NANOVEA M1 Hardness Tester

USER GUIDE

6 Morgan, Ste156, Irvine CA 92618 P: 949.461.9292 F: 949.461.9232 nanovea.com

Todays standard for tomorrows materials.
Contents
SECTION 1: ..................................................................................................................................................................5
Getting Started.........................................................................................................................................................5
1.1 System Components................................................................................................................................5
1.1.1 M1-PBASE Platform Base.....................................................................................................................5
1.1.2 M1-PBASE Optional Components ...................................................................................................5
1.1.3 M1-CBASE Compact Base ...................................................................................................................5
1.1.4 M1-CBASE Optional Components ...................................................................................................5
1.1.5 M1-NANOM Nano Module Optional Components ...................................................................6
1.1.6 M1-MICROM Micro Module Optional Components..................................................................6
1.1.7 M1-MACROM Macro Module Optional Components...............................................................6
1.2 Definition of Components .....................................................................................................................6
1.3 Hardware Overview..................................................................................................................................6
1.3.1 M1-PBASE Platform Base.....................................................................................................................6
1.3.2 M1-CBASE Compact Base ...................................................................................................................7
1.3.3 Electronic Control Unit ........................................................................................................................8
1.3.4 PC.................................................................................................................................................................8
1.3.5 Cables.........................................................................................................................................................8
1.4 Installation ...................................................................................................................................................8
1.4.1 Safety Symbols .......................................................................................................................................9
1.4.2 Electrical Specifications .......................................................................................................................9
SECTION 2: ............................................................................................................................................................... 10
Turning System On .............................................................................................................................................. 10
2.1 Start Up ...................................................................................................................................................... 10
2.2 Shut Down ................................................................................................................................................ 10
SECTION 3: ............................................................................................................................................................... 10
INTRODUCTION TO MODULES ....................................................................................................................... 10
3.1 Platform Base Optional Components ............................................................................................. 10
3.1.1 M1-ROT Rotation Table .................................................................................................................... 11

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 3.1.2 M1-LTEMP Sample Heating Stage ................................................................................................ 11
3.1.3 M1 Anti-Vibration Table ................................................................................................................... 11
3.1.4 M1-ERGO Ergonomic Anti-Vibration Workstation.................................................................. 11
3.1.5 M1-ENCL Acrylic Enclosure ............................................................................................................. 12
3.1.6 M1-COMP Air Compressor............................................................................................................... 12
3.1.7 T1-VICE Vice Style Sample Holder................................................................................................. 12
3.1.8 M9-AVIBPAD Gel Vibration Isolator.............................................................................................. 12
3.2 M1-CBASE Compact Base.................................................................................................................... 12
3.2.1 M1-ANPLAT Compact Anti-Vibration Plate ............................................................................... 12
3.2.2 M1-ENCL Acrylic Enclosure ............................................................................................................. 13
3.2.3 T1 VICE Vice Style Sample Holder ................................................................................................. 13
3.3 Modules ..................................................................................................................................................... 13
3.3.1 Nano Module........................................................................................................................................ 13
3.3.1.1 Standard Nano Level Friction Module ..................................................................................... 13
3.3.1.2 Hot Plate ............................................................................................................................................. 14
3.3.2 Micro Module ....................................................................................................................................... 14
3.3.2.1 Non-Contact Depth Sensor ......................................................................................................... 14
3.3.2.2 Acoustic Emission Sensor............................................................................................................. 15
3.3.2.3 Micro Friction Module ................................................................................................................... 15
3.3.3 Macro Module...................................................................................................................................... 15
3.3.3.1 Macro Friction Module .................................................................................................................. 15
SECTION 4: ............................................................................................................................................................... 15
OPTIONAL OPTICAL DEVICES ......................................................................................................................... 15
4.1 Microscope Imaging System.............................................................................................................. 15
4.2 Video Zoom Imaging System ............................................................................................................ 16
4.3 Standard Atomic Force Microscope Module................................................................................ 16
4.4 Extended Atomic Force Microscope Module............................................................................... 16
4.5 3D Non-Contact Optical Profiler Module ...................................................................................... 16
SECTION 5: ............................................................................................................................................................... 17
INTRODUCTION TO HARDNESS TESTER SOFTWARE ........................................................................... 17
5.1 File Menu................................................................................................................................................... 17
5.1.1 File -> New ............................................................................................................................................ 17

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 5.1.2 File -> Open ......................................................................................................................................... 18
5.1.3 File -> Save ............................................................................................................................................ 19
5.1.4 File -> Save As ...................................................................................................................................... 19
5.1.5 File -> Page Setup............................................................................................................................... 19
5.1.6 File -> Print Preview........................................................................................................................... 20
5.1.7 File -> Print........................................................................................................................................... 20
5.1.8 File -> Export To Excel...................................................................................................................... 21
5.1.9 File -> Import From Excel................................................................................................................. 21
5.1.10 File -> Exit........................................................................................................................................... 21
5.2 Instrument Menu ................................................................................................................................... 21
5.2.1 Instrument -> Indenters .................................................................................................................. 21
5.2.2 Instrument -> Stage Controller...................................................................................................... 22
5.2.2.1 Software Joystick............................................................................................................................. 23
5.2.2.2 Force Values ...................................................................................................................................... 23
5.2.2.3 Distance Measurement ................................................................................................................. 24
5.2.2.4 Stage Motion Settings.................................................................................................................... 24
5.2.2.5 Save Camera-Indenter Distance ................................................................................................ 25
5.2.2.6 Indenter Reference ......................................................................................................................... 25
5.2.3 Instrument -> New Hardness Test ................................................................................................ 25
5.2.4 Instrument -> Calibration & Options ........................................................................................... 26
5.2.4.1 Calibration and Options................................................................................................................ 27
5.2.4.1.1 Load Cell Calibration .................................................................................................................. 27
5.2.4.2. Motion Settings ............................................................................................................................. 27
5.2.4.3 Depth and Comp............................................................................................................................ 28
SECTION 6: ............................................................................................................................................................... 29
HARDNESS TEST QUICK GUIDE ...................................................................................................................... 29
6.1 Sample Mounting .................................................................................................................................. 29
6.2 Indenter-Camera Calibration ............................................................................................................. 30
6.3 Test Setup ................................................................................................................................................. 31
6.4 Post-Test Analysis................................................................................................................................... 33
6.5.1 Image Acquisition:.............................................................................................................................. 34
6.5.2 Determining Point of Contact........................................................................................................ 35

