ANSI/IEEE Std 943-1986

An American National Standard

IEEE Guide for Aging Mechanisms and

Diagnostic Procedures in Evaluating
Electrical Insulation Systems

Sponsor

IEEE Standards Coordinating Committee 4,Thermal Rating

Approved June 13, 1985

IEEE Standards Board

Approved November 15, 1985

American National Standards Institute

Copyright 1986
The Institute of Electrical and Electronics Engineers, Inc
345 East 47th Street, New York, NY 10017, USA
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without
prior written permission of the publisher.

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Foreword
(This Foreword is not a part of ANSI/IEEE Std 943-1986, IEEE Guide for Aging Mechanisms and Diagnostic Procedures in
Evaluating Electrical Insulation Systems.)

This guide was developed to aid equipment committees standardize tests for use in evaluating electrical insulation
systems. In the development of this guide the IEC Publication 610 (1978), Principal Aspects of Functional Evaluation
of Electrical Insulation Systems: Aging Mechanisms and Diagnostic Procedures, was followed closely. When this
guide was approved the IEEE Standards Coordinating Committee 4, Thermal Rating had the following membership:
E. A. Boulter, Chair
P. E. Alexander, Vice Chair
H. E. Reymers, Secretary
D. E. Armstrong
E. L. Brancato
L. W. Buchanan
C. deTourreil
G. I. Duncan
R. J. Flaherty

M. Fort
H. N. Galpern
W. H. Gottung
T. B. Jenkins
C. Y. Lu

M. L. Manning
K. N. Mathes
H. Rosen
H. R. Sheppard
W. T. Starr
C. R. Willmore

When this guide was approved the members of the Electrical Insulation Systems Working Group were as follows:
Robert Flaherty, Chair
P. E. Alexander
D. E. Armstrong
A. C. Baker
J. C. Botts
E. A. Boulter
E. L. Brancato
L. W. Brotherton

L. W. Buchanan
G. I. Duncan
M. M. Epstein
E. M. Forte
H. N. Galpern
M. L. Manning

K. N. Mathes
W. B. Penn
H. I. Reymers
H. Rosen
H. R. Sheppard
W. T. Starr
C. R. Willmore

The following persons were designated by SCC4 as the balloting committee that approved this document for
submission to the IEEE Standards Board:
P. E. Alexander
B. F. Allen
D. E. Armstrong
A. C. Baker
J. C. Botts
E. A. Boulter
E. L. Brancato
L. W. Brotherton

L. W. Buchanan
V. Condello *
C. deTourreil
G. I. Duncan
M. M. Epstein
R. J. Flaherty
E. M. Forte
H. N. Galpern
J. Goetz

M. L. Manning
K. N. Mathes
W. B. Penn
N. Porter
H. I. Reymers
H. Rosen
H. R. Sheppard
W. T. Starr
C. R. Willmore *

* Nonvoting member

iii

When the IEEE Standards Board approved this standard on June 13, 1985, it had the following membership:
John E. May, Chair
John P. Riganati, Vice Chair
Sava I. Sherr, Secretary
James H. Beall
Fletcher J. Buckley
Rene Castenschiold
Edward Chelotti
Edward J. Cohen
Paul G. Cummings
Donald C. Fleckenstein

* Member emeritus

iv

Jay Forster
Daniel L. Goldberg
Kenneth D. Hendrix
Irvin N. Howell
Jack Kinn
Joseph L. Koepfinger *
Irving Kolodny
R. F. Lawrence

Lawrence V. McCall
Donald T. Michael *
Frank L. Rose
Clifford O. Swanson
J. Richard Weger
W. B. Wilkens
Charles J. Wylie

CLAUSE
1.

PAGE

Purpose and Scope ..............................................................................................................................................1

1.1 Purpose....................................................................................................................................................... 1
1.2 Scope .......................................................................................................................................................... 1

2.

References ...........................................................................................................................................................1

3.

Aging Mechanisms and Their Verification.........................................................................................................2

3.1
3.2
3.3
3.4

4.

General ....................................................................................................................................................... 2
Assessment of Insulation Condition After Test or Service........................................................................ 3
Correlation of Aging Stresses in Test and Service..................................................................................... 3
Review and Evaluation of Test Results ..................................................................................................... 5

Diagnostic Techniques ........................................................................................................................................5

An American National Standard

IEEE Guide for Aging Mechanisms and

Diagnostic Procedures in Evaluating
Electrical Insulation Systems

1. Purpose and Scope

1.1 Purpose
The purpose of this guide is to present background information necessary for proper construction of aging mechanisms
and selection of diagnostic procedures when designing tests for functional evaluation of insulation systems for
electrical equipment.
This guide is primarily intended to aid committees to standardize tests within their scope of responsibilities.

