3.4V, Vctrl = 2.8V, Vsply = Vbw = 3.3V

Theta Jc
23.4C

Table 7. ESD Ratings

ESD Test
Human Body Model Machine Model

Reference:
JESD22-A114-C JESD22-A115-A

Results
1000V (Class 1B) 50V (Class A)

HBM
Class 0 is ESD voltage level < 250V, Class 1A is voltage level between 250V and 500V, Class 1B is voltage level between 500V and 1000V, Class 1C is voltage level between 1000V and 2000V, Class 2 is voltage level between 2000V and 4000V, Class 3A is voltage level between 4000V and 8000V, Class 3B is voltage level > 8000V.

Moisture Sensitivity Classification: Level 3

Preconditioning per JESD22-A113D Level 3 was performed on all devices prior to reliability testing except for ESD classification test. MSL 3 Preconditioning, Accelerated condition (JESD22A113D): 125C HTS for 24hrs + 60C/60%RH for 40hrs + 3x Pb-free Reflow, 260C peak.

MM
Class A is ESD voltage level <200V, Class B is voltage level between 200V and 400V, Class C is voltage level > 400V.

Handling Precautions
ESD sensitivity levels for Human Body Model, Machine Model and Charge Device Model necessitate the following handling precautions: Ensure Faraday cage or conductive shield is used during transportation processes. If the static charge at SMT assembly station is above device sensitivity level, place an ionizer near to the device for charge neutralization purposes. Personal grounding must be worn at all time when handling the device.

For product information and a complete list of distributors, please go to our web site:

www.avagotech.com

Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries. Data subject to change. Copyright 2005-2009 Avago Technologies. All rights reserved. AV02-2101EN - September 9, 2009