Nk2he552 L130 Ce

EMC Test Report
Reference No.:NK2HE552
EMC Test Report

EMC Test Report
Project Reference No. Product Model Tested according to NK2HE552 Multi-User Computing Access Terminal L130 EN 55022:2006 (Class B) EN 55024:1998+A1:2001+A2:2003 EN 61000-3-2:2000+A2:2005 EN 61000-3-3:1995+A1:2001+A2:2005
Tested in period Issued date Name and address of the Test House
July 16, 2007 to August 06, 2007 August 14, 2007 300-2, Osan-Ri, Mohyun-Myun, Cheoin-Gu, Yongin-Si, Gyeonggi-Do, Korea Phone : +82 31 322 2333 Fax : +82 31 322 2332
Tested by
Jae-rak, Choi date
Verified by
Hyun-ho, Kim date
This form is only for use by Nemko Korea, or by others according to special agreement with Nemko Korea. The report may be reproduced in full. Partial reproduction may only be made with the written content of Nemko Korea. This report apply only to the sample(s) tested. It is the manufacturers responsibility to assure the additional production units of this product are manufactured with identical electrical and mechanical components. The manufacturer is responsible to the Competent Authorities in Europe for any modifications made to the product which results in non-compliance to the relevant regulation.
NComputing Co., Ltd. L130
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EMC Test Report

Contents of This Report

1. CLIENT INFORMATION
1.1 Applicant 1.2 Manufacturer 1.3 Factory 1.4 Other Information
4
4 4 4 4
2.
EQUIPMNET UNDER TEST(EUT)

2.1 Identification of EUT 2.2 Variants Covered By This Report 2.3 Modifications 2.4 Additional Information Related to Testing 2.5 Picture Documentation
5
5 5 5 5 5
3.
GENERAL TEST CONDITIONS

3.1 Location 3.2 Operating Environment 3.3 Operating During Test 3.4 Test Equipment 3.5 EUT & Support Equipment 3.6 Connection Cable 3.7 Test Set-up Drawing
6
6 6 6 6 7 7 8
4.
EVALUATION OF PERFORMANCE
4.1 Functions Monitored During Immunity Tests 4.2 Function Tested After Immunity Tests 4.3 Performance Criteria 4.4 Measurement Uncertainty 4.5 Final Decision
9
9 9 9 9 9
5.
STANDARDS, DEVIATIONS AND RESULTS

5.1 Applied Test Standards 5.2 Deviations And Evaluations
10
10 10
6.
CONDUCTED DISTURBANCE AT THE MAINS PORT

6.1 Test Procedure 6.2 Measurement Uncertainty 6.3 Test Parameters 6.4 Test Data
11
11 11 11 11
7.
CONDUCTED DISTURBANCE AT THE TELECOMUNICATION PORT

14
14 14 14 14
8.
RADIATED DISTURBANCE
16
16 16 16 17
9.
ELECTROSTATIC DISCHARGES
9.1 Test Procedure 9.2 Test Parameters 9.3 Test Log NComputing Co., Ltd. L130
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18 18 19 Page 2 of 38
EMC Test Report

10.
RADIATED ELECTROMAGNETIC FIELD

10.1 Test Procedure 10.2 Test Parameters 10.3 Test Log
20
20 20 20
11.
FAST TRANSIENTS/BURST
21
21 21 21
12.
SURGE PULSE
22
22 22 22
13.
IMMUNITY TO CONDUCTED DISTURBANCES

23
23 23 23
14.
VOLTAGE DIPS AND INTERRUPTIONS

14.1 Test Procedure 14.2 Test Parameters 14.3 Dips/Interruptions Test Log
24
24 24 24
15.
FLUCTUATING HARMONICS
15.1 Test Procedure 15.2 Test Parameters 15.3 Fluctuating Harmonics, Graphic Presentation
25
25 25 25
16.
FLICKER
16.1 Test Procedure 16.2 Test Parameters 16.3 Flicker Probability, Graphic Presentation
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28 28 28
APPENDIX A PHOTOGRAPHS OF TEST APPENDIX B PHOTOGRAPHS OF EUT
32 38
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EMC Test Report

