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IRLHS6242PbF

HEXFET Power MOSFET


VDS

20

VGS

12

V
V

RDS(on) max

11.7

(@VGS = 4.5V)

RDS(on) max

15.5

(@VGS = 2.5V)

ID
(@TC (Bottom) = 25C)

12

T OP VIEW

D 1

D 2

G 3

6 D

5 D

4 S

2mm x 2mm PQFN

Applications

Charge and discharge switch for battery application


System/Load Switch
Features and Benefits
Features
Low RDSon ( 11.7m)
Low Thermal Resistance to PCB ( 13C/W)
Low Profile ( 1.0mm)
Industry-Standard Pinout
Compatible with Existing Surface Mount Techniques
RoHS Compliant Containing no Lead, no Bromide and no Halogen
MSL1, Industrial Qualification

Orderable part number

Package Type

IRLHS6242TRPbF
IRLHS6242TR2PbF

PQFN 2mm x 2mm


PQFN 2mm x 2mm

results in

Resulting Benefits
Lower Conduction Losses
Enable better thermal dissipation
Increased Power Density
Multi-Vendor Compatibility
Easier Manufacturing
Environmentally Friendlier
Increased Reliability

Standard Pack
Form
Quantity
Tape and Reel
4000
Tape and Reel
400

EOL notice # 259

Max.

Units

Note

Absolute Maximum Ratings


Parameter
VDS

Drain-to-Source Voltage

20

VGS

12

ID @ TA = 25C

Gate-to-Source Voltage
Continuous Drain Current, VGS @ 4.5V

ID @ TA = 70C

Continuous Drain Current, VGS @ 4.5V

ID @ TC(Bottom) = 25C

Continuous Drain Current, VGS @ 4.5V


Continuous Drain Current, VGS @ 4.5V

8.3
22

ID @ TC(Bottom) = 70C

10

i
i

d
d
12d
18

IDM

Continuous Drain Current, VGS @ 4.5V (Package Limited)


Pulsed Drain Current

PD @TA = 25C

Power Dissipation

ID @ TC(Bottom) = 25C

PD @TC(Bottom) = 25C

g
Power Dissipation g

TJ

Linear Derating Factor


Operating Junction and

TSTG

Storage Temperature Range

88
1.98

9.6
0.016
-55 to + 150

W
W/C
C

Notes through are on page 2


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IRLHS6242PbF

Static @ TJ = 25C (unless otherwise specified)


Min.

Typ.

Drain-to-Source Breakdown Voltage

Parameter

20

Breakdown Voltage Temp. Coefficient


Static Drain-to-Source On-Resistance

6.8
9.4

11.7

Gate Threshold Voltage

0.5

12.4
0.8

15.5
1.1

Gate Threshold Voltage Coefficient


Drain-to-Source Leakage Current

-4.2

1.0
150

IGSS

Gate-to-Source Forward Leakage


Gate-to-Source Reverse Leakage

100
-100

gfs
Qg
Qgs

Forward Transconductance

36

14

VDS = 10V, ID = 8.5A


VDS = 10V

Gate-to-Drain Charge
Gate Resistance
Turn-On Delay Time
Rise Time

1.5
6.3

nC

Qgd

VGS = 4.5V
ID = 8.5A (See Fig.17 & 18)

2.1
5.8
15

Turn-Off Delay Time


Fall Time

19
13

Input Capacitance
Output Capacitance

1110
260

Reverse Transfer Capacitance

180

Min.

Typ.

BVDSS
VDSS/TJ
RDS(on)
VGS(th)
VGS(th)
IDSS

Total Gate Charge


Gate-to-Source Charge

RG
td(on)
tr
td(off)
tf
Ciss
Coss
Crss

h
h

Max. Units
V

Conditions
VGS = 0V, ID = 250A

mV/C Reference to 25C, ID = 1mA


VGS = 4.5V, ID = 8.5A
m
VGS = 2.5V, ID = 8.5A
V
VDS = VGS, ID = 10A
mV/C
VDS = 16V, VGS = 0V
A
VDS = 16V, VGS = 0V, TJ = 125C

ed
ed

nA

ns

pF

VGS = 12V
VGS = -12V

VDD = 10V, VGS = 4.5V


ID = 8.5A

d

RG=1.8
See Fig.15
VGS = 0V
VDS = 10V
= 1.0MHz

Diode Characteristics
Parameter
IS

Continuous Source Current

ISM

(Body Diode)
Pulsed Source Current

c

Reverse Recovery Time


Reverse Recovery Charge

Qrr
ton

Forward Turn-On Time

Conditions
MOSFET symbol

22
A

(Body Diode)
Diode Forward Voltage

VSD
trr

Max. Units

88

1.2

15
12

23
18

ns
nC

showing the
integral reverse

p-n junction diode.


