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Article history:
Received 30 September 2015
Received in revised form
22 April 2016
Accepted 12 August 2016
Available online 18 August 2016
In this paper, stochastic automata networks (SANs) formalism to model reliability of power systems
substations is applied. The proposed strategy allows reducing the size of state space of Markov chain
model and simplifying system specication. Two case studies of standard congurations of substations
are considered in detail. SAN models with different assumptions were created. SAN approach is compared with exact reliability calculation by using a minimal path set method. Modeling results showed
that total independence of automata can be assumed for relatively small power systems substations with
reliable equipment. In this case, the implementation of Markov chain model by a using SAN method is a
relatively easy task.
& 2016 Elsevier Ltd. All rights reserved.
Keywords:
Reliability modeling
Markov chain
Stochastic automata network
Power system
Substation
1. Introduction
Markov chain modeling has been applied in power system reliability modeling for a long time [1,2]. It has a well-developed
mathematical apparatus and can describe complex behavior of a
system [3]. Two alternatives to Markov models are common in
power system reliability modeling: methods based on the independence of system components (e.g., fault tree analysis, reliability block diagrams, etc.) and Monte Carlo simulation.
Methods which assumes total independence of system components are simpler, but even these techniques can be cumbersome, and classical methods, such as fault tree analysis [4] or
generation of minimal set paths [5], require computer assistance
and use of special algorithms. These methods can also be combined in modeling of Markov chains [6,7].
A Monte Carlo simulation method is often applied in reliability
modeling and has been used to simulate various types of objects,
such as substations [8], power plants [9] or standard and composite generation and transmission systems [10,11]. However, simulation of rare events (which is common in reliability modeling)
requires special attention [12,13], and Markov chain models tend
to be more efcient if a system is not too large and highly reliable
[14]. Moreover, since by nature Monte Carlo method is based on
n
Corresponding author.
E-mail addresses: minsnip@ktu.lt (M. nipas),
Virginijus.Radziukynas@lei.lt (V. Radziukynas), eimval@ktu.lt (E. Valakeviius).
http://dx.doi.org/10.1016/j.ress.2016.08.006
0951-8320/& 2016 Elsevier Ltd. All rights reserved.
random experiments, it is benecial to be able to compare its results to other methods, for which Markov chain modeling can be
used [15,16].
Markov chain modeling allows evaluating complex system
behavior [17,18]; however, the main drawback is rapid growth of
system states and, consequentially, rising complexity. Therefore,
most examples in Markov chain reliability modeling deal with
relatively small state space [17,19]. For a more complex system,
special software can be applied [20,21], but there is still a need for
systematic approach, which would allow for simplied description
of complex systems. Some proposed strategies are based on system decomposition into smaller independent subsystems [22,23],
but the problems might arise if subsystems are interdependent.
One of the methods suitable for complex Markov chain model
creation is stochastic automata networks (SANs) formalism [24].
SAN formalism applies Kronecker algebra operations, which enables to store innitesimal generator matrix in compact format;
therefore, it is especially suitable for solving the problem of dimensionality. It also allows for systematic description of interaction between smaller subsystems which provides an exact solution. The SAN method was applied to different areas of research.
For example, SAN formalism was used to evaluate availability of
large-scale computer networks [25], in system theory, SANs were
applied in creating the inuence model [26]; in cell biology, SANs
can be used to model ion channels [27], etc.
Kronecker algebra approach is not new in system reliability, but
most examples deal with systems of independent components
14
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
[28]. A more sophisticated use of Kronecker algebra with functional transitions in respect to system reliability is considered in
[29], though it uses different terminologies than that of SAN
formalism. In [30], theoretical k out of n system was specied by
using SAN formalism. However, practical application of SANs in
solving real-world reliability problems is still uncommon.
In [31], SAN formalism is used to specify reliability of cogeneration power plant substation. In this paper, it has been elaborated on these ideas to propose a methodology to model system
reliability of power systems substations. System division into different automata and the use of arrowhead matrices are addressed
in detail. We also consider the use of SANs together with classic
reliability modeling techniques like minimal path sets, failure
modes and effect analysis (FMEA) and structure functions. Reliability models of two standard congurations of substation under
different model assumptions are created using the proposed
methodology. The calculation of system measures and evaluation
of independence of individual automata are also considered.
