4 4 4 METALLOGRAPHY

number K is calculated based on the average number of grains Z per square

centimeter at 100X by the following formula:
K = 3.7 + 3.33 log Z

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For example, for A"of 5, there are 2.5 grains per square centimeter at 100X, which
translates to 16 grains per square inch at 100X, or ASTM 5. The Japanese
specifications also use the metric system, but the equation used produces grain
size numbers equal to ASTM numbers. The formula used is as follows:
m = 2G+3

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where m is the number of grains per square millimeter at IX.

Of the standard charts prepared by other countries, two should be mentioned.
The German chart SEP 1510, which is used for ferritic microstructures that are
equiaxed or elongated by cold work, illustrates nontwinned grains that are
equiaxed or elongated with axial ratios of 2:1 and 4:1. The French NF A04-102
chart for rating the grain size of carburized steels is particularly useful because it
depicts the case structure after etching with alkaline sodium picrate, which
preferentially darkens the cementite grain-boundary network.
To estimate the grain size of a given specimen, the sample must be carefully
polished and then etched in a manner consistent with the chart employed; i.e., if a
sample is given a grain contrast etch, the chart used should depict similarly etched
samples. Each sample should be rated at several randomly chosen locations, and
the average should be computed and rounded to the nearest whole number. The
operator should not view the image when selecting the fields, and no attempt
should be made to pick out "typical" areas for rating. Unbiased field selection
always produces the best results. If the grain structure is not uniform, the number
of fields rated should be increased.
Estimates are made by viewing the microstructure through the eyepieces or
on a projection screen interspersed with views of the chart. First impressions of
the most typical chart picture are usually best. Alternatively, some of the charts
may be available as eyepiece reticles, which makes it possible to compare the
structure and standard more efficiently. Plate I of ASTM E112 can be obtained as
transparencies. These can be held next to the projected image or superimposed
over it, thus permitting very good grain size estimates.
Although it is usually best to view the sample at the same magnification as the
standard, other magnifications can be used. If the magnification M is greater than
the chart magnification Mh, the true grain size number will be greater by a factor Q
than the apparent grain size number; the opposite result is obtained if M is less
than Mb. For example, suppose that a magnification of 200X is used with an
ASTM chart designed for 100X and the apparent grain size number for the sample
is ASTM 8.t To calculate Q, the following formula is employed:
Q = 6.64 log
Mb
t Grain size estimates are usually rounded to the nearest one-half unit.

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