1. Client Information
1.1 Applicant
Company Name: Company Address: NComputing Co., Ltd. 2nd Fl, Daeyoung Bldg, 1423-6, Gwanyang1-Dong, Dongan-Gu, Anyang-City, Gyeonggi-Do, Korea Phone/Fax: Contact Name: + 82 31 422 5138 / + 82 31 422 5158 Mr. Thomas Lee
1.2 Manufacturer
Company Name: Company Address: NComputing Co., Ltd. 2nd Fl, Daeyoung Bldg, 1423-6, Gwanyang1-Dong, Dongan-Gu, Anyang-City, Gyeonggi-Do, Korea
1.3 Factory
Company Name: Company Address: NComputing Co., Ltd. 2nd Fl, Daeyoung Bldg, 1423-6, Gwanyang1-Dong, Dongan-Gu, Anyang-City, Gyeonggi-Do, Korea
1.4 Other Information

No Comment
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EMC Test Report

2. Equipment Under Test (EUT)

2.1 Identification of EUT
Category : Model Name : Serial Number : Voltage : Multi-User Computing Access Terminal L130 N/A Input : 100-250 V~, 50-60 Hz, 0.3 A Output : +5 Vdc, 2.0 A In/Out Port : Remark: LAN, PS/2 x 2 EA (Mouse, Keyboard), Audio out, Video
2.2 Variants Covered By This Report

Model Name N/A Technical Deviations From Reference Model N/A
2.3 Modifications
No modifications.
2.4 Additional Information Related To Testing

No comment.
2.5 Picture Documentation

Pictures can be found in Appendix B.
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EMC Test Report

3. General Test Conditions

3.1 Location
NEMKO KOREA 300-2, Osan-Ri, Mohyun-Myun, Cheoin-Gu, Yongin-Si, Gyeonggi-Do, Korea Phone : + 82 31 322 2333 Fax : + 82 31 322 2332
3.2 Operating Environment

All tests and measurements were performed in a shielded enclosure or a controlled environment suitable for the tests conducted. The climatic conditions in the test area are automatically controlled and recorded continuously. Parameters Recording during test Accepted deviation Ambient temperature 25.1 15 - 35 Relative humidity 46.0 % 30 - 60 % Atmospheric pressure 99.4 kPa 86 - 106 kPa
3.3 Operating During Test

The System of the host PC was located at outside of the shield room and connected to EUT via 3 m unshielded RJ 45 cable then the test was performed during accessing the resources of host PC system continuously.
3.4 Test Equipment

The test equipment used in testing are calibrated on a regular basis. For most of the testing equipment accredited calibration is conducted once a year. For certain equipment the calibration interval is longer. Between the calibrations all test equipment are controlled and verified on a regular basis. The test equipments used are defined in each test section of this report.
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EMC Test Report

3.5 EUT & Support Equipment

Equipment Multi-User Computing Access Terminal (EUT) Adaptor Monitor Keyboard PS/2 Mouse Headset Host Computer Monitor Keyboard PS/2 Mouse HUB Adaptor Manufacturer NComputing Co., Ltd. Wendeng Jeil electronics TIANJIN SAMSUNG ELECTRONICS DISPLAY Sejin Electronics Co., Ltd. Logitech Sound King Corp. Dell ASIA PACIFIC SDN. SAMSUNG HEWLETT PACKARD COMPANY. Logitech 3COM Ault Inc. Model L130 JPW146CA0500N01 BR20BS 104-DYW10-100 M-S34 MS-691 WHL (PRECISION 530) PN21MS SK-2502C M-S48a Dual Speed Switch 16 7900-000-046-1.00 Serial Number N/A N/A N667HVZLC00868W 333-001-0111 N/A N/A N/A N/A C0012069513 HCA11800561 N/A 0100/7RFF018307
3.6 Connection Cable

Connection of EUT Video Audio Out LAN PS/2 PS/2 DC In Connection Terminal Monitor Headset HUB Keyboard Mouse Adaptor Cable Data 1.5 m length, Shielded 2.0 m length, Unshielded 3.0 m length, Unshielded 1.5 m length, Shielded 1.5 m length, Shielded 1.2 m length, Unshielded
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EMC Test Report

3.7 Test Set-up Drawing
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EMC Test Report

4. Evaluation Of Performance
4.1 Functions Monitored During Immunity Tests
In order to verify acceptable performance by the EUT during the applied tests, the following functions were monitored: No interruptions of display and operating
4.2 Function Tested After Immunity Tests

The following function tests were conducted to verify correct performance by the EUT before and after each test: Performance of EUT according to the manufacturer specifications
4.3 Performance Criterias

