Nabl 121 PDF

NABL 121
NABL
NATIONAL ACCREDITATION
BOARD FOR TESTING AND
CALIBRATION LABORATORIES
SPECIFIC CRITERIA
for CALIBRATION LABORATORIES
IN ELECTRO TECHNICAL
DISCIPLINE
ISSUE NO : 04
ISSUE DATE: 07.03.2007
AMENDMENT NO : 01
AMENDMENT DATE: 27.06.2012
AMENDMENT SHEET
Sl
Page
Clause
Date of
Amendment
No.
No.
Amendment
made
Reasons
Signatur
Signatur
e QM
e
Director
5,19,
1,14,
20,21,
Form 73,
22
27.06.2012
BMC is changed to
Adoption of ILAC
CMC
policy
Gen.
Remarks
10
National Accreditation Board for Testing and Calibration Laboratories

Doc. No: NABL 121
Issue No: 04
Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

Issue Date: 07. 03.2007
Amend No: 01
Amend Date: 27.06.2012
Page No: 1 / 53
CONTENTS
Sl
Title
Page No.
Amendment Sheet
Contents
Introduction
PART I : Specific Criteria for Accreditation of Calibration Laboratories in the

Field of
Electro-Technical Measurements
1.
Scope
2.
Criteria for Accreditation
3.
Scope of Accreditation
4.
Organisation
5.
Management System
6.
Personnel
7.
Accommodation and Environment Conditions
10
8.
Calibration Methods & Uncertainty of Measurement
13
9.
Equipment
15
10.
Measurement Traceability
16
11.
Handling of Calibration Items
17
12.
Proficiency Testing
17
13.
Calibration Certificate/ Report
18
14.
Guidance for Assessments and Scope Recommendation
19
PART II : Guidelines Regarding Generally Achieved Measurement

Capabilities in
Calibration for Electro-Technical Measurement
General Remarks and Environmental Conditions
22
1.
Table 1 : DC Voltage
23
2.
Table 2 : AC Voltage
24

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3.
Table 3 : L.F. & H.F. Voltage
25
4.
Table 4 : DC Current
28
5.
Table 5 : AC Current
29
6.
Table 6 : L.F. & H.F. Current
30
7.
Table 7 : AC Power & Energy
31
8.
Table 8 : L.F. & H.F. & Microwave Power
32
9.
Table 9 : AC Ratio
34
10.
Table 10 : Phase Angle
35
11.
Table 11 : L.F. & H.F. & Microwave Attenuation
36
12.
Table 12 : Capacitance & Dielectric Loss Angle (Tan) 50 Hz
38
13.
Table 13 : Capacitance (120 Hz & 1 kHz)
39
14.
Table 14 : L.F. & H.F. Capacitance
41
15.
Table 15 : Inductance (1 kHz)
43
16.
Table 16 : L.F. & H.F. Inductance
44
17.
Table 17 : DC Resistance
45
18.
Table 18 : AC Resistance 1 kHz
47
19.
Table 19 : L.F. & H.F. Impendence
48
20.
Table 20 : Microwave Impedence & Q Values
49
21.
Table 21 : Time and Frequency / Time Interval
50
22.
Table 22 : Magnetic Measurements
52
Technical Committee for Electro-Technical Measurement
53

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INTRODUCTION
This document specifies additional requirements for the calibration laboratories in the ElectroTechnical field and seeking NABL accreditation in accordance with ISO/ IEC 17025: 2005.
The specific requirements given in this document does not cover all the requirements of
ISO/IEC 17025: 2005 but only those clauses which need amplification and are stated as
additional requirements. These requirements should be read in conjunction with the relevant
requirements of ISO/IEC 17025:2005.
This criteria can be used by laboratories and those who are associated with the program of
accreditation of calibration laboratories e.g. experts, assessors, officials engaged with day-today activities of accreditation.
This document provides the laboratories with necessary information in preparing for
accreditation and the requirements for assessment / surveillance / reassessment.
The information in this document has been compiled in two parts.
PART I
Specific Criteria for Accreditation of Calibration Laboratories in the Field of ElectroTechnical Measurements
This part provides information on additional requirements for the laboratories engaged in
calibration in the field of Electro-Technical measurements, seeking accreditation in accordance
with ISO/ IEC 17025: 2005.
PART II
Guidelines Regarding Generally Achieved Measurement Capabilities in Calibration for
Electro-Technical Measurements
This part contains guidelines on uncertainties typically achieved in calibration laboratories for
Electro-technical parameters, if the laboratories use available standards and equipment of
different accuracy specifications.

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PART I
SPECIFIC CRITERIA FOR ACCREDITATION OF CALIBRATION

LABORATORIES IN THE FIELD OF ELECTRO-TECHNICAL
MEASUREMENTS
1.0
SCOPE
1.1
Calibration laboratories are accredited by NABL after it is demonstrated that a

laboratory complies with the requirements of international standard ISO/IEC 17025:
2005. In view of generic nature of the standard the requirements stated there in, need
to be further redefined in specific fields of calibration. This specific criteria lays down
those specific requirements in the field of Electro-technical calibration. This part of the
document thus amplifies the generic requirements for Electro-technical calibration and
supplement the requirements of ISO/IEC 17025:2005. Laboratories seeking NABL
accreditation in the field of Electro-technical calibration must also comply with the
requirements stated in this part.
1.2
Calibration and Measurement Capability (CMC) is one the parameters that is used by
NABL to define the scope of an accredited calibration laboratory, the others being
parameter/quantity measured, standard/master used, calibration method used and
measurement range. The CMC is expressed as "the smallest uncertainty that a
laboratory can achieve when calibrating the best existing device. It is an expanded
uncertainty estimated at a confidence level of approximately 95% corresponding to a
coverage factor k=2.
Note: Refer NABL 143 for NABL policy on Calibration and Measurement Capability
(CMC) and uncertainty in calibration
The laboratorys ability to achieve their claimed CMC shall be evaluated based on its
performance during the on-site assessment and by review of proficiency testing results,
wherein the laboratory has participated.
1.3
The definition of CMC implies that within its accreditation a laboratory is not permitted
to report a smaller uncertainty of measurement than the CMC endorsed on its scope of
accreditation. This means that the laboratory shall be required to state a uncertainty not
better than that corresponding to the CMC whenever it is established that the actual
calibration process adds significantly to the uncertainty of measurement. The CMC is
applicable only to the results for which the laboratory claims its status as accredited
laboratory. It is therefore a realistic means for customers to select and compare
accredited laboratories capabilities.

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The scope of accreditation of calibration laboratory shall be identified as source and

measure. Source shall define the sourcing capability of a laboratory where as measure
shall define the measuring capability of a laboratory.
1.4
All the parameters for which accreditation is sought must be expressed in S.I. Units,
wherever applicable.
2.0
CRITERIA FOR ACCREDITATION

Accreditation of an Electro-technical calibration laboratory will require assessment of
the laboratory for compliance to ISO/ IEC 17025: 2005 (General Requirements for the
Competence of Testing and Calibration Laboratories) and NABL 121 (Specific Criteria
for Calibration Laboratories in Electro-Technical Discipline).
3.0
SCOPE OF ACCREDITATION
3.1
The scope of accreditation of an accredited laboratory in the field of Electro-Technical

calibration shall be defined in terms of its capability to calibrate sources and/or of
measuring equipments for various parameters. Therefore, a scope should be identified
as Source and Measure because it provides more information to users of calibration
laboratories. Source as appearing in the accredited scope of the laboratory reflects
the sourcing capability of the laboratory (e.g. calibrators, discrete resistances,
inductance, capacitance, frequency generator etc). Measure as appearing in the
accredited scope of the laboratory reflects the measuring capability of the laboratory
(e.g. high end multimeters, frequency counters etc).
Laboratories can apply for accreditation for only source or only measure or both.
3.2
A calibration laboratory seeking accreditation to offer calibration services in the field of

Electro-Technical measurements will generally carry out calibration in:
a)
DIRECT CURRENT
Voltage, Resistance, Current, their Ratios and Power.

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b)
ALTERNATING CURRENT (Up to 1kHz)

Voltage, Current, Power, Energy, Voltage and Current Ratio, Phase Angle and
Power Factor, Resistance, Capacitance & Dielectric Loss Angle, Inductance &
Dissipation Factor.
c)
LOW FREQUENCY (1kHz to 30kHz)

Voltage, Current, Power, Energy, Voltage and Current Ratio, Phase Angle and
Power factor, Attenuation, resistance, Capacitance, Inductance, Dissipation
Factor, Modulation Index, Distortion and Noise, Impedance.
d)
HIGH FREQUENCY (30kHz to 1GHz)

Voltage, Current, Power, Attenuation, Lumped and Distributed Impedance,
Capacitance, Noise, Modulation Index, Distortion, Pulsed RF Voltage and
Power.
e)
MICROWAVE (1GHz and above)

Power, Impedance, Phase Shift, Attenuation, VSWR and Noise.
f)
SPECIAL HF INSTRUMENTS
EMI/ EMC related parameters including field strength and power density etc.
g)
TIME AND FREQUENCY

Time Instant, Time Interval, L.F. & H.F. Frequency, Microwave Frequency.
h)
MAGNETIC MEASUREMENTS
Flux Density, Field Strength, Magnetic losses and allied parameters, Area turns
(search coils).
i)
ELECTRICAL SIMULATION TECHNIQUES (THERMAL)

