Designation: A 598/A 598M 02

Standard Test Method for

Magnetic Properties of Magnetic Amplier Cores
1
This standard is issued under the xed designation A 598/A 598M; the number immediately following the designation indicates the year
of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval.
A superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of the mag-
netic performance of fully processed cores for magnetic
amplier-type applications.
1.2 Tests may be conducted at excitation frequencies of 60,
400, 1600 Hz, or higher frequencies.
1.3 Permissible core sizes for this test method are limited
only by the available power supplies and the range and
sensitivity of the instrumentation.
1.4 At specied values of full-wave sinusoidal-current ex-
citation, H
max
, this test method provides procedures of deter-
mining the corresponding value of maximum induction, B
max
.
1.5 At specied values of half-wave sinusoidal-current ex-
citation, this test method provides procedures for determining
the residual induction, B
r
.
1.6 At increased specied values of half-wave sinusoidal-
current excitation, this test method provides procedures for
determining the dc reverse biasing magnetic eld strength, H
1
,
required to reset the induction in the core material past B
r
to a
value where the total induction change, DB
1
, becomes approxi-
mately one third of the induction change, 2 B
p
. It also provides
procedures for determining the additional dc reset magnetic
eld strength, DH, which, combined with H
1
, is the value
required to reset the induction in the core material past B
r
to a
value where the total induction change, DB
2
, becomes approxi-
mately two thirds of the induction change 2 B
p
.
1.7 This test method species procedures for determining
core gain from the corresponding biasing and induction
changes, DH and DB.
1.8 This test method covers test procedures and require-
ments for evaluation of nished cores which are to be used in
magnetic-amplier-type applications. It is not a test for basic-
material magnetic properties.
1.9 This test method shall be used in conjunction with
Practice A 34/A 34.
1.10 Explanations of symbols and abbreviated denitions
appear in the text of this test method. The official symbols and
denitions are listed in Terminology A 340.
1.11 The values and equations stated in customary (cgs-emu
and inch-pound) or SI units are to be regarded separately as
standard. Within this test method, SI units are shown in
brackets. The values stated in each system may not be exact
equivalents; therefore, each system shall be used independently
of the other. Combining values from the two systems may
result in nonconformance with this test method.
1.12 This standard does not purport to address all of the
safety concerns, if any, associated with its use. It is the
responsibility of the user of this standard to establish appro-
priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
2. Referenced Documents
2.1 ASTM Standards:
A 34/A 34M Practice for Sampling and Procurement Test-
ing of Magnetic Materials
2
A 340 Terminology of Symbols and Denitions Relating to
Magnetic Testing
2
A 596/A 596M Test Method for Direct-Current Magnetic
Properties of Materials Using the Ballistic Method and
Ring Specimens
2
3. Terminology
3.1 Denitions Below is a list of symbols and denitions
as used in this test method. The official list of symbols and
denitions may be found in Terminology A 340. (See Table 1
where indicated).
1
This test method is under the jurisdiction of ASTM Committee A06 on
Magnetic Properties and is the direct responsibility of Subcommittee A06.01 on Test
Methods.
Current edition approved Oct. 10, 2002. Published November 2002. Originally
published as A 598 69. Last previous edition A 598 92 (1997).
2
Annual Book of ASTM Standards, Vol 03.04.
1
Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
3.2 Symbols:
A = cross-sectional area of test specimen core
material, cm
2
[m
2
].
A
1
= ac ammeter for primary circuit, half-wave,
average-responsive, A.
A
2
= dc ammeter for H
1
biasing winding, A.
A
3
= dc ammeter for H
2
biasing winding, A.
A
4
= dc milliammeter for ac voltage calibrator, V.
B
max
B
r
= change in test specimen induction, under
half-wave sinusoidal-current excitation
specied for this measurement.
B
m
= maximum induction in a sine-current SCM
ac ux-current loop Gauss [Tesla] (Note 1).
B
p
= maximum value of induction in the sine-
current half-wave CM ux-current loop, for
the reset test Gauss [Tesla] (Note 1).
B
r
= residual induction in an ac sine-current ux-
current loop Gauss [Tesla].
DB = change in magnetic induction Gauss [Tesla]
(Table 1).
DB
1
= change in induction in the ux-current loop
during H
1
test Gauss [Tesla] (Table 1).
DB
2
= change of induction in the ux current loop
during H
2
test Gauss [Tesla] (Table 1).
CM = cyclic magnetization (see Terminology
A 340).
D
1
and D
2
= solid state diodes or other rectiers.
D
3
to D
6
= silicon diodes.
d = lamination thickness, cm [m].
E
avg
= average value of voltage waveform, V.
f = frequency of test, Hz.
G = core gain DB
2
B
1
/H
2
, H
1
,
Gauss
Oe
F
T
A/m
G
.
H
c
= coercive eld strength in an SCM ux-
current loop Oe [A/m].
H
max
= maximum magnetic eld strength in a sine-
current SCM ac ux-current loop, Oe [A/m]
(Note 1).
H
p
= maximum value of the sine-current ac mag-
netic eld strength for the CM reset tests, Oe
[A/m] (Note 1).
H
1
= dc biasing (reset) magnetic eld strength for
the H
1
test point, Oe [A/m].
H
2
= dc biasing (reset) magnetic eld strength for
the H
2
test point, Oe [A/m].
DH = change in dc biasing (reset) magnetic eld
strength, Oe [A/m].
N
1
= test winding primary, ac excitation winding,
turns.
N
2
= test winding primary, dc H
1
biasing winding,
turns.
N
3
= test winding primary, dc H
2
biasing winding,
turns.
N
4
= test winding secondary, DB pickup winding,
turns.
SCM = symmetrical cyclic magnetization (see Ter-
minology A 340).
