EXPERIMENT NO.

405
DIFFRACTION

JEROMMEL OLGADO, PHY13L/A2

jerommelolgado@gmail.com

Abstract
The experiment deals with the study of diffraction specifically with single slit
diffraction and two slit interference. The objectives of this experiment are: to explore the
phenomenon of diffraction of light, and to compare single slit diffraction and two slit
interference. The experiment is divided into three parts. The first part is the analysis of single
slit diffraction by determining the positions of dark fringes, and the second part is the analysis
of two slit interference by measuring the positions of the bright fringes. With the gathered
data and observation, the single slit diffraction and two slit interference under the concept of
diffraction with the use of diode laser, slit disk holders, and an optical bench with screen is
interpreted and further understood and analyzed by physical experiment which is then
discussed and explained in this paper.
Key Words: Diffraction, Single slit diffraction, two slit interference, light bend
Introduction
Everyone is used to the idea that sound bends around corners. If sound didnt behave
this way, you couldnt hear a police siren thats out of sight around a corner or the speech of a
person whose back is turned to you. What may surprise you, and certainly surprised many
scientists of the early 19th century, that light can bend around corners as well. When light
from a point source falls on a straightedge and casts a shadow, the edge of the shadow is
never perfectly sharp. Some light appears in the area that we expect to be in the shadow, and
we find alternating bright and dark fringes in the illuminated area. In general, light emerging
from apertures doesnt behave precisely according to the predictions of the straight-line ray
model of geometric optics.
We can analyze diffraction patterns using Huygens principle. This principle states
that we can consider every point of a wave front as a source of secondary wavelets. These
spread out in all directions with a speed equal to the speed of propagation of the wave. The
position of the wave front at any later time is the envelope of the secondary wavelets at that
time. To find the resultant displacement at any point, we combine all the individual
displacements produced by these secondary waves, using the superposition principle and
taking to account their amplitudes and relative phases.

Methodology
1. Materials
The Experiment made use of the following materials: 1 pc optical bench with screen,
1 pc diode laser, 1 pc single slit disk with holder, 1 pc multiple slit disk with holder, and 1 pc
ruler. The materials can be seen in Fig. 1.

Fig. 1: Materials. Names are listed above.

2. Procedure
2.1. Single Slit Diffraction
After the set-up is done, turn the single slit disk until the laser is incident on the single
slit of width 0.16mm. Using a ruler, determine the middle central bright fringe of the
diffraction pattern formed on the screen. This will be position y=0 with the y-axis along the
line of the diffraction pattern. From y=0, determine the positions of the dark fringes: y1, y2, y3,
y-1, y-2, y-3. Move the screen to the 85cm mark and determine the positions of the dark fringes
and the repeat the same with the screen moved to the 70cm mark.
Move the screen back to the 100cm mark and repeat the procedure for slit widths
0.08mm and 0.04mm.

2.2. Two Slit Interference

From the set-up of 2.1, Replace the single slit disk with the multiple slit disk; like the
single slit disk, the multiple slit disk should be facing the diode laser. Turn on the diode laser
and turn the disk until the laser is incident on the double slit marked 0.08/0.50. The diode
laser should be perfectly centered on the double slit so that a clear pattern may be formed. If
not centered, adjust the knobs of the diode laser. Next, determine the middle of the central
bright fringe using a ruler. This will be position y=0, with the y-axis along the line of the
interference pattern. From y=0, determine the positions of the bright fringes: y1, y2, y3, y-1, y-2,
y-3. . Move the screen to the 85cm mark and determine the positions of the bright fringes and
the repeat the same with the screen moved to the 70cm mark.
Move the screen back to the 100cm mark and repeat the procedure for the double slits
marked 0.08/0.25 mm and 0.04/0.5.
3. Set-Up

Fig. 2: Screen at 100cm mark, diode laser at 0cm mark pointed at the screen,
And the single slit disk at the 10cm mark.

Results and Discussion

The fifth experiment is all about diffraction of light waves. For this experiment our
main objective is to explore the phenomenon of diffraction of light and to compare single slit
diffraction and multiple slits interference.
4.1 Determination of Index of Refraction of Glass
To start, we first investigate the single slit diffraction. In order for us to investigate the
diffraction occurring in a single slit disk, we try to change either the slit-screen difference, x,
or slit width, a, leaving or setting the other variable as constant. From here, we can get the
value for wave length, , and eventually analyze its relationship to the slit-screen difference,
x, and the Slit width, a. Based on the results of our experiment, I observed that for every
increase in the slit-screen distance, x, corresponds to a decrease in the wave length, . On the
other hand, I observed that at constant slit-screen separation, an increase in slit width, a
corresponds to an increase in value with regards to the wave length, . Based on the results of
our observations, we can conclude that the results are consistent with the theory which gives
the equation, =(yma)/(mx) where a is the slit width and x is the slit-screen separation.
With that, we observed that the waves are 180o since weve used a single slit disk and
therefore resulting to a destructive interface. Destructive interface occurs when a crest of one
wave overlaps through another wave resulting to a decrease in amplitude and formation of a
dark region known as the central minimum. The single slit formation can be found in the
figure below and the data obtained in this part are shown on TABLE 1.
TABLE 1. SINGLE SLIT DIFFRACTION
a = 0.16 mm
m
1
2
3
-1
-2
-3