The main principles of Markov chain numerical modeling and
SANs are introduced in Section 2, while the theoretical background
on SAN formalism is presented in Section 3.
In Section 4, the application of SANs of real world power systems is addressed. In this chapter, the formation of individual
automaton is considered due to preventative circuit breaker actions of power system. The proposed technique leads to automata,
whose innitesimal generators are arrowhead matrices. We demonstrated that arrowhead matrices and SAN formalism allow
specifying various scenarios, which are common in reliability
modeling.
This methodology is applied in two case studies. In Section 5
we present the model of sectionalized bus and in Section 6 a ring
bus substation conguration. Both reliability models are considered in detail under different assumptions, which can be easily
implemented by the use of functional transition rates. Functional
transition rates are used to specify preventative circuit breaker
operation, shared load and repair capacity.
In Section 7, it is shown how SAN reliability modeling can be
combined with minimal path set methods and structure functions
for estimation of system availability.
In Section 8, the modeling results are presented. In Section 9,
we discuss the implication of modeling results and the conditions,
under which the independence of automata can be assumed. In
this case, the implementation of SAN modeling becomes a much
easier task.
Q = 0.
(1)
( n 1),
(2)
e = 1;
Pr( F ) =
s ( i ) SF
( )
s ( i) ;
(3)
where s
( i)
state s( i).
One of the main problems in Markov chain modeling is a rapid
growth of the number of system states. E.g., Markov chain model
of a system consisting of k different items (each of them can be at
fault or operating) has a state-space of size 2k. Thus a twenty-item
system would have more than one million states. Moreover, the
number of states doubles if the number of items is increased by
one. This phenomenon the number of states of the Markov chain
grows exponentially when the number of system components
grows linearly is called a state space explosion.
The state space explosion makes the practical application of
Markov chains a difcult task. If the number of system states is
large, the model creation and solution of (2) might be challenging.
Therefore, the use of efcient Markov chain modeling techniques
and numerical methods is crucial.
a11B a1nB
A B = R mp nq.
a m1B a mnB
(4)
A B = A In + Im B R mn mn.
(5)
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
found in [32].
If the network consists of k independent stochastic automata
A( i) with innitesimal generators Q( i) , i = 1... k , when an innitesimal generator of the whole system (so called global innitesimal generator) Q can be expressed as a tensor sum
k
Q = Q ( i).
i=1
(6)
= ( i).
i=1
(7)
15
S9
C4
S7
B1
S3
C1
S4
C2
S1
L1
S5
C3
S6
T2
S10
C5
S8
B2
S2
Table 1
Preventative disconnection due to
the failure of other items.
Failed
Disconnected
L1, S1
L2, S2
B1, S3, S5, S7
B2, S4, S6, S8
T1, S9
T2, S10
C1-S3
C2-S4
C1-S1, C3-S6, C4-S9
C2-S2, C3-S5, C5-S10
C4-S7
C5-S8
Table 2
Preventative disconnection due to
the failure of circuit breakers.
Failed Disconnected
C1
C2
C3
C4
C5
C3-S6, C4-S9
C3-S5, C5-S10
C1-S1,C2-S2,C4-S9,C5-S10
C1-S1, C3-S6
C2-S2, C3-S5
L2
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
16
Q ( i) = 1
ni
1 n i
* 0 0
.
0 * 0
0 0 *
(8)
The rst line in (8) denotes an operating state, while the rest
denotes a failure of items number 1, 2, , ni respectively. Eq. (8)
can also be written in the block form as follows
d
1, ni
1,1
;
Q ( i) =
ni,1 Dni
(9)
d1,1 = 1, nieni,1.
The structure of non-zero entries in matrices (8)(9) has a
distinct shape, which is known as arrowhead matrix [36]. In this
paper we want to demonstrate that the use of arrowhead matrices
and SAN formalism allows describing variety of events common in
system reliability.
