Professional Documents
Culture Documents
43
CMM Probing
David Flack
Issue 2
CMM probing
David Flack
Engineering Measurement Division
National Physical Laboratory
ABSTRACT
This guide is a general guide on probes and probing. It covers probing practice; types of
contact probing systems, their advantages and disadvantages and how they work. It also
covers the advantages and disadvantages of various stylus configurations; choosing the
appropriate probing sphere size; and the use of non-contact sensors on CMMs. It is an update
of a guide first published in 2001.
July 2001
Updated August 2014
ISSN 1368-6550
Acknowledgements
The author would like to thank Mr. Alan Hatcher (Mitutoyo Ltd) for supplying much of the
information given in this guide and Mr. Keith Bevan (Mitutoyo Ltd), Mr. Mike Crossman
and Mr John Cubis (UKAS) for providing useful technical input. Thanks go to Renishaw for
providing many of the images in this guide and for reviewing early drafts. Thanks also to Dr.
G N Peggs and Dr. R Angus (NPL) and all lead users who reviewed the various drafts and
last but not least the Department of Trade and Industry (DTI) for funding production of this
guide as part of the 1999-2002 Length Programme (Project MPU 8/61.3). The latest updates
were funded by the UK National Measurement System Programme for Engineering & Flow
Metrology.
Contents
Introduction .............................................................................................................................. 1
What this guide is about and what it is not ....................................................................... 2
Introduction to CMM probing .......................................................................................... 2
Co-ordinate measuring machines ....................................................................... 2
CMM probes ...................................................................................................... 3
Design and principles of mechanical type touch trigger probes .......................................... 5
Design and principles of mechanical type touch trigger probes....................................... 6
Chapter Summary ........................................................................................................... 11
Analogue (measuring) probes ............................................................................................... 13
Analogue (measuring) probes......................................................................................... 14
Microprobing systems .................................................................................................... 15
Chapter Summary ........................................................................................................... 16
Probing systems an overview ............................................................................................. 17
Workpiece related considerations................................................................................... 18
Selection of probing system ........................................................................................... 18
Probe head considerations ................................................................................ 18
Probe extension selection (extension bars) ...................................................... 18
Stylus selection considerations ....................................................................................... 19
Stylus extension selection ................................................................................ 19
Probing system qualification .......................................................................................... 19
Chapter Summary ........................................................................................................... 19
Probe head selection .............................................................................................................. 21
Non-articulating probe heads ......................................................................................... 22
Articulating probing systems .......................................................................................... 22
Changing stylus/probe .................................................................................................... 25
Use of probe extensions.................................................................................................. 27
Chapter summary............................................................................................................ 28
Selection of stylus type ........................................................................................................... 29
Keep the stylus simple .................................................................................................... 30
Keep the stylus short and stiff ........................................................................................ 30
Select a large ball tip ...................................................................................................... 31
Appendix A
A.1
A.1.1
A.1.2
A.1.3
A.1.4
A.2
A.2.1
A.3
A.3.1
A.3.2
A.4
A.5
A.5.1
Appendix C
Manufacturers .............................................................................................. 92
List of Figures
Figure 1 An early CMM probe ( Renishaw plc 1975) ............................................................ 3
Figure 2 Schematic of a kinematic probe shown in seated position showing the three
rods and three pairs of balls.( Renishaw plc 2002) ......................................................... 6
Figure 3 Cut-away drawing of a touch trigger probe ( Renishaw 1987) ................................ 7
Figure 4 The moment of trigger. A trigger probe is in one of two states seated or
unseated. Seated when not in contact with the workpiece and unseated when in
contact. (Renishaw plc 2006) .......................................................................................... 7
Figure 5 Forces that are in action during the trigger process. The amount of stylus
bending at the point that a trigger occurs is known as the pre-travel. ( Renishaw
plc 2014) ............................................................................................................................. 8
Figure 6 High force and low force direction. High force is a pivot about a single
contact. For the low force direction the mechanism pivots about two contacts. (
Renishaw plc 2006) ............................................................................................................ 9
Figure 7 Image showing the low force (FL) and high force (FH) directions and its
relationship to the number of pivots. ( Renishaw plc 2014)............................................ 9
Figure 8 Axial probing (no mechanical advantage over the spring so the forces are
equal. ( Renishaw plc 2006.) ........................................................................................... 9
Figure 9 A strain gauge probe mechanism. Note the one of the four silicon strain
gauges is shown above the spring in red. Strain gauges trigger at forces that do not
unseat the kinematics thus largely eliminating pretravel variation. ( Renishaw plc
2006) ................................................................................................................................. 10
Figure 10 A micro-strain gauge transducer ( Renishaw plc 2002) ....................................... 10
Figure 11 A micro strain gauge transducer ( Renishaw plc 2002) ....................................... 11
Figure 12 Piezo shock sensing. The shock wave travels up the stylus and is transmitted
through kinematics. A piezo ceramic sensor detects shock of impact. Shock
sensing is not 100 % reliable so is often backed by kinematic and strain sensors to
conform shock Renishaw plc 2006) ............................................................................. 11
Figure 13 A CMM with an analogue probing system.............................................................. 14
Figure 14 An exploded diagram of an analogue probe head (Zeiss) .................................... 15
Figure 15 A photograph of the probe head shown in the exploded diagram left..................... 15
Figure 16 A micro-CMM probe. The stylus tip diameter is 0.125 mm. .................................. 16
Figure 17 A manually articulating probe head ( Tesa Group) .............................................. 23
Figure 18 Renishaw type PH1 and PH5 probe heads ( Renishaw plc 2002) ........................ 24
Figure 19 A Renishaw PH10M indexable motorised head ( Renishaw plc 2006) ............... 25
Figure 20 An autochange rack ( Tesa Group)....................................................................... 26
Figure 21 An extension bar kit Renishaw plc 2014 ............................................................. 27