Temperature controller, indicator, simulator using simulation techniques.
4.0
ORGANISATION (clause 4.1 of ISO/IEC 17025:2005)
4.1
The calibration laboratory shall be organized in such a way that all staff members are
aware of both the extent and the limitations of their area of responsibility.
This
organization shall specify and document the responsibility and authority of the Head of
the calibration laboratory, Technical Manager and Quality Manager who will have direct
access to the top management. All personnel will perform or verify work affecting the
quality of calibrations as per general guidelines and specific criteria laid down for the
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accredited parameters. The calibration laboratory shall be organized in such a way so

as to ensure the integrity of its staff. The training of its employees and operations of the
laboratory shall be conducted for ensuring unbiased calibration.
4.2
The laboratory shall clearly nominate Authorized Signatory for authorizing calibration
certificates/ reports issued by the laboratory. Authorized signatories shall be approved
by NABL.
5.0
MANAGEMENT SYSTEM (clause 4.2 of ISO/IEC 17025:2005)
5.1
The calibration laboratory shall have a Quality Manual which shall be maintained up-todate and shall be in compliance with ISO/ IEC 17025: 2005 and NABL requirements,
with emphasis on following information:
a)
A quality policy statement, including objectives as evidence of commitment by the

top management.
b)
A statement on the organization of the calibration laboratory.
c)
Names, qualifications and experience of the persons responsible for managerial,

and scientific/ technical activities.
d)
A clearly defined charter of responsibility showing the relationship between

technical management, quality management and support services.
e)
Scope and operation of the laboratory along with information on measurement

capability and traceability of calibration results of measuring instruments including
reference and working standards to national measurement standards, which are
realization of SI system of units.
f)
The reference of document number on detailed calibration procedures adopted in

the laboratory, which should be compiled in the form of a manual for the use of
calibration staff.
g)
The reference list of all specification/standards being referred to or used in the

performance
of
calibration
work
(copies
of
such
specifications/standard
specifications should be available in the laboratory for the use of calibration staff.)
h)
All amendments made in any of the documents must be updated and listed in the
relevant document.

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5.2
The calibration facilities established in accordance with the general guidelines and
specific criteria shall be audited periodically and reviewed by or on behalf of the
management to ensure the continued effectiveness of the system.
5.3
The calibration laboratory shall clearly specify, document and make known to the
customers, the administrative and other procedures to be followed for getting
calibration done from the laboratory. The procedure for redressal of complaints should
also be clearly specified and documented.
5.4
The laboratory shall have authorized signatories for approving and issuing calibration
certificates for each calibration parameter as mentioned in the scope of accreditation.
Any officer competent to evaluate calibration results critically and occupying a position
involving responsibility for the adequacy of calibration results is eligible for approval by
NABL as an authorized signatory of endorsed calibration documents. Approved
authorized signatories must demonstrate understanding of NABL requirements, and
must be competent in the relevant area of calibration.
6.0
PERSONNEL (clause 5.2 of ISO/IEC 17025:2005)
6.1
The calibration laboratory shall have adequate number of qualified competent and
trained personnel as follows:
Laboratory personnel performing calibration: Diploma in Engineering (relevant branch)
or Science graduate (with Physics, Chemistry and Mathematics) with 1 year of relevant
experience or ITI with at least 5 years of relevant experience.
Authorized Signatory: Bachelor of Engineering/Post Graduate in Science (relevant
branch) with 1 year of relevant experience or Diploma in Engineering (relevant branch)
with minimum 3 years of relevant experience.
The relevant experience should be in the field of Electro-Technical measurements and
calibration practices. For any relaxation in terms of qualification and experience for
above personnel, the assessment team should give explicit reasons and written
recommendations on their competence.
6.2
Arrangements for improvement of qualifications and periodic refresher courses and

practical training should also exist for the laboratory personnel so as to keep them in
touch with latest developments in the relevant fields.

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7.0
ACCOMMODATION AND ENVIRONMENTAL CONDITIONS
(clause 5.3 of
ISO/IEC 17025:2005)
7.1
GENERAL
7.1.1
The environmental conditions maintained in the laboratory shall be such that it does not
adversely affect the required accuracy of measurement. Facilities should be provided
for recording environmental parameters such as temperature, humidity etc. prevailing
during calibration. The environmental conditions maintained in the laboratory during
calibration should be reported in the calibration report/ certificate.
Wherever applicable, laboratory is required to maintain appropriate environmental
conditions related to Line regulation, Harmonic content in supply voltage, EMI/EMC,
Stray magnetic fields , Vibration, Dust level, Acoustic noise level, Illumination level etc
and keep a record of the same.
7.1.2
The laboratory shall specify limits on the environmental conditions to be achieved in the
laboratory. The condition shall be appropriate to the level of its capability required for
the calibration undertaken by the laboratory.
7.1.3
The environmental conditions shall be monitored at appropriate intervals and

calibrations stopped when the environmental conditions are observed to be outside the
specified limits.
7.1.4
As far as possible, only the staff engaged in the calibration activity shall be permitted
entry inside the calibration area. Access of other persons shall be controlled and
defined.
7.2
SPECIAL ENVIRONMENTAL REQUIREMENTS OF LABORATORY
7.2.1
The calibration laboratory shall make arrangements for regulated and uninterrupted
power supply. The recommended regulation level is 1% or better on the calibration
bench.

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7.2.2
Relevant IS specifications (IS: 1248, IS: 4722) regarding total harmonic content and
variation in supply frequency should be followed. Voltage stabilizers of low harmonic
content and variation in supply frequency should be used to comply with these
requirements.
7.2.3
For Inductance (low frequency) and DC Resistance, the temperature variation must be
controlled such that the calibration uncertainty does not exceed 10% due to
temperature variation.
7.2.4
For High Voltage Capacitors/ Transformers, the temperature variation should be < 1
during calibration period. The inductive voltage divider should be protected against the
effects of AC magnetic fields.
7.2.5
For High voltage calibration, temperature and humidity shall be recorded by the
laboratory and correction shall be applied wherever required.
7.2.6
The laboratory shall use, if necessary, isolation transformers and filters etc. to ensure
minimization of ground current and effects of mains hum interference.
7.2.7
The power supply to the calibration laboratory shall be directly obtained from the
substation as far as possible and shall not be on the same feeder line which is
supplying power to workshops and other production areas which require operation of
heavy duty machines.
7.2.8
The calibration area shall be adequately free from vibrations generated by central airconditioning plants, vehicular traffic and other sources to ensure consistent and uniform
operational conditions. The laboratory shall take all special/ protective precautions like
mounting of sensitive apparatus on vibration free tables and pillars etc., isolated from
the floor, if necessary.
7.2.9
Acoustic noise level in the laboratory shall be maintained to facilitate proper

performance of calibration work. A threshold noise level of 60 dBA is recommended
unless otherwise stated.

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7.2.10 The calibration area shall have adequate level of illumination. Where permissible,
fluorescent lighting is preferred to avoid localized heating and temperature drift. The
recommended level of illumination is 450-700 lux on the working table with glare index
of 19 for the laboratory.
7.2.11 Effective earthing shall be provided for mains in accordance with relevant specification
IS: 3043. Laboratories are required to maintain earth resistance to less than 1 ohm and
earth to neutral voltage to less than 1 volt. This shall be periodically checked and stray
couplings minimized.
7.2.12 Special care shall be taken about the location of magnetic field sources like,
transformers, looped wires, ferrous materials etc., in order to minimize magnetic
interference in the measurements.
7.2.13 Adequate screening of the laboratory against electromagnetic interference may be
done if necessary. By pass filters should also be provided to minimize conducted
interference effect on the electronic equipment. Special shielding chambers should be
provided in the laboratory for measurements, particularly when signal to noise ratio is a
disturbing factor for accurate measurements.
7.2.14 The reference standards shall be maintained at temperatures specified for their
maintenance in order to ensure their conformance to the required level of operation.
The laboratory should have specific facilities required for carrying out the calibration of
parameters chosen.
7.2.15 The laboratory shall be sealed against dust and external air pressure. Positive air
pressure, if necessary shall be maintained inside the laboratory.
7.2.16 Adequate protective measures, like use of transient suppressors etc, shall be taken by
the laboratory to ward off high current spikes and transients emanating from switching
on and off, of heavy machines, surges in power lines and other such reasons, from
reaching the electronics equipment in general and computer based systems involving
data storage facilities in particular.

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7.3
SAFETY PRECAUTIONS
7.3.1
Relevant fire extinguishing equipment for possible fire hazards should be available in
the corridors or convenient places in the laboratory. Adequate safety measures against
electrical, chemical fire hazards must be available at the work place. Laboratory rooms/
areas where highly inflammable materials are used/ stored should be identified. Access
to relevant fire equipment should be assured near these rooms/ areas.
7.3.2
Specification SP.31-1986, a special publication in the form of a wall chart, giving the
method of treatment in case of electric shock, should be followed. The chart should be
placed near the power supply switchgear and at other prominent places as prescribed
under Indian Electricity Rules 1956.
8.0
CALIBRATION METHODS AND UNCERTAINTY OF MEASUREMENT (clause

5.4 of ISO/IEC 17025:2005 )
8.1
COMPARISON METHOD OF CALIBRATION
The laboratory while using the comparison method of calibration (using a nominal
source of good short term stability and a measurement standard/master) shall devise
methods to evaluate the short term stability of the sources/supply. Records of the short
term stability shall be available with the laboratory for verification by NABL.
For comparison method of calibration, it is not mandatory to calibrate the
source/supply. However, the laboratory is required to demonstrate the short term
stability of the source/supply during the assessment.
The suitability of the comparison method (especially in case of low voltage, low/high
current, low/high resistance, high frequency voltage measurements) shall be
established by the laboratory by studying the effects of factors like capacitive / inductive
/ resistive loading, allowable current, compliance voltage etc. on measurement.
Assessor shall verify the same during assessments.
The stability data generated by the laboratory for the source/supply needs to be used
as a Type-B contribution towards uncertainty of calibration. Other possible contributions
towards Type-B, depending on the type of comparison method used, shall have to be
identified by the laboratory and included in the uncertainty budget. This shall be verified
by the assessor during assessment.

