Professional Documents
Culture Documents
General Description
Applications
DC/DC converter
Low side notebook
SO-8
Parameter
VDSS
Drain-Source Voltage
VGSS
Gate-Source Voltage
ID
Drain Current
PD
Continuous
Units
30
20
(Note 1a)
14.5
(Note 1a)
2.5
(Note 1b)
1.2
(Note 1c)
Pulsed
TJ, TSTG
Ratings
50
55 to +150
Thermal Characteristics
RJA
RJC
(Note 1a)
50
C/W
(Note 1)
25
C/W
Device
Reel Size
Tape width
Quantity
FDS6676AS
FDS6676AS
13
12mm
2500 units
FDS6676AS
FDS6676AS_NL (Note 3)
13
12mm
2500 units
www.fairchildsemi.com
April 2005
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BVDSS
VGS = 0 V, ID = 1 mA
BVDSS
TJ
30
IDSS
VDS = 24 V, VGS = 0 V
500
IGSS
GateBody Leakage
VGS = 20 V, VDS = 0 V
100
nA
mV/C
28
On Characteristics (Note 2)
VGS(th)
VDS = VGS, ID = 1 mA
VGS(th)
TJ
3.3
1.5
RDS(on)
Static DrainSource
OnResistance
VGS = 10 V, ID = 14.5 A
VGS = 4.5 V, ID = 13.2 A
VGS = 10 V, ID = 14.5A, TJ = 125C
4.9
5.9
6.7
ID(on)
VGS = 10 V, VDS = 5 V
gFS
Forward Transconductance
VDS = 10 V, ID = 14.5 A
66
VDS = 15 V, VGS = 0 V,
f = 1.0 MHz
2510
pF
mV/C
6.0
7.25
8.5
50
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
RG
Gate Resistance
710
pF
270
pF
1.6
VDD = 15 V, ID = 1 A,
VGS = 10 V, RGEN = 6
10
20
ns
12
22
ns
tr
td(off)
43
69
ns
tf
29
46
ns
td(on)
tr
td(off)
tf
VDD = 15 V, ID = 1 A,
VGS = 4.5 V, RGEN = 6
17
31
ns
22
35
ns
34
54
ns
29
46
ns
Qg(TOT)
45
63
nC
Qg
25
35
nC
Qgs
GateSource Charge
nC
Qgd
GateDrain Charge
nC
VDD = 15 V, ID = 14.5 A,
2
FDS6676AS Rev. A (X)
www.fairchildsemi.com
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
0.4
0.5
0.7
trr
IRM
Qrr
VGS = 0 V, IS = 3.5 A
VGS = 0 V, IS = 7 A
(Note 2)
IF = 14.5A,
diF/dt = 300 A/s
(Note 3)
(Note 2)
27
nS
1.9
26
nC
Notes:
1. RJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
RJC is guaranteed by design while RCA is determined by the user's board design.
a) 50/W when mounted
on a 1 in2 pad of 2 oz
copper
Pulse Test: Pulse Width < 300s, Duty Cycle < 2.0%
3.
FDS6676AS_NL is a lead free product. The FDS6676AS_NL marking will appear on the reel label.
