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I.
INTRODUCTION
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)
Transformer nominal
power & frequency
Transformer winding
parameters
Transformer core loss
resistance
16 MVA, 50 Hz
R=.002 pu, L=.08 pu
500 pu
TABLE II
TRAINING PATTERN DATA GENERATION
Condition
system
Voltage angle
Load(MW)
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)
Is Stopping criterion
Satisfied?
No
Increment iteration count
Yes
Display
Output
STOP
Fig.2. Block diagram for Genetic Algorithm
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)
No. of Variables
Population Size
Scaling Function
Selection Function
Mutation Function
Mutation Rate
Crossover Function
Generations
Function Tolerance
TABLE III
GA PARAMETERS
214
1000
Rank
Roulette Wheel
Uniform
0.01
Heuristic
1000
1e-16
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)
IV.
10
Train
Validation
Test
Best
)
e
s
-1
10
m
(
r
o
rr
E
d
e
ra
u 10-2
q
S
n
a
e
M
-3
10
50
100
150
200
250
263 Epochs
Normal
Inrush
Over excitation
Internal Fault
External Fault
0.0018
0.9950
0.0012
1.27e-05
0.0017
0.0011
5.37e-07
0.9976
3.36e-08
0.0011
0.0010
2.43e-05
0.0001
0.9921
0.0010
0.3890
0.0005
0.0003
0.0057
0.4270
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)
Normal
Inrush
Over excitation
Internal Fault
External Fault
8.78e-08
0.9999
3.56e-08
1.28e-11
4.06e-12
3.06e-12
8.20e-09
0.9999
8.15e-08
5.61e-09
5.21e-11
7.41e-15
2.71e-10
0.9999
6.91e-08
1.19e-07
1.37e-13
4.16e-08
9.90e-09
0.9999
V.
CONCLUSION
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REFERENCES
[16]
[17]
[18]
[19]
[20]
[21]
[22]
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)
International Journal of Emerging Trends in Electrical and Electronics (IJETEE ISSN: 2320-9569)