1.2 Scope
This guide briefly describes aging mechanisms of insulation systems and methods for ascertaining correlation of aging
during testing and aging during actual service. Diagnostic techniques for use in functional tests are also listed.
When the performance of an insulation system is evaluated by accelerated functional tests, misleading results may be
obtained if the aging mechanisms under the conditions of the test differ from those experienced in actual service
applications. The risk of such errors increases as the aging stresses are intensified in relation to their normal levels in
service.
The equivalence of the aging mechanisms in the test and in service must be verified before an effective functional
evaluation test can be performed. The importance of such verification procedures increases with the degree of stress
intensification. Considerations regarding the methodology of verification are given in Section 3.
Diagnostic methods, which are especially sensitive in ascertaining changes in the test specimen's condition, may have
the advantage that tests at relatively less intensified stresses can be included to determine the changes of the system's
characteristics or aging rate. Diagnostic methods are reviewed in Section 4..
It must be recognized that functional test procedures may require the selection of an arbitrary end-point criterion that
does not correspond to equipment failure. This end-point, however, provides a relative measure of life expectancy.

2. References
This guide shall be used in conjunction with the following publications:

Copyright 1998 IEEE All Rights Reserved

ANSI/IEEE Std 943-1986

IEEE GUIDE FOR AGING MECHANISMS AND DIAGNOSTIC PROCEDURES IN

[1] ANSI/IEEE Std 100-1984, IEEE Standard Dictionary of Electrical and Electronics Terms.1
[2] IEEE Std 1-1986, IEEE Standard General Principles for Temperature Limits in the Rating of Electrical Equipment
and for the Evaluation of Electrical Insulation.2

3. Aging Mechanisms and Their Verification

3.1 General
3.1.1 Verification of Service-Related Aging Mechanisms
Possible approaches to verification of service-related aging mechanisms include
1)
2)
3)

Assessment of the insulation system condition after service

Correlation of aging stresses in test and in service
Review and evaluation of test results

3.1.2 Diagnostic Methods

Changes in the specimen and its degradation products are monitored by suitable diagnostic methods. These methods
are selected (see Table 1) based on the knowledge of or by making assumptions pertaining to the physical and chemical
processes resulting from the aging factors. Such changes in the specimen may affect
1)
2)
3)
4)
5)
6)

The structure of the insulation

Electrical properties
Mechanical properties
Chemical composition of the specimen
Liberation of constituents and degradation products
Visual appearance or optical properties

Suitable determinations should be made to verify that the aging stresses acting on the test specimen are sufficiently
representative of the service conditions. This rule applies to all kinds of aging factors used during evaluation tests
(thermal, electrical, environmental, and mechanical), whether they are used alone, in sequence, or in combination.
3.1.3 Information Regarding Aging Mechanisms
Useful information regarding aging mechanisms may be derived from the test results. Suitable approaches include
1)
2)
3)

Analyzing the stress-time relationships

Checking the distribution of the times to end point within a batch of specimens
Comparing the failure locations at various stress levels and observing whether failures occur under the action
of aging stresses or when a diagnostic factor is applied

1 ANSI/IEEE publications are available from the Sales Department American National Standards Institute, 1430 Broadway, New York, NY 10018.

They are also available from the IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854.
2 IEEE publications are available from IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854.