Figure 22 An extension bar in use. Tesa Group .................................................................. 27
Figure 23 Effective Working Length ( Renishaw plc 1987) ................................................ 31
Figure 24 Star styli ( Renishaw plc 2014) ............................................................................ 32
Figure 25 Disc styli .................................................................................................................. 33
Figure 26 A disc stylus in use ( Renishaw plc 2014)............................................................ 33
Figure 27 Cylinder styli probing a thread and a thin sheet ...................................................... 33
Figure 28 A cylinder stylus in use ( Renishaw plc 2014) ..................................................... 34
Figure 29 Ceramic hollow ball styli ( Renishaw plc 2007) .................................................. 34
Figure 30 Pointer Styli ............................................................................................................. 35
Figure 31 An application of a pointer stylus ( Renishaw plc 2014) ..................................... 35
Figure 32 A five-way stylus centre (Renishaw plc 2007)..................................................... 36
Figure 33 Stylus knuckle (Renishaw plc 2007) .................................................................... 36
Figure 34 Stylus knuckle (Renishaw plc 2007) .................................................................... 37
Figure 35 Stylus Adaptors ( Renishaw plc 2014) ................................................................. 37
Figure 36 Stylus extensions ( Renishaw plc 2014) ............................................................... 38
Figure 37 A gram gauge ( Renishaw plc 2011) .................................................................... 40
Figure 38 Contact on stylus tip not on the stylus shaft ( D.R.Coleman & T.F.Waters) ....... 42
Figure 39 Stylus qualification .................................................................................................. 45
Figure 40 Alternative patterns of probe movement (F M Chan et al) ..................................... 51
Figure 41 Examples of continuous scanning probes used for gear tooth and turbine
blade measurement ........................................................................................................... 57
Figure 42 Operation of 2-D scanning head axial probe motion............................................ 57
Figure 43 Operation of 2-D scanning head radial probe motion .......................................... 58
Figure 44 A five-axis scanning probe ( Renishaw plc 2014) ............................................... 58
Figure 45 A sweep scan round a curved surface ( Renishaw plc 2008) ............................... 59
Figure 46 A non-contact probing system ................................................................................. 62
Figure 47 Optical trigger probe system ( Renishaw plc 2006) ............................................. 63
Figure 48 Combined probe head ( Zeiss).............................................................................. 64
Figure 49 An optical probe head ( Zeiss) ............................................................................. 64
Figure 50 NPL high precision traceable FreeForm reference standard, the standard is
available in a number of sizes........................................................................................... 65
Preface
CMM probing
Preface
The author hopes that after reading this Good Practice Guide you will be able to better
understand CMM probing. The content is written at a simpler technical level than many of
the standard textbooks so that a wider audience can understand it. I am not trying to replace a
whole raft of good textbooks, operators manuals, specifications and standards, rather present
an overview of good practice and techniques.
There are six guiding principles to good measurement practice that have been defined by
NPL. They are:
The Right Measurements: Measurements should only be made to satisfy agreed and wellspecified requirements.
The Right Tools: Measurements should be made using equipment and methods that have
been demonstrated to be fit for purpose.
The Right People: Measurement staff should be competent, properly qualified and well
informed.
Regular Review: There should be both internal and independent assessment of the technical
performance of all measurement facilities and procedures.
Demonstratable Consistency: Measurements made in one location should be consistent with
those made elsewhere.
The Right Procedures: Well-defined procedures consistent with national or international
standards should be in place for all measurements.
Introduction
IN THIS CHAPTER
Chapter 1
Chapter 1
CMMs are widely used in manufacturing industries for accurate, fast and reliable
dimensional measurement of components. They are generally expensive to buy and maintain
but their results are crucial to the manufacturing process.
Two forms of CMMs are available; manual and Direct Computer Control (DCC). Generally,
use is made of manual CMMs for first-article inspection work. If the primary manufacturing
environment is production orientated, a DCC machine is the usual choice.
DCC machines generally are the tools of choice for manufacturers who need to gather and
analyse large amounts of data for maintaining control of the manufacturing process. The
CMM is normally completely under DCC operation thereby eliminating any user influence
on the quality of the recorded data.
CMM probes
CMMs can sense the surface using a variety of devices. These include touch trigger probes,
analogue (measuring) probes, continuous scanning, and non-contact systems. The bulk of this
guide will concentrate on touch trigger probes although found throughout this guide will be
information on the other probing systems.
Mention will be made of some of the developments in probing technology since this the last
issue of this guide including five-axis measurement probes, micro probes and fibre probes.
The guide discusses changes to the international standards relating to CMM probing since the
last issue of this guide.
Chapter 1
Design and
principles of
mechanical type
touch trigger
probes
IN THIS CHAPTER
Chapter 2
Figure 2 Schematic of a kinematic probe shown in seated position showing the three rods and three pairs
of balls.( Renishaw plc 2002)
An electrical circuit is made through contacts such that a trigger signal is generated whenever
the stylus is deflected in any direction. At the moment of contact, this trigger signal notifies
the computer to record the machine position (figure 4). These co-ordinates are then stored for
Chapter 2
subsequent use. The probe design allows further stylus deflection following contact, allowing
time for the CMM to decelerate. As the stylus moves off the surface, the spring force (FS in
figure 5) causes the stylus mounting to reseat. The mechanism allows the probe to detect
surfaces with sub-micrometre repeatability.
Figure 4 The moment of trigger. A trigger probe is in one of two states seated or unseated. Seated when
not in contact with the workpiece and unseated when in contact. (Renishaw plc 2006)
The main problem associated with the kinematic design of touch-trigger probes is that the
geometry of the contacts results in slightly different contact forces being required to trigger
the probe depending on the direction in which the stylus and surface meet. This variation
Chapter 2
leads to differing degrees of bending of the stylus between the moment when it makes contact
with the workpiece to the instant when a trigger signal is generated. This deflection due to
contact forces prior to the trigger signal is known as pre-travel. Pre-travel variation is the
direction dependent range of this deflection. Stylus pre-travel can be accommodated by probe
qualification against a calibrated reference sphere. Since pre-travel can vary according to the
direction of probing, it is necessary to qualify the probe in the same direction as that of the
intended measurement.
Figure 5 Forces that are in action during the trigger process. The amount of stylus bending at the point
that a trigger occurs is known as the pre-travel. ( Renishaw plc 2014)
Figure 5 shows the forces that are in action during the trigger process. The contact force FC
generates a moment about the kinematics, resisted by the spring force FS. The point of
equilibrium is reached when the moment generated by FC x L matches that generated by FS x
R.
The load FC causes the stylus to bend. The amount of bending prior to the point that a trigger
occurs depends of the magnitude of FC needed to overcome the spring force, plus the length
and stiffness of the stylus.