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8.2
VALIDATION OF SOFTWARE
Any software used by laboratories for performing automated calibration shall be

validated so that all parameters and ranges intended to be calibrated using the
software are taken care of. Records for the same shall be available with the laboratory
during assessment. Such software needs to be verified by the user laboratory
periodically. Periodicity of these verifications may be decided by the user laboratory.
Re-validation of software is required whenever there is a change in the version of the
software used.
8.3
MINIMUM TYPE B COMPONENTS FOR UNCERTAINTY CALCULATIONS
The following Type B components shall be necessarily considered as a minimum for

estimation of measurement uncertainty:
U1: Uncertainty reported in the calibration certificate of the standard(s)/master(s)
U2:
Uncertainty
arising
from
stability
data
of
the
measurement
standard(s)/master(s) used for calibration (Detailed explanation for this component

is provided below)
U3: Uncertainty from the resolution of the Device/Unit under Calibration
U4, U5 etc: Uncertainty due to other influential factors such as temperature,
humidity variation etc affecting the measurements.
Clarifications pertaining to U2 component:
Stability data shall be generated by laboratories by preparation of control /trend charts
based on successive calibration of their standard(s)/master(s) (preferably without
adjustments)*. This shall be established by laboratories within two years from the date
on which laboratories apply for NABL accreditation. For the accredited laboratories, this
shall be established within a period of two years w.e.f. the date of this issue.

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The laboratories may need to get their standard(s)/master(s) calibrated more

frequently to generate the stability data within the above stipulated time.
Till
such
time,
the
stability
data
provided
by
the
manufacturer
of
the
standard(s)/master(s) can be utilized for estimation of uncertainty. In case the stability

data from the manufacturer is also not available, the accuracy specification as
provided by the manufacturer can be used. However, manufacturers data will not be
acceptable after the two year period as mentioned above since the laboratories are
expected to establish their own stability data by that period.
* In cases where the standard(s)/master(s) are adjusted during its calibration, preadjustment data needs to be used for preparation of control/trend charts.
9.0
EQUIPMENT (clause 5.5 of ISO/IEC 17025:2005)
9.1
The calibration laboratory shall have measurement standards and equipment of

required accuracy in respect of each parameter covered by it in order to be able to
realize and to substantiate the corresponding measurement capability claimed.
Stability of the standards, accuracy of the values realized through them and
repeatability, should be regularly monitored.
9.2
Any bias resulting from ageing of standards should be precisely determined.

Instructions for operating each standard and equipment/ instrument should be readily
available for use by the laboratory staff members.
9.3
The standards/ measuring equipment of the laboratory should be calibrated at regular

intervals, with higher accuracy standards. The calibration certificates, performance
history sheets in respect of the reference secondary/ working standards and measuring
equipment should be held safely by the laboratory.
9.4
Proper record shall be maintained for each standard and equipment with the following
information:
a)
Name of the equipment
b)
Manufacturers name and address
c)
Type, range, identification and serial number
d)
Date of procurement and commissioning
e)
Details of Calibration
f)
Details of maintenance and repairs

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9.5
g)
Performance history with dates
h)
Availability of service manual
Details of periodic calibration schedule of new and old standards and measuring
equipment should be worked out in consultation with higher capability laboratory and
this schedule should be observed.
9.6
Details of re-calibration of used, serviced and repaired equipment should also be

available and proper precautions shall be observed to identify equipment, which are not
in service.
9.7
Any alterations in the observations/ data shall be signed by the calibration staff and
duly authenticated. Instructions to this effect should be printed on data sheet used for
writing observations/ data in the laboratory.
9.8
REPAIR AND MAINTENANCE
9.8.1
A separate repair and maintenance facility, adequately equipped with repair facilities
and qualified and experienced manpower, shall be available in-house or by any other
means effectively accessible to the calibration laboratory. This facility shall also assist
in identifying the preventive maintenance measures, which should be brought to the
attention of the personnel engaged in calibration work for taking necessary actions. The
repair facility should cover digital and programmable instruments also.
9.8.2
Every repaired equipment shall invariably be re-calibrated through in-house facility or

by higher capabilities laboratory before being used for further calibration work.
10.0
MEASUREMENT TRACEABILITY (clause 5.6 of ISO/IEC 17025:2005)
10.1
All calibration laboratories shall follow NABL 142 (Policy on Calibration and Traceability
of Measurements) to achieve traceability. For this (irrespective of manual and software
calibrations), standard(s)/master(s) used by laboratories need to be calibrated for all
parameters and ranges under its scope of accreditation. For each range,
standard(s)/master(s) are required to be calibrated at least at two points (preferably
minimum and maximum points) of the range assuming ranges to be linear.

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10.2
When same standard(s)/master(s) are used both for a parameter and its derived
parameter (e.g. reciprocal counter for measurement of Time and Frequency),
traceability achieved for the main parameter automatically ensures traceability for the
derived parameter. However, the derived parameter(s) needs to be separately
demonstrated identifying the appropriate uncertainty contributions and subsequently
included in the scope of accreditation.
11.0
HANDLING OF CALIBRATION ITEMS (clause 5.8 of ISO/IEC 17025:2005)
11.1
The standards/ measuring instruments/ equipment received by the laboratory for

calibration shall be safely stored in proper environmental conditions according to the
instructions given by the customer/manufacturer.
11.2
The laboratory shall have adequate arrangements for packaging of calibrated

instruments and may assist the user, if necessary, about the procedure and
precautions to be taken by the organization for packaging and transportation of the
equipment to the calibration laboratory.
12.0
PROFICIENCY TESTING (clause 5.9 of ISO/IEC 17025:2005)
12.1
Laboratories shall follow NABL 163 (Policy & Procedures for Inter-Laboratory
Comparisons and / or Proficiency Testing) and NABL 164 (Guidelines for interlaboratory comparison for calibration laboratories where formal PT programs are not
available) for participation in PT/ILC programs.
12.2
In order to assure validity of calibrations undertaken and demonstrate its technical

competence, a laboratory will be required to participate, from time to time, in
Proficiency Testing Programs. The laboratory shall remain prepared to participate in
the Proficiency Testing Program through inter-laboratory, inter-comparison schemes
wherever it is technically feasible. In case any abnormalities, in terms of En number are
detected through these inter-comparisons, appropriate corrective action will be taken,
the standards/ equipment shall be replaced/ repaired and re-calibrated with a higher
accuracy standard. Reports on such inter-comparisons should be documented with
reference. The Proficiency Testing practice should be included in the Quality Manual.

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13.0
CALIBRATION CERTIFICATE/ REPORT (clause 5.10 of ISO/IEC 17025:2005)
13.1
The result of calibration carried out by the calibration laboratory, shall be presented in a
comprehensive manner, using a standard format which shall unambiguously and
objectively present the measurement results and all relevant information in order to
facilitate easy comprehension and usage.
13.2
The calibration report/ certificate shall include the following additional information:
a)
Date of receipt of the item and date of completion of the calibration work.
b)
Environmental conditions maintained during the measurements.
c)
Signature and title of authorized person (authorized signatory) accepting

responsibility for the report and date of issue.
d)
A statement of the accreditation measurement capability relevant to the job

under calibration.
e)
NABL Symbol identifying the scope of accreditation of the laboratory.
f)
The Uncertainty of measurement.
g)
An evidence that the measurements are traceable to National/ International

Standards through unbroken chain of Accredited Laboratories.
13.3
The calibration report/ certificate shall not contain any recommendation on the
calibration interval except where this has been agreed with the client. This requirement
may be superseded by legal regulations.
13.4
Laboratories accredited for main parameters are not allowed to use NABL symbol for
parameters derived from these parameters since the associated uncertainty of the
derived parameter is not known and the same is not verified by NABL.
13.5
All laboratories are required to retain a replica (either hard copy or soft copy ) of the
certificates issued to their customers. Laboratory may decide on the appropriate
retention period.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date:--
Page No: 18 / 53
14.0
GUIDANCE FOR ASSESSMENTS AND SCOPE RECOMMENDATION
14.1
For initial assessment, the calibration for each parameter, as applied by the laboratory,
shall be witnessed. For all ranges under a parameter, atleast the minimum and
maximum point of a range, shall be witnessed. The witnessing may be reduced if
proper records are available with the laboratory. This needs to be examined by the
assessor. The assessor may select additional appropriate critical points for evaluating
the laboratorys competence.
For surveillances and re-assessments, sampling plan for witnessing of parameters /
ranges, provided by NABL shall be followed as far as possible.
14.2
Recommendation of scope shall be in the order- source and / or measure wise,

parameter-wise and range wise, as shown as an example in Form 73 (Recommended
Scope of Accreditation) in the next page.
In special cases, e.g. calibration of
oscilloscopes, electrostatic discharge etc, the scope shall be recommended instrumentwise, keeping in mind the uniqueness of calibration or the customer requirement.
14.3
AC parameters to be recommended as under (frequency ranges followed by

voltage/current ranges).
Resistance parameter should be clearly recommended as AC or DC.
For oscilloscope calibration, minimum parameters that need to be calibrated are
amplitude, time base and bandwidth.
14.4
The recommended ranges shall be split on the basis of capability of the

standard(s)/master(s) used and different methods/procedures adopted by the
laboratory. It is advisable to split ranges to keep less variation in Calibration and
Measurement Capability (CMC) and shall be split in such a manner that linearity is
ensured for each range. Wherever linearity is not possible in a range, single value shall
be recommended.
When single value standard(s) /master(s) are used, recommendation shall also be a
single value.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 01
Page No: 19 / 52
14.5
Laboratories are expected to report measurement uncertainty in SI units in the

calibration certificates issued by them. It is desirable that NABL assessor recommends
CMC in SI units (wherever possible). The assessor shall recommend the CMC of each
range giving due consideration to factors like laboratorys claim and demonstrated
uncertainty and shall be rounded off to two significant digits.
14.6
In form 73, Remarks/Methods column will mention the specific calibration method
used by the laboratory e.g. comparison method, null method etc.
Wherever required, foot notes may be added to the scope of accreditation for the
purpose of clarity and/or completeness.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 01
Page No: 20 / 52
Form 73
RECOMMENDED SCOPE OF ACCREDITATION

