DCCT

Beam Diagnostics
Ulrich Raich
CERN AB - BDI
(Beam Diagnostics and Instrumentation)
U. Raich CERN Accelerator School 2005
Introduction
An accelerator can never be better than the instruments measuring its
performance!
Course Overview
Generalities
Intensity measurements
Faraday Cup
AC current transformer
DC current transformer
Profile measurements
TV screens
SEMgrids
Wire scanners
Emittance
Phase space scans
Pepperpot
Position measurements
Different uses of beam diagnostics

Regular crude checks of accelerator performance
Beam Intensity
Radiation levels
Standard regular measurements
Emittance measurement
Trajectories
Tune
Sophisticated measurements e.g. during machine
development sessions
May require offline evaluation
May be less comfortable
Diagnostic devices and quantity

measured
Instrument
Physical Effect
Measured Quantity
Effect on beam
Faraday Cup
Charge collection
Intensity
Destructive
Current
Transformer
Magnetic field
Intensity
Non destructive
Wall current
monitor
Image Current
Intensity
Longitudinal beam shape
Non destructive
Pick-up
Electric/magnetic
field
Position
Non destructive
Secondary
emission monitor
Secondary electron
emission
Transverse size/shape,
emittance
Disturbing, can be
destructive at low
energies
Wire Scanner
Secondary particle
creation
Transverse size/shape
Slightly disturbing
Scintillator screen
Atomic excitation
with light emission
(position)
Destructive
Residual Gas
monitor
Ionization
Non destructive
Intensity measurements
Faraday Cups
Cable from ring to equipment room
Computer
network
Sensor + amplifier/shaper
Required Competence in a beam

diagnostics group
Some beam physics in order to understand the beam
parameters to be measured and to distinguish beam effects
from sensor effects
Detector physics to understand the interaction of the beam
with the sensor
Mechanics
Analogue signal treatment
Low noise amplifiers
High frequency analogue electronics
Digital signal processing
Digital electronics for data readout
Front-end and Application Software
Layout of a Faraday Cup
Electrode: 1 mm stainless steel

Only low energy particles can be
measured
Very low intensities (down to 1
pA) can be measured
Creation of secondary electrons of
low energy (below 20 eV)
Repelling electrode with some
100 V polarisation voltage pushes
secondary electrons back onto the
electrode
Schema: V. Prieto
Faraday Cup
Electro-static Field in Faraday Cup
-92V
In order to keep secondary

electrons with the cup a repelling
voltage is applied to the polarization
electrode
Collect eur
-62V
-17V
-40V
-31.5V
-24.5V
-9V
-2.3V
-47V
Since the electrons have energies of

less than 20 eV some 100V
repelling voltage is sufficient
-100V
Elect r ode de polar isat ion
10
Energy of secondary emission electrons
With increasing repelling voltage

the electrons do not escape the
Faraday Cup any more and the
current measured stays stable.
At 40V and above no decrease in
the Cup current is observed any
more
90keV
50keV
30keV
Itotal vs. eV
1.6
1.4
1.2
1
I(A)
0.8
0.6
0.4
0.2
0
0.1
10
V
11
100
1000
Faraday Cup application

Testing the decelerating RFQ
Antiproton decelerator
Accelerate protons to 24 GeV and eject them onto a target
Produce antiprotons at 2 GeV
Collect the antiprotons and cool them
Decelerate them and cool them
Output energy: 100 MeV
In order to get even lower energies:
Pass them through a moderator
High losses
Large energy distribution
=> Build a decelerating RFQ
12
Waiting for Godot
RFQ
Proton beam
Testing the
decelerating RFQ
Spectrometer
magnet
FC
13
FC
Setup for charge state measurement

Average Current from
Fararday cup 2 (mA)
75
80
85
90
95
100
14
Scan of Bending magnet Current with extraction voltage 20.5kV 11/04/03 -JCh
70
beam
0.15
65
Ion
source
0.1
60
Bending Magnet Current (A)
Faraday
Cup
0.05
-0.05
Spectrometer
Magnet
The spectrometer
magnet is swept
and the current
passing the slit is
measured
Measuring charge state distribution

