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GAL16V8

High Performance E2CMOS PLD Generic Array Logic


FEATURES HIGH PERFORMANCE E2CMOS TECHNOLOGY 3.5 ns Maximum Propagation Delay Fmax = 250 MHz 3.0 ns Maximum from Clock Input to Data Output UltraMOS Advanced CMOS Technology 50% to 75% REDUCTION IN POWER FROM BIPOLAR 75mA Typ Icc on Low Power Device 45mA Typ Icc on Quarter Power Device ACTIVE PULL-UPS ON ALL PINS E CELL TECHNOLOGY Reconfigurable Logic Reprogrammable Cells 100% Tested/Guaranteed 100% Yields High Speed Electrical Erasure (<100ms) 20 Year Data Retention EIGHT OUTPUT LOGIC MACROCELLS Maximum Flexibility for Complex Logic Designs Programmable Output Polarity Also Emulates 20-pin PAL Devices with Full Function/Fuse Map/Parametric Compatibility PRELOAD AND POWER-ON RESET OF ALL REGISTERS 100% Functional Testability APPLICATIONS INCLUDE: DMA Control State Machine Control High Speed Graphics Processing Standard Logic Speed Upgrade ELECTRONIC SIGNATURE FOR IDENTIFICATION
2

FUNCTIONAL BLOCK DIAGRAM


I/CLK
CLK

8 I 8 I

OLMC

I/O/Q

OLMC

I/O/Q

PROGRAMMABLE AND-ARRAY (64 X 32)

OLMC

I/O/Q

OLMC

I/O/Q

OLMC

I/O/Q

OLMC

I/O/Q

I 8 I 8 I OLMC
OE

OLMC

I/O/Q

I/O/Q

I/OE

DESCRIPTION The GAL16V8D, at 3.5 ns maximum propagation delay time, combines a high performance CMOS process with Electrically Erasable (E2) floating gate technology to provide the highest speed performance available in the PLD market. High speed erase times (<100ms) allow the devices to be reprogrammed quickly and efficiently. The generic architecture provides maximum design flexibility by allowing the Output Logic Macrocell (OLMC) to be configured by the user. An important subset of the many architecture configurations possible with the GAL16V8 are the PAL architectures listed in the table of the macrocell description section. GAL16V8 devices are capable of emulating any of these PAL architectures with full function/fuse map/parametric compatibility. Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. As a result, Lattice Semiconductor guarantees 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are guaranteed.

PIN CONFIGURATION

DIP PLCC
I I 2 I I I I I 8 14 9 I GND 11 I/OE I/O/Q 13 6 4 I/CLK Vcc 20 18 I/O/Q I/O/Q

I/CLK I I I

20

Vcc I/O/Q I/O/Q

GAL16V8
16

I/O/Q

GAL 16V8
5 15

I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q

I
I/O/Q I/O/Q I/O/Q

Top View

I I I

I/O/Q

I GND 10 11

I/OE

Copyright 1996 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice.

LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 681-0118; 1-888-ISP-PLDS; FAX (503) 681-3037; http://www.latticesemi.com

1996 Data Book

16v8_02

Specifications GAL16V8
GAL16V8 ORDERING INFORMATION
Commercial Grade Specifications
Tpd (ns)
3.5 5

Tsu (ns)
2.5 3

Tco (ns)
3.0 4

Icc (mA)
115 115 11 5 GAL16V8D-3LJ

Ordering #

Package
20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC

GAL16V8C-5LP GAL16V8C-5LJ GAL16V8C-7LP GAL16V8C-7LJ GAL16V8B-7LP GAL16V8B-7LJ GAL16V8B-10LP GAL16V8B-10LJ GAL16V8D-10QP GAL16V8D-10QJ GAL16V8D-15QP or GAL16V8B-15QP GAL16V8D-15QJ or GAL16V8B-15QJ GAL16V8D-15LP or GAL16V8B-15LP GAL16V8D-15LJ or GAL16V8B-15LJ GAL16V8D-25QP or GAL16V8B-25QP GAL16V8D-25QJ or GAL16V8B-25QJ GAL16V8D-25LP or GAL16V8B-25LP GAL16V8D-25LJ or GAL16V8B-25LJ

7.5

115 115 11 5 115

10

10

115 115

10

10

7.5

55 55

15

12

10

55 55 90 90

25

15

12

55 55 90 90

Industrial Grade Specifications


Tpd (ns)
7.5

Tsu (ns)
7

Tco (ns)
5

Icc (mA)
130 130

Ordering #
GAL16V8C-7LPI GAL16V8C-7LJI GAL16V8B-10LPI GAL16V8B-10LJI GAL16V8D-15LPI or GAL16V8B-15LPI GAL16V8D-15LJI or GAL16V8B-15LJI GAL16V8D-20QPI or GAL16V8B-20QPI GAL16V8D-20QJI or GAL16V8B-20QJI GAL16V8D-25QPI or GAL16V8B-25QPI GAL16V8D-25QJI or GAL16V8B-25QJI GAL16V8D-25LPI or GAL16V8B-25LPI GAL16V8D-25LJI or GAL16V8B-25LJI

Package
20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC

10

10

130 130

15

12

10

130 130

20

13

11

65 65

25

15

12

65 65 130 130

PART NUMBER DESCRIPTION


XXXXXXXX _ XX X X X

GAL16V8D Device Name GAL16V8C GAL16V8B Speed (ns) L = Low Power Q = Quarter Power Power

Grade

Blank = Commercial I = Industrial

Package P = Plastic DIP J = PLCC

1996 Data Book

Specifications GAL16V8
OUTPUT LOGIC MACROCELL (OLMC)
The following discussion pertains to configuring the output logic macrocell. It should be noted that actual implementation is accomplished by development software/hardware and is completely transparent to the user. There are three global OLMC configuration modes possible: simple , complex , and registered . Details of each of these modes are illustrated in the following pages. Two global bits, SYN and AC0, control the mode configuration for all macrocells. The XOR bit of each macrocell controls the polarity of the output in any of the three modes, while the AC1 bit of each of the macrocells controls the input/output configuration. These two global and 16 individual architecture bits define all possible configurations in a GAL16V8 . The information given on these architecture bits is only to give a better understanding of the device. Compiler software will transparently set these architecture bits from the pin definitions, so the user should not need to directly manipulate these architecture bits. The following is a list of the PAL architectures that the GAL16V8 can emulate. It also shows the OLMC mode under which the GAL16V8 emulates the PAL architecture.
PAL Architectures Emulated by GAL16V8 16R8 16R6 16R4 16RP8 16RP6 16RP4 16L8 16H8 16P8 10L8 12L6 14L4 16L2 10H8 12H6 14H4 16H2 10P8 12P6 14P4 16P2 GAL16V8 Global OLMC Mode Registered Registered Registered Registered Registered Registered Complex Complex Complex Simple Simple Simple Simple Simple Simple Simple Simple Simple Simple Simple Simple