1) Repairable item I.e. an item which can be in two possible
states: operating and failed. If and denotes a failure and
repair rates respectively, its' Markov chain has an innitesimal
generator
Q=
(10)
Q=
p
p
p
0
0 .
(11)
3) System with shared load and repair capacity Consider a twoitem system with a shared load. I.e. failure and repair rates can
vary due to the failure of another item (because of increased
load, limited repair capabilities, etc.). Each item can be described by the innitesimal generator with functional transition
rates:
f
f2 1
1
; Q ( 2) =
Q ( 1) = 2
g21 g21
f
f12
.
1 2
g12 g12
(12)
Suppose that failure rate increases 50% due to the shared load,
and repair rate decreases 20% due to the shared repair capabilities. In that case functional transition rates in (12) can be
dened as
1,
1,
s ( j) = O ;
s ( j) = O ;
; gi =
fi =
.
j
1.5, s ( ) = F;
0.8, s ( j) = F;
(13)
Q = Q ( 1) Q ( 2);
2
0, s ( ) = F ;
f1 =
f2 = g1 = g2 = 1.
(
1, s 2) = O;
(15)
5) Generalized arrowhead matrix Putting together all aforementioned reliability scenarios one can dene an arrowhead matrix
with functional transition rates (in respect to generalized tensor
algebra we call it generalized arrowhead matrix):
i
fn n(i )
i
0
0
.
0
*
0
*
i
f11( )
*
g ( i)
*
Q ( i) = 1 1
0
( i)
0
gni ni
(16)
Q = Q ( i).
i=1
g
(17)
items L2, S2 and circuit breaker C2. Since both of these parts consist
of identical items, its innitesimal generators are given by:
* f f f
Li l
Si s
Ci c
*
0
0
, i = 1, 2.
Q ( i) = l
s 0
*
0
*
0
c 0
(18)
(14)
ventative disconnection under the repair. These and other functional transition rates are considered in detail in Sections 5.25.4.
For the rest of innitesimal generators Q( i) we use block form
(9). In that case Q( i) is dened by vectors ( i) and ( i) . E.g., the
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
third automaton A( 3), which models behavior of the items S3, S5, S7,
B1 and C3, is given by
( 3) =
fB b fS s fS s fS s fC c
1
(
= (s
= (s
= (s
fS
fS
( 3) = ( b s s s c ) .
(19)
fS
( 4) =
(f
B2 b
(20)
)
);
T1 t
fS s fC c ;
9
4
T2 t
fS s fC
10
(5)
(i )
(1)
i = 1, 2, 5, 6;
(27)
(
) (
) (
)
= ( s ( ) = 0 ) ( s ( ) 5 ) ( s ( ) 3) ;
= ( s ( ) = 0 ) ( s ( ) 3 ) ( s ( ) 3) ;
= ( s ( ) 3) ( s ( ) 5) ( s ( ) 3) .
fS
fS
fS
(28)
) (
fT = s ( 3) = 0 s ( 1) 3 ; fS = fC = fT .
5 c
T
( i) = ( t s c ) ; i = 5, 6.
(21)
(29)
And nally, functional transition rates associated with automaton A( 6) are as follows:
) (
) (
fT = s ( 4) = 0 s ( 3) 5 s ( 2) 3 ;
Q = Q ( i).
i=1
g
(22)
s=
(4)
(5)
fC = fS .
T
( 4) = ( b s s s ) .
(f
( ) = ( f
(1)
fB = s ( 2) 3 s ( 3) 5 s ( 6) 3 ;
fS s fS s fS s ;
4
6
8
( 5) =
)
3) ;
3) ;
3) ;
fB = s (1) 3 s (5) 3 ;
3
) (
= 0 ) (s
= 0) (s
= 0 ) (s
17
{ ( s )}; i = 1, 6; s = 0, 3; s = 0, 5; s
( i)
= 0, 4.
fS
10
= fC = fT .
5
(30)
(23)
i,
i=1
i =i 1 i
.
(31)
This transformation allows for a signicant reduction of statespace and could be useful if Markov chain reliability model had a
large number (millions or more) of states.
any of S3, S5, S7, B1, C3 (all belong to A( 3)) or C4 (denoted by state
3 of A( 5)) is under repair. These conditions can be expressed by
dening fL as
1
) (
fL = s ( 3) = 0 s ( 5) 3
1
(24)
fS = fC = fL .
