Instruction Manual P/N 305-32056A

EDX Series
Measuring Hazardous Elements

SHIMADZU CORPORATION
ANALYTICAL & MEASURING
INSTRUMENTS DIVISION

About this manual

About this manual

This manual describes how to make analytical condition for measuring hazardous elements (Cd, Pb, Hg,
Cr and Br) in EDX series.
The descriptions are based on the functionality offered by EDX software version 1.00, release 017.
Furthermore, the parameters described in this manual are based primarily on examples of settings for
elements in plastic.

Contents

Contents
About this manual
1. Sensitivity and Precision in X-Ray Fluorescence Spectrometry.....................................
1.1 Precision of X-Ray Spectrometry
......................................................
1.1.1 Standard Deviation
......................................................
1.1.2 Lower Detection Limit
......................................................
1.2 Differences in Sensitivity Due to Sample Material and Shape ...............................
1.2.1 Differences in Sensitivity Due to Sample Material ..........................................
1.2.2 Differences in Sensitivity Due to Sample Size or Thickness ...........................
1.2.3 Scattered X-ray and Fluorescent X-ray
......................................................
1.2.4 Correcting for Sample Shape and Material ......................................................
2. Analytical Conditions
......................................................
2.1 Example of Setting Parameters
......................................................
2.1.1 Example of Setting Parameters
......................................................
2.2 Key Points for Setting Parameters
......................................................
2.2.1 Overview
......................................................
2.2.2 Element Registration
......................................................
2.2.3 Element Information
......................................................
2.2.4 Measurement Conditions
......................................................
2.2.5 Process for Spectra
......................................................
2.2.6 Internal Standard Correction
......................................................
2.2.7 Result Format
......................................................
2.2.8 Standard Sample Registration
......................................................
2.2.9 Standard Sample Measurements
......................................................
2.2.10 Calibration Curve Preparation
......................................................
3. Controlling Precision
......................................................
3.1 Drift Check Analysis
......................................................
3.1.1 Analyzing Control Sample
......................................................
3.1.2 Results Outside the Control Range
......................................................
3.2 Drift Standardization
......................................................
3.2.1 What is Drift Standardization?
......................................................
3.2.2 Registration of Reference Intensities for Standardization Samples ..................
3.2.3 Drift Coefficient Renewal
......................................................
3.2.4 Drift Coefficient Criteria
......................................................
3.3 Measurement Time Reduction
......................................................
3.3.1 Measurement Time Reduction
......................................................
4. Interpreting Data and Making Determination
......................................................
4.1 The possibility of Determination Errors
......................................................
4.1.1 Determination Errors Due to Overlapping Spectra ..........................................
4.1.2 Determination Errors Due to Diffracted Lines ................................................
4.2 ExReport Function
......................................................
4.2.1 ExReport Function
......................................................
5. Hints for Configuring Conditions
......................................................

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1. Sensitivity and Precision of X-Ray Fluorescence Spectrometry

1. Sensitivity and Precision of X-Ray Fluorescence

Spectrometry

1.1 Precision of X-Ray Fluorescence Spectrometry

1.1.1 Standard Deviation
The precision level of x-ray fluorescence analysis is related to the standard deviation of the x-ray intensity
from target elements. In general, the standard deviation of the x-ray count for an x-ray measurement is
expressed as the square root of the x-ray counts, where
Standard Deviation of X-Ray Intensity (Count)
=

X-Ray Counts

In the case of x-rays per unit time (cps), the standard deviation is as follows.
Standard Deviation of X-Ray Intensity (cps)
=

X-Ray Counts

Measurement Time (sec)

<Measurement Time and Standard Deviation>

The x-ray count is proportional to the measurement time, having the following relationship.
When Time is Doubled -->

Std. dev. of x-ray intensity (count) is multiplied by

Std. dev. of x-ray intensity (cps) is multiplied by 1/ 2 (or 2/2)

When Time is Quadrupled --> Std. dev. of x-ray intensity (count) is multiplied by 2 (or 4)
Std. dev. of x-ray intensity (cps) is multiplied by 1/2 (or 4/4)
Therefore, when the measurement time is increased, the standard deviation of intensity (cps) decreases. In
other words, the longer the measurement time, the higher the reliability of measurement values.

