INSE 6220 Formula Sheet Midterm Exam

Descriptive Statistics: Hypothesis Testing:

Pn
Sample mean: x = n1 i=1 xi Two-tailed Upper-Tailed Lower-Tailed
Sample median: x(1) , . . . , x(n) is the ordered sample Hypotheses: H0 : = 0 H0 : = 0 H0 : = 0
x +x
Q2 = x(k+1) if n = 2k + 1 and (k) 2 (k+1) if n = 2k H1 : 6= 0 H1 : > 0 H1 : < 0
First quartile: X 0
Q1 divides the bottom 25% of the sample from the top 75% Test Statistic (z-test): Z0 =
/ n
Third quartile: Two-tailed Upper-Tailed Lower-Tailed
Q3 divides the bottom 75% of the sample from the top 25% Critical Regions:
|z0 | > z/2 z0 > z z0 < z
Interquartile range: IQR = Q3 Q1 Two-tailed Upper-Tailed Lower-Tailed
Sample mode: value occurring most frequently in data. p-values:
2[1 (|z0 |)] 1 (z0 ) (z0 )
Sample range: R = x(n) x(1)
Sample variance: s2 = n1 1
Pn
)2 X 0
i=1 (xi x Test Statistic (t-test): T0 =
Graphical representation of data: Dot plot, boxplot, Pareto S/ n
chart, steam-and-leaf diagram, normplot... Two-tailed Upper-Tailed Lower-Tailed
Critical Regions:
|t0 | > t/2,n1 t0 > t,n1 t0 < t,n1
Probability Distributions:
Two-tailed Upper-Tailed Lower-Tailed
E(aX + b) = aE(X) + b and V ar(aX + b) = a2 V ar(X). p-values:
2[1 F (|t0 |)] 1 F (t0 ) F (t0 )
Binomial distribution:
X bino(n, p) with E(X) = np and V ar(X) = np(1 p) Type I error: is the error of rejecting H0 when it is true.
Poisson distribution: Type II error: is the error of accepting H0 when it is false.
X poiss() with E(X) = V ar(X) = Control Charts:
Uniform distribution: Western Electric rules:
(ba)2
X unif (a, b) with E(X) = a+b 2 and V ar(X) = 12 Rule 1: A point falls outside the upper and lower control
Normal distribution: limits, i.e. above U CL or below LCL
X N (, 2 ) with E(X) = and V ar(X) = 2 Rule 2: Two out of three consecutive points fall above
Standard normal distribution: Z = X
N (0, 1) + 2 or below 2
z/2 = 1 1 2 . For = 0.05, z/2 = 1.96


Rule 3: Four out of five consecutive points fall above
Normal approximation
 to binomial:
 + 1 or below 1
x+0.5np

P (X x) . Rule 4: Eight or more consecutive points fall above or
np(1p)
Exponential distribution: below
X exp() with E(X) = 1 and V ar(X) = 12 Rule 5: Eight or more consecutive points move upward (in-
Chi-Squared distribution: creasing) or downward (decreasing) in value.
X 2 (n) with E(X) = n and V ar(X) = 2n Control Chart for the Mean (X-chart):
Students t-distribution: U CL = x + A2 r CL = x LCL = x A2 r
n
X t(n) with E(X) = 0 and V ar(X) = n2 Control Chart for the Range (R-chart):
F -distribution: X F (n1 , n2 ). U CL = D4 r CL = r LCL = D3 r
Control Chart for the Standard Deviation (S-chart):
Sampling Distributions:
X
N (0, 1)
U CL = B4 s CL = s LCL = B3 s
Z = / n
2 Control Chart for the Mean (from s):
(n 1) S2 2 (n 1) + A3 s A3 s
U CL = x CL = x LCL = x
X

t= S/ n
t(n 1) R S
Unbiased estimators of are:
= d2 or
= c4
S 2 / 2
F = SX2 /X2 F (n1 1, n2 1)
Y Y
Process Capability Analysis:
Confidence Intervals: Process capability potential: Cp = U SLLSL
6

100(1 )% confidence interval on with known variance:
Upper capability index: CpU = (U SL X)/(3 )
z/2 n x
x + z/2 n
Lower capability index: CpL = (X LSL)/(3 )
100(1 )% confidence interval on with unknown variance:
Process capability index: Cpk = min(CpU , CpL )
t/2,n1 sn x
x + t/2,n1 sn
Fraction non-conforming: p = 1 P (LSL < X < U SL).
100(1 )% confidence interval on 2 :
(n1)s2 2 Case 1: If Cpk < 1, the process in not capable.
2 2(n1)s
2 /2,n1 1/2,n1 Case 2: If Cpk 1.33, the process in highly capable.
100(1 p)% confidence interval on p:p Case 3: If 1 Cpk < 1.33, the process in barely capable.
p z/2 p(1 p)/n p p + z/2 p(1 p)/n