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Surfaces in Precision Engineering, Microengineering and Nanotechnology

1 2 3 4
L. De Chiffre (1), H. Kunzmann (1), G.N. Peggs (1), D. A. Lucca (1)
1 2
Technical University of Denmark, Denmark, Physikalisch-Technische Bundesanstalt, Germany,
3 4
National Physical Laboratory, United Kingdom, Oklahoma State University, USA

Abstract
This paper addresses the role of surfaces at the micrometric and nanometric length scales. Applications,
functional behaviour, and manufacturing issues are reviewed with respect to state-of-the-art and emerging
products fabricated using high precision technologies. Examples of surfaces obtained with precision
engineering, microengineering and nanotechnology are presented, encompassing surfaces in computers,
MEMS, biomedical systems, light and X-ray optics, as well as in chemical systems. Surface properties at
micro and nanoscale are considered, including geometry as well as physical and chemical properties.
Different manufacturing processes are reviewed with respect to surface fabrication, encompassing
conventional machining, microfabrication, and nanomanipulation. Surface metrology at micro and nanoscale
is briefly addressed, and its fundamental importance strongly emphasized.

Keywords: surface, precision engineering, microengineering, nanotechnology

The authors thank the following contributors: at micro and nanoscale are considered, including
(* indicates CIRP member) geometry as well as physical and chemical properties. The
paper contains a review of the different manufacturing
P. Bariani, Denmark processes, with respect to surface fabrication,
N.J. Bjerrum, Denmark encompassing conventional machining, microfabrication,
K.D. Bouzakis*, Greece and nanomanipulation. Surface metrology at micro and
E. Brinksmeier*, Germany nanoscale is briefly addressed.
F. Christensen, Denmark
J. Corbett*, UK Table 1 gives a schematic overview of applications,
H.N. Hansen*, Denmark functional behaviour, and manufacturing technologies that
N. Ikawa*, Japan are considered in this work with respect to surfaces.
T. Inamura*, Japan
M.J. Klopfstein, USA A number of keynote papers published by CIRP during the
L. Koenders, Germany last few years [1-5] provide the baseline for the paper.
R. Krger-Sehm, Germany Surface metrology has been the subject of the 2002
J.K. Nrskov, Denmark keynote paper [5] but is not extensively considered in this
M. Tricard, USA paper, though its fundamental importance is emphasized.
K.J. Weinmann*, USA

1. INTRODUCTION Examples of Fabrication


Functions
applications technologies
Surfaces act as interfaces governing the functional
behaviour of a product. Often, the behaviour controlling Computer Optical Machining
mechanisms involve surface details on a micrometre or chips Fluid dynamic Masking
nanometre scale. Many emerging products are based on Data storage Tribological Replication
achieving these small scales, as is the case in precision MEMS Biomedical Deposition
engineering, microengineering, and nanotechnology. Biomedical Mechanical Manipulation
systems Chemical Other
This paper considers the role of surfaces at the Micro-optical Aesthetic
micrometric and nanometric length scales. It contains a systems Other
review of important applications involving surfaces, X-ray optics
considering properties and functional behaviour, as well Fuel cells
as manufacturing issues, with respect to state-of-the-art Implants
and emerging products fabricated using high precision Other
technologies. A number of examples of surfaces obtained
with precision engineering, microengineering and
nanotechnology are presented, encompassing surfaces in Table 1: Examples of applications, functional behaviour,
computers, MEMS, biomedical systems, light and X-ray and high precision manufacturing technologies concerning
optics, as well as in chemical systems. Surface properties surfaces.
2. SURFACES IN PRECISION ENGINEERING, some issues regarding their manufacturability and wear
MICROENGINEERING AND resistance are not yet solved.
NANOTECHNOLOGY

2.1 Surfaces in computers and peripherals


The tremendous impact of computer technology has
become possible because of the progressive downscaling
of integrated circuits and storage devices. The smallest
features of the most modern integrated circuits are
already significantly smaller than 1 m, and the scale
reductions in storage media are equally impressive.
Commercial magnetic storage has now reached a density
of 400 million bits per square centimetre. This
corresponds to a square single-bit size of 500 nm side
length [6]. Considering that the critical dimension for
electronic devices needs to shrink down to 22 nm in the
year 2016, the fabrication of nanostructures has become
a technologically important research area [7].

