Professional Documents
Culture Documents
(CD74
HC373
,
CD74
HCT37
3,
CD54
HC573
,
CD74
HC573
,
CD74
HCT57
3)
/Sub-
November 1997
CD74HC373, CD74HCT373,
CD54HC573, CD74HC573,
CD74HCT573
High Speed CMOS Logic
Octal Transparent Latch, Three-State Output
Features
Description
Ordering Information
HC Types
- 2V to 6V Operation
- High Noise Immunity: NIL = 30%, NIH = 30% of VCC
at VCC = 5V
TEMP. RANGE
(oC)
PACKAGE
CD54HC573F
-55 to 125
20 Ld CERDIP
F20.3
CD74HC373E
-55 to 125
20 Ld PDIP
F20.3
CD74HCT373E
-55 to 125
20 Ld PDIP
E20.3
CD74HC573E
-55 to 125
20 Ld PDIP
E20.3
CD74HCT573E
-55 to 125
20 Ld PDIP
E20.3
CD74HC373M
-55 to 125
20 Ld SOIC
M20.3
CD74HCT373M
-55 to 125
20 Ld SOIC
M20.3
CD74HC573M
-55 to 125
20 Ld SOIC
M20.3
CD74HCT573M
-55 to 125
20 Ld SOIC
M20.3
PART NUMBER
HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
VIL= 0.8V (Max), VIH = 2V (Min)
- CMOS Input Compatibility, Il 1A at VOL, VOH
PKG.
NO.
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer or die for this part number are available which meets all
electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
File Number
1679.1
OE 1
20 VCC
OE 1
Q0 2
19 Q7
D0 2
19 Q0
D0 3
18 D7
D1 3
18 Q1
20 VCC
D1 4
17 D6
D2 4
17 Q2
Q1 5
16 Q6
D3 5
16 Q3
Q2 6
15 Q5
D4 6
15 Q4
D2 7
14 D5
D5 7
14 Q5
D3 8
13 D4
D6 8
13 Q6
Q3 9
12 Q4
D7 9
12 Q7
GND 10
11 LE
GND 10
11 LE
D1
D
G
D2
D
G
D3
D
G
D4
D5
D6
D
G
D7
D
G
D
G
LE
OE
O0
O1
O2
O3
O4
O5
O6
O7
CD74HCT573
D0
D1
D2
D3
D4
D5
D6
D7
LE
OE
O0
O1
O2
O3
O4
O5
O6
O7
TRUTH TABLE
OUTPUT ENABLE
LATCH ENABLE
DATA
OUTPUT
NOTE: H = High Voltage Level, L = Low Voltage Level, X = Dont Care, Z = High Impedance State, l = Low voltage level one set-up time prior
to the high to low latch enable transition, h = High voltage level one set-up time prior to the high to low latch enable transition.
Thermal Information
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, VCC
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. JA is measured with the component mounted on an evaluation PC board in free air.
DC Electrical Specifications
TEST
CONDITIONS
PARAMETER
SYMBOL
VI (V)
VIH
25oC
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
1.5
1.5
1.5
4.5
3.15
3.15
3.15
4.2
4.2
4.2
HC TYPES
High Level Input
Voltage
VIL
VOH
VIH or
VIL
VOL
VIH or
VIL
0.5
0.5
0.5
4.5
1.35
1.35
1.35
1.8
1.8
1.8
-0.02
1.9
1.9
1.9
-0.02
4.5
4.4
4.4
4.4
-0.02
5.9
5.9
5.9
-6
4.5
3.98
3.84
3.7
-7.8
5.48
5.34
5.2
0.02
0.1
0.1
0.1
0.02
4.5
0.1
0.1
0.1
0.02
0.1
0.1
0.1
4.5
0.26
0.33
0.4
7.8
0.26
0.33
0.4
II
VCC or
GND
0.1
ICC
VCC or
GND
80
160
(Continued)
TEST
CONDITIONS
25oC
SYMBOL
VI (V)
VIL or
VIH
VO =
VCC or
GND
VIH
VIL
VOH
PARAMETER
Three-State Leakage
Current
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
0.5
10
4.5 to
5.5
4.5 to
5.5
0.8
0.8
0.8
VIH or
VIL
-0.02
4.5
4.4
4.4
4.4
-6
4.5
3.98
3.84
3.7
-7.8
5.48
5.34
5.2
0.02
4.5
0.1
0.1
0.1
4.5
0.26
0.33
0.4
7.8
0.26
0.33
0.4
HCT TYPES
VOL
VIH or
VIL
VCC to
GND
5.5
0.1
ICC
VCC or
GND
5.5
80
160
Three-State Leakage
Current
VIL or
VIH
VO =
VCC or
GND
0.5
10
Additional Quiescent
Device Current Per
Input Pin: 1 Unit Load
(Note 4)
ICC
VCC
-2.1
4.5 to
5.5
100
360
450
490
Input Leakage
Current
Quiescent Device
Current
NOTE:
4. For dual-supply systems theoretical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
HCT373
HCT573
OE
1.5
1.25
Dn
0.4
0.3
LE
0.6
0.65
NOTE: Unit Load is ICC limit specified in DC Electrical Specifications table, e.g., 360A max at 25oC.
