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GENERAL DESCRIPTION
The ADXL103/ADXL203 are high precision, low power, complete single and dual axis accelerometers with signal conditioned voltage outputs, all on a single monolithic IC. The ADXL103/ADXL203 measures acceleration with a full-scale range of 1.7 g . The ADXL103/ADXL203 can measure both dynamic acceleration (e.g., vibration) and static acceleration (e.g., gravity). The typical noise floor is 110 g/Hz, allowing signals below 1 mg (0.06 of inclination) to be resolved in tilt sensing applications using narrow bandwidths (<60 Hz). The user selects the bandwidth of the accelerometer using capacitors CX and CY at the XOUT and YOUT pins. Bandwidths of 0.5 Hz to 2.5 kHz may be selected to suit the application. The ADXL103 and ADXL203 are available in 5 mm 5 mm 2 mm, 8-pad hermetic LCC packages.
APPLICATIONS
Vehicle Dynamic Control (VDC)/Electronic Stability Program (ESP) systems Electronic chassis control Electronic braking Platform stabilization/leveling Navigation Alarms and motion detectors. High accuracy, 2-axis tilt sensing
ADXL103
CDC SENSOR RFILT 32k COM ST XOUT CX COM AC AMP OUTPUT AMP CDC
ADXL203
AC AMP SENSOR RFILT 32k ST RFILT 32k YOUT CY XOUT CX
03757-0-001
DEMOD
DEMOD
OUTPUT AMP
OUTPUT AMP
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 2004 Analog Devices, Inc. All rights reserved.
REVISION HISTORY
Revision 0: Initial Version
Rev. 0 | Page 2 of 12
ADXL103/ADXL203 SPECIFICATIONS
Table 1. TA = 40C to +125C, VS = 5 V, CX = CY = 0.1 F, Acceleration = 0 g, unless otherwise noted.
Parameter SENSOR INPUT Measurement Range1 Nonlinearity Package Alignment Error Alignment Error (ADXL203) Cross Axis Sensitivity SENSITIVITY (Ratiometric)2 Sensitivity at XOUT, YOUT Sensitivity Change due to Temperature3 ZERO g BIAS LEVEL (Ratiometric) 0 g Voltage at XOUT, YOUT Initial 0 g Output Deviation from Ideal 0 g Offset vs. Temperature NOISE PERFORMANCE Output Noise Noise Density FREQUENCY RESPONSE4 CX, CY Range5 RFILT Tolerance Sensor Resonant Frequency SELF TEST6 Logic Input Low Logic Input High ST Input Resistance to Ground Output Change at XOUT, YOUT OUTPUT AMPLIFIER Output Swing Low Output Swing High POWER SUPPLY Operating Voltage Range Quiescent Supply Current Turn-On Time7 Conditions Each Axis % of Full Scale X Sensor to Y Sensor Each Axis VS = 5 V VS = 5 V Each Axis VS = 5 V VS = 5 V, 25C Min 1.7 0.5 1 0.1 2 940 1000 0.3 2.5 25 0.1 1 110 0.002 24 2.5 Typ Max Unit g % Degrees Degrees % mV/g % V mg mg/C mV rms g/Hz rms F k kHz V V k mV V V 6 1.1 V mA ms
5 1060
2.4
2.6
32 5.5
10 40
1100
1 2 3
Guaranteed by measurement of initial offset and sensitivity. Sensitivity is essentially ratiometric to VS. For VS = 4.75 V to 5.25 V, sensitivity is 186 mV/V/g to 215 mV/V/g. Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature. 4 Actual frequency response controlled by user-supplied external capacitor (CX, CY). 5 Bandwidth = 1/(2 32 k C). For CX, CY = 0.002 F, Bandwidth = 2500 Hz. For CX, CY = 10 F, Bandwidth = 0.5 Hz. Minimum/maximum values are not tested. 6 Self-test response changes cubically with VS. 7 Larger values of CX, CY will increase turn-on time. Turn-on time is approximately 160 CX or CY + 4 ms, where CX, CY are in F.