The magnetic properties of a computer hard disk are Fig.1: Typical stiction problems in MEMS. (a)
influenced by a surface region several nanometres thick. Micromachine stiction during release-etch process; (b)
In order to minimize head stiction to the disk surface, stiction between overdriven suspended mass
surface polishing is followed by a texturing process accelerometer and limit stop [8].
producing circumferential grooves or laser texturing, the
overall roughness of the structured surface being Rq = 3- Stiction in MEMS is the main problem from an industrial
5 nm [5]. point of view, while wear debris due to tight clearances and
contact fatigue can be of concern in dynamic devices such
2.2 Surfaces in microelectromechanical systems as micromotors.
(MEMS)
In MEMS devices free-standing micrometre and sub- 2.3 Surfaces in biomedical systems
micrometre sized structures are realized on the surface of Miniaturization of medical diagnostic tools promise cost
a polished silicon wafer by bulk or surface reductions owing to the volume scaled reagents
micromachining. These structures are not just the consumption, time saving (diffusion time dependence),
projection of a two dimensional feature into the depth, but improved reliability and ease of use. Concepts such as bio
truly three dimensional [8]. Very often these structures compatibility in implanted chips, bio-recognition, cross
have to be movable like the cantilever used to support the contamination and bio-fouling in analytical systems,
seismic mass of an accelerometer or microscale wetting properties and electrophoresis in micro-channels
mechanisms realized by IC compatible processes. MEMS often determine device success. Ultimately all these
are characterized by small masses, tight functional factors depend on interactions at the surface. Recently
tolerances, smooth surfaces and light loads. Surface there has been a strong trend toward high aspect ratios
mechanisms are then of tremendous importance in structures because they are capable of achieving a higher
determining their reliability. A major issue in MEMS is active surface area per unit substrate surface area. This is
stiction, as illustrated in Fig. 1. Removal of a silicon oxide particularly important for chemical and biomedical
sacrificial layer is accomplished by wet HF etching. During applications, which offer the possibility of higher packaging
the subsequent drying operation some shrinking drops densities of microstructural elements and higher
may, due to their surface tension, bend the free standing throughput in continuous flow systems. In biomedical
polysilicon structure down to the substrate. There, a devices, where cells are present, interactions at the
permanent adhesion occurs and the device functionality is surface involve biologic functional units ranging from water
compromised, Fig. 1(a). Stiction may also occur at any molecules and small proteins at sub-nanometre size to
time during normal operation, as a result of an overdrive cells in the micrometre range. Protein adsorption
or handling, Fig. 1 (b). Adhesion forces are indeed often mechanisms on a synthetic surface play a fundamental
stronger than ones obtained by actuation. Single role in determining cell adhesion [10]. Many
mechanisms and their relative contribution in determining microfabricated diagnostic tools are under development.
the total stiction force have been discussed in [8]. Several studies show the possibility of manufacturing
Reduction of adhesion and friction forces at interfaces three-dimensional microstructures both in silicon and
may be achieved by modifying surface chemistry or polymeric materials to form microprobe arrays [11]. Aspect
topography. Tribological coatings, well known in the area ratios up to 100:1 are obtained using the SU-8 photoresist
of mechanical engineering have an interesting potential [12]. In lab-on-chip applications, surface chemistry plays a
as tribologically optimized surfaces for micro parts. double role. In certain areas protein adsorption is highly
Important differences exist due to the small offset (0.1- desirable, since it mediates cell adhesion and eventually
2m) and the low forces. Current research is focusing on bio-recognition, on the other hand cell cultures have to be
development of wear resistant surfaces which show restricted to some selected regions within the micro-array.