COMPILER SUPPORT FOR OLMC


Software compilers support the three different global OLMC modes as different device types. These device types are listed in the table below. Most compilers have the ability to automatically select the device type, generally based on the register usage and output enable (OE) usage. Register usage on the device forces the software to choose the registered mode. All combinatorial outputs with OE controlled by the product term will force the software to choose the complex mode. The software will choose the simple mode only when all outputs are dedicated combinatorial without OE control. The different device types listed in the table can be used to override the automatic device selection by the software. For further details, refer to the compiler software manuals. When using compiler software to configure the device, the user must pay special attention to the following restrictions in each mode. Registered ABEL CUPL LOG/iC OrCAD-PLD PLDesigner TANGO-PLD P16V8R G16V8MS GAL16V8_R "Registered"1 P16V8R2 G16V8R Complex P16V8C G16V8MA GAL16V8_C7 "Complex"1 P16V8C2 G16V8C Simple P16V8AS G16V8AS GAL16V8_C8 "Simple"1 P16V8C2 G16V8AS3 Auto Mode Select P16V8 G16V8 GAL16V8 GAL16V8A P16V8A G16V8 In registered mode pin 1 and pin 11 are permanently configured as clock and output enable, respectively. These pins cannot be configured as dedicated inputs in the registered mode. In complex mode pin 1 and pin 11 become dedicated inputs and use the feedback paths of pin 19 and pin 12 respectively. Because of this feedback path usage, pin 19 and pin 12 do not have the feedback option in this mode. In simple mode all feedback paths of the output pins are routed via the adjacent pins. In doing so, the two inner most pins ( pins 15 and 16) will not have the feedback option as these pins are always configured as dedicated combinatorial output.

1) Used with Configuration keyword. 2) Prior to Version 2.0 support. 3) Supported on Version 1.20 or later.

1996 Data Book

Specifications GAL16V8
REGISTERED MODE
In the Registered mode, macrocells are configured as dedicated registered outputs or as I/O functions. Architecture configurations available in this mode are similar to the common 16R8 and 16RP4 devices with various permutations of polarity, I/O and register placement. All registered macrocells share common clock and output enable control pins. Any macrocell can be configured as registered or I/O. Up to eight registers or up to eight I/O's are possible in this mode. Dedicated input or output functions can be implemented as subsets of the I/O function. Registered outputs have eight product terms per output. I/O's have seven product terms per output. The JEDEC fuse numbers, including the User Electronic Signature (UES) fuses and the Product Term Disable (PTD) fuses, are shown on the logic diagram on the following page.

CLK

Registered Configuration for Registered Mode - SYN=0. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this output configuration. - Pin 1 controls common CLK for the registered outputs. - Pin 11 controls common OE for the registered outputs. - Pin 1 & Pin 11 are permanently configured as CLK & OE.

Q Q

XOR

OE

Combinatorial Configuration for Registered Mode - SYN=0. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1 defines this output configuration. - Pin 1 & Pin 11 are permanently configured as CLK & OE.

XOR

Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.

1996 Data Book

Specifications GAL16V8
REGISTERED MODE LOGIC DIAGRAM
DIP & PLCC Package Pinouts
1
0 0000 4 8 12 16 20 24 28 2128 PTD

OLMC
0224

19

2
0256

XOR-2048 AC1-2120

OLMC
0480

18

3
0512

XOR-2049 AC1-2121

OLMC
0736

17

4
0768

XOR-2050 AC1-2122

OLMC
0992

16

5
1024

XOR-2051 AC1-2123

OLMC
1248

15

6
1280

XOR-2052 AC1-2124

OLMC
1504

14

7
1536

XOR-2053 AC1-2125

OLMC
1760

13

8
1792

XOR-2054 AC1-2126

OLMC
2016

12

9
2191

XOR-2055 AC1-2127

OE

11

SYN-2192 AC0-2193

1996 Data Book

Specifications GAL16V8
COMPLEX MODE
In the Complex mode, macrocells are configured as output only or I/O functions. Architecture configurations available in this mode are similar to the common 16L8 and 16P8 devices with programmable polarity in each macrocell. Up to six I/O's are possible in this mode. Dedicated inputs or outputs can be implemented as subsets of the I/O function. The two outer most macrocells (pins 12 & 19) do not have input capability. Designs requiring eight I/O's can be implemented in the Registered mode. All macrocells have seven product terms per output. One product term is used for programmableoutput enable control. Pins 1 and 11 are always available as data inputs into the AND array. The JEDEC fuse numbers including the UES fuses and PTD fuses are shown on the logic diagram on the following page.

Combinatorial I/O Configuration for Complex Mode - SYN=1. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1. - Pin 13 through Pin 18 are configured to this function.

XOR

Combinatorial Output Configuration for Complex Mode - SYN=1. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1. - Pin 12 and Pin 19 are configured to this function.

XOR

Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.

1996 Data Book

Specifications GAL16V8
COMPLEX MODE LOGIC DIAGRAM
DIP & PLCC Package Pinouts
1
2128

0
0000

12

16

20

24

28

PTD

OLMC
0224

19

2
0256

XOR-2048 AC1-2120

OLMC
0480

18

3
0512

XOR-2049 AC1-2121

OLMC
0736

17

4
0768

XOR-2050 AC1-2122

OLMC
0992

16

5
1024

XOR-2051 AC1-2123

OLMC
1248

15

6
1280

XOR-2052 AC1-2124

OLMC
1504

14

7
1536

XOR-2053 AC1-2125

OLMC
1760

13

8
1792

XOR-2054 AC1-2126

OLMC
2016

12

XOR-2055 AC1-2127 11
2191

SYN-2192 AC0-2193

1996 Data Book

Specifications GAL16V8
SIMPLE MODE
In the Simple mode, macrocells are configured as dedicated inputs or as dedicated, always active, combinatorial outputs. Architecture configurations available in this mode are similar to the common 10L8 and 12P6 devices with many permutations of generic output polarity or input choices. All outputs in the simple mode have a maximum of eight product terms that can control the logic. In addition, each output has programmable polarity. Pins 1 and 11 are always available as data inputs into the AND array. The center two macrocells (pins 15 & 16) cannot be used as input or I/O pins, and are only available as dedicated outputs. The JEDEC fuse numbers including the UES fuses and PTD fuses are shown on the logic diagram.