(For Calibration Laboratories)
Laboratory:
Date(s) of visit:
Facility:
Sl
Discipline(s):
Parameter /
Quantity
measured
(equipment
wise)
Measure
Standards /
Masters
Used
AC Voltage
Fluke
8508A
DMM
DC Voltage
Fluke
8508A
DMM
Source
Range(s)*
Calibration and measurement capability**

Claimed by Laboratory
Observed by Assessor
Recommended by
Assessor
10Hz to 10kHz
1mV to 100mV
100mV to 100V
100V to 1000V
0.002mV to 0.006mV
0.006mV to 0.017V
0.017V to 0.022V
0.004mV to 0.016mV
0.016mV to 0.013V
0.013V to 0.018V
0.004mV to 0.016mV
0.016mV to 0.017V
0.017V to 0.022V
10kHz to
100kHz
1mV to 100mV
100mV to 100V
100V to 1000V
0.0069mV to 0.03mV
0.03mV to 0.14V
0.14V to 0.91V
0.0069mV to 0.43mV
0.43mV to 0.1V
0.1V to 0.81V
0.0069mV to 0.43mV
0.43mV to 0.14V
0.14V to 0.91V
100V to 10mV
10mV to 100mV
0.012 V to 0.0042mV
0.0042mV to 0.0005mV
0.012 V to 0.0042mV
0.0042mV to 0.0004mV
0.012 V to 0.0042mV
0.0042mV to 0.0005mV
SAMPLE
DC
Resistance
Wavetek
4808
Calibrator
0.0004m to 0.012
1m to 10
0.012 to 0.0011k
10 to 100k
100k to 100M 0.011k to 0.019M
0.0004m to 0.042
0.042 to 0.0021k
0.021k to 0.026M
0.0004m to 0.042
0.042 to 0.0021k
0.021k to 0.026M
DC Current
Wavetek
4808
Calibrator
100A to 100mA 0.004A to 0.005mA

0.005mA to 0.00011A
100mA to 1A
0.00011A to 0.001A
1A to 10 A
0.014A to 0.006mA
0.006mA to 0.00014A
0.00014A to 0.0029A
0.014A to 0.006mA
0.006mA to 0.00014A
0.00014A to 0.0029A
For Electro-technical Discipline, wherever applicable, the ranges may be mentioned frequency wise
** Calibration and measurement capability is expressed as measurement uncertainty at a confidence level of 95%
Signature & Name of

Lab Representative
Signature & Name of

Assessor(s)
Signature & Name of

Lead Assessor

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 01
Page No: 21 / 52
Remark
/ Method
used
PART II
GUIDELINES REGARDING GENERALLY ACHIEVED

MEASUREMENT CAPABILITES IN CALIBRATION FOR
ELECTRO-TECHNICAL MEASUREMENT
(TABLES ARE ARRANGED PARAMETER WISE COVERING ALL FREQUENCY RANGES)
GENERAL REMARKS
The following pages may be referred as guidelines and not mandatory requirements for the
laboratories. The accredited calibration laboratories are no longer required to be categorized
into Echelon/ level I, II, III.
Part II of this document aims at providing guidance to the
laboratories with respect to environmental conditions to be maintained as appropriate to

respective CMC of the laboratories. The laboratories, on their own, should decide to have
environmental conditions in their calibration area to achieve the CMC claimed in their scope of
accreditation applied for. The tables given in subsequent pages show that generally achieved
measurement capabilities expressed as expanded uncertainty in Electro-technical calibration
laboratories if the laboratories control environmental condition as given in the table for various
levels viz. I, II and III. Further, It may also be noted that:
1)
The measurement capability is expressed as expanded uncertainty at a confidence level

of 95% approximately.
2)
The term uncertainty in these tables pertains to the corresponding measurement

capability of the laboratory in respect of each parameter
3)
The values of uncertainty of measurement shown in the following tables are at 95%
confidence level unless stated otherwise.
ENVIRONMENTAL CONDITIONS
Standard environmental conditions for calibration laboratory in an Electro-Technical
Measurement Laboratory shall be as follows:
Level
II
III
Temperature
250C 0.50C
250C 2.50C
250C 4.00C
Relative humidity
350C to 65%
35 to 65%
not to exceed 70%

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 01
Page No: 22 / 52
TABLE 1
DC VOLTAGE
Parameter
Standard Values/
Ranges
Uncertainty
Level-I
DC Voltage
DC Voltage
Level-II
Level-III
a) Standard Values
-4
1x10
-5
1x10
-6
1x10
-6
2x10
-6
5x10
-6
1x10
-6
5x10
1mV
1x10
10mV
1x10
100mV
1x10
1V
1x10
10V
1x10
100V
2x10
1000V
5x10
-3
5x10
-3
-4
5x10
-5
5x10
-6
1x10
-6
5x10
-5
1x10
-5
5x10
-4
-5
-5
-5
-4
-4
b) Measurement Capability
-2
-3
5x10 to 1x10
-3
-4
1x10 to 5x10
-4
-5
5x10 to 5x10
-5
-6
5x10 to 5x10
-6
-6
5x10 to 5x10
-6
-6
5x10 to 1x10
-6
-6
1x10 to 5x10
-6
-5
5x10 to 1x10
-5
-5
1x10 to 2x10
-5
-4
2x10 to 1x10
10 V to 100 V
5x10 to 5x10
100 V to 1mV
5x10 to 5x10
1mV to 10mV
5x10 to 5x10
10mV to 100mV
5x10 to 5x10
100mV to 1V
5x10 to 1x10
1 to 10V
1x10 to 2x10
10 to 100V
2x10 to 5x10
100 to 1000V
5x10 to 2x10
1000 to 1500V
2x10 to 5x10
1500 to 100kV
5x10 to 2x10
-2
-2
-2
-3
2x10 to 1x10
-3
-4
1x10 to 1x10
-4
-5
1x10 to 1x10
-5
-6
1x10 to 2x10
-6
-5
2x10 to 2x10
-5
-5
2x10 to 2x10
-5
-4
2x10 to 2x10
-4
-4
2x10 to 5x10
-4
-2
To be worked out
-2
-2
-2
-3
-3
-4
-4
-5
-5
-4
-4
-3
-3
-2
-2
-2

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 23 / 53
TABLE 2
AC VOLTAGE
Parameter
AC Voltage
AC Voltage
Standard
Values/
Ranges
Uncertainty
Frequency Level-I
Level-II
Level-III
a) Standard Values
-4
1x10
-4
1x10
-5
1x10
-5
5x10
-6
2x10
-6
2x10
-5
2x10
-5
5x10
-5
5x10
-5
5x10
-5
5x10
10 V
50 Hz
5x10
10mV
,,
1x10
100mV
,,
5x10
250mV
,,
2x10
1V
,,
5x10
3V
,,
5x10
10V
,,
1x10
30V
,,
1x10
100V
,,
5x10
300V
,,
5x10
1000V
,,
5x10
-3
1x10
-2
-3
5x10
-3
2x10
-4
2x10
-4
2x10
-4
2x10
-4
2x10
-4
2x10
-4
2x10
-4
5x10
-4
5x10
-2
5x10
-3
-3
-3
-3
-3
-3
-3
-3
-3
-3
-4
-4
10V-10mV
,,
5x10 to 1x10
10mV-250mV
,,
1x10
250mV-3V
,,
1x10
3V-300V
,,
2x10 to 1x10
300V-1kV
,,
1x10
1kV-40kV
,,
1x10 to 5x10
1x10
>40kV
,,
__
2x10
-2
5x10
-4
5x10 to 1x10
-5
1x10 to 5x10
-5
-4
-4
-4
-2
-3
1x10 to 5x10
-3
-4
5x10 to 2x10
-4
-3
2x10 to 5x10
-3
-3
5x10
5x10 to 1x10
1x10 to 2x10
-4
-1
-3
-3
-3
-3
-3
-3
-2
2x10
-2
-2
5x10
-2

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
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TABLE 3
L.F. & H.F. VOLTAGE
Parameter
L.F.
Voltage
Standard
Values/
Range
Frequency
Uncertainty
Level-I
Level-II
Level-III
a) Standard Values
1mV
-5
-4
1x10
-5
-4
1x10
-5
-3
1x10
-6
-5
2x10
-6
-5
2x10
1kHz to 30 kHz 5x10 to 1x10
10mV
,,
5x10 to 1x10
100mV
,,
5x10 to 1x10
1V
,,
5x10 to 1x10
3V
,,
5x10 to 1x10
10V
,,
2x10
100V
,,
-3
__
-3
5x10
-3
2x10
-4
2x10
-4
2x10
-4
2x10
-4
-3
-3
Primary Standard
-3
-3
-6
2x10
-3
5x10
-6
5x10
2x10
__
__
__
-3
1V to 10V
1kHz to 10kHz
10V to 1mV
,,
-4
-4
5x10 to 1x10
-2
-3
-4
-3
5x10 to 1x10
To be worked
out later
5x10 to 1x10
-4
1x10
-4
1x10
1mV to 10mV
,,
1x10
10mV to 250mV
,,
1x10
10V to 10mV
-3
1x10
-2
-3
1x10
-2
5x10
-2
-2
-4
5x10
-5
-4
5x10 to 2x10
-5
-5
1x10 to 5x10
10kHz to 30kHz 1x10 to 1x10
10mV to 250mV
,,
5x10 to 1x10
250mV to 3V
,,
2x10 to 2x10
3V to 300V
1kHz to 30kHz
2x10 to 1x10
300V to 1kV
,,
-5
-4
1x10
-4
-2
-3
-3
2x10 to 5x10
-3
1x10 to 5x10
-4
5x10 to 1x10
-3
1x10
5x10 to 1x10
3
1x10 to 2x10
-2
-2
-2
-3
-3
-2
-2
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 25 / 53
Table 3Contd.
H.F.
Voltage
(a) Standard Values