TJ = 25C, IS = 8.5A , VGS = 0V

d
d
TJ = 25C, IF = 8.5A , V
di/dt = 210A/s e

DD

= 10V

Time is dominated by parasitic Inductance

Thermal Resistance
RJC (Bottom)
RJC (Top)
RJA
RJA (<10s)

g
g

Junction-to-Case
Junction-to-Case
Junction-to-Ambient
Junction-to-Ambient

Parameter

Typ.

f
f

Max.
13
94
63
46

Units
C/W

Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Package is limited to 12A by die-source to lead-frame bonding technology.
Pulse width 400s; duty cycle 2%.
When mounted on 1 ich square copper board.
R is measured at T J of approximately 90C.
For DESIGN AID ONLY, not subject to production testing.
Calculated continuous current based on maximum allowable junction temperature.

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IRLHS6242PbF
100

100

10
BOTTOM

0.1

1.4V

BOTTOM

10

60s PULSE WIDTH


1

10

0.1

100

10

100

Fig 2. Typical Output Characteristics

Fig 1. Typical Output Characteristics


100

1.6
RDS(on) , Drain-to-Source On Resistance
(Normalized)

ID, Drain-to-Source Current (A)

V DS, Drain-to-Source Voltage (V)

V DS, Drain-to-Source Voltage (V)

T J = 150C
TJ = 25C

10

VDS = 10V
60s PULSE WIDTH

1.0

ID = 8.5A

VGS = 4.5V

1.4

1.2

1.0

0.8

0.6

1.0

1.5

2.0

2.5

3.0

3.5

-60 -40 -20 0

Fig 4. Normalized On-Resistance vs. Temperature

Fig 3. Typical Transfer Characteristics


10000

20 40 60 80 100 120 140 160

T J , Junction Temperature (C)

VGS, Gate-to-Source Voltage (V)

14.0

VGS = 0V,
f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED
C rss = C gd

VGS, Gate-to-Source Voltage (V)

ID= 8.5A

C oss = C ds + C gd

C, Capacitance (pF)

Tj = 150C

0.01

Ciss
1000
Coss
Crss

12.0

VDS= 16V
VDS= 10V

10.0

VDS= 4.0V
8.0
6.0
4.0
2.0
0.0

100
1

10

100

VDS, Drain-to-Source Voltage (V)

Fig 5. Typical Capacitance vs.Drain-to-Source Voltage


3

60s PULSE WIDTH

1.4V

Tj = 25C
0.1

VGS
10V
4.5V
3.0V
2.5V
2.0V
1.8V
1.5V
1.4V

TOP

ID, Drain-to-Source Current (A)

ID, Drain-to-Source Current (A)

TOP

VGS
10V
4.5V
3.0V
2.5V
2.0V
1.8V
1.5V
1.4V

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10

15

20

25

30

35

QG, Total Gate Charge (nC)

Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage


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IRLHS6242PbF
1000

ID, Drain-to-Source Current (A)

ISD, Reverse Drain Current (A)

100

T J = 150C

T J = 25C

10

OPERATION IN THIS AREA


LIMITED BY R DS(on)
100
100sec
10msec
10
Limited by
Wire Bond
1
Tc = 25C
Tj = 150C
Single Pulse

VGS = 0V
1.0

DC

0.1
0.4

0.5

0.6

0.7

0.8

0.9

1.0

1.1

VSD, Source-to-Drain Voltage (V)

10

100

VDS, Drain-to-Source Voltage (V)

Fig 7. Typical Source-Drain Diode Forward Voltage

Fig 8. Maximum Safe Operating Area

25

VGS(th), Gate threshold Voltage (V)

1.6
Limited By Package

20
ID, Drain Current (A)

1msec

15

10

1.4
1.2
1.0
ID = 25A
ID = 250A
ID = 1.0mA
ID = 1.0A

0.8
0.6
0.4
0.2

25

50

75

100

125

150

-75 -50 -25

T C , Case Temperature (C)

25

50

75 100 125 150

T J , Temperature ( C )

Fig 9. Maximum Drain Current vs.


