Debugging EMI Using a Digital

Oscilloscope

1
Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
|1
06/2009
of DSOs
1

Debugging EMI Using a Digital Oscilloscope

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Lets get familiar with the RTO!

The problem: isolating sources of EMI after compliance test
failure
Near field probing basics
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H-Field
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E-Field
Measurement considerations for correlating time and frequency
domains
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Frequency analysis capabilities
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Important scope parameters for EMI Debug
Workshop
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Working with FFTs
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Finding a sources of EMI
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Isolating a source of EMI
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EMI from switch mode power supplies

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Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
|2
06/2009
of DSOs
2

Familiarization

Setting up a multiple channel measurement

Press PRESET:
Connect CH1 to RARE_SIG on the demo board,
Connect CH2 to 10_MHZ_CLK
Toggle Demo Board DOWN button until 8 is displayed.
Press AUTOSET
Adjust Vertical and Horizontal Position and Scale. (~40ns/div, 1V/Div on each channel).

03.03.2014

Quick Start Guide

Similar Display Using Smart Grid

Press AUTOSET
Minimize both channels (tapping on the channel icon)
Move CH1 onto smart grid
Drop CH2 below CH1 on Smartgrid
Change Horizontal scaling to 20ns/div.

03.03.2014

Quick Start Guide

Using Toolbar

From same setup

Note the toolbar
Zoom on CH2 to isolate the pulse.
Note the Mask Function,
Draw a mask inside the zoomed pulse.
Use the Trash Can to delete mask then zoom window.
Add back the zoom window with undo.

03.03.2014

Quick Start Guide

Display Menu

Note the dot

Change demo board to

Press Preset
Press Autoset.
Change horizontal scale to 20ns/div
Press the DISPLAY hard Key. Enable infinite persistence.
Raise the intensity of the display to 100%
Shortly a runt pulse should appear.
Note an open voltage level slightly above and below the runt. Jot this down.

03.03.2014

Quick Start Guide

Trigger Menu

Keep the same Demo board configuration.

Press PRESET and AUTOSCALE. Change horizontal scale to 20ns/div
Enter TRIGGER system
Select trigger type RUNT.
Set the upper and lower limits to the Open space around the runt we saw
Why does it not appear triggered?

03.03.2014

Quick Start Guide

Now lets talk about EMI

03.03.2014

Quick Start Guide

The Problem: isolating sources of EMI

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EMI compliance is tested in the RF far field

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What happens when compliance fails?

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Compliance is based on specific allowable power levels as a

function of frequency using a specific antenna, resolution bandwidth
and distance from the DUT
No localization of specific emitters within the DUT
Need to locate where the offending emitter is within the DUT
Local probing in the near field (close to the DUT) can help physically
locate the problem
Remediate using shielding or by reducing the EM radiation

How do we find the source?

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Frequency domain measurement

Time/frequency domain measurement
Localizing in space

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Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
| 10
06/2009
of DSOs
10

Basic EMI Debug Process

Understand your DUT
Clock rates, possible harmonics,
frequency of power supplies
Noise from power supply

CW Emission
Unknown broadband
noise peak

Measure DUT in far-field /

anechoic chamber
Understand signal behavior
of critical frequencies
Identify signal sources with
Near-field probes
March 2013

EMI Debugging with the RTO

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Top Common Causes of EMI Problems

(In no particular ranked order)
1

Ground Impedance

Stray Internal Coupling

Paths

Poor Cable Shielding

Component Parasitics

Emissions from Switching

Power Supplies

Inadequate Signal returns

Power Supply Filters

Discontinuous Return Paths

LCD Emissions

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ESD in Metallized Enclosures

Ten common EMI Problems by William D. Kimmel and Daryl D. Gerke

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Near Field Definition

E field
H field

Wave impedance

Distance from DUT

r

Near field Transition

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Far field

r = 1.6m for
f > 30 MHz

Sources with Low Voltage, but high current predominantly generate

magnetic fields (e.g. terminated high speed signals)
Sources with High Voltage, but low current predominantly generate
electrical fields (e.g. unterminated signals)
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Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
| 13
06/2009
of DSOs
13

Near-Field "Sniffer" Probes

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Magnetic and Electrical Near-Field Probes

Basically the probes are antennas that pickup the magnetic & electric field variation
The output Depends on the position & orientation of the probe