All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
Rev. 0 | Page 3 of 12
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
TP RAMP-UP
tP
CRITICAL ZONE TL TO TP
TEMPERATURE
TL
TSMAX TSMIN
tL
tS
PREHEAT
t25C TO PEAK
TIME
Profile Feature Average Ramp Rate (TL to TP) Preheat Minimum Temperature (TSMIN) Minimum Temperature (TSMAX)
Condition Sn63/Pb37 Pb Free 3C/second Max 100C 150C 60120 seconds 150C 200C 60150 seconds
Time (TSMIN to TSMAX) (tS) TSMAX to TL Ramp-Up Rate Time Maintained above Liquidous (TL) Liquidous Temperature (TL)
Time (tL) Peak Temperature (TP) Time within 5C of Actual Peak Temperature (tP) Ramp-Down Rate Time 25C to Peak Temperature
240C +0C/5C 260C +0C/5C 1030 seconds 2040 seconds 6C/second Max 6 minutes Max 8 minutes Max
Rev. 0 | Page 4 of 12
03757-0-002
RAMP-DOWN
10
15
20
25
30
0.95 0.60 0.50 0.40 0.30 0.20 0.10 0 0 0.02 0.04 0.06 0.08 0.10
03757-0-011 03757-0-010
0.96
0.80 0.70
0.97
0.98
0.99
mg/C
VOLTS/g
1.01
1.02
1.03
1.04
1.05
1.06
03757-0-012
Rev. 0 | Page 5 of 12
PERCENT OF POPULATION (%)
0 5 0 35 40 10 15 20 25
10
15
0.94 0.70 0.60 0.50 0.40 0.30 0.20 0.10 0 0.10 0.20 0.30 0.40 0.50 0.60 0.70 0.80
03757-0-014
0.95
0.96
0.80
0.97
0.98
0.99
mg/C
VOLTS/g
1.00
1.01
1.02
1.03
1.04
1.05
1.06
ADXL103/ADXL203
03757-0-015
ADXL103/ADXL203
2.60 2.58 2.56 2.54 2.52 2.50 2.48 2.46 2.44
03757-0-004
1.03
1.02
SENSITIVITY (V/g)
1.01
VOLTAGE (1V/g)
1.00
0.99
2.42
10 20 30 40 50 60 70 80 40 30 20 10 90 100 110 120 50
130
10
20
30
40
50
60
70
80
40
30
20
50
10
90
100
110
120
TEMPERATURE (C)
TEMPERATURE (C)
40 35 30 25 20 15 10 5 0 60 70 80 90 100 110 120 130 X AXIS NOISE DENSITY (g/Hz) 140 150
03757-0-007
30 25 20 15 10
03757-0-005
30 25 20 15 10 5 0
03757-0-006
5 0
1.0
2.0
3.0
4.0
5.0
1.0
2.0
3.0
4.0
4.0
3.0
1.0
4.0
3.0
5.0
2.0
5.0
Rev. 0 | Page 6 of 12
2.0
1.0
5.0
130
2.40
0.97
03757-0-016
0.98
ADXL103/ADXL203
0.9 100 90 0.8 VS = 5V 0.7
CURRENT (mA) PERCENT OF POPULATION (%)
5V
80 70 60 50 40 30 20 10
1000 0.95 1.00
03757-0-009
03757-0-019 03757-0-018
3V
0.6
0.5 VS = 3V
03757-0-020
0.4
200
300
400
500
600
700
800
50 TEMPERATURE (C)
100
150
35 30 25 20 15 10 5
0.40 0.45 0.50 0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00
03757-0-017
0.55
0.55
VOLTS
VOLTS
10
20
30
40
50
60
70
80
50
40
30
20
10
90
100
110
120
TEMPERATURE (C)
130
Rev. 0 | Page 7 of 12
900
0.3 50
EARTH'S SURFACE
The ADXL103/ADXL203 are complete acceleration measurement systems on a single monolithic IC. The ADXL103 is a single axis accelerometer, while the ADXL203 is a dual axis accelerometer. Both parts contain a polysilicon surfacemicromachined sensor and signal conditioning circuitry to implement an open-loop acceleration measurement architecture. The output signals are analog voltages proportional to acceleration. The ADXL103/ADXL203 are capable of measuring both positive and negative accelerations to at least 1.7 g. The accelerometer can measure static acceleration forces such as gravity, allowing it to be used as a tilt sensor. The sensor is a surface-micromachined polysilicon structure built on top of the silicon wafer. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against acceleration forces. Deflection of the structure is measured using a differential capacitor that consists of independent fixed plates and plates attached to the moving mass. The fixed plates are driven by 180 out-of-phase square waves. Acceleration will deflect the beam and unbalance the differential capacitor, resulting in an output square wave whose amplitude is proportional to acceleration. Phase sensitive demodulation techniques are then used to rectify the signal and determine the direction of the acceleration.
