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5/17/2015

FieldEmissionScanningElectronMicroscopeEarnsMilestoneIEEETheInstitute

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FieldEmissionScanningElectronMicroscopeEarnsMilestone
Thedevelopmentmadepossiblehighresolutionimaging
ByANIAMONACO20January2012
ThismonthIEEEishonoringan
inventionthateventuallyledto
theinitialobservationoftheAIDS
virus,amongmanyother
contributions.Thefirstpractical
fieldemissionscanningelectron
microscope(FESEM),developed
byHitachiincollaborationwith
physicistAlbertCrewein1972,
madepossiblereliableultrahigh
resolutionimaging.
Electronmicroscopesletus
observecellsand
microorganisms,largemolecules,
biopsysamples,metalsand
crystallinestructures,andthe
Photo:Hitachi
characteristicsofvarious
surfaces.Theyreusedinindustryforqualitycontrolandfailureanalysis,amongotherapplications.
Torecognizethebreakthrough,IEEEnamedHitachisFESEManIEEEMilestoneinElectricalEngineeringand
Computing.

SIMULT ANE OUSE FFORT S


Hitachisresearchonelectronmicroscopes,whichuseabeamofelectronstoilluminatethespecimenand
produceamagnifiedimage,begancloseto70yearsago.In1942,HitachidevelopedJapansfirstcommercial
electronmicroscope.Thecompanythenworkedfordecadestoimprovethetechnology.
Butothers,includingCrewe,whointheearly1960swasdirectorofArgonneNationalLaboratory,inDowners
GroveTownship,Ill.,werealsomakingadvancesinmicroscopy.Crewehadbecomeinterestedinelectron
microscopybecauseofhislabsextensivebiologyprogram.Hewantedtoimprovethemicroscopicimagesthat
weresointegraltobiologistsresearch.Hecameupwithadesignforamicroscopethatscansasamplewitha
highenergybeamofelectronsinarectangular,lineatatimepattern.Duetothenarrowelectronbeam,scanning
electronmicroscopeimageshavealargedepthoffield,producingacharacteristicthreedimensionalappearance
usefulforunderstandingasamplesstructure.
CrewesetupagroupatArgonnetoturnhisconceptintoreality,andin1963theresearchersmadeafunctioning
device.Ayearlater,hedevelopedthefirstfieldemission(FE)gun,whichimprovedtheelectronmicroscopes
opticalquality.Thegunproducedanelectronbeamsmallerindiameterandwithgreatercurrentdensityand
brightnessthancouldbeachievedbyconventionalthermionicemitterswhichreliedontheheatinducedflowof
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5/17/2015

FieldEmissionScanningElectronMicroscopeEarnsMilestoneIEEETheInstitute

chargecarriersfromasurface.Thegunalsoimprovedsignaltonoiseratioandspatialresolution.

BE T T E RFOCUS
Crewewantedtospendmoretimeresearchingmicroscopy,soheleftArgonnein1967tobecomeaprofessorof
physicsattheUniversityofChicago.In1970,hedevelopedanFEscanningtransmissionelectronmicroscope
andusedittoobserveindividualatoms.(CrewewasntthefirsttodosothecreditgoestoGermanphysicist
ErwinWilhelmMuller,whoinventedanFEelectronmicroscopein1936.)Inthemeantime,Hitachihadbecome
interestedinCrewesworkandhiredhimasaconsultant.Duringthenextfewyears,hecollaboratedwithHitachi
toenhanceandcommercializethemicroscope.Amongthegreatestchallengesindevelopingacommercial
versionwasovercomingtheinstabilityofFEelectroncurrents.Hitachiovercamethathurdlewithultrahigh
vacuumtechnology,andin1972thecompanycompletedtheworldsfirstcommercialFESEM.
Themicroscopesimageresolutionwasvastlysuperiortoothersatthetime,capableofcapturingfeaturesas
smallas3nanometers,comparedwiththeprevious15nm.
TheFESEMsinitialapplicationwastobiology,anditcapturedthefirsthighresolutionimagesof
T2bacteriophages,virusesthatinfectE.colibacteria.Moredetailedimagesofbacteriophageswereproducedin
theearly1980swiththeadditionofmicroprocessorcontrol,whichmadeultrahighresolutionpossibleata
subnanometerscale.ThatcapabilityalsoledtothefirstobservationoftheAIDSvirus,in1985atTottori
UniversityinTokyo.
AceremonyfortheMilestoneistobeheldon31January,withplaquesunveiledattwoHitachiresearch
laboratoriesinTokyo.Theplaquesread:
HitachidevelopedpracticalfieldemissionelectronsourcetechnologyincollaborationwithAlbertCrewe
oftheUniversityofChicago,andcommercializedtheworldsfirstfieldemissionscanningelectron
microscopein1972.Thistechnologyenabledstableandreliableultrahighresolutionimagingwitheasy
operation.Fieldemissionelectronmicroscopeshavemadeinvaluablecontributionstotheprogressof
science,technology,andindustryinphysics,biology,materials,andsemiconductordevices.

FormoreinformationaboutthisandotherIEEEMilestones,visittheIEEEGlobalHistoryNetwork
(http://ghn.ieee.org/wiki/index.php/Special:Home).
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Story
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