Criteria A During and after the test, the EUT shall operate without: - Error rate beyond the figure defined by the manufacturer - Requests for retry beyond the figure defined by the manufacturer - Speed of data transmission rate beyond the figure defined by the manufacturer - Protocol failure - Loss of link Criteria B Error rate, request for retry and speed of data transmission rate may be degraded during the application of the test. Degradation of the performance as described in criterion A is permitted provided that the normal operation of the EUT is self-recoverable to the condition immediately before the application of the test. In these cases, operator response is permitted to re-initiate an operation. Criteria C Degradation of the performance as described in criteria A and B is permitted provided that the normal operation of the EUT is self-recoverable to the condition immediately before the application of the test or can be restored after the test by the operator.
4.4 Measurement Uncertainty

Measurement uncertainty is calibrated in accordance with : EMCIT document 93/30 NAMAS Information Sheet NIS81,Ed.1 May 1994 (The treatment of uncertainties in EMC measurement). The measurement uncertainty is not considered when deciding PASS or FAIL against the limit lines. This means that shared risk (according to NAMAS publication NIS81 4.2) is used as option Criterion. The argument for using this method, is that it is commonly accepted that the EMC limits have already taken common good laboratory practice.
4.5 Final Decision

The equipment under test complies to all requirements of the applied test standards. NComputing Co., Ltd. L130 Page 9 of 38
EMC Test Report

5. Standards, Deviations And Results

5.1 Applied Test Standards
The following standards have been applied: EN 55022:2006 (Class B) : Limits and methods of measurement of radio disturbance characteristics of information technology Equipment. Phenomena Basic Standards Result Conducted Disturbance at the mains ports EN 55022:2006 Pass Conducted Disturbance at the EN 55022:2006 Pass telecommunication ports Radiated Disturbance EN 55022:2006 Pass EN 55024:1998+A1:2001+A2:2003: Information technology equipment- Immunity characteristics limits and methods of measurement Phenomena Basic Standards Result Electrostatic Discharge EN 61000-4-2:1995+A1:1998+A2:2001 Pass Electromagnetic Field EN 61000-4-3:2002+A1:2002 Pass Electric Fast Transients/Burst EN 61000-4-4:2004 Pass Surge EN 61000-4-5:1995+A1:2001 Pass Immunity to Conducted Disturbances EN 61000-4-6:1996+A1:2001 Pass 50Hz Magnetic Field EN 61000-4-8:1993+A1:2001 N/A Dips/Interruptions EN 61000-4-11:2004 Pass EN 61000-3-2:2000+A2:2005: Electromagnetic compatibility(EMC)-Pt.3: Limits-S.2: Limits for harmonic-current emissions (equipment input current up to and including 16A) Phenomena Basic Standards Result Steady State Harmonics EN 61000-3-2:2000+A2:2005 N/A Fluctuating Harmonics EN 61000-3-2:2000+A2:2005 Pass EN 61000-3-3:1995+A1:2001+A2:2005: Electromagnetic compatibility(EMC)-Pt.3: Limits-S.3: Limits for voltage fluctuations and flicker in low voltage supply systems for equipment with rated current up to and including 16A. Phenomena Basic Standards Result Flicker EN 61000-3-3:1995+A1:2001+A2:2005 Pass Voltage Fluctuations EN 61000-3-3:1995+A1:2001+A2:2005 N/A
5.2 Deviations And Evaluations

No recorded deviations to the applied standards. No general evaluations made.
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EMC Test Report

6. Conducted Disturbance at the Mains Port

6.1 Test Procedure
The measurements were performed in a shielded enclosure. EUT was connected to an Artificial Mains Network(AMN). EUT was placed on a wooden table 0.8 m above the grounded floor and at least 0.4 m from the reference ground plane(wall), EUT was placed at least 0.8 m from, and connected via a 1 m mains cable, to the AMN. The measurements on the terminals for mains connection were conducted between neutral and ground, and between phase and ground, in the frequency range 150 kHz to 30 MHz. A peak detector scan was conducted over the defined frequency range on all phases. A comparison of the results obtained from the different phases was then conducted to find the most emitting phase for each frequency. This Worst Case scan with quasi-peak detector & average detector was presented detector. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration Test Receiver Rohde & Schwarz ESCS30 100302 2007.12 LISN Rohde & Schwarz ESH3-Z5 833874/006 2007.11 LISN Kyoritsu KNW-407 8-1034-10 2008.03

Conducted Disturbance measurement : 2.37 dB (CL is 95 %, k = 2)
6.3 Test Parameters

Port: Test Standard: Frequency Range: 150 kHz 30 MHz AC Mains Test Engineer: EN 55022:2006 (Class B) Frequency Step: IF Bandwidth: 5 kHz 9 kHz Jae-rak, Choi Measurement Time: 0.2 s
6.4 Test Data

