Product Specification Secure Digital Card Connector

1. 1.1. SCOPE Content

108-2378
25Nov08 Rev A

This specification covers perform ance, tests and quality requirem ents for the Tyco Electronics Secure Digital Card Connector. 1.2. Qualification W hen tests are perform ed on the subject product line, procedures specified in Figure 1 shall be used. All inspections shall be perform ed using the applicable inspection plan and product drawing. 1.3. Successful qualification testing on the subject product line was com pleted on 04Oct04. The Qualification Test Report num ber for this testing is 501-693. This docum entation is on file at and available from Engineering Practices and Standards (EPS). APPLICABLE DOCUM ENTS The following docum ents form a part of this specification to the extent specified herein. Unless otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the requirem ents of this specification and the product drawing, the product drawing shall take precedence. In the event of conflict between the requirem ents of this specification and the referenced docum ents, this specification shall take precedence. 2.1. Tyco Electronics Docum ent 501-693: Qualification Test Report (Secure Digital Card Connector) 2.2. Industry Docum ent EIA-364: Electrical Connector/Socket Test Procedures Including Environm ental Classifications 2.3. Reference Docum ent 109-197: Test Specification (Tyco Electronics Test Specifications vs EIA and IEC Test Methods) 3. 3.1. REQUIREM ENTS Design and Construction Product shall be of the design, construction and physical dim ensions specified on the applicable product drawing. 3.2. Materials Materials used in the construction of this product shall be as specified on the applicable product drawing.

2.

2008 Tyco Electronics Corporation Harrisburg, PA All International Rights Reserved.

* Trademark | Indicates change

For latest revision, visit our website at www.tycoelectronics.com\documents. For Regional Customer Service, visit our website at www.tycoelectronics.com

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LOC B

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3.3. Ratings ! ! ! 3.4. Voltage: 3.3 volts AC Current: 0.5 ampere m axim um Tem perature: -20 to 85 / C

Perform ance and Test Description Product is designed to m eet the electrical, m echanical and environm ental perform ance requirem ents specified in Figure 1. Unless otherwise specified, all tests shall be perform ed at am bient environm ental conditions.

3.5.

Test Requirem ents and Procedures Sum m ary Test Description Requirem ent Meets requirem ents of product drawing. Meets visual requirem ents. ELECTRICAL Procedure EIA-364-18. Visual and dim ensional (C of C) inspection per product drawing. EIA-364-18. Visual inspection.

Initial exam ination of product.

Final examination of product.

Low Level Contact Resistance (LLCR).

40 m illiohm s m axim um initial. 100 m illiohm s m axim um final.

EIA-364-23. Subject specim ens to 100 m illiam peres m axim um and 20 m illivolts m axim um open circuit voltage. EIA-364-21. 500 volts DC, 2 m inute hold. Test between adjacent contacts.

Insulation resistance.

1000 m egohm s m inim um .

W ithstanding voltage.

One m inute hold with no breakdown EIA-364-20, Condition I. or flashover. 500 volts AC at sea level. Test between adjacent contacts. MECHANICAL

Solderability, dip test. Durability.

Solderable area shall have a m inim um of 95% solder coverage. See Note.

EIA-364-52, Category 3. Subject contacts to solderability. EIA-364-9. Mate and unm ate specim ens for 10,000 cycles at a m axim um rate of 500 cycles per hour. EIA-364-13. Measure force necessary to m ate specim ens at a m axim um rate of 12.7 m m per m inute. EIA-364-13. Measure force necessary to unm ate specim ens at a m axim um rate of 12.7 m m per m inute.

Mating force.

40 N m axim um .

Unm ating force.

1 N m inim um .

Figure 1 (continued)

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Test Description Contact retention force. Requirem ent 3 N m inim um per contact. Procedure EIA-364-13. Measure force necessary to rem ove a contact from the housing.

ENVIRONMENTAL Therm al shock. See Note. EIA-364-32. Subject specim ens to 5 cycles between -55 and 100 / C with 30 m inute dwells at tem perature extrem es and 1 m inute transition between tem peratures. EIA-364-31, Method III. Subject specim ens to 10 cycles (10 days) between 25 and 65 / C at 80 to 100% RH.

Hum idity/tem perature cycling.

See Note.

NOTE

Shall meet visual requirements, show no physical damage, and meet requirements of additional tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure 2. Figure 1 (end)

3.6.

Product Qualification and Requalification Test Sequence Test Group (a) Test or Exam ination 1 2 3 4 5 6 7

Test Sequence (b) Initial examination of product LLCR Insulation resistance W ithstanding voltage Solderability, dip test Durability Mating force Unm ating force Contact retention force Therm al shock Hum idity/tem perature cycling Final exam ination of product NOTE (a) (b) 5 4 3 5 5 4 3 3 3 2 3 2 1 2,4 1 1 2,4 1 2,4 2 3 2 1 1 1

See paragraph 4.1.A. Numbers indicate sequence in which tests are performed. Figure 2

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4. 4.1. QUALITY ASSURANCE PROVISIONS Qualification Testing A. Specim en Selection Specim ens shall be prepared in accordance with applicable Instruction Sheets and shall be selected at random from current production. Each test group shall consist of a m inim um of 4 specim ens. B. Test Sequence Qualification inspection shall be verified by testing specim ens as specified in Figure 2. 4.2. Requalification Testing If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process, product assurance shall coordinate requalification testing, consisting of all or part of the original testing sequence as determ ined by developm ent/product, quality and reliability engineering. 4.3. Acceptance Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. If product failure occurs, corrective action shall be taken and specim ens resubm itted for qualification. Testing to confirm corrective action is required before resubm ittal. 4.4. Quality Conform ance Inspection The applicable quality inspection plan shall specify the sam pling acceptable quality level to be used. Dim ensional and functional requirem ents shall be in accordance with the applicable product drawing and this specification.

Rev A

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