-2
__
-3
2x10
-5
5x10
-4
5x10
-5
10V
100kHz
2x10
1mV
,,
1x10
1V
,,
2x10
10V
,,
2x10
100V
,,
5x10
10V
30MHz
2x10
1mV
,,
5x10
1V
,,
1.5x10
10V
,,
1.5x10
100V
,,
2x10
10V
100MHz
3x10
1mV
,,
1x10
1V
,,
3x10
10V
,,
5x10
100V
,,
5x10
10V
300MHz
3x10
1mV
,,
1.5x10
1V
,,
3x10
10V
,,
5x10
10V
1000MHz
3x10
__
-3
__
-4
1x10
-4
1x10
5x10
-4
__
-2
__
__
-3
1x10
-3
-3
-2
__
-3
__
-3
__
-3
-3
5x10
-5
5x10
-3
5x10 (50V)
__
-2
__
__
-2
__
__
-3
1x10
-3
-2
__
1x10
-2
__
-3
__
__
-2
__
__
-2
-3
2x10
-3
-2
-2
1mV
,,
1.5x10
1V
,,
5x10
10V
,,
1x10 (7V)
-3
-2
__
3x10
-2
__
__
__
__
__
-2
3x10
__
-2
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 26 / 53
Table 3Contd.
(b) Measurement Capacity
10V-250mV
250mV-10V
-4
-2
30kHz-1MHz
2x10 to2x10
1MHz100MHz
2x10 to 3x10
100 MHz1GHz
1x10 to 4x10
30kHz-1MHz
1x10 to 2x10
-2
-3
-2
3x10
-2
-2
-2
3x10 to 5x10
-4
-4
1x10
-4
-3
1x10
-2
1MHz-100MHz 2x10 to 5x10

-3
-2
100 MHz-1GHz 5x10 to 1.5x10

10V-100V
30kHz-1MHz
30kHz-100kHz 1x10
-2
-1
,,
-3
,,
-2
,,
-2
,,
3x10
-4
5x10 to 1x10
-4
-2
1x10 to 3x10
-4
-2
3x10 to 1x10
In all ranges
-4
1x10 to 5x10
1MHz-100MHz 2x10 to 1x10

100V-300V
-2
1x10 to3x10
-3
-2
-2
-2
-2
-2
3x10 to 5x10
,,
,,

Doc. No: NABL 121
Issue No: 04

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Amend No: 00
Amend Date: --
Page No: 27 / 53
TABLE 4
DC CURRENT
Parameter
Standard
Value/Range
Uncertainty
Level-I
Level-II
Level-III
a) Standard Values
DC Current
-3
5x10
-4
1x10
-4
5x10
-5
1x10
-5
2x10
-6
1x10
-6
5x10
-6
2x10
-5
5x10
1A
1x10
10A
5x10
100A
1x10
1mA
5x10
10mA
1x10
100mA
5x10
1A
2x10
10A
5x10
100A
1x10
-2
1x10
-1
-3
5x10
-4
1x10
-4
5x10
-5
5x10
-5
2x10
-6
1x10
-5
1x10
-5
2x10
-3
-3
-4
-5
-5
-5
-4
-4
DC Current
-2
-5
1A to 1mA
*5x10 to 5x10
1mA to 1A
5x10 to 2x10
1A to 10A
2x10 to 5x10
10A to 100A
5x10 to 1x10
100A to 1000A
1x10 to 1x10
1000A to 5000A
1x10 to 5x10
-1
-4
2x10 to 2x10
-4
-6
2x10 to 2x10
-6
-6
2x10 to 2x10
-5
-4
2x10 to 5x10
-4
-3
5x10 to 5x10
-3
-2
5x10 to 5x10
1x10 to 1x10
-5
-6
1x10 to 5x10
-6
-6
5x10 to 2x10
-6
-5
2x10 to 1x10
-5
-4
1x10 to 1x10
-4
-3
1x10 to 1x10
-1
-4
-4
-5
-5
-4
-4
-4
-4
-3
-3
-2
Requirements of current measurements associated with active semiconductors have been taken into
account.

Doc. No: NABL 121
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Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 28 / 53
TABLE 5
AC CURRENT
Parameter
Standard
Values/ Range
Frequency
Uncertainty
Level-I
AC Current
Level-II
Level-III
(a) Standard Values

1mA
50 Hz-1kHz
5mA
,,
5x10
10mA
,,
,,
100mA
,,
1A
10A
-5
-4
-3
5x10 to 1x10
at selected
values
To be worked
out later
5x10
,,
,,
,,
,,
,,
,,
,,
,,
,,
,,
-5
(b) Measurement Capability
-4
5x10
-4
5x10
-4
1x10
5x10
-4
1x10
__
1x10
1mA to 1A
,,
1x10
1A to 20A
,,
1x10
20A to 100A*
,,
5x10
100A to 1000A*
,,
1kA to 30
kA/100kA*
,,
-4
5x10
-3
-4
5x10
-4
1x10
-3
1x10
-2
5x10
-3
-2
-2
-2
Only at 50/60 Hz

Doc. No: NABL 121
Issue No: 04

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Amend No: 00
Amend Date: --
Page No: 29 / 53
TABLE 6
L.F. & H.F. CURRENT
Parameter Standard
Values/
Range
(i) L.F.
Current
Frequency
Uncertainty
Level-I
Level-II
Level-III
(a) Standard Values
1mA
1kHz-30kHz
-5
To be worked out
later
-5
,,
,,
-5
,,
,,
-5
,,
,,
5x10
5mA
,,
5x10
10mA
,,
5x10
100mA
,,
5x10
To worked out
later
(ii) H.F.
Current
-4
5x10
-4
5x10
-4
1x10
-3
5x10
-5
To be worked out
later
To be worked out
later
-5
,,
,,
-4
,,
,,
1mA to 1A
,,
1x10
1A to 20A
,,
5x10
30kHz100kHz
5x10
10mA
,,
5x10
100mA
,,
1x10
-3
-3
(a)Standard Values
1mA

-5
-4
5x10 to 7x10
-4
-4
5x10 to 7x10
-4
-4
5x10 to 1x10
1mA to
100mA
,,
5x10 to 1x10
100mA to 5A
,,
1x10 to 2x10
5A to 20A
,,
2x10 to 5x10
-4
-4
1x10 to 5x10
-3
-3
-4
-4
1x10 to 5x10
-3
-3
-4
-3
__

Doc. No: NABL 121
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Amend No: 00
Amend Date: --
Page No: 30 / 53
TABLE 7
AC POWER & ENERGY
Parameter
(i) AC Power
Standards
Values/
Range
Frequency
Uncertainty
Level-I
Level-II
Level-III
Single phase
100mW-2 kW
UPF
0.5PF
0.2PF
-4
5x10
-4
5x10
50Hz
1x10
,,
1x10
-4
1x10
-4
1x10
-3
5x10
-3
2x10 to 5x10
-3
2x10 to 5x10
-3
2x10 to 5x10
-3
2x10 to 5x10
-3
5x10
-4
2x10
-4
1x10
-4
1x10
-4
1x10
-4
1x10
-3
1x10
,,
2x10
0.5PF
,,
5x10
UPF
,,
2x10
Below 0.5PF
,,
8x10
,,
1x10
1 to 0.5PF
,,
1x10
Below 0.5PF
,,
-3
-3
-3
2kW-50kW
-3
-3
-3
-3
-3
-3
-3
-3
Three phase
1W-5kW
1 to 0.5PF
5kW-50kW
AC Energy
__
-3
__
__
Single Phase
1Wh to 2kWh
-4
5x10 to
-3
1x10
-4
2x10
-4
1x10 to
-3
2x10
-4
2x10
-4
2x10
a) 0.5 to UPF
,,
1x10
b) 0.2PF
,,
2x10
,,
5x10
0.5 to UPF
,,
1x10
5kWh to 1MWh
,,
1x10
0.5 to UPF
,,
0.1x10
-4
2x10 to 5x10
-3
-3
-3
5x10
-3
5x10
-3
5x10
-3
5x10
-3
5x10 to 1x10
-3
2kWh to
100kWh
0.2 to UPF
-3
Three Phase
1Wh to 5kWh
-3
2x10 to
-3
5x10
-3
-3
-3
-2

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 31 / 53
TABLE 8
L.F., H.F. & MICROWAVE POWER
Parameter
i) L.F. Power
Standard
Values/
Ranges
Frequency
Uncertainty
Level-I
Level-II
Level-III
a) Standard Values
-4
1x10
-4
1x10
-4
1x10
1mW
1kHz
1x10
1W
,,
1x10
1kW
,,
1x10
-3
To be worked
out later
-3
,,
-3
,,
-3
2x10
-3
2x10
ii) H.F.
Power
-4
-3
5x10
-3
-3
5x10
-3
-2
1.5x10
3x10 to 5x10
-3
-3
1.510
-2
3x10 to 5x10
-3
-2
1.5x10
-3
-2
1.5x10
-3
-3
1.5x10
1mV to 100W
1kHz to
30kHz
5x10 to 1x10
100W to 5kW
,,
1x10 to 5x10
-2
-2
a) Standard Values
1mW
30kHz to
2GHz
2x10 to 1x10
10mW
,,
2x10 to 5x10
100mV
,,
5x10
-2
-2
-2
-2
-2
-3
10W-1mW
30kHz to 1
GHz
5x10 to 1x10
1mW-10mW
,,
3x10 to 1x10
10mW100mW
,,
3x10 to 8x10
100mW-30W
,,
8x10 to 1.5x10
-3
-2
-2
5x10
-2
3x10
-2
3x10
-2
-2
-2
-2
-2
3x10
5x10
To be worked
out later
iii) Microwave a) Standard Values