The amount of stylus bending at the point that a trigger occurs is known as the pre-travel. The
pre-travel is direction-dependent, since it depends on the lever arm over which the spring
force acts (R). As will be seen in the following figures, R changes depending on which
direction the contact force acts relative to the probe mechanism, meaning the the magnitude
of the contact force needed to trigger the probe also varies with probing direction.
Chapter 2
Figure 6 High force and low force direction. High force is a pivot about a single contact. For the low force
direction the mechanism pivots about two contacts. ( Renishaw plc 2006)
Figure 7 Image showing the low force (FL) and high force (FH) directions and its relationship to the
number of pivots. ( Renishaw plc 2014)
Figure 8 Axial probing (no mechanical advantage over the spring so the forces are equal. ( Renishaw plc
2006.)
Advances in probe design have helped to reduce this effect (figure 9 and figure 10). The use
of three highly sensitive strain gauges situated in the probing head can detect contact forces
building up between the stylus and workpiece (figure 11). In such designs, a trigger signal is
10
Chapter 2
generated at a very low force which is consistent in all directions therefore reducing the error
due to direction- dependent forces.
Figure 9 A strain gauge probe mechanism. Note the one of the four silicon strain gauges is shown above
the spring in red. Strain gauges trigger at forces that do not unseat the kinematics thus largely
eliminating pretravel variation. ( Renishaw plc 2006)
The following list highlights the advantages of strain gauge probe technology over
conventional kinematic probes.
Increased stylus lengths can be supported (since contact forces are low, stylus
bending is minimised). Use can be made of long styli without reducing the
accuracy of measurement.
They eliminate the lobing characteristic.
Improved repeatability due to the low consistent trigger force.
Contoured surfaces can be measured using 3-D operation whilst maintaining high
accuracy.
Increases probe life by up to a factor of ten compared to conventional kinematic
probes.
11
Chapter 2
Figure 11 shows how the stylus module is mounted on the probe via a kinematic joint. This
joint allows rapid stylus changing capability and probe overtravel protection.
Further developments in trigger probe technology have seen the introduction of combined
multi-sensing shock, strain and kinematic sensors. These types of probe can detect the minute
shock of impact between the stylus and surface (figure 12), the force exerted on the stylus
during displacement and the absolute displacement of the stylus.
Figure 12 Piezo shock sensing. The shock wave travels up the stylus and is transmitted through
kinematics. A piezo ceramic sensor detects shock of impact. Shock sensing is not 100 % reliable so is often
backed by kinematic and strain sensors to conform shock Renishaw plc 2006)
Chapter Summary
12
Chapter 2
Analogue
(measuring)
probes
IN THIS CHAPTER
14
Chapter 3
15
Chapter 3
Microprobing systems
Conventional CMMs equipped with conventional probing systems are not suitable for
measuring very small parts as the size of the stylus tip (> 1 mm) is usually too large and the
static probing force (50 mN to 200 mN) is too high. In addition, the resolution of the probe is
often not good enough. The dynamic probing force due to the high moving mass can also be
an issue.
To overcome these limitations, commercial probing systems have been developed by Zeiss
and XPRESS Precision Engineering based on probes with silicon membranes with integrated
strain gauge sensors. These probing systems usually incorporate stylus tips with diameters of
the order of 0.2 mm.
Other microprobes such as that developed at PTB and NIST are based on a spherical tip
created on the end of an optical fibre. When the tip is displaced the amount and direction of
displacement can be measured with a vision system. Probe diameters as small as 0.01 mm are
possible with this system along with probing forces of the order of a few millinewtons. Its
main disadvantage is that it does not allow axial probing so is essentially a 2D probe.
All microprobes are essentially 2.5D at best. In the case of the Zeiss microprobe the stylus
and probe tip are integrated so a stylus change necessitates changing the whole probing
system. The stylus can't be articulated and multi-stylus configurations are impossible.
16
Chapter 3
Chapter Summary
Understand the basic designs of analogue probes and how the differ from touch
trigger probes.
Be aware of microprobing systems.
Probing systems
an overview
IN THIS CHAPTER
18
Chapter 4
oth analogue and touch trigger probes have a stylus that makes contact with the
workpiece being measured. Determining the number of points required to obtain an
accurate measurement is dependent to a large degree on the skill and experience of
the user, although semi-automated systems based on uncertainty estimating software are
under development. Users requiring guidance on this subject are recommended to refer to
NPL Good Practice Guide No. 41 CMM Measurement Strategies.
Summarised below are the key factors to be considered by the user, before measurement
takes place.
probe
extension
selection
19
Chapter 4
Figure 21) will depend on the type of measurement required, the accuracy, the mass and
length of the stylus and the rigidity of the attachment face of the stylus. Probe extensions fit
between the probe head and the contact trigger probe. Chapter 5 covers probe extensions in
detail.
Chapter Summary
This chapter is an introduction to the chapters that are about to follow.
20
Chapter 4
Probe head
selection
IN THIS CHAPTER
22
Chapter 5
robe head selection can significantly affect the overall system performance. This
chapter covers the selection of the probe head and looks at articulating and nonarticulating probing systems. Listed below are a number of factors that need to be
considered when choosing a probe head.
The response speed of the probe system must be compatible with the CMM controller.
Where possible use the same probe body for a complete measuring application.
The probe body should be able to accommodate all styli used for the application.
In manual operation, a touch probe may be subjected to accidental abuse. It is possible that
the user may vary the speed and force when bringing the stylus into contact with the
workpiece, this variation may also result in an excessive amount of over travel. To avoid
damage to the trigger mechanism probe heads designed for manual operation must therefore
be more robust than probe bodies designed for DCC.
The choice of probe head can also significantly affect the overall system performance.
Compromises may therefore have to be made in the selection of the probe head in order to
satisfy all measurement requirements. For example, a probe head that is capable of carrying a
heavy stylus will also have a high measuring force and a slow response speed. In addition,
when selecting a probe head the user should be aware that the more sensitive probe heads
need a better thermal operating environment. For best results, the user should monitor the
local ambient temperature and compare against that specified for the particular probe head in
use.
In addition to the amount of weight the probe head will support, and the trade-off between
sensitivity and thermal operating environment, the user should also consider the use of an
articulating or non-articulating head and if it should be manual or automatic.