1. Sensitivity and Precision of X-Ray Fluorescence Spectrometry

1.1.2 Lower Detection Limit

The minimum level of target elements that can be detected is determined by the following parameters.
a) Standard deviation B of intensity for a sample containing no target elements.
b) Calibration curve coefficient b
In general, the lower detection limit is defined as 3 x

x b.

1. Sensitivity and Precision of X-Ray Fluorescence Spectrometry

1.2 Differences in Sensitivity Due to Sample Material and Shape

1.2.1 Differences in Sensitivity Due to Sample Material
The minimum detectable quantity will vary depending on the sample material. The reasons for this
variation are as follows.
a) X-ray fluorescence emission from target elements is absorbed by surrounding materials.
b) Primary x-rays from the x-ray tube are absorbed by the surrounding material and do not excite the
target elements.
Generally high atomic number materials absorb more x-ray than low atomic number material. In addition,
absorption also increases if the material has a higher density. Therefore, in general, sensitivity is higher in
plastics and lower in metals, as shown in the example below.

Differences in Lower Detection Limits Due to Sample Material

(as a proportion of the detection limit for target elements in polyethylene)
Polyethylene

PVC

Aluminum

Copper

Tin

Lead

Cd

1.2

1.5

50

200

Pb

2.3

2.5

20

30

---------

Note that even though they are both plastics, the lower detection limit for polyethylene and polyvinyl
chloride (PVC) is quite different. This is due to x-ray fluorescence from target elements being absorbed
by the chlorine contained in polyvinyl chloride.

1. Sensitivity and Precision of X-Ray Fluorescence Spectrometry

1.2.2 Differences in Sensitivity Due to Sample Size or Thickness

Theoretically, the larger the sample is, the greater the x-ray intensity is. This also applies to thickness.
X-ray intensity is greater for thicker samples.
<Collimator Size>
The x-ray irradiation diameter can be changed using an optional collimator. Using a smaller diameter for
analysis generally decreases x-ray intensity levels. However, for samples comprised of differing sections,
this can reduce the undesirable x-rays emitted from non-target areas, improving the relative sensitivity for
the target area.
<Sample Thickness>
In general, thicker samples result in higher x-ray intensities, but x-ray intensity does not increase when it
reaches a certain constant thickness. That saturation thickness varies depending on the sample material.
For the EDX series, the following table shows the saturation thickness of X-ray intensity for different
sample materials.
Polyethylene

PVC

Aluminum

Copper

Tin

Lead

Cd

5mm

5mm

3mm

100 m

150 m

20 m

Pb

5mm

0.7mm

0.5mm

20 m

30 m

---------

1.2.3 Scattered X-ray and Fluorescent X-ray

When primary x-ray from x-ray tube irradiates to a sample, fluorescent x-ray and scattered x-ray are both
detected. Fluorescent x-ray is x-ray generated when primary x-ray excites target elements in a sample.
Scattered x-ray is detected as background intensity. This scattered x-ray includes valuable information
also, such as the sample size, thickness and composition.