m
1
2
3
-1
-2
-3

x = 90 cm
Calculated
711 nm
622 nm
652 nm
-711 nm
-622 nm
-652 nm
668 nm
x = 75 cm
Calculated
640 nm
747 nm
640 nm
-640 nm
-747 nm
-640 nm
676 nm
x = 60 cm
Calculated

ym
0.4 cm
0.6 cm
1.1 cm
-0.4 cm
-0.6 cm
-1.1 cm
AVERAGE CALCULATED
a = 0.16 mm
ym
0.3 cm
0.7 cm
0.9 cm
-0.3 cm
-0.7 cm
-0.9 cm
AVERAGE CALCULATED
a = 0.16 mm
ym
4

1
2
3
-1
-2
-3

m
1
2
3
-1
-2
-3

m
1
2
3
-1
-2
-3

m
1
2
3
-1
-2
-3

m
1
2
3
-1
-2
-3

m
1

0.2 cm
0.6 cm
0.7 cm
-0.2 cm
-0.6 cm
-0.7 cm
AVERAGE CALCULATED
a = 0.08 mm
ym
0.8 cm
1.5 cm
2.2 cm
-0.8 cm
-1.5 cm
-2.2 cm
AVERAGE CALCULATED
a = 0.08 mm
ym
0.7 cm
1.2 cm
1.8 cm
-0.7 cm
-1.2 cm
-1.8 cm
AVERAGE CALCULATED
a = 0.80 mm
ym
0.5 cm
1.0 cm
1.5 cm
-0.5 cm
-1.0 cm
-1.5 cm
AVERAGE CALCULATED
a = 0.04 mm
ym
667 nm
667 nm
667 nm
-667 nm
-667 nm
-667 nm
AVERAGE CALCULATED
a = 0.04 mm
ym
1.3 cm

533 nm
800 nm
622 nm
-533 nm
-800 nm
-622 nm
677 nm
x = 90 cm
Calculated
711 nm
667 nm
652 nm
-711 nm
-667 nm
-652 nm
567.90 nm
x = 75 cm
Calculated
747 nm
640 nm
640 nm
-747 nm
-640 nm
-640 nm
676 nm
x = 60 cm
Calculated
667 nm
667 nm
667 nm
-667 nm
-667 nm
-667 nm
667 nm
x = 90 cm
Calculated
577.78 nm
555.55 nm
548.15 nm
533.33 nm
533.33 nm
533.33 nm
667 nm
x = 75 cm
Calculated
693 nm
5

2
3
-1
-2
-3

m
1
2
3
-1
-2
-3

2.5 cm
3.8 cm
-1.3 cm
-2.5 cm
-3.7 cm
AVERAGE CALCULATED
a = 0.04 mm
ym
1 cm
2 cm
3 cm
-1 cm
-2 cm
-3 cm
AVERAGE CALCULATED

667 nm
676 nm
-693 nm
-667 nm
-676 nm
679 nm
x = 60 cm
Calculated
667 nm
667 nm
667 nm
-667 nm
-667 nm
-667 nm
667 nm

Fig. 3: Image formed on the screen with a single slit with of 0.16mm
And diode laser 100cm away from the screen.
4.2 Two Slit Interference
For the second and the last part of the experiment, the same procedure was done as
that of the first part but a multiple slit disk was used instead of the single slit disk. The result
of the experiment shows that the observation on the first part is almost the same as the second
6

part. Since weve used double-slit disk, waves were in phase resulting to a constructive
interference which occurs when crest of the two waves overlap resulting to an increase in
amplitude and formation of bright region known as the central maximum. The data obtained
in this part are shown on TABLE 2.

TABLE 2. TWO SLIT INTERFERENCE

a = 0.08 mm / d = 0.50 mm
m
ym
0
0.0 cm
1
0.1 cm
2
0.2 cm
3
0.4 cm
-1
-0.1 cm
-2
-0.2 cm
-3
-0.4 cm
AVERAGE CALCULATED
a = 0.80 mm / d = 0.50mm
m
ym
0
0.0 cm
1
1 cm
2
2 cm
3
3 cm
-1
-1 cm
-2
-2 cm
-3
-3 cm
AVERAGE CALCULATED

x = 90 cm
Calculated
0 nm
667 nm
667 nm
648 nm
-667 nm
-667 nm
-648 nm
660 nm
x = 75 cm
Calculated
0 nm
667 nm
667 nm
667 nm
-667 nm
-667 nm
-667 nm
667nm

