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Roll No
hrs marks'
"
with Rl.u)Explain Bridgman technique of crystal growth with neat diagram .Also compare this method prochralski technique.
.yjwtrutdoyouunderstandbyVaporphaseEpitaxyandMolecularbeamEpitaxy.
i
fc))A v7.2A0onthex_axis.Findthecorrespondinginterceptsontheyandzaxis.
crystal whose primitives aie 1.2A0, 1.8A0 ,and.2.0A0 a plane( 231) cuts an intercepts;at that can be filled by hard sphere in the sc,
'
Q2. a) What do you understand by Liquid phase Epitaxy and Molecular beam Epitaxy. Differentiate & Analyze the performance. b) Write a short note on of hole i) Erregtrve Effective mass ()1 u Semiconductor Dsllltuulluuutur Ex[rrr]srL: Extrinsic & 6a ii) Intrinsic lu lrunnslc iii) Tunneling effect in quantum mechanics A Si crystai is to be grown_ by the Czochralski method and it is desired that the ingot contains c) a) What concentration of phosphorous atoms should the melt contain to give this impugitii concentration in the crystal during the initial growth, for P in Si ku: 6.60 b) If the initial load of Si in the crucible is 8 Kg , how many grams of phosphorous should be added .The atomic weight of phosphorous is 31.
I ,
e3*ffixplain -
the process of lon-Implantation with suitable ciiagranr. Also define the Gaussian fotmulae fo, implanted ciosage and projected range. bwhat are the diffeient .upu.1turr."s formed in p-n junction formation .Derive the formulae for diffusion and transition 6))Boron is alloyed into an n-typ" Si sarnple (lrld:101e cm-31 ,forming an abruptjunction of circular
capacitance
\7"ros
section with a diameter of 0.02 in .Assume that the accepter concentration in the alloyed y',r1n20 rm-3 -o^i^- ic r rq rJ \.Ia: lvBru YYlr lvElvrr Calculate V0, xno, xpo and Ee for this junction at equilibrium (300K) .
I
(+.
1)
Varactor Diode
:
2\/ Tunnel Diode b)bxplain how a p-n junction diode can be used as photodiode for illumination purpose' Also
explain the energy band diagrams giving equation of current. and analyze Zenw and Avalanche breakdo$'n. c) L//xplain
Q*{" a) What
b)
are the different steps of BJT fabrication.Explain in details with suitable diaer;ms. For a Si one sided abrupt junction with Na:lQle cm-3 and No 1016 cm'3 ,Calcutatle tire width of depletion layer and maximum field at zera bias( T:300K )
Q6.a) what do you understand by Ebers- moll model in context to BJT. model with suitable diagram. b) Compare and contrast the construction and
diagrams.
j
for this
W.
*
elB*plain the different steps used in the fabrication of MOS IC. Give the . flecessary detail with suitable diagrams. 7S) Wt at is CCD. Explain the improvements in basic structul.e of CCD.
lasers"
.p) Explain p-n-p-n diode with Two -Transistor topology. c) Write short note on TRAPATT diode.
Roll No.:
(Advance Electronics 31! _Communication) _. Speciatizarion in VLSI D;;;rrt..rv4ar\ First Semester Examinrti*, z'riif _fz
Time:3 hours
9TE: All questions are compulsory
Max marks:100
Ql. Attemptanytwo,
( rcx2)
what concentration of phosphorus atoms should the melt contain to give this impurity concentration in the crystal during the initial growth? Forp in Si, Ko:0.35. II' ifthe initial road of Si in the crucibre is 5
I.
of
phosphorus is 31.
kg, how many grams phosphorus should be added? The atomic weight of
c)
tqz.
and Tunneling.
Attemptanytwo:
with a scaring factor h for direct and indirect electron transitions in semiconductors. b) Derive an expression rerating the intrinsic
(10 x 2)
revel E, to the center of the bandgapEr/2. carculate the dispracement of E, from E/2 for si at 300k, assuming the effective mass values for electrons and holes are l " l m, and 0.56 mo, respectively.
vD014
I
c) Draw
Dirac distribution, and the carrier concentrations for intrinsic, ntype, and p-type semiconductors at thermal equilibrium"
Q3. Attemptanytwo: (10 x 2) a) Derive diffusion equations for electrons and holes for solving transient problems of diffu sion with recombination. b) Briefly explain all the steps folrowed in rhe fabrication of p-n junctions. e) Describe Schottky Barriers and Rectifying Contacts.