1. Sensitivity and Precision of X-Ray Fluorescence Spectrometry

1.2.4 Correcting for Sample Shape and Material

<Background (BG) Internal Standard Correction>
Even for samples having the same concentration level, intensities vary depending on sample size and
thickness. This affects the calculated quantitative values. To avoid this bias, differences in quantitative
values due to sample size and thickness can be corrected by preparing calibration curves using the ratio
between fluorescent x-ray and scattered x-ray intensities.
<Automatic Switching of Calibration Curve Coefficients>
In the case of plastics, there is a significant difference in sensitivity between polyethylene and PVC.
Therefore, if calibration curves are prepared without factoring in intensity ratios, the calibration curve
coefficient values for lead, for example, will differ by 3 to 5 times. Using BG internal standard correction
compensates to some degree for the difference in calibration curve coefficients, but even so, the
difference can be 1.2 to 2 times, depending on the element.
For that reason, these spectrometers allow switching between calibration curves prepared using standard
samples containing chlorine and not containing chlorine.

2.Analytical Conditions

2. Analytical Conditions

2.1 Example of Setting Parameters

2.1.1 Example of Setting Parameters
As an example of how to set up parameters for analyzing hazardous elements, the EDX software includes
the following file.
Folder:
c:\edx\user\grpqn\rohs_ex
Group Name: [Quantitative] Plastic5Elem

2.2 Key Points for Setting Parameters

2.2.1 Overview
Refer to Section 4.2 in the main EDX unit instruction manual regarding calibration curve measurements
using standard samples. For plastic samples, commercially marketed 5-element standard samples for
EDX systems can be used as standard samples.
This section indicates some important points for preparing calibration curves using standard plastic
samples.

2. Analytical Conditions

[Example]
Register Cd,Pb,Hg,Cr,Br in Periodic Table.
Also register Cl,Sb.

Element
Registration

Quant. Calibration Curve For Cd,Pb,Hg,Cr,Br

Correct For Cl,Sb
Change Line to La. For Pb
Change Unit to ppm. For Cd,Pb,Hg,Cr,Br

Element
Information

Measurement
Condition
( For EDX-720 )

Voltage

Meas. Time (sec)

Filter (*1)

DT%(*2)

Cd

50kV

100

MoNi

40

Sb

50kV

100

MoNi

40

Pb

50kV

100

Ag

40

Hg

50kV

100

Ag

40

Br

50kV

100

Ag

40

Cl

50kV

100

Ag

40

Cr

30kV

100

Al

40

Smoothing

Process for

No. of Points

Repeat
Times

Repeat Times

Calculation
Points

Cd

11

100

20

Sb

11

100

20

Pb

11

100

Hg

11

100

Br

11

100

Cl

100

Cr

11

100

Spectra

Internal Standard
Correction

BG Calculation

With internal standard correction For Cd,Pb,Hg,Cr,Br,Cl

Without internal standard correction For Sb

Curve

Multiple calibration curve -- Set Co-Exist mode with Cl.

For Pb,Hg,Br,Cr

Result Format

Digit -- Set Place of Decimal to 1. For Cd,Pb,Hg,Br,Cr

Calibration

(*1) For EDX-700HS/800HS, use Mo filter instead of MoNi filter. Use Ni filter instead of
Ag filter. For EDX-900HS, use Zr filter instead of a MoNi filter. Use Ni filter instead of
Ag filter.
(*2) For EDX-700HS/800HS spectrometers, set DT% to 25. For EDX-900HS, set DT% to
10.
7

2. Analytical Conditions

2.2.2 Element Registration

Register Cd, Pb, Hg, Cr and Br via the periodic table. In addition, register Cl and Sb as elements for
correction.

2. Analytical Conditions

2.2.3 Element Information

For Cd, enter the following element information.

Proc. Calc.
Type of Quantification
Unit

Quant.
Calibration Curve
ppm

Enter settings for Pb, Hg, Cr and Br in the same way. However, in the case of Pb, also change the line to
La.

For Cl and Sb, enter the following element information.

