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VLSI Testing
Testing
Fault
Fault Simulation
Simulation
Virendra Singh
Indian Institute of Science
Bangalore
virendra@computer.org
E0 286: Test & Verification of SoC Design
Lecture - 5
Jan 28, 2008
E0-286@SERC
Problem
Problem and
and Motivation
Motivation
Fault simulation Problem: Given
A circuit
A sequence of test vectors
A fault model
Determine
Fault coverage - fraction (or percentage) of
modeled faults detected by test vectors
Set of undetected faults
Motivation
Determine test quality and in turn product quality
Find undetected fault targets to improve tests
E0-286@SERC
Parallel
Parallel Fault
Fault Simulation
Simulation
Compiled-code method; best with twostates (0,1)
Exploits inherent bit-parallelism of logic
operations on computer words
Storage: one word per line for two-state
simulation
Multi-pass simulation: Each pass simulates
w-1 new faults, where w is the machine
word length
Speed up over serial method ~ w-1
Not suitable for circuits with timing-critical
and non-Boolean logic
Jan 28, 2008
E0-286@SERC
Parallel
Parallel Fault
Fault Simulation
Simulation
Bit 0: fault-free circuit
Bit 1: circuit with c s-a-0
Bit 2: circuit with f s-a-1
1
a
b
1
1
s-a-0
0
c s-a-0 detected
0
s-a-1
E0-286@SERC
Deductive
Deductive Fault
Fault Simulation
Simulation
One-pass simulation
Each line k contains a list Lk of faults
detectable on k
Following true-value simulation of each
vector, fault lists of all gate output lines
are updated using set-theoretic rules,
signal values, and gate input fault lists
PO fault lists provide detection data
Limitations:
E0-286@SERC
Deductive
Deductive Fault
Fault Simulation
Simulation
Notation: Lk is fault list for line k
kn is s-a-n fault on line k
1
{b0}
{a0}
{b0 , c0}
{b0 , d0}
Le = La U Lc U {e0}
= {a0 , b0 , c0 , e0}
e
f
{b0 , d0 , f1}
E0-286@SERC
Lg = (Le Lf ) U {g0}
= {a0 , c0 , e0 , g0}
U
Faults detected by
the input vector
6
Concurrent
Concurrent Fault
Fault Simulation
Simulation
E0-286@SERC
Conc.
Conc. Fault
Fault Simulation
Simulation
a0
a
b
1
1
c
d
1 0
c0
b0
e0
1
0
a0
b0
0 1
Jan 28, 2008
d0
0 1
f1
1 1
E0-286@SERC
1
0
b
0 0
g0
1
1
f1
c0
0
1
1
e0
0
d0
8
Fault
Fault Sampling
Sampling
E0-286@SERC
Motivation
Motivation for
for Sampling
Sampling
Number of gates
Number of faults
Number of vectors
Number of gates
Number of vectors
E0-286@SERC
10
Random
Random Sampling
Sampling Model
Model
Detected
fault
All faults with
a fixed but
unknown
coverage
Random
picking
Undetected
fault
E0-286@SERC
Ns = sample size
Ns << Np
c = sample coverage
(a random variable)
11
Probability
Probability Density
Density of
of
Sample
Sample Coverage,
Coverage, c
c
(x--C )2
-- ------------
p (x )
C (1 - C)
2
Variance, = -----------Ns
Sampling
error
Mean = C
C -3
1/2
2 2
C +3 1.0
Sample coverage
Jan 28, 2008
E0-286@SERC
12
Fault
Fault simulator
simulator in
in a
a VLSI
VLSI
Design
Design Process
Process
Verified design
netlist
Verification
input stimuli
Fault simulator
Test vectors
Remove
Modeled
fault list tested faults
Fault
coverage
?
Low
Test
Delete
compactor vectors
Test
generator
Add vectors
Adequate
Stop
E0-286@SERC
13
Thank You
Jan 28, 2008
E0-286@SERC
14