Copyright 1998 IEEE All Rights Reserved

EVALUATING ELECTRICAL INSULATION SYSTEMS

ANSI/IEEE Std 943-1986

3.2 Assessment of Insulation Condition After Test or Service

3.2.1 Physical Investigations
During aging the determination of some physical state or measurement of some property and the comparison of results
obtained at various stress levels and at various times may yield pertinent information on the aging process.
Such properties are primarily electric or mechanical, and concern the internal structure of the specimens. For example,
structural changes can be detected by a change in elasticity or hardness. Additionally, partial discharge intensity may
sometimes be of value to aid in the detection of changes in the structure of an insulation system.
When electrical aging is involved, particularly at increased frequency, it is advisable to determine dielectric loss as a
function of frequency at the test temperatures to avoid abnormally high dielectric heating during aging tests. In some
cases, dielectric heating could lead to thermal instability and make the aging process nonrepresentative of actual
service conditions. This kind of mechanism can occur even at the power frequency, usually at the higher levels of
temperature, when excessive dielectric heating is observed. Adjustment of the test frequencies or introducing
temperature control may therefore be required in order to minimize the affects of dielectric heating.
3.2.2 Chemical Investigations
Chemical analysis of specimens can reveal much information pertaining to the aging process. For example, the
polymerization of cellulose tracks the percentage of life remaining in paper insulation and analysis of degradation
products gives information on the aging process. The rate of increase of acidity or monitoring the consumption of
antioxidants may permit comparison of aging rates at different stress levels.
The rates of diffusion among adjacent components of an insulation system or changes in solubility among components
may also give information pertinent to the aging process. An insulating liquid or gas may be contaminated by the
release of compounds from other components of the insulation system or from its container.
In the analysis of the gaseous degradation products during aging, the most widely used method of investigation is gas
chromatography, possibly in combination with mass spectroscopy. Hydrogen, carbon oxides, and light hydrocarbons
are to be found among gaseous products of degradation that are formed from organic materials. The degradation
products are dependent upon the electrical and thermal stresses involved and will differ from one another significantly
as conditions vary.
Monitoring of a liquid insulation can yield information regarding the aging process of the system. Liquid
chromatography or infrared spectrophotometry can identify chemical changes in the liquid, the presence of
contaminating materials, or the change in amount of antioxidant present. Changes in acidity can indicate oxidation as
can color change.
Other techniques available to evaluate aging include
1)
2)
3)
4)
5)

Degree of crystallinity of a polymer

Differential thermal analysis (DTA)
Differential scanning calorimetry (DSC)
Optical microscopy
Scanning electron microscopy

3.3 Correlation of Aging Stresses in Test and Service

Most standard test methods for evaluation of insulation systems are primarily concerned with single aging factors.
Complications arise when simultaneous applications are made of more than one factor, even if only one of the factors
is intensified.

Copyright 1998 IEEE All Rights Reserved

ANSI/IEEE Std 943-1986

IEEE GUIDE FOR AGING MECHANISMS AND DIAGNOSTIC PROCEDURES IN

3.3.1 Thermal Aging

When temperature is the principal aging factor, the heating method should provide for an appropriate temperature
distribution within the specimen. When temperature gradients are an important aging factor, internal heating may have
to be provided instead of the typical method of aging in an oven.
Temperature gradients influence diffusion and they may be affected by dielectric heating. These effects should be
taken into consideration when designing the test. The test specimen may require cooling to minimize the effects of
dielectric heating.
The temperature distribution in the test specimen should be as designed. Specimens are commonly aged in an oven
where temperatures are intended to be uniform. Correlation of aging temperature with expected operating temperature
distributions may be an important consideration.
3.3.2 Electrical Aging
Various measurement methods are available to check the electrical state of a test specimen.
The recording of amplitude and time distributions of partial discharges may be a useful tool. Comparison of such
distributions at test and service levels of the electrical stress may provide a verification of the validity of the
intensification both in level and in frequency.
Evaluation of data, such as dielectric losses as a function of voltage, the maximum discharge per cycle, discharge
repetition rate and similar measurements may produce characteristics that permit an overall judgement of degradation
resulting from partial discharges.
Electrolytic degradation is affected by temperature and humidity. Such degradation has been observed even with
alternating current.
3.3.3 Environmental Aging
It should be noted that in many types of equipment gases or liquids are part of the insulation system.
Care should be taken to prevent products of degradation, including water, from accumulating on or around the test
specimens in quantities considerably in excess of those that may occur under service conditions.
When an insulation system is designed to be used in a particular environment (gas or liquid), test procedures should
take the environment into account. Changes of the environment often produce changes in the degradation mechanism,
and such changes should be avoided. For example, changing the gaseous environment may affect both the intensity and
the chemical degrading mechanism or partial discharges.
3.3.4 Mechanical Aging
In mechanical aging, when vibration is applied, it should be verified that the stress distribution is sufficiently
representative and that resonances do not occur unless explicitly desired.
If transient thermomechanical stresses are involved, the rate of change of the applied temperature should be considered
along with temperature distribution and its rate of change.
Intensification of thermal or mechanical test may cause relative motion between components. Care should be taken to
ensure that typical service conditions are represented.