Proc. Calc.
Correct

2. Analytical Conditions

2.2.4 Measurement Conditions

For Cd, enter the following measurement conditions.
Voltage :
Current :
Filter(*1) :
Integration Time :
DT%(*2) :
Intensity Calculation :
Analysis Range (keV) :

50 kV
Auto
MoNi
Live Time and 100 sec
40
Fitting
22.72 23.52

10

2. Analytical Conditions

Similarly, use the following table to enter settings for the other elements. Regarding other parameters, set
Current to Auto for all of the elements, and Intensity Calculation Method to Fitting. The initial
voltage setting for Cl is 15 kV. In this case, change it to 50 kV to allow simultaneous measurement with
Pb, Hg and Br.
Voltage

Meas.Time (sec)

Analysis Range(keV)

Filter(*1)

DT%(*2)

Cd

50kV

LiveTime 100

22.72-23.52

MoNi

40

Sb

50kV

LiveTime 100

25.88-26.68

MoNi

40

Pb

50kV

LiveTime 100

10.32-10.82

Ag

40

Hg

50kV

LiveTime 100

9.74-10.24

Ag

40

Br

50kV

LiveTime 100

11.66-12.16

Ag

40

Cl

50kV

LiveTime 100

2.42-2.82

Ag

40

Cr

30kV

LiveTime 100

5.12-5.62

Al

40

(*1) For EDX-700HS/800HS, use Mo filter instead of MoNi filter. Use Ni filter instead of
Ag filter. For EDX-900HS, use Zr filter instead of a MoNi filter. Use Ni filter instead of
Ag filter.
(*2) For EDX-700HS/800HS spectrometers, set DT% to 25. For EDX-900HS, set DT% to
10.

11

2. Analytical Conditions

2.2.5 Process For Spectra

For Cd, enter the following peak integration settings.
Smoothing

Number of Points :
Repeat Times :
Method:
Repeat Times :
Calculation Points :

BG Calculation

11
1
Savitzky-Golay
100
20

Similarly, use the following table to enter settings for the other elements.
Smoothing

BG Calculation

No. of Points

Repeat Times

Repeat Times

Calculation Points

Cd

11

100

20

Sb

11

100

20

Pb

11

100

Hg

11

100

Br

11

100

Cl

100

Cr

11

100

12

2. Analytical Conditions

2.2.6 Internal Standard Correction

For Cd, enter the following internal standard correction settings.
Correction :
Internal Std. Line :

On
CdKa_BG

Similarly, enter the internal standard settings for Pb, Hg, Br, Cr and Cl. However, do not enter internal
standard settings for Sb.

13

2. Analytical Conditions

2.2.7 Result Format

For Cd, enter the following format settings for the number of digits to display.
Place of Decimal

Similarly, enter the result format settings for Pb, Hg, Br and Cr.

14

2. Analytical Conditions

2.2.8 Standard Sample Registration

<Registering Standard Sample Names>
Register standard sample names via Standard Sample Name window.

Example: Using both standard PVC samples and standard PE samples.

Standard PVC Samples
PVC-1
PVC-2
PVC-3
PVC-4
PVC-5

Standard PE Samples
PE-1
PE-2
PE-3
PE-4
PE-5

PVC-6

PE-6

15

2. Analytical Conditions

<Registering Standard Values>

Next, enter standard values via Standard Value Input window.

After entering the values, close the window by clicking [OK]. Then click [Apply] in the Standard Sample
window to confirm the settings.

<Saving Parameters Settings>

Once all the necessary settings have been entered, save the current parameters via the File menu in the
Group Condition window, then close the Group Condition window.

16

2. Analytical Conditions

2.2.9 Standard Sample Measurements

Next, measure x-ray intensities of the standard samples.
From the Sample Schedule in the Analysis window, open the Sample Registration window and select the
group file just created. Select Standard from Purpose of Measurement field. Then the standard
samples registered appear automatically in the Sample Name fields.

Click [Apply] to register the standard samples in the Sample Schedule. Place the first standard sample in
the instrument. Then click [Start] button in the Analysis window to start measurement.
After the first sample has been measured, the sample chamber will open automatically. After exchanging
samples, click the [Start] button to resume measurement.