Vcc

Combinatorial Output with Feedback Configuration for Simple Mode - SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this configuration. - All OLMC except pins 15 & 16 can be configured to this function.

XOR

Combinatorial Output Configuration for Simple Mode


Vcc

XOR

- SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this configuration. - Pins 15 & 16 are permanently configured to this function.

Dedicated Input Configuration for Simple Mode - SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1 defines this configuration. - All OLMC except pins 15 & 16 can be configured to this function.

Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.

1996 Data Book

Specifications GAL16V8
SIMPLE MODE LOGIC DIAGRAM
DIP & PLCC Package Pinouts
1
2128

0
0000

12

16

20

24

28

PTD

OLMC
XOR-2048 AC1-2120 19

0224

2
0256

OLMC
XOR-2049 AC1-2121 18

0480

3
0512

OLMC
XOR-2050 AC1-2122 17

0736

4
0768

OLMC
XOR-2051 AC1-2123 16

0992

5
1024

OLMC
XOR-2052 AC1-2124 15

1248

6
1280

OLMC
XOR-2053 AC1-2125 14

1504

7
1536

OLMC
XOR-2054 AC1-2126 13

1760

8
1792

OLMC
XOR-2055 AC1-2127 12 11

2016

2191

SYN-2192 AC0-2193

1996 Data Book

Specifications GAL16V8D Specifications GAL16V8


ABSOLUTE MAXIMUM RATINGS(1)
Supply voltage VCC ...................................... 0.5 to +7V Input voltage applied .......................... 2.5 to VCC +1.0V Off-state output voltage applied.......... 2.5 to VCC +1.0V Storage Temperature................................. 65 to 150C Ambient Temperature with Power Applied ........................................ 55 to 125C
1.Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).

RECOMMENDED OPERATING COND.


Commercial Devices: Ambient Temperature (TA) ............................... 0 to 75C Supply voltage (VCC) with Respect to Ground ..................... +4.75 to +5.25V Industrial Devices: Ambient Temperature (TA) ........................... 40 to 85C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V

DC ELECTRICAL CHARACTERISTICS
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current Output Low Voltage Output High Voltage 0V VIN VIL (MAX.) 3.5V VIN VCC IOL = MAX. Vin = VIL or VIH IOH = MAX. Vin = V IL or V IH L-3 CONDITION MIN.
Vss 0.5

TYP.3

MAX. 0.8 Vcc+1 100 10 0.5 16 24

UNITS V V A A V V mA mA

VIL VIH IIL1 IIH VOL VOH IOL IOH IOS2

2.0 2.4

Low Level Output Current

L-15/-25 Q-10/-15/-20/-25

High Level Output Current Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25C

30

3.2 150

mA mA

COMMERCIAL ICC Operating Power


Supply Current

VIL = 0.5V

VIH = 3.0V

L -3 L-15/-25 Q-10/-15/-25

75 75 45

115 90 55

mA mA mA

ftoggle = 15MHz Outputs Open

INDUSTRIAL ICC Operating Power


Supply Current

VIL = 0.5V

VIH = 3.0V

L -15/-25 Q -20/-25

75 45

130 65

mA mA

ftoggle = 15MHz Outputs Open

1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Guaranteed but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 C

10

1996 Data Book

Specifications GAL16V8 Specifications GAL16V8D


AC SWITCHING CHARACTERISTICS
Over Recommended Operating Conditions
COM TEST PARAM. COND1 . COM COM / IND IND COM / IND

DESCRIPTION Input or I/O to Comb. Output Clock to Output Delay Clock to Feedback Delay 1 1

-3
MIN.

-10
MAX. MIN.

-15

-20

-25 UNITS
MAX.

MAX. MIN.

MAX. MIN.

MAX. MIN.

tpd tco tcf2 tsu th

A A A

3.5 3 2.5

3 2 10 0 57.1

10 7.5 6

3 2 12 0 45.5

15 10 8

3 2 13 0 41.6

20 11 9

3 2 15 0 37

25 12 10

ns ns ns ns ns MHz

Setup Time, Input or Fdbk before Clk 2.5 Hold Time, Input or Fdbk after Clk Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled 0 182

fmax3

A A

200 250

62.5 62.5

50 62.5

45.4 50

40 41.6

MHz MHz

twh twl ten t tdis t

B B C C

2 2

4.5 4.5 4.5 4.5

8 8 3 2 2 1

10 10 10 10

8 8

15 15 15 15

10 10

18 18 18 18

12 12

20 20 20 20

ns ns ns ns ns ns

CAPACITANCE (TA = 25C, f = 1.0 MHz)


SYMBOL CI CI/O PARAMETER Input Capacitance I/O Capacitance MAXIMUM* 8 8 UNITS pF pF TEST CONDITIONS VCC = 5.0V, VI = 2.0V VCC = 5.0V, VI/O = 2.0V

*Guaranteed but not 100% tested.

11

1996 Data Book

Specifications GAL16V8C Specifications GAL16V8


ABSOLUTE MAXIMUM RATINGS(1)
Supply voltage VCC ...................................... 0.5 to +7V Input voltage applied .......................... 2.5 to VCC +1.0V Off-state output voltage applied.......... 2.5 to VCC +1.0V Storage Temperature................................. 65 to 150C Ambient Temperature with Power Applied ........................................ 55 to 125C
1.Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).

RECOMMENDED OPERATING COND.


