Professional Documents
Culture Documents
e-ISSN: 2455-5703
I. INTRODUCTION
The complexity of VLSI continues to grow; more number of transistors is integrated on a single chip and test data volume has
drastically increased. The testing cost and testing power are two major issues in the current generation integrated chip testing.
Testing cost is related to test data volume. The cost includes a number of parameters, but the major one is the cost of Automatic
Test Equipment proposed by Pranab.K. Nag et al. Such it is difficult to transmit huge test data from ATE to system-on-a-chip
(SOC). The commercial ATEs have limited memory, bandwidths and I/O channel capacity. Testing cannot precede any faster
than the amount of time required to transfer the data:
Test time >= (amount of test data on tester)/ (number of tester channels)*(tester clock rate)
As we can see from the above equation that the test time is directly proportional to the test data hence we can reduce this
test data to reduce testing time proposed by Pranab.K. Nag et al. The testing time of SOC directly impacts the test cost. It is
determined by several factors, including the test data volume, the test required to transfer test data to the cores and the maximum
scan chain length. While test data volume reduction techniques can be applied to soft and hard cores, scan chains cannot modified
in hard (IP) cores. New techniques are therefore needed to reduce the test data volume, decrease testing time, and overcome ATE
memory limitations for SOCs containing IP cores.
Build-in self-test (BIST) proposed by S.Lei et al has emerged as an alternative to ATE-based external testing. It allows precomputed test sets to be embedded in the test sequences generated by on-chip hardware, supports test reuse and at speed testing.
Test data compression offers a promising solution to the problem of reducing the test data volume, special when the cores are not
BIST ready.
The test volume reduction consists of compressing the original test data, storing the compressed data in ATE, and then
decompressing them for restoring the original test volume. Three basic methods for reducing test data compression: proposed by
N.A.Tauba and Abramovici.M et al Code-based schemes, Linear-decompression-based schemes and Broadcast-scan-based
schemes. An alternative approach for reducing test data volume for SOCs is based on the use of data compression techniques such
as: proposed by N.A.Tauba Run length based, Dictionary based, Statistical codes and Constructive codes. In this paper we will
concentrate on run length based codes. The proposed work has been compared with Golomb code was proposed by Priyanka
Kalode et al, AVR was proposed by B.Ye, FDR was proposed by A.Chandra et al, EFDR was proposed by H.Aiman et al and Nine
code compressions was proposed by Usha S. Mehta et al. All these are variable to variable run length code. Golomb code, AVR
and nine code compressions are discussed in details so that there functionality is clear as the proposed work is based on these
codes.
The organization of the rest of the paper is as follows: Section II contains the discussions of Golomb and AVR codes. Section
III contains the discussion of Enhanced compression code (ECC). Section IV contains the Decompression Architecture. Section V
shows some of the Parameter Analysis. Finally section VI shows the Conclusion and Future Work.
452
A2
A3
Run
Group
Tail
Codeword
length
prefix
0
0
00
000
1
01
001
2
10
010
3
11
011
4
01
00
0100
5
01
0101
6
10
0110
7
11
0111
8
001
00
00100
9
01
00101
10
10
00110
11
11
00111
.
.
.
.
Table 1: Golomb coding for M=4.
EXAMPLE:
TD: 00000011111111111100001000100000001111100001 No. of
bits:44, M=4
TE: 1010 000 000 000 000 000 000 000 000 000 000 000 000 100 011
1011 000 000 000 000 1000
Encoded bits=67.
A2
Run
length
1
2
3
4
5
6
7
8
Group prefix
Tail
01
0
1
0
1
00
01
10
11
10
001
Code
word
010
011
100
101
00100
00101
00110
00111
453
9
110
00
10
01
11
10
12
11
13
0001
000
14
001
......
......
20
111
21
1110
000
22
001
.
..
Table 2: AVR code compression.
A3
11000
11001
11010
11011
0001000
0001001
......
0001111
1110000
1110001
..
EXAMPLE:
TD : 00000011111111111100001000100000001111100001
No. of bits: 44
TE : 001011101010010000110101101
No. of bits : 27
Input block
0000 0000
1111 1111
Symbol
00
11
Code word
0
10
3
4
0000 1111
1111 0000
01
10
11000
11001
5
6
7
8
1111 uuuu
uuuu 1111
0000 uuuu
uuuu 0000
1u
u1
0u
u0
11010
11011
11100
11101
uuuu uuuu
uu
1111
454
The second counter of log2 (k+1) bit was used to count the length of the prefix and tail in order to identify the group. The
signals inc and dec2 were used to increment and decrement the counter, respectively.
The FSMs output signal out controlled the toggle of the T flip-flop, and indicated that it had finished decoding runs of 0s or
1s before decoding runs of 1s or 0s according to the binary parameter . Signal v indicated when the output was valid and it
was used to control the scan clock signal scan_clk.
The operation of decoder was expressed as follows:
Step 1: In the initial state, the T flip-flop was reset to 0. Signal en become high and ready to receive data from bit_in.