3
FDS6676AS Rev. A (X)
www.fairchildsemi.com
2.4
50
VGS = 10V
RDS(ON) , NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
3.5V
40
6.0V
4.5V
3.0V
30
20
10
2.5V
2.2
VGS = 3.0V
2
1.8
1.6
3.5V
1.4
4.0V
4.5V
1.2
6.0V
10V
1
0.8
0
0
0.25
0.5
0.75
VDS , DRAIN-SOURCE VOLTAGE (V)
40
50
0.016
ID = 7.3 A
I D = 14.5A
VGS =10V
1.2
0.8
0.014
0.012
0.01
TA = 125 C
0.008
0.006
TA = 25C
0.6
-55
0.004
-35
-15
25
45
65
T J, JUNCTION TEMPERATURE (
85
o
105
125
4
6
8
VGS, GATE TO SOURCE VOLTAGE (V)
C)
10
50
VGS = 0V
V DS = 5V
40
20
30
ID, DRAIN CURRENT (A)
1.4
RDS(ON) , NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
10
30
TA = 125 C
-55C
20
25C
10
10
TA = 125C
25C
0.1
-55C
0.01
0.001
1
1.5
2.5
3.5
0.2
0.4
0.6
0.8
4
FDS6676AS Rev. A (X)
www.fairchildsemi.com
Typical Characteristics
3500
10
f = 1MHz
VGS = 0 V
3000
8
VDS = 10V
CAPACITANCE (pF)
I D = 14.5A
20V
6
15V
4
2500
Ciss
2000
1500
Coss
1000
500
Crss
0
0
0
10
20
30
40
50
25
30
100
100s
RDS(ON) LIMIT
10
15
20
VDS , DRAIN TO SOURCE VOLTAGE (V)
1ms
10
10ms
100ms
1s
10s
DC
VGS = 10V
SINGLE PULSE
R JA = 125 C/W
0.1
T A = 25C
0.01
0.01
0.1
10
30
20
10
0
0.001
100
SINGLE PULSE
R JA = 125C/W
TA = 25C
40
0.01
0.1
10
100
1000
t1 , TIME (sec)
1
D = 0.5
R JC(t) = r(t) * R JC
R JC = 125 C/W
0.2
0.1
0.1
0.05
P(pk)
0.02
0.01
t1
t2
T J - T C = P * R JC (t)
Duty Cycle, D = t 1 / t2
0.01
SINGLE PULSE
0.001
0.0001
0.001
0.01
0.1
10
100
1000
5
FDS6676AS Rev. A (X)
www.fairchildsemi.com
Typical Characteristics
Schottky barrier diodes exhibit significant leakage at high temperature and high reverse voltage. This will increase the power
in the device.
Fairchilds SyncFET process embeds a Schottky diode in parallel with PowerTrench MOSFET. This diode exhibits similar characteristics to a discrete external Schottky diode in parallel with a
MOSFET. Figure 12 shows the reverse recovery characteristic
of the FDS6676AS.
0.8A/DIV
0.1
TA = 125 C
0.01
TA = 100 C
0.001
0.0001
TA = 25 C
0.00001
0
10
15
20
25
30
0.8A/DIV
For comparison purposes, Figure 13 shows the reverse recovery characteristics of the body diode of an equivalent size MOSFET produced without SyncFET (FDS6676).
10nS/DIV
6
FDS6676AS Rev. A (X)
www.fairchildsemi.com
VDS
BVDSS
tP
VGS
RGE
VDS
DUT
IAS
VDD
VGS
VDD
0V
IAS
tp
vary tP to obtain
required peak IAS
0.01
tAV
Drain Current
Same type as
50k
10V
10 F
1 F
VDD
QG(TOT)
VGS
10V
DUT
QGD
QGS
VGS
Ig(REF)
Charge, (nC)
VDS
RL
VDS
tr
90%
tOFF
td(OFF)
tf
90%
VGS
RGEN
td(ON)
VDD
DUT
10%
0V
10%
90%
VGS
VGS
50%
Pulse Width 1s
Duty Cycle 0.1%
0V
7
FDS6676AS Rev. A (X)
10%
50%
Pulse Width
www.fairchildsemi.com
Typical Characteristics
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx
FAST
ActiveArray
FASTr
Bottomless FPS
CoolFET
FRFET
CROSSVOLT GlobalOptoisolator
DOME
GTO
EcoSPARK HiSeC
E2CMOS
I2C
EnSigna
i-Lo
FACT
ImpliedDisconnect
FACT Quiet Series
IntelliMAX
ISOPLANAR
LittleFET
MICROCOUPLER
MicroFET
MicroPak
MICROWIRE
MSX
MSXPro
OCX
OCXPro
POP
Power247
PowerEdge
PowerSaver
PowerTrench
QFET
QS
QT Optoelectronics
Quiet Series
RapidConfigure
RapidConnect
SerDes
SILENT SWITCHER
SMART START
SPM
Stealth
SuperFET
SuperSOT-3
SuperSOT-6
SuperSOT-8
SyncFET
TinyLogic
TINYOPTO
TruTranslation
UHC
UltraFET
UniFET
VCX
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
8
FDS6676AS Rev. A (X)
www.fairchildsemi.com
TRADEMARKS