minimized friction and, above all, low stick-slip behaviour. Indeed other pre-selected device zones are sensed to
Nanocoatings of DLC (diamond like carbon), metal provide a background signal, and therefore they have to
doped-DLC and CNx were demonstrated also to have resist protein adsorption. In other words surface chemistry
excellent wear resistance against abrasive and adhesive is designed and realized to provide the tailored chemical
treatments [9]. Self assembled organic coatings have reactions only where desired. With respect to protein
been proved to eliminate release-related stiction and in- resistance, a 20 nm thick plasma polymerized tetraglymer
use stiction, as well as reduce friction in microengines, but coating layer has been shown to perform satisfactorily as a
control medium [13]. In biochip arrays for DNA analysis
several different single strand DNA segments are attached
to the surface in differentiated locations. Biochemical preventing leakage of strong drugs [15]. Retinal implants
response depends on matching the known DNA based on CMOS technology have recently been reported
fragments with the ones under test. Detector DNA [16]. When adopting a subretinal principle, an electro-
molecules immobilization must be accomplished in such a active array of micro-photo diodes convert light into
way that surface binding is gentle enough to preserve analogue current which is transmitted to the tissue through
their bio-recognition function. Polarization forces at metal a passivation silicon dioxide layer and electrodes patterned
surfaces as well as ionic or covalent interactions on many into a nanoporous TiN layer. This porous layer increases
metal oxides and semiconductor surfaces may determine the contact area by a factor of up to 100. Bioresistance is a
unacceptable loss of specificity. CMOS surfaces are key for this kind of implant which is meant to have lifetime
therefore modified by introduction of space layers and duration. SEM of in vivo implants showed failure of the
linker molecules with the aim of preserving specificity and passivation layer and pit corrosion of the silicon
localization in DNA biochip arrays [10]. At present there is underneath. Therefore the use of other protective layers is
an increasing trend toward the adoption of polymeric films under investigation. Micromachined nanoporous
and bulk materials in biomedical and chemical membranes can be used to create immunoisolation
microdevices. This is due to properties such as, for biocapsules to protect transplanted cells from
example: transparency, corrosion resistance or immunological attack. A fabrication protocol based on a
biocompatibility and the possibility of designing the thin sacrificial oxide thermally grown and sandwiched
material itself as required by the specific application. The between two silicon structural layers gives membrane
role of the surface is of major importance also with structures with highly defined pore sizes, as small as 10
respect to signal detection in biosensors; reflectivity and nm [17]. These were demonstrated to be suitable in
adsorption properties are relevant issues in thin-film xenotransplantation: the typical dimensions of insulin,
design of optical coatings. Electrophoretic separation of glucose, oxygen and carbon dioxide molecules are below
chemical species is currently achieved in microfabricated 3.5 nm, while the antibodies are demonstrated to be
microfluidic devices. Polymer fabricated systems are retained by a membrane with a pore diameter of 30 nm.
under development that are relatively cheap. In these The strict control of pore diameter is of great importance,
systems, the wetting properties are of major concern. A since even a small amount of pore diameters over the
different approach has been followed in programmable nominal cutoff value would allow the passage of antibodies
biochips based on SAW actuation which have been in sufficient amounts to initiate immunorejection pathways.
recently presented [14]. Here, instead of trapping the
liquid into microchannels, it is kept into micro-beakers and An important area is that of implants for medical use,
transported across the surface of a chip. The surface is where the current R&D on surface modifications pointing
chemically functionalized, see Figure 2, in such a way to toward complex and multifunctional surfaces identifies
