Condition Monitoring CTs, CVTs and LAs

Current Transformer

EHV CURRENT TRANSFORMERS

DEAD TANK
- HAIR PIN DESIGN - EYE BOLT DESIGN

LIVE TANK TYPE

Insulation Grading

Capacitance and Tan Delta Measurement

CTs with Test Tap- Ungrounded Specimen Test mode (UST) CTs without Test Taps Grounded Specimen Test (GST) mode with jumpers disconnected Values to be monitored w.r.t. factory/ pre-commissioning values Sudden change in measured values indicate faster deterioration of insulation. Precautions: P1/P2 to be shorted. Porcelain surface to be thoroughly cleaned. Test Tap to be reconnected to Earth after the Test

Capacitance and Tan Delta Measurement Contd.

Connection of Test Tap to be ensured otherwise it may lead slow arcing in the soldering area and insulation may fail in due course of time. Measurement of Tan Delta of C2 (insulation between last foil on which test tap wire is soldered to the ground) to be carried out. Measurement in GSTg mode with P1/P2 terminal guarded.

EFFECT OF MOISTURE IN PAPER INSULATION

FACTORS AFFECTING TAN DELTA MEASUREMENT

TEMPERATURE

TAN T0 = TanT0 e (T-T0) Where, = Temperature coefficient = (ln TanT - ln TanT0)/ (T - T0)

Recovery Voltage Measurement

2.0kV (d.c.) to be applied between HV and Test Tap for time tc followed by shorting for time td. Then Recovery Voltage to be measured. Time constant to be computed with different readings. Low value of time constant(RC) indicate insulation degradation

Recovery Voltage Measurement

Vdc

Vr

tc

Vr

td Vr

Time

Time

CVT Schematic

Arrester Fundamentals
How the Arrester Operates

Vs = System Overvoltage Ia = Arrester Discharge current Va = Voltage Across Arrester

L = Inductance per unit length C = Capacitance per unit length Zo = Surge Impedance of the system

Arrester Fundamentals
V I Characteristics

Arrester Fundamentals
Minimize all separation distances L1, L2, LA affected the arrester discharge voltage d affects the magnitude and frequency of voltage oscillation at the transformer Protective distance: D = U Up X V 2xs D = Protective distance V = Velocity of propagation of overvoltage wave = 300 mts / micro sec S = FOW steepness of the incident overvoltage in kV/ micro sec

LA

Ageing of Metal Oxide Surge Arresters

Normal Operating Voltage causes ageing of ZnO Blocks Temporary O/V, Switching O/V and Lightning O/V may cause overloading of all or some of the ZnO blocks External Pollution may cause non-linear voltage distribution. Accelerated ageing caused by internal PDs The increase in Resistive Leakage Current may bring the arrester to Thermal instability and complete Arrester Breakdown

Basic Circuit of LCM

Equivalent Circuit of LA

Thank You