Design of Low Power TPG Using LP-LFSR

AIM: The main aim of the project is to design and implement Design of Low Power TPG Using LP-LFSR. ABSTRACT: This paper presents a novel test pattern generator which is more suitable for built in self test (BIST) structures used for testing of VLSI circuits. The objective of the BIST is to reduce power dissipation without affecting the fault coverage. The proposed test pattern generator reduces the switching activit among the test patterns at the most. In this approach! the single input change patterns generated b a counter and a gra code generator are "#clusive$%&ed with the seed generated b the low power linear feedbac' shift register (L)*L+S&,. The proposed scheme is evaluated b using! a s nchronous pipelined -#- and .#. Braun arra multipliers. The S stem*%n*/hip (S%/) approach is adopted for implementation on 0ltera +ield )rogrammable 1ate 0rra s (+)10s) based S%/ 'its with 2ios II soft*core processor. +rom the implementation results! it is verified that the testing power for the proposed method is reduced b a significant percentage. Proposed e!"od:

In this paper while implementing the adder we need #or gate . actuall it re3uires 4- transistor5s to implement . 0nd 6*flip flop with onl 7 transistors.we can implement this #or gate with 8 transistors . in this wa we reduce the area! dela ! power consumption
V.Mallikarjuna (Project manager)

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+ig9 Low )ower Test )attern 1enerator

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V.Mallikarjuna (Project manager)

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Mobile No: +91-8297578555. Branch !: "#$ ra%a$ &

 The seed generated from (L)*L+S&) is "#*%&ed with the single input changing se3uences generated from gra code generator! which effectivel reduces the switching activities among the test patterns. The proposed method significantl reduces the power consumption during testing mode with minimum number of switching activities using L)*L+S& in place of conventional L+S& in the circuit used for test pattern generator. The proposed method gives better power reduction compared to the e#iting method. R'F'R'%C'S: BalwinderSingh! 0run 'hosla and Su'hleen Bindra :)ower %ptimi;ation of linear feedbac' shift register(L+S&) for low power BIST< ! =>>? I""" international 0dvance computing conference(I0//) )atiala!India @*A. B.Corian! :0 6istributed BIST control scheme for comple# VLSI devices!< )roc. VLSI Test S mp.! ).-*?. ).1irard!< surve of low*power testing of VLSI circuits!< I""" design and test of computers! Vol. 4?!no.8!)) .>*?>. Dechrdad 2ourani!<Low*transition test pattern generation for BIST* Based 0pplications<! I""" T&02S0/TI%2S %2 /%D)ET"&S! Vol 7A!2o.8. B%B" and Tian*Fang Li!< 0 novel BIST scheme for low power testing!< I""".
V.Mallikarjuna (Project manager) Mobile No: +91-8297578555. Branch !: "#$ ra%a$ &

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