The morphology of the composite and fractured samples was characterized using Scanning Electron Microscopy (SEM) and

an optical microscope. The SEM is a JEOL 840 A equipped with an EDS or EDX (Energy Dispersive X-Ray Spectroscopy), model Edax Phoenix system (with a "Sapphire "ultra-thin window for light-element analysis) to measure (qualitative and quantitative) the elemental composition

of a sample. SEM is used in this research to produce high resolution, high magnification images of the morphology of the solid surfaces of the specimens. Non-metallic samples conductive by coating with a thin conductive layer of metal (e.g. gold) using a Sputter coating machine. were made electrically

XRD Analysis Figs. 1 (a)(d) show the XRD patterns of the Al-5%SiC composite powders after 5, 10, 15, and 25 h of milling time. There was no formation of any other phase, but the X-ray diffraction patterns display increasing

broadening of the crystalline peaks as a function of milling time. The XRD peaks were analyzed using the WilliamsonHall method [16] and the results are reported in Table 1. Of significance here is that as the milling time was increased, work hardening rate and matrix deformation were enhanced, and so the lattice strain increased and the average size of the aluminum phase crystallites decreased [16, 17]. Table 1 shows that the Al-5%SiC composite powders acquired the smallest crystallite size (45 nm) with the highest lattice strain (0.41%) after 25 h of milling. Furthermore, it is evident that mechanical milling led to a faster rate of change of the average grain size and lattice strain in the early stage of the MA process as compared to the later stages. A slight shift in the position of the

XRD peaks was also noticed and could be related to the dissolution of impurities, mostly iron, in the lattice of the matrix phase [16].

XRD measurements are performed with a Bruker ASX D-8 X-ray diffractometer, which is equipped with a copper target operating at 1.8 kW and graphite-curved single crystal {0002} monochromator to select the CuK radiation at the goniometer receiving slit section. The divergence, antiscattering, and receiving slits were chosen to be 0.5, 0.5, and 0.3 mm, respectively. The diffraction angle (2) is maintained between 10 and 120 during the entire XRD analysis.

4.1 Microstructural examination The chemical compositions of the different phases are investigated through spot and line-scan analysis on energy dispersive X-ray (EDX) detector, attached to the SEM. Figure2ais a SEM image of as-cast 7075 Al alloy, showing uniform distribution of all the elements. EDX spot analysis in Fig. 2bfrom matrix of the 7075 Al alloy has also shown Cu concentration as low as 2.4 wt.%. EDX analysis revealed that these precipitates contained magnesium, zinc, and copper, representative of the equilibrium precipitate. Figure3ais a SEM image of as cast 7075 Al alloy with 10 wt.% SiC (2040m) reinforcements, showing uniform distribution of SiCp. EDX spot analysis of this composite in Fig.3bhas shown that Cu concentration is as low as 1.16 wt.%, which is much less than the bulk. EDX spot analysis also suggests the absence of Al4C3phases. Figure4ashows the 7075 Al alloy with 15 wt.% SiC (2040m) composite under as cast condition with an EDX spectrum. EDX spot analysis of this composite is shown in Fig.4b. It suggests the absence of Al4C3phases. A homogenous microstructure can be observed avoiding particle agglomeration. SEM images of as-cast 7075 Al alloy, 10 and 15 wt.% SiC (2040m) composites in Figs.2, 3and4indicate that all the elements are uniformly distributed in the microstructures. Elemental analysis show that percentage of aluminum is same in chemical and elemental analysis of 7075 Al alloy but amount of Al in AA7075/10 wt.%/SiCp and AA7075/ 15 wt.%/SiCp composites is reduced to 76.67 and 61.10 %, respectively. This is due to the addition of SiCp. Amount of SiCp in AA7075/10 wt.%/SiCp (2040m) has increased to 11.20 % and in AA7075/15 wt.%/SiCp (2040m) composites; it has increased to 16.71 %.

4.4 X-ray diffraction XRD patterns of the 7075 Al alloy, 7075 Al alloy reinforced with 10 and 15 wt.% SiCp are shown in Fig.11. Al peaks and SiC were indexed using JCPDS (numbers 040787and 49-1431, respectively). The XRD pattern confirmed the presence of Al matrix and SiC particulate in the composite. Figure11a, b indicates the XRD analysis of 7075 Al alloy and AA7075/10 wt.%/SiCp (2040m) composite. From Fig.11a, it can be observed that besides Al reflections, there appeared a broad peak at about 2045 and some other weak peaks. The broad peak at about 45 corresponds to GP zones, and other weak peaks whose positions are little lower than those of hexagonalphase are from the metastable hexagonalphase whose lattice parameters are little larger than those of phase [13]. Judging from the relative peak intensities in the XRD pattern, it is concluded that a uniform structure is formed in 7075 Al alloy. In AlSiC composites, a direct reaction between Al and SiC can occur during the fabrication stage forming Al4C3 and Si. 4Al3SiCAl4C33SiThis reaction is known to have undesirable effects on the overall AlSiC composite properties such as: degradation of mechanical properties due to formation of Al4C3, reduction in corrosion resistance in water, methanol, HCl, etc. because of unstable nature of reaction product (Al4C3 ) in such environment and changing the matrix alloy composition by Si released during interfacial reaction. As a result, composite interface plays an important role in determining the resultant composite properties. From Fig.11b, it can be observed that broadening of Alpeak is only marginal. If an amorphous state had existed, it would have broadened the peak to a greater extent than in the present case. One of the main observations of XRD analysis is the absence of peak corresponding to Al4C3.This peak is undesirable due to low strength and brittleness. From Fig.11c, it can be observed that, mainly there are peaks of Al and SiC. There is no peak corresponding to Al4C3. It indicates better distribution of SiC in 7075 Al alloy.

Comparison of Fig.11a, b, and cindicates that elements are properly distributed in 7075 Al alloy and AA7075/ 10 wt.%/SiCp (2040m) and AA7075/15 wt.%/SiCp (2040m) composites. Also, no adverse reactions have been observed in 7075 Al alloy and AA7075/10 wt.%/SiCp (2040m) and AA7075/15 wt.%/SiCp (2040m) composites.

4.1 Hardness Test Various compositions of SiC/AI composite having 5, 10, 15, 20, 25 and 30 % of SiC were produced. The average hardness values of the samples were measured using Brinell Hardness Tester (BHN). The hardness values are given in Table-2 and graphically presented in Figure-2.