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 6.5.3 Hardness Analysis............................................................................................................................... 36
Section 7: .................................................................................................................................................................. 39
System Maintenance .......................................................................................................................................... 39
7.1 Optical System Maintenance ............................................................................................................. 39
7.1.1 Cleaning Microscope Objectives................................................................................................... 39
7.1.2 Replacing / Adding Objectives ...................................................................................................... 39

7.1.2.1 Calibrating Objective Width........................................................................................................ 39

7.2 Indentation System Maintenance.................................................................................................... 40
7.2.1 Diamond Maintenance..................................................................................................................... 40
7.2.1.1 Micro / Macro Diamond Maintenance..................................................................................... 40
7.2.1.2 Nano Diamond Maintenance...................................................................................................... 40
7.2.1.2.1 Using the Area Correction Tool .............................................................................................. 41
7.2.2 Micro / Macro Depth Sensor Maintenance................................................................................ 41

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SECTION 1:
Getting Started

1.1 System Components

The Nanovea Hardness Tester is made up of several components which change depending on
the options and modules purchased for the system. This section covers the components for
the Hardness Tester.

1.1.1 M1-PBASE Platform Base

Platform Base with Integrated Hardware Joystick

Simultaneous Mount of Micro or Macro Module and Nano Module
Motorized X-Y Translation for Work Table
Motorized Z Translation
Gas-Spring Slide
Electronic Control Unit
Acquisition Card
PC (Including USB mouse and keyboard)
Computer Monitor
CD Containing Nanovea Software and System Drivers
Set of Connecting Wires and Cables

1.1.2 M1-PBASE Optional Components

Rotation Table
Sample Heating Stage
Ergonomic Anti-Vibration Workstation with keyboard, monitor, and flexible arms
Acrylic Enclosure for Workstation
Air Compressor for Workstation
Sample Holder VICE Style

1.1.3 M1-CBASE Compact Base

Compact Base
Interchangeable Mount of all Modules
Motorized X-Y translation for work table
Motorized Z Translation
Electronic Control Unit
Acquisition Card
PC (Including USB mouse and keyboard)
Computer Monitor
CD Containing Nanovea Software and System Drivers
Set of Connecting Wires and Cables

1.1.4 M1-CBASE Optional Components

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Compact Anti-Vibration Plate
Acrylic Enclosure for Workstation
Vice Style Sample Holder

1.1.5 M1-NANOM Nano Module Optional Components

Mounting Block
Nano Level Friction Module

1.1.6 M1-MICROM Micro Module Optional Components

Non-Contact Depth Sensor

Acoustic Emission Sensor and Electronics
Micro Friction Mondule
Advanced Acoustic Emission Analysis Software

1.1.7 M1-MACROM Macro Module Optional Components

Non-Contact Depth Sensor

Acoustic Emission Sensor and Electronics
Macro Friction Module
Advanced Acoustic Emission Analysis Software

1.2 Definition of Components

System Base Contains X, Y, and Z stages.

Gas-Spring Slide - Allows vertical adjustment for the indenter tip.
CHR-Axial Chromatism Non-Contact Optical Sensor
Electronic Control Unit Contains power supply (driver) and controller for all motorized axes.

1.3 Hardware Overview

The Nanovea Hardness Testers are available with several options for module selection,
additional sensors, environmental condition monitors, and software packages. This section
focuses on the hardware features. Specific details for the modules and optional equipment
will be covered in Section 3.

1.3.1 M1-PBASE Platform Base

The M1 Platform Base is capable of simultaneously accommodating two modules (a Micro or

Macro and a Nano Module). For module descriptions, see Section 3. The Platform Base
features an integrated hardware joystick for controlling stage motion. The joystick is made up
of six arrows, each controlling stage motion in one direction as well as a knob which controls
the speed of the stage motion.

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WARNING

The joystick should never be used to bring the indenter/scratch/wear tip into contact with the
surface of the surface of the sample. Once the indenter/scratch/wear tip is close to the surface
of the sample, the software joystick should be used to bring the tip into contact with the
surface. Using the joystick to contact the sample surface may result in permanent damage to
the indenter tip or load cell.

The Platform Base also features a Gas-Spring Slide which allows the indenter tip to move up
and down to accommodate samples up to 130 mm (5.11 in) tall.

Note:

The maximum sample weight is 50 lbs (22.6 kg). Exceeding the maximum sample weight will
prevent the stages from moving correctly.

WARNING

Never operate the stage controls while the bellows or panels are removed from the system.
Operating the equipment with removed panels presents a pinch hazard.

In addition to the joystick, the Platform base also features an integrated Emergency Stop
button. When activated, the Emergency Stop button will prevent all stage motion and end a
test in progress.