Faraday Cup
Slit
Spectrometer
magnets
15
Charge state distribution measured with

a Faraday Cup on a heavy ion source
Scan of Bending magnet Current with extraction voltage 20.5kV 11/04/03 -JCh
Average Current from

Fararday cup 2 (mA)
0.15
0.1
0.05
0
60
65
70
75
80
85
-0.05
Bending Magnet Current (A)

Histogram contributed by R. Scrivens
16
90
95
100
Faraday Cup with water cooling
For higher intensities

water cooling may be needed
17
Current Transformers
Magnetic field
Fields are very low
ri
Capture magnetic field

lines with cores of high
relative permeability
ro
(CoFe based amorphous

alloy Vitrovac: r= 105)
Beam current
I beam
qeN qeN c
=
=
t
l
0 r 2 r0
L=
lN ln
2
ri
18
The
ideal
The
ACtransformer
transformer
The
active
AC
transformer
RF
R
dI
beam
U (U
t ) = ILbeam (t ) e
dt N
droop
Ls
RLL
A
CSS
Inductance L of the winding
rise= LsCs
Transformer output signal

Beam signal
LL
L
droop ==
droop R f
RL
R ++ R
RLL
A
19
Principle of a fast current transformer

Diagram by H. Jakob
20
The transformer installed in the machine
Needs
Magnetic Shielding
21
Magnetic shielding
Shield should extend along the vacuum chamber
length > diameter of opening
Shield should be symmetrical to the beam axis
Air gaps must be avoided especially along the beam axis
Shield should have highest possible but should not saturate
monitor
Permalloy (3)
Soft iron (1) Transformer steel (2)
22
Calibration of AC current transformers

The transformer is
calibrated with a very
precise current source
The calibration signal is
injected into a separate
calibration winding
A calibration procedure
executed before the
running period
A calibration pulse before
the beam pulse
measured with the beam
signal
23
Current transformer and its electronics

Photo: GSI Darmstatt
24
Display of transformer readings

Transformers in
a transfer line
Calculated losses
trigger a watchdog
Display distributed
via video signal
25
The DC current transformer

AC current transformer can be extended to very long droop
times but not to DC
Measuring DC currents is needed in storage rings
Must provide a modulation frequency
Takes advantage of non/linear magnetisation curve
B
26
Principle of DCCT
Va+Vb
Va
Synchronous
detector
Vb
modulator
Power supply
beam
V=RIbeam
Compensation
current Ifeedback=-Ibeam
27
Modulation of a DCCT without beam

B=f(t)
B
dB
U = NA
dt
H
Udt
B=
+B
NA
Modulation current
has only odd
harmonic
frequencies since
the signal is
symmetric
1
2 3
5
28
Modulation of a DCCT with beam

B=f(t)
B
Sum signal becomes non-zero

Even harmonics appear
2 3
5
29
Modulation current difference signal with

beam
Difference signal has 2m

m typically 200 Hz 10 kHz
Use low pass filter with
c<< m
Provide a 3rd core, normal
AC transformer to extend to
higher frequencies
30
Photo of DCCT internals
31
Interaction of particles with matter

Coulomb interaction
Average force in s-direction=0
Average force in transverse
direction <> 0
Mostly large impact parameter
=> low energy of ejected
electron
Electron mostly ejection
transversely to the particle
motion
Beam particle
s
b
F
Atomic shell electron
32
Bethe Bloch formula

2
2 2
2
Z
m
c
2
Z
dE
p
e
= 4N A re2 me c 2 T 2 [ln
2]
dx
AT
I
with the following constants:

NA: Avogadros number
me and re: electron rest mass and classical electron radius
c: speed of light
the following target material properties:
: material density
AT and ZT: the atomic mass and nuclear charge
and the particle properties:
Zp: particle charge
: the particle velocity and = 1 2
2
Dependance on Z p
33
High energy loss a low energies

dE MeV
[
]
2
dx g / cm
50
20
10
gas
solid
Ekin[GeV]
1
0.01
0.1
10
100
1000
Heavy ions at low energy are stopped within a few micro-meters