The output of the demodulator is amplified and brought offchip through a 32 k resistor. At this point, the user can set the signal bandwidth of the device by adding a capacitor. This filtering improves measurement resolution and helps prevent aliasing.
PERFORMANCE
Rather than using additional temperature compensation circuitry, innovative design techniques have been used to ensure high performance is built in. As a result, there is essentially no quantization error or non-monotonic behavior, and temperature hysteresis is very low (typically less than 10 mg over the 40C to +125C temperature range). Figure 9 shows the zero g output performance of eight parts (X and Y axis) over a 40C to +125C temperature range. Figure 12 demonstrates the typical sensitivity shift over temperature for VS = 5 V. Sensitivity stability is optimized for VS = 5 V, but is still very good over the specified range; it is typically better than 1% over temperature at VS = 3 V.
Rev. 0 | Page 8 of 12
03757-0-021
ADXL103/ADXL203 APPLICATIONS
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 F capacitor, CDC, will adequately decouple the accelerometer from noise on the power supply. However in some cases, particularly where noise is present at the 140 kHz internal clock frequency (or any harmonic thereof), noise on the supply may cause interference on the ADXL103/ADXL203 output. If additional decoupling is needed, a 100 (or smaller) resistor or ferrite beads may be inserted in the supply line of the ADXL103/ADXL203. Additionally, a larger bulk bypass capacitor (in the 1 F to 22 F range) may be added in parallel to CDC.
Often, the peak value of the noise is desired. Peak-to-peak noise can only be estimated by statistical methods. Table 5 is useful for estimating the probabilities of exceeding various peak values, given the rms value. Table 5. Estimation of Peak-to-Peak Noise
Peak-to-Peak Value 2 RMS 4 RMS 6 RMS 8 RMS % of Time That Noise Will Exceed Nominal Peak-to-Peak Value 32 4.6 0.27 0.006
SELF TEST
The ST pin controls the self-test feature. When this pin is set to VS, an electrostatic force is exerted on the beam of the accelerometer. The resulting movement of the beam allows the user to test if the accelerometer is functional. The typical change in output will be 750 mg (corresponding to 750 mV). This pin may be left open-circuit or connected to common in normal use. The ST pin should never be exposed to voltage greater than VS + 0.3 V. If the system design is such that this condition cannot be guaranteed (i.e., multiple supply voltages present), a low VF clamping diode between ST and VS is recommended.
Rev. 0 | Page 9 of 12
ADXL103/ADXL203
Peak-to-peak noise values give the best estimate of the uncertainty in a single measurement. Table 6 gives the typical noise output of the ADXL103/ADXL203 for various CX and CY values. Table 6. Filter Capacitor Selection (CX, CY)
Bandwidth(Hz) 10 50 100 500 CX, CY (F) 0.47 0.1 0.047 0.01 RMS Noise (mg) 0.4 1.0 1.4 3.1 Peak-to-Peak Noise Estimate (mg) 2.6 6 8.4 18.7
Rev. 0 | Page 10 of 12
ADXL203E
TOP VIEW (Not to Scale) VS
8
ST 1 DNC 2 COM 3
4
7 6 5
ST 1 DNC 2 COM 3
4
7 6 5
DNC
DNC
Rev. 0 | Page 11 of 12
1.27
7 1
0.64 2.50
0.38 DIAMETER
BOTTOM VIEW
Figure 24. 8-Terminal Ceramic Leadless Chip Carrier [LCC] (E-8) Dimensions shown in millimeters
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ORDERING GUIDE
ADXL103/ADXL203 Products ADXL103CE1 ADXL103CEREEL1 ADXL203CE1 ADXL203CEREEL1 ADXL203EB Evaluation Board Number of Axes 1 1 2 2 Specified Voltage (V) 5 5 5 5 Temperature Range 40C to +125C 40C to +125C 40C to +125C 40C to +125C Package Description 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier Evaluation Board Package Option E-8 E-8 E-8 E-8
2004 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D0375704/04(0)
Rev. 0 | Page 12 of 12