(10 x 2)
a) Find the maximum width of the depletion region for an ideal MOS capacitor on p-fype Si with Na : 10'u cm-,. Draw characteristic profile of capacitance voltage relation for an nchannelMOs capacitor. b) Describe I. TheCoupled-DiodeModel' II" Charge ControlAnalysis c) compare the basic semiconductor lasers and hetero-junction
lasers"
Q5.
Attemptanytwo:
chip.
l}x})
b) Draw and explain c-v characteristics of DRAM Mos eapacitor in stored "0" and stored" l " states" c) Briefly Explain I. TheIMPAITDiode trI. The GUNN Diode
III" PackagingforlCs.
VDO14
vDl0l
(Following Paper ID and Roll No. to RolI No.:
b-e
\l\
llolslqlc,
M.Tech.
Examination,20ll-12
Sub: Advanced Computer
Time:3
hours
(10x2:20) Ql. Attemptanytwoofthefollowing a) i) What are the different approaches to solve the mismatch problem
between software and hardware parallelism?
ii) Draw a dependence graph to show all the dependences for the below
givenprogram:
LoadRl,M(100) /Rl+-Memory(100)/
Move R2,
Rl
/IU+- (R1)/
IncRl AddR2,R1
iM<-(Rl)+
1/
b) i) What do you mean by k-issue processor? Define the term MIPS rate. Differentiate among UMA, NUMA and COMA computers? ii) Explain node duplication scheduling to eliminate the
communication delays between processors with an example. c) Explain Flynn's classification of computer architecture in detail.
Q2"
Attemptanytwoofthefottowing.
a) Differentiate between characteristics
(10x2:20)
CISC
architectures.
controlled unit works to enhance the performance ofprocessors. b) Differentiate between omega and baseline networks? Also design a two stage 64x64 butterfly switch network built with sixteen 8x8 crossbar switches and eight way shuffle inter-stage connection. c) What are the characteristics ofvector and symbolic processor? Explain.
VDlO1
Q3. Attempt any two of the following. (10 x 2=20) a) Consider the tlve stage pipelined processor specified by follcwing reservation table.
I
SI
s2 s3
S4
x
,
x
6
x
x
x x
S5
For above ,list the set of forbid<len latencies and collision vector and draw the state diagram showing; all possible initial sequences(cycles) without causing collision in a pipeline. a) i) Differentiate among direct mapping, associative mapping and kway set associative mapping with reference to cache addressing. ii) Explain in short the static arithmetic pipelines.
b)
instructions. Assume that hit takes r clock cycre and miss penalty is I 00 clock cycles. A road and store (data) hit takes I extra clock cycle on unified cache. carcurate the average memory access time for sprit. memory and unifiedmemoryanrl compare them.
which has the rower miss rate: a 16 KB instruction cache with r6KB data cache or a32KB unified cache? The miss per 1000 instructions r6 KB instruction cache is 3.g2, data cache is 40.9 and for 32 KB unified cache is 43-3 are given. Assuin: -z6ok of rnstr-;ctions are de.ta transfer
Q4.
a) what is Multiprocessor cache crherence? Discuss the directory based cache coherence protocols in sht.,rt.
goxz:Zo)
b) Discuss MSI, MESI and MOESI cache coherence protocors in short with their state transition diagrarn. c) Explain in short about the symmetric shared memory architectures and distributed memory shared memory architectures.
(5x4:20)
b. Domain partitioning c. Enterprise RAS feafures set. d. Memory mirroring / migration e. Fault tolerant system
vD101
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,--ffiat g*p la in the bas ic transport proces s e s atlcl *=-6l^ ,rr.l.^.""n fLtm tire 1;lot o1' 1/Cr versus V. What
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does thil
vD-102
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V11p:3.3V. V;.11.11:0.6V. V.;s.p:-0.7V. k,,:200liA/Vl, l<.,.,:Bt)ptA/Vl. Calculate the noise ntargins of the circnit. lbJExplain the C-'omp lerlen taLy-pass-transistor lo gic ( C'pL). , .{c)Dr:srgn CUOS D latcli. Q6(a)Calculate Vrrr., Vorr,
[rpCo*: 201s,AlY', Vpp 5V. (blCorrsi,{e-r, thq r.irnr.ir. i" +l:: ' quu {,:,':.:^*^*'-;^'-:-"ii'r,r irguu.Ui slti_)wll Delow.