1
(25)
) (
) (
fL = s ( 4) = 0 s ( 3) 5 s ( 6) 3 ; fS = fC = fL .
2
(26)
1,
if s ( j) = 0 ;
fT s =
( i; j) = ( 1; 6), ( 2; 5).
i
1.5, otherwise ;
(32)
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
18
if s ( j) = 0 = 1 ;
1,
ji
gi =
i = 1, 6.
0.5, otherwise ;
(33)
Table 3
Preventative disconnections due to the failure of the items of ring bus
conguration.
Failed
L1, S2, S3, B2
L2, S4, S8, B3
T1, S1, S5, B1
T2, S6, S7, B4
Disconnected
Failed
Disconnected
C1-S1,
C2-S3,
C1-S2,
C3-S5,
C1
C2
C3
C4
C2-S4,
C1-S1,
C1-S2,
C2-S3,
C2-S4
C4-S7
C3-S6
C4-S8
C3-S6
C4-S7
C4-S8
C3-S5
S = s ( i) ; i = 1, 4; si = 0, 5.
given by
(34)
fB b fS s fS s fC c ;
3
4
8
2
(35)
The third automaton A( 3) models items T1, B1, S1, S5 and C3. Its
local innitesimal generator Q( 3) is dened by vectors
(36)
( 4)
T2 t
fS
L1
C1
S2
(
)
= f = ( s ( ) = 0 ) ( s ( ) 5) ;
= ( s ( ) = 0 ) ( s ( ) 5) .
(40)
( 2)
and
fS
C2
fS
(41)
S3
C2
S4
fT = fB = s ( 1) 5 ;
1
) (
fS = s ( 1) = 0 s ( 2) 5 ;
1
fS = fC = s
3
( 4)
) (
=0 s
( 1)
5 .
(42)
fT = fB = s ( 3) 5 ;
2
L2
B2
fL = fB = s ( 4) 5 ;
(37)
S1
C1
fB b fS s fS s fC c ;
4
6
7
4
( 4) = ( 3) .
B1
( 3) = ( t b s s c ) .
(f
fS
( 4) =
fB b fS s fS s fC c ;
1
1
5
3
T1 t
(
)
= f = ( s ( ) = 0 ) ( s ( ) 5) ;
= ( s ( ) = 0 ) ( s ( ) 5) .
fL = fB = s ( 2) 5 ;
T
( 2) = ( l b s s c ) .
(f
(39)
( 3) =
(38)
Similarly to (34) the rest of automata are described by arrowhead innitesimal generators, therefore it is possible to write them
in block matrix form (9). E.g., innitesimal generator Q( 2) , which
L2 l
i=1
g
* f f f f f
L1 l
B2 b
S2 s
S3 s
C1 c
*
0
0
0
0
l
b 0
*
0
0
0
1)
(
Q =
.
*
0
0
0
s 0
*
0
0
0
s 0
*
0
0
0
c 0
(f
Q = Q ( i).
( )
( 2) =
B3
fS
) (
fS = fC = s
7
= s ( 3) = 0 s ( 1) 5 ;
4
( 2)
) (
=0 s
( 3)
5 .
(43)
B4
S5
T1
C3
S6
T2
S7
C4
S8
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
19
1, if s ( j) = 0 ;
fT s =
( i; j) = ( 1; 4), ( 2; 3).
i
1.5, otherwise ;
(44)
(45)
1( s) =
( s ( j ) = 0) ;
j = 1, 3, 5.
(49)
2( s) =
(48)
i=1
( s ( i) = 0) ( s ( 3) 5);
i = 1, 3, 5;
( s ( i ) = 0 ) ( s ( j ) 3) ;
i 2, 5; j = 2, 5;
( s ( i ) = 0 ) ( s ( j ) 3) ;
i 1, 6; j = 1, 6.
i, j
4( s) =
(50)
i, j
P1 {L1,S1,C1,S3,B1,S7,C4,S9,T1} {S5,C3};
P2 {L2,S2,C2,S4,B2,S8,C5,S10,T2} {C3,S6};
P3 {L1,S1,C1,S3,B1,S5,C3,S6,B2,S8,C5,S10,T2} {C4,S7,S4,C2};
P4 {L2,S2,C2,S4,B2,S6,C3,S5,B1,S7,C4,S9,T1} {C1,S3,S5,S8}.