Power
10mW
-3
-3
8.2GHz to
12.4 GHz
(X Band)
5x10 to 7x10
1.0x10-2
(1.4GHz)
9,10,11
(1.02 SWR)
1.5x10-2
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 32 / 53
Table 8Contd.
-3
-2
Coxial:
1W-100mW
2GHz to
18 GHz
7x10 to 1.5x10
Wave Guide:
1V-100mW
(i) 8.2 GHz

to 12.4 GHz
8x10 to
-2
1x10
(ii) 5.8GHz
to 8.2 GHz
1x10 to 1.5x10
(iii) 12.4 GHz

to 18.0 GHz
1x10 to 1.5x10
-3
-2
-2
5 to 8%
-2
-2
To be worked
out later
-2
-2
-2
-2
3x10 to 5x10
3x10 to 5x10
-2
-2
3x10 to 5x10
-2
-2
3x10 to 5x10
To be worked
out later
Notes
Accuracy & Measurement Uncertainty quoted at Level I and Level II are exclusive of mismatch errors.
The exact generated standard values may be different, but the uncertainty limits will remain
unchanged.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 33 / 53
TABLE 9
AC RATIO
Parameter Standard
Values/ Ranges
Frequency
Uncertainty
Level-I
AC Ratio
Level-II
Level-III
a) Standard Values
Voltage Ratio
50Hz
-7
-8
1x10 to 3x10 of
the input voltage
IVD based
0.00000001 to
-6
1x10 of the
input voltage
0.99999999
Standard PT based
3, 5, 6, 10, 15, 20,
30, 40 kV/100V
,,
-5
5x10
-4
5x10
-3
-4
5x10
5x10
-3
230, 460, 1150,

2300, 3450,
6900V/115V
2.5x10
Standard CT based
100, 200, 400, 800,
1600, 3200,
6400A/5A
,,
-5
-3
5x10
5x10
Voltage Ratios
(Calibration of IVDs)
,,
-6
0.00000001 to
0.99999999
(Calibration of PTs)
-8
1x10 -5x10
-6
-5
5x10 to 1x10
-3
230V/115V6900V/115V
,,
2.5x10
3kV-40kV/100V
40kV/100V100kV/100V
(Calibration of CTs)
,,
2x10
to be created
5A/5A-2000A/5A
2000A/5A6000A/5A
,,
2x10
to be created
-4
5x10
-3
1x10
-4
2x10
-3
-3
5x10
-3

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 34 / 53
TABLE 10
PHASE ANGLE
Parameter
Standard
Values/ Ranges
Frequency
Uncertainty
Level-I
Phase Angle
Level-II
Level-III
a) Standard Value
0
50 Hz
10 milli Rad
20 milli Rad
To be worked
out later
30
,,
10 milli Rad
20 milli Rad
,,
60
,,
10 milli Rad
20 milli Rad
,,
90
,,
5 milli Rad
10 milli Rad
,,
120
,,
5 milli Rad
10 milli Rad
,,
150
,,
5 milli Rad
10 milli Rad
,,
180
,,
5 milli Rad
10 milli Rad
,,
,,
10-5 milli Rad
20
,,
20 milli Rad
40
Single Phase
0-360
Three Phase
0-360
Note:- Exact frequency at which calibration has been done shall be mentioned in the calibration data.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 35 / 53
TABLE 11
L.F., H.F. & MICROWAVE ATTENUATION
Parameter
(i) L.F. Ratio

& Attenuation
Standard
Values/
Ranges
Frequency
Uncertainty
Level-I
Level-II
Level-III
(a) Standard Values

-7
-6
(A)
0.00000001 to
0.99999999
Voltage Ratio
1kHz to 10kHz
1x10 of input
1x10 of input
To be worked out
later
(B) 0-100dB
(Attenuation)
1kHz to 30
kHz
0.007dB/10dB
0.02dB/10dB
0.02dB/10dB
(ii) H.F.
Attenuation
(A) 0-100dB
(600 Ohm)
,,
0.005dB/10dB
0.01dB/10dB
0.05dB/10dB
(B) 0-100dB
(50 Ohm)
,,
0.005dB/10dB
0.01dB/10dB
0.1dB/10dB
0.005dB/10dB
0.01dB/10dB
0.05dB/10dB to
0.1dB/10dB
(a) Standard Values

0 to 60 dB
30 MHz

(A) Fixed Attenuator
0to 10dB
30kHz-1GHz
0.005dB/10dB
to0.01dB/10dB
0.01dB/10dB
0.01dB/10dB
0.01dB/10dB to
0.2dB/10dB
10 to 60dB
,,
0.005dB/10dB
to0.02dB/10dB
0.05dB/10dB
0.1dB/10dB to
0.2dB/10dB
0 to 10dB
,,
0.005dB/10dB to
0.01dB/10dB
0.05dB/10dB
to 0.1dB/10dB
0.2dB/10dB
10 to 60dB
,,
0.005dB/10dB to
0.02dB/10dB
0.05dB/10dB
01dB/10dB
60 to 100dB
,,
0.005dB/10dB to
0.05dB/10dB
0.01dB/10dB
to 0.3dB/10dB
0.1dB/10dB to
0.3dB/10dB
(B) Variable
Attenuator
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 36 / 53
Table 11--Contd
(iii) Microwave (a) Standard
Value 0 to
Attenuation
60dB
30 MHz
0.005dB/10dB
0.01dB/10dB
0.05dB/10dB

(A) Coaxial System
0 to 10dB
1GHz-18GHz
10 to 60dB
,,
0.015dB/10dB to
0.02dB/10dB
(VSWR 1.05)
__
__
0.02dB/10dB
(VSWR 1.05)
0.03dB/10dB
to 0.1dB/10dB
0.1dB/10dB to
0.3dB/10dB
2.6 to 3.95
GHz
(S Band)
0.02dB/10dB
0.05dB/10dB
To be worked out
later
5.3 to 8.2
GHz
(XN Band)
0.02dB/10dB
0.05dB/10dB
,,
8.2 to 12.4
GHz
(X Band)
0.02dB/10dB
0.05dB/10dB
,,
12.4 to 18
GHz
(ku Band)
0.02dB/10dB
0.5dB/10dB
,,
(B) Wave Guide System

0-60dB
(Rotary Vane
Attenuator)

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 37 / 53
TABLE 12
CAPACITANCE & DIELECTRIC LOSS ANGLE (tan) 50 Hz
Parameter
Standard
Values/
Ranges
Frequency
Uncertainty
0.01F, 0.1F,
1F, 10F,
100F, (0-600
Volts peak,
400 volts rms)
50Hz
2x10
10,100,1000,
10,00pF,
(100V to 35kV)
,,
1x10
Level-I
Level-II
Level-III
i) Capacitance
-4
5x10
-4
5x10
-4
2x10
-4
1x10 to
-2
1x10
-4
-3
-4
To be worked
out later
-3
1x10 to
-2
3x10
5x10
-4
To be worked
out later
50-10
50-10
Measurement Capability
0.01F-250F
(0-600 Volts
peak)
,,
5x10 to
-3
5x10
100pF-1000pF
(100V-35kV)
,,
2x10
-3
ii) Dielectric Loss angle (tan)

0.00001 to 0.1
(1kV)
,,
-2
50-1x10
Note: Exact frequency at which calibration has been done shall be mentioned in the calibration data.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 38 / 53
TABLE 13
CAPACITANCE (120 Hz & 1 kHz)
Parameter
(i) Capacitance
(120 Hz)
Standard
Values/
Ranges
Frequency
a) Standard/
Values
100/120Hz
Uncertainty
Level-I
Level-II
-3
1x10
-3
1x10
-3
2x10
-2
1x10
1mF
,,
1x10
10mF
,,
1x10
100mF
,,
5x10
1000mF
,,
2x10
Level-III
-2
To be worked
out later
-2
,,
-2
,,
-1
,,
b) Measurement
Capability
1mF-1F
(ii) Capacitance 0.001,0.01,0.1pF,

(1kHz)
(Air dielectric)
100/120Hz to
1kHz
-3
-2
1x10 to 2x10
-2
-4
5x10
-5
2x10
-7
2x10
-6
1x10
-5
1x10
-4
1x10
-4
5x10
-3
1x10
,,
2x10
1pF (Air
dielectric)
,,
2x10
10pF, 100pF
(silica)
,,
5x10
10,100,1000pF
(Air)
,,
2x10
0.001, 0.01F
(Mica)
,,
2x10
10F
,,
2x10
100F
,,
5x10
1000F
,,
1x10
-1
1x10 to 1x10
-2
-1
5x10 to 2x10
-4
1x10
-3
-4
1x10
-3
-6
__
-5
2x10
-4
-4
5x10
-4
-3
__
-3
__
-2
__
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 39 / 53
Table 13Contd.
b) Measurement
Capability
0.001 pF-1pF
1kHz
-4
-5
1x10 to 5x10
-5
-5
5x10 to 5x10
-5
-4
2x10 to 5x10
-4
-2
5x10 to 1x10
5x10 to 5x10
1pF-1000pF
,,
5x10 to 1x10
0.001F-1F
,,
5x10 to 1x10
1F-1F
,,
1x10 to 1x10
-3
-4
5x10 to 1x10
-3
-3
-4
-5
1x10 to 5x10
-3
-4
-4
-4
1x10
-4
-2
1x10 to 5x10
-3
-3
-2

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 40 / 53
TABLE 14
L.F. & H.F. CAPACITANCE
Parameter
Standard
Values/ Ranges
Frequency
Uncertainty
Level-I
Level-II
Level-III
i) L.F. Capacitance
a) Standard Values
-4
2x10
-5
1x10
-3
5x10 to
-4
5x10
-4
5x10
-4
5x10 to
-3
5x10
-3
1x10 to
-3
5x10
-4
2x10 to
-3
5x10
1pF, 10pF, 100pF

