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9-1-2004
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(a)
(b)
Fig. 1Isopleths from the Al-Si-Fe ternary phase diagram obtained from
the commercial software Pandat: (a) phase diagram of Al-7 wt pct Si and
Al-7 wt pct Si-0.5 wt pct Fe; and (b) phase diagram of Al-7 wt pct Si and
Al-7 wt pct Si-0.01 wt pct Fe.
METALLURGICAL AND MATERIALS TRANSACTIONS A
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(a)
(b)
(c)
Fig. 3SEM micrographs of an Al-4.5 pct Si alloy sample: (a) secondary electron image, (b) backscatter electron image of region indicated in (a), and (c)
elemental map of Fe showing the -(Al, Si, Fe) phase.
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Fig. 4Images showing association of eutectic Si with the -(Al, Si, Fe) phase. (a) Composite elemental map of Al, Si, and Fe (key inserted) obtained
from the image shown in (b). (b) TEM bright-field image showing locations where -(Al, Fe, Si) phase was found.
Particle 2
Particle 3
Particle 4
Particle 5
Element
Wt Pct
At. Pct
Wt Pct
At. Pct
Wt Pct
At. Pct
Wt Pct
At. Pct
Wt Pct
At. Pct
Al
Si
Fe
63.64
10.86
25.49
73.66
12.08
14.26
62.8
12.43
24.77
69.2
15.42
15.38
62.83
11.10
26.07
72.98
12.39
14.63
64.59
10.26
25.15
74.58
11.38
14.03
61.53
13.82
24.65
70.95
15.31
13.73
Makhlouf and Guthy critically reviewed the various hypotheses that have been proposed over the past 80 years to explain
the eutectic reaction in aluminum-silicon alloys.[16] Careful
examination of these hypotheses shows that they cannot
explain many observed phenomena that are associated with
chemical modification, particularly (1) they do not explain
the relatively large undercooling during solidification that
is observed with the evolution of the eutectic phases when
modifying elements are present, and (2) they cannot explain
the occurrence of eutectic modification without chemical
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Fig. 5TEM micrograph of an Al-7.5 wt pct Si-0.064 wt pct Fe sample. A [112]Al || [011]Si crystallographic relationship was observed between the eutectic Si and the adjoining eutectic Al. The white circles marked A, B, and C represent the areas where diffraction patterns were taken from Si, the Si-Al interface region, and Al, respectively. The respective diffraction patterns marked A, B, and C are shown below the bright-field image. It can be seen that the
[112]Si and [110]Al overlap well in the pattern taken at the interface region between Al and Si. The images are in inverse polarity mode to enhance viewing
contrast.
(a)
(b)
Fig. 6(a) and (b) Secondary electron SEM images of an Al-7.5 wt pct Si-0.064 wt pct Fe sample showing the evolution of coarse prequench eutectic Si
flakes upon which eutectic Al phase evolves.
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Fig. 9Ga ion image of an Al-7 wt pct Si-0.02 wt pct Sr alloy sample
showing the primary -Al dendrite and the eutectic region composed of
fine eutectic Al grains and fine Si phase.
(a)
Fig. 10Fibrous, broomlike morphology of eutectic Si phase in an Al7 wt pct Si-0.023 wt pct Sr alloy sample.
REFERENCES
(b)
Fig. 8Interface between primary -Al dendrite and eutectic region in an
Al-7 wt pct Si-0.023 wt pct Sr alloy sample. (a) Bright-field TEM image
showing the precipitation of blocky Si phase at the interface between the
-Al dendrite and the eutectic liquid. (b) Centered dark-field TEM image
showing the bright primary -Al dendrites and the inability of the eutectic liquid to feed the dendrite after the formation of blocky Si precipitates
at the interface.
additives but rather due to an increased superheat or a relatively fast solidification rate.[17,18] It is clear that the theory
presented herein can account for these as well as other relevant observations.
METALLURGICAL AND MATERIALS TRANSACTIONS A