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H-Field Probe
H field

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Current flow

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Maximum response with probe parallel with current and

closest to the current carrying conductor
Traces with relatively high current, terminated wires and
cables
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Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
| 16
06/2009
of DSOs
16

E-Field Probe
Vo

E field

Current flow
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Maximum response with probe perpendicular with current

and closest to the current carrying conductor
Traces with relatively high voltage: unterminated Cables,
PCB traces to high impedance logic (tri-state outputs of
logic ICs)
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Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
| 17
06/2009
of DSOs
17

Debugging EMI Using a Digital Oscilloscope

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The problem: isolating sources of EMI after compliance test

failure
Near field probing basics
Measurement considerations for correlating time and frequency
domains
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Isolating sources of EMI

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Frequency analysis capabilities

Oscilloscope sensitivity and dynamic range
Probe position and frequency content
Correlating EMI with time domain events using an oscilloscope
Analyzing intermittent EMI

Measurement example: Isolating intermittent EMI

Measurement example: Locating Broadband Noise Source
Measurement example: isolating power supply switching EMI

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Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
| 18
06/2009
of DSOs
18

Fourier Transform Concept

Any real waveform can be
produced by adding sine waves

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Frequency Domain Analysis

FFT Basics
FFT

f FFT

ts

Integration time tint

NFFT samples input for FFT
l NFFT
l fFFT
l tint
l fs

Total bandwidth fs
NFFT filter output of FFT

Number of consecutive samples (acquired in

time domain), power of 2 (e.g. 1024)
Frequency resolution (RBW)
f FFT = 1 = f s
tint N FFT
integration time
sample rate
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Measurement Consideration:
FFT Implementation
l Conventional oscilloscopes
l Calculate FFT over entire acquisition

l Improved method: Digital Down

Conversion
l Calculate only FFT over span

of interest
l fC = center frequency of FFT

=> FFT much faster & more flexible

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Measurement Consideration: Time Gating

Signal characteristics change over the acquisition interval

Gating allows selection of specific time intervals for analysis
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Measurement Consideration: Time Gating

Tg

1
f =
Tg

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Measurement Consideration: Sensitivity

Ability to detect weak Signals
EMI tends to be weak and near field probes have low gain, the oscilloscope
needs to be able to detect small signals over its full bandwidth

1mV/div

Low Noise and High Sensitivity

at Full Bandwidth

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Signal to Noise and ENOB

Higher ENOB => lower quantization error and higher SNR =>
Better accuracy

l Thermal noise is proportion to BW.

l An FFT bin is captures a narrow BW proportional to 1/

NFFT
1

10
log
l Noise is reduced in each bin by a factor of
10
N
FFT
l The limit approaches sum of all non-random errors.
(Measurement induced errors are still present)

f FFT

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Signal to Noise

>80 dB

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Important Scope-Parameters for EMI Debugging

Parameter

Description

Record length

Ensure that you capture enough

Sample rate

>2x max frequency, start with 2.5 GS/s for

0 1 GHz frequency range

Coupling

50 for near-field probes (important for bandwidth)

Vertical sensitivity

1 5 mV/div is usually a good setting across full BW

Color table &

persistence

Easily detect and distinquish CW signals and burst

FFT Span / RBW

Easy to use familiar interface, Lively Update

Signal zoom & FFT

gating

Easily isolate spurious spectral components in time

domain

Nov
2010| |Fundamentals
Scope Seminar
Signal| Fidelity
| 27
06/2009
of DSOs
27

Lab 1: Working with FFTs

Objective: Learn how to make frequency domain measurements using an FFT on
an oscilloscope

Any real waveform can be

produced by adding sine waves

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Lab 1: Working with FFTs

SETUP
CH1= SMA-BNC cable
SMA-BNC= Demo board RF out
Demo board setting = 1
Press PRESET.
Ch1=50 Ohm
AUTOSCALE

With the FFT window up, try different Resolution BW

settings. What is the trade off?

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Locating EMI Faults: First Steps

There are many potential sources of EMI on a board. Before you can eliminate an
EMI issue you must first identify it.

General approach
Start with the largest loop probe smaller loop probe stub probe

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Locating EMI Faults: First Steps

There are many potential sources of EMI on a board. Before you can eliminate an
EMI issue you must first identify it.