a = 0.08 mm / d = 0.50 mm
M
ym
0
0.0 cm
1
0.8 cm
2
1.7 cm
3
2.3 cm
-1
-0.8cm
-2
-1.7 cm
-3
-2.3 cm
AVERAGE CALCULATED
a = 0.08 mm / d = 0.25 mm
m
ym
0
0.0 cm
1
2.3 cm
2
4.8 cm
3
7.3 cm
-1
-2.3 cm

x = 60 cm
Calculated
0 nm
667 nm
708 nm
639 nm
-667 nm
-708 nm
-639 nm
670 nm
x = 90 cm
Calculated
0 nm
639 nm
667 nm
676 nm
-639 nm
7

-2
-4.8 cm
-3
-7.3 cm
AVERAGE CALCULATED
a = 0.08 mm / d = 0.25 mm
M
ym
0
0.0 cm
1
1.9 cm
2
4.1 cm
3
6.1 cm
-1
-1.9 cm
-2
-4.1 cm
-3
-6.1 cm
AVERAGE CALCULATED
a = 0.08 mm / d = 0.25 mm
0.0 cm
m
1.5 cm
0
3.2 cm
1
4.9 cm
2
-1.5 cm
3
-3.2 cm
-1
-4.9 cm
-2
0.0 cm
-3
AVERAGE CALCULATED
a = 0.04 mm / d = 0.50 mm
m
ym
0.0 cm
0
1.2 cm
1
2.3 cm
2
3.5 cm
3
-1.2 cm
-1
-2.3 cm
-2
-3.5 cm
-3
AVERAGE CALCULATED
a = 0.04 mm / d = 0.50 mm
m
ym
0.0 cm
0
1 cm
1
2 cm
2
3 cm
3
-1 cm
-1
-2 cm
-2
-3 cm
-3
AVERAGE CALCULATED
a = 0.04 mm / d = 0.50 mm
m
ym
0.0 cm
0
0.7 cm
1

-667 nm
-676 nm
660 nm
x = 75 cm
Calculated
0 nm
633 nm
683 nm
678 nm
-633 nm
-683 nm
-678 nm
665.81 nm
x = 60 cm
Calculated
0 nm
625 nm
667 nm
681 nm
-625 nm
-667 nm
-681 nm
637 nm

x = 90 cm
Calculated
0 nm
667 nm
639 nm
648 nm
-667 nm
-639 nm
-648 nm
651 nm

x = 75 cm
Calculated
0 nm
667 nm
667 nm
667 nm
-667 nm
-667 nm
-667 nm
667 nm

x = 75 cm
Calculated
0 nm
583 nm

1.6 cm
2
2.5 cm
3
-0.7
cm
-1
-1.6 cm
-2
-2.5 cm
-3
AVERAGE CALCULATED

668 nm
694 nm
-583 nm
-668 nm
-694 nm
648 nm

As a whole, single and double slit disk differ on their interference but the relationship
regarding slit width, wave length and slit-screen separation are all the same. Diffraction
depends only on the ratio of wave length to the size of the diffracting object.

Conclusion
Diffraction refers to various phenomena associated with wave propagation such as
bending, spreading and interference of waves passing by an object or aperture that disrupts
the wave. Even though Diffraction always occurs, its affects generally most noticeable for
waves were the wavelength is on order of the diffracting objects. The complex patterns in the
intensity of a diffracted wave are for result of interference between different parts of a wave
that traveled to the observer by different paths.
The angular spacing of the features in the diffraction angle is inversely proportional to
the dimensions of the objects causing the diffraction. The diffraction angles are invariant
under scaling; they depend only on the ratio of the wavelength to the size of the diffracting
object.
The effects of diffraction can be easily seen in everyday life. The closed space tracks
on a CD act as a diffracting grating to form a rainbow pattern we seen when looking at the
disk. Diffraction in the atmosphere by small particles in it can cause a bright ring to be visible
around a bright light source like the sun or the moon. Diffraction can also be a concern in
some technical applications; it sets a Fundamental limit to the resolution of camera, telescope
or microscope.
Interference is the overlapping of two waves. It is a phenomenon which occurs when
two waves of the same nature from different sources meet at the same place. Constructive
interference when ting amplitude is greater than the amplitude of the two waves that results to
the formation of bright region known as the central maximum. On the other hand, Destructive
interference occurs when the crest of one wave overlaps the trough of another wave resulting
to a decrease in amplitude and the formation of dark region known as the central minimum.

References
Book
[1] Halliday, Principles of Physics, 9e., John Wiley & Sons, Inc., Asia (2011).
[2] Young,H., University Physics with Modern Physics 12e., Pearson Education, Inc., San
Francisco (2008)
[3] Mapua Institute of Technology, Physics 4 Lab Manual., Department of Physics., nd.

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