Similarly we dene the structure functions i i = 1, 8 associated to the minimal path sets Pi of the ring bus conguration. The
argument of these functions is state space vector (39).
4
Pr( A1) = Pr Pi.
i=1
3( s) =
1( s) =
( s ( i) = 0) ( s ( 2) 5);
i = 1, 3;
2( s) =
( s ( i ) = 0) ;
i = 1, 2, 3, 4;
3( s) =
( s ( i) = 0) ( s ( 4) 5);
i = 1, 2, 3;
( s ( i) = 0) ( s ( 1) 5);
i = 2, 3, 4;
( s ( i) = 0) ( s ( 2) 5);
i = 1, 3, 4;
( s ( i) = 0) ( s ( 3) 5);
i = 1, 2, 4;
4( s) =
(46)
5( s) =
Pr( A2 ) = Pr( P1 P2 P1 P3 P2 P4 P3 P4 ).
(47)
6( s) =
7( s) =
( s ( j ) = 0) ;
i = 1, 2, 3, 4;
8( s) =
( s ( j) = 0) ( s ( 3) 5);
i = 2, 4.
(51)
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
20
for i3 0:5
for i4 0:4
for i5 0:3
for i6 0:3
f1: (i1 0)*(i3 0)*(i5 0);
f2: (i2 0)*(i4 0)*(i6 0)*(i35);
f3: (i1 0)*(i3 0)*(i4 0)*(i6 0)*(i33)*(i33);
f4: (i2 0)*(i3 0)*(i4 0)*(i5 0)*(i13)*(i63);
if (f1) or (f2) or (f3) or (f4)
pr ps p(ind)
end if
end for i6
end for i5
end for i4
end for i3
end for i2
end for i1
Table 5
Sectionalized bus conguration reliability modeling results.
1 Set of parameters
Reliability model
Event
A1
A2
A1
A2
A1
A2
A1
A2
A1
A2
SAN (independent)
SAN (f, prev.)
SAN (f, shar.)
SAN (f, prev. shar.)
2 Set of parameters
Reliability model
Minimal path sets
SAN (independent)
ind = i j nk .
j=1 k=j+1
6
(52)
8. Modeling results
We calculated probabilities Pr( A1) and Pr( A2 ) for sectionalized
bus and ring bus substation congurations with two different sets
of failure and repair rates. The rst set of estimated model parameters (see Table 4) is statistical data collected by Lithuanian
Energy Institute. The second set of parameters was chosen from
[38]. In this case we chose higher failure rates and average repair
times, in order to get more visible difference between different
reliability modeling methods.
Probabilities of events A1 and A2 for the sectionalized bus
conguration was estimated by using two different modeling approaches: probability calculation of standard minimal set paths
method and Markov chain modeling.
First, we used minimal set paths and the general addition
theorem for exact calculation of Pr( A1) and Pr( A2 ). The probabilities
that an item j is operating was calculated from pj = j8760/t j .
Table 4
Failure and repair rates.
Set 1
l
s
c
b
t
Set 2
0.0816
0.0002
0.0067
0.0002
0.0114
tl
ts
tc
tb
tt
70
8
48
2
48
l
s
c
b
t
0.15
0.001
0.08
0.01
0.02
tl
ts
tc
tb
tt
100
15
160
6
200
Event
A1
A2
A1
A2
A1
A2
A1
A2
A1
A2
s
30
4
30
2
29
1
35
20
30
1
s
49
0
38
54
9
21
15
41
53
37
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
Table 6
Ring bus conguration reliability modeling results.