Commercial Devices: Ambient Temperature (TA) ............................... 0 to 75C Supply voltage (VCC) with Respect to Ground ..................... +4.75 to +5.25V Industrial Devices: Ambient Temperature (TA) ........................... 40 to 85C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V

DC ELECTRICAL CHARACTERISTICS
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current Output Low Voltage Output High Voltage Low Level Output Current High Level Output Current Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25C 0V VIN VIL (MAX.) 3.5V VIN VCC IOL = MAX. Vin = VIL or VIH IOH = MAX. Vin = VIL or VIH CONDITION MIN.
Vss 0.5

TYP.3

MAX. 0.8 Vcc+1 100 10 0.5 16 3.2 150

UNITS V V A A V V mA mA mA

VIL VIH IIL1 IIH VOL VOH IOL IOH IOS2

2.0 2.4 30

COMMERCIAL ICC Operating Power


Supply Current

VIL = 0.5V

VIH = 3.0V

L -5/-7

75

115

mA

ftoggle = 15MHz Outputs Open

INDUSTRIAL ICC Operating Power


Supply Current

VIL = 0.5V

VIH = 3.0V

L -7

75

130

mA

ftoggle = 15MHz Outputs Open

1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Guaranteed but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 C

12

1996 Data Book

Specifications GAL16V8C Specifications GAL16V8


AC SWITCHING CHARACTERISTICS
Over Recommended Operating Conditions
COM PARAMETER COM IND

TEST COND1. A

DESCRIPTION Input or I/O to Comb. Output 8 outputs switching 1 output switching 1 1 3 0

-5

-7

-7 UNITS

MIN. MAX. MIN. MAX. MIN. MAX.

tpd tco tcf2 tsu th

5 4 3

3 2 7 0 83.3

7.5 7 5 3

1 1 7 0 83.3

7.5 5 3

ns ns ns ns ns ns MHz

A A

Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled

142.8

fmax3

A A

166 166

100 100

100 100

MHz MHz

twh twl ten tdis

B B C C

3 3 1 1 1 1

6 6 5 5

5 5 3 2 2 1.5

9 6 9 6

5 5 1 1 1 1

9 6 9 6

ns ns ns ns ns ns

1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Characterized initially and after any design or process changes that may affect these parameters.

CAPACITANCE (TA = 25C, f = 1.0 MHz)


SYMBOL CI CI/O PARAMETER Input Capacitance I/O Capacitance MAXIMUM* 8 8 UNITS pF pF TEST CONDITIONS VCC = 5.0V, VI = 2.0V VCC = 5.0V, VI/O = 2.0V

*Guaranteed but not 100% tested.

13

1996 Data Book

Specifications GAL16V8B Specifications GAL16V8


ABSOLUTE MAXIMUM RATINGS(1)
Supply voltage VCC ...................................... 0.5 to +7V Input voltage applied .......................... 2.5 to VCC +1.0V Off-state output voltage applied.......... 2.5 to VCC +1.0V Storage Temperature................................. 65 to 150C Ambient Temperature with Power Applied ........................................ 55 to 125C
1.Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).

RECOMMENDED OPERATING COND.


Commercial Devices: Ambient Temperature (TA) ............................... 0 to 75C Supply voltage (VCC) with Respect to Ground ..................... +4.75 to +5.25V Industrial Devices: Ambient Temperature (TA) ........................... 40 to 85C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V

DC ELECTRICAL CHARACTERISTICS
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current Output Low Voltage Output High Voltage Low Level Output Current High Level Output Current Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25C 0V VIN VIL (MAX.) 3.5V VIN VCC IOL = MAX. Vin = VIL or VIH IOH = MAX. Vin = VIL or VIH CONDITION MIN.
Vss 0.5

TYP.3

MAX. 0.8 Vcc+1

UNITS V V A A V V mA mA mA

VIL VIH IIL1 IIH VOL VOH IOL IOH IOS2

2.0 2.4 30

100
10 0.5 24 3.2 150

COMMERCIAL ICC Operating Power


Supply Current

VIL = 0.5V

VIH = 3.0V

L -7/-10 L -15/-25 Q -15/-25

75 75 45

115 90 55

mA mA mA

ftoggle = 15MHz Outputs Open

INDUSTRIAL ICC Operating Power


Supply Current

VIL = 0.5V

VIH = 3.0V

L -10/-15/-25 Q -20/-25

75 45

130 65

mA mA

ftoggle = 15MHz Outputs Open

1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Guaranteed but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 C

14

1996 Data Book

Specifications GAL16V8B Specifications GAL16V8


AC SWITCHING CHARACTERISTICS
Over Recommended Operating Conditions
COM PARAM. TEST COND1. COM / IND COM / IND IND COM / IND

DESCRIPTION Input or I/O to Comb. Output 8 outputs switching 1 output switching 3 2 7 0

-7
MIN.

-10
MAX. MIN.

-15

-20

-25 UNITS
MAX.

MAX. MIN.

MAX. MIN.

MAX. MIN.

tpd tco tcf2 tsu th

7.5 7 5 3

3 2 10 0 58.8

10 7 6

3 2 12 0 45.5

15 10 8

3 2 13 0 41.6

20 11 9

3 2 15 0 37

25 12 10

ns ns ns ns ns ns MHz

A A

Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Fdbk before Clk Hold Time, Input or Fdbk after Clk Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled

83.3

fmax3

A A

100 100

62.5 62.5

50 62.5

45.4 50

40 41.6

MHz MHz

twh twl ten tdis

B B C C

5 5 3 2 2 1.5

9 6 9 6

8 8 3 2 2 1.5

10 10 10 10

8 8

15 15 15 15

10 10

20 18 20 18

12 12

25 20 25 20

ns ns ns ns ns ns

1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section.

CAPACITANCE (TA = 25C, f = 1.0 MHz)


SYMBOL CI CI/O PARAMETER Input Capacitance I/O Capacitance MAXIMUM* 8 8 UNITS pF pF TEST CONDITIONS VCC = 5.0V, VI = 2.0V VCC = 5.0V, VI/O = 2.0V

*Guaranteed but not 100% tested.

15

1996 Data Book

Specifications GAL16V8
SWITCHING WAVEFORMS

INPUT or I/O FEEDBACK

VALID INPUT

tsu
INPUT or I/O FEEDBACK CLK VALID INPUT

th

tco
REGISTERED OUTPUT 1/fmax (external fdbk)

tpd
COMBINATIONAL OUTPUT

Combinatorial Output

Registered Output

INPUT or I/O FEEDBACK

OE

tdis
COMBINATIONAL OUTPUT

ten
REGISTERED OUTPUT

tdis

ten

Input or I/O to Output Enable/Disable

to Output Enable/Disable

twh
CLK 1/fmax (w/o fb)

twl

CLK 1/fmax (internal fdbk)

tcf
REGISTERED FEEDBACK

tsu

Clock Width

fmax with Feedback

16

1996 Data Book

Specifications GAL16V8
fmax DESCRIPTIONS
CLK

LOGIC ARRAY

CLK
REGISTER

LOGIC ARRAY

tsu

tco

REGISTER

fmax with External Feedback 1/(tsu+tco)


Note: fmax with external feedback is calculated from measured tsu and tco.
CLK

t cf t pd

fmax with Internal Feedback 1/(tsu+tcf)


LOGIC ARRAY REGISTER

tsu + th

fmax with No Feedback


Note: fmax with no feedback may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%.

Note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. For example, the timing from clock to a combinatorial output is equal to tcf + tpd.