17

2. Analytical Conditions

2.2.10 Calibration Curve Preparation

Open the group condition after the standard sample measurements finished.
Open Calibration Curve window to calculate calibration curve coefficient. Click [Calculate] to calculate
coefficient and click [Apply] to save the result.

18

2. Analytical Conditions

<Automatic Switching Between Calibration Curves for Coexisting Chlorine>

If standard samples of both PVC and PE are measured, it is possible to switch automatically between
calibration curves calculated with and without chlorine. An example for Pb is shown below.

Set parameters as follows.

a) Click [Multiple Calibration Curve] to open Multiple Calibration Curve window.
b) Choose [Co-Exist] as Use for.
c) Select Cl from the list of choice displayed.
d) Set Number of Curves to 2.
e) Enter 2.0 in the Boundary field.
Once the settings have been entered, click [OK].
Now that settings are configured for multiple calibration curves, back in the Calibration Curve window, a
choice of 1 or 2 is available in the Curve No. field.

19

2. Analytical Conditions

Select calibration curve number 1 and click [Calculate]. This will calculate a calibration curve using
standard sample Cl intensities ratio that are below 2.0. In other words, this calculates the calibration
curve for the standard PE sample.

Next, select calibration curve number 2 and click [Calculate]. This will calculate a calibration curve using
standard sample Cl intensities (ratio) that are 2.0 or higher. In other words, this calculates the
calibration curve for the standard PVC sample.

Once both calibration curves are calculated, click [Apply] to save the results.
20

2. Analytical Conditions

Settings for Pb, Hg, Br and Cr are also configured for automatic switching between calibration curves.
For Cd, the difference between coefficients for PVC and PE is not large, so the process of configuring
automatic switching between calibration curves may be skipped.

21

3. Controlling Precision

3. Controlling Precision

3.1 Drift Check Analysis

3.1.1 Analyzing Control Sample
It is possible to determine whether an instrument is working normally or not by analyzing control samples
and confirming whether the quantitative values are within their respective control ranges.
Normally, of the standard samples used to prepare calibration curves, the sample with the highest
concentration is analyzed and the quantitative values are checked to determine whether they are within
the control range.
The control range is determined as approximately three times the standard deviation for repeated
measurements of a control sample or approximately three times the standard deviation indicated in the
quantitative results for a single measurement.
Make sure the energy calibration has been done before analyzing control samples.

3.1.2 Results Outside the Control Range

There is a possibility that x-ray intensity changes due to changes in the instrument over time or due to
other reasons.
If energy calibration is normal and values of control sample analysis are outside the control range, x-ray
intensity values can be corrected using drift standardization.

22

3. Controlling Precision

3.2 Drift Standardization

3.2.1 What is Drift Standardization?
The intensity of standardization samples are measured and registered in advance. Then, if the control
sample analysis results in values outside the control range, re-measure the intensity of the standardization
sample. Any change in intensity can be corrected by multiplying the ratio of reference intensity to the
current intensity of the standardization sample. This is referred to as drift standardization.

3.2.2 Registration of Reference Intensities for Standardization Samples

<Setting Up Standardized Samples>
Register standardization samples to the group condition used to create calibration curve.
Open Standardization Sample tab of Standardization window to register standardization samples.

23

3. Controlling Precision

<Turning Drift Standardization On/Off>

Next, open Drift Coefficient tab and turn drift standardization on by checking the checkbox to the left
of each element name. Also, set alpha-Control Range to 0.8 to 1.2. If low concentration standardization
samples will also be analyzed, set beta-Control Range to -1.0 to 1.0.

Once the settings have been entered, click [OK] to close Standardization window. Then save the group
condition via the File menu.