Frequency (MHz) *) Level(dB) Q-Peak Average **) Line Limit(dB) Q-Peak Average Margin(dB) Q-Peak Average
0.26 0.39 0.47 1.10 1.95 2.50
39.9 42.4 43.7 38.4 37.3 40.3
35.7 35.5 35.4 30.0 30.7 31.5
N N N L L N
61.4 58.1 56.5 56.0 56.0 56.0
51.4 48.1 46.5 46.0 46.0 46.0
21.5 15.7 12.8 17.6 18.7 15.7
15.7 12.6 11.1 16.0 15.3 14.5
*) Correction factor was included to Test Level (dBuV) **) LINE : L=Line, N=Neutral Comment If no frequencies are specified in the tables, no measurement for quasi-peak or average was necessary. Result Compliant NComputing Co., Ltd. L130 Page 11 of 38
EMC Test Report

Conducted Disturbance at the mains ports Spectrum (Line)
Tested by : Jae-rak, Choi NComputing Co., Ltd. L130 Page 12 of 38
EMC Test Report

Conducted Disturbance at the mains ports Spectrum (Neutral)
EMC Test Report

7. Conducted Disturbance at the telecommunication port 7.1 Test Procedure

The measurements were performed in a shielded enclosure. The EUT was connected to AC 230 V, 50 Hz main power source. The telecommunication port of an EUT was connected to a ISN described in CISPR 22:2005. EUT was placed on a wooden table 0.8 m above the grounded floor and at least 0.4 m from the reference ground plane (wall), EUT was placed at least 0.8 m from ISN. The measurement at telecommunication port was conducted in the frequency range 150 kHz to 30 MHz. A peak detector scan was conducted over the defined frequency range. This Worst Case scan with quasi-peak detector & average detector was presented detector. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration Test Receiver Rohde & Schwarz ESCS30 100302 2007.12 LISN Rohde & Schwarz ESH3-Z5 833874/006 2007.11 LISN Kyoritsu KNW-407 8-1034-10 2008.03 Impedance TESEQ GMBH ISN T4 24330 2008.05 Stabilization Network

Conducted Disturbance Telecommunication measurement : 2.33 dB (CL is 95 %, k = 2)
7.3 Test Parameters

Port: Test Standard: Frequency Range: 150 kHz 30 MHz Ethernet port Test Engineer: EN 55022:2006 (Class B) Frequency Step: IF Bandwidth: 5 kHz 9 kHz Jae-rak, Choi Measurement Time: 0.2 s
7.4 Test Data

Frequency (MHz) *) Level(dB ) Q-Peak Average Limit(dB ) Q-Peak Average Margin(dB) Q-Peak Average
0.82 5.91 8.33 13.41 23.12 26.60
53.9 48.7 55.9 53.7 57.1 56.2
48.3 44.2 47.2 52.0 56.2 55.8
74.0 74.0 74.0 74.0 74.0 74.0
64.0 64.0 64.0 64.0 64.0 64.0
20.1 25.3 18.1 20.3 16.9 17.8
15.7 19.8 16.8 12.0 7.8 8.2
*) Correction factor was included to test level (dBuV) Comment If no frequencies are specified in the tables, no measurement for quasi-peak or average was necessary. Result Compliant
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EMC Test Report

Conducted Disturbance at the telecommunication ports Spectrum
EMC Test Report

8. Radiated Disturbance 8.1 Test Procedure

A pretest was performed at 3 m distance in an anechoic screened enclosure, scanning the frequency range, and locating any frequencies at the which EUT radiates. EUT was positioned on a wooden table 0.8 m above the floor, at the edge of the turntable. Frequency scans were conducted with a peak detector with horizontal and vertical polarization of the antenna. Measurements were done in the frequency range 30 MHz -1000 MHz. The main test was then conducted by measurements at each frequency found in the pretest. These measurements were done at an open area test site at 10 m distance, with a quasi-peak detector. EUT was placed on a wooden table 0.8 m above the ground plane, at the edge of the turntable. Cables connected to EUT were fixed to cause maximum emission. A maximum emitting point for each frequency was found by turning EUT 0-360 , and adjust the antenna height between 1-4 m. A quasi-peak detector measurement was then done at the maximum emitting point. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration Test Receiver Rohde & Schwarz ESCS30 833364/020 2008.08 Amplifier HP 8447F 2805A03351 2007.10 Trilog-Broadband Schwarzbeck VULB 9168 9168-257 2008.03 Antenna Dail EMC Position Controller N/A N/A N/A Engineering Dail EMC Turntable N/A N/A N/A Engineering