lay down fluidic tracks on the surface, very much like three classes: one aiming at optimizing the topography
printing circuits on electronic boards. In this way, specific (pore distributions, roughness, etc.); the second one
regions of the chip can be made hydrophobic or focusing on the biochemical properties of surface coatings
hydrophilic. The tracks are shaped by lithography [14]. and impregnations (ion release, multi-layer coatings,
coatings with biomolecules, controlled drug release, etc.);
and the third one dealing with the viscoelastic properties of
surface materials [18]. The surface is recognized by the
biological system through the combined chemical and
topographic pattern of the surface, and the viscoelastic
properties. In most cases, biorecognition is a central
component. Any attempt to make a sophisticated
functional surface for biointeractions must take into
account the highly developed ability of biological systems
to recognize specially designed features on the molecular
scale [10]. Famous examples are antibodyantigen,
enzyme substrate, and receptor transmitter recognition
(e.g., in cell membranes). The recognition is programmed
into the molecules through the combination of their 3D
topographic architecture, the superimposed chemical
architecture, and the dynamic properties. Consequently an
optimally designed surface for specific biological function
must take these aspects into account. Although the
Fig. 2: Sketch of BioMEMS with selective texture for the fundamental interactions occur on the molecular scale
generation of droplets having a 20 pl volume. The there is an interesting and unique synergistic connection
diameter of circles on the surface is approximately 30 m between the nanometre and the micrometre length scales
[14]. when cells are present, as e.g., in the cases of medical
implants, tissue engineering and cell-based bioelectronics.
Therapeutic tools such as implantable biocapsules and Recent work in the area of surface modification by
drug delivery systems are the object of extensive texturing, implantation, and coatings can be found in
research. Microfabricated pumps for drug delivery references [19-25].
applications are based on actuated silicon membranes.
Fluid compression is achieved by overdriving a 2.4 Surfaces in light and X-ray optics
reciprocating membrane. The return motion is due to the For general-purpose-research telescopes the description
membranes own elasticity. There, the squeeze effect is of the optical quality of the surfaces is normally based on a
limited by texturing one of the contacting surfaces. In specified point spread function and a simple roughness
these devices, thermal mismatch due to the difference in criterion. There are two types of mathematical
thermal expansion between silicon and silicon dioxide, relationships relating surface roughness and other surface
has been used to pretension the surface of valves figuring errors to scattering. However, the two basic
expressions are not normally used together. The root- textures in the region of 0.4 nm Ra was possible in the
mean-square (rms) wavefront aberration in terms of 1980s [31] and figure accuracies of 0.2 nm are published
wavelengths is denoted by . For small aberrations, the today. The very demanding metrology requirements
fractional loss L of intensity in the central peak of an spawned a significant number of instruments designed to
image that is close to the diffraction limit is simply related measure exceptionally smooth surfaces and they were
to the Strehl ratio, that is a measure of image quality [26], both of the contacting [32] and the non-contacting [33]
[16]: types, such as ellipsometry, where a light beam of known
polarization is incident on the sample. In general the light
2 2 2
L = 1 exp(-(2) ) 4 (1) reflected from the surface is elliptically polarized and, for
very thin coatings, the light will reach the lower interface
As pointed out by Born and Wolf [26], the formula is and the ellipsicity of the light will be thickness dependent.
derived for low-order (smooth) aberrations. In contrast, The axial angular slope is another key parameter that must
the Total Integrated Scattering S, at normal incidence for be controlled during manufacture [30] and slopes in the
random roughness is given by: range of 2 to 5 microradians are required for optics with
good performance. Attempts at making x-ray microscopes
2 2 2