The Platform Base features an adjustable slide system which enables the user to adjust the
height of the indenter tip. This allows the user to test samples with height differences greater
than 50 mm.

1.3.2 M1-CBASE Compact Base

The M1 Compact Base can accommodate one module at a time. The Compact Base is only
controllable via Nanovea Software.

The height of the indenter can be increased by 22 mm by remounting the Z motor bracket to
the second set of mounting holes.

Note:

Remounting the Z Motor bracket may change the calibration settings of the indentation
system. The height of the indentor tip should only be changed if the 25 mm travel of the Z
motor is insufficient to accommodate a sample. Please test hardness properties of a Fused
Silica sample to verify that the system is still properly calibrated.

WARNING

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If the Z Motor bracket must be remounted to the additional mounting holes, remove the
indenter head to prevent damage to the unit.

1.3.3 Electronic Control Unit

The Electronic Control Unit contains the hardware that controls the motors and relays the data
from the load cell to the data acquisition card on the PC. The Electronic Control Unit, PC, and
all cables connected to them are labeled at both ends to help ensure cables are properly
reconnected if the system must be moved.

Note:

If your M1 Mechanical Tester is equipped with a Nano Module, see Section 3.3.1 for additional
hardware description.

1.3.4 PC

Each Nanovea M1 Mechanical Tester includes a PC preloaded with the Nanovea software for
the indenter modules purchased. The ports on the computer are labeled to help avoid
improper connection to the Electronic Control Unit.

1.3.5 Cables

Each cable is labeled at both ends to reduce the risk of improperly connecting cables.

WARNING

If system must be disconnected, test the stage motion without a sample after reconnecting all
cables correctly.

1.4 Installation

The work area should be chosen by keeping in mind that this instrument has the ability to
measure nanometers of height variation. The base should be placed on a rigid table that is
not influenced by vibrations, or on a vibration-isolation table.
Installation Diagram

Base
Monitor CHR

PC

ECU

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Note:

The installation diagram shows an optional CHR for Non-Contact Depth measurement. If your
indentation system does not include one, omit the CHR unit when installing the system.

1.4.1 Safety Symbols

Product will be marked if hazardous voltages are present

Product will be marked if hot surfaces are present

1.4.2 Electrical Specifications

* All power cords require earth ground from outlet.

Inputs Outputs
CHR Computer Electronic Control Unit
85-263 VAC 110/220 VAC 12 - 48 V
100 W 6.0/3.0 A 0.14-2.1 A (peak)
47-63 Hz 60/50 Hz

Electronic Control Unit Monitor Piezo

100-240 VAC 100-240 VAC 0 - 100V
60/50 Hz 1.5 A 0.14 A (Peak)
5A 60/50 Hz

WARNING

Computer, Motion Control Units, CHR, and all Optional components are labeled with
appropriate input Voltage. Operating equipment at a different input Voltage may result in
permanent damage to the indentation system.

Fuse Replacement

Each control unit contains a 5A/250V fuse that is

removable/ replaceable on the back panel.

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SECTION 2:
Turning System On

2.1 Start Up

In order to be able to use the control and acquisition software for the Nanovea Indentation
system, it is essential that all the system items are correctly connected.
In particular, it is mandatory that the control units for the M1 be switched on before starting
the software.

Start the Macro Indentation, NMHTS, or Nano Indentation program (for Macro, Micro, and
Nano testing, respectively) using their respective icons on the PC desktop, or from the Start /
Programs menu.

Each time the program starts, it automatically launches several initialization operations:

- Verify communication between computer, stage controller, load cell, and depth sensor.
- Verify position of the X, Y, and Z stages.

Initialization may take a few minutes. When initialization is successfully completed, the
NANOVEA interface appears. Otherwise, a warning (or error) message indicates the problem
encountered.

2.2 Shut Down

When not in use for extended periods of time, the NANOVEA software should be closed. After
software has been closed, power off the control unit. By turning off the CHR, when not using
the M1, you will be preventing accidental damage to the system from unintended stage
motion.

SECTION 3:
INTRODUCTION TO MODULES

The Nanovea M1 Mechanical Tester can accommodate several optional components to tailor
the system to suit various test types. Optional Components are available for both the Platform
Base and Compact Base systems.

3.1 Platform Base Optional Components

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The Platform Base may be used with several optional components to tailor the system for
different test configurations.

3.1.1 M1-ROT Rotation Table

The Rotation Table is allows the M1 Mechanical Tester to perform pin-on-disk wear testing.
The table is capable of rotating at 500 RPM for wear testing. The Rotation stage should be
mounted to the X-Y stage such that the electric motor is to the left or right.

Note:

For Nano wear testing, the maximum speed is 100 RPM.

3.1.2 M1-LTEMP Sample Heating Stage

The Sample Heating Stage is ideal for testing material hardness or wear in higher temperature
environments. The stage includes an external controller to set and monitor the temperature
of the stage. It is capable of increasing the stage temperature to 150C. The Sample Heating
Stage is mounted to the X-Y Stage using the included screws. The controller for the heater is
marked with the Proper Input Voltage.

Note:

The Sample Heating Stage is not compatible with the Non-Contact Depth Sensor (Section
3.3.2.1).

Warning

The sample heating stage may be hot after it is shut down. Please ensure that no flammable
materials are placed on or near the stage during or immediately after use.
3.1.3 M1 Anti-Vibration Table

The Anti-Vibration table is a pneumatic vibration isolation table used to reduce noise in test
data caused by introducing vibration to the indentation system. The Anti-Vibration Table
requires the use of an air compressor with a in (6.35 mm) air line. After connecting the air
compressor to the Anti-Vibration Table, the height of the table surface can be adjusted using
the valves under the table.