All energy is deposited in a very small volume
34
Scintillating Screens
Method already applied in cosmic ray
experiments
Very simple
Very convincing
Needed:
Scintillating Material
TV camera
In/out mechanism
Problems:
Radiation resistance of TV camera
Heating of screen (absorption of
beam energy)
Evacuation of electric charges
Transparencies on screens by T. Lefevre
35
Frame grabber
35000
30000
20000
15000
10000
5000
0
-10
-5
10
15
20
25
30
20000
35
Y (mm)
15000
For further evaluation

the video signal is
digitized, read-out and
treated by program
Intensity (u.a.)
Intensity (u.a.)
25000
10000
5000
0
-10
10
20
30
X (mm)
36
40
50
60
70
Test for resistance against heat-shock
cp at 20C
k at 100C
J/gK
W/mK
Material
g/cm3
Tmax
C
R at 400
C
.cm
Al2O3
3.9
0.9
30
1600
1012
ZrO2
0.4
1200
103
BN
1.6
35
2400
1014
Better for electrical conductivity (>400C)

Better for thermal properties
(higher conductivity, higher heat capacity)
50 00 0
30 00 0
S tart
90 C (30m in)
450 C (2h30m in)
585 C (3h15m in)
720 C (4h)
10000
Light intensity (u.a.)
Light intensity (u.a.)
40 00 0
20 00 0
10 00 0
1000
100
Test start
+2min
+3min
+1h30
+3h
10
1
-10
10
20
30
Y (m m )
0.1
-10
10
20
Y (mm)
37
30
40
Degradation of screen
Degradation clearly visible

However sensitivity stays essentially
the same
38
Screen mechanism
Screen with graticule
39
In/out mechanisms
Rotary mechanism driven by
electric motor
Mechanism driven pneumatically
40
Profile measurements
Secondary emission grids (SEMgrids)
When the beam passes
secondary electrons are
ejected from the ribbons
The current flowing back
onto the ribbons is
Measured
Electrons are taken away
by polarisation voltage
One amplifier/ADC chain
channel per ribbon
41
SEMgrids with wires

Photos received from C. Dutriat
42
Profiles from SEMgrids

Projection of charge density
projected to x or y axis is
Measured
One amplifier/ADC per wire
Large dynamic range
Resolution is given by wire
distance
Used only in transfer lines
43
Wire Scanners
A thin wire is quickly moved across the beam
Secondary particle shower is detected outside the vacuum chamber
on a scintillator/photo-multiplier assembly
Position and photo-multiplier signal are recorded simultaneously
44
Problems at low energy

Secondary particle shower intensity in dependence of primary
beam energy
25000
800
700
Pion threshold
SEM mode
20000
arbitrary units
600
Signal
500
400
300
15000
10000
200
Scintillator mode
5000
100
0
-40
-30
-20
-10
0
Position (mm)
10
20
30
0
0
45
200
400
600
Kinetic energy (MeV)
800
Wire scanner profile

High speed needed
because of heating.
Adiabatic damping
Current increase due to
Speed increase
Speeds of up to 20m/s
=> 200g acceleration
46
Problems at low energy

Secondary particle shower intensity in dependence of primary
beam energy
25000
800
700
Pion threshold
SEM mode
20000
arbitrary units
600
Signal
500
400
300
15000
10000
200
Scintillator mode
5000
100
0
-40
-30
-20
-10
0
Position (mm)
10
20
30
0
0
47
200
400
600
Kinetic energy (MeV)
800
Partially stripped ions loose electrons

when interacting with the wire
The beam is lost
Can measure amplitude distribution
however
Beam current [arb.units]
Wire scanners and partially stripped ions
Beam centered
reached at t0
Beam edge
reached
-2
-1
0
time [ms]
48
Emittance measurements
A beam is made of many many particles,
each one of these particles is moving with
a given velocity. Most of the velocity
vector of a single particle is parallel to the
direction of the beam as a whole (s).
There is however a smaller component of
the particles velocity which is
perpendicular to it (x or y).
r
v particle = vs u s + v x u x + v y u y
Design by E. Bravin
49
Emittance measurements
If for each beam particle we
plot its position and its
transverse angle we get a
particle distribution whos
boundary is an usually ellipse.
The projection onto the x axis
is the beam size
50
x
Beam size
x
The slit method