(Air Dielectric)
10 kHz
1x10
1000pF
(Air Dielectric)
10kHz
5x10
-4
2x10
-4
-4
2x10
-3
To be worked
out later
-4
1x10
-4
1x10 to
-3
5x10
-3
1x10 to
-3
5x10
-3
To be worked
out later
-4
0.001pF-1pF
100kHz
1x10 to
-4
2x10
1pF-1000pF
,,
2x10
0.001F-1F
upto 100kHz
2x10 to
-3
2x10
1F-10f
upto 20kHz
1x10 to
-3
5x10
1pF
upto 1000MHz
2x10 to
-3
1x10
2pF
upto 1000MHz
2x10 to 1x10
3.3333pF
upto 800MHz
2x10 to 1x10
4pF
upto 700MHz
2x10 to 1x10
5pF
upto 600MHz
2x10 to 1x10
6.6667pF
upto 500MHz
2x10 to 1x10
-3
-3
-3
ii) H.F. Capacitance

a) Standard Values
-4
-3
2x10 to
-3
5x10
-3
,,
-4
-3
2x10 to
-3
5x10
-3
,,
-4
-3
2x10 to
-3
5x10
-4
-3
2x10 to
-3
5x10
-4
-3
2x10 to
-3
5x10
-3
-3
-3
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 41 / 53
Table 14Contd.
-4
-3
2x10 to
-3
5x10
-4
-3
2x10 to
-3
5x10
-3
-3
-4
-3
1x10 to
-2
1x10
-3
-2
1x10 to
-2
3x10
-4
-3
1x10 to
-2
1x10
-3
-3
2x10
(Only upto
1MHz)
10pF
upto 300MHz
2x10 to 1x10
20pF
upto 200MHz
2x10 to 1x10
1pF, 10pF,
100pF, 1000pF,
(4TP)
upto 10MHz
1x10 to 5x10
-3
-3
0-50pF
100kHz-250MHz
5x10 to 5x10
0-20pF
250MHz-1000MHz
5x10 to 2x10
50-100pF
100kHz-100MHz
5x10 to 5x10
100-1000pF
100kHz-30MHz
1x10 to 5x10
-3
1x10 to
-2
5x10
-3
-2
1x10 to
-2
5x10
-3
2x10 to
-2
5x10
-2
-3
-3

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 42 / 53
TABLE 15
INDUCTANCE (1kHz)
Parameter
Inductance
Standard
Values/
Ranges
Frequency
Uncertainty
Level-I
Level-II
Level-III
a) Standard Value
-3
1x10
-3
1x10
-3
5x10
-4
5x10
-5
2x10
-5
1x10
-5
1x10
-5
5x10
-4
5x10
-2
2x10 to
-3
5x10
-3
5x10 to
-3
1x10
-4
1x10 to
-2
1x10
2H,3H
1kHz
5x10
5H
,,
5x10
10H
,,
1x10
100H
,,
1x10
1mH
,,
5x10
10mH
,,
1x10
100mH
,,
1x10
1H
,,
5x10
10mH
,,
5x10
-2
-2
-3
1x10
-2
-4
1x10
-4
1x10
-4
5x10
-4
5x10
-4
1x10
-3
1x10
-2
5x10 to
-2
1x10
-3
1x10 to
-3
2x10
-3
1x10 to
-2
5x10
-3
-3
-4
-4
-3
-2
1H-10H
,,
1x10 to
-3
2x10
10H-100H
,,
2x10 to
-4
5x10
1mH-100H
,,
2x10 to
-3
5x10
-2
-2
-3
Note: The same standards can be assigned values at 50 Hz also through Capacitance - Inductance
transfer techniques.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 43 / 53
TABLE 16
L.F. & H.F. INDUCTANCE
Parameter
Standard
Values/
Ranges
Frequency
Uncertainty
Level-I
(i) L.F.
(a) Standard Values
Inductance
10H, 100H,
1mH, 10mH
10kHz
Level-II
-4
1x10
-4
1x10
-4
1x10
5x10
Level-III
-3
2x10
-3
-3
1x10
-3
1x10
-3
(ii) H.F.
Inductance
1H-10H
upto 20kHz
5x10
10H-100H
upto 20kHz
5x10
100H-1mH
upto 10kHz
5x10 to 1x10
-3
-3
-4
-3
1x10
1x10
-3
-4
-3
To be
worked out
later
To be worked
out later
-3
-2
-3
To be worked
out later
-3
2x10 to
-3
5x10
(a) Standard Values

5x10 to 2x10
5nH
upto 1000MHz
8nH
upto 800MHz
10nH
upto 700MHz
25nH
upto 300MHz
50nH
upto 200MHz
0.05H to 25mH
(2T)
50kHz to 250kHz
1x10 to 1x10
100H (4TP)
upto 10MHz
2x10
100H (4TP)
upto 1MHz
1x10
-3
-3

-3
-2
-3
-3
5x10 (upto
10MHz only)
-3
-3
5x10 to
-2
1x10
10nH
250MHz-1000MHz
5x10 to 2x10
1H-500H
100kHz-250MHz
1x10 to 5x10
100H-1mH
30kHz-10MHz
2x10 to 5x10
-3

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 44 / 53
TABLE 17
DC RESISTANCE
Parameter
Standard
Values/Ranges
Uncertainty
Level-I
Level-II
Level-III
DC Resistance
-3
2x10
-4
2x10
-5
2x10
-6
5x10
-7
5x10
-6
5x10
-6
1x10
-6
2x10
5x10
-6
2x10
-6
2x10
-5
5x10
-5
1x10
100Ohm
2x10
1m Ohm
1x10
10m Ohm
1x10
100m Ohm
1x10
1 Ohm
5x10
10 Ohm
1x10
100 Ohm
2x10
1000 Ohm
5x10
10000 Ohm
100,000 Ohm
5x10
1 mega Ohm
1x10
10 mega Ohm
2x10
1 Ohm to 1m Ohm
1x10 to 1x10
1m Ohm to 1 Ohm
1x10 to 1x10
1 to 10 Ohm
1x10
-5
1x10
-6
5x10
-6
5x10
-6
2x10
-5
5x10
-5
5x10
-5
5x10
-5
5x10
-5
1x10
-4
5x10
-3
-4
-5
-5
-5
-5
-5
-5
-5
-4
-4
-4
-6
5x10 to 2x10
-6
-6
2x10 to 5x10
-6
-5
5x10 to 2x10
-5
-4
2x10 to 5x10
-4
-2
5x10 to 5x10
1x10 to 2x10
1x10 to 2x10
15
Ohm
-4
2x10 to 5x10
2x10 to 1x10
10 to 10
-2
-4
10 to 10 Ohm
1x10
-1
10 to 10 Ohm
-3
2x10 to 1x10
-1
-4
5x10 to 1x10
-1
-3
-4
-6
1x10 to 5x10
-3
-5
-6
-6
5x10 to 1x10
-5
-4
-6
-5
1x10 to 2x10
-4
-4
-5
-4
2x10 to 2x10
-4
-4
-4
-2
__
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 45 / 53
Table 17Contd.
Operating voltages are given below
Resistance value
Operating voltage
1-5V
1-50V
1-500V
1-1000V
13
1-1000V
14
10-1000V
15
100-1000V
10 Ohms
10 Ohms
10 Ohms
10 Ohms
10 Ohms
10 Ohms
10 Ohms
Facilities have to be created for measurement of Resistance value between 10 -10 Ohm at operating
voltage of 500 to 1000 volts.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 46 / 53
TABLE 18
AC RESISTANCE 1kHz
Parameter
Standard
Values/Range
Frequency
Uncertainty
Level-I
AC
Resistance
Level-II
Level-III
a) Standard Values
1m Ohm, 10m Ohm,

100m Ohm
-4
5x10
-6
5x10
-6
1x10
-6
1x10
-6
1x10
-5
5x10
1kHz
1x10
1 Ohm, 10 Ohm,
100 Ohm
,,
5x10
1000 Ohm
,,
1x10
10,000 Ohm
,,
5x10
100,000 Ohm
,,
1x10
1000,000 Ohm
,,
5x10
-4
To be worked
out later
-5
,,
-5
,,
-5
,,
-5
,,
-4
,,
Note:
-4
-5
5x10 to 5x10
-5
-5
1x10 to 5x10
-5
-4
5x10 to 2x10
200m Ohm 1 Ohm
,,
5x10 to 1x10
1 Ohm-10k Ohm
,,
1x10 to 5x10
10k Ohm-1M
Ohm
,,
5x10 to 5x10
-3
-4
5x10 to 1x10
-2
-3
-4
-4
1x10 to 5x10
-3
-3
-4
-3
5x10 to 1x10
-3
-2
1. The same standards can be assigned values at 50Hz.