Radiated disturbance measurement : 3.78 dB (300 MHz), - 3.90 and + 3.93 dB (300 MHz) (CL is 95 %, k = 2)
8.3 Test Parameters

Port: Basic Standard: Test Distance: Measurement Time: Enclosure EN 55022:2006 (Class B) 10 m 0.2 s Test Engineer: Frequency Range: IF Bandwidth: Jae-rak, Choi 30 MHz 1 GHz 120 kHz
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EMC Test Report

8.4 Test Data

Frequency (MHz) 80.00 239.99 290.89 309.10 399.99 624.99 Pol* (H/V) H V V V H H Reading (dB/m) 44.8 41.6 39.9 39.4 40.6 34.4 AF+CL+Amp (dB)** -16.5 -11.6 -9.8 -9.4 -7.8 -2.6 Result (dB/m) 28.3 30.0 30.1 30.0 32.8 31.8 Limit (dB/m) 30.0 37.0 37.0 37.0 37.0 37.0 Margin (dB) 1.7 7.0 6.9 7.0 4.2 5.2
*) Ant. + C. L + Amp = Antenna Factor + Cable Loss + Amplifier Comment If no frequencies are specified in the tables, no measurement for quasi-peak was necessary. Result Compliant
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EMC Test Report

9. Electrostatic Discharges
9.1 Test Procedure
A ground reference plane was located on the floor, and connected to earth via a low impedance connection. The return cable of the ESD generator was connected to the reference plane. In case of a floor standing equipment, EUT was placed on the reference plane on 10 cm of insulating support. In case of table-top equipment, EUT was placed on a wooden table 0.8 m above the reference plane. A horizontal coupling plane(HCP) of 1.6*0.8 m was placed on the table, and connected to the reference plane via a cable with a 470 resistor located in each end(0.5 mm insulating support between EUT and HCP). In both cases a vertical coupling plane (VCP) of 0.5*0.5 m was located 10 cm from the EUTs sides. The VCP was connected to the reference plane in the same matter as the HCP. The test was done by applying contact and air discharges to the EUT itself, and contact discharges to the HCP and VCP. When applying the discharges to the HCP, the tip of the generator was located at the front edge of each HCP opposite the center point of the EUT, at 10 cm distance. When applying the discharges to the VCP the tip of the generator was located at the middle edge of the VCP. The VCP was located 10 cm from each side of the EUT. Contact discharges up to 4 kV were applied to various points of the EUT at conductive surfaces, and to the HCP/VCP. Air discharges up to 8 kV were applied to various points of the EUT at non-conductive surfaces. Ungrounded equipment, or ungrounded part(s) of equipment, cannot discharge itself similarly to class I mains-supplied equipment. If the charge is not removed before the next ESD pulse is applied, it is possible that the EUT or part(s) of the EUT be stressed up to twice the intended test voltage. Therefore, double-insulated equipment could be charged at an unrealistically high charge, by accumulating several ESD discharges on the capacitance of the class II insulation, and then discharge at the breakdown voltage of the insulation with a much higher energy. In the case of class II & III equipment. To avoid of unrealistical high charge, it is possible to ionize using ionizer before each discharge. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration ESD Simulator Noiseken ESS-2000 0199C02406 2007.12 Discharge Gun Noiseken TC-815P 1199C02485 2007.12
9.2 Test Parameters

Port: Basic Standard: Performance Criteria: Test Level Enclosure Test Engineer: EN 61000-4-2:1995+A1:1998+A2:2001 B Performance Results : Air Discharge: 8 kV Contact Discharge: 4 kV Jae-rak, Choi A
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EMC Test Report

9.3 Test Log

Point HCP, VCP LAN Enclosure LED PS/2 Audio Out DC In D-Sub Buttons Adaptor Voltage 4 kV 4 kV 8 kV 8 kV 8 kV 8 kV 8 kV 8 kV 8 kV 8 kV Coupling Contact Discharge Contact Discharge Air Discharge Air Discharge Air Discharge Air Discharge Air Discharge Air Discharge Air Discharge Air Discharge Result (Pass/Fail) Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass
Comment/Performance No operation errors were detected during or after the discharges. Result Compliant
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EMC Test Report