24

3. Controlling Precision

<Measuring Standardization Samples (Registering Reference Intensities)>

The intensity of standardization samples is registered via the Analysis window, in the same manner as for
standard sample measurements.
From Sample Schedule in the Analysis window, open Sample Registration window and select the
group condition that was just saved. Then select Drift Standardization and Intensity Registration from
Purpose of Measurement section. This will cause the standardization samples, registered when
parameters were entered, to appear automatically in the sample name fields.

Click [Apply] to register the standardization samples in the Sample Schedule. Place the first
standardization sample in the instrument. Then click [Start] button in the Analysis window to start
measurement.

25

3. Controlling Precision

The measured intensities are automatically registered in the original group condition. The intensities can
be confirmed via Standardization Sample tab in Standardization window.

26

3. Controlling Precision

3.2.3 Drift Coefficient Renewal

<Measuring Standardization Samples (Renewal of Drift Coefficient)>
If control samples are analyzed and results are not within control range, try to measure the standardization
samples and calculate drift coefficient.
Drift coefficient can be calculated via the Analysis window, in the same manner as for registering
intensities for standardized samples.
From Sample Schedule in the Analysis window, open Sample Registration window and select the
group condition that was just saved. Then select Drift Standardization and Coefficient Renewal from
Purpose of Measurement section.

Click [Apply] to register the standardization samples in the Sample Schedule. Place the first
standardization sample in the instrument. Then click [Start] button in the Analysis window to start
measurement.

27

3. Controlling Precision

The drift coefficient is calculated automatically after the measurement is finished and displayed on
Result Display window. These results are automatically saved into the original group condition only if
the drift coefficient is within the control range.

3.2.4 Drift Coefficient Criteria

If the alpha drift coefficient is not between 0.8 and 1.2, new calibration curves need to be prepared. Refer
to Sections 2.2.8 Standard Sample Registration through 2.2.10 Calibration Curve Preparation
regarding preparing calibration curves.

28

3. Controlling Precision

3.3 Measurement Time Reduction

3.3.1 Measurement Time Reduction
Generally you need longer measurement times for measuring trace elements, but if target elements are
present in larger quantities they can be detected with shorter measurement times.
If you set the allowable relative error of intensity in Measurement Condition, program can reduce
measurement time adequately. These settings are only applicable for quantitative analysis.

Given relative error (CV) = std. dev. of x-ray intensity / x-ray intensity x 100, there is an approximately
99% probability that the true value for the x-ray intensity is within the range (x-ray intensity x relative
error x 3.0).

29

4. Interpreting Data and Making Determination

4. Interpreting Data and Making Determination

4.1 The Possibility of Determination Errors

4.1.1 Determination Errors Due to Overlapping Spectra
Depending on the sample composition, peaks for other elements can appear near the target peaks, making
it difficult to interpret results.
Overlapping peaks that might appear for the five elements Cd, Pb, Hg, Cr and Br, are listed below. In the
case of overlapping peaks, the accuracy of quantitative values could suffer if measuring trace quantities.
Cd

When Pb is present in large quantities (PbSUM)

PbLa

When As is present (AsKa)

When Bi is present (BiLa)

Hg

When Ge is present (GeKa)

When Zn is present in large quantities (ZnKb)
When Br is present in large quantities (BrKaESC)
When W is present (W Lb2)

BrKa

When Hg is present (HgLb1)

Cr

When Cl is present in large quantities (ClSUM)

When Fe is present in large quantities (FeKbESC)
When Ba is present (BaLb2,BaLg1)
When V is present (V Kb)
When Ni is present in large quantities (NiKaESC)
When Co is present in large quantities (CoKaESC)

PbLb1 When Bi is present (BiLb1)

When Br is present (BrKb)
When Se is present (SeKb)
When Fe is present in large quantities (FeKaSUM)
BrKb

When Pb is present in large quantities (PbLb5)

When Au is present in large quantities (AuLg1)

30

4. Interpreting Data and Making Determination

4.1.2 Determination Errors Due to Diffracted Lines

In general, when a sample is irradiated with x-rays, in addition to fluorescent x-rays, scattered incident
x-rays are also observed. With some samples, the scattered x-ray intensity increases significantly at
specific energies by X-ray diffraction.
For EDX series spectrometers, these diffraction lines are observed at the following energies.