The reader should also be aware of the performance tests specified in ISO 10360-5:2010
Geometrical Product Specifications (GPS) Acceptance and reverification tests for
coordinate measuring machines (CMM)Part 5: CMMs using single and multiple-stylus
contacting probing systems. Knowledge of these tests will help you to interpret data in
manufacturer's brochures and manuals.
23
Chapter 5
and the B-axis controls the direction that the probe points in the horizontal plane. The angles
are usually in either 15 degree or 7.5-degree increments. This type of probe head allows the
measurement of features on the back or sides of the workpiece as well as features at oblique
angles.
Articulating probing systems come in two general varieties: manual (figure 17) and motorised
(figure 18). Each articulating probe head has a maximum allowable extension length. If
penetration into a deep bore is required, the user should ensure the use of a probe head that
can support the weight of the required extension bar.
Manually articulating probing systems require user intervention to move the probe to the
desired orientation. These types of probe can be used on manual and DCC machines;
however, on a DCC machine the program will pause at each programmed probe orientation
point and wait for the user to articulate the head.
24
Chapter 5
Figure 18 Renishaw type PH1 and PH5 probe heads ( Renishaw plc 2002)
With manually articulating probing systems, once the required position has been selected the
new stylus position will require qualification against the reference sphere. It should be noted
that the heat generated by the user when orientating the probe may cause errors in the
recorded results due to thermal expansion of the stylus. Therefore, it is advisable to wear
gloves when orientating the probe.
With some types of manually articulating probing systems a number of qualifications using a
reference sphere can be performed with the probe set in a number of positions. During
measurement, the user may re-orientate the probe head to one of the positions previously
qualified and measurement can then take place without further checking against the reference
sphere. Other manually articulating probing systems require qualification with a reference
sphere directly after each re-orientation of the head. It is important, when using this type of
probe head, that no movement of the reference sphere occurs during qualification as this will
lead to errors in the measurement results, due to qualification errors.
Automatic or motorised probing systems (figure 19) allow automatic changing of the probe
angles from within the part program. Therefore, very complex part programs utilising many
different probe positions can be run completely unattended. These probe heads are used only
on automated CMMs. The same qualification procedures described for manually articulating
probing systems are also required for automatic or motorised probing systems.
If the user employs a Direct Computer Control machine and only requires articulation of the
probe head occasionally then the use of a manually articulating probe head is recommended.
If, however, the measurement strategy requires articulation on a regular basis then an
automatic articulating probe head is required. This type of probe head will allow the user to
gain full benefit from the part program and will avoid constant pauses in the machine cycle in
order for the user to re-orientate the probe head manually. A part program is of little benefit if
the user is required to stand by the machine during the part program cycle and change probe
orientations on a frequent basis.
25
Chapter 5
Section 6.4 of ISO 10360-5 covers the verification of articulating probing systems. The
principle of the test is to measure the form, size and location of a test sphere using five
different angular positions of an articulating probing system. At each angular position, 25
points are measured on the test sphere, for a total of 125 points using all five positions. The
ranges of the centre of all five spheres are calculated. The largest of these three ranges yields
the probing-system location value. In addition, a least-squares sphere fit using all 125 points
is examined for the form and size errors of indication. This analysis yields the multi-stylus
size error and multi-stylus form error.
Changing stylus/probe
Probe accuracy depends on the triggering system design. The strain gauge type is more
accurate than the simpler touch-trigger probe designs, especially when used with a long
stylus.
When designing a measurement strategy it is good practice to consider the systems ability to
change the stylus tip automatically within a part program. Requalification of the stylus tip
before use will always be required with those probe heads where the styli removal is by
unscrewing from the probe and attaching a replacement.
26
Chapter 5
Some stylus modules are attached magnetically to the probe. Remove and replace these
modules either by hand or by the use of a module changing rack. It is recommended that, in
order to maintain accuracy; after the stylus module change has been completed, the stylus
should be requalified before further measurement takes place. This is particularly important if
the temperature in the room has changed since the last qualification.
Using an autochange rack (figure 20) allows automatic stylus tip change within a part
program with no operator intervention being required.
Note that ISO 10360-5 contains information on verification when a stylus- or probe-changing
system is supplied with a CMM and is covered in a later chapter.
27
Chapter 5
28
Chapter 5
Chapter summary
Be aware of the types of articulating probe head, both manually articulating and
motorised.
Be aware of good practice when using probe head extension bars.
Selection of
stylus type
IN THIS CHAPTER
30
Chapter 6
tylus tips make contact with the workpiece. They generally consist of synthetic mono
crystalline highly spherical industrial rubies (Al2O3) mounted on a shaft. Ruby is a hard
ceramic material ensuring minimum wear of the stylus ball. There are numerous types
and sizes available for a variety of applications; the shafts on which the styli are mounted are
usually non-magnetic stainless steel, ceramic, carbon fibre or tungsten carbide.
Ruby ball styli are suitable for the majority of probing applications. To maximise the
accuracy of measurements taken, the user should follow the following rules:
31
Chapter 6
32
Chapter 6
Disc stylus
Where the feature is too small for easy access of the star stylus then a disc stylus (figure 25)
can be used. A simple disc stylus requires qualifying on only one diameter using a ring
gauge, this limits effective probing to X and Y directions only.
33
Chapter 6
The edge of the disc has a spherical shape and, because only a small region of the spherical
surface is available for contact, thin discs require careful angular alignment to ensure correct
contact between the disc surface and the probed features.
34
Chapter 6
A large hollow ceramic ball (figure 29) can be used for probing deep features in X, Y and Z
directions. Probing with large diameter balls can average out the effects of rough surfaces.
Use a pointed stylus (figure 30) to inspect points, scribed lines and thread depths. The use of
a radius-end pointer stylus allows more accurate datuming and probing of features and can be
used to inspect the location of small holes.
35
Chapter 6
A stylus centre (figure 32) allows maximum probing flexibility, using a single probe taking
up to five styli, and can be configured to the users specification. Various sizes of centre
block are available and each stylus can have a different length and tip diameter as required.
The user should take care to ensure that the mass of the stylus is not excessive as this may
36
Chapter 6
exert an out-of-balance force on the probe mechanism. This type of stylus can reduce cycle
times by avoiding the need to change the stylus during the measurement cycle.
37
Chapter 6
38
Chapter 6
It is always important with any kind of adaptor to make sure all the joints are tight before
making measurements.