Note:

For best results, adjust Anti-Vibration Table height with the indentation system on it.

3.1.4 M1-ERGO Ergonomic Anti-Vibration Workstation

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The Ergonomic Anti-Vibration Workstation is added to the Anti-Vibration Table (Section 3.1.3).
The Ergonomic Workstation is used to mount the computer monitor and a keyboard/mouse
tray to the Anti-Vibration Table, eliminating the need for a desk next to the indentation
system. The Ergonomic Workstation is mounted to the leg of the Anti-Vibration Table with
three tapped holes.

3.1.5 M1-ENCL Acrylic Enclosure

The Acrylic Enclosure is used to reduce noise in test data caused by air circulation. The Acrylic
Enclosure is designed to be installed on the Anti-Vibration Table (Section 3.1.3), but may be
used with other Anti-Vibration tables.

3.1.6 M1-COMP Air Compressor

The Air Compressor is a silent compressor which minimizes vibration while pressurizing the
Anti-Vibration Table. The Air Compressor includes the tubing and fittings necessary for use
with the Anti-Vibration Table.

3.1.7 T1-VICE Vice Style Sample Holder

The Vice Style Sample Holder can hold a sample up to 2 in (50.8 mm). The Vice is mounted to
the X-Y Stage using the provided screws. To mount a sample in the Vice, place the sample
between the jaws of the Vice and tighten the thumb screws until the sample is securely
fastened.

Note:

Over-tightening sample vice may cause damage to the threads on the clamp.

3.1.8 M9-AVIBPAD Gel Vibration Isolator

The M9-AVIBPAD Gel Vibration Isolator offers additional vibration isolation for the M1
Indentation system.

Note:
The Gel Vibration Isolator is recommended for all systems, but may be required for
laboratories above the ground level.

3.2 M1-CBASE Compact Base

The Compact Base may be used with optional components to reduce noise in the data.

3.2.1 M1-ANPLAT Compact Anti-Vibration Plate

The Compact Anti-Vibration Plate is used to reduce noise in test data caused by introducing
vibration into the indentation system. The Compact Anti-Vibration Plate must be set on a

12
sturdy and level work surface. The Compact Anti-Vibration Plate is a pneumatic vibration
isolation plate, which requires the use of an air compressor with a in (6.35 mm) air line or the
M1-COMP (section 3.1.6). To adjust the Anti-Vibration Plate, use the air valves located on the
base of the plate. If necessary, increase the input pressure from the air compressor.

WARNING

The maximum air pressure for the Compact Anti-Vibration Plate should not exceed 80 psi (550
kPa)

3.2.2 M1-ENCL Acrylic Enclosure

Refer to Section 3.1.5.

3.2.3 T1 VICE Vice Style Sample Holder

Refer to Section 3.1.7.

3.3 Modules

The M1 Mechanical Tester can accommodate Macro, Micro, and Nano modules. Each of the
modules can be used to conduct scratch, wear, and hardness tests.

3.3.1 Nano Module

The Nano Module is capable applying loads from 0mN to 400 mN. Mechanical Testers
equipped with a Nano Module will also include a second Electronic Control Unit for control of
the piezoelectric controller, Z stage motion, and load cell feedback control. The Nano Module
is equipped with a high resolution capacitor depth sensor. The Nano Module features
interchangeable tips for conducting scratch, wear, or hardness tests. To change the tip, loosen
the set screws on the diamond holder shaft while holding the tip.

Note:

The Capacitor Depth Sensor should be lowered using the included hex-key set before
changing indenter/scratch/wear tip.

WARNING

If load cell must be removed for any reason, remove depth sensor and tip before attempting
to remove Nano load cell. Use caution when handling the load cell.

3.3.1.1 Standard Nano Level Friction Module

The Nano Level Friction Module is an optional component used to measure frictional forces up
to 400 mN during scratch testing. The Friction module is fastened to the X-Y stage using the

13
screws provided. After mounting the friction module, connect the cable to the correct port on
the Electronic Control Unit.

Note:

The Nano Level Friction Module should be removed before conducting indentation tests.

For calibration instructions, see Calibration Annex.

3.3.1.2 Hot Plate

The Hot Plate is used to mount a sample on a Sample Mounting Block using a thermopolymer
adhesive. To use the hot plate, turn the hot plate to an appropriate temperature setting for
the adhesive to be used and place a sample mounting block on the hot surface. Allow the
mounting block to increase in temperature until the thermopolymer adhesive will melt upon
contact. Remove the sample mounting block from the hot plate and carefully affix the sample
to the mounting block using firm pressure and a circular motion. Once air bubbles are
removed, allow adhesive to set and mounting block to cool before conducting tests.

WARNING

The surface of the hot plate and sample mounting blocks placed on the hot plate will be hot.
Use caution when handling sample mounting blocks on the hot plate.

Note:

Additional mounting blocks may be purchased. For details, please contact Nanovea Inc.

3.3.2 Micro Module

The Micro Module is capable applying loads from 0 N to 40 N.

3.3.2.1 Non-Contact Depth Sensor

The Non-Contact Depth Sensor includes a CHR, fiber-optic cable, optical pen, and mounting
hardware. The Non-Contact Depth Sensor is used to precisely measure indenter depth for
depth versus load instrumented indentation tests. The Non-Contact Depth Sensor is required
for microindentation under 300 microns. The data from the sensor is used to calculate the
Rockwell hardness of materials. The CHR must be connected to the optical pen with the fiber-
optic cable and to the computer using the provided data cable.