10. Radiated Electromagnetic Field

10.1 Test Procedure
The tests were performed at 3 m distance in an anechoic chamber. For floor-standing equipment, the EUT was mounted a non-conducting support 0.1 m above the supporting plane. For tabletop equipment, the EUT was located on a wooden table 0.8 m above the floor. The EUT was exposed to the field from different angles, normally 0 , 90 , 180 , 270 and at both horizontal and vertical polarization (antenna height 1.75 m) A signal level of 3 V/m, 80 % AM modulated with a 1 kHz sine wave was applied in the frequency range 80 1000 MHz. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration Signal Generator R&S SMY01 830766/032 2008.03 Power Amplifier Noiseken NA25MF1G2010C A00518 2007.10 Power Sensor HP 8482A US37293322 2008.03 Power Sensor HP 8482A US37293323 2008.03 Power Meter HP E4419B GB39511164 2008.03 Biconical log ARA LPB-2520/A 1180 2008.02 Antenna Position Controller Seo-Young EMC N/A N/A N/A Turntable Seo-Young EMC N/A N/A N/A
10.2 Test Parameters

Port: Basic Standard: Performance Criteria: Dwell Time: Frequency Step: Frequency Range: Enclosure Test Engineer: EN 61000-4-3:2002+A1:2002 A Performance Results : 3s Modulation: 1% Test Level: 80-1000 MHz Jae-rak, Choi A 80 %AM(1 kHz) 3 V/m
10.3 Test Log

Frequency Range (MHz) 80-1000 80-1000 80-1000 80-1000 80-1000 80-1000 80-1000 80-1000 Position (Angle) Front Rear Right Left Front Rear Right Left Polarity (H or V) H H H H V V V V Field Strength (V/m) 3 3 3 3 3 3 3 3 Modulation 80 % AM (1 kHz) 80 % AM (1 kHz) 80 % AM (1 kHz) 80 % AM (1 kHz) 80 % AM (1 kHz) 80 % AM (1 kHz) 80 % AM (1 kHz) 80 % AM (1 kHz) Result (Pass/Fail) Pass Pass Pass Pass Pass Pass Pass Pass
Comment/Performance No operation errors were detected during or after the exposures. Result Compliant
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EMC Test Report

11. Fast Transients/Burst

11.1 Test Procedure
The minimum area of the ground reference plane is 1 m x 1 m, and connected to earth via a low impedance connection. The EFT/Burst generator was located on the ground reference plane. The EUT was located 0.1 m above the ground reference plane. The minimum distance between the EUT and all other conductive structures, except the ground reference plane is more than 0.5 m. The test voltage was applied simultaneously between each of the power supply conductors and the protective earth at the power supply. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration EFT/Burst Simulator Noiseken 2007.12 FNS-AXB50 0199B01147 Capacitive Clamp Noiseken 2007.12 FNS-AXB50 N/A

Port: Basic Standard: Duration: Test Data Performance Criteria: AC Mains, LAN EN 61000-4-4:2004 120 s Tr/Th 5/50 ns B Test Engineer: Jae-rak, Choi
Fburst 5 kHz Trep Performance Results : A
300 ms
11. 3 Test Log

Line L1-L2 LAN Voltage 1 kV 0.5 kV Coupling Direct Clamp Inject Time (sec) 120 120 Result (Pass/Fail) Pass Pass
Comment/Performance No operation errors were detected after the fast transients. Result Compliant
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EMC Test Report

12. Surge Pulse

12.1 Test Procedure
The surge generator was connected to earth via a low impedance connection. No presents of an earth/reference plane is necessary. The surge test is only applicable to AC mains. The surges were applied between neutral and ground, between each phase and ground and between the phases. For each level/line the surges were applied at steped phase angles, usually with 90 steps. The differential mode surges were applied at 1 kV line-line and line-neutral. The surges were applied with 1min intervals. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration Surge Simulator Noiseken LSS-6030 9099E00349 2007.12

Port: Basic Standard: Test Data Performance Criteria: AC Mains Jae-rak, Choi Test Engineer: EN 61000-4-5:1995:A1:2001 Line to Neutral, Neutral to Line B Performance Results : A
12.3 Test Log

Line N-L L-N Voltage 1 kV 1 kV Coupling Direct Direct Phase 0 ~ 360 / 90 step 0 ~ 360 / 90 step Inject (count) 5 5 Result (Pass/Fail) Pass Pass
Comment/Performance No operation errors were detected after the surges. Result Compliant
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EMC Test Report