SWITCHING TEST CONDITIONS


+5V

Input Pulse Levels GAL16V8B and Input Rise and Fall Times GAL16V8D-10 (and slower) GAL16V8C and GAL16V8D-3 Input Timing Reference Levels Ouput Timing Reference Levels Output Load 3-state levels are measured 0.5V from steady-state active level.

GND to 3.0V 2 3ns 10% 90%


R1

1.5ns 10% 90% 1.5V 1.5V See figure at right


Table 2-0003/16V8

FROM OUTPUT (O/Q) UNDER TEST

TEST POINT

R2

C L*

*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE

GAL16V8B and GAL16V8D-10/-15/-20/-25 Output Load Conditions (see figure above) Test Condition A B C Active High Active Low Active High Active Low R1 200 200 200 R2 390 390 390 390 390 CL 50pF 50pF 50pF 5pF 5pF

GAL16V8C Output Load Conditions (see figure above) Test Condition A B C Active High Active Low Active High Active Low R1 200 200 200 R2 200 200 200 200 200 CL 50pF 50pF 50pF 5pF 5pF

17

1996 Data Book

Specifications GAL16V8
SWITCHING TEST CONDITIONS, CONTINUED
GAL16V8D-3 Output Load Conditions (see figure at right) Test Condition A B C High Z to Active High at 1.9V High Z to Active Low at 1.0V Active High to High Z at 1.9V Active Low to High Z at 1.0V R1 50 50 50 50 50 CL 35pF 35pF 35pF 35pF 35pF
TEST POINT R1 +1.45V

FROM OUTPUT (O/Q) UNDER TEST

Z0 = 50, CL = 35pF*

*CL includes test fixture and probe capacitance.

ELECTRONIC SIGNATURE
An electronic signature is provided in every GAL16V8 device. It contains 64 bits of reprogrammable memory that can contain user defined data. Some uses include user ID codes, revision numbers, or inventory control. The signature data is always available to the user independent of the state of the security cell. NOTE: The electronic signature is included in checksum calculations. Changing the electronic signature will alter the checksum.

OUTPUT REGISTER PRELOAD


When testing state machine designs, all possible states and state transitions must be verified in the design, not just those required in the normal machine operations. This is because, in system operation, certain events occur that may throw the logic into an illegal state (power-up, line voltage glitches, brown-outs,etc.). To test a design for proper treatment of these conditions, a way must be provided to break the feedback paths, and force any desired (i.e., illegal) state into the registers. Then the machine can be sequenced and the outputs tested for correct next state conditions. GAL16V8 devices include circuitry that allows each registered output to be synchronously set either high or low. Thus, any present state condition can be forced for test sequencing. If necessary, approved GAL programmers capable of executing text vectors perform output register preload automatically.

SECURITY CELL
A security cell is provided in the GAL16V8 devices to prevent unauthorized copying of the array patterns. Once programmed,this cell prevents further read access to the functional bits in the device. This cell can only be erased by re-programmingthe device, so the original configuration can never be examined once this cell is programmed. The Electronic Signature is always available to the user, regardless of the state of this control cell.

INPUT BUFFERS
GAL16V8 devices are designed with TTL level compatible input buffers. These buffers have a characteristicallyhigh impedance, and present a much lighter load to the driving logic than bipolar TTL devices. The GAL16V8 input and I/O pins have built-in active pull-ups. As a result, unused inputs and I/O's will float to a TTL "high" (logical "1"). Lattice Semiconductor recommends that all unused inputs and tri-stated I/O pins be connected to another active input, VCC, or Ground. Doing this will tend to improve noise immunity and reduce ICC for the device.

LATCH-UP PROTECTION
GAL16V8 devices are designed with an on-board charge pump to negatively bias the substrate. The negative bias minimizes the potential of latch-up caused by negative input undershoots. Additionally, outputs are designed with n-channel pull-ups instead of the traditional p-channel pull-ups in order to eliminate latch-up due to output overshoots.

DEVICE PROGRAMMING
I n p u t C u r r e n t (u A )

Typical Input Pull-up Characteristic


0

GAL devices are programmed using a Lattice Semiconductorapproved Logic Programmer, available from a number of manufacturers. Complete programming of the device takes only a few seconds. Erasing of the device is transparent to the user, and is done automatically as part of the programming cycle.

-20

-40 -60 0 1.0 2.0 3.0 4.0 5.0

In p u t V o lt ag e ( V o lt s)

18

1996 Data Book

Specifications GAL16V8
POWER-UP RESET
Vcc
Vcc (min.)

t su
CLK

t wl t pr

INTERNAL REGISTER Q - OUTPUT

Internal Register Reset to Logic "0"

FEEDBACK/EXTERNAL OUTPUT REGISTER

Device Pin Reset to Logic "1"

Circuitry within the GAL16V8 provides a reset signal to all registers during power-up. All internal registers will have their Q outputs set low after a specified time (tpr, 1s MAX). As a result, the state on the registered output pins (if they are enabled) will always be high on power-up, regardless of the programmed polarity of the output pins. This feature can greatly simplify state machine design by providing a known state on power-up. Because of the asynchronous nature of system power-up, some

conditions must be met to guarantee a valid power-up reset of the device. First, the VCC rise must be monotonic. Second, the clock input must be at static TTL level as shown in the diagram during power up. The registers will reset within a maximum of tpr time. As in normal system operation, avoid clocking the device until all input and feedback path setup times have been met. The clock must also meet the minimum pulse width requirements.

INPUT/OUTPUT EQUIVALENT SCHEMATICS


PIN
Feedback PIN

Vcc
Active Pull-up Circuit
Active Pull-up Circuit

Vcc
ESD Protection Circuit

Vref

Vcc

Tri-State Control

Vcc

Vref

PIN

Data Output

PIN

ESD Protection Circuit


Typ. Vref = 3.2V Typical Input Typ. Vref = 3.2V

Feedback (To Input Buffer)


Typical Output

19

1996 Data Book

Specifications GAL16V8
GAL 16V8D-3: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Normalized Tpd vs Vcc
1.2 1.2

Normalized Tco vs Vcc


1.2

Normalized Tsu vs Vcc

Normalized Tpd

1.1

Normalized Tco

Normalized Tsu

PT H->L PT L->H

1.1

RISE FALL

1.1

PT H->L PT L->H

0.9

0.9

0.9

0.8 4.50

4.75

5.00

5.25

5.50

0.8 4.50

4.75

5.00

5.25

5.50

0.8 4.50

4.75

5.00

5.25

5.50

Supply Voltage (V)