2. Time constants of standards can also be determined at 1 kHz.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 47 / 53
TABLE 19
L.F. & H.F. IMPENDENCE
Parameter Standard
Values/Ranges
Frequency
Uncertainty
Level-I
Level-II
Level-III
i) L.F. Impedence
(a) Standard Values
1 Ohm, 10 Ohm,
10 kHz
-4
-4
2x10 to 1x10
-4
-3
1x10
-4
-3
1x10
-3
-2
3x10
-2
-2
1x10 to 5x10
-4
-3
100 Ohm, 1k Ohm,

10k Ohm, 100k Ohm
To be worked
out later
1 Ohm-100 Ohm
Upto 20
kHz
5x10 to 1x10
100 Ohm-100k Ohm
,,
5x10 to 1x10
100 k Ohm-1 M Ohm
,,
1x10 to 1x10
1M Ohm-10M Ohm
,,
1x10 to 3x10
-3
1x10
-3
-3
1x10
-2
3x10
5x10
-2
5x10
To be worked
out later
To be worked
out later
-3
-2
-2
ii) H.F. Impedence

a) Standard Values
-4
-3
0.5m Ohm, 1m Ohm, 1MHz- 300

2m Ohm, 5m Ohm
MHz
5x10 to 2x10
33.33 Ohm,
41.67 Ohm,
45.45 Ohm,
100 Ohm,
(Coaxial discs)
1MHz to
300MHz
1x10 to 5x10
0.1 Ohm, 1 Ohm,

10 Ohm, 100 Ohm,
1k Ohm, 10k Ohm,
100 Ohm (4TP)
10kHz to
10MHz
1x10 to 5x10
-3
-3
-3
-3
-3
-3
-3
-3
-4
-3
2x10
-3
-2
1x10 to 2x10
2x10 to 5x10
To be worked
out later

1 Ohm to 100 Ohm
30kHz1MHz
1x10 to 2x10
20 Ohm to 10k Ohm 12MHz250MHz
3x10 to 5x10
20 Ohm to 1k Ohm
2x10 to 2x10
250MHz1000MHz
-2
-3
To be worked
out later
-2

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 48 / 53
TABLE 20
MICROWAVE IMPEDENCE & Q VALUES
Parameter
Standard
Frequency
Values/
Ranges
(i) Microwave
Impedence
Uncertainty
Level-I
Level-II
Level-III
(a) Standard Values
Wave Guide
Standard Short
(Reflection
Coeff. 1.0000)
X and XN Band
(5.3 to 12.4 GHz)
0.9993
0.990
To be worked
out later
Precision
Waveguide Refl.
Coeff. 0.0002
0.002
0.01
,,
SWR 1.0004
1.004
1.02
,,

Refl. Coeff.
SWR
Refl. Coeff.
Ref. Coeff.
0.0476
1.1
0.0020
0.02 to 0.05
,,
0.0909
1.2
0.0025
0.02 to 0.05
,,
0.1304
1.3
0.0027
0.02 to 0.05
,,
0.200
1.5
0.0030
0.02 to 0.05
,,
1 to 18 GHz
0.002 to 0.003
in the SWR
range 1.05 to
1.5
0.01 to 0.02 in
the SWR
range 1.05 to
2.0
0.03 to 0.05
in the SWR
range 1.1 to
2.0
COAXIAL
Refl. Coeff.
0.002 to 0.2 in
the SWR range
1.004 to 1.5
(ii) Q Values
Q Value upto
600
Upto 300MHz
-2
2x10
-2
5x10
-2
10x10

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 49 / 53
TABLE 21
TIME AND FREQUENCY/ TIME INTERVAL
Parameter
Standard Values/ Ranges
Uncertainty
Level-I
(i) L.F. Frequency
Level-II
Level-III
-12
__
__
-11
5x10
-11
5x10
-11
5x10
-11
5x10
-11
5x10
-11
5x10
-11
5x10
-11
5x10
-11
(a) Standard Values

100kHz, 1MHz, 5 MHz &
10MHz (Cesium Std)
1x10
1MHz
2x10
100 MHz
2x10
1Hz
2x10
10 Hz
2x10
100 Hz
2x10
1 kHz
2x10
10 kHz
2x10
100 kHz
2x10
-11
1x10
-8
-11
1x10
-11
1x10
-11
1x10
-11
1x10
-11
1x10
-11
1x10
-11
1x10
-10
-8
-8
-8
-8
-8
-8
-8
(ii) H.F. Frequency
-8
1MHz to 30kHz
(by counter technique)
100kHz, 1MHz, 5MHz 10MHz
2x10
1x10
1x10
1 Count
1 Count
1 Count
(by phase Meas. Tech)
5x10
-12
__
__
(a)Standard Values
30kHz-1GHz
2x10
-11
5x10
-11
-11
To be worked
out later
(iii) Microwave
Frequency
-11
-10
30kHz-1GHz
2x10
5x10
5x10
MW Stds
1 Count
1 Count
1 Count
(a) Standard Value

1GHz-18GHz (1KHz steps
from 1 to 12 GHz)
-11
5x10
-10
5x10
To be worked
out later
Contd.

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 50 / 53
Table 21Contd.
1GHz-18GHz
(iv) Time Instant

(Epoch)
-11
-10
5x10
5x10
To be worked
out later
100 nanosecond
10 microsecond
1 milli-second
100 nanosecond
20 microsecond
1 milli-second
(a) Standard Values
1pps
(pulse per second)

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 51 / 53
TABLE 22
MAGNETIC MEASUREMENTS
Parameter
Field
Strength
(Standard
Magnets)
Standard
Values/
Ranges
Frequency
Uncertainty
Level-I
Level-II
Level-III
(a) Standard Values

Transverse:
-3
0.01T, 0.05T,
0.02T
2.5x10
__
__
0.1T, 0.5T, 1T
1x10
-2
__
__
-2
__
__
5x10 -1x10
-3
-2
__
__
-3
-3
__
__
-3
-2
Coaxial :
0.03T, 0.05T
1x10

-3
Field
strength
Standard
Magnets
Gaussmeter
Calibration
10 T-1T
Area-turns
(Search
coils)
1cm -40cm
30Hz
5x10 -1x10
Flux
Fluxmeter
(Calibration)
-5
-2
10 wb-10 wb
5x10 -1x10

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 52 / 53
Technical Committee for Electro-Technical Measurement
1.
Dr. P.C. Kothari (Chairman)

Head, Electrical & Electronics Standards
NPL, New Delhi
2.
Mrs. Kowsalya Varadan

Retired Coordinator STQC Calibration Services,
Bangalore
3.
Mr. S.K. Kimothi

Retired Director
ERTL(N), New Delhi
4.
Mr. R.K. Vapta

Retired Senior Manager
BHEL, Bhopal
5.
Dr. V.N. Ojha

Scientist F, Electrical & Electronics Standards
NPL, New Delhi
6.
Mr. B.S. Kumar

Director
ETDC, Bangalore
7.
Mr. B.M. Vyas

Manager, Yadav Measurements Pvt. Ltd.
Udaipur
8.
Dr. Sulbha M. Gupta

Director, NABL
9.
Mr. Anil Relia

Quality Manager, NABL
10.
Dr. Rubeena Saleem

Accreditation Officer, NABL
11.
Mr. Bibin Philip

Trainee Accreditation Officer, NABL
12.
Mr. Jaydip Kanango (Convener)

Accreditation Officer, NABL

Doc. No: NABL 121
Issue No: 04

Issue Date: 07. 03.2007
Amend No: 00
Amend Date: --
Page No: 53 / 53

3rd Floor, NISCAIR
14, Satsang Vihar Marg
New Mehrauli Road
New Delhi 110 067
Tel.: +91-11 4649999
Fax: +91-11 26529716
Website: www.nabl-india.org

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NABL 121

National Accreditation Board for Testing and Calibration Laboratories

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

PART I : Specific Criteria for Accreditation of Calibration Laboratories in the

Criteria for Accreditation

Accommodation and Environment Conditions

Calibration Methods & Uncertainty of Measurement

Handling of Calibration Items

Calibration Certificate/ Report

Guidance for Assessments and Scope Recommendation

PART II : Guidelines Regarding Generally Achieved Measurement

National Accreditation Board for Testing and Calibration Laboratories

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

Table 3 : L.F. & H.F. Voltage

Table 6 : L.F. & H.F. Current

Table 7 : AC Power & Energy

Table 8 : L.F. & H.F. & Microwave Power

Table 10 : Phase Angle

Table 11 : L.F. & H.F. & Microwave Attenuation

Table 12 : Capacitance & Dielectric Loss Angle (Tan) 50 Hz

Table 13 : Capacitance (120 Hz & 1 kHz)

Table 14 : L.F. & H.F. Capacitance

Table 15 : Inductance (1 kHz)

Table 16 : L.F. & H.F. Inductance

Table 18 : AC Resistance 1 kHz

Table 19 : L.F. & H.F. Impendence

Table 20 : Microwave Impedence & Q Values

Table 21 : Time and Frequency / Time Interval

Table 22 : Magnetic Measurements

Technical Committee for Electro-Technical Measurement

National Accreditation Board for Testing and Calibration Laboratories

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

National Accreditation Board for Testing and Calibration Laboratories

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

SPECIFIC CRITERIA FOR ACCREDITATION OF CALIBRATION

Calibration laboratories are accredited by NABL after it is demonstrated that a

National Accreditation Board for Testing and Calibration Laboratories

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

The scope of accreditation of calibration laboratory shall be identified as source and

CRITERIA FOR ACCREDITATION

The scope of accreditation of an accredited laboratory in the field of Electro-Technical

A calibration laboratory seeking accreditation to offer calibration services in the field of

National Accreditation Board for Testing and Calibration Laboratories

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

ALTERNATING CURRENT (Up to 1kHz)

LOW FREQUENCY (1kHz to 30kHz)

HIGH FREQUENCY (30kHz to 1GHz)

MICROWAVE (1GHz and above)

TIME AND FREQUENCY

ELECTRICAL SIMULATION TECHNIQUES (THERMAL)

ORGANISATION (clause 4.1 of ISO/IEC 17025:2005)

Specific Criteria for Calibration Laboratories in Electro-Technical Discipline

accredited parameters. The calibration laboratory shall be organized in such a way so

MANAGEMENT SYSTEM (clause 4.2 of ISO/IEC 17025:2005)

A quality policy statement, including objectives as evidence of commitment by the

A statement on the organization of the calibration laboratory.

Names, qualifications and experience of the persons responsible for managerial,

A clearly defined charter of responsibility showing the relationship between

Scope and operation of the laboratory along with information on measurement

The reference of document number on detailed calibration procedures adopted in

The reference list of all specification/standards being referred to or used in the

National Accreditation Board for Testing and Calibration Laboratories