25oC
SYMBOL
TEST
CONDITIONS
VCC
(V)
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
tW
80
100
120
ns
4.5
16
20
24
ns
14
17
20
ns
50
65
75
ns
4.5
10
13
15
ns
11
13
ns
HC TYPES
LE Pulse Width
tSU
tH
tH
40
50
60
ns
4.5
10
12
ns
10
ns
ns
4.5
ns
ns
HCT TYPES
LE Pulse Width
tw
4.5
16
20
24
ns
tw
4.5
13
16
20
ns
tH
4.5
10
13
15
ns
Switching Specifications
PARAMETER
SYMBOL
TEST
CONDITIONS
tPLH, tPHL
CL = 50pF
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
150
190
225
ns
4.5
30
38
45
ns
26
33
38
ns
CL = 15pF
12
ns
CL = 50pF
175
220
265
ns
4.5
35
44
53
ns
30
37
45
ns
CL = 15pF
14
ns
CL = 50pF
175
220
265
ns
4.5
35
44
53
ns
30
37
45
ns
14
ns
HC TYPES
Propagation Delay,
Data to Qn
(HC/HCT373)
Propagation Delay,
Data to Qn
(HC/HCT573)
Propagation Delay,
LE to Qn
tPLH, tPHL
tPLH, tPHL
CL = 15pF
PARAMETER
Output Enabling Time
SYMBOL
TEST
CONDITIONS
tPZL, tPZH
CL = 50pF
tPLZ, tPHZ
tTLH, tTHL
25oC
-40oC TO 85oC
-55oC TO
125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
150
190
225
ns
4.5
30
38
45
ns
26
33
38
ns
CL = 15pF
12
ns
CL = 50pF
150
190
225
ns
4.5
30
38
45
ns
26
33
38
ns
CL = 15pF
12
ns
CL = 50pF
60
75
90
ns
4.5
12
15
18
ns
10
13
15
ns
Input Capacitance
CI
10
10
10
pF
Three-State Output
Capacitance
CO
20
20
20
pF
Power Dissipation
Capacitance
(Notes 5, 6)
CPD
51
pF
CL = 50pF
4.5
32
40
48
ns
CL = 15pF
13
ns
CL = 50pF
4.5
35
44
53
ns
CL = 15pF
17
ns
CL = 50pF
4.5
35
44
53
ns
CL = 15pF
14
ns
CL = 50pF
4.5
35
44
53
ns
CL = 15pF
14
ns
CL = 50pF
4.5
35
44
53
ns
CL = 15pF
14
ns
CL = 50pF
4.5
12
15
18
ns
HCT TYPES
Propagation Delay,
Data to Qn
(HC/HCT373)
tPLH, tPHL
Propagation Delay,
Data to Qn
(HC/HCT573)
tPLH, tPHL
Propagation Delay,
LE to Qn
tPLH, tPHL
tPZL, tPZH
tPLZ, tPZH
tTLH, tTHL
Input Capacitance
CI
10
10
10
pF
Three-State Output
Capacitance
CO
20
20
20
pF
Power Dissipation
Capacitance
(Notes 5, 6)
CPD
53
pF
NOTES:
5. CPD is used to determine the no-load dynamic power consumption, per latch.
6. PD (total power per latch) = VCC2 fi (CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
tfCL
trCL
50%
10%
10%
tf = 6ns
tr = 6ns
tTLH
90%
INVERTING
OUTPUT
tPHL
tPLH
trCL
tfCL
VCC
tfCL
GND
1.3V
0.3V
GND
tH(H)
tH(L)
VCC
DATA
INPUT
3V
2.7V
CLOCK
INPUT
50%
tH(H)
tTLH
1.3V
10%
tPLH
10%
GND
tTHL
90%
50%
10%
90%
3V
2.7V
1.3V
0.3V
GND
tTHL
trCL
tWH
INPUT
INVERTING
OUTPUT
GND
VCC
90%
50%
10%
1.3V
1.3V
tWL
tf = 6ns
tPHL
1.3V
0.3V
tWH
INPUT
2.7V
0.3V
GND
tr = 6ns
DATA
INPUT
50%
tH(L)
3V
1.3V
1.3V
1.3V
GND
tSU(H)
tSU(H)
tSU(L)
tTLH
90%
OUTPUT
tTHL
90%
50%
10%
tTLH
90%
1.3V
OUTPUT
tREM
3V
SET, RESET
OR PRESET
GND
tTHL
1.3V
10%
tPHL
1.3V
GND
IC
CL
50pF
GND
90%
tPLH
50%
IC
tSU(L)
tPHL
tPLH
I
fCL
3V
tREM
VCC
SET, RESET
OR PRESET
tfCL = 6ns
CLOCK
50%
50%
tWL
CLOCK
INPUT
tWL + tWH =
trCL = 6ns
VCC
90%
CLOCK
I
fCL
CL
50pF
(Continued)
6ns
OUTPUT
DISABLE
90%
50%
10%
OUTPUTS
ENABLED
2.7
1.3
OUTPUT HIGH
TO OFF
50%
OUTPUTS
DISABLED
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
IC WITH
THREESTATE
OUTPUT
GND
1.3V
tPZH
90%
OUTPUTS
ENABLED
OUTPUTS
ENABLED
0.3
10%
tPHZ
tPZH
90%
3V
tPZL
tPLZ
OUTPUT LOW
TO OFF
50%
OUTPUT HIGH
TO OFF
6ns
GND
10%
tPHZ
tf
OUTPUT
DISABLE
tPZL
tPLZ
OUTPUT LOW
TO OFF
6ns
tr
VCC
1.3V
OUTPUTS
DISABLED
OUTPUTS
ENABLED
OUTPUT
RL = 1k
CL
50pF
NOTE: Open drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test circuit is Output RL = 1k to
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
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accordance with TIs standard warranty. Testing and other quality control techniques are utilized to the extent
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