NOTE 1Note that H
max
and B
max
, as used in this test method, are
maximum points on the sine-current SCM or corresponding half-wave
CM ux-current loops. Also, that H
p
and B
p
are maximum points on a CM
ux-current loop corresponding to the ac half-wave sine current which is
established in the exciting winding, N
1
, and held constant, during the dc
current measurements for H
1
, H
2
, or DH. These denitions are different
from those used for the same symbols in Terminology A 340 for use with
dc or sinusoidal-ux ac measurements.
4. Summary of Test Method
4.1 This test method uses the procedures commonly referred
to as the Constant Current Flux Reset Test Method
(C.C.F.R.). For graphic representation of the magnetic ampli-
er core test see Appendix X3.
4.2 Under its provision, a specic predetermined value of
sinusoidal-current excitation, H
max
, (Table 2) is established and
the corresponding induction change is measured to determine
the value of maximum induction which is then designated
B
max
.
4.3 The excitation is then changed to a unidirectional
half-wave sinusoidal current of the same magnitude as that
used for determining maximum induction. The change in
induction under this excitation then is measured to determine
the property designated (B
max
B
r
), or the change between the
maximum and residual values of induction.
4.4 The ac half-wave sinusoidal-current excitation, as mea-
sured in the ac exciting winding, is then increased to a new
value, designated H
p
(Table 2), which causes the ac induction
in the test specimen to rise to a new value which is designated
B
p
. A dc reverse-polarity magnetic eld strength is then
applied. The opposing dc magnetic eld strength resets the ux
or induction in the core material, between each half cycle of ac
magnetization, to a value that provides the specied DB
1
induction change (Table 1). This dc excitation, designated H
1
,
is the value required to reset past B
r
to a point that provides the
TABLE 1 Standard Values of DB, DB
1
, and DB
2
for the Commonly Used Materials
Core Material
A
DB
1
(for Test of 10.5) DB
2
(for Test of 10.4) DB or
(DB
2
DB
1
)
kG Tesla kG Tesla kG Tesla
Supermendur 14 1.4 28 2.8 14 1.4
Oriented silicon-iron 10 1.0 20 2.0 10 1.0
50 % nickel-iron:
Oriented 10 1.0 20 2.0 10 1.0
Nonoriented 8 0.8 16 1.6 8 0.8
79 % nickel-iron 5 0.5 10 1.0 5 0.5
Supermalloy 5 0.5 10 1.0 5 0.5
A
Values for other materials may be used by mutual agreement between seller and purchaser.
A 598/A 598M 02
2
specied change in induction of DB
1
which is approximately
equal to one third of 2 B
p
. This value of H
1
has some
correlation to the coercive eld strength, H
c
, of the material.
4.5 Holding the same increased value of ac half-wave
sinusoidal-current excitation, as described in 4.4, the dc
reverse-polarity excitation is increased by the amount DH and
the total value of dc reverse biasing (H
1
+ DH) is designated
H
2
. It is the value of dc reverse biasing required to reset the ux
between ac magnetizing cycles to a value which provides the
specied total change in induction of DB
2
(Table 1) that is
approximately equal to two thirds of 2 B
p
.
4.6 From the change in dc bias DH and the changes in
induction DB corresponding to the change between the H
1
and
H
2
operating points, the core gain may be determined. It is
usually reported as a DH value for the core. When required for
special reasons, it may be reported in terms of core gain, G (see
11.5).
4.7 It is standard practice to assign values to the change of
induction DB
1
and DB
2
(Table 1). This in turn determines the
magnitude of the H
1
and H
2
biasing values corresponding to
these changes of induction.
4.8 The normal test specimen may have any size or shape.
When used specically to evaluate materials for core construc-
tion, it is limited in size, weight, and method of manufacture.
4.9 Heat treatment appropriate to the core material and core
construction may be required before test.
5. Signicance and Use
5.1 The method of excitation simulates, to a practical
degree, the operation of a magnetic core in a self-saturating
magnetic amplier. The properties measured are related to the
quality of performance of the cores in magnetic ampliers and
are useful for the specication of materials for such cores.
6. Apparatus (see Fig. 1)
6.1 Sinusoidal Voltage SupplyThe source of excitation
shall be an ac source of sinusoidal voltage which shall have
sufficient power to magnetize the largest core to be examined
to the levels of excitation as specied in Table 2. Its harmonic
distortion under load shall be less than 3 %. Its frequency
should be constant to within 1 % or less. Standard test
frequencies are 60, 400, and 1600 Hz.
6.2 Series Impedance, Z
1
, or Resistor, R
1
This impedance
should provide a voltage drop much larger than the voltage
appearing across the excitation winding. Then, the distortion of
current waveform as a result of the nonlinear impedance of the
core will be minimized. It may be a power resistor for small
size cores. For larger cores, a series resonant circuit may be
used, which reduces the voltage requirements of the power
source. The voltage across this impedance or a reactive element
in Z
1
must be greater than 25 times the average voltage induced
in the excitation turns, N
1
.
TABLE 2 Standard Values of Peak Sine Current Magnetic Field Strength to Be Established for Testing the Commonly Used Materials
Core Material
A
Full-Wave SCM Value of H
max
,
(for Measurement of B
max
in Test of 10.2)
Half-Wave CM Value of H
max
,
(for Measurement of B
max

B
r
in Test of 10.3)
Half-Wave CM Value of H
p
, (for
Determining H
1
and H
2
or DH
in Testing of 10.4 and 10.5 and
adjustments of 10.1)
Oe A/m Oe A/m Oe A/m
Supermendur 3 240 3 240 6 480
Oriented silicon-iron 3 240 3 240 6 480
50 % nickel-iron 1 80 1 80 2 160
79 % nickel-iron 0.5 40 0.5 40 1 80
Supermalloy 0.25 20 0.25 20 0.5 40
A
Values for other materials may be used by mutual agreement between seller and purchaser.