General approach
Start with the largest loop probe smaller loop probe stub probe

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Observe the Spectrum While Scanning With a NearField Probe

I) General Approach
Wide Span scan fundamental of interfering signals are usually lower than 1GHz,
a span of <1GHz is sufficient as a start

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Observe the Spectrum While Scanning With a NearField Probe

I) General Approach
Wide Span scan fundamental of interfering signals are usually lower than 1GHz,
a span of <1GHz is sufficient as a start
Identify abnormal spurious or behavior and its location while moving the probe
around

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Observe the Spectrum While Scanning With a NearField Probe

I) General Approach
Wide Span scan fundamental of interfering signals are usually lower than 1GHz,
a span of <1GHz is sufficient as a start
Identify abnormal spike or behavior and its location while moving the probe around
Narrow down to smaller span and RBW, change to smaller probe for better analysis

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Observe the Spectrum While Scanning With a NearField Probe

I) General Approach
Wide Span scan fundamental of interfering signals are usually lower than 1GHz,
a span of <1GHz is sufficient as a start
Identify abnormal spike or behavior and its location while moving the probe around
Narrow down to smaller span and RBW, change to smaller probe for better analysis

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Identifying EMI Through Signal Analysis

Understand the DUT
Known frequency source (clock and etc.)
Possible harmonic frequencies
Frequency & power of switching power supply emissions
Identify miscellaneous periodic waves
*Take into consideration of technique used such as Spread Spectrum Clocking,
frequency hopping and etc.

Causes of EMI
EMI is often caused by the switching of signals, e.g. power supply, clocks,
memory interface, etc. This is referred to as narrowband interference and
generally occurs at very specific frequencies related to components on your
board.
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Identifying EMI by Frequency Content

Understanding the expected signals and their harmonics, analyze possible
interference sources in the frequency range of interest

Signal Harmonics

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Lab 2: Finding Sources of EMI

Objective: Use a Near Field Probe to locate narrow band signals and determine
the frequency

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Lab 2: Finding Sources of EMI

SETTING (same as scope exit configuration from last lab)

CH1= Change to Loop Near Field Probe (NFP)

Config (if needed)
Demo Board = #1 (seven segment display should read=1)
Press PRESET..
Ch1=50 Ohm
Vertical Scale=1mV/div
Perform FFT on this signal (settings, 825MHz CF, 50MHz Span,
100KHz RBW).
Adjust the Color table=false colors

Locate the 825MHz CW with the NFP by scanning

the probe above the surface of the PCB.
Note that we can see the same signal as before, but now we are not directly
connected to it. This emission seems to be coming from the digital
attenuation IC path.
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Lab 2: Finding Sources of EMI (Cont)

SETTING (Change to scan entire board)

CH1= Change to Loop Near Field Probe (NFP)

Config (same except FFT settings)
Demo Board = #1 (seven segment display should read=1)
Press PRESET..
Ch1=50 Ohm
Vertical Scale=1mV/div
Perform FFT on this signal (settings, 500MHz CF, 1GHz Span, 2MHz
RBW).
Adjust the Color table=false colors

Note the 825MHz CW with the NFP by scanning the probe above the surface of the
PCB. Also note the power supply and other harmonic emissions. Note that there
is something down around 10MHz we want to look at further (there is a small, but
larger spike down there. We can admit that we are focused on the process not that
this might be an actual problem.

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Lab 3: Isolating Sources of EMI

SETUP
Ch1=Large Loop NFP
Preset
CH1=50 Ohm
Vertical Scale=1mV/div
FFT=10MHz CF, 20MHz Span, 20KHz RBW

This lab utilizes larger to smaller probes to

demonstrate the isolation of an EMI issue through
progressive probing. It requires 4 steps and the
change of 4 NFPs.

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Lab 3: Isolating Sources of EMI

Objective: Learn how to use different size probes and both E-Field and H-Field
probes to localize a 10MHz emission
Step 1: move around the board and show that there is a stronger 10MHz
emission around the main IC in the middle of the board.

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Lab 3: Isolating Sources of EMI

Step 2: Switch to smaller loop probe and have the user take the probe around all
4 sides of the IC. Note that the smaller probe can isolate which side of the IC has
the most emission in the H field.

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Lab 3: Isolating Sources of EMI

Step 3: Switch to the smallest Magnetic probe (stub probe). This probe can be placed on
each pin of the IC to look for the one with the largest emission.
You should see a strong signature by the pins next to the decoupling cap.
This area which includes the local oscillator as well as the pins of the IC by the decoupling
path are the source of the emissions.

