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8 6

2013 12


Chinese
Journal

ofShipResearch

doi10.3969/j.issn.1673-3185.2013.06.020
http://www.cnki.net/kcms/detail/42.1755.TJ.20131125.1150.011.html

Vol.8 No.6
Dec.
2013
8

www.ship-research.com

LabVIEW

1 2
1 116005
2 125004

LabVIEW

LabVIEW
U664.5

16733185 2013 0611407

A Virtual Test Platform Design Using LabVIEW for the Control Circuit in
Marine Air Compressors
XIE Fei1GUO Ningbo2

1 Naval Military Representative Office in Dalian Shipbuilding Industry Co. Ltd.Dalian 116005China
2 Naval Military Representative Office in Bohai ShipyardHuludao 125004China

AbstractAiming at the design process of the control circuit in marine air compressorsthis paper propos
es a new circuit inspection method based on the LabVIEW software. Digital inputting and outputting cir
cuits are specifically designed to realize the function of signal acquisitionwhere the signal interactive cir

cuit uses basic electrical components to achieve signal amplificationfilteringand the function of digital
signal input and output. The corresponding test results can be used in system debugging and the actual cir

cuit module development. This innovative test platform significantly reduces the complexity of traditional
testing methods. In actual production activitiesthe method is capable of detecting and locking circuit mal

function in the general moduleand results show that the circuit after inspection collects digital signal ac
curately and efficiently. Thereforethe proposed method can be well applied in real circuit function tests.
Key wordscontrol systemcircuitLabVIEWvirtual testsignal acquisition

LabVIEW

20130531

2013-11-25 11:50

1987E-mail68064672@qq.com
1988

LabVIEW

1
1.1

115

Fig.1

1.2

1
The electric air compressor control logic diagram for a ship

1-3

1 1

4-6

23

35

42

USB-4751

116

Fig.2

2
The basic composition schematic diagram of data acquisition system

PC

USB-4751

USB

Fig.3

3
3.1

3
The block diagram of data acquisition system

4N35 LM339

74HCT240

74HCT240

3.2

SPDT

LabVIEW

USB-4751

I/O I/O

TTL

VIEW

Lab

74LS04P 74LS86P
ULN2803A

8 16

LabVIEW

117

Write to Digital Line. vi

1 2

6 3

Fig.4

4
The test procedure chart of signal alarm function

Fig.6

5.1

6
The front panel of air compressor simulation test system

Fig.5

5
The program of fault detection

118

7 8

1.2
1
0.8
0.6
0.4
0.2
0
-0.2
08:00:00.00
1904-1-1

Fig.7

7
The signal waveform diagram of purge valve working on the normal state

1.5
1.25
1
0.75
0.5
0.25
0
-0.25
-0.5

08:02:37.999
1904-1-1

80

Fig.8

8
The signal waveform diagram of purge valve control function fault condition
Tab.1

180

/s

1
The fault alarm function test results of purge valve

20 s

20.7 s

1 330 s 7.6%

1 338 s 8.2%

160 s

5.2

162 s

9
2

1.5
1.0
0.5
0

-0.5
00:00

Fig.9

9
The signal waveform of sequence component

08:01

LabVIEW
Tab.2

119

2
The fault alarm function test results of sequence trigger unit

10.2 s

10.5 s

50%

50%

10 11

1.2
1
0.8
0.6
0.4
0.2
0
-0.2
00:00

04:06

a 1

1.2
1
0.8
0.6
0.4
0.2
0
-0.2
00:00

04:06

b 2

Fig.10

1.2
1
0.8
0.6
0.4
0.2
0
-0.2
00:00

10
The signal waveform of sequence calibration circuit unit on the normal state

04:15

a 1

1.2
1
0.8
0.6
0.4
0.2
0
-0.2
00:00

04:15

b 2

Fig.11

11
The signal waveform of sequence calibration circuit unit on the fault state

LabVIEW

LabVIEW

I/O

1 TONOLI KSAILI D. Building a virtual instrument us


ing LabVIEW for the data collection of thermal lens
transientsC//National Meeting Exposition of the

American-Chemical-Society. New YorkIEEE Press


2001171-176.

2 . LabVIEW

J. 201132

140-45.

HUANG HaocaiYANG CanjunCHEN Daohuaet al.

120

Measurement

and

control

system

for

gas-tight

143.

nese Journal of Scientific Instrument2011321

MA YingjianCAO JieSONG Peng. Design in 3458A

40-45.

of data acquisition system based on LabVIEWJ.

3 . LabVIEW AVR
1192-9498.

YANG HuiZHOU Qiang. Pressure data acquisition

J. 20091131-133

deep-sea water sampler based on LabVIEWJ. Chi

J. 201037

Electronic Measurement Technology 2009 1


131-133143.

6 . LabVIEW AMT

and processing system based on LabVIEW and AVR

microcontrollerJ. Control and Instruments in Chemi


cal Industry2010371192-9498.

4 VANGESTEL TSUYKENS J A KBAESENS Bet


al. Benchmarking least squares support vector machine

classifiersJ. Machine Learning 2004 541


5-32.

J. 201212
35-36131.

XUE DaweiYANG ChunlanCHENG Ronglong. De

sign of data acquisition instrument for vehicle amt

based on LabVIEWJ. Instrument Technique and Sen


sor20121235-36131.

5 . LabVIEW 3458A

2013

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