13. Immunity to Conducted Disturbances

13.1 Test Procedure
The tests were performed on a 2*2 meter ground reference plane. The EUT was located on a 10 cm isolating support. The current was injected to each single port separately. For AC ports, DC ports, coax lines and 2- or 4 lines balanced communication lines a coupling/decoupling network was used to inject. On other multiple signal cables a capacitive coupling clamp (EM Clamp) was used for injection. Each signal level of 3 V, 80 % AM modulated with a 1 kHz sine wave was applied in the frequency range 150 kHz 80 MHz. Instrumentation used during this session: Instruments Manufacturer Model Serial number Due to Calibration Signal Generator R&S SMY01 830766/032 2008.03 Power Amplifier Noiseken NA15K80M50C A00518 2007.10 Power Amplifier Noiseken NA25MF1G2010C A00518 2007.10 Power Sensor HP 8482A U537293323 2008.03 Power Sensor HP 8482A US37293322 2008.03 Power Meter HP E4419B GB39511164 2008.03 CDN FCC NCDN-M3-16A 2021 2008.05 CDN FCC NCDN-M2-16A 2012 2008.05 CDN FCC NCDN-T4 2020 2008.05

Port: Basic Standard: Frequency Step: Frequency Range: Test Level: Performance Criteria: AC Main, LAN Test Engineer: EN 61000-4-6:1996+A1:2001 1% 0.15-80 MHz Dwell Time: 3 V EMF Modulation: A Performance Results : Jae-rak, Choi
3s 80 % AM (1 kHz) A
13.3 Test Log

Frequency (MHz) 0.15-80 0.15-80 Field Strength (EMF) 3V 3V Result (Pass/Fail) Pass Pass
Point AC Main Power LAN Port
Coupling CDN CDN
Modulation 80 % AM (1 kHz) 80 % AM (1 kHz)
Comment/Performance No operation errors were detected during or after the injection. Result Compliant
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EMC Test Report

14. Voltage Dips and Interruption

14.1 Test Procedure
The dips/interruption test is only applicable to AC mains. The dips/interruptions were applied at zero Crossing. The presence of a reference plane and the configuration of EUT are not critical for this test. The dips were applied with > 95 % dip and a 30 % dip. EUT was given a 10 s interval between each dip to recover. 3 dips were applied at each phase angle step. The interruptions are > 95 % dip-type. EUT was given a 10 s interval between each interruption to recover. 3 interruptions were applied at each phase angle step. Instrumentation used during this session: Instruments Manufacture Model Serial number Due to Calibration Profline 2100 Schaffner Profline2115-400 35000361 2008.01

AC Mains EN 61000-4-11:2004 Voltage Reduction 30 % (dropout) Test Level: > 95 % (dropout) > 95 % (interruption) Performance Results : A, A, C Port: Basic Standard: Test Engineer: Duration 25 period 0.5 period 250 period Jae-rak, Choi Performance Criteria C B C
14.3 Test Log

Voltage Dip/Int. %UT 30 % > 95% > 95% Duration Period of the rated frequency 25 period 0.5 period 250 period Phase () 0 0 0 Count 3T 3T 3T Result (Pass/Fail) Pass Pass Pass
Comment/Performance During the interruption, a power of EUT was turned off. But after the interruption, the EUT was recovered by operators intervention. Result Compliant
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EMC Test Report

15. Fluctuating Harmonics

15.1 Test Procedure
EUT was connected to the Power Analyzer system. Measurements were conducted on all active phases, for harmonics 1-40 th of the mains frequency (50 Hz). A pure AC mains was supplied to the system from two power supply units. The units supply an AC mains, free of harmonics or distortion of any kind. An overview of the harmonic emission is presented as numerics and as graphics. Instrumentation used during this session: Instruments Manufacture Model Serial number Due to Calibration PM6000 Universal Voltech PM6000 100006700119 2008.02 Power Analyzer

Port: Basic Standard: AC Mains EN 61000-3-2:2000+A2:2005 Test Engineer: Class: Jae-rak, Choi A
15.3 Fluctuating Harmonics, Graphic Presentation

Measurement results can be found in the following pages. Comment The following pages inform the harmonic current emissions. Result Compliant
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EMC Test Report

Fluctuating Harmonics, Graphic Presentation
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EMC Test Report