FIG. 1 Basic Diagram for Magnetic Amplier Core Test
A 598/A 598M 02
3
6.3 Diodes (Note 2), D
1
and D
1
may be fast solid state
devices (Note 3), high-vacuum rectiers, or Schottky rectiers.
NOTE 2During the interval between half-wave pulses, when the
excitation should be nominally zero, the average leakage current shall be
less than 0.1 % of the peak value of excitation current during a pulse.
NOTE 3In the case of solid-state devices, a capacitative charging
pulse of reverse current is sometimes observed, particularly at the higher
frequencies. Its integrated value, in ampere-seconds, at any test frequency
shall be limited to 1.0 % of the ampere-seconds of the exciting half-wave.
6.4 The test xture shall be composed of four sets of
windings enclosing the core and a means of compensating for
air-ux effect in induced voltage in N
4
.
6.4.1 The exciting winding N
1
shall contain as small a
number of turns as practical to limit the exciting-current
waveform distortion (see 6.1).
6.4.2 The B-coil, pickup winding, N
4
, may contain any
convenient number of turns. This winding shall be maintained
in a xed position in relation to the excitation windings to
eliminate variations in the air-cored inductive or capacitive
coupling between them. Compensation for such coupling may
be accomplished with the air-cored bucking transformer, T
1
.
NOTE 4The coils of the test xture, including the air-cored bucking
transformer, T
1
, if used, shall be initially adjusted such that the voltage
coupling between the exciting and pickup windings will be minimized
when no specimen is in place, and maximum full-wave exciting current
for a given-size core is applied. The cancellation will be considered
adequate when the ux voltmeter indicates the equivalent of 15 G [0.0015
T] or less for that size core. The pickup circuit should be shielded from
stray elds, when this cannot be accomplished an adjustable coil may be
used to buck out voltages picked up from external elds (see 10.1).
6.4.3 The dc reset windings shall use a small number of
turns to help minimize the ac transformer loading of the test
core. The impedances, Z
2
and Z
3
, described in 6.9 and 11.5 also
help to limit this loading effect to acceptable values.
6.5 Flux Voltmeter:
6.5.1 The ux voltmeter must respond to the true average
value of the pickup-winding voltage. The average value of the
voltage waveform is directly proportional to the total change of
magnetic ux in the core. The ux-voltmeter accuracy shall be
1 % or better.
NOTE 5For medium- or small-size cores, the ordinary rectier ac
voltmeters are not sensitive enough to accurately measure B
max
B
r
, and
conventional average-responsive vacuum-tube voltmeters are subject to
excessive errors as a result of the extremely peaked nature of the voltage
waveform and to the high ratio of peak to average values. Therefore,
special instruments must be used. Some typical schemes appear in
Appendix X1.
6.5.2 The input impedance of the ux voltmeter as con-
nected to the pickup winding of the core shall exceed the value
of Z for any coil load as specied in 11.6.
6.6 Calibration SourceAn adequate means shall be pro-
vided to calibrate the ux voltmeter. A source of accurately
known ac voltage, or the output of a core whose saturation has
been carefully measured by dc ballistic methods may be used.
The reference voltage calibrator shown in Appendix X2
provides a suitable voltage source having a waveform approxi-
mating that of cores tested by this test method, with a test
method for determining the average voltage (see 9.2).
6.7 DC Power Supply for H
1
This power supply shall
provide sufficient voltage to overcome the voltage drop across
impedance, Z
2
, and sufficient current capacity to saturate any
core to be tested. The rms value of the ac ripple of the dc
power-supply voltage shall not exceed 0.25 % of the test
voltage required under the conditions of maximum or mini-
mum dc load currents.
6.8 DC Power Supply for DHThis power supply shall
provide sufficient voltage to overcome the voltage drop of
impedance, Z
3
, and sufficient current capacity to provide DH
for any core to be tested. Its rms ripple voltage shall not exceed
0.25 % of the test voltage required under the conditions of
maximum or minimum dc load currents.
6.9 AC Blocking Impedances, Z
2
and Z
3
These imped-
ances are dc current-passing elements that reduce the ac
loading effects of the H
1
and DH windings and their dc power
supplies to acceptable limits. Minimum values for impedances
Z
2
or Z
3
may be calculated from the equation of 11.6.
6.10 Ammeters:
6.10.1 Ammeter, A
1
This ammeter is normally a dc instru-
ment of the dArsonval indicating type or a dc digital voltmeter
reading voltage across a precision resistor. It shall have a
full-scale accuracy of at least 61.0 % and shall be capable of
calibration as a full-wave or half-wave peak-indicating amme-
ter.
6.10.2 Ammeters, A
2
and A
3
These instruments are dc
ammeters or dc digital voltmeters reading voltages across
precision resistors and must have a full-scale accuracy of at
least 60.5 %. For measurement of properties of very-high-gain
cores, these ammeters must have an accuracy of at least
60.25 % of full scale.
6.11 Resistor, R
1
This resistor compensates for the amme-
ters impedance and nonequality of the two diodes. It is
adjusted to provide equal values of crest current, in the two half
waves, when full-wave excitation is being used.
6.12 Switch, S
1
This switch provides means for applying
either full- or half-wave excitation to the core while maintain-
ing full-wave loading on the power source.
7. Sampling
7.1 Unless otherwise agreed upon, test specimens that
represent a lot or more than one core shall be selected in
accordance with Practice A 34/A 34M.
8. Test Specimen
8.1 The test specimen may be a core or lamination stack of
any size or shape which has been designated for use in
magnetic-amplier applications.
9. Calibration of Test Equipment
9.1 The individual instruments used to measure the three
excitation currents must be calibrated against suitable dc
reference standards according to good laboratory practice.