1 Set of parameters
Reliability model
Event
SAN (independent)
A1
A2
A1
A2
A1
A2
A1
A2
Event
A1
A2
A1
A2
A1
A2
A1
A2
s
5
28
4
28
17
43
16
41
s
42
24
34
39
34
49
11
4
Pri( 2) nf 2 2 ,
(53)
nf2 =
ni nj ;
i=1 j=i
(54)
21
10. Discussion
The paper presents the use of SAN formalism in system reliability modeling. The proposed strategy of system division into individual automata allows for simplication of model specication.
The use of decomposition techniques in Markov chain reliability
modeling is not new and is probably unavoidable for a large system.
The applications differ in types of modeled systems (e.g., nuclear
power plants [23] or electrical bus networks [22]) and used methodology (Markov models can be specied using together with faulttree analysis [39], Petri nets formalism [40], etc.). The decomposition is natural if subsystems are independent, but it is much more
complicated if they interact in any way. SAN formalism allows to
describe the behavior of a system in a systematic way as we have
demonstrated by the proposed technique in this paper.
In general, it is intended that this research serves as an encouragement for a more widespread use of Markov chains and
SAN formalism in reliability modeling. However, we have to note
that the proposed methodology has some drawbacks. Specication
of functional dependencies among different automata can be
cumbersome even for a relatively small object, such as standard
substation congurations presented in this paper. In the future
research, it might be very advantageous to automate the process of
system description based on graph theory algorithms, as it was
done in [22,39]. Graph theory methods can also be applied for
generation of minimal path sets, which, as has been shown in this
study, can be merged with SAN formalism and structure functions
for estimation of system measures. This could be achieved by
adding some labeling schemes of each item with respect to different automata. We also believe that SAN application together
with minimal cut sets could be implemented in a similar way.
Modeling results showed that the difference between the
model of independent automata and the models with functional
transition rates is relatively small, especially in models with very
reliable equipment. This means that probably the most cumbersome part, i.e. specication of functional transition rates, could be
avoided altogether. In this case, assumption of independence is
justied quantitatively, and modeling by SAN becomes a relatively
easy task.
One of the advantages of the proposed methodology is that it
leads to a distinct structure, that is, the innitesimal generator of
each individual automaton is an arrowhead matrix. Although this
property was not utilized in this study, it might be benecial for
application of efcient numerical methods. This property would be
very important for lowering computation time for large models,
when the storage of global system matrix and efcient calculation
of steady-state probabilities requires special attention.
22
M. nipas et al. / Reliability Engineering and System Safety 157 (2017) 1322
At the moment, we cannot state that the proposed methodology is the most efcient way for the system description. Other
techniques might yield a lower number of system states or, alternatively, to simplify specication of functional dependencies
between different automata. This study was opted for a trade-off
between the size of state space and ability to describe interaction
between different automata.
In general, two main factors restrict the applicability of any
Markov chain based methodology in reliability modeling. First, it is a
rapid growth of the number of states in Markov model, which is
often referred to as state space explosion. Although SAN formalism is
suitable for simplifying this problem, it is not a complete solution.
Depending on computational resources even the compact representation of transition matrix is not sufcient when the size of
probability vector exceeds RAM capacity. To the best of our knowledge, a general compact form for a probability vector is not yet
known; therefore, it remains the bottleneck in Markov chain modeling for large systems. In this case, state space reduction could be
applied as it is common in reliability problems [41]. This study did
not concentrate on these problems, and the presented examples
were intended merely to demonstrate the proposed methodology.
However, we believe that the advanced techniques, such as SAN
formalism, allow for specication and solution of much larger Markov chain models in reliability problems than is commonly assumed.
Second limitation to the application of Markov processes is its
inapplicability to non-Markovian systems. In Markovian system, the
time after which the system leaves any particular state does not
depend on the time already spent in that state. This memoryless
property is satised only when the time-spans between different
events have an exponential distribution. Non-exponential distribution can be approximated by phase type distribution, which is
also applicable to SAN formalism [42]. In such a way a non-Markovian system is replaced by a Markovian one, although it would
further increase the size of state-space. In addition, this, most likely,
would not be suitable in some situations, e.g., to model planned
repairs in regular time intervals. In such cases, other approaches,
such as the Monte Carlo method, should be applied.
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Acknowledgments
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