E: Energy of Diffracted X-ray (keV)

n: Order(1,2,3, )
d: Crystal Face Distance in Sample (A)

Note, this diffraction phenomenon only occurs when the angle between the crystal face and x-ray tube
and the angle between the crystal face and detector are the same. However, crystal faces are oriented in
multiple directions and samples are generally not single crystals, so it is not possible to accurately predict
which crystal faces will generate intense diffraction line emissions.
Diffraction lines observed with EDX series have the following properties.
a)

They mainly appear between 3 keV and 15 keV.

b)
c)

The line widths are often about the same or wider than x-ray fluorescence peaks.
The diffraction pattern may change if the sample orientation or tilt angle is changed.

d)
e)

They are rarely observed in plastic samples. Tiny diffraction lines appear in metal samples.
They become lower when you use x-ray filter.

Currently program cannot determine automatically whether detected peaks are fluorescent x-ray lines or
diffraction lines. Therefore, be aware that the program treats diffraction lines as though they were peaks
from fluorescent x-rays, so peaks could be misidentified as other elements.
In some cases, using a primary x-ray filter for measurements can reduce the diffraction lines more than
peaks from fluorescent x-rays. If in doubt regarding whether a peak is a diffraction line or not, measure
the sample using a filter and compare the results to not using the filter.
Currently, the following cases have been reported.
Fe-based samples Tiny peaks near 10 keV may appear to be Hg peaks.
Ag-based samples Tiny peaks near 5.4 keV may appear to be Cr peaks.
Sn-based samples Tiny peaks near 5.4 keV may appear to be Cr peaks.

31

4. Interpreting Data and Making Determination

4.2 ExReport Function

4.2.1 ExReport Function
The quantitative value determination results can be summarized in a one-page report. For more
information regarding report creation features (ExReport), refer to the separate instruction manual of
ExReport.

32

5. Hints for Configuring Conditions

5. Hints for Configuring Conditions

Temporarily switching off measurement of specific elements
[Method 1] Uncheck Do Analysis in Element Information window of Condition program.

[Method 2] Uncheck the checkbox to the left of Analyte in Change Measuring Time window of
Analysis program..

33

5. Hints for Configuring Conditions

Changing the name of standard samples

1. Select standard sample name to be changed in Standard Sample window of Condition
program.

2. Manually input a different name in Standard Sample field. And click any other location in the
window.

34

5. Hints for Configuring Conditions

Measurement for only specific standard samples

[Method 1] Delete the samples not to be measured in Sample Registration window.

[Method 2] Measure the sample as an Unknown sample and load the standard sample intensities by
clicking [Read Intensity from Data] in Standard Sample window. Then reenter standard
values as necessary.

35

5. Hints for Configuring Conditions

Deciding when to use BG internal standard correction and when not to use correction
Regular calibration curve methods are recommended for samples with low scattered x-ray intensities
(metal samples). Regular calibration curves are also recommended if samples are measured using a
smaller collimator.

Measuring metals using plastic standard samples

The calibration curve coefficients for metals and plastics differ significantly, so calculated
quantitative values would be unreliable.

Negative quantitative values

When measuring samples with concentrations near or below the lower detection limit, the variance of
x-ray intensity can result in negative quantitative values being displayed. This does not indicate a
problem with the instrument or software.

Whether to use La or Lb1 analytical lines for Pb analysis

In the case of plastic samples, the La line is preferred in order to prevent overlapping by Br.
(However, it is possible Pb could be incorrectly detected if the sample contains As.)
If using model EDX-720 to measure the Pb content in brass samples, the absorption by copper is less
for Lb1, so sensitivity will be higher with Lb1.

36