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Experimental Mechanics
Scanning Electron Microscope
Lab Report


2/26/2014
By :Jaymin Patel





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Introduction:
In many cases of testing or study of material we cannot analyze the material by normal
eye vision or microscope beyond some scope. SEM is one of the instrument to analyze
the things which are of nano scale.

About SEM:
A Scanning Electron Microscope (SEM) is a tool for seeing otherwise invisible worlds of
microspace and nanospace). By using a focused beam of electrons, the SEM reveals
levels of detail and complexity inaccessible by light microscopy.
Principle:
The SEM uses a beam of high energy electrons generated by an electron gun, processed
by magnetic lenses, focused at the specimen surface and systematically scanned
(rastered) across the surface of a specimen.
SEMs can magnify an object from about 10 times up to 10,000 times. As the conventional
microscope, the electrons in a SEM never form a real image of the sample. The SEM image is an
electronic image. It is a result of the beam probe illuminating the sample one point at a time, with
the strength of the signal generated from each point being a reflection of differences (e.g.
topographical or compositional) in the sample.
One of the benefit of SEM image is the height of a specimen that appears in focus in an image
This means that great topographical detail can be obtained by For many users, the three
dimensional appearance of the specimen image, is the most valuable feature of the SEM. This is
because such images, even at low magnifications, can provide much more information about a
specimen than is available using the LM. The use of "stereo pair" SEM images can give even
greater information about the sample.
Chamber is being evacuated all the air because electron beam can be disturbed by atom of the air
and get scattered so vacuum equipments are also use for this machine.

SEM Parts :
The typical scanning electron microscope laboratory contains a machine with three components:


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1. the microscope column, including the electron gun at the top, the column, down which
the electron beam travels, and the sample chamber at the base
2. the computer that drives the microscope, with the additional bench controls
3. ancillary equipment that, for example, analyses composition. This will be explored in the
module on microanalysis rather than here under SEM.

FIGURE: SEM parts
Electron gun Generates beam of the electron. Many times it is made of tungsten metal.
Electron column
Magnetic lens is to concentrate or direct/deflect the electron beam. A simple glass or plastic lens can be
used to deflect the beam because different material will cause deflection but it is not
used because this materials will stop the electrons and electrons will be charged on it. A
coil is used for this purpose. By passing current through coil we can create magnetic
field around it and we can deflect the electron beam.
Detector detects the electrons reflects from the test specimen. According to the electron reflects from
specimen image is generated.
Water chilling system is to cool and maintain temperature of the whole machine.
Specimen chamber is places because while working we need vacuum so this part is used for that.
Main control panel controls the parameters of electric voltage and current.


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Operation unit from which operator operates and get images of the specimen
Test Sample Preparation:
To test any specimen in SEM we have to prepare that sample first. Same is made clean
first which part is to be analyzed. If sample is metal then one need not to worry but if it is
biological or non-conductive material then it is to be coated from any metal or carbon
spray first because this material will not conduct the electrons and there will be
accumulation of the charge on the surface and then electrons will not able to penetrate the
surface and we will not get image of the specimen.
For different material different potential difference is kept. Here for Aluminum we have
kept 10Kv. For non conductive material it can be less than that. How we increase the
potential difference we can get deeper image of the specimen because electrons will
penetrate more with that.


Aluminum End piece Image From SEM
Above Image is taken in the lab of Aluminum end bar piece. In image Red marked part is
zoomed in and is shown in all images. All shining lines are grain boundaries. This grain


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boundaries are shining more because they reflects more electrons then other parts. From this
images we can predict fracture and crack in the material.