Copyright 1998 IEEE All Rights Reserved

EVALUATING ELECTRICAL INSULATION SYSTEMS

ANSI/IEEE Std 943-1986

3.4 Review and Evaluation of Test Results

3.4.1 Stress-Time Relationships
If test results at different stress levels are evaluated to develop a life curve, and if the curve deviates from the form expected
on the basis of a theory or experience with the aging mechanism, then a change of aging mechanism is suggested.
A change of slope at higher stress levels is clearly indicative of a change in the aging mechanism. When the slope of
the curve changes substantially at higher stress levels, the results at these levels should be disregarded in the final
evaluation of the insulation system.
3.4.2 Statistical Distributions
It may occur that the distribution of the individual times-to-failure within a batch can be clearly interpreted as
belonging to two or more different distributions. In such cases, suspect specimens should be examined for possible
defects. If physical differences among the specimens are not revealed, the whole batch shall be considered together.
This may affect the decision concerning the appropriate type of statistical analysis to be employed.
The criterion to be used for deletion of test values is the identification of abnormalities in the specimens.
3.4.3 Location of Failures
Inspection of the specimens after the test may provide pertinent information. If the end of life consists of an observable
weakening or rupture of the test specimen, failure location may be indicative of a change in the aging mechanism.
Conclusions may sometimes be drawn concerning the dielectric strength of specimens if the location of the failures is
known with respect to the spatial distribution of the aging stresses. Failure may occur either under the actual aging
stress or during application of a diagnostic stress.
This inspection for defects applies primarily when a failure occurs under an electric or mechanical stress.
If at higher levels of voltage stress, during voltage endurance tests, most failures occur at the edge of an electrode and
the distribution of puncture locations at lower stresses is random, a change in aging mechanism may be indicated.

4. Diagnostic Techniques
All methods for the assessment of the state of specimens or for the detection of aging mechanisms should introduce
negligible aging in the test. Diagnostic procedures for monitoring properties of insulation systems during service or
aging tests may be nondestructive, possibly destructive, or destructive.
In nondestructive tests, the stress has no measurable effect on aging.
Possibly destructive tests are those with low influence on aging if used as short-time tests for periodic application. If
any stress of possibly destructive character is used for continued monitoring of aging, it has to be demonstrated that its
influence on aging is negligible compared with the aging by other factors.
Destructive diagnostic tests are to be used to determine end points or as a means of determining the trend of a
characteristic with respect to time of aging.
If destructive diagnostic tests are to be used and the test results are to be statistically evaluated, then a sufficient number
of specimens should be tested.
A list of some possible diagnostic procedures is provided in Table 1.

Copyright 1998 IEEE All Rights Reserved

ANSI/IEEE Std 943-1986

IEEE GUIDE FOR AGING MECHANISMS AND DIAGNOSTIC PROCEDURES IN

Table 1Diagnostic Techniques

1. Nondestructive Measurement of Properties
(a) Dielectric Properties of the System
(i) Insulation resistance
(ii) Dielectric polarization or depolarization current versus time
(iii) Dielectric constant
(iv) Dielectric losses
(v) Surface resistivity
(vi) Partial discharge, inception and extinction voltage, amplitude, number, quadratic rate
(vii) Dielectric properties as a function of temperature
(b) Physical-Mechanical Properties of the System
(i) Hardness
(ii) Elasticity
(iii) Weight loss
(iv) Stiffness
(v) Resonance frequency and damping
(c) Chemical Analysis
(i) Analysis of products of degradation (gas chromatography, mass spectrometry
(d) Visual Inspection
(i) Evaluation of color and color changes
(ii) Surface condition (smooth or rough)
(iii) Deposition of dust, oil, humidity, or other contaminants
(iv) Location of failure
(v) Dimension, size
2. Possibly Destructive Tests for Periodic Application
(a) Electrical
(i) Proof test with increased voltage (dc, ac, inpulse)
(ii) Proof test (overvoltage, independent of the type of service voltage):
DC
Low frequency (0.1 Hz)
AC (50/60 Hz and higher test frequencies)
Half wave test (50/60 Hz and higher test frequencies
Impulse test, steep front wave
High frequency test with damped oscillations
(iii) Tracking resistance

Copyright 1998 IEEE All Rights Reserved

EVALUATING ELECTRICAL INSULATION SYSTEMS

ANSI/IEEE Std 943-1986

(b) Physical-Mechanical
(i) Tension
(ii) Bending
(iii) Torsion
(iv) Elongation
(v) Vibration
(vi) Compression
(c) Chemical
(i) Ambient influence (humidity, dust)
3. Destructive Determination of Properties (Including Sample Taking)
(a) Electrical
(i) Overvoltage test increased or maintained until breakdown
(ii) Tracking resistance
(b) Physical-Mechanical
(i) Tension
(ii) Bending
(iii) Torsion
(iv) Elongation
(v) Pressure
(vi) Vibration
(vii) Compression
(viii) Weight loss
(ix) Bond strength
(x) Determination of internal stress
(c) Visual Inspection
(i) Dissection
(ii) Macroscopic inspection
(iii) Microscopic inspection

Copyright 1998 IEEE All Rights Reserved