S = 1 exp(-(4) ) 16 (2) were based on reflective optics [34-35] but in recent years
more success was achieved using zone plates, noteably
where is the rms surface roughness as deviation from a amplitude zone plates [36] but more recently by phase
mean plane [27]. Expression (1) applies to an optical zone plates [37-39]. There is much interest in x-ray
wavefront generating an image that is close to the microscopes because their resolution is determined by the
diffraction limit of resolution. Expression (2) in the form width of the outer ring of the zone plate which can be of
shown applies to any beam of light in reflectance at the order of 35 nm which is therefore at least 10 times
normal incidence. However, in case (2), rms wavefront better than an optical microscope. Moreover, the x-ray
errors at normal incidence are equal to 2. We therefore microscope can be used to image intact cells to a depth of
have = /2. The two expressions give similar results a few micrometres [40-41].The normal type of x-ray
despite having different origins. With the advent of microscope takes an image of the whole specimen at once
advanced design telescopes and recent developments in but there are scanning variants where the object to be
polishing technologies, it may be possible to tailor the measured is rastered whilst a picture is built up [42].
characteristics of mirror surfaces to improve the optical
characteristics of an optical element. The major Multi-layer based x-ray optical systems represent an
advantage is that stray light could be managed in a much important area. Multi-layer coatings are being used
more efficient way than currently possible [28] by successfully as beam-forming elements for soft x-ray
engineering the surface. It would be possible, for applications such as hard x-ray micro-probes [43]. Such
example, to direct stray light away from key regions of the coatings that can be 100 layers thick are arranged in such
field where maximum contrast is needed to meet the a way that reflections add in phase. However, the
science requirement. thickness of such layers is of the order of 1 to 10 nm thick
and the surface texture must be carefully controlled to the
Surface roughness plays a major role in reflective x-ray order of 0.1 nm Ra [44]. Windt et al. [45] point out that it is
optics. X-rays incident at very shallow angles can be very important to specify, and measure within, the surface
reflected with high efficiency off smooth metallic or metal- wavelength which influences the x-ray reflectivity, in this
-1
coated surfaces, for example gold. Such mirrors, with case from 1 to 100 m .
designs of varying degrees of complexity, are widely used
in x-ray telescopes and other x-ray imaging applications. Examples of micro-optical systems are the OLED (organic
In typical applications, an x-ray telescope mirror is made light emitting diodes), which are illumination sources based
from glass ceramic material that is highly polished and on electrophosphorescent organic thin film layers (less
coated with metal, or it can be made from nickel than 500 nm). Their light extraction efficiency is limited to
electrodeposited on a mandrel. In practice, such a 20% due to total internal reflection. This limitation is
telescope receives x-rays from sources in space and they partially removed when an ordered array of microlenses is
first strike an annular parabolic surface and are then attached to the substrate surface opposite to that of the
reflected on to an annular hyperbolic surface (an optical OLEDs. Ten micrometre diameter PDMS microlense
configuration developed by Wolter [29]). Frequently, such arrays fabricated using transfer moulding were
surfaces are nested to improve the collecting efficiency of demonstrated to improve external quantum efficiency of an
the telescope. In telescopes with the best angular OLED by 50%. No alignment is required for these arrays
resolution the geometry of the individual mirrors is as since the microlense diameter is about ten times smaller
close to perfection as possible but this implies a rigid than a display pixel [46].
surface that has a thickness of some millimetres. For
applications where less angular resolution is needed foils 2.5 Surfaces in chemical systems
can be used. In both cases the surface texture of the The surface plays an important role in chemical systems