Step 2: The FSM fed the (k+1)-bit counter with the prefix. The end of the prefix was identified by the separator 0 or 1 according
to code word type. The signal en, shift and inc were kept high until 0 or 1 was received. If the prefix was inverted in the (k+1)
bit counter. For example, if the prefix was 1110, then the data in the (k+1)-bit counter would be 0001.
Step 3: The FSM output, 0s and 1s decrement the (k+1)-bit counter and made the signal dec1 high. It continued it until rs1 is
high. The v signal shows whether the output was high or not. The tail part was again shifted to (k+1)-bit counter, but it was
under the log2 (k+1)-bit counter. It controlled the length of the control word.
455
V. PARAMETER ANALYSIS
Power dissipation is an important problem for the circuit under test. A huge amount of power is dissipated when the circuit elements
switched from logic 1 to 0 and vice versa. Next, we analyzed the testing time when a single scan chain was fed by the AVR decoder.
Test data compression decreased testing time and allowed the use of a low-cost ATE, running at a low frequency, to the core
without imposing any penalties on the total testing time. The efficiency is used to compare the different codes with each other,
where
Efficiency=
TD
100
100
Where TD is the original test data and TE is the data archived after compression.
Nine
code
Combined
AVR and 9C
Area (m)sq
Alternative
variable
runlength code
6866
350
7437
Time (ps)
142
171
381
Gate Count
(m) sq
Power (nw)
6866.334
350.208
7437.132
50165
4688
53191
Table 4: Decompression Results.
456
Circuit
Original number
of bits
FDR % compressed
EFDR
compressed
Golomb
code
compressed
s5378
s9234
23754
39273
48.02
43.59
51.92
45.89
-3.23
36.80
65.7
74.08
s15850
s38417
76986
164736
66.22
43.26
67.99
60.56
63.49
86.01
86.06
96.95
REFERENCES
[1] Abramovici, M., Breuer, M.A. and Friedman, A.D. (1990). Digital System Testing and Testable Design, IEEE press. The
Institute of EEE, Inc.
[2] Aiman, H., El-Maleh, Raslan, H. and Al-Abaji. (2002). Extended Frequency-Directed Run-Length Code with Improved
Application to System-on a-Chip Test Data Compression, Int. Conf: on Electronics, Circuits and Systems, 2:449-452.
[3] Chandra, A., Chakrabarty, K. (2001). Frequency-directed run-length (FDR) codes with application to System-on-a-Chip test
data compression, in Proc. VLSI Test Symp., pp.42-47.
[4] Chandra, A., Chakrabarty, K. (2002). Reduction of SOC Test Data Volume, Scan Power and Testing Time Using Alternative
Run-length Codes, DAC02: Proceeding of the 39th conference on Design automation.
[5] Jin Shang and Liyong Zhang (2013). Test Data Compression Scheme Based on Compatible Data Block Coding, Information
Technology Journal 12(1): 204-208.
[6] Kalamani, C. and Paramasivam, K. (2013). Survey of Low PowerTesting Using Compression Techniques, IJECT Vol 4, Issue
4.
[7] Kalamani, C. and Paramasivam, K. (2014). A Combined Compatible Block Coding and Run Length Coding Techniques for
Test Data Compression, World Applied Sciences Journal 32 (11): 2229-2233.
[8] Lei, S., Hou, X., Shao, Z., Liang, F. (2008). A Class of SIC circuits: Theory and application in BIST design, IEEE Trans.
Circuit system II 55(2) pp. 161-165.
[9] Pranab K. Nag., Anne Gattiker. and Sichao Wei. (2002). Modelling the Economics of Testing: A DFT Perspective, in IEEE
Design & Test of Computers.
[10] Priyanka Kalode and Richa Khandelwal (2012). Test Data Compression Based on Golomb, Signal & Image Processing:
AnInternational Journal (SIPIJ) Vol.3, No.2.
[11] Shurti Chadha and Harpreet Vohra. (2015). Enhanced Compression Code for SOC Test Data Volume Reduction, IJCEM
International Journal of Computational Engineering & Management, Vol. 18 Issue 3, pp. 14-18.
[12] Tehranipoor, M., Nourani, M., Chakrabarty, K. (2005). Nine-coded compression technique for testing embedded cores in
SoCs, IEEE Tranx.Very Large Scale Integr. (VLSI) Syst.13 (6)719-730.
[13] TAUBA, N.A. (2016). Survey of Test Vector Compression Techniques, IEEE transaction Design & Test of Computers, pp.
294-303.
[14] Usha, S. Mehta, Kankar, S. Dasgupta. and Niranjan, M. Devashrayee. (2010). Hamming distance based reordering and column
wise bit stuffing with difference vector: A better scheme for test data compression with run-length based codes, 23rd
International Conference on VLSI design.
[15] Ye, B., Zhao, Q., Zhou, D., Wang, X., Luo, M. (2011). Test data compression using alternative variable run-length code,
Integr.VLSIJ.44 (2)103-110.
457