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ICEMI2013
I. INTRODUCTION
More and more attention is being attached on the
performance degradation monitoring so that failure
can be predicted and prevented. This is referred as the
condition-based maintenance (CBM) [ 1 ] . The
diagnosis of the incipient faults, such as shifts in
performance parameters, is crucial, yet very difficult.
Xu et al. [2] has proposed to use the output voltage,
autoregressive-moving average (ARMA) coefficients,
and wavelet transform coefficients as the
combinational feature vector whose dimensions were
reduced by linear discriminant analysis (LDA) to train
hidden Markov model (HMM) for incipient fault
diagnosis of analog circuits. Deng et al. [3] has
proposed to use the fault features extracted based on
the fractional correlation and the sub-band Volterra
series to train HMM for incipient fault diagnosis of
nonlinear analog circuits. The aforementioned
incipient fault diagnosis methods are all based on
HMM, and the difference mainly lies in their ways of
extracting the feature. To improve the classification
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978-1-4799-0759-5 /13/$31.00 2013 IEEE
(8)
2
24 /(16 3 27) ,
2
2
G ( x) x exp( x / 2) , G ( x) exp( x / 2) .
The centroid of the closed region which is formed
by the waveform of signal and axes can be obtained as
follows:
1
f
u0
ug ( u ) du
f
f
f
(10)
g (u ) du
n0
n u x(n)
n 1
M
x(n)
(11)
n 1
E ( x m) 2
(5)
p( x) log p( x)dx
( x ( n))
2
(9)
where
k1 36 /(8 3 9) , k2
(4)
The skewness which is a measure
of the asymmetry
of the data around the mean value is defined as
follows:
H ( x)
(n)
n 1
M
n 1
[ E ( x m)]3
v3
var( x)
E{x 4 }
[ E{x 2 }]2
kurt ( x)
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(7)
ICEMI2013
ICEMI2013
V. SIMULATION RESULTS
The experimental circuit is a leapfrog filter (Fig.3),
which is a benchmark circuit of ITC97 [9]. The
tolerance of the resistors and capacitors are set to 5%
and 10% respectively. There are many components in
the filter, and some components such as R1, R2, R3,
R4, R8 and C2 that are more sensitive to the test
signal than the other components, are selected as the
potential faulty components. For each of the faulty
components, two soft-fault classes are shown as
follows: a class for the component values larger than
the nominal one (labeled by) and the other for the
component values smaller than the nominal one
(labeled by). Therefore, 12 fault classes, in addition to
the fault-free condition, are simulated, and output of
the leapfrog filter is used as the test node.
Faulty
Component
R1
[1.05Yna1.15Yn]
[0.85Yn0.95Yn]
R2
[1.05Yn1.15Yn]
[0.85Yn0.95Yn]
R3
[1.05Yn1.15Yn]
[0.85Yn0.95Yn]
R4
[1.05Yn1.15Yn]
[0.85Yn0.95Yn]
R8
[1.05Yn1.15Yn]
[0.85Yn0.95Yn]
C2
[1.10Yn1.20Yn]
[0.80Yn0.90Yn]
Fault
ID
F0
F1
F2
F3
Fault
Class
NF
R
R
R
Nominal
Value
Fault
Value
Tolerance
10K
10K
10K
11K
9K
11K
f4.5%
f5.5%
f4.5%
F4
R
10K
9K
f5.5%
F5
F6
F7
F8
F9
F10
F11
F12
R
R
R
R
R
R
C2
C2
10K
10K
10K
10K
10K
10K
20nF
20nF
11K
9K
11K
9K
11K
9K
23nF
20nF
f4.5%
f5.5%
f4.5%
f5.5%
f4.5%
f5.5%
f4.5%
f5.5%
98
mean
10
8
6
std
skewness
kurtosis
entropy
94
0.2
0
-3
x 10
0.04 0
centroid
96
0.4
10
20
30
40
Accuracy(%)
Range
F0
F1
50
92
90
88
10
20
30
40
50
86
0.03
0.02
3.5 0
10
20
30
40
50
10
20
30
40
50
10
20
30
40
50
10
20
30
40
50
84
50
3
2.5
0
14
100
150
200
250
samples for each fault class
300
12
10
0
2.9
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T ime(s)
2.88
2.86
65 0
4190
5000
60
55
4000
0
10
20
30
50 test samples
40
3000
50
2000
73.406
1000
MD based on PSO
Exhaustive
[3]
Fault
Class
NF
R
R
R
R
R
R
R
R
R
R
C2
C2
Average
[4]
Accuracy (%)
92.50
98.00
98.00
95.00
96.00
96.33
90.83
98.67
96.33
100.00
92.40
88.50
93.20
95.06
[5]
[6]
[7]
[8]
[9]
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VI. CONCLUSIONS
AUTHOR BIOGRAPHY
A near-optimal feature vector selected by MD
based on PSO has been proposed for diagnostics of
the incipient faults in analog circuits using LSSVM.
Through the simulation results for the three filters
with parametric faults, we can draw the following
conclusions:
The accuracy using the near-optimal feature
vectors is better than the accuracy
using a single vector.
The consuming time of the near-optimal feature
vectors selected by MD based PSO is reduced about
98% in comparison to the time of the optimal feature
vectors selected by the exhaustive method
The proposed method provides a tradeoff between
diagnostic accuracy and time for diagnostics of the
incipient faults in analog circuits, which is beneficial
for analog IC or circuits testing and diagnosis.
ACKNOWLEDGMENT
This work was supported in part by National Natural
Science Foundation of China under Grants 61071029,
60934002, 61271035 and 61201009, and in part by the
Fundamental Research Funds for the Central Universities
under Grants ZYGX2012J088.
REFERENCES
[1] DAI J, DAS D, PECHT M. Prognostic-based risk
mitigation for telecom equipment under free air cooling
conditions[J]. Energy, v2012,99(4):423-429.
[2] XU L, HUANG J, WANG H, et al. A novel method for
the diagnosis of the incipient faults in analog circuits