Professional Documents
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Contents
Integrity and Reliability
Package Integrity Tests
Device Reliability Tests
Appendix 1 Calculations
Appendix 2 Example of Failure Rate Calculation
Page 1 of 8
Reliability Handbook
MOISTURE SENSITIVITY LEVEL (MSL)
MSL relates to the packaging and handling precautions for semiconductors. The MSL indicates the
time period to which a moisture sensitive device can be exposed to ambient room conditions
(approximately 30C/60%RH).
During the solder reflow process; the sudden expansion of any trapped moisture inside the
component can result in internal separation (delamination) of the plastic encapsulation from the die
or lead-frame, wire bond damage, die damage, and internal cracks. Most of this damage is not
visible on the component surface. In extreme cases, cracks will extend to the component surface. In
the most severe cases, the component will bulge and pop, this is known as the "popcorn" effect.
Testing involves submitting the device to standard assembly conditions including repeated reflow
cycles, followed by testing to datasheet parameters. C-mode Scanning Acoustic Microscopy (CSAM) testing can be performed to validate internal integrity.
Zetex products comply with IPC/JEDEC J-STD-020C at MSL 1 unlimited storage.
AUTOCLAVE (CLV)
Autoclave, also known as Pressure Cooker Test (PCT) is an environmental test which measures
device resistance to moisture penetration and the resultant effects of galvanic corrosion. Conditions
employed during the test include 121C, 100% relative humidity and 2 atmospheres pressure. This
test is highly accelerated and is generally carried out for 96 hours.
Page 2 of 8
Reliability Handbook
SOLDERABILITY / SOLDERABILITY (UNLEADED)
This test verifies the packages ability to solder onto PCBs successfully using SnPb or lead-free
solder.
SOLDER WETTABILITY
This test, which is related to solderability, measures the time taken for the solder to wet the
devices legs/pins using a wetting balance. This must occur within 3 seconds.
ESD TESTING
These tests determine the device/packages ability to withstand damage or degradation by exposure
to electrostatic discharge. There are three types of testing:
CDM - Charged Device Model this simulates the discharge that occurs as a charged component
discharges to another object at a different electrostatic potential.
The results are classified as follows:
<125V, 125 to <250V, 250 to <500V, 500V to <1000V, 1000 to <1500,
1500 to <2000, 2000V
this simulates the discharge from a human being. The results are
in the ranges as follows:
<250V, 250 to <500V, 500V to <1000V, 1000 to <2000, 2000 to <4000,
4000 to <8000, 8000V
MM
- Machine Model
All these tests use a defined electrical charge which is applied to the device across all the pin
combinations, testing is usually performed from the lowest voltage upwards to determine the
maximum withstand voltage.
Page 3 of 8
Reliability Handbook
DEVICE RELIABILITY TESTS <top>
The results from these tests are used to predict the reliability of the devices in terms of FIT (1 FIT = 1 failure
per billion (1E9 -One thousand million) device hours and mean time to failure (MTTF). As the tests depend to
some extent on the design of a particular die, the results are grouped together into families of similar
devices.
Page 4 of 8
Reliability Handbook
Appendix 1
RELIABILITY CALCULATION DEFINITIONS
% Failures =
X 100%
The mean time before failure is the average time it takes for a failure to occur. It is calculated using the
formula:
Total device hours
MTBF =
Total number of failures
Failure Rate is the reciprocal of the MTBF.
1
MTBF
FR =
ELECTRICAL TRIALS
t1
t2
that is, the ratio of the time at the lower temperature to that at the higher. Since the acceleration factor is a
dimensionless ratio, it will be equal to the ratio of any other parameters proportional to the stress times. The
most useful ratio is that of failure rates, which are inversely proportional to stress times; if f1 is the failure rate
at T1, and f2 the failure at T2 then....
T2>T1 implies that f2>f1 and A=
t1
t2
Acceleration factor
Zetex Semiconductors Plc 2004-6
=e
EA 1 1
k T1 T2
Page 5 of 8
Reliability Handbook
A1.3 TEMPERATURE ACCELERATION
The High Temperature Reverse Bias (HTRB) test is an example of a temperature-accelerated test. It is
usually found that the rates of the reactions causing device failure are accelerated with temperature
according to the Arrhenius equation.