Vn, V111, n'M; uncl NN411 tbr a tr,vo input NOR gate fabricated r.vith CMOS technology. Given, 1W/L;,,=4. (WL),,=1, V1.p:0.7V, V1.p: - 0.7V. LrnCn*: 40 pAiV3"
logic ftlnetion f. (ii) Design a circnit to implement the sarne ftinction using NOR gates and AND-OR-Invert gate. Draw the transistor level
(U Uetefmine tlfe
schematic also.
*L
B
the ROM and RAM cells clesign. lQ7(ffixptain -fli)Explain the CMOS SRAM cell rvor&ing rvith neat sketch. Also give cEll clesign strategy.
t'i
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(iii)
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vD-2.02
\ \
M. Tech.
(Second Semester) (Regular) Examinatio n,
20ll-lz
Time:
HoursJ
Note
l0x2:24
?
Derive an
A 16-bit bus is used to derive the load of l0 pF/bit. Each bit has 40% switching probability at each clock cycle. The supply voltage is 3.3V and its clock rate is
I
(b)
(i)
Explainbriefly.
(ii)
There
pseudo-NMoS row decoder and PMoS pull ups on 32-bit line. The w/L ratio
,1
ofbit line
(1)
are on at any
time
P.
T. O.
(c)
(i)
from pou'er dissipation Define hierarchy of limits upon scaling that arises
consideration. Explain circuit limit in detail'
(i
i)
How
dosupplyvoltageandthresholdvoltageaffecttheperformanceofanyCMOS
device ?
2.
AttemPtanYtwoofthefollowing:
L0x2-20
(a)
(i) (ii)
at switch
and
(b) (i)
frequency.Characterizetherandomsignalshownbelowandcalculatethe
frequencY'
Time
lnr)
(iil
usingit?
to calculate static probability of Boolean Use the Shanuon Decomposition technique
(c)
and
3.
0x2:20
How the transistor sizing is opiimir"ri to reduce the dynamic and leakage
pou,er at circuit-level design 'l
(b) (i)
What do you understand by local restructuring of gates ? What are the basic
steps of local transformation to the network ?
(i,
(c) (i)
will
(ii) 4"
'
l0x2:20
What do you understand by power and performance management ? Explain with the help ofexample.
What are the two popular techniques used for microprocessor design at
architecture level to save the dynamic power ?
(b)
flow graph (CDFG) for the loop Unroll the loop once and explain how power can be
saved by unrolling the loop.
(c)
(3)
5.
lAxZ
(a)
to any condition maxQt)<tr, and max(d,.- d.r)<tb, where d;an d d, arcphase delays from
sink Points
(b) . (c)
'
..
Explainthgpowersavingtechniquesforbuses:
(4)
200
M.Tech.(VLSI)
Tirne: 3 HosysJ Note: Aftcmpt all questions:
E 1!sz3e oo&
0
vD_202
{Total tutarks; t 00
l.
Attempt.arry TWO questions from the following: a?' are the sources-of power ciissipurto,i,n / fo' power cMos circuits? Derive ,n. "what computation in cMoS circuits. A o+ "orutillf:'o' off-chip bus is operating at j v and 66 'it'IHz clock rate is driving u .upu.itun'e 1i1 of IOpF/bit.Each bit is estimated ro have a clock cvcte. carcurate rr," po*", Jissipation in the bus. y'.tossl;firTr::HY.$l: design? Give an overview of ernerging trends in lowei power design uoo.ou"onlrlower c' Discuss the positive and.negative impact of reducing gate oxide thickness, device vortage scaring and..ou.ine iortug" swing on power dissipation in :r,;t'$'jfir,ir:rd
i'"*n
o=ro, / ". suitabte o,fdata il;;;;"";erization in porver anarysis? *ltn ,ui,,ry::::jf l,_T,lTi*. exampre, exprain how dara , coneration can efrectiv;iil:H#lt"ilill*"rr,
/b' y'
approach) over simuration based moders estimation can be done using entropy? Jro* ry:.r Write a short note on _ Ir{onte Carlo simulation.
what are the advantages of estimating power dissipation using simuration techrriques such as SPICE? what is'the main disadvantage of gate lever porver anarysis? What are the merits and demerits.f transiticn ri*:rs!? n:,rde! ;.r_rr-._r-i!:_.i
;ffi;ilffi;#
and P(c) are the input static probabilities ., olcerrain 1ogic circuit. trind the output static probabirity ofy: rb * c by using Sftannon,s dccornposition theoreni.
