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Warranty: Contact your Micron sales representative for further information regarding the product, including product warranties.
Products and specifications discussed herein are for evaluation and reference purposes only and are subject to change by Micron without notice. Products are only warranted by Micron to meet Microns production data sheet specifications.
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2013 Micron Technology, Inc. All rights reserved.
Preliminary
AT xxx M AM - 1
xx
ES Production Status
Blank = Production ES = Engineering sample
Drive Density
064 = 64GB 128 = 128GB 256 = 256GB
Product Family
AR = P400e
BOM Revision
For example: 1 = 1st generation
Sector Size
1 = 512-byte
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Preliminary
General Description
Microns solid state drive (SSD) uses a single-chip controller with a SATA interface on the system side and n-channels of Micron NAND Flash internally. Packaged in an JEDEC-standard mSATA form factor, the SSD integrates easily in existing storage infrastructures. The SSD is designed to use the SATA interface efficiently during both reads and writes while delivering bandwidth-focused performance. SSD technology enables enhanced boot times, faster application load times, reduced power consumption, and extended reliability. Figure 2: Functional Block Diagram
NAND SATA
SSD controller
NAND NAND
NAND NAND
DRAM buffer
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Preliminary
Physical Configuration
Table 2: mSATA Dimensions and Weight
Value Specification Height Width Length Unit weight Nom 29.85 50.80 Max 3.75 10 Unit mm mm mm g
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Preliminary
Interface Connectors
Figure 3: SSD Interface Connections
Primary side Secondary side
P1
P17 P15
P51
P52
P18 P2 P16
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Preliminary
Performance
Measured performance can vary for a number of reasons. The major factors affecting drive performance are the density of the drive and the interface of the host. Additionally, overall system performance can affect the measured drive performance. When comparing drives, it is recommended that all system variables are the same, and only the drive being tested varies. Performance numbers will vary depending on the host system configuration. Table 4: Drive Performance
Density Interface Speed Sequential read (64KB transfer) Sequential write (64KB transfer) Random read (4KB transfer) Random write (4KB transfer) Random read (8KB transfer) Random write (8KB transfer) READ latency WRITE latency Notes: 64GB 6 Gb/s 440 100 59,000 1,500 22,000 750 1 21 128GB 6 Gb/s 440 170 60,000 2,200 27,000 1,150 0.5 15 256GB 6 Gb/s 440 240 44,700 2,600 31,800 1,450 0.7 12 Unit MB/s MB/s IOPS IOPS IOPS IOPS ms ms
1. Typical I/O performance numbers as measured using Iometer with a queue depth of 32 and write cache enabled. 2. 4KB transfers used for READ/WRITE latency values. 3. System variations may affect measured results.
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Preliminary
Reliability
Microns SSDs incorporate advanced technology for defect and error management. They use various combinations of hardware-based error correction algorithms and firmware-based static and dynamic wear-leveling algorithms. Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is defined as data that is reported as successfully programmed to the SSD but when it is read out of the SSD, the data differs from what was programmed. Table 5: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate <1 sector per 1015 bits read Operation READ
1. The product achieves an MTTF of 1.2 million hours based on population statistics not relevant to individual units.
Endurance
Endurance for the SSD can be predicted based on the usage conditions applied to the device, the internal NAND component cycles, the write amplification factor, and the wear-leveling efficiency of the drive. The table below shows the drive lifetime for each SSD density based on predefined usage conditions. Table 7: Drive Lifetime
Density 64GB 128GB 256GB Note: Drive Lifetime (Total Bytes Written) 72TB 72TB 72TB
1. Access patterns are 50% sequential and 50% random and consist of the following: 5% are 4KB; 5% are 8KB; 10% are 16KB; 10% are 32KB; 35% are 64KB; and 35% are 128KB.
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Preliminary
Electrical Characteristics
Stresses greater than those listed may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Table 8: mSATA Power Consumption
Density All Notes: Idle Average <85 Active Average 160 Sequential Write/Read Maximum (128KB transfer) 4000 2200 Unit mW
1. Data taken at 25C using a 6 Gb/s SATA interface. 2. Sequential power measured in IOMETER MAX with 128KB transfer size.
1. Temperature is best measured with a thermocouple attached to the center point of the drive controller ASIC package. This is the larger package closest to the interface connector on the primary side. Refer to Package Dimensions for details. 2. Supply voltage slew rate during asynchronous power-down should follow a slope of no steeper than 60 mV/ms. 3. Poweroff sequence: When the Micron SSD is shut down, the ATA STANDBY IMMEDIATE (STBI) command should be the last command sent by the host and acknowledged by the SSD. Failure to follow this process could result in a longer than normal time-to-ready (TTR) during the subsequent power-on sequence. TTR is the time from power-on to drive ready to accept SATA commands.