Note:

The fiber-optic cable is fragile and must be handled with care.

14
Note:

The Non-Contact Depth Sensor requires the Nanovea 3D software upgrade

3.3.2.2 Acoustic Emission Sensor

The Acoustic Emission Sensor includes all hardware necessary for mounting the sensor and
communication with the PC. The sensor is mounted near the diamond holder for the load cell.
The Acoustic Emission Sensor allows measurement of the acoustic activity. Extra Acoustic
Emission sensors and cables are available. An optional software package is available for
advanced Acoustic Emission analysis.

3.3.2.3 Micro Friction Module

The Micro Friction module measures the tangential forces up to 40N during scratch testing.
The Friction module is fastened to the X-Y stage using the screws provided. After mounting
the friction module, connect the cable to the correct port on the Electronic Control Unit.

For calibration instructions, see Calibration Annex.

3.3.3 Macro Module

The Macro Module may be used with the same optional components as the Micro Module
(Section 3.3.2).

3.3.3.1 Macro Friction Module

The Macro Friction Module measures the tangential forces up to 200N during scratch testing.
The Friction module is fastened to the X-Y stage using the screws provided. After mounting
the friction module, connect the cable to the correct port on the Electronic Control Unit.
For calibration instructions, see Calibration Annex

SECTION 4:
OPTIONAL OPTICAL DEVICES

The M1 Mechanical Tester has several imaging systems available for use. Imaging devices can
be chosen to suit various testing needs.

Note:

Nano indentations may not be visible in hard materials using microscope imaging system.

4.1 Microscope Imaging System

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The Microscope Imaging System includes a video card, color video camera, and a polished
copper sample for position calibration. The Microscope Imaging System is only available for
systems with the Platform Base. The Microscope is used both for observation of indentation
and calculating the Vickers hardness of a sample. The Microscope system can accommodate
five standard or long working distance microscope objective lenses simultaneously. 5x, 10x,
20x, 50x, and 100x standard objective lenses or polarized long working distance objective
lenses are available for purchase. The Microscope system has a gas-spring slide for coarse
focus adjustment and a knob for fine focus adjustment.

4.2 Video Zoom Imaging System

The Video Zoom Imaging System includes a 12x Ultrazoom lens with coaxial lighting, a 1x
magnification adapter, color video camera, and a polished copper sample for calibration. The
imaging system can be used for observation or calculating the Vickers hardness of a test
sample. The Video Zoom Imaging System can accommodate one standard microscope
objective at a time. 5x, 10x, 20x, 50x, and 100x objective lenses are available for purchase.

Note:

Recalibration of the optical system is required if objective lenses are changed.

4.3 Standard Atomic Force Microscope Module

The Standard Atomic Force Microscope Module includes an SPM S50 Controller, SH B110 Scan
Head, Camera, Large Scan Sample Kit, Micrometer, replacement probe tips, required cables,
hardware, and basic analysis software. To install the Atomic Force Microscope, carefully align
the AFM Module with the Precision mount then slide the AFM until it is flush with the top of
the precision mount. After the AFM is secured by the magnets on the precision mount, close
the latch to prevent accidental removal of the unit. For detailed instructions on changing
cantilever tips, see the included manual.

4.4 Extended Atomic Force Microscope Module

The Extended Atomic Force Microscope Module includes an SPM 200 Controller, SHB110 Scan
Head, Camera, Large Scan Sample Kit, Cantilever Replacement Probe Tips, Cantilever Tap
Replacement Probe Tips, required cables, hardware, and basic analysis software. To install the
Atomic Force Microscope, carefully align the AFM Module with the Precision mount then slide
the AFM until it is flush with the top of the precision mount. After the AFM is secured by the
magnets on the precision mount, close the latch to prevent accidental removal of the unit. For
detailed instructions on changing cantilever tips, see the included manual.

4.5 3D Non-Contact Optical Profiler Module

The 3D Non-Contact Optical Profiler Module includes a CHR150 Controller and basic analysis
software. The Optical Profiler Module can accommodate optical pens with 130 m, 400 m,
1.2mm, 3.5 mm, 12 mm, and 27 mm measurement ranges. To install the optical pen, connect
the fiber-optic cable to the pen, then pass the cable through the optical pen mounting

16
bracket. Secure the optical pen in the bracket using the provided tools. After the optical pen
is secured, connect the fiber-optic cable to the CHR.

Note:

Please let the CHR warm up for fifteen minutes before conducting first test. The CHR will
output noise if it is not warmed up.

SECTION 5:
INTRODUCTION TO HARDNESS TESTER SOFTWARE

The Nanovea Indentation software is used for controlling the M1 system with Platform or
Compact Base. This part of the manual provides a brief overview of the various software
functions, each of which is described in detail in the next section.

The Hardness tester software has five menus for data management, test setup, and data
analysis. The items in the menus are covered in this section.

5.1 File Menu

The File Menu is used to access options for data management.

5.1.1 File -> New

Clicking File -> New creates a new test container. Test containers are used to store test data.
Test containers can be used to organize test data by sample type or test date for analysis
purposes.

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5.1.2 File -> Open

Clicking File -> Open opens a previously saved test container for. Once opened, new test data
may be added to test containers. Only hardness tester files (.mht files) may be opened in the
hardness testing software via the Open menu item.

Note:

Test containers may also be opened by dragging the data files to the hardness tester software
window.

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5.1.3 File -> Save

Clicking File -> Save saves any changes made to the selected test container. Each test
container must be saved manually. Be sure to save after last test. Hardness tester files may
only be saved with the .mht file extension.