Supply Voltage (V)

Supply Voltage (V)

Normalized Tpd vs Temp


1.3 1.2 1.1 1 0.9 0.8 0.7 -55 1.3 1.2 1.1 1 0.9 0.8 0.7 -55

Normalized Tco vs Temp


1.3 1.2 1.1 1 0.9 0.8 0.7 -55

Normalized Tsu vs Temp

Normalized Tpd

Normalized Tco

-25

25

50

75

100

125

-25

25

50

75

100

125

Normalized Tsu

PT H->L PT L->H

RISE FALL

PTH->L PT L->H

-25

25

50

75

1 00

1 25

Temperature (deg. C)

Temperature (deg. C)

Temperature (deg. C)

Delta Tpd vs # of Outputs Switching


0 0

Delta Tco vs # of Outputs Switching

Delta Tpd (ns)

-0.1

Delta Tco (ns)

-0.1

-0.2

-0.2

RISE FALL
-0.3

-0.3

RISE FALL

-0.4 1 2 3 4 5 6 7 8

-0.4 1 2 3 4 5 6 7 8

Number of Outputs Switching

Number of Outputs Switching

Delta Tpd vs Output Loading


14 12 14 12

Delta Tco vs Output Loading

Delta Tpd (ns)

10 8 6 4 2 0 -2 0 50

Delta Tco (ns)

RISE FALL

10 8 6 4 2 0 -2

RISE FALL

100

150

200

250

3 00

50

100

150

200

250

3 00

Output Loading (pF)

Output Loading (pF)

20

1996 Data Book

Specifications GAL16V8
GAL 16V8D-3: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Vol vs Iol
1 5

Voh vs Ioh
3.25

Voh vs Ioh

0.75

4 3

Voh (V)

Vol (V)

0.5

Voh (V)
0 10 20 30 40 50

2.75

0.25 1

0 0 10 20 30 40

2.5 0 1 2 3 4

Iol (mA) Normalized Icc vs Vcc


1.2 1.3

Ioh (mA) Normalized Icc vs Temp


1.2 1.15

Ioh (mA) Normalized Icc vs Freq.

1.2

Normalized Icc

Normalized Icc

Normalized Icc
-25 0 25 50 75 100 125

1.1

1.1 1.05 1 0.95 0.9 0 25 50 75 1 00

1.1

0.9

0.9

0.8 4.50

4.75

5.00

5.25

5.50

0.8 -55

Supply Voltage (V) Delta Icc vs Vin (1 input)


10 0 10 8

Temperature (deg. C) Input Clamp (Vik)

Frequency (MHz)

Delta Icc (mA)

20

Iik (mA)

30 40 50 60 70 80

0 0 0.5 1 1.5 2 2.5 3 3.5 4

90 -2

-1.5

-1

-0.5

Vin (V)

Vik (V)

21

1996 Data Book

Specifications GAL16V8
GAL 16V8D-10 (and Slower): TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Normalized Tpd vs Vcc
1.2 1.2 RISE FALL

Normalized Tco vs Vcc


1.2

Normalized Tsu vs Vcc

Normalized Tpd

1.1

PT H->L PT L->H

Normalized Tco

Normalized Tsu

1.1

1.1

PT H->L PT L->H

0.9

0.9

0.9

0.8 4.50

4.75

5.00

5.25

5.50

0.8 4.50

4.75

5.00

5.25

5.50

0.8 4.50

4.75

5.00

5.25

5.50

Supply Voltage (V)

Supply Voltage (V)

Supply Voltage (V)

Normalized Tpd vs Temp


1.3 1.2 1.3

Normalized Tco vs Temp


1.3

Normalized Tsu vs Temp

Normalized Tpd

Normalized Tco

1.1 1 0.9 0.8 0.7 -55

1.1 1 0.9 0.8 0.7 -55

Normalized Tsu

PT H->L PT L->H

1.2

RISE FALL

1.2 1.1 1 0.9 0.8 0.7 -55

PT H->L PT L->H

-25

25

50

75

100

125

-25

25

50

75

100

125

-25

25

50

75

100

125

Temperature (deg. C)

Temperature (deg. C)

Temperature (deg. C)

Delta Tpd vs # of Outputs Switching


0 -0.2 0 -0.2

Delta Tco vs # of Outputs Switching

Delta Tpd (ns)

-0.4 -0.6 -0.8 -1 -1.2 1 2 3 4 5 6 7 8

Delta Tco (ns)

-0.4 -0.6 -0.8 -1 -1.2 1 2 3 4 5 6 7 8

RISE FALL

RISE FALL

Number of Outputs Switching Delta Tpd vs Output Loading


12 10 12 10

Number of Outputs Switching Delta Tco vs Output Loading

Delta Tpd (ns)

Delta Tco (ns)

8 6 4 2 0 -2 -4 -6 0 50

RISE FALL

8 6 4 2 0 -2 -4

RISE FALL

100

150

200

250

300

50

100

150

200

250

300

Output Loading (pF)

Output Loading (pF)

22

1996 Data Book

Specifications GAL16V8
GAL 16V8D-10 (and Slower): TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Vol vs Iol
0.6 5 4

Voh vs Ioh
4

Voh vs Ioh

3.8

Voh (V)

Voh (V)
0 10 20 30 40 50

0.4

Vol (V)

3 2

3.6

3.4 3.2

0.2

1 0 0 10 20 30 40

3 0 1 2 3 4

Iol (mA) Normalized Icc vs Vcc


1.2 1.3 1.2

Ioh (mA) Normalized Icc vs Temp


1.4 1.3

Ioh (mA) Normalized Icc vs Freq.