Where
The activation energy, EA, is found experimentally and is usually of the order of 1.0eV, depending on the
predominant failure mechanism. For the failure mechanisms in Zetex products, a value of 0.9eV has been
determined.
A1.4 CHI-SQUARED DISTRIBUTION
The failure rate predictions quoted in this report are based on a statistical tool known as the "chi-squared"
distribution. This is simply a mathematical model that describes the relationship between the actual failure
rate of a given device and the observed failure rate of a limited sample of that device. It is generally accepted
that the chi-squared distribution is the most accurate model for calculating failure rates from the relatively
small numbers of failures observed when testing electronic components.
A1.5 THE CHI SQUARED MULTIPLIER, 2
The value of the chi squared multiplier, 2, depends on the Upper Confidence Level (UCL or ) to which the
failure rate is to be quoted, (see section A1.6 about confidence levels), and the degrees of freedom (),
calculated from the number of failures, n. The actual values are derived directly from the chi-squared
distribution and are usually summarised in tables. The first five values, to a UCL of 60%, are tabulated
below:
Degrees of freedom
Chi-Squared value
2
1.83
4
4.04
6
6.21
8
8.35
10
10.5
90% UCL
2.52
1.93
1.71
1.60
1.52
1.47
1.44
1.40
1.38
Page 6 of 8
95% UCL
3.27
2.35
2.03
1.86
1.74
1.67
1.61
1.57
1.53
99% UCL
5.03
3.29
2.71
2.41
2.21
2.08
1.98
1.90
1.84
Reliability Handbook
A1.7 CALCULATING THE DEGREES OF FREEDOM
Since we require the maximum potential failure rate, the value of n used is taken to be 1 greater than the
actual number of failures observed during the test period. In order to take the "worst case" it is assumed that
the next failure would have occurred at the same time as the test was terminated. If the actual number of
failures observed is n, then...
Degrees of freedom = = 2(n+1)
A1.8 DETERMINING FIT VALUE
Now that the degrees of freedom has been calculated and the correct 2 value has been determined from the
Chi squared distribution table the failure rate is calculated from:
FR =
2
2 EDH
FR
10 9
A1.9 REFERENCES
Further discussion on accelerated testing can be found in the following documents:
(1) "VLSI Technology" Edited by Sze. 1984
Mc-Graw-Hill International Book Company
(2) "A Review of the Status of Plastic Encapsulated Semiconductor Component Reliability" RE Lawson
British Telecom Journal Vol 2 No 2 April 1984
Further discussion on the application of the chi-squared distribution to failure rate calculations can be found in:
"Electronic Equipment Reliability" JC Cluley MacMillan
The derivation of the chi-squared distribution and tables is discussed in most advance statistics textbooks.
Page 7 of 8
Reliability Handbook
Appendix 2
Example of a Failure Rate Calculation <top>
PNP High performance SOT23
Test performed:
HTRB for 1008 hours
Number tested:
400
Number of failures: 0
Cumulative Device Hours = number of devices tested x Test time
= 400 x 1008 = 403,200
The acceleration factor is calculated from the Arrhenius equation (see section A1.3)
Test temperature:
Service temperature:
Activation energy:
AF = e
0.9
1
5
8.63 x10 328 423
= 1262.318
FR =
2
2 EDH
-9
1.83
= 1.80 x 10
2 508966617.6
The Company reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service.
Europe
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Tel: (49) 89 45 49 49 0
Fax: (49) 89 45 49 49 49
email: europe.sales@zetex.com
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Hauppauge, NY 11788
USA
Tel: (1) 631 360 2222
Fax: (1) 631 360 8222
email: usa.sales@zetex.com
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Hong Kong
Tel: (852) 26100 611
Fax: (852) 24250 494
email: asia.sales@zetex.com
Page 8 of 8
Corporate Headquarters
Zetex Semiconductors plc
Zetex Technology Park,
Chadderton, Oldham, OL9 9LL
United Kingdom
Tel: (44) 161 622 4444
Fax: (44) 161 622 4446
email: hq@zetex.com