5.1.4 File -> Save As

Clicking File-> Save As saves the selected test container as a new file. This allows the user to
save data files to multiple locations or rename test containers with new data added.

Note:

Both the Save and Save As items are applied only to the active test container. Attempting to
close a group container without saving changes will prompt a warning to avoid possible loss
of data

5.1.5 File -> Page Setup

Clicking File -> Page Setup allows you to select the paper size, report orientation, set your
margins, and configure available printers.

19
5.1.6 File -> Print Preview

Clicking File -> Print Preview opens an image of the report for the selected test as it will appear
once printed.

5.1.7 File -> Print

Clicking File -> Print prints the selected test in landscape format.

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5.1.8 File -> Export To Excel

Clicking File -> Export to Excel exports the selected tests data into a .csv file (Comma-
Separated Values format).

5.1.9 File -> Import From Excel

Clicking File -> Import From Excel imports data saved in .csv format for hardness analysis.

5.1.10 File -> Exit

Clicking File -> Exit closes the hardness tester software.

5.2 Instrument Menu

The instrument menu is used to control the stage motion of the indentation system, select
information for analysis report population, and calibrate optical and motion settings.

Note:

The software has been designed to simplify the user experience with the instrument. Several
security measures have been incorporated with the software to minimize the possibility of
damage due to improper use. Youll receive warnings any time limit switches are triggered,
maximum forces are exceeded, or the emergency stop button is pressed. These warnings will
immediately halt all motion until cleared.

5.2.1 Instrument -> Indenters

Clicking Instrument -> Indenters opens a window where the indenter tips can be selected or
entered. The indenter tip selected will appear in the report generated after performing
hardness analysis.

Note:

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When adding an indenter tip, select the indenter type using the dropdown menu and enter
information from the indenter tips packaging into the remaining fields. The Nanovea
hardness tester uses the hardness calculation method outlined in ASTM E2546-07. Failure to
enter information or select the indenter tip in use will result in erroneous hardness
calculations.

5.2.2 Instrument -> Stage Controller

Clicking Instrument -> Stage Controller opens the stage controller window. The Stage
controller window is used to monitor and control stage motion before a test is conducted.

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5.2.2.1 Software Joystick

The software joystick is used to control the motion of the Stages.

Warning

Using the stage controls to bring the indenter into contact with the sample may result in
damage to the indenter. In order to minimize the risk of damaging the indenter, please set the
speed control (Section 5.2.2.4) to the minimum value when the indenter tip is close to the
sample surface.

5.2.2.2 Force Values

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5.2.2.3 Distance Measurement

5.2.2.4 Stage Motion Settings

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5.2.2.5 Save Camera-Indenter Distance

Once the calibration has been stored then Move to Microscope and Move to Indenter will
use the stored distance to move accurately between positions.

Note:

Always ensure there is enough clearance between sample and indenter or microscope to
prevent any damage to the sample and the system.

5.2.2.6 Indenter Reference

5.2.3 Instrument -> New Hardness Test

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Clicking Instrument -> New Hardness Test opens the New Hardness Test window. This
window is used to input the sample name and desired test parameters such as maximum load,
contact load, and the approach speed of the indenter tip.

5.2.4 Instrument -> Calibration & Options

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Clicking Instrument -> Calibration & Options opens the Calibration window. This window is
used to calibrate the hardness tester.

WARNING

Avoid making any changes in these tabs unless instructed by Nanovea Inc. Unnecessary
changes may uncalibrate the system, causing erroneous test data and/or results.

5.2.4.1 Calibration and Options

The Calibration and Options tab contains the force coefficients, data acquisition rate, stage
speed, and hardware communication s settings. The values for each field may be changed
manually.

Note:

To calibrate the load cell, a scale is required that can measure 500 mN, 50 N, or 250 N for the
nano, micro, or macro modules respectively.

5.2.4.1.1 Load Cell Calibration

To calibrate the load cell, place a scale on the X-Y stage, click Calibrate Sensor, and follow the
instructions on the prompt. For the nano load cell, the load applied must be manually entered
into the text box.

5.2.4.2. Motion Settings

The Motion Settings tab displays the PID coefficients for the stages and motor backlash. These
values can be changed manually.

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5.2.4.3 Depth and Comp

The Depth and Comp tab contains instrument calibration factors. These values are unique for
each instrument.

WARNING

Avoid making any changes in these tabs unless instructed by Nanovea Inc. Unnecessary
changes may uncalibrate the system, causing erroneous test data and/or results.

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SECTION 6:
HARDNESS TEST QUICK GUIDE

This section should be used as a step by step guide to conducting hardness tests. Please read
the entire users manual before attempting to conduct hardness tests or operate the M1
Indentation System.

6.1 Sample Mounting

The stage should be directly under the microscope in order to allow easy access and extra
clearance for sample mounting; use Move to Microscope if needed.

Note:

Always ensure there is enough clearance between sample and indenter or microscope to
prevent any damage to the sample or the indentation system.

After the sample is under the microscope, release the microscope lock for easy access to stage
and sample.

Note:

Compact base systems are not equipped with the microscope assembly mentioned; however,
the same result can be achieved by raising the Ultrazoom camera as high as possible.

Place sample on stage, and using the clamps and screws provided in accessories box, clamp
the sample down in at least 2 corners, 4 are preferable. The sample must be firmly clamped to
prevent any movement during testing. Any movement will be seen as an error in the results.

29


Note:

If your system is equipped with a sample vise, you may secure the sample in the vice without
the included clamps and screws.