9.1.1 Ammeter A
1
, used to measure the full-wave and
half-wave ac magnetizing currents, is an average-responsive
ammeter connected in such a manner that for both measure-
ments it sees only the positive unidirectional half-cycle current
wave trains. This dc instrument is calibrated to indicate the
A 598/A 598M 02
4
average value of the ac half-wave where I
dc
= I
avg
, and the peak
of the current wave trains is obtained as follows:
I
p
5 pI
avg
where:
I
p
= peak value of half-wave ac exciting current, A and
I
avg
= average value of ac half-wave exciting current, A.
9.1.2 Ammeters A
2
and A
3
are dc instruments used to
measure direct current. They require accurate calibration but
no conversion factors.
9.2 The ac uxmeter may be calibrated by either a reference
core or a reference-voltage calibrator.
9.2.1 Areference core is one whose ux change is known or
can be measured. Such measurements can be made by dc
ballistic methods.
3
A supermalloy core or suitable equivalent
prepared from 0.001-in. [25-m] thick material excited to a
peak excitation of 10 Oe [796 A/m] is suggested. This
reference core is placed in the test xture and excited with the
magnetic eld strength for which the ux change is known.
The ac ux voltmeter is then calibrated in terms of the known
ux change.
9.2.2 The reference-voltage calibrator of Appendix X2 de-
velops a known average voltage having a waveform approxi-
mating that of the induced voltage in winding N
4
of Fig. X2.1
for the measurement of B
max
.
10. Procedure
10.1 Set switch S
1
to the full-wave position and turn all dc
power supplies to zero current. Then, with no core in the test
jig, raise the level of the ac sinusoidal current in the excitation
winding, N
1
, to the value which produces the peak excitation,
I
p
, required in Table 1 for the measurement of B
p
. Then adjust
the coupling of the air ux compensator, T
1
, to give a minimum
reading on the ux voltmeter scale (Note 4). The position of the
stray-ux compensator must also be adjusted to provide the
lowest possible residual-ux voltmeter reading. The exciting
current, I
p
, value required for this measurement may be
calculated from the equation of 11.1.
10.2 Place a test specimen in the test xture, and with the
value of full-wave SCM sinusoidal-current excitation, I
p
(calculated from specied H
max
of Table 2), owing through
the excitation winding, N
1
, observe the ux-voltmeter reading
across winding, N
4
. This voltage corresponds to a total ux
change from forward B
max
to reverse B
max
(or 2 B
max
in terms
of half-wave parameters).
10.3 Operate switch S
1
to the half-wave excitation position
and maintain the same value of peak-excitation current, I
p
(used in 9.2), so that the half-wave (CM) value of H
max
equals
the previous full-wave (SCM) value of H
max
. Again observe
and record the ux-voltmeter reading across winding N
4
. This
voltage is proportional to the ux-density shift in the specimen
material during cyclic changes from maximum to residual
induction and is the measure for the quanitity B
max
B
r
.
10.4 With switch S
1
remaining in the half-wave excitation
position, readjust the excitation current, I
p
(as calculated for
10.1), to a value that provides the peak magnetic eld strength
specied in Table 1 which is to be maintained during measure-
ments for the parameters, H
1
, DH, and DB. Then adjust the dc
level (form the H
1
power supply) in winding N
2
until the ux
voltmeter indicates the voltage that is induced when the desired
DB
1
(as shown in Table 1) has been established. This reverse dc
biasing current, I
2
, in amperes is used to calculate the value of
H
1
in oersteds or A/m (see 11.3).
10.5 With switch S
1
remaining in the half-wave position and
excitation current, I
p
, and reverse-biasing current, I
2
, held to
the values given in 10.4, adjust the dc current level (from the
DH power supply) in winding N
3
until the ux voltmeter
indicates the voltage which is induced when the desired
DB
2
(as shown in Table 1), has been established. This reverse
dc biasing current, I
3
, in amperes is used to calculate the value
of DH oersteds or A/m (see 11.3). This current represents the
change in reverse dc biasing current (or biasing eld DH
oersteds or A/m) which causes the induction resulting from the
ac excitation to change by the value of DB G.
10.6 When a very stable dc power supply is used with 1-dc
ammeter of the 0.1 % class or better, this combination with a
single dc winding, N
2
, may be used for both the H
1
and H
2
or
DH determinations.
10.7 In this test method, the coercive eld strength H
c
parameter is not measured directly or calculated from other
parameters. An approximate correlation may be found with the
parameter H
1
.
11. Calculations
11.1 Table 1 species the values of full-wave or half-wave
sinusoidal-current magnetic eld strength to be used in testing
various materials. The following equation is used to calculate
the peak value of full-wave or half-wave sinusoidal current
required to establish the desired magnetic eld strength. Where
for full-wave excitation,
I
p
5 ,
1
H
max
/0.4pN
1
, H
max
in Oe
I
p
5 ,
2
H
max
/N
1
, H
max
in A/m
and for half-wave excitation,
I
p
5 ,
1
H
p
/0.4pN
1
, H
p
in Oe
I
p
5 ,
2
H
p
/N
1
, H
p
in A/m
where:
I
p
= peak value of current reached during a cycle of the
sinusoidal full-wave or half-wave exciting current,
A,
,
1
= mean magnetic path length of the test specimen,
cm, and
,
2
= mean magnetic path length of the test specimen,
m.
H
max
= predetermined peak value of magnetic eld
strenght H
max
to be used for a particular test (see
Table 2),
H
p
= predetermined peak value of magnetic eld
strength, H
p
, to be used for a particular test (see
Table 2), and
N
1
= number of turns used in the excitation winding.
3
See Practice A 34/A 34M, Terminology A 340, and Test Method A 596/
A 596M.
