NPTEL Syllabus

Materials
Characterization - Video
course
COURSE OUTLINE

Scope of optical metallographic studies:
Image formation, resolving power, numerical
aperture, empty magnification, depth of focus,
components of microscopes, important lens
defects and their correction, principles of phase
contrast, interference and polarized light
microscopy, elements of quantitative
metallography and image processing, sample
preparation techniques.
X Ray diffraction and their applications:
Production and properties of X-ray, absorption
of X-rays and filters, X-ray - diffraction
directions, diffraction methods. X-ray -
diffraction intensities, factors affecting intensity,
structure factor calculations for simple, body
centered, face centered, diamond cubic and
h e x a g o n a l crystal structures. Working
principles of diffractometer, counters and
cameras. Indexing of XRD patterns. Precise
lattice parameter determination, Chemical
analysis by X-ray diffraction & fluorescence,
determination of particle size and micro/macro
strains.
Studies by electron microscopes:
Construction and working principles of
transmission el ectron microscopes. Image
formation, resolving power, magnification,
depth of focus, elementary treatment of image
contrasts, important lens defects and their
correction. Bright field and dark field images.
Stereographic projection and their applications.
Formation of selected area diffraction patterns,
reciprocal lattice and Ewald sphere
construction, indexing of diffraction patterns,
sample preparation techniques. Scanning
electron microscope; construction, interaction
of electrons with matter, modes of operation,
i ma g e formation of plane and fractured
surfaces. Chemical analysis using electron
NPTEL
http://nptel.iitm.ac.in
Metallurgy and Material
Science

Pre-requisites:
Materials Science or Materials
Engineering
Additional Reading:
Literatures on equipments used for
characterisation.
Hyperlinks:
1. Microscopy Books:
www.tedpella.com/books_html/books.htm
2. Electron Microscopy:
www.net/biobooks_1_electron-
microscopy.html
3. Thermal Analysis Excellence:
www.mt.com/ta
Coordinators:
Dr. S. Sankaran
Department of Metallurgical & Materials
EngineeringIIT Madras
beam devices like electron probe micro
analysis, atomic force microscopy etc.
Advanced chemical and thermal analysis:
Basic principles, practice and applications of X-
ray photoelectron spectrometry, Augur
spectroscopy, differential thermal analysis,
differential scanning calorimetric and thermo
gravimetric analysis.

COURSE DETAIL
Sl.
No
Topic Number
of Hours
1. Scope of optical
metallographic studies:
Image formation, resolving
power, numerical aperture,
empty magnification, depth
of focus, components of
microscopes, important
lens defects and their
correction, principles of
phase contrast,
interference and polarized
light microscopy, elements
of quantitative
metallography and image
processing, sample
preparation techniques.
10
2. X Ray diffraction and
their applications:
Production and properties
of X-ray, absorption of X-
rays and filters, X-ray -
diffraction directions,
diffraction methods. X-ray -
diffraction intensities,
factors affecting intensity,
structure factor
calculations for simple,
body centered, face
centered, diamond cubic
and hexagonal crystal
structures.
Working principles of
diffractometer, counters
and cameras. Indexing of
XRD patterns. Precise
12
lattice parameter
determination, Chemical
analysis by X-ray
diffraction & fluorescence,
determination of particle
size and micro/macro
strains.
3. Studies by electron
microscopes:
Construction and working
principles of transmission
electron microscopes.
Image formation, resolving
power, magnification, depth
of focus, elementary
treatment of image
contrasts, important lens
defects and their
correction.
Bright field and dark field
images. Stereographic
projection and their
applications. Formation of
selected area diffraction
patterns, reciprocal lattice
and Ewald sphere
construction, indexing of
diffraction patterns, sample
preparation techniques.
Scanning electron
microscope; construction,
interaction of electrons with
matter, modes of operation,
image formation of plane
and fractured surfaces.
Chemical analysis using
electron beam devices like
electron probe micro
analysis, atomic force
microscopy etc.
12
4. Advanced chemical and
thermal analysis: Basic
principles, practice and
applications of X-ray
photoelectron
spectrometry, Augur
spectroscopy, differential
thermal analysis, differential
scanning calorimetric and
thermo gravimetric
8
analysis.
References:
1. Spencer, Michael, Fundamentals of Light
Microscopy, Cambridge University
Press,1982.
2. David B. Williams, C. Barry Carter, "
Transmission Electron Microscopy: A
Textbook for Materials Science" ,Springer,
pub. 2009.
3. Joseph I Goldstein, Dale E Newbury,
Patrick Echlin and David C Joy,
"Scanning Electron Microscopy and X-
Ray Microanalysis", 3rd Edition , 2005.
4. B.D.Cullity and S.R.Stock, "Elements of X-
Ray Diffraction" Third edition, Prentice
Hall, NJ , 2001.
5. G.W.H. Hohne, W.F. Hemminger, H.-J.
Flammersheim , "Differential Scanning
Calorimetry", Springer, 2nd rev. a.
enlarged ed., 2003.
6. 'Fundamentals of light microscopy and
electronic imaging' Douglas B. Murphy,
2001, Wiley-Liss, Inc. USA
7. 'Encyclopedia of Materials
Characterization, Surfaces, Interfaces,
Thin Films,' Editors C. Richard Brundle,
Charles A. Evans, Jr., Shaun Wilson,
Butterworth-Heinemann, Boston London
Oxford Singapore Sydney Toronto
Wellington
8. 'Physical metallurgy and advanced
materials' R.E. Smallman and A.H.W.
Ngan, Seventh edition, 2007, Elsevier
Ltd., USA.
9. www.microscopyu.com
10. Electron optical applications in materials
science (McGraw-Hill series in materials
science and engineering) by Lawrence
Eugene Murr.
11. Practical Electron Microscopy in
Materials Science, J.W. Edington, 1976, 4
volumes reprinted by Tech Books,
Herndon, USA.
12. Transmission Electron Microscopy and
Diffractometry of Materials, B.Fultz, and
J.M.Howe, Second Edition, 2002,
Springer, Germany.
13. Electron Diffraction in the Transmission
Electron Microscope, P.E. Champness,
2001, Garland Science, USA.
A joint venture by IISc and IITs, funded by MHRD,
Govt of India
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