6.2 Indenter-Camera Calibration

The indenter to camera calibration must be completed prior to any testing in order to be able
to view the indent and acquire images. (Use a soft polished material for best results;
calibration samples work best).
Begin by mounting sample, opening up the Stage Controller window and replacing
the microscope to its original ready and locked position, close to sample.
Focus objective on sample surface. Try to select a clean, smooth and distinguishable
area, such as a corner. This will allow user to find the indent much quicker and easier.
Once area has been selected select Move to Indenter from the Stage Controller
window. If distance falls short or long, which it will most likely happen the first time of
calibration, try moving as close as possible to the original distinguishable area by
using the joystick.

Note:

Make sure there is enough room for the sample to move without interfering with the objective
in use
Using the joystick, either hardware or software, move the Z-axis down towards sample
as close as possible without making any contact.
Before indenting, Reset the X and Y axes to zero in the Stage Controller window.

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 Using the software joystick, move the Z-axis down slowly while monitoring the Normal
Force display. When contact with the surface is made, continue moving the Z-axis
down slowly until the Normal Force display reads approximately 300mN.

Move indenter up, making sure that there is enough clearance between the sample
and both the indenter and microscope. Click on Move to Microscope to search for
indent and record the distance calibration values.
Once under the microscope, focus on the surface of the sample and find the indent.
This is why it is recommended to indent in a distinguishable area.
After finding the indent, copy and paste the values in the Distance Measurement
area onto the Save Camera-Indenter Distance area in the Stage Controller window.

Click on Save & Config.

A new window called Stage Position will pop-up; select Microscope and click OK.

6.3 Test Setup

After Calibrating the camera position, open the stage controller and click Move to
Indenter.
Verify that the stage or sample will not hit the objective(s) or the indenter, then click
ok if the stage is clear.
Lower the indenter tip to the sample, making sure the indenter tip is not contacting
the surface of the sample.
Using the software joystick, lower the indenter tip slowly until the load cell registers a
load.
Raise the indenter tip until the load is no longer read by the load cell, then zero the Z
position.
Raise the Z Stage by 10-20 m, then move the X or Y stage 50 m and lower the Z
stage back to the 0 position.

Note:

31
Conducting tests too close to each other will alter the hardness results calculated by the
software. For best results, move the indenter tip in the X or Y direction 5 times the depth of
the previous test.

Select File> Instrument> New Hardness Test and enter the desired test parameters.

WARNING

Do not exceed the maximum load outlined in Section 3 for your module. Doing so may
permanently damage the load cell and/or indenter tip.

Note:

For the nano module, the minimum load is 0.5 mN, the minimum loading rate is 0.05 mN/min,
and the maximum loading rate is 2000 mN/min.

Note:

For the Micro and Macro Modules, the minimum load is 0.5 N. The minimum loading/
unloading rate is 0.5 N/min and the Maximum loading rate is 3 times the desired test load.

Note:

Choosing a high loading rate may result in insufficient data for hardness analysis.

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If Drift Compensation is selected in Instrument> Drift Compensation, the Calculating Drift
window will appear after a test is started. During the first 60 seconds, a stabilization reading is
taken. This is followed by another 60 second countdown where the drift is calculated. Drift
Compensation calculates the variation in the depth sensor over the 60 second time frame,
allowing for more accurate results.

During a test, all instrument functions are disabled via a pop-up window displaying a gear
image. The Stop button is the only functional button during a test. The stop button will halt
a test immediately. Once the indent is complete the instrument retracts the indenter to its
starting position. Upon completion of motion the pop-up window disappears and enables
all instrument functions.

6.4 Post-Test Analysis

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6.5.1 Image Acquisition:

To analyze your results move under the microscope.

Make certain that there is enough clearance between the sample to the microscope
and indenter.
Click on Acquire image, on bottom right hand corner of graph window.
Second windows labeled Image Acquisition will pop-up. This window will have an
independent joystick to navigate the stages.
Save desired images with correct label and objective being used, for future reference.

Note:

All acquired images are stored and labeled in the test graph window.

Note:

Indents on hard materials may not be visible with the microscope when using the nano
module.

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6.5.2 Determining Point of Contact

Selecting the correct contact point is a critical step in the analyzing the results. Click on Select
Contact on the bottom right hand corner of graph window. A window labeled Select
Contact will pop-up. Although the contact point may look accurate, this must be verified by
dragging and zooming into the area around the initial contact.

35
The contact point must be selected where it is evident that the load is increasing for the test.

6.5.3 Hardness Analysis

36
The hardness should be analyzed after the Point of Contact has been selected.
Once the point of contact has been selected, click View > Hardness Analysis.

The Hardness Analysis window will open. Begin by selecting the correct indenter
(upper right hand corner) and proceed to adjust the Percent value in order to
accurately select the correct unloading points.
Making the Percent value larger or smaller will dictate where the red line lies.

Note:

The red line should be as flush to the blue unloading curve as possible. The points where
the red and the blue line are overlapped are the points that will be used for the hardness
analysis.

Once the lines are accurately adjusted, the Hardness Values, to the left of the window,
will have changed accordingly. (See Pictures below)

Note:

If samples were included with your system, the hardness and elastic modulus values for steel
and brass samples are written on the containers included with the samples. For the micro and

37
macro modules, the stainless steel sample has a hardness value 8.0 .04 GPa and an elastic
modulus of 230.0 11 GPa For the nano module, the fused silica sample has hardness value
9.4 0.4 GPa and an elastic modulus of 71.3 1.5 GPa when tested at a load of 80 mN.

Pre-Analysis

Post-Analysis

Once values are adjusted click Save to store values in graph window.

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Section 7:
System Maintenance

7.1 Optical System Maintenance

The maintenance of the optical system is not essential for conducting hardness testing,
however, it will provide more clear images for reporting purposes.

