Professional Documents
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Content
n State of the art Stress / thickness Service performance Downsizing n Design Temperature Strength Length Ageing n Manufacture Degassing Scorch
Electrical Stresses
8 6 4 2 0 0 2 4 6 8 10 12 14 16 Conductor stress (kV/mm)
Mean & 90% Conf Limits
ICC Fall 2003 Education Session
EHV HV MV
Selected HV Experience
2000
CONDUCTOR SIZE (SQMM)
125
150
175
Thickness (m m )
66
0 1965 1970
110
1975 1980
132
1985
138
1990
154
1995 2000 2005
R e la tiv e V a lu e
WEIGHT
0,9
0,8
HV TECHNOLOGY 6 / 3 kV/mm
0,7 10 12 14 16 18 20 22
Content
n State of the Art Stress / Thickness Service Performance Downsizing
the winner of the 100m should complete the marathon in 1 hour 10 mins
Designing Cables
Edesign =
40 3 * 2.2 *1.1
5.5
= 16mm
Endurance Tests
0,9 Probability of failure 50kV/mm 33kV/mm 0,6
0,3
TYPE TESTS
Time (Hours)
ICC Fall 2003 Education Session
Size
25mm 5mm
Size
25mm
5mm
1000
10000
Content
n State Of The Art Stress / Thickness Service Performance Downsizing n Design Temperature Strength Length Ageing
60 50 40 30 20 10
1,E -02
n Water Barrier Has To Be Effective And Protected n Oversheaths & Jackets Are Important Parts Of The Cable Design
VIRGIN RAMP BREAKDOWN RAMP BREAKDOWN AFTER DRY AGEING RAMP BREAKDOWN AFTER WET AGEING
1,E -01 1,E + 00 1,E + 01 1,E + 02 1,E + 03 1,E + 04 1,E + 05 1,E + 06
TIME (HOURS)
10
0 0 20 40 60 80 100
Overpressure at 90C
4
Overpressure at 23C
0 0 20 40 60 80 100 120 140 160 180 200 Aus g as ung s ko nz e ntratio n de s in Me than in de r Is ppm o lie rung in ppm methane concentration insulation in
ICC Fall 2003 Education Session
20
25
2,5
1,5
0,5
as made
max permitted
long degassing
60
Die
40 T=8C 20
SC=45%
Typical Carrot
0 125 130 135 Temperature [C]
ICC Fall 2003 Education Session
140
Tomorrow
Today
NUMBER AND SIZE IS NOT EVERYTHING! HOW DO WE ALLOW FOR DIFFERENT: MATERIALS SHAPES
10 0
3
STRESS ENHANCEMENT FACTOR 8 6 4 2 0 1
100
Electrical Stresses
8 6 4 2 0 0 5 10 15 20 25 30 35 Conductor stress (kV/mm)
ICC Fall 2003 Education Session
Conclusions
n XLPE HV Cables have come a long way and have some exciting challenges ahead n Much of the technology is well established and known n Challenges for the future
use of proven EHV technology to downsize long lengths increased need
ATTENTION TO DETAIL
RELIABILITY