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Lab 3: Isolating Sources of EMI

Step 4: Connect the blade E field probe to the scope and probe the traces down near
the 10Mhz crystal.
You should see an emission is coming from the clock trace evident by the E field probes
ability to detect the signal when the probe is placed right on top of the clock trace
You can also probe the trace leading to the 10MHz Clock pin. There is a strong Electrical
field on this due to the trace length.

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Lab 4: Using a Gate to Correlating frequency/ time

Objective: Use a MASK to stop and help correlate an emission in the

frequency domain to a pulse train on the SPI bus in the time domain
Demo board=#4 (seven segment display =4)
Ch1= Small H 2.5-2 NFP
Ch2= Passive probe with retractable hook and attach probe to SPI DATA
through hole connection on edge of board
Preset.
Ch1=50 Ohm
Ch1=Vertical Scale 1mV/div
Ch2=500mV/div
Setup FFT to find the pulse causing an emission at around 35MHz
FFT= 100MHz CF, 200MHz Span, 2MHz RBW
Adjust the horizontal to have a few bursts of traffic. ~5-10us/div
See next slide for next steps

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Lab 4: Using a MASK to Correlating frequency/ time

Place NFP very near or at rest on the SPI through hole connector

Note: Wrong
Probe Shown here

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Lab 4: Using a Mask to Correlate frequency/ time

You should see something similar to the screen below without the NFP near
the emitter. Note that CH2 is minimized
With the NFP in place near the emitter a rise in harmonic distortion can be
seen spanning between 30 MHz to 160 MHz

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Lab 4: Using a Mask to Correlate frequency/ time

Move probe away so the transmission is not being captured
Set a MASK to stop on this emission and move the probe back into position

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Lab 4: Using a Mask to Correlate frequency/ time

Add back in the analog wave form of CH2 and show the correlation of the
bursts of SPI data to the noise captured by the NFP

You can
zoom if
needed
here

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Lab 4: Using a Mask to Correlate frequency/ time

Instructor ONLY:
Perform a math function on CH2 to show the derivative (dx/dt) of CH2. This derivative is
the energy of the edge. Some of this energy is what is picked up by the NFP as it
emits from the signal connection. The math and CH2 waveform should look similar.
(Note that you need to scale the math function WAY down to have it appear on screen).

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Lab 5: Analyzing power supply emissions

l Power Supplies are the most common source of EMI and

other radiated emissions.

l A common DC-DC supply can operate in Buck (Step Down)
Boost (step up) and Inverter modes.
l Choice of inductor and other elements to match your
anticipated load and current draw can impact EMI emissions
l Peak output current is an important consideration choice of
inductor and diode for switching converter design.
SMPS | 52

Buck DC-DC Supply

SMPS | 53

We will
Change
R values

Lab 5: Isolating Sources of EMI

SETUP
Ch1=Large Loop NFP
Preset
CH1=50 Ohm
Vertical Scale=10mV/div
FFT Settings (500MHZ CF, 1GHz Span, RBW:5MHz)
Display set to False Colors

Demo Board set to: 2.

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Buck Converter EMI emissions

EMI Profile No Output Load

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Buck Converter EMI emissions

Change
to

3.

EMI Profile Matched Load

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Buck Converter EMI emissions

Change
to

4.

EMI Profile Oversized Load

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Sources of the EMI Transmission

Press
RUN/CONT

To stop the
aquisition
Select FFT
and drag a
window
around a
noise burst
and a
quiet spot

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Inductor Voltage View Oversized Load

Remove FFTs
Press RON/CONT
Add a voltage probe
to CH2 to view the
Voltage at the
inductor

Cursors can help verify time alignment

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Inductor Voltage Matched Load

Change
to

2.

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Debugging EMI Using a Digital Oscilloscope

Summary
The modern oscilloscope with hardware DDC and overlapping FFT is capable of
far more than a traditional oscilloscope

EMI Debugging with an Oscilloscope enables correlation of interfering signals

with time domain while maintaining very fast and lively update rate.

The combination of synchronized time and frequency domain analysis with

advanced triggers allows engineers to gain insight on EMI problems to isolate
and converge the solution quickly.

Power Supply design choices have a large impact on EMI emissions, frequency
and time techniques can help unravel the mystery.

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