7.1.1 Cleaning Microscope Objectives

All of the microscope objectives may be cleaned using a lint-free cloth and isopropyl alcohol.
To clean the objectives, raise the microscope to its maximum height, wet the cloth with
isopropyl alcohol, and gently wipe the objective lens with a gentle circular motion.

7.1.2 Replacing / Adding Objectives

To replace or add additional objective lenses to the optical system, screw the objective into
the microscope by hand, making sure to tighten the objectives carefully. After installation,
clean the objective using the procedure in section 7.1.1.

7.1.2.1 Calibrating Objective Width

After changing an objective lens, the objective width may be calibrated, so that scale on the
stage controller displays a reference size. To calibrate an objective, a microscope micrometer
must be placed on the X-Y stage. Once the micrometer is oriented correctly, the width of the
objectives field of view can be measured using the markings of the micrometer. To measure

39
the width, click Instrument> Calibrate Objectives and select the appropriate magnification for
the objective. Enter the width of the objective in the blank field.

7.2 Indentation System Maintenance

The indentation system maintenance covers maintenance of the diamond and the non-
contact depth sensor (micro and macro only).

7.2.1 Diamond Maintenance

7.2.1.1 Micro / Macro Diamond Maintenance

If your diamond does not give the correct hardness values for the included stainless steel
sample, the diamond may be worn or damaged. In either case, the diamond should be
replaced. To determine whether a diamond is damaged or worn, place a copper or brass
sample on the X-Y stage and apply 50% of the maximum load for your system. Next, view the
indentation under the microscope and verify that the indentation has sharp corners, both on
the sample surface and into the material. If the shape is incorrect or the corners are not sharp,
the tip must be replaced. If not, call Nanovea Inc. for support.

Note:
For scratch tips, this procedure can be conducted, but the tip of the indenter should be round,
rather than square.

7.2.1.2 Nano Diamond Maintenance

If your diamond does not give the correct hardness values for the included silica sample, the
diamond may be worn or damaged. In either case, the diamond should be replaced. To
determine whether a diamond is damaged or worn, place the silica sample on the X-Y stage
and then click Help> Calibration test, then select the Area Correction radio button, then start
test.

The area correction test will conduct a large number of tests at varying loads. After the area
correction test is completed, you must select the contact point and conduct a hardness
analysis for each test. After selecting all contact points and analyzing each test, save the test
container, click Help> Area Correction Tool. A window will open prompting you to select the
indenter used. Select the indenter used to conduct the test. Next, you will be prompted to
select the file containing the Area Correction Test hardness analysis. Locate and select the
saved test and open it. A new window will open containing several Load Vs. Depth plots for
the area correction test. Uncheck and recheck one of the checkboxes on the left pane, then
analyze the data on the right pane. The data points for a worn tip will appear grouped in
sections for each load above 20 mN in the area correction test. A bad tip will yield more
scattered data points.

Note:
Area Correction tests must be conducted when there is little to no movement in the room
where the system is located. This test is most successful when run overnight.

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7.2.1.2.1 Using the Area Correction Tool

The Area Correction Tool is used to compensate for the difference in shape between the
perfectly shaped indenter tip and the tip installed on your system. The Area Correction Tool
does this by calculating the contact area of the indenter and comparing the calculated area to
the ideal contact area. To calculate the difference, the tool calculates a best-fit curve using the
measured data points to approximate the error introduced by the indenter tip. After opening
the tool, selecting the indenter, and selecting the area correction test, a window will open with
the Load Vs. Depth plot from each test of the Area Correction test container. Next, you must
remove the invalid tests by deselecting test data sets in the left pane. Invalid tests are outliers
in the plot of A/AI Vs. Depth in the right pane. Once the outliers are removed, you may adjust
the best-fit curve by changing the degree of the polynomial that best approximates the
measured test value.

Note:
The data points above 20 mN should approach a A/Ai value of 1. For worn tips, this may vary,
however, the tool can be used to compensate for a worn tip as well.
7.2.2 Micro / Macro Depth Sensor Maintenance

If a message opens that states the maximum acquisition rate is greater than 100 Hz after
taking a dark signal for the depth sensor, the fiber-optic cable must be cleaned. To clean the
cable, remove the end from the sensor, carefully pull back the protective metal cover, then,
wipe with a lint-free cloth and isopropyl alcohol using a circular motion. Reconnect the fiber-
optic cable and take another dark signal. If the same message appears, contact Nanovea Inc.
for support.

If the sensor displays a lamp error message, verify that the sensor is still outputting light. If
not, replace the light bulb .

7.2.2.1 Replacement of Bulb/Lamp

The (halogen) bulb/lamp is the only part in the CHR that is subject to wear. The bulb has a
lifetime of about 1,000 hours, which is why it is a good idea to turn off the CHR when it is not
in use for extended periods (overnight). When the bulb is no longer good, the CHR will display
the following text on the front LCD panel: Lamp problem change/adjust lamp. This
indicates that there is a problem with the bulb/lamp and it most likely needs to be changed,
using the following steps:

Turn off power to CHR and disconnect the power cord. We recommend letting the CHR cool
off for about 10 minutes before opening it, as the light bulb can be hot.

Remove the two screws, as shown in picture to

the left.

41
 Slide out light bulb compartment.

Unscrew large thumbscrew and pull off cover.

Remove old bulb and replace with the new bulb.

Be careful not to touch new bulb with bare hand
(use tissue).

Adjust the position of bulb so that the filament lines

up with the fiber input (small ceramic disc with hole
in center).

42