surface strongly affects the performance of the mirror such as heterogeneous catalysis, fuel cells, etc., since
because it gives rise to x-ray scatter and therefore chemical reactions depend on the amount of active
minimizing the surface texture is a vital aspect of the surface, predominantly on the micrometre to nanometre
manufacture of such components. Fortunately, the scale. Actually, catalysts are today the most important
improvement between an optical component and an x-ray group of commercial nanomaterials [47-48]. The majority
component is not the ratio of the optical to x-ray of industrial catalysts are high-surface-area solids onto
wavelengths because the x-ray optical component is which an active component is dispersed in the form of very
operating at grazing incident. It can be shown that a small particles. These have dimensions of 1 to 20 nm and
surface texture improvement of about 25 is needed for the are often referred to as nanoparticles. Catalysis will
x-ray case that has been demonstrated to be possible continue to be an important area of nanotechnology since
[30]. A number of researchers have demonstrated solutions to many important resource, energy and
manufacturing and measuring substrates with surface
environmental problems require new catalysts with tailor- Complex patterns
made nanostructures. 3D nature with re-entrances
Miniaturised components
An area involving catalysis which is receiving particular
attention is represented by fuel cells [49]. In a fuel cell, Figures 4 and 5 show examples of surfaces on modern
basically consisting of two electrodes sandwiched around products, where micrometre details govern the functional
an electrolyte, oxygen passes over one electrode and behaviour of the surface through the so-called lotus effect
hydrogen over the other, generating electricity, water and [51]. Figure 6 illustrates the typical dimensions of
heat. Several kinds of fuel cells have been developed, for structures obtained with different manufacturing
example [49]: Phosphoric Acid (PAFC), Proton Exchange processes, which are, in general, interrelated. Going down
Membrane (PEM), Molten Carbonate (MCFC), Solid from millimetre to nanometre length scales is not only a
Oxide (SOFC), Alkaline, Direct Methanol Fuel Cells scaling of the size of the material, the nature of the
(DMFC), Regenerative Fuel Cells, Zinc-Air Fuel Cells material itself changes. At distances of some nanometres it
(ZAFC), Protonic Ceramic Fuel Cells (PCFC). As an is not only less material which is observed, the material
example, in PEM fuel cells, the proton exchange becomes atomic and discrete in character, i.e., the atoms
membrane is a thin plastic sheet that allows hydrogen of the surface determine the physical and chemical
ions to pass through it. The membrane is coated on both properties of the surface. On the other side we have to
sides with highly dispersed metal alloy particles (mostly take into account the atomic steps on surface crystals.
platinum) that are active catalysts. In PCFC cells, Steps at this scale depend on the treatment of the sample
gaseous molecules of the hydrocarbon fuel are absorbed and represent the surface heights becoming discrete.
on the surface of the anode in the presence of water Calculations of the roughness of such atomic surfaces
vapor, and hydrogen atoms are efficiently stripped off to have been produced recently, [52-53].These calculations
be absorbed into the electrolyte, with carbon dioxide as take into account the available data of crystals and
the primary reaction product. Figure 3 gives an knowledge acquired using the bulk values, although the
impression of the role played by the active surface area in atoms on the surface show different structures, as
a MCFC cell cathode which is considerably expanded by observed by Low Energy Electron Diffraction (LEED) and
a high porosity. Scanning Tunneling Microscopy (STM). The surface atoms
are arranged in such a way that the surface energy is
Another important area is that of microchemical sensors, minimized. Accordingly, on a clean silicon surface of (111)
which has been partially illustrated in connection with orientation we see a 7x7 unit cell, whereas on a (100)
micromedical applications in section 2.3. surface a 2x1 structure is observed, Figs. 7 and 8. The
meaning of 7x7 is that the surface unit cell is 7 times larger
in the x direction than assumed from the bulk values, see
[54-56].