Normalized Icc

Normalized Icc

1.1 1 0.9 0.8

Normalized Icc
-25 0 25 50 75 100 125

1.1

1.2 1.1 1 0.9 0.8 0 25 50 75 100

0.9

0.8 4.50

4.75

5.00

5.25

5.50

0.7 -55

Supply Voltage (V)

Temperature (deg. C)

Frequency (MHz)

Delta Icc vs Vin (1 input)


8 0 10

Input Clamp (Vik)

Delta Icc (mA)

Iik (mA)
0 0.5 1 1.5 2 2.5 3 3.5 4

20 30 40 50

60 -2 -1.5 -1 -0.5 0

Vin (V)

Vik (V)

23

1996 Data Book

Specifications GAL16V8
GAL 16V8C-5/-7: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Normalized Tpd vs Vcc
1.2 1.2

Normalized Tco vs Vcc


1.2

Normalized Tsu vs Vcc

Normalized Tpd

Normalized Tco

1.1

Normalized Tsu

PT H->L PT L->H
1

RISE 1.1 FALL

PT H->L
1.1

PT L->H
1

0.9

0.9

0.9

0.8 4.50 4.75 5.00 5.25 5.50

0.8 4.50 4.75 5.00 5.25 5.50

0.8 4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Supply Voltage (V)

Supply Voltage (V)

Normalized Tpd vs Temp


1.3 1.3

Normalized Tco vs Temp


1.4

Normalized Tsu vs Temp

Normalized Tpd

Normalized Tco

Normalized Tsu

1.2 1.1 1 0.9 0.8 0.7

PT H->L PT L->H

1.2 1.1 1 0.9 0.8 0.7

RISE FALL

1.3 1.2 1.1 1 0.9 0.8 0.7

PT H->L PT L->H

-55

-25

-55

-25

25

50

75

25

50

100

125

75

100

125

100

Temperature (deg. C)

Temperature (deg. C)

Temperature (deg. C)

Delta Tpd vs # of Outputs Switching


0 0

Delta Tco vs # of Outputs Switching

Delta Tpd (ns)

-0.25

Delta Tco (ns)

-0.25

-0.5

-0.5

RISE
-0.75

RISE
-0.75

FALL
-1 1 2 3 4 5 6 7 8

FALL
-1 1 2 3 4 5 6 7 8

Number of Outputs Switching

Number of Outputs Switching

Delta Tpd vs Output Loading


8 8

Delta Tco vs Output Loading

Delta Tpd (ns)

FALL
4 2 0 -2 0 50 100 150 200 250 300

Delta Tco (ns)

RISE

6 4 2 0 -2 0 50

RISE FALL

100

150

200

250

300

Output Loading (pF)

Output Loading (pF)

24

1996 Data Book

125

-55

-25

50

25

75

Specifications GAL16V8
GAL 16V8C-5/-7: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Vol vs Iol
2 5 4

Voh vs Ioh
4.25

Voh vs Ioh

1.5

Voh (V)

3 2 1 0

Voh (V)

Vol (V)

3.75

0.5

3.5

0 0.00 20.00 40.00 60.00 80.00

3.25 10.00 20.00 30.00 40.00 50.00 0.00 1.00 2.00 3.00 4.00

0.00

Iol (mA)

Ioh(mA)

Ioh(mA)

Normalized Icc vs Vcc


1.20 1.3

Normalized Icc vs Temp


1.50 1.40

Normalized Icc vs Freq.

Normalized Icc

Normalized Icc

1.10

Normalized Icc

1.2 1.1 1 0.9 0.8

1.30 1.20 1.10 1.00 0.90 0.80

1.00

0.90

0.80 4.50 4.75 5.00 5.25 5.50

-55

-25

25

50

75

100

125

25

50

75

100

Supply Voltage (V)

Temperature (deg. C)

Frequency (MHz)

Delta Icc vs Vin (1 input)


10 0 5

Input Clamp (Vik)

Delta Icc (mA)

8 6 4 2 0 0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00

10

Iik (mA)

15 20 25 30 35 40 45 -2.00 -1.50 -1.00 -0.50 0.00

Vin (V)

Vik (V)

25

1996 Data Book

Specifications GAL16V8
GAL 16V8B-7/-10: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Normalized Tpd vs Vcc
1.2 1.2

Normalized Tco vs Vcc


1.2

Normalized Tsu vs Vcc

Normalized Tpd

Normalized Tco

1.1

Normalized Tsu

PT H->L PT L->H
1

RISE 1.1 FALL

PT H->L
1.1

PT L->H
1

0.9

0.9

0.9

0.8 4.50 4.75 5.00 5.25 5.50

0.8 4.50 4.75 5.00 5.25 5.50

0.8 4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Supply Voltage (V)

Supply Voltage (V)

Normalized Tpd vs Temp


1.3 1.3

Normalized Tco vs Temp


1.4

Normalized Tsu vs Temp

Normalized Tpd

Normalized Tco

Normalized Tsu

1.2 1.1 1 0.9 0.8 0.7

PT H->L PT L->H

1.2 1.1 1 0.9 0.8 0.7

RISE FALL

1.3 1.2 1.1 1 0.9 0.8 0.7

PT H->L PT L->H

-55

-25

25

50

75

100

100

125

125

-55

-25

25

50

75

100

Temperature (deg. C)

Temperature (deg. C)

Temperature (deg. C)

Delta Tpd vs # of Outputs Switching


0 0

Delta Tco vs # of Outputs Switching

Delta Tpd (ns)

-0.5

Delta Tco (ns)

-0.5

-1

-1

RISE
-1.5

RISE
-1.5

FALL
-2 1 2 3 4 5 6 7 8

FALL
-2 1 2 3 4 5 6 7 8

Number of Outputs Switching

Number of Outputs Switching

Delta Tpd vs Output Loading


10 10

Delta Tco vs Output Loading

Delta Tpd (ns)

6 4 2 0 -2 0 50

FALL

Delta Tco (ns)

RISE

8 6 4 2 0 -2

RISE FALL

100

150

200

250

300

50

100

150

200

250

300

Output Loading (pF)

Output Loading (pF)

26

1996 Data Book

125

-55

-25

25

50

75

Specifications GAL16V8
GAL 16V8B-7/-10: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Vol vs Iol
1 5 4

Voh vs Ioh
4.5

Voh vs Ioh

0.75

4.25

Voh (V)

3 2 1 0

0.5

Voh (V)

Vol (V)

0.25

3.75

0 0.00 20.00 40.00 60.00 80.00 100.00

3.5 10.00 20.00 30.00 40.00 50.00 60.00 0.00 1.00 2.00 3.00 4.00

0.00

Iol (mA)

Ioh(mA)

Ioh(mA)

Normalized Icc vs Vcc


1.20 1.2

Normalized Icc vs Temp


1.30

Normalized Icc vs Freq.