EMC Test Report

16. Flicker
16.1 Test Procedure
EUT was connected to the Power Analyzer system. Measurements were conducted to obtain the desired flicker parameters. The measuring time depends on which parameters are to be measured: 2 hours for Long Time Flicker assessment (Plt) 10 minutes for Short Time Flicker assessment (Pst) 1-10 minutes for Dmax, Dc and Dt assessment (depending on EUT switch-rate) A pure AC mains was supplied to the system from two power supply units. The units supply an AC mains, free of harmonics, fluctuations or distortion of any kind. A defined impedance was located between the supply unit and the EUT. A measurement table and a graphic presentation of the Worst Case probability function of Short Time Flicker during this session(if measured) are presented in the report. For voltage changes caused by manual switching, equipment is deemed to comply without further testing if the maximum r.m.s. input current (including inrush current) evaluated over each 10 ms half-period between zero-crossings does not exceed 20 A, and the supply current after inrush is within a variation band of 1.5 A. If measurement methods are used, the maximum relative voltage change dmax caused by manual switching. The final test result shall be calculated by deleting the highest and lowest results and take the arithmetical average of the remaining 22 values. Instrumentation used during this session: Instruments Manufacture Model Serial number Due to Calibration PM6000 Universal Voltech PM6000 100006700119 2008.02 Power Analyzer Profline 2100 Schaffner Profline2115-400 35000361 2008.01

Port: Basic Standard: Measured: AC Mains Test Engineer: EN 61000-3-3:1995+A1:2001 Dmax Dc Dt Pst Jae-rak, Choi Plt InRush
16.3 Flicker Probability, Graphic Presentation

Measurement results can be found in the following page. Result Compliant
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EMC Test Report

Flicker Probability, Graphic Presentation
EMC Test Report

Flicker Probability, Graphic Presentation (InRush)
EMC Test Report

Appendixes
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EMC Test Report

Appendix A Photographs of Test

1. Conducted Disturbance at the mains ports
[Front]
[Rear]
NComputing Co., Ltd. L130 Page 32 of 38
EMC Test Report

2. Radiated Disturbance
[Front]
[Rear]
EMC Test Report

3. Electrostatic Discharge Immunity
4. Radiated, Radio-frequency, Electromagnetic Field Immunity
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EMC Test Report

5. Fast Transients/Burst
6. Surge Pulse
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EMC Test Report

7. Immunity to Conducted Disturbances
8. Voltage Dips and Interruption
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EMC Test Report

9. Fluctuating Harmonics and Flicker
[Harmonics & Flicker]
[Inrush]
EMC Test Report

Appendix B Photographs of EUT

1. Front View of Product
2. Rear View of Product
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EMC Test Report

EMC Test Report

NComputing Co., Ltd. L130

EMC Test Report

Contents of This Report

EQUIPMNET UNDER TEST(EUT)

GENERAL TEST CONDITIONS

STANDARDS, DEVIATIONS AND RESULTS

CONDUCTED DISTURBANCE AT THE MAINS PORT

CONDUCTED DISTURBANCE AT THE TELECOMUNICATION PORT

EMC Test Report

RADIATED ELECTROMAGNETIC FIELD

IMMUNITY TO CONDUCTED DISTURBANCES

VOLTAGE DIPS AND INTERRUPTIONS

APPENDIX A PHOTOGRAPHS OF TEST APPENDIX B PHOTOGRAPHS OF EUT

NComputing Co., Ltd. L130

EMC Test Report

1.4 Other Information

NComputing Co., Ltd. L130

EMC Test Report

2. Equipment Under Test (EUT)

2.2 Variants Covered By This Report

2.4 Additional Information Related To Testing

2.5 Picture Documentation

NComputing Co., Ltd. L130

EMC Test Report

3. General Test Conditions

3.2 Operating Environment

3.3 Operating During Test

3.4 Test Equipment

NComputing Co., Ltd. L130

EMC Test Report

3.5 EUT & Support Equipment

3.6 Connection Cable

NComputing Co., Ltd. L130

EMC Test Report

3.7 Test Set-up Drawing

NComputing Co., Ltd. L130

EMC Test Report

4.2 Function Tested After Immunity Tests

4.3 Performance Criterias

4.4 Measurement Uncertainty

4.5 Final Decision

EMC Test Report

5. Standards, Deviations And Results

5.2 Deviations And Evaluations

NComputing Co., Ltd. L130

EMC Test Report

6. Conducted Disturbance at the Mains Port

6.2 Measurement Uncertainty

6.3 Test Parameters

6.4 Test Data

0.26 0.39 0.47 1.10 1.95 2.50

39.9 42.4 43.7 38.4 37.3 40.3

35.7 35.5 35.4 30.0 30.7 31.5

61.4 58.1 56.5 56.0 56.0 56.0

51.4 48.1 46.5 46.0 46.0 46.0

21.5 15.7 12.8 17.6 18.7 15.7

15.7 12.6 11.1 16.0 15.3 14.5

EMC Test Report

Conducted Disturbance at the mains ports Spectrum (Line)

Tested by : Jae-rak, Choi NComputing Co., Ltd. L130 Page 12 of 38