Chapter Summary
Touch probe
operation
IN THIS CHAPTER
40
Chapter 7
his chapter will give an overview of some of the considerations when using a touch
trigger probe.
41
Chapter 7
Approach velocity
A slow approach velocity will ensure high accuracy; the use of the same approach velocity
for all measurements will ensure high precision readings. The final approach velocity is
usually under the control of the machine software system and cannot always be adjusted by
the user.
It is good practice that the approach velocity used for the qualification of the probe is the
same as that used during the measurements and that the force and direction of the approach
are maintained in accordance with the procedure used for probe qualification.
Workpiece deformation
At the contact point, a force will occur between the stylus and the workpiece. If the
component being measured is not robust and therefore likely to deform then a non-contact
probe needs to be considered. Typical non-contact probes available use video and laser
technologies (see chapter on Non-contact probing systems).
Some CMM software has special measuring force extrapolation functions. Measurements are
made at two measuring forces and the results extrapolated to zero force. This software is used
for measuring elastic workpieces 2.
Note that it may not be possible to control the maximum force that is applied use of small diameter stylus
tips on 'soft' materials may lead to plastic deformation (indenting).
42
Chapter 7
Figure 38 Contact on stylus tip not on the stylus shaft ( D.R.Coleman & T.F.Waters)
Chapter summary
Probing system
qualification
IN THIS CHAPTER
44
Chapter 8
45
Chapter 8
Although careful qualification of the stylus will not directly reduce the errors inherent in the
probe design, it will improve the accuracy of some measurements, such as features of size.
For example, when determining say the distance between two spheres or two holes the
calculation of the location of the centres is unaffected by any error in the stylus tip radius.
However, when measuring a feature of size, such as the length between two faces or the
diameter of a hole, the radius of the stylus tip will have an effect since it is used in the
calculation of the feature size. By increasing the number points used in the stylus tip
qualification, the resulting effective stylus tip diameter will be more accurate. To maintain
the full benefit of improved qualification, the workpiece feature under measurement must
also be measured with an increased number of points. As stated earlier, benefit will be gained
from using 25 to 50 points per tip qualification.
It is recommended that for small diameter styli a small diameter reference sphere should be
used, for example, for qualification of a 1 mm diameter tip use an 8 mm diameter reference
sphere. The user should also ensure that if more than one reference sphere is available the
value that is entered into the software relates to the sphere in use. A common error is entering
the wrong value for the reference sphere in use into the CMM software. If this happens then
the qualification output will be incorrect. It should also be noted that if an ISO 10360:2
verification has been performed on the machine then that machine is only verified for
measurements made using the same reference sphere as used for the verification test. It is
advisable, wherever possible, to only use the reference sphere supplied with the machine.
Monitoring qualification
Keep a written record of the qualification constants for the stylus for future reference. Ideally,
if the same probe is used regularly its qualification constants should be monitored. At the
very least record the effective diameter of the probe tip. Some CMM software gives an
indication of the deviations of the probed points from a true sphere. The user should check
that these deviations are within the normal expected range. Remember if the probe
46
Chapter 8
qualification is incorrect all future measurements made until the next qualification will be
incorrect. Ask the following question.
Does this probe normally output this value, if not why has the value changed?
If the qualification values have altered significantly then the user should take action to
investigate the reason why. Make sure that the stylus and reference sphere are clean, that the
value entered into the software corresponds to the reference sphere currently being used and
that the probing strategy is the same as that used previously.
Measuring the length of a known artefact, for example, a calibrated gauge block or plain
setting ring is a simple check on the probe qualification. If the difference between the
calibrated size of the gauge block and the length you measure is not within the machine's
specification at this length, then requalify the probe and repeat the check.
Chapter summary
To summarise, the key steps in the probe qualification procedure are listed below.
Clean stylus and calibration sphere and check that it is adequately clamped.
Check correct calibration sphere diameter is entered into the software (check against
latest calibration certificate).
Calibrate styli using a probing strategy that matches the probing directions on the
workpiece. At the very minimum, probe two points close to the pole and four points
on the equator. Use automatic calibration routines if available.
Check that sensible values have been recorded - keep all printouts.
Check against any history.
Measure a known artefact before measuring the workpiece.
Sources of
uncertainty of
measurement
IN THIS CHAPTER
48
Chapter 9
49
Chapter 9
100
54
Tungsten
carbide
600
40
Ceramic
380
95
The above table shows, for instance, that tungsten carbide is very stiff but its specific
stiffness is low because it is very heavy (dense). Ceramic on the other hand has a high
specific stiffness because it is light and stiff. The best material (not shown in the table) is
carbon fibre as it is lighter and stiffer than ceramic. The limitation of carbon fibre is that
shafts made from it have to be at least 3 mm in diameter. Steel is the poorest material as it is
too heavy and not stiff enough for long styli.
An experiment
The effect of some of the above factors on a measurement can be difficult to quantify in
general terms. However, the effect can be determined experimentally in the following
manner:
Mount a known artefact on the machine, for example, a calibrated gauge block or plain
setting ring. Measure the artefact using a number of commonly used stylus and probe
configurations. Examine the variations in the measured sizes and, in the case of a ring gauge,
the position of the centre of the ring. Compare the differences of the measured size using
each stylus with the known size to give the user an indication of the increase in error
associated with each stylus type.
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Chapter 9
Probing strategies
The performance characteristics of any probing system are influenced by the measurement
strategy selected by the user. For example, the machine dynamic errors depend on factors
such as probing direction, probe speed, approach distance and acceleration values.
The following is a number of parameters listed according to their influence on the accuracy
of a CMM fitted with a touch trigger probe.
51
Chapter 9
All of the patterns were tested both in the clockwise and in the anti-clockwise direction. The
results obtained using the saw tooth pattern indicated considerable variability in both
directions furthermore the variability of results produced using this pattern was larger than
those for the radial and circular patterns.
The results also indicated that there are no differences in the performance between the radial
and the circular patterns when they were measured in the clockwise and the anti-clockwise
directions respectively. However, when a number of tests were performed to compare the
behaviour of the two approach movements significant differences were found. The results
confirmed the radial method to be the best path for measurement.
52
Chapter 9
53
Chapter 9
To keep the stiffness high minimise the number of joints in the stylus assembly.
Use the shortest stylus possible.
Use the largest diameter stylus ball possible.