A 598/A 598M 02
5
11.2 When the peak current ammeter used is a dc average-
responsive ammeter, the following equation shall be used to
calculate the scale indication corresponding to the desired
value of peak magnetic eld strength, H
max
. Where for
full-wave excitation,
I
avg
5 ,
1
H
max
/0.4pN
1
p, H
max
in Oe
I
avg
5 ,
2
H
max
/N
1
p, H
max
in A/m
and for half-wave excitation,
I
avg
5 ,
1
H
p
/0.4pN
1
p, H
max
in Oe
I
avg
5 ,
2
H
p
/N
1
p, H
max
in A/m
where:
I
avg
= average value of alternating current as indicated on
the dc average responsive instrument scale, A;
,
1
= mean magnetic path length of the test specimen,
cm; and
,
2
= mean magnetic path length of the test specimen,
m.
H
max
= peak value of magnetic eld strength, H
max
, from
Table 2;
H
p
= peak value of magnetic eld strength, H
p
, from
Table 2; and
N
1
= number of turns on excitation winding.
11.3 The values of reverse dc biasing magnetic eld
strength for the H
1
and DH determinations may be calculated
from the following:
H
1
5 0.4pN
2
I
2
/,
1
in Oe, H
1
5 N
2
I
2
/,
2
in A/m
DH 5 0.4pN
3
I
3
/,
1
in Oe, DH 5 N
3
I
3
/,
2
in A/m
where:
H
1
= dc biasing (reset) magnetic eld strength from coil
N
2
(H
1
testpoint);
DH = dc biasing (reset) magnetic eld strength from coil
N
3
(N
2
testpoint);
N
2
= magnetizing coil for H
1
dc reverse biasing, turns;
N
3
= magnetizing coil for H
2
dc reverse biasing, turns;
I
2
= direct current required in N
2
for the H
1
testpoint, A;
I
3
= direct current required in N
3
for the H
2
testpoint, A;
and
,
1
= mean magnetic path length of the test specimens,
cm.
11.4 The value of DB may be calculated as follows:
DB 5 DB
2
2 DB
1
where:
DB
1
= total B swing for the H
1
testpoint and
DB
2
= total B swing for the H
2
testpoint.
11.5 The gain factor for a core is usually expressed in terms
of the DH test value required to change the induction swing
from the value of DB
1
to that of DB
2
(see 11.3). This value is
very useful for evaluating the quality of cores made from a
specic material. For quality comparisons between cores made
from two different types of material or for other isolated cases,
it may be desirable to express the gain factor of the core as a
ratio between DB and DH as follows:
G 5 DB/DH, G@T# 5 DB/DH
where:
G = core gain, G/Oe, or G[T] = core gain, Tesla/A/m.
11.6 The minimum value of impedance that is allowable for
an external circuit or instrument which is to be connected to a
test winding can be determined from the following equation:
Z 5 2pfN
2
A
,
1
DB
DH
3 10
25
cnst. units
Z 5 5fN
2
A
,
1
DB
DH
3 10
3
SI units
where:
Z = total impedance, looking externally from the winding
terminals, V;
f = frequency, Hz;
N = number of turns in the test winding to be connected to
the circuit impedance or instruments;
A = cross-sectional area of the core material, cm
2
[m
2
];
and
,
1
= mean magnetic path length of the core, cm [m].
11.7 The core material area, A, is normally determined from
the nominal core dimensions and lamination factors of Table 3
and Table A1.2. When the core area is not known, it may be
determined by calculation from dimensions and stacking fac-
tor.
11.8 The mean path length of the core material shall be
determined from the manufacturers published dimension or
from measured dimensions.
11.9 The ux-voltmeter scale may be calibrated to indicate
DB changes directly from its scale reading (Appendix X2) or to
indicate average volts. Voltages corresponding to the desired
induction or change in induction may be calculated as follows:
E
avg
5 2~DB!N
4
fA 3 10
28
cnst. units
E
avg
5 2DBN
4
fA SI units
where:
E
avg
= average value of voltage induced in winding N
4
,V;
DB = change in induction in the magnetic core material,
G [T];
N
4
= number of turns in winding N
4
;
f = frequency, Hz; and
A = cross-sectional area of the core material, cm
2
[m
2
].
TABLE 3 Lamination Factor
Tape Thickness Stacking Factor
in. [cm] [m (10
6
)]
0.0005 [0.0013] [13] 0.5
0.0010 [0.0026] [25] 0.75
0.002 [0.0051] [51] 0.85
0.004 [0.010] [100] 0.90
0.006 [0.015] [150] 0.90
0.010 to 0.014 [0.025 to 0.36] [250360] 0.95
A 598/A 598M 02
6
12. Precision and Bias
12.1 It is not practicable to specify the precision of the
procedure in this test method for measuring the gain factor of
a core because there are too few laboratories capable of making
this test to conduct an interlaboratory study. The procedure in
this test method for measuring the gain factor of a core has no
bias because the gain factor is dened only in terms of this test
method.
13. Keywords
13.1 core; coregain; gain factor; induction; magnetic am-
plier; magnetic eld strength
ANNEX
(Mandatory Information)
A1. STANDARD TEST SPECIMENS FOR USE IN EVALUATING CORE MATERIALS
A1.1 When the test specimen is intended for evaluation of
basic materials for core construction, the test sample shall be
selected as required for strip materials in accordance with the
provisions of Practice A 34/A 34M. The procurement speci-
cations should specify the method of sample selection and
subsequent treatment for such cores. When not covered by
specications, the provisions and requirements of Annex A1
shall govern the sample selection and preparation.
A1.2 The test specimen, unless otherwise agreed upon
between the purchaser and manufacturer, shall be a tape-wound
core having the dimensions listed in Table A1.1.
