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Outline
Objectives
Micro/nanoscale techniques
Definition
From Wikipedia
Number of Procedures
Projections*
2000000
1500000
Primary TJA
Revision TJA
1000000
500000
0
2000
2005
2010
2015
2020
2025
2030
Year
Fracture (rare)
Joint tribology
Wear mechanisms
Fretting, corrosion-assisted, adhesive,
fatigue, third-body
Testing methodologies
Joint simulators
accurate
Pin-on-disk testers
high
speeds
high loads
unidirectional wear
Reciprocating tribometers
highly
Micro/nanotribology approach
Contact between engineering surface occurs at discrete
asperities that dictate tribological behavior of interface
Probe
microscope
Sharp Probe
Piezo
scanner
Sample
Predict behavior of
macroscale interface
Objectives
Use micro/nanoscale techniques to investigate the
tribology of femoral head-acetabular cup interface in total
replacement hip joints
10
Experimental Details
Samples and interfaces
Si3N4 (probes)
Controlled humidity
11
Photodetector
B
A
C
Laser
Control signal:
vertical defection of
cantilever
( A B) (C D)
A BCD
Piezo
tube
scanner
Cantilever/tip
Sample
Vibration isolation
12
X
Y
Z
Experimental AFM
Topography and surface roughness
characterization
Adhesion (From force distance curves)
Lateral (Friction) force measurements
10 x 10 micron scan size
Normal loads: 0 100 nN
speed = 40 mm/s
13
Si3N4
Si tip
r ~ 10 nm
Contact Mode, r = 50 nm
(Friction, adhesion)
Intermittent Contact
Mode (Topography)
Experimental - Microtribometer
Strain Gages
Lateral Arm
Normal Arm
14
Microtribometer
Stroke length = 30mm
Max Hertzian contact
pressure: 3 30 MPa
Contact sizes
10s 100s mm2
AFM
Max. Hertzian contact
pressure: 75 200 MPa
Elastic contacts:
Plasticity index = 0.5
E *
p
H
Surface topography
UHMWPE
Si3N4 sphere
10 micron scans
Ra
23 nm
Ra
2.1 nm
RMS
28 nm
RMS
2.9 nm
Peak to Valley
169 nm
Peak to Valley
55 nm
Skewness
Kurtosis
- 0.23
Skewness
2.3
Kurtosis
16
0.90
10
200
RH = 18%
150
100
50
0
25
20
15
10
5
0
20
40
60
Normal Force (nN)
80
100
48
18
Relative Humdity (%)
17
RH = 50%
RH = 20%
25
20
15
10
0
0
50
100
150
18
Material transfer
Partly loose, partly adhesive
AFM analysis: about 600 nm high
19
10 mm scan
Si
Counts
60000
40000
20000
Adh. force = 18 nN
Si
60000
C O
Al
Counts
0.0
0.5
1.0
1.5
2.0
2.5
3.0
40000
20000
C
10 mm scan
Al
0
0.0
0.5
1.0
1.5
2.0
2.5
20
3.0
21
After
Direction of stroke
Material transfer
Mostly loose
No discernable wear
track on UHMWPE
22
Summary of results
Micro/nanoscale friction behavior of UHMWPE dependent
on humidity
23
24
END
Acknowledgements
Jason Check, former ISU student
25