If we place a slit into the beam we cut
out a small vertical slice of phase
space
Converting the angles into position
through a drift space allows to
reconstruct the angular distribution at
the position defined by the slit
slit
51
Transforming angular distribution to

profile
Influence of a drift space
When moving through a

drift space the angles
dont change (horizontal
move in phase space)
When moving through a
quadrupole the position
does not change but the
angle does (vertical
move in phase space)
x
x
slit
slit
Influence of a quadrupole
x
slit
52
The Slit Method

3d plot from P. Forck
53
The Slit Method
54
Moving slit emittance measurement

Position resolution given by slit size and displacement
Angle resolution depends on resolution of profile measurement
device and drift distance
High position resolution many slit positions slow
Shot to shot differences result in measurement errors
55
Single pulse emittance measurement

Every 100 ns
a new profile
Kickers
slit
SEMgrid
56
Result of single pulse emittance

measurement
57
Single Shot Emittance Measurement

Advantage:
Full scan takes 20 s
Shot by shot comparison possible
Disadvantage:
Very costly
Needs dedicated measurement line
Needs a fast sampling ADC + memory for each wire
Cheaper alternative:
Multi-slit measurement
58
Multi-slit measurement
Needs high resolution profile detector
Must make sure
that profiles
dont overlap
beam
Scintillator + TV + frame grabber

often used as profile detector
Very old idea, was used with photographic plates
59
Pepperpot
Uses small holes instead of slits
Measures horizontal and vertical emittance in a single shot

Photo P. Forck
60
Adiabatic damping
Change of emittance with acceleration
norm = physical
Transverse
displacement
acceleration
: speed
: Lorentz factor
before
after
Longitudinal
displacement
61
1
1 2
Position measurements
w
U
d
d
If the beam is much smaller than w, all field lines are captured and
U is a linear function with displacement
else: Linear cut (projection to measurement plane must be linear)
62
Shoebox pick-up
UR
UL
UL - UR
=
x
UL + UR
Linear cut through a shoebox
63
Doubly cut shoebox

Can measure horizontal and vertical position at once
Has 4 electrodes
64
Simulatenous horizontal and vertical

measurement
vertical
horizontal
a
c
a
c
(U a + U c ) (U b + U d )
X=
U
Y=
65
(U a + U b ) (U c + U d )
U
Photo of a cylindrical pick-up

The cuts can be made by photo
chemical means of mechanically
Here done with a sand-blasting
device
A cylindrical pick-up with its connections

Photo by L. Sby
66
Building a cylindrical paper pick-up

A linear cut in a cylinder:
67
Unfolding the cylinder

When unfolded the cut becomes a sine curve
68
Flipping the sine curve

What happens if we flip use abs (sin(x)) instead?
Mirror the negative sine part?
69
The cylinder is cut twice!

Horizontal
and
vertical cut
70
Flipping half the sin curve upside down
71
Cut in the same direction
72
Using all the electrode surface
73
Calibration of the pick-up
74
Wall Current Monitor (WCM)

principle
The BEAM current is accompanied by its IMAGE
A voltage proportional to the beam current develops on the RESISTORS in the beam pipe gap
The gap must be closed by a box to avoid floating sections of the beam pipe
The box is filled with the FERRITE to force the image current to go over the resistors
The ferrite works up to a given frequency and lower frequency components flow over the box wall
Slide by M. Gasior
75
WCM as a Beam Position Monitor
R
f L =
2 L
R
f L =
2 L
For a centered BEAM the IMAGE current is evenly distributed on the circumference
The image current distribution on the circumference changes with the beam position
Intensity signal () = resistor voltages summed
Position dependent signal () = voltages from opposite resistors subtracted
The signal is also proportional to the intensity, so the position is calculated according to /
Low cut-offs depend on the gap resistance and box wall (for ) and the pipe wall (for ) inductances
Slide by M. Gasior
76
Measurement with pick-ups