A1.3 The test sample material shall be slit to the required
width. This is commonly done on commercially available
rotary slitting equipment. It is essential that the quality of the
slitting be according to the best commercial practice with a
minimum burr and free of waves and wrinkles. The slit strips
shall be clean and free of any dust or foreign matter. They shall
be long enough to wind the required core without welding or
patching two or more pieces together.
A1.4 The surfaces of the strip must be coated with a
refractory insulation before or during the winding of the core.
A ne grade of magnesium oxide (less than 5 m in diameter)
has been found satisfactory. It may be made to adhere to the
strip by applying a light oil lm on the strip previous to or
during core winding. All insulation materials and bonding
agents (such as the oil) used in the insulation process must be
carefully screened to eliminate those that could contaminate
the cores during the heat-treating process. The oil, suggested
above, should be selected so that it can be removed by heating
at a low temperature in air, such as at 150C [302F]. The
amount of the insulation must allow the cores to meet the
lamination factors of Table A1.2.
A1.5 The winding tension may be used to control the
stacking factor. A satisfactory core, after heat treatment, may
be telescoped with light nger pressure. The lamination factors
must conform to the limits of Table A1.2.
A1.6 At one spot of the rst layer and at one spot of the
outer layer, the core may be spot welded to keep the core from
unwinding. The welds must not penetrate more than three
adjacent layers.
A1.7 When a core is to be used for basic material
evaluation, the area, A, shall be determined as follows:
A 5 ~m/,
1
d!
where:
A = metallic cross-sectional core area [cm
2
, cnst. unit; m
2
,
SI unit],
m = mass of the core material [g, cnst. unit; kg, SI unit],
,
1
= mean magnetic path length [cm, cnst. unit; m, SI unit],
and
d = standard assumed density of the core material [g/cm
3
,
cnst. unit; kg/m
3
, SI unit].
A1.8 The heat treatment of the standard core specimen will
determine the performance of the core material to a critical
degree. The choice of time and temperature and annealing
TABLE A1.1 Dimensions of Standard Tape-Wound Core Specimens to Be Used When Evaluating Basic Material Properties
NOTE 1For other thickness of material, d, the core size shall be determined by mutual agreement and shall have the following limitations: the inside
diameter shall be at least 140 d but less than 2000 d, the strip width shall be at least 30 d but not more than 500 d, the outside diameter shall be 1.25
times the inside diameter, the mean magnetic path of such a core is 3.54 times the inside diameter.
Dimension Light Gage, in [m] Heavy Gage, in. [m]
Strip thickness, d 0.0005 [13 m] up to and including 0.004 [100 m] up to and including
0.006 [150 m] 0.014 [350 m]
Inside diameter, D
i
1.000 [0.0254] 2.00 [0.0508]
Outside diameter, D
o
1.250 [0.0318] 2.500 [0.0636]
Strip width, w 0.0250 [0.006 36] 0.500 [0.0127]
Mean magnetic path, l
1
3.54 [0.0898] 7.07 [0.1796]
A 598/A 598M 02
7
atmosphere must provide the proper conditions for develop-
ment of optimum properties as specied by the material
manufacturer. The typical conditions for heat treatment of
standard core specimens when used for material evaluation are
found in Table A1.3.
A1.9 Furnace:
A1.9.1 The furnace should be suitable for heat treating at
temperatures up to 1204C [2200F] in pure dry hydrogen
atmospheres. Where required, its size and heating rate should
be such as to meet the heating rates specied in Table A1.3 or
other agreed upon conditions capable of imparting to the
charge temperatures which are uniform within 10F [5.5C].
A1.9.2 The temperature-controlling equipment should be
selected to allow the above 5.5C [610F] accuracy in setting
and uniformity.
A1.9.3 When dry hydrogen atmospheres are used, the exit
dew point should be below 40C [40F]. (Warning
Hydrogen is a highly explosive gas. Extreme care must be
exercised when using it.)
A1.10 Annealing Trays:
A1.10.1 The specimens are arranged in trays in as stable a
way as possible to avoid deformations. At the heat-treating
temperatures, the magnetic materials do not have enough
strength to support themselves. If the trays are not at, the
samples will follow the contour of the trays.
A1.10.2 Adequate strength of the trays at the annealing
temperature should be one of the selection criteria for tray
materials.
A1.10.3 The thermal coefficient of expansion of the tray
material and spacers should be preferably of the same order as
that of the magnetic material to be heat treated.
A1.10.4 The chemical composition of the material used for
trays and spacers should be examined and found not to have
any interactions with the magnetic material. It is generally
desirable that they be free from carbon and sulfur.
A1.10.5 The tray arrangement in the furnace retort and the
piling of the specimens should be arranged in such a way that
the heat-treating atmosphere freely reaches all specimens.
TABLE A1.2 Lamination Factor Range for Standard Tape-Wound
Core Specimens When Used for Evaluation of Basic Material
Properties
NOTE 1Denition of lamination factor may be found in Terminology
A 340.