Avoid handling the stylus unnecessarily - use gloves when handling long stylus
combinations.
Most of the points listed above apply equally to both analogue and touch trigger probes.
Thermal expansion
Styli are a potential source of thermal expansion error. This can result, for example, from
handling of the probe body and stylus during attachment to the machine or when changing
the orientation of a manual articulating probe head.
To give an indication of the effect of temperature, an 8 mm diameter probe tip (typical
thermal expansion coefficient 5 10-6 C-1) experiencing a change of temperature of 3 C
will change in diameter by
5 106 8 3 = 0.000 1 mm
This change is significant on some of the higher accuracy machines on the market.
A more important change is the change in length of the stylus shaft. For a steel shaft 100 mm
long (typical thermal expansion coefficient 12 10-6 C-1) the change in length for the same
temperature change of 3 C is
12 106 100 3 = 0.003 6 mm
In addition, if two of the stylus tips on a t-shaped probe are 100 mm apart there will be an
apparent shift between measurements made on the position of the same feature using each of
the styli.
It is, therefore, necessary to allow a stylus to reach thermal equilibrium with the environment
before stylus tip qualification. This can take from several minutes to an hour, depending on
the accuracy needed and the size of the stylus. You can shorten this time by using gloves
when inserting stylus systems in to the probe head or probe changing rack.
If the environment is also subject to temperature fluctuations it is necessary to requalify at
frequent intervals.
54
Chapter 9
Chapter summary
Continuous
scanning
IN THIS CHAPTER
10
56
Chapter 10
onventional CMMs equipped with touch trigger probes use the discrete-point probing
method to record streams of points from the part surface. In discrete point probing,
the CMM lifts the probe head from the surface of the workpiece, moves it forward
and lowers it until contact is made again, this happens for every data point that is collected.
This single point procedure is relatively slow and is unsuited for the efficient measurement of
complex shaped workpieces and applications where large amounts of data are required, such
as form evaluation. The availability of dual-purpose probes that are able to utilise continuous
scanning and touch trigger operation allows fast set up procedures when switching modes.
Analogue probes for continuous scanning are designed to send an uninterrupted flow of data
back to the system computer; they eliminate the auxiliary movements required by discrete
(point-to-point) measuring probes. CMMs use two types of continuous scanning methods,
Open Loop and Closed Loop, depending on whether the geometry of the workpiece is
defined or undefined respectively
57
Chapter 10
Figure 41 Examples of continuous scanning probes used for gear tooth and turbine blade measurement
2-D probing systems are not as accurate as they cannot use all three probe axes
simultaneously. Probe size compensation takes place in a plane, not in space therefore they
cannot retrieve the part surface vectors and perform true 3-D measurements. These probes
have two operating modes, axial scanning (figure 42) and radial scanning (figure 43). In axial
scanning, only the axial-probe is free to move, the other two axes are locked. This mode is
suitable for profiling.
In radial-scanning mode (figure 43), the axial probe axis is locked and the other two are free
to move. Radial scanning is used in contouring applications. 2-D probes are able to
compensate for probe tip size in the scanning plane only; each measured point is affected by
cosine error. This method is not suitable for the inspection of convoluted surface parts.
58
Chapter 10
59
Chapter 10
Five-axis scanning allows the stylus to follow continuous paths around complex components
without having to leave the surface to change stylus or index the head (figure 45).
60
Chapter 10
Chapter summary
Adhesive wear can be found between surfaces during frictional contact and generally refers to unwanted
displacement and attachment of wear debris and material compounds from one surface to another.
Non-contact
probing systems
IN THIS CHAPTER
11
62
Chapter 11
on-contact probing systems are replacing the more traditional contact probing
systems in applications where sped is required or where the material properties are
not suitable for contact probing. These systems are fast and collect many data
points. However, the user should be aware of the limitations of such systems.
Currently traceability is difficult to demonstrate for such sensors and specification standards
relating to performance verification are at the early stages of development.
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Chapter 11
touch trigger probe. This ensures that it can be used with existing CMM software and
requires no specialist programming techniques.
Because the laser probe causes no distortion of workpiece surfaces it is well suited for the
inspection of pliable and delicate materials. Typical applications of such systems include the
measurement of seating and dashboards in automobiles, plastic mouldings, clay models and
rapid prototyping models. Laser probes can produce accurate measuring systems but it should
be noted that errors could be produced for certain types of workpiece material due to their
optical reflection properties.
Some non-contact sensors incorporate a structured light source that emits a plane of light
(Figure 46). When this plane intersects the part, a line of light forms along the contour of the
workpiece. The line is detected by an image sensor, which transforms it into a measurable
digital image from which it is possible to triangulate and calculate the (x, y, z) co-ordinates of
hundreds of points along the line.
Non-contact sensors can scan faster than analogue sensors, but they may have limitations in
accessibility to all workpiece features. Because of this frequent re-orientations of the head
may be required during the scanning process resulting in a reduction of the effective overall
system throughput.
Generally optical systems are not used for high accuracy applications and camera based
optical systems are limited by the size and number of pixels and resolutions of the camera
image (see Measurement good Practice Guide No.39 Vision Systems).
Non-contact scanning methods can be combined with analogue scanning to extend the
application of CMMs to include inspection of small complex parts.
Most CMM manufacturers nowadays offer multisensor systems that include contact and noncontact measuring devices. The CMM can be programmed to recognise when a touch trigger
probe is in use or when an optical system is operating. Autochange probe equipment or
multiple function-probing heads facilitates switching between systems.
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Chapter 11
One of the key benefits of a multisensor system is the flexibility of operation it gives the user.
Parts that require tactile and vision measurements can be inspected on the same machine and
do not have to be transferred from the CMM to a separate vision system therefore facilitating
economic inspection.
Figure 48 and figure 49 show other optical sensor configurations.
65
Chapter 11
are from genuine stray reflections and not from surface defects. Often measurements have to
be made with some kind of dulling agent applied to the surface.
The reference standard can also be used to verify the performance of Cartesian CMMs fitted
with tactile probing systems.
The standard bears several geometrical forms that are blended to form a single surface that
tests various aspects of instrument performance. Ceramic tooling balls or hemispheres on
66
Chapter 11
each corner of the standard aid registration. Supplied with each standard is a calibration
certificate, the relevant CAD model and traceable measurement data files.