Trajectory measurements in transfer lines
Control beam steering
77
Trajectory measurements in circular

machines
Needs integration gate

Can be rather tricky
Distance between bunches
changes with acceleration
Number of bunches
may change
Raw data from pick-ups

double batch injection
Histograms by J. Belleman
78
Changing bunch frequency

Bunch splitting or recombination
One RF frequency is gradually
decrease while the other one
is increased
Batch compression
For all these cases the gate
generator must be synchronized
79
Batch compression
80
Tune measurements
When the beam is displaced (e.g. at injection or with a
deliberate kick, it starts to oscillate around its nominal orbit
(betatron oscillations)
kicker
Measure the trajectory
Fit a sine curve to it
Follow it during one revolution
81
Tune measurements with a single PU

Design by P. Forck
82
Kicker + 1 pick-up
Measures only non-integral part of Q
Measure a beam position at each revolution
Fourier transform of pick-up signal

Histograms by J. Belleman
83
Further Reading
P. Forck, Joint Universities Accelerator School (JUAS)
Archamps, France
Course notes:http://www-bd.gsi.de/conf/juas/juas.html
Previous CERN Accelerator Courses
(H. Koziol, Beam Diagnostics Jyvskyl )
CAS on Beam Measurement 1998 Montreux (Switzerland)
Proceedings of Diagnostics and Instrumentation for Particle
Accelerators DIPAC (Europe) and Beam Instrumentation
Workshop BIW (USA)
84

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Beam Diagnostics

U. Raich CERN Accelerator School 2005

U. Raich CERN Accelerator School 2005

U. Raich CERN Accelerator School 2005

Different uses of beam diagnostics

Diagnostic devices and quantity

U. Raich CERN Accelerator School 2005

Cable from ring to equipment room

U. Raich CERN Accelerator School 2005

Required Competence in a beam

Layout of a Faraday Cup

Electrode: 1 mm stainless steel

U. Raich CERN Accelerator School 2005

U. Raich CERN Accelerator School 2005

Electro-static Field in Faraday Cup

In order to keep secondary

Since the electrons have energies of

U. Raich CERN Accelerator School 2005

Energy of secondary emission electrons

With increasing repelling voltage

U. Raich CERN Accelerator School 2005

Faraday Cup application

Waiting for Godot

U. Raich CERN Accelerator School 2005

Setup for charge state measurement

U. Raich CERN Accelerator School 2005

Bending Magnet Current (A)

Measuring charge state distribution

U. Raich CERN Accelerator School 2005

Charge state distribution measured with

Average Current from

U. Raich CERN Accelerator School 2005

Faraday Cup with water cooling

For higher intensities

U. Raich CERN Accelerator School 2005

Fields are very low

Capture magnetic field

(CoFe based amorphous

U. Raich CERN Accelerator School 2005

Inductance L of the winding

Transformer output signal

Principle of a fast current transformer

U. Raich CERN Accelerator School 2005

The transformer installed in the machine

U. Raich CERN Accelerator School 2005

Calibration of AC current transformers

Current transformer and its electronics

U. Raich CERN Accelerator School 2005

Display of transformer readings

U. Raich CERN Accelerator School 2005

The DC current transformer

U. Raich CERN Accelerator School 2005

U. Raich CERN Accelerator School 2005

Modulation of a DCCT without beam

U. Raich CERN Accelerator School 2005

Modulation of a DCCT with beam

Sum signal becomes non-zero

U. Raich CERN Accelerator School 2005

Modulation current difference signal with

Difference signal has 2m

U. Raich CERN Accelerator School 2005

Photo of DCCT internals

U. Raich CERN Accelerator School 2005

Interaction of particles with matter