Strip Thickness, d
Lamination Factor,
Range, S, %
in. [m]
0.0005 to 0.0008 [13 to 20] 50 to 60
0.0008 to 0.0015 [20 to 38] 60 to 80
0.0015 to 0.003 [38 to 76] 75 to 90
0.003 to 0.008 [76 to 200] 80 to 90
0.008 and up [200] and up 95
TABLE A1.3 Typical Range of Heat-Treatment Conditions for Standard Cores When Used for Material Evaluation
80 % Nickel-Iron Alloy 50 % Nickel-Iron Alloy Oriented Silicon-Iron
49 % Cobalt-Iron 2 %
Vanadium
Temperature, C [F] 930 to 1200 [1700
to 2200]
930 to 1200 [1700
to 2200]
650 to 870 [1200
to 1600]
650 to 870 [1200
to 1600]
Atmosphere hydrogen hydrogen up to 20 % hydrogen,
balance nitrogen
hydrogen
Flow rate, in volume changes/h 10 10 10 10
Time charge is at temperature, h 2 2 2 2
Heating rate, C [F]/h 6 20 % 280 [500] 280 [500] 280 [500] 280 [500]
Cooling rate, C [F]/h 6 20 % upon agreement with
supplier
280 [500] 280 [500] upon agreement with
supplier
A 598/A 598M 02
8
APPENDIXES
(Nonmandatory Information)
X1. FLUX VOLTMETER INSTRUMENTATION
X1.1 Resistance-Capacitance (R-C) Integrator-Amplier
(See Fig. X1.1)
X1.1.1 A simple R-C network can be used as an effective
integrator. With attention to detail, it can perform integration
with an accuracy sufficient for ux measurements. For proper
operation, the ratio of R to 1/vC should be at least 250 to 1 at
the test frequency. Otherwise, a phase displacement at the
lower frequencies will appear as a droop on the at-top portion
of the integrated waveform. A high-quality, low-loss capacitor
and a noninductive resistor are required.
X1.1.2 The R-C network should be completely shielded to
avoid stray pickup at the test frequency. This pickup can cause
either a rise or droop on the at top of the output waveform.
X1.1.3 A safe test for proper integration and a minimum of
low-frequency phase displacement is to use the integrator to
observe the ux-current loop on an oscilloscope under sine-
current excitation conditions. The test core should be of the
square-loop variety (oriented 50 % Ni-Fe) with a B
r
/B
max
ratio
of 0.98 or more and driven to a peak magnetic eld strength of
2 Oe [0.025 A/m]. For this check, the tails of the ux-current
loop should show no crossover or opening. The oscilloscope
should be operated direct coupled with a probe on the input to
obtain very high input impedance.
X1.1.4 The input impedance of the R-C integrator must be
of such value as to cause a very minimum of loading on the
test-core secondary. This value of impedance should be greater
than the core impedance Z (see 11.6).
X1.1.5 Since the output of an R-C integrator is usually very
low, an amplier is used to increase this level to a value
sufficient for measurement purposes.
X1.1.6 The input impedance of the amplier should be high
enough to avoid unnecessary loading of the integrator. An input
impedance greater than 1000 X V at the test frequency is
recommended.
X1.1.7 The amplier should employ sufficient feedback to
enable good amplitude linearity (60.1 %).
X1.1.8 The frequency response should be low enough to
reproduce a practically perfect square wave at the lowest test
frequency with no visible droop on the at-top portion of the
waveform. The frequency of highest satisfactory response
should be at least 20 times the highest test frequency to be
used. Asuitable amplier would have good frequency response
from 1 to 100 Hz for testing in the frequency range from 60 to
5000 Hz.
X1.1.9 A standard half-wave voltage-doubler circuit is used
to enable peak detection of the integrated waveform to be
performed. This circuit yields a dc voltage equivalent to the
peak-to-peak (P-P) value of its input voltage. To avoid losses
caused by diode leakage and barrier effects, the input voltage
should be at least 200-V P-P under B
max
conditions. A 103
multiplier should be used on the amplier to increase the
(B
max
B
r
) integral of square materials (B
r
/B
max
ratios above
0.80). In this way, the doubler circuit is always sensing
waveforms of the necessary amplitude.
X1.1.10 The indicating part of the ux meter is a dc
voltmeter. The full-scale accuracy of this instrument should be
at least 60.25 %. This accuracy is necessary to permit an
overall system accuracy of about 60.5 %.
X1.2 Miller Integrator (See Fig. X1.2)
X1.2.1 A Miller integrator or operational amplier con-
nected as a Miller integrator operates on the core pickup
voltage in much the same manner as the R-C integrator. Its
most desirable characteristic, however, is that the value of the
capacitance in the R-C network is effectively increased by the
open-loop gain of the amplier. This results in a larger time
constant which is the equal to RC (1 + A), where A is the gain
of the amplier.
X1.2.2 The frequency requirements for the amplier used in
this integrator are very similar to those specied for the R-C
integrator system of X1.1.8.
X1.2.3 The normally high input impedance of the Miller
integrator will contribute very little loading on the core
secondary voltage. This impedance is dened in X1.1.4.
FIG. X1.1 R-C Integrator-Amplier
A 598/A 598M 02
9
X1.2.4 Two other desirable characteristics of this integrator
are a higher output signal amplitude and the capability of
adapting reasonable loading without reducing its quality of
integration.
X1.2.5 Since the integrator output is still too low for good
peak detection, an additional amplier is required.
X1.2.6 The requirements pertaining to linearity and fre-
quency response of this amplier are the same as those called
for in X1.1.8.
X1.2.7 The input impedance need not be abnormally high
since integrator loading is not very critical.
X1.2.8 The half-wave voltage doubler and dc voltmeter
used with this system should have characteristics and accura-
cies identical with those established in the preceding system
X1.2.1 and X1.2.2.
X1.3 Rectier-Integrator (See Fig. X1.3)
X1.3.1 In this system, an amplier is used to increase the
core output voltage to a level sufficient for accurate full-wave
rectication. The frequency requirements here are more strin-
gent for this amplier than those of the foregoing systems. This
is due to the magnitude and number of harmonics in the core
output voltage. The high-frequency response must be adequate
to handle the higher-order harmonics properly, which, in some
cases, may be in excess of 50 times the test frequency. A
suitable amplier would have good frequency response from 5
to 250 kHz for testing in the frequency range from 60 to 5000
Hz.
X1.3.2 Linearity should be at least 60.1 %.