Normalized Icc

Normalized Icc

1.10

1.1

Normalized Icc
-55 -25 0 25 50 75 100 125

1.20 1.10 1.00 0.90 0.80 0 25 50 75 100

1.00

0.90

0.9

0.80 4.50 4.75 5.00 5.25 5.50

0.8

Supply Voltage (V)

Temperature (deg. C)

Frequency (MHz)

Delta Icc vs Vin (1 input)


10 0 10 20

Input Clamp (Vik)

Delta Icc (mA)

8 6 4 2 0 0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00

Iik (mA)

30 40 50 60 70 80 90 100 -2.00 -1.50 -1.00 -0.50 0.00

Vin (V)

Vik (V)

27

1996 Data Book

Specifications GAL16V8
GAL 16V8B-15/-25: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Normalized Tpd vs Vcc
1.2 1.2

Normalized Tco vs Vcc


1.2

Normalized Tsu vs Vcc

Normalized Tpd

1.1

Normalized Tco

Normalized Tsu

PT H->L PT L->H
1

RISE 1.1 FALL

PT H->L
1.1

PT L->H
1

0.9

0.9

0.9

0.8 4.50 4.75 5.00 5.25 5.50

0.8 4.50 4.75 5.00 5.25 5.50

0.8 4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Supply Voltage (V)

Supply Voltage (V)

Normalized Tpd vs Temp


1.3 1.3

Normalized Tco vs Temp


1.4

Normalized Tsu vs Temp

Normalized Tpd

1.2 1.1 1 0.9 0.8 0.7 -55 -25

Normalized Tco

1.2 1.1 1 0.9 0.8 0.7

Normalized Tsu

PT H->L PT L->H

RISE FALL

1.3 1.2 1.1 1 0.9 0.8 0.7

PT H->L PT L->H

25

50

75

100

125

-55

-25

25

50

75

100

125

-55

-25

25

50

75

100

125

Temperature (deg. C)

Temperature (deg. C)

Temperature (deg. C)

Delta Tpd vs # of Outputs Switching


0 0

Delta Tco vs # of Outputs Switching

Delta Tpd (ns)

-0.5

Delta Tco (ns)

-0.5

-1

-1

RISE
-1.5

RISE
-1.5

FALL
-2 1 2 3 4 5 6 7 8

FALL

-2 1 2 3 4 5 6 7 8

Number of Outputs Switching

Number of Outputs Switching

Delta Tpd vs Output Loading


12 10 12

Delta Tco vs Output Loading

Delta Tpd (ns)

Delta Tco (ns)

RISE FALL

10 8 6 4 2 0 -2

RISE FALL

8 6 4 2 0 -2 0 50

100

150

200

250

300

50

100

150

200

250

300

Output Loading (pF)

Output Loading (pF)

28

1996 Data Book

Specifications GAL16V8
GAL 16V8B-15/-25: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS
Vol vs Iol
2 5 4

Voh vs Ioh
4.25

Voh vs Ioh

1.5

Voh (V)

3 2 1 0

Voh (V)

Vol (V)

3.75

0.5

3.5

0 0.00 20.00 40.00 60.00 80.00 100.00

3.25 10.00 20.00 30.00 40.00 50.00 60.00 0.00 1.00 2.00 3.00 4.00

0.00

Iol (mA)

Ioh(mA)

Ioh(mA)

Normalized Icc vs Vcc


1.20 1.2

Normalized Icc vs Temp


1.40

Normalized Icc vs Freq.

Normalized Icc

Normalized Icc

1.10

1.1

Normalized Icc
-55 -25 0 25 50 75 100 125

1.30 1.20 1.10 1.00 0.90 0.80 0 25 50 75 100

1.00

0.90

0.9

0.80 4.50 4.75 5.00 5.25 5.50

0.8

Supply Voltage (V)

Temperature (deg. C)

Frequency (MHz)

Delta Icc vs Vin (1 input)


12 0 10 20

Input Clamp (Vik)

Delta Icc (mA)

10

6 4 2 0 0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00

Iik (mA)

30 40 50 60 70 80 90 100 -2.00 -1.50 -1.00 -0.50 0.00

Vin (V)

Vik (V)

29

1996 Data Book

Copyright 1996 Lattice Semiconductor Corporation. E2CMOS, GAL, ispGAL, ispLSI, pLSI, pDS, Silicon Forest, UltraMOS, Lattice Logo, L with Lattice Semiconductor Corp. and L (Stylized) are registered trademarks of Lattice Semiconductor Corporation (LSC). The LSC Logo, Generic Array Logic, InSystem Programmability, In-System Programmable, ISP, ispATE, ispCODE, ispDOWNLOAD, ispGDS, ispStarter, ispSTREAM, ispTEST, ispTURBO, Latch-Lock, pDS+, RFT, Total ISP and Twin GLB are trademarks of Lattice Semiconductor Corporation. ISP is a service mark of Lattice Semiconductor Corporation. All brand names or product names mentioned are trademarks or registered trademarks of their respective holders. Lattice Semiconductor Corporation (LSC) products are made under one or more of the following U.S. and international patents: 4,761,768 US, 4,766,569 US, 4,833,646 US, 4,852,044 US, 4,855,954 US, 4,879,688 US, 4,887,239 US, 4,896,296 US, 5,130,574 US, 5,138,198 US, 5,162,679 US, 5,191,243 US, 5,204,556 US, 5,231,315 US, 5,231,316 US, 5,237,218 US, 5,245,226 US, 5,251,169 US, 5,272,666 US, 5,281,906 US, 5,295,095 US, 5,329,179 US, 5,331,590 US, 5,336,951 US, 5,353,246 US, 5,357,156 US, 5,359,573 US, 5,394,033 US, 5,394,037 US, 5,404,055 US, 5,418,390 US, 5,493,205 US, 0194091 EP, 0196771B1 EP, 0267271 EP, 0196771 UK, 0194091 GB, 0196771 WG, P3686070.0-08 WG. LSC does not represent that products described herein are free from patent infringement or from any third-party right. The specifications and information herein are subject to change without notice. Lattice Semiconductor Corporation (LSC) reserves the right to discontinue any product or service without notice and assumes no obligation to correct any errors contained herein or to advise any user of this document of any correction if such be made. LSC recommends its customers obtain the latest version of the relevant information to establish, before ordering, that the information being relied upon is current. LSC warrants performance of its products to current and applicable specifications in accordance with LSCs standard warranty. Testing and other quality control procedures are performed to the extent LSC deems necessary. Specific testing of all parameters of each product is not necessarily performed, unless mandated by government requirements. LSC assumes no liability for applications assistance, customers product design, software performance, or infringements of patents or services arising from the use of the products and services described herein. LSC products are not authorized for use in life-support applications, devices or systems. Inclusion of LSC products in such applications is prohibited. LATTICE SEMICONDUCTOR CORPORATION 5555 Northeast Moore Court Hillsboro, Oregon 97124 U.S.A. Tel.: (503) 681-0118 FAX: (503) 681-3037 http://www.latticesemi.com

November 1996

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