Professional Documents
Culture Documents
Dr. K.Sivasankaran,
Associate Professor,
VLSI Division,
School of Electronics Engineering,
VIT University
ksivasankaran@vit.ac.in
ksivasankaran.vlsi@gmail.com
Mobile: 9994256440
Cabin: TT238
Outline
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
ASIC DESIGN
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
Syllabus
Introduction
Implementation Strategies for Digital ICs: Custom IC Design, Cell-based Design Methodology. Array based
implementation approaches. Traditional and Physical Compiler based ASIC Flow.
Digital ASIC Design using Verilog HDL
Verilog HDL: Levels of Abstraction, Hierarchical modeling and Delay modeling, Verilog constructs, FSM,
Memory modeling. Complex Digital System Design Examples.
RTL Simulation and Synthesis
Functional Simulation: Test bench Wrappers. Event-based Simulation: Event-based Simulation. Cyclebased Simulation.
RTL Synthesis: An overview of the synthesis based ASIC design flow. Synthesis Environment. technology
library: technology libraries, logic library basics, delay calculations.
Partitioning and Coding Styles: Partitioning for synthesis, Coding guideline for synthesis. Logic Inference:
Order dependence. Optimization and mapping constraints (clock, delay, area, design). Instantiating special
operators and black boxes. FSM synthesis, Performance-driven synthesis.
Static Timing Analysis
Overview of timing verification and static timing analysis. Critical path. Timing exceptions. Multicycle
paths, false paths, and timing constraints (such as setup, hold, recovery, and pulse width). Practical usage
of timing analysis.
Design for Testability
Types of DFT. Scan Insertion. Design Rules, DFT guidelines. Built-in-Self-Test(BIST):Test pattern Generation
Exhaustive , Pseudo Random , Pseudo Exhaustive , Output Response Analysis , Logic BIST architectures
With and without scan chains , Register Reconfiguration , Boundary Scan and core testing.
Module-I
ASIC DESIGN
Module-I
ASIC DESIGN
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
Mode of Evaluation
Module-I
Component
Marks
Weightage
Assessment Test
50
20
Surprise Test
10
10
Assignment
20
20
100
50
Total
100
ASIC DESIGN
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
10
Module-I
ASIC DESIGN
11
Module-I
ASIC DESIGN
12
ENIAC
Size : 30 x 50 ft
Weight : 30 tons
Tubes : 18 K
Resistors: 70 K
Capacitors : 10 K
Switches : 6 K
Power : 150 kW
Cost (1940) : US $ 400 K
Module-I
ASIC DESIGN
Microcomputer
Size : inch x inch
Weight : nil
Power < light bulb
Speed : 20 times faster
Memory : larger, more
computing capacity
Cost < $300 (compare
with $ 400 K + inflation
over 34 years).
13
14
Module-I
ASIC DESIGN
15
Module-I
ASIC DESIGN
16
Levels of Integration
Module-I
ASIC DESIGN
17
Module-I
ASIC DESIGN
18
Module-I
ASIC DESIGN
19
Moores law
Module-I
ASIC DESIGN
Source: Intel
20
[ITRS, 2011]
Module-I
ASIC DESIGN
21
Courtesy: Intel
Module-I
ASIC DESIGN
22
Why Scaling?
Technology shrinks by 0.7/generation
With every generation can integrate 2x more functions per
chip for about the same $/chip
Cost of a function decreases by 2x
But
How to design chips with more and more functions?
Design engineering population does not double every two
years
Hence, a need for more efficient design methods
Exploit different levels of abstraction
Module-I
ASIC DESIGN
23
Scaling Issues
Log(Idrain)
MOSFET
Ideal switch
switch
ON state
Current
OFF state
Current
OFF State
Current
Vgate
Threshold (Vth)
Module-I
ASIC DESIGN
24
MODULE
+
GATE
CIRCUIT
DEVICE
G
S
n+
Module-I
ASIC DESIGN
D
n+
25
ITRS Projections
Module-I
ASIC DESIGN
26
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
27
Module-I
ASIC DESIGN
28
2x2 cm
M1
M1
Source
NiSi
Drain
contact
10x10 mm
M1
NiSi
Silicon channel
4x4 m
500x500 nm
Module-I
ASIC DESIGN
30
10
1
0.1
0.01
0.001
1970 1980 1990 2000 2010 2020
Year
2000
SiGe
Metal gates
High-k dielectrics
Low-k dielectrics
Cu interconnects
W plug
Co-silicide
Ti-silicide
Ni-silicide
BPSG
Poly-Si
Si3N4
Oxi-nitride
As, B, P, Al, SiO2, Si.
PMOS channel
under the gate
ASIC DESIGN
32
High K dielectric
Metal gate
Strained silicon
Module-I
ASIC DESIGN
33
VG
VS
FET with:
Carbon nanotubes.
Self-aggregated organic nanotubes.
VD
Molecular transistors.
Emerging nanotechnology
solutions
Quantum
Dots
Molecular
devices
NT arrays
DNA self
assembly
Module-I
SETs
NanotubeFE
Ts
RTD
Nanoscale
CMOS
Molecular orientations
as Bits
Molecules
in Solution
DNA strands as
Bits
Self assembled
NT
ASIC DESIGN
Logic
Memory
Technology
35
Lower
Lower
Higher
Higher
Higher
Smaller
Lower
Higher
Lower
Lower
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
37
ASIC
Application Specific Integrated Circuit
E.g. Chip designed solely for use in cell phone
A chip that can be designed by an engineer with no particular
knowledge of semiconductor physics or semiconductor
processes.
Module-I
ASIC DESIGN
38
What is an FPGA?
ASIC DESIGN
Interconnection switches
I/O
I/O
Module-I
Logic
block
I/O
I/O
39
Module-I
ASIC DESIGN
40
Ethernet
MAC
Audio
Codec
Interrupt
Controller
GP I/O
Address
Decode
Unit
CPU
(uP / DSP)
CLK
SRAM
Module-I
Power Supply
CLK
CLK
Memory
Controller
SRAM
SRAM
SDRAM
ASIC DESIGN
Timer
UART
CoProc.
SDRAM
custom
IF-logic
Display
Controller
41
Next Step...
Ethernet
MAC
FPGA
Audio
Codec
Interrupt
Controller
GP I/O
Address
Decode
Unit
CPU
(uP / DSP)
CLK
SRAM
Module-I
Power Supply
CLK
CLK
Memory
Controller
SRAM
SRAM
SDRAM
ASIC DESIGN
Timer
UART
CoProc.
SDRAM
custom
IF-logic
Display
Controller
42
Audio
Codec
EPROM
Power Supply
SRAM
Module-I
SRAM
SRAM
ASIC DESIGN
SDRAM
SDRAM
43
Syllabus
Evaluation Procedure
VLSI-System Perspective
Discussion
Module-I
ASIC DESIGN
44
Module-I
ASIC DESIGN
45
Module-I
ASIC DESIGN
46