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MEDIUM-SPEED OPERATION
tPHL = t PLH = 70ns (Typ.) at CL = 50 pF and
VDD = 10V
QUIESCENT CURRENT SPECIFIED UP TO
20V
5V, 10V AND 15V PARAMETRIC RATINGS
INPUT LEAKAGE CURRENT
II = 100nA (MAX) AT VDD = 18V TA = 25C
100% TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC
JESD13B " STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTION
The HCF4070B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
The HCF4070B contain four independent
exclusive OR gates. This device provide the
DIP
SOP
ORDER CODES
PACKAGE
TUBE
T&R
DIP
SOP
HCF4070BEY
HCF4070BM1
HCF4070M013TR
PIN CONNECTION
September 2001
1/7
HCF4070B
INPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN No
SYMBOL
1, 5, 8, 12
2, 6, 9, 13
3, 4, 10, 11
7
A, C, E, G
B, D, F, H
J, K, L, M
VSS
14
VDD
Data Inputs
Data inputs
Data Outputs
TRUTH TABLE
INPUTS
LOGIC DIAGRAM
OUTPUT
A, C, E, G
B, D, F, H
J, K, L, M
L
L
H
H
L
H
L
H
L
H
H
L
Parameter
Supply Voltage
VI
DC Input Voltage
II
DC Input Current
PD
Value
Unit
-0.5 to +22
V
mA
200
100
mW
mW
Top
-55 to +125
Tstg
Storage Temperature
-65 to +150
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to VSS pin voltage.
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Parameter
Supply Voltage
VI
Input Voltage
Top
Operating Temperature
Value
Unit
3 to 20
0 to VDD
-55 to 125
HCF4070B
DC SPECIFICATIONS
Test Condition
Symbol
IL
VOH
VOL
VIH
VIL
IOH
IOL
II
CI
Parameter
Quiescent Current
VI
(V)
Output Sink
Current
Input Leakage
Current
Input Capacitance
|IO| VDD
(A) (V)
0/5
0/10
0/15
0/20
0/5
0/10
0/15
5/0
10/0
15/0
Output Drive
Current
VO
(V)
0/5
0/5
0/10
0/15
0/5
0/10
0/15
0/18
Value
0.5/4.5
1/9
1.5/13.5
4.5/0.5
9/1
13.5/1.5
2.5
4.6
9.5
13.5
0.4
0.5
1.5
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
<1
Any Input
Any Input
5
10
15
20
5
10
15
5
10
15
5
10
15
5
10
15
5
5
10
15
5
10
15
18
TA = 25C
Min.
Typ.
Max.
0.02
0.02
0.02
0.04
1
2
4
20
4.95
9.95
14.95
-40 to 85C
-55 to 125C
Min.
Min.
30
60
120
600
4.95
9.95
14.95
0.05
0.05
0.05
4.95
9.95
14.95
3.5
7
11
1.5
3
4
-3.2
-1
-2.6
-6.8
1
2.6
6.8
0.1
7.5
0.05
0.05
0.05
1.5
3
4
V
1.5
3
4
-1.1
-0.36
-0.9
-2.4
0.36
0.9
2.4
1
3.5
7
11
-1.15
-0.36
-0.9
-2.4
0.36
0.9
2.4
10-5
Max.
30
60
120
600
0.05
0.05
0.05
3.5
7
11
-1.36
-0.44
-1.1
-3.0
0.44
1.1
3.0
Max.
Unit
mA
mA
1
A
pF
The Noise Margin for both "1" and "0" level is: 1V min. with VDD =5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
Value (*)
Unit
Parameter
VDD (V)
5
10
15
5
10
15
Min.
Typ.
Max.
140
70
50
100
50
40
280
130
100
200
100
80
ns
ns
(*) Typical temperature coefficient for all VDD value is 0.3 %/C.
3/7
HCF4070B
TEST CIRCUIT
4/7
HCF4070B
inch
DIM.
MIN.
a1
0.51
1.39
TYP
MAX.
MIN.
TYP.
MAX.
0.020
1.65
0.055
0.065
0.5
0.020
b1
0.25
0.010
20
0.787
8.5
0.335
2.54
0.100
e3
15.24
0.600
7.1
0.280
5.1
0.201
L
Z
3.3
1.27
0.130
2.54
0.050
0.100
P001A
5/7
HCF4070B
mm.
MIN.
TYP
A
a1
inch
MAX.
MIN.
TYP.
1.75
0.1
0.068
0.2
a2
MAX.
0.003
0.007
1.65
0.064
0.35
0.46
0.013
0.018
b1
0.19
0.25
0.007
0.010
0.5
0.019
c1
45 (typ.)
8.55
8.75
0.336
0.344
5.8
6.2
0.228
0.244
1.27
0.050
e3
7.62
0.300
3.8
4.0
0.149
0.157
4.6
5.3
0.181
0.208
0.5
1.27
0.019
0.050
M
S
0.68
0.026
8 (max.)
PO13G
6/7
HCF4070B
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