It is good practice to use a standard such as this, or something similar representing typical
day-to-day measuring tasks to verify the performance on non-contact scanning systems. Such
an item allows day-to-day checks to be carried out and also allow the evaluation of new
measurement technologies.
Chapter summary
Published
Standards
IN THIS CHAPTER
12
Published standards
68
Chapter 12
his measurement good practice guide has provided an overview of the various
considerations relating to CMM probing. The reader is advised to keep up-to-date
with the standardisation work in this area. This chapter lists the currently available
CMM specification standards and gives an overview of the work in progress.
Knowledge of the standards will allow the reader to more fully understand manufacturers'
specifications and the processes involved in the performance verification of probing systems.
Published standards
International Standard ISO 10360 covers CMMs. This standard has nine parts:
ISO 10360-1 is relevant to this guide as it defines the terminology relating to the probing
system and the stylus system. It also has a section on scanning terms.
Part of ISO 10360-5 describes how to verify the performance of the probe for both single and
multiple stylus contacting probing systems. ISO 10360-4 extends this test for scanning
systems.
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Chapter 12
Since the last revision of this guide part 2 and part 5 have been updated and new parts 6, 7, 8
and 9 have been published. The single stylus probing test that appeared in ISO 10360-2: 2001
does not appear in the current edition of ISO 10360-2. The test is now in the new edition of
ISO 10360-5. Parts 8 and 9 are relevant to those systems fitted with optical probing systems.
To keep up-to-date on the latest revisions visit the catalogue on the ISO website
www.iso.org.
The following parts of the standard are currently under development as of August 2014. Both
have sections on evaluating probings made with each of these technologies.
70
Chapter 12
Summary
IN THIS CHAPTER
13
72
Chapter 13
his measurement good practice guide has provided an overview of the various
considerations relating to CMM probing. The pertinent points of this guide are
summarised below.
Glossary of terms
IN THIS CHAPTER
Glossary of terms
14
74
Chapter 14
Glossary of terms
erms defined below are based on the VIM, 3rd edition, JCGM 200:2008 (International
Vocabulary of Metrology - Basic and General Concepts and Associated Terms) and
ISO 10360 Parts 1 and 2.
This glossary of terms is taken from the Renishaw technical manual except where stated
Accuracy
Analogue probe
E-bar or ebar
Edge triggering
Extension
Indexing head
Jog
75
Chapter 14
Kinematic Seating
Kinematics
Lobing characteristics
Non-contact Probe
Optical Triangulation
Overtravel
Overtravel force
Pretravel
Pretravel variation
Probe
Probe head
A device fitted to the quill of the CMM that carries the probe
mounting connector. Probe heads may have fixed orientation
or may articulate to provide re-orientation of the probing
76
Chapter 14
Probe qualification
Ram
Reference sphere
Requalification
Scanning
Scanning Probe
Shank
Stylus
Stylus tip
77
Chapter 14
Stylus changing
Trigger force
The force that must be applied at the stylus tip to trigger the
probe.
Unidirectional repeatability
For a full list of terms see ISO 10360-1:2000 Geometrical Product Specifications (GPS)
Acceptance and reverification tests for coordinate measuring machines (CMM)Part 1:
Vocabulary
78
Chapter 14
IN THIS CHAPTER
15
Mechanical
Hazards associated with laser illumination
Chemical
80
Chapter 15
hen making measurements on a CMM any local safety rules should be adhered to
and a risk assessment undertaken before starting the work. If working at a
customers site be aware of any evacuation procedures and any extra risks such as
moving vehicles and overhead cranes. Some specific things to look for when carrying out a
risk assessment are listed below.
Mechanical hazards
Many of the items you are measuring may be relatively heavy. The appropriate lifting
techniques and equipment should always be used and safety shoes worn. Operators should
wear laboratory coats or overalls for safety reasons and to prevent fibres shed from clothing
from falling on items being measured.
Machines under direct computer control may move without warning. The operator should
stand back from the machine during an automatic run.
Chemical hazards
Chemicals may need to be used for cleaning purposes. Make sure the manufacturers safety
guidance is followed and the relevant personal protective equipment worn. Substances may
be covered by the COSHH regulations.
Appendices
IN THIS CHAPTER
16
82
Chapter 16
Appendix A
A.1
The National Physical Laboratory (NPL) is the UKs national measurement institute and is a
world-leading centre of excellence in developing and applying the most accurate
measurement standards, science and technology available. For more than a century NPL has
developed and maintained the nations primary measurement standards. These standards
underpin an infrastructure of traceability throughout the UK and the world that ensures
accuracy and consistency of measurement.
NPL ensures that cutting edge measurement science and technology have a positive impact in
the real world. NPL delivers world-leading measurement solutions that are critical to
commercial research and development, and support business success across the UK and the
globe.
Good measurement improves productivity and quality; it underpins consumer confidence and
trade and is vital to innovation. NPL undertake research and shares its expertise with
government, business and society to help enhance economic performance and the quality of
life.
NPL's measurements help to save lives, protect the environment, enable citizens to feel safe
and secure, as well as supporting international trade and companies to innovation. Support in
83
Chapter 16
areas such as the development of advanced medical treatments and environmental monitoring
helps secure a better quality of life for all.
NPL employs over 500 scientists, based in south west London, in a laboratory, which is
amongst the worlds most extensive and sophisticated measurement science buildings.
The National Physical Laboratory is operated on behalf of the National Measurement Office
by NPL Management Limited, a wholly owned subsidiary of Serco Group plc. For further
information: Switchboard 020 8977 3222 | www.npl.co.uk/contact
A.1.2 National Institute of Standards and Technology (NIST)
NIST is the equivalent of NPL in the United States of America. Founded in 1901, NIST is a
non-regulatory federal agency within the U.S. Department of Commerce. NIST's mission is
to promote U.S. innovation and industrial competitiveness by advancing measurement
science, standards, and technology in ways that enhance economic security and improve
quality of life.
The NIST web site at www.nist.gov often contains documents relevant to this guide in Adobe
PDF.
A.1.3 EURAMET
The European Association of National Metrology Institutes (EURAMET) is a Regional
Metrology Organisation (RMO) of Europe. It coordinates the cooperation of National
Metrology Institutes (NMI) of Europe in fields such as research in metrology, traceability of
measurements to the SI units, international recognition of national measurement standards
and related Calibration and Measurement Capabilities (CMC) of its members. Through
knowledge transfer and cooperation among its members EURAMET facilitates the
development of the national metrology infrastructures.