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Preliminary
Device ID
Table 11: Identify Device
See Note 1 for setting definitions Word Bit(s) Setting 0 15 148 7 6 53 2 1 0 1 2 3 4 6 7 9 10 20 23 27 47 158 70 F F F F (O)V ( )X (M)F ( )X (M)F (M)F F F F X F F X V X F Default Value 0b 0000100b 0b 1b 000b 0b 0b 0b 3FFFh C837h 0010h 0000h 0000h 003Fh 0000h 0000h 0000h Varies 0000h 0000h 0000h Varies Varies 80h 10h Description General configuration bit-significant information 0 = ATA device Retired 1 = removable media device Obsolete Retired Response incomplete Retired Reserved Obsolete Specific configuration Obsolete Retired Obsolete Reserved for assignment by the CompactFlash Association Retired Serial number (20 ASCII characters) Retired/obsolete Firmware revision (8 ASCII characters) Model number (40 ASCII characters) 80h 00h = Reserved 01h-FFh = Maximum number of logical sectors that shall be transferred per DRQ data block on READ/WRITE MULTIPLE commands Trusted Computing feature set options Shall be cleared to zero Shall be set to one 1 = Trusted Computing feature set is supported
48
15 14 131 0
F F F F
0b 1b 0b
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Preliminary
0000000000000b Reserved
59
15 14 13 12 119 8 70
F F F F F V V
1 = The BLOCK ERASE EXT command is supported 1 = The OVERWRITE EXT command is supported 1 = The CRYPTO SCRAMBLE EXT command is supported 1 = The Sanitize feature set is supported Reserved 1 = Multiple sector setting is valid xxh = Current setting for number of logical sectors that shall be transferred per DRQ data block on READ/WRITE MULTIPLE commands
60
M(F)
10
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Preliminary
67 68 69
15 14 13 12 11 10 9 8 7 6 5 40
F F F F F F F F F F F F F F F F
0078h 0078h
70
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Preliminary
12
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Preliminary
13
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Preliminary
14
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Preliminary
15
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Preliminary
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Preliminary
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Preliminary
12 11 109
0b 0b
0b
7 6 5 4 3 21
0 94 95 158 70
F V (O)V
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Preliminary
Default Value 0000h 0000h 0000h 0000h 0000h 0008h 0b 1b 0b 0b 00000000b 0000b 0000h 0101b 000000001010b 000001110101b Varies Varies Varies 0000h 0000h 0000h 0000h 0000h 0000h 0000h 0b 1b 00000001b 0b 1b 1b 1b 1b 0b
Description Streaming transfer time DMA Streaming access latency DMA and PIO Streaming performance granularity (98-99) Streaming transfer time PIO Maximum number of 512-byte blocks of LBA range entries per DATA SET MANAGEMENT command Physical sector size/logical sector size Shall be cleared to zero Shall be set to one 1 = Device has multiple logical sectors per physical sector 1 = Device logical sector longer than 256 words Reserved 2^x logical sectors per physical sector Interseek delay for ISO-7779 acoustic testing in microseconds NAA (3-0) IEEE OUI (23-12) IEEE OUI (11-0) Unique ID (35-32) 5-0 unique ID (31-16) Unique ID (15-0) Reserved for 128-bit world wide name extension to 128 bits Reserved for INCITS TR-37-2004 Words per logical sector Commands and feature sets are supported (continued from words 84-82) Shall be cleared to zero Shall be set to one Reserved 1 = Free-fall control feature set is supported 1 = The DOWNLOAD MICROCODE command with mode 3 is supported 1 = READ LOG DMA EXT and WRITE LOG DMA EXT commands are supported 1 = WRITE UNCORRECTABLE EXT command is supported 1 = Write-read-verify feature set is supported Reserved for DDT
(O)V (O)V (O)F V (O)V ( )F F F F F F F (O)F F F (M)F (M)F (O)F (O)V (O)F F F F F F F F F F
Varies by capacity Maximum user LBA for 48-bit address feature set
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Preliminary
121
0000h 0000h 0000h 0000h 0000h 0000h 0000h 0000000b 0b 00b 1b 0b 0b 0b 0b 1b Vendor-specific data 0b 0b 0b 0b 000000000000b
127 128
159 8 76 5 4 3 2 1 0
(O) F V F F V V V V F ( )X F F F V F
Obsolete Security status Reserved Security level 0 = High, 1 = Maximum Reserved 1 = Enhanced security erase is supported 1 = Security count is expired 1 = Security is frozen 1 = Security is locked 1 = Security is enabled 1 = Security is supported Vendor-specific CFA power mode 1 Word 160 is supported Reserved CFA power mode 1 is required for one or more commands implemented by the device CFA power mode 1 is disabled Maximum current in ma
129 160
15 14 13 12 110
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Preliminary
168 169
Reserved Device nominal form factor DATA SET MANAGEMENT command is supported
000000000000000 Reserved b 1b 0000h 0000h 0000h 0000h 0000h 0000h Varies 0000b 000000b 1b 1b 1b 1b 0b 1b 0000h 0000h 0b 1b 1 = The trim bit in the DATA SET MANAGEMENT command is supported Additional product identifier Reserved Current media serial number (60 ASCII characters) SCT command transport Vendor-specific Reserved SCT command transport data tables is supported SCT command transport features control is supported SCT command transport error recovery control is supported SCT command transport write same is supported SCT command transport long sector access is supported SCT command transport is supported Reserved for CE-ATA Alignment of logical blocks within a larger physical block Shall be cleared to zero Shall be set to one
1512 116 5 4 3 2 1 0
207 209
15 14 130
00000000000000b Logical sector offset within the first physical sector where the first logical sector is placed 0000h 0000h 0000h 0001h Write-read-verify sector count mode 3 only Verify sector count mode 2 only
210 212
21
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Preliminary
234
(O)F
Minimum number of 512-byte units per DOWNLOAD MICROCODE command for mode 3
22
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Preliminary
255
158 70 Note:
(M)F
1. F = The content of the word is fixed and does not change. V = The content of the word is variable and may change depending on the state of the device or the commands executed by the device. X = The content of the word may be fixed or variable. R = The content of the word is reserved and will be zero.
