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Abstract
Experiments show that the microstructure of solders changes over time. From a materials science point-of-view this phenomenon considerably aects the reliability and lifetime of microelectronic products. It is, therefore, important to quantitatively predict the amount of
microstructural change. In the present paper we concentrate on a theoretical and experimental description of spinodal decomposition as
well as subsequent phase growth in binary solder alloys. We present experimental results and a theoretical description, which is based on
an extended diusion equation of the phase eld type, and which can be interpreted as an generalization of the CAHNHILLIARD equation.
Moreover, it takes diusion of the FICKian type, surface tensions along the phase boundaries as well as local thermo-mechanical stresses
into account. In particular we turn our attention to the determination of the required material parameters, which can all be obtained
consistently from atomistic models or adopted from literature. As an example the FCC-structured lead-free solder alloy AgCu is considered and numerical results are presented.
2007 Elsevier B.V. All rights reserved.
PACS: 81.40.Gh; 72.15.v; 66.30.h; 64.75.+g; 68.03.Cd
Keywords: Lead-free solders; Diusion; Spinodal decomposition; Coarsening
1. Introduction
There is an ongoing miniaturization in the area of
microelectronics driven by an increasing requirement for
mobility and more complex functionalities (e.g., automotive or portable industry). The minimal feature size within
semiconductors continuously decreases whereas the number of transistors rapidly grows (cf., Fig. 1). As a consequence the demands on strength and lifetime of the used
materials considerably rise while the material size is continuously reduced.
In addition to these technological trends environmental
initiatives become increasingly important. The purpose of
*
Corresponding author. Tel.: +49 30 314 26440; fax: +49 30 314 24499.
E-mail addresses: thomas.boehme@tu-berlin.de (T. Bohme),
wolfgang.h.mueller@tu-berlin.de (W.H. Muller).
1
Tel.: +49 30 314 27682; fax: +49 30 314 24499.
0927-0256/$ - see front matter 2007 Elsevier B.V. All rights reserved.
doi:10.1016/j.commatsci.2007.07.034
222
Fig. 1. The development of the minimal feature size and the number of
transistors in microelectronics.
2. Microstructures in solders
2.1. General remarks
In modern electronic packaging, e.g., ip-chips, solder
balls (or bumps) play an important role, cf., Fig. 2. On
the one hand side they guarantee the electrical connection
between the chips and the electronic circuits, on the other
hand they provide the mechanical connection of the dierent electronic components on the printed circuit board.
From a microscopic point-of-view these solder balls are
basically exposed to two dierent micromorphological
changes, cf., Fig. 3: (a) the formation of scallop-shaped
intermetallic compounds (IMCs) at the interface solder/
substrate and (b) spinodal decomposition and coarsening
in the bulk.
IMCs are formed and grow due to an interfacial reaction. In the case of a Cu substrate and an Sn-containing
solder (e.g., SnAgCu) this reaction takes place between
Cu and Sn and necessitates a mass transport from the substrate to the solder, cf., Fig. 3 (left) and [6]. However, the
resulting expanding scallops can have a positive inuence on the strength and lifetime of the solder joints,
because they guarantee a dovetail connection. On the
other hand there are stress peaks around the IMCs, leading
to crack initiation in this region. Consequently it is reasonable that the positive eects are limited by a critical size.
In contrast to IMC-formation SD and C are diusion
processes exclusively driven by aspects of thermodynamical
stability and interfacial energy minimization, cf., Section
2.2 and [2]. The resulting composite of dierent phases
can be interpreted as a particle reinforced material in
which the stier phase acts as the reinforcement. Unfortunately mechanical failure, such as cracks, favorably grow
along the phase boundary which result, among other reasons, from thermal mismatching. Thus the benet of phase
dispersion is also limited by a critical phase size.
However, there is a considerable interest in predicting
the micro-morphological temporal development, which is
the basic requirement for further failure analysis of the heterogeneous material. In the following we focus on spinodal
decomposition and on the coarsening process. The binary
alloy AgCu is investigated, in which SD results in two
equilibrium phases, the a-phase (Ag-rich) and the b-phase
(Cu-rich), cf., Fig. 3 (right). It has qualitatively a similar
miscibility gap (phase stability data) as the previously used
SnPb solders, and all required material parameters can
easily be obtained.