X1.3.3 The amplier output should be capable of handling
200 V, peak, without clipping.
X1.3.4 A full-wave diode bridge is used to rectify the
amplier output voltage. The large voltage swing tends to
minimize the errors caused by nonlinearities in the diode
voltage-current characteristics at the low-voltage levels. These
areas contain a large portion of the average value of the overall
waveform. Consequently, it is necessary to amplify the core
output voltage until the low-level regions fall on the linear
portion of the diode characteristic.
X1.3.5 The use of germanium diodes further will reduce the
error caused by the barrier voltage encountered in solid state
diodes.
X1.3.6 Linearity can be further enhanced by using diodes to
shunt the rectier bridge. These diodes should have the same
characteristics, be held at the same temperature, and carry the
same current levels as bridge diodes.
X1.3.7 The indicating instrument must be of the dArsonval
type. The actual integration is performed by this instrument
which responds to the average value of the rectied waveform.
X1.3.8 The full-scale accuracy of this instrument should be
60.25 %.
FIG. X1.2 Miller Integrator
FIG. X1.3 Rectier-Integrator
A 598/A 598M 02
10
X2. CALIBRATION CIRCUIT FOR THE FLUX VOLTMETER
X2.1 This calibration circuit develops an ac test voltage
having a waveform similar to the induced voltage in winding
N
4
of Fig. 1 during the measurement of B
max
. The circuit, as
shown in Fig. X2.1, uses a tape-wound core of square
hysteresis loop material, T
3
, which is excited by a sinusoidal
current limited by resistor R
2
. The induced voltage is rectied
in the silicon diodes in a bridge rectier circuit.
X2.2 Because the same current ows in the ac calibration
resistor as ows in the dc milliammeter, the average value of
the current indicated by the milliammeter, A
4
, is the same as
that owing in the ac shunt resistor, R
4
E
cal
5 I
ac
R
4
X2.3 The voltage developed across R
4
may be related to
E
avg
, the average of the induced voltage in N
4
of Fig. 1 as
follows:
E
avg
5 2~DB! N
4
fA 310
28
cnst. unit
E
avg
5 2DBN
4
fA SI unit
where:
DB = change in magnetic induction, G [T];
N
4
= number of turns linking the core specimen which is
connected to the ux voltmeter (see Fig. 1);
f = frequency, Hz; and
A = cross-sectional area of magnetic ux path of the
specimen core, cm
2
[m
2
].
NOTE 1
T
2
stepdown transformer, output 25 V at 1.0 A
R
2
voltage-dropping resistor, 25 V, 25 W
T
3
square hysteresis loop coreprimary 20 turns (approximately), secondary ve turns when core area = 1 cm
2
D
3
to D
6
full-wave rectier, silicon diodes
R
3
current control resistor, 50 to 100 V
A
4
milliammeter 0.25 % accuracy, 1 to 100 mA depending on frequency
R
4
ac current shunt, 1.0 to 10 V
FIG. X2.1 Calibration Circuit for Flux Voltmeter
A 598/A 598M 02
11
X3. GRAPHICAL REPRESENTATION OF THE MAGNETIC AMPLIFIER CORE TEST (C.C.F.R.)
X3.1 The gures of this Appendix show in graphical form
the various steps and interpretation of the (C.C.F.R.) magnetic
amplier core test.
X3.2 Fig. X3.1 and Fig. X3.2 are to be used for the
determination of induction, B
max
, reached in the core material
when magnetized by full-wave sinusoidal current to the speci-
ed value of H
max
Oe, using procedures of 10.2.
X3.3 Fig. X3.3 and Fig. X3.4 are for use in the determi-
nation of the residual induction, B, in the core material after
being magnetized to H
max
Oe and the value of B
max
B using
the procedures of 10.3.
X3.4 Reference should be made to Fig. X3.5 and Fig. X3.6
for determination of the direct current biasing eld, H
1
,
required to reset the core ux sufficiently to establish an
induction change of DB, in the core material when using the
procedures of 10.4.
X3.5 Fig. X3.7 and Fig. X3.8 are useful for determination
of the direct current biasing eld, H
2
, required to reset the core
ux sufficiently to establish an induction change ofDB
2
in the
core material when using the procedures of 10.5.
X3.6 Graphical representation of the combined ux-current
loops which represent the various test conditions of Section 10
is shown in Fig. X3.9.
X3.7 A characteristic performance curve (Fig. X3.10),
which represents a full range of operating values for a magnetic
amplier core, may be obtained by plotting the induction
changes versus a number of different values of the dc biasing
magnetic eld strength. The procedures of 10.4 and 10.5 are
followed except that a number of different values of the dc
biasing eld are established for determination of the corre-
sponding values of induction change DB. FIG. X3.1 Circuit Diagram for Tests Described in 10.2
FIG. X3.2 Sine-Current SCM Flux-Current Loop for Test
Described in 10.2
FIG. X3.3 Circuit Diagram for Tests Described in 10.3
A 598/A 598M 02
12
FIG. X3.4 Sine-Current CM Flux-Current Loop for the Test
Described in 10.3
FIG. X3.5 Circuit Diagram for Tests Described in 10.4
A 598/A 598M 02
13
FIG. X3.6 Flux-Current Loop with Combined dc Biasing Field, H
1
,
and Half-Wave Sine-Current Field, H
p
, as Used for Tests
Described in 10.4
FIG. X3.7 Circuit Diagram for Tests Described in 10.5
A 598/A 598M 02
14
FIG. X3.8 Flux-Current Loop with Combined dc Biasing Fields, H
1
, H
2
, and Half-Wave Sine-Current Field, H
p
, as Used for Tests
Described in 10.5
A 598/A 598M 02
15
FIG. X3.9 Composite Flux-Current Loops Showing Relationship of Various Test Conditions of the C.C.F.R. Test
A 598/A 598M 02
16
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FIG. X3.10 Characteristic Curve of Core Specimen Under Half-Wave ac Excitation and dc Reset Conditions
A 598/A 598M 02
17