Case (Bottom) Temperature

Fig 10. Threshold Voltage vs. Temperature

Thermal Response ( Z thJC ) C/W

100

10

D = 0.50
0.20
0.10
0.05

0.02
0.01
0.1
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc

SINGLE PULSE
( THERMAL RESPONSE )
0.01
1E-006

1E-005

0.0001

0.001

0.01

0.1

t1 , Rectangular Pulse Duration (sec)

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case (Bottom)


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IRLHS6242PbF

RDS(on), Drain-to -Source On Resistance ( m)

RDS(on) , Drain-to -Source On Resistance (m)

25
ID = 8.5A
20

15
T J = 125C
10
TJ = 25C
5
0

10

12

14

30
25
20
Vgs = 2.5V
15
Vgs = 4.5V
10
5

16

10

20

30

40

50

60

70

ID, Drain Current (A)

VGS, Gate -to -Source Voltage (V)

Fig 13. Typical On-Resistance vs. Drain Current

Fig 12. On-Resistance vs. Gate Voltage

600

70
ID
TOP
2.2A
4.3A
BOTTOM 8.5A

60
50

500
Single Pulse Power (W)

EAS , Single Pulse Avalanche Energy (mJ)

35

40
30
20

400
300
200
100

10

0
1E-5

0
25

50

75

100

125

150

1E-4

Starting T J , Junction Temperature (C)

Driver Gate Drive

P.W.

dv/dt controlled by RG
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test

P.W.
Period

D.U.T. ISD Waveform


Reverse
Recovery
Current

V DD

D=

Period

RG

1E+0

VGS=10V

Circuit Layout Considerations


Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer

1E-1

Fig 15. Typical Power vs. Time

1E-2

Time (sec)

Fig 14. Maximum Avalanche Energy vs. Drain Current

D.U.T

1E-3

+
-

Body Diode Forward


Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt

Re-Applied
Voltage

Body Diode

VDD

Forward Drop

Inductor Curent
Ripple 5%

ISD

* VGS = 5V for Logic Level Devices


Fig 16. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET Power MOSFETs
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IRLHS6242PbF

Id

Vds
Vgs

L
VCC

DUT

1K

Vgs(th)

Qgs1 Qgs2

Qgd

Qgodr

Fig 17b. Gate Charge Waveform

Fig 17a. Gate Charge Test Circuit

V(BR)DSS
15V

DRIVER

VDS

D.U.T

RG

+
V
- DD

IAS

20V

tp

I AS

0.01

tp

Fig 18a. Unclamped Inductive Test Circuit

V DS
V GS
RG

RD

VDS

90%
D.U.T.
+

-V DD

V10V
GS
Pulse Width 1 s
Duty Factor 0.1

Fig 19a. Switching Time Test Circuit

Fig 18b. Unclamped Inductive Waveforms

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10%

VGS
td(on)

tr

td(off)

tf

Fig 19b. Switching Time Waveforms

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IRLHS6242PbF

PQFN 2x2 Outline Package Details

For footprint and stencil design recommendations, please refer to application note AN-1154 at
http://www.irf.com/technical-info/appnotes/an-1154.pdf

PQFN 2x2 Outline Part Marking

Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRLHS6242PbF

PQFN 2x2 Outline Tape and Reel

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December 17, 2013

IRLHS6242PbF

Qualification information

Industrial

Qualification level
Moisture Sensitivity Level

(per JE DEC JES D47F


PQFN 2mm x 2mm

RoHS compliant

guidelines )
MS L1

(per JE DEC J-S T D-020D )


Yes

Qualification standards can be found at International Rectifiers web site


http://www.irf.com/product-info/reliability
Applicable version of JEDEC standard at the time of product release.

Revision History
Date
Comments
Updated ordering information to reflect the End-Of-life (EOL) of the mini-reel option (EOL notice #259)
12/17/2013 Updated Qual level from "Consumer" to "Industrial" on page 1, 9
Updated data sheet with new IR corporate template

IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA


To contact International Rectifier, please visit http://www.irf.com/whoto-call/
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December 17, 2013

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