2.2. Spinodal decomposition and coarsening
From a thermodynamical point-of-view a binary alloy
AB decomposes into two equilibrium phases a and b due
to a gain of the GIBBS free energy G(c, T), which is a function
of mass concentration c cB (cA + cB = 1) and temperature
T. Without loss of generality we put Tmelt Teut where Teut
denotes the eutectic temperature. In Fig. 4 two dierent
Fig. 3. Left: scallop-shaped Cu6Sn5-IMCs at the interface solder (SnAgCu)/substrate (polished Cu). Right: SD and C in eutectic AgCu after 20 h
heat treatment at 1000 K.
Fig. 4. Schematic GIBBS free energy curves for two dierent temperatures.
G-curves are illustrated, one for T > Teut and one for
T < Teut.
Obviously the curve describing the liquid phase is completely convex. Thus a mixture with arbitrary c is stable to
all uctuations. This fact is evident considering a uctuated
two-phase-system, represented by the states B in the neighborhood of the original one-phase-state A, cf., Fig. 4. The
resulting energy G of the two-phase-mixture is given by the
energetically disadvantageous connecting line. Therefore
the system remains in the one-phase-state.
This fact changes for the solid state as illustrated in
Fig. 4. In this case G(c, T) is piecewise concave. This region
is called the spinodal area, enclosed by the spinodal concentrations csp
1=2 , and it characterizes the concentrations
for which the system is unstable. Evidently any uctuating
system represented by the connecting line of the neighboring perturbed states is energetically advantageous. Consequently the system will decompose into the equilibrium
concentrations ca/b. Note that ca/b can be constructed by
the so-called common tangent rule, which results from a
thermodynamical stability analysis, [9]:
oGc; T
Gcb ; T Gca ; T
:
1
oc
cb ca
cca=b
After the whole system reaches the equilibrium concentrations coarsening begins in such a way that the number of
precipitated phase regions decreases whereas the size of
the phases increases. This process is often called OSTWALD-ripening and minimizes the interfacial energy of the
system. Fig. 5 shows various experimentally observed
stages of coarsening after 2 h, 5 h, 20 h, and 40 h of heat
treatment in eutectic AgCu.
J q0 M rlB lA :
223
oc
rJ 0
ot
r
rr :
;
dc
oc
orc
orrc
with:
w wconf c; e ac; e : rrc bc; e : rcrc;
wconf w0 c wel c; e;
1
Hooke 1
r : e e : Cc : e:
wel
2
2
Fig. 5. SD and C in eutectic AgCu at 970 K. Dark: b-phase. Light: aphase.
224
r rT r Cc : e 0
must be solved together with appropriate boundary conditions, [5]. Note that thermal strains e* can be incorporated
by putting:
e!ee
with
e aT T ref ;
M
2A 2
ot ox
ox
oc
ox
oc ox ox
2
2
oA oc o o a o o oa o
2
:
10
o ox ox o2 ox ox o ox2
~ 0 c;
e c; w0 w
Note the following dependencies: M M
~ el c; ; a ~ac; ; b ~bc; , and A Ac;
e .
wel w
It is worth mentioning that the restriction to line strains
requires large stresses in order to avoid deformations in the
second and third dimension. However, this 1D-case enables
us to nd a closed expression for the strains (x, t) from Eq.
(8). For that reason we assume linearity for the stiness
C Cij11 and for the thermal expansion coecient a a11:
Nc 1 HcNa HcNb ;
H fC; ag;
Hc
c c
cb ca
with
c ~cx; t:
11
12
13
Thus we can nally write for the strains and for the elastically stored energy density:
r0
x; t b
;
cb cx;t
C 11 cb ca C b11 C a11
14
1
r20
:
wel c
2 C b11 cb cx;t
C b11 C a11
cb ca
With that wel does not contain thermal strains which cancel
due to the restriction to the 1D-case.