lf
P(a)'P(b)
(5x4:20) what are glitches? trhat impact cro they rrave on power consunrption? wrriti are techniqrres adopted to minimizc effect orr,igt capacitance nodes in lorv porver vLSI design?
rb: How logic encoding can help in power manageme,t? Ilrustrate rvith suitai-.re cxanrpre. c'lDiscuss thc significance of bt,s invert
d'
encoding in power manage,".ent. Discuss the translormarions irtvolved in irnplemeniing gu," rcorga,izatio. .uld iocal restructuring f,or power notc on anv ONE-
e. Write short
l+
,/1iil
*t V
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is
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(Following Paper ID and Ro.ll No. to be filled in yourAnswer Book) Roll No.:
i)
li
'l
'Note:
Hours
Question I is compulsory. Attempt 5 questions in all.
'-
6IThe chip size of a CPU is 15mm * 25mm with clock frequency of 300MHz operating at 3.3V. The length of the clock routing is
estimated to be twice the circumfereuce of the chip. What is the power dissipation of the clock signal if the clock signal is routed on a metal layer with width
p
Q
(4) Iayeris lffium2. po\l'er in the Gate ievei components Grve a brief description of tirree (4) logic simulaiion
Compute the transition density and static probability tbr y : ab + c given that P(a) :0.2, P(b) :0.3, P(c):0.4, D(a) : l, D(b) :2, D(c)
-J.
(4)
Compare the power dissipation in a Uniprocessor system to that in Parallel processing systems and pipelined
systems.
(4)
Question 2 threshold -a)'What are the impacts of varying gate oxide thickness, voltage and voltage swing otr th,: p61v"t dissipation in CMOS
( 10)
Question3
Q,xplain Dual Bit Type signal model. Derive the expression of power
dissipation for the Datapath module
characterization.
(10)
the
QHow
/O"nr" thc terms'static Probability' and'Trans:ti on Density'. Discuss -\ the propatlation of Static Probability and Transition Derrsity in the
Iogic circuit.
(10)
b) How does the entropy of the system affbcts ihe power dissipation of
the system. Derive the po.ver expression to support the explanation.
Que,rtron
t_
(10)
5
./nlrExOlain
'
t'
.lrci;iis.
t
u)
\ t What are the various logir" encoding schemes. I-rcscribe the power managcrnent plocess in Sti:te Machine E,ncoding. ( l0)
Question6
b) Explain the working of Arlay Multiplier and state its shortcomings. How"Wallace Tree Multiplier' leads to low power desigrs. ( 1 0)
Question
7
a) What is the significance af Tolerable skew? l)erive the value of tolerable skew in order i; overcome Double-clocking and Zeroclocking condition.
Vector Quantization proce:rs.
(10)
( 10)
vD
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VDO34
parts from Note: Attempt any two parts from section I-IV and four tionV.
Section-I
of rl,.{Vhat do you mean by quanhrm confinement? calculate density (10) -6ates for 3D, 2D and lb iYstem. .Considerametalnanoparticleofsizel0nmxl0nmxl0nm.
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Fermi energy is 10 eV. Calculate (a) Density of electrons n? (10) "fotal numbJiof electrons N on the particle? &) ^ + +l.o of gap 1I/!:e facio;s band tile which affeci J. YV ildl Gi! ^-.. lrr! lqlrvrJ
semiconductor?
(10)
Section-II
( l0) -Importanc" of l"sotrrtlon in opiical lithography? . VlExotain deep ultra-violetiithography and also explain the factors
v,aefini
technique in 1. What is chemical beam epitaxy (cBE). Discuss this matching lattice why explain Atso detaitwith its merits and demerits. (10) duririg epitaxial growth is the explain and lithography with rti general processing steps
important?
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(10)
Section-III
Derive
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(lo) l.zWhatareCarbonNano.tubes?Writedowntwomethodsof
I
apd height
or ine banier in
rectangular potential
vD034
iiection-IV Effect Quantum Dot (FEQD) and Strain Induced Quantum Dots
Field 1. What do you mean by quantum dot? Differentiate between
(10)
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me,iicinet
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liection-V
Explain briefly the immersion lithography? 2. Write a short note on PA(i. 3. What is scattering or beam proximity effect? 4. Write a short note on SCALPEL. 5. Define dePhasing? \lfi,lrite a short note on SET.
VDO34