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Design of RF Passives
Outline
Inductors
Basic structure
Modeling
Effect of ground shields
Transformers
Structures
Modeling
Effect of coupling capacitors
Varactors
PN junction
MOS Varactors
Capacitors
Reading:
RF Microelectronics by Razavi
The Design of CMOS RFIC by Thomas Lee
Bhaskar Banerjee, EERF 6330, Sp2013, UTD
On-chip Inductor
Design parameters
Line width
Line spacing
Diameter (outer or inner)
Number of turns
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Circular
Stacked
Octagonal
Symmetric
Parallel Spirals
Various inductor geometries shown above are result of improving the tradeoffs in inductor design, specifically those between:
The quality factor and the capacitance.
The inductance and the dimensions.
Note These various inductor geometries provide additional degrees of
freedom but also complicate the modeling task.
Bhaskar Banerjee, EERF 6330, Sp2013, UTD
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Inductance Equations
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interwinding capacitances
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If k-->infinity and Cu-->0 such that kCu is equal to total wire capacitance:
Capacitance = Ctot /3
Bhaskar Banerjee, EERF 6330, Sp2013, UTD
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Loss Mechanism
Loss mechanisms
Metal losses
Finite conductivity of the metal
Current crowding at the edge
due to skin effect
Proximity effects
due to the presence of a nearby metal layer
current crowding
Visual representation of the effect on current distribution in the crosssection of inductor layer
DC
Skin effect
Proximity effect
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Skin depth =
Extra
resistance =
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Loss Mechanism
Loss mechanisms
Substrate losses
The conducting nature of the Si substrate leads to various loss
mechanisms
Electric energy is coupled to the substrate through the
displacement current
The time-varying magnetic field generates current in the substrate
called substrate eddy current
Increase series resistance
Decrease series inductance
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Inductor Model
Si on-chip spiral inductor equivalent model
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On-chip Inductor
Si inductor design example
Process parameters
Inductor metal layer
aluminum (Al)
conductivity : 2.5107 (1/m)
thickness : 1 m
Inter-dielectric material
SiO2 (Silicon dioxide)
r : 4.43
thickness : 5.5 m
Si substrate
resistivity : 10 cm
Design parameters
Shape : rectangular
Outer diameter : 160 m
Line width : 10 m
Line spacing : 2 m
Number of turns : 1.5 / 2.5 / 3.5
Bhaskar Banerjee, EERF 6330, Sp2013, UTD
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On-chip Inductor
Si inductor design example
Performance
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at each point of the spiral rise and fall with time causing
displacement current flow between this capacitance and substrate.
This current causes loss and reduces the Q of the inductor.
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The
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Q = Rp /L1
Q = L1 /Rs
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Resulting behavior of Q
Overall Q of inductor
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Broadband model
Broadband skin effect model
At
As
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Definitions of Q
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Symmetric Inductor
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L1 + L2 2M
Lower
Leq=
L1 + L2 + 2M
Higher
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Differential
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The
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(b)
(a)
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Stacked Inductors
Ltot = L1 + L2 + 2M
M = L1 = L2
Ltot = 4L
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MEMS Inductors
MEMS inductor
Micro-Electro-Mechanical System (MEMS)
Kind of post-process
Two categories
Si surface micromaching
Building additional structures on Si substrate
Si bulk micromaching
Etching Si substrate
Advantages
High Q-factor
High conductive metal: Cu
Thick metal: >50 m
Disadvantages
Cost / Reliability
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MEMS Inductors
MEMS inductor
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MEMS Inductors
MEMS inductor
MEMS inductor with different heights
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Transformers
Impedance matching
Feedback and feedforward with positive and negative
polarity
Single ended to differential conversion and vice-verse.
AC coupling between stages
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Transformer Structures
Segments
inductors.
Primary and secondary are identical so this is 1:1
transformer.
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Input Impedance =
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Stacked Transformers
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For
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Transformer Modeling
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T-Line as Inductor
T-Line serving as
load inductor
T-Line
having short circuit termination act as an inductor (if Tline is much smaller than the wavelength of signal).
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In
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Stripline
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Varactors
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PN Junction Varactor
Cjo
Vo
= Built-in potential.
m = exponent around 0.3 in
integrated structure
Varactor capacitance of reversed-biased PN junction.
Note - Weak dependance of Cj upon Vd, because
(Vd,max = 1V ) Cj,max/Cj,min ~ 1.23 (Low range) .
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Q of varactor is obtained by
measurement on fabricated
structure
Difficult to calculate it
Current distribution in varactor
As
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MOS Varactor ?
Regular MOS device:
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MOS
varactor is obtained by
placing an NMOS inside an
nwell .
The variation of capacitance
with Vgs is monotonic.
The C/V characteristics scale
well with scaling in
technology.
Unlike PN junction varactor
this structure can operate
with positive and negative
bias so as to provide
maximum tuning range.
C/V characteristics of varactor
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Vg
< Vs
Depletion region is formed
under gate oxide.
Equivalent capacitance is
the series combination of
gate capacitance and
depletion capacitance.
Vg > Vs
Formation of channel under
gate oxide.
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Here, Vo and a allow fitting for the slope and the intercept.
The
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Simulation
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Q of varactor:
Determined
terminals.
Approximately calculated by lumped model shown in above.
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Distributed Model
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It follows that
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Constant Capacitors
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Parallel
plate capacitor.
This structure employs planes in different metal layers.
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Fringe Capacitor
Fringe
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On-chip Resistor
Source / Drain resistor
Two types
Ion implanted
Diffusion
Large parasitic capacitance
Limited usable frequency range
metal
SiO2
p+
FOX
FOX
n-well
p- substrate
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On-chip Resistor
Source / Drain resistor
Ion implanted
500 ~ 2000 /square
Absolute accuracy = 15%
Temperature coefficient = 400ppm/OC
Voltage coefficient = -800 ppm/V
Diffusion
10 ~ 100 /square
Absolute accuracy = 35%
Temperature coefficient = 1500 ppm/OC
Voltage coefficient = -200 ppm/V
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On-chip Resistor
Polysilicon resistor
polysilicon resistor
FOX
p- substrate
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On-chip Resistor
N-WELL resistor
FOX
FOX
FOX
n-well
p- substrate
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