Eqs. (14)1,2 can be inserted into Eq. (10). The resulting
equation still represents a nonlinear PDE of 4th order for
the last unknown quantity, the mass concentration eld
c(x, t). A numerical solution of this equation and a subsequent quantitative investigation of SD and C requires an
exact knowledge of the occurring material data which is
the subject of the following section.
In the following we want to concentrate to the onedimensional case xi = x1 x, i.e., we simply consider the
diusion process along a line. Furthermore so-called
line strains are introduced by putting 11 = (x,t) =
225
Table 2
Characteristic concentrations, diusion coecients, and mobilities of Ag
Cu at 1000 K
h 2i
h 5i
Phase
ceut
ca/b
csp
1=2
M mJs
D ms
Note that all other (indirectly required) characteristic material data, e.g., ca=b ; csp
1=2 ; ceut , follow from w0 by applying the
common tangent rule.
a
b
On the other hand the mobility denotes the factor of proportionality introduced in the corrected diusion Eq.
(3). A comparison of the original FICKian law with the
FICKian part of the EDE leads to:
a=b
o2 w0
D
Dc Mc 2 ) M a=b 2
:
16
o w0
oc
Table 1
The t parameters required for w0(c)
ga GJ
gb GJ
gc mole
m3
m3
m3
7.27
5.20
vI
5
1.11 10
GJ
m3
2.97
vII
GJ
m3
3.01
0.29
0.29
0.063
0.945
0.19
0.79
oc2
1.01 1014
4.09 1015
7.25 1025
3.65 1025
cca=b
a/b
with
N fa; b; Ag:
17
The symbols k N0=c==c denote coecients and can be determined by a t. Here we used the atomistically calculated
HGCs of Fig. 7 at the points:
c; fca ; 0; cb ; 0; ca ; 0:2; cb ; 0:2g:
Fig. 6. 1st row, left: GIBBS free energy density according to Eq. (15). Right:
2nd derivative of w0. 2nd row, left: Stiness as a function of c. Right:
Mobility depending on c.
226
GJ
Grid points N
2pL [lm]
w
512
1 107
0.1
0.2
m3
Table 3
Coecients for the HGCs as bilinear functions of c and
N
k N0 in N
k Nc in N
k N in N
k Nc in N
>0
a
b
A
4.04 1011
5.84 1011
1.53 1010
8.74 1011
4.72 1011
3.74 1011
1.19 1010
1.74 1010
7.73 1010
3.31 1010
1.98 1010
2.87 1010
<0
a
b
A
4.04 1011
5.84 1011
1.53 1010
8.74 1011
4.72 1011
3.74 1011
3.07 109
4.18 v 109
2.55 109
7.82 1010
2.34 109
8.45 1010
c
n~x~x Y K
d~t
d~t
Ma
2
Ma
oc oK
oK
1 b
Y c 2
Y
19
o~x o~x
o~x
M
with the denition for the symbol K:
~ conf w0 wel ;
w
w
~t
bt
wM
;
L cb ca
2
have been
where the numerical parameters L and w
chosen as shown in Table 4. Now the resulting equation represents a PDE for c ~c~x; ~t depending on
the dimensionless position ~x and on the dimensionless time ~t.
~ conf
ow
2
o2 c
2 k A0 k Ac c k A k Ac c 2
o~x
oc
wL
2
1
oc
2
o
A
A
A
A
2 k c k c
2 k k c c
o~
x
oc
wL
wL
2
oc
1
2 k a k ac c
o~x
wL
"
2 #
2
2
o oc
o o c
:
20
2
oc
o~x
oc o~x2
227
k 1 D~t g^cn ;
21
5. Discussion
In Figs. 810 it seems that the presence of stresses inuences the coarsening process. Especially tensile loadings
appear to have a stronger impact on coarsening than compressive ones. Indeed, the number of b-islands in the last
stage of Fig. 10 is greater than in Fig. 9. But there are indications for phase-coalescence in the immediate future
whereas the b-phases in Fig. 9 uniformly separated. However, it must be emphasized that this statement needs to
228
2
There are similar HGCs, e.g., [7], in which the investigated simulation
time is also extremely short.