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Preliminary
Commands
Table 12: Supported ATA Command Set
See ATA-8 standard for command details Command Name CHECK POWER MODE DEVICE CONFIGURATION RESTORE DEVICE CONFIGURATION FREEZE LOCK DEVICE CONFIGURATION IDENTIFY DEVICE CONFIGURATION SET DOWNLOAD MICROCODE EXECUTE DEVICE DIAGNOSTIC FLUSH CACHE FLUSH CACHE EXT IDENTIFY DEVICE IDLE IDLE IMMEDIATE INITIALIZE DEVICE PARAMETERS NOP READ BUFFER READ DMA (with retry) READ DMA (without retry) READ DMA EXT READ FPDMA QUEUED READ LOG EXT READ MULTIPLE READ MULTIPLE EXT READ NATIVE MAX ADDRESS READ NATIVE MAX ADDRESS EXT READ SECTOR(S) EXT READ SECTOR(S) (with retry) READ SECTOR(S) (without retry) READ VERIFY SECTOR EXT READ VERIFY SECTOR(S) (with retry) SCT WRITE SAME Command Code (hex) 98h or E5h B1h/C1h B1h/C3h B1h/C1h B1h/C3h 92h 90h E7h EAh ECh E3h or 97h E1h or 95h 91h 00h E4h C8h C9h 25h 60h 2Fh C4h 29h F8h 27h 24h 20h 21h 42h 40h 02h/0001h 02h/0002h 02h/0101h 02h/0102h 030h/01h 03h/01h 04h/01h 04h/02h
SCT RETURN ERROR RECOVERY CONTROL SCT SET ERROR RECOVERY CONTROL SCT SET FEATURE CONTROL SCT RETURN FEATURE CONTROL
PDF: 09005aef8516d551 p400e_msata.pdf - Rev. B 11/13 EN
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Preliminary
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Preliminary
Compliance
Micron SSDs comply with the following: RoHS CE (Europe): EN55022, 2006 + A1:2007 and EN55024, 1998 + A1:2001 + A2:2003 FCC: CFR Title 47, Part 15 Class B UL/cUL: approval to UL-60950-1, 2nd Edition, IEC 60950-1:2005 (2nd Edition); Am 1:2009, EN 60950-1 (2006) + A11:2009+ A1:2010 + A12:2011 BSMI (Taiwan): approval to CNS 13438 C-TICK (Australia, New Zealand): approval to AS/NZS CISPR22 KCC RRL (Korea): approval to KCC-REM-MU2-C40018 W.E.E.E.: Compliance with EU WEEE directive 2002/96/EC. Additional obligations may apply to customers who place these products in the markets where WEEE is enforced TUV (Germany): approval to IEC60950/EN60950 VCCI
FCC Rules
This equipment has been tested and found to comply with the limits for a Class A digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference when the equipment is operated in a commercial environment. This equipment generates, uses, and can radiate radio frequency energy and, if not installed and used in accordance with the instruction manual, may cause harmful interference to radio communications. Operation of this equipment in a residential area is likely to cause harmful interference in which case the user will be required to correct the interference at his own expense.
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Preliminary
Package Dimensions
Figure 4: mSATA Package 50.80mm
2.60mm DIA THRU 0.102in (2 PLCS)
3.11mm 0.122in
P1 0.75mm RAD 0.030in 3.75mm 0.148in 5.69mm 0.224in 1.40mm 0.055in 1.00mm 0.039in 1.00mm RAD 0.039in (2 PLCS)
29.85mm 1.175in 2.08mm 0.082in 2.83mm 0.111in 2.75mm 0.108in 5.27mm 0.207in 50.80mm 2.000in
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Preliminary
References
Serial ATA: High-speed serialized AT attachment, Serial ATA working group, available at www.sata-io.org SATA 3.0 GOLD ATA-8 ACS2 JEDEC MO-300B (mSATA SSD Assembly)
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Preliminary
Revision History
Rev. B 11/13
Updated descriptions for bits 1 and 2 for Word 119
Rev. A 07/13
Initial release
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900 www.micron.com/productsupport Customer Comment Line: 800-932-4992 Micron and the Micron logo are trademarks of Micron Technology, Inc. All other trademarks are the property of their respective owners. This data sheet contains initial characterization limits that are subject to change upon full characterization of production devices.
PDF: 09005aef8516d551 p400e_msata.pdf - Rev. B 11/13 EN
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