EURAMET serves the promotion of science and research and European co-operation in the
field of metrology.
This is realized by the following measures in particular:
o development and support of European-wide research co-operation in the field
of metrology and measurement standards;
o development, regular updating and implementation of a European Metrology
Research Programme (EMRP);
o support of members and associates when applying for research funds for the
purpose of European cooperative projects;
o co-ordination of joint use of special facilities;
o improvement of the efficiency of use of available resources to better meet
metrological needs and to assure the traceability of national standards;
o technical co-operation with metrology institutes beyond EURAMET and with
other regional and international metrology organisations;
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Chapter 16
A.2
Networks
A.3
A.3.1
BSI started in 1901 as a committee of engineers determined to standardise the number and
type of steel sections in order to make British manufacturers more efficient and competitive.
The BSI Group is now the oldest and arguably the most prestigious national standards body
in the world and is among the worlds leading commodity and product testing organisations.
Website www.bsi-group.com.
A.3.2 International Organisation for Standardization (ISO)
The International Organization for Standardization (ISO) is a worldwide federation of
national standards bodies from some 140 countries.
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Chapter 16
The mission of ISO is to promote the development of standardisation and related activities in
the world with a view to facilitating the international exchange of goods and services, and to
developing cooperation in the spheres of intellectual, scientific, technological and economic
activity.
ISO's work results in international agreements that are published as International Standards.
Further information on ISO can be found at: www.iso.ch
A.4
Traceability
86
Chapter 16
A.5
Training courses
the underpinning knowledge and expertise for anyone who uses measurement tools or
requires an appreciation of the importance of measurement,
the principle knowledge and practical training for people who are required to use
dimensional measurement techniques to complete their daily tasks; and
the tools to instil and encourage questioning culture.
Enabling:
87
Chapter 16
the underpinning knowledge and expertise for anyone who uses measurement tools or
requires an appreciation of the importance of measurement,
the principle knowledge and practical training for people who are required to use coordinate measurement techniques to complete their daily tasks; and
the tools to instil and encourage questioning and planning culture
Enabling:
88
Chapter 16
Course Content
Geometric Product Specification (GPS) B
Content covered:
GPS standards; Envelope tolerance; Size Principles; ISO Limits and Fits
Projected tolerance; Free state condition; Virtual condition; Maximum
Material Condition principles; Geometrical tolerancing measurements using
first principle measuring equipment; Surface texture principles.
Measurement Principles and Methods C
Content covered:
Calibration; Uncertainties; Traceability; Procedures; First Principle
Measurement; Angle plate; Gauge blocks; Surface plate; Height micrometer;
Sine bar or sine table.
Process Control A
Content covered:
Statistical Process Control theory; Variation common, special causes;
Prevention versus detection; Collecting and calculating data when using
measuring tools; Callipers; micrometers; Basic charts Tally chart/Frequency
Table, Histogram, Control Chart; Reacting to variation; Benefits of process
control; Standard deviation; Capability indices; Fundamentals of Gauge R&R.
Measurement Principles and Methods D
Content covered:
Taper calculations; Angles; Diameters; Searching for triangles; Chords;
Radians; Manipulation of formula.
Co-ordinate Principles A
Content covered:
Application of equipment: First principles; Co-ordinate Measuring Machine;
Optical and vision machines; Articulating arm; Laser tracker; Projector;
Microscopes; Height gauge with processor; Contour measurement equipment.
Machine performance: Calibration standards; Self-verification/artefacts;
Measurement volume.
Alignment Techniques: 321/point system alignment; Flat face alignment;
Axes alignment; Car line/engine centre line.
Machine appreciation: Ownership; Care; Respect; Cost; Contribution to the
business.
Work Holding: Fixturing; Rotary table; Clamping; How to hold the part;
Influence of component weight, size, shape; Free state; Restrained state.
Co-ordinate geometry: Points; Plane; Line; Circle; Cylinder; Cone; Sphere;
Ellipse.
Sensor Types: Probing Strategies; Relevant standards; Environment.
Measurement Strategies: Number of points; Partial arc; Contact/non contact.
Co-ordinate methods A (OEM Training - equipment specific)
Content covered:
First principles; Co-ordinate Measuring Machine; Optical and vision
89
Chapter 16
Ready for:
apprenticeship programmes;
national curricula; and
workplace learning schemes.
Measurement just got simpler, and is now available to you whenever you want and
wherever you like sign up now for free.
http://www.npl.co.uk/e-learning
Save time - Reduce time away from the job and fit training into busy work
schedules
90
Chapter 16
Save money - Save travel costs and adjust training to your own schedule
Take the classroom with you - Have your lessons anytime, anywhere
Control your learning - Sequence your own learning and access only the
materials you require
Own your progression - Assess your progress and receive immediate feedback
91
Appendix B
Chapter 16
Further reading
92
Appendix C
Chapter 16
Manufacturers
The following is a list of probe and stylus manufacturers and distributors. This is by no
means a full list and the appearance of a manufacturer in this list is not an endorsement of its
products.
Renishaw are both a manufacturer of probe heads and a supplier of styli and accessories for
CMM probes. They can be contacted at New Mills, Wotton-under-Edge, Gloucestershire,
GL12 8JR. Renishaw can also be found at www.renishaw.com. This site contains various
documents that can be downloaded. .
Heidenhain are a German manufacturer of touch trigger probes (www.hiedenhain.com).
Fred V. Fowler Co Inc is an American manufacturer of touch trigger probes. They can be
contacted at 66 Rowe Street P.O. Box 299 Newton, Ma 02466 or at www.fvfowler.com.
SWIP U.K, a division of Oakwade, is a supplier of CMM styli and accessories. They can be
contacted at Unit 21, Hartlepool Workshops, Usworth Road Industrial Estate, Hartlepool,
TS25 1PD. SWIP can be found on the web at www.saphirwerk.com
N J Metrology PO Box 413, Bedford, MK41 9ZP can also supply SWIP and Renishaw
products contact website: www.njmetrology.com.
Tesa UK, Halesfield 13, Telford, Shropshire, TF7 4PL is a manufacturer of CMM probes
(www.tesagroup.co.uk).
Werth Messtechnik. Manufacturers of fibre probes.