Fig. 3: SEM micrograph of modified NiO cathode for


MCFC [50].
Fig. 4: A regular surface structure from which the Lotus
3. SURFACE PROPERTIES AT MICRO AND effect can be obtained (University of Bonn/Courtesy of the
NANOSCALE PTB)
The issue of defining the surface itself has been reviewed
in the 2002 keynote paper [5] emphasizing the fact that a
surface also depends on the measurement technique
used to characterize it, and measurements at different
depths are needed for complete characterization. It is
moreover clear that interactions between geometrical,
physical, and chemical properties take place, and that the
influence from mesoscopic conditions, reaction velocities,
quantum effects, etc. becomes of paramount importance.

3.1 Geometry
A number of aspects among those listed below
differentiate the geometry of high precision surfaces from
the geometry of surfaces of conventional products:

Very fine topographical scales


Fig. 5: Lotus effect of paint on glass (Courtesy of the PTB)
High aspect ratios
physical state has been extensively treated in two recent
min. height of micro-structures in m keynote papers [5][57], and the critical importance of
hot molding surface and subsurface integrity of ultraprecision surfaces
3000 injection molding
has been documented [57]. As a result of the increasing
2000
need to characterize the mechanical response of surface
1000 regions in the nanometre range, significant efforts in the
min. lateral development of indentation instruments that measure load
dimensions in m
min. height of micro-structures in m versus depth have been made. Nanoindentation has been
3000 X-ray lithography shown to be able to successfully characterise the elastic
optical lithography modulus and hardness of the very near surface of solids
2000
and thin films, and nanoscratching has been employed to
1000 characterise thin film adhesion. The use of
min. lateral
dimensions in m
nanoindentation for the characterisation of the near
min. height of micro-structures in m surface residual stress state has also recently been
3000 discussed [5]. In addition to these measurements,
electrodeposition
micro laser beam nanoindentation has been used to study pop-in [58] - an
2000
cutting abrupt increase in penetration at a given load - which has
1000 been observed in a large variety of materials including
min. lateral
dimensions in m
metals [59] and semiconductors [60-61]. Pop-in is a near
5 50 100 150 200
surface behaviour which has been most commonly
associated with the sudden nucleation of dislocations and
the onset of plasticity [58], [62], although in some cases it
Fig. 6: Height versus lateral dimension of micro-structures has been attributed to oxide layer breakthrough [59].
produced using different fabrication processes (Courtesy Nanoindentation coupled with FEM modeling has been
of A. Weckenmann, University Erlangen-Nurenberg) used to determine the constitutive behaviour of the near
surface [63]. The fundamental nature of near surface
plasticity is also being investigated by nanoindentation and
relates to the fact that for many different crystalline
materials, hardness of the near surface is seen to
decrease with increasing depth. This indentation size
effect is thought to have a physical basis described by
strain gradient plasticity [64], [67] although rate effects are
also thought to play an important role [68].

Unique surface behaviour has also been investigated


using nanoindentation. For example, the near surface
photoplastic effect (PPE) in II-VI semiconductors [69 - 71],
has been reported. Whereas the PPE has been observed
in bulk single crystal II-VI semiconductors [72] for many
years, only recently has it been observed at the near
Fig 7: STM image of a clean Si (111)- 7x7 surface. surface. Wolf et al. [69] examined the effect of white light
Horizontal range: 20 nm; Vertical range: 15 nm; Z-range illumination on the hardness of (111)ZnSe.
(out of paper): 0.4 nm. The rhombus shows the 7x7 Nanoindentation was performed using a Berkovich
surface unit cell. (Courtesy of the PTB) indenter in darkness and under illumination by a tungsten
2
halogen lamp that produced 50 mW/cm on the surface.
Over the entire depth range (50 nm to 450 nm) an increase
in hardness of approximately 10% was observed. In further
studies by the same group, the spectral sensitivity of the
change in hardness was investigated, again on (111)ZnSe
[70]. The wavelength of the incident light was varied from
470 nm to 585 nm. The largest increase in hardness was
obtained with light of a wavelength of 510 nm, slightly
greater than that representing the band gap of the
material, 480 nm. Recently, Klopfstein et al. [71] studied
the effects of white light illumination on the
nanoindentation response of (0001) etched ZnO for a
depth from the surface of 25 nm to 275 nm. Illumination
resulted in a 40% increase of the load at which pop-in or
the onset of plasticity occurred. Figure 9 shows the
measured hardness as a function of contact depth with
Fig. 8: STM image of a 20 nm x 20 nm large part of a sample illumination and in darkness. In both cases the
silicon (100) 2x1 surface with an atomic step. The step indentation size effect, an increase in hardness with
height is 0.13 nm. (Courtesy of the PTB) decreased indentation depth, was observed. To a depth of
100 nm the hardness of the illuminated sample was found
to be 7% to 20% greater than that measured in darkness.
3.2 Physical properties Beyond this depth no observable difference in hardness
The mechanical properties of the surface and near was found. The increase in near surface hardness with
surface region can play an important role in the functional illumination was attributed to the charging of dislocations
behaviour of precision surfaces, e.g., frictional effects in by surface states of the material. The lack of an observed
tribological systems. Characterisation of the near surface PPE for indentations with a contact depth greater than 100
nm was attributed to a reduced effect of the surface states and N2. In another study by the same research group, the
on dislocation charging in this region and insufficient bulk mechanical properties of TiCxN1-x thin films deposited on
charging resultant from short dislocation travel distances. cemented carbide substrates were measured as a function
of the intrinsic stress on the film as measured by X-ray
diffraction [84]. Investigation into the effects of multilayer
structures of compositionally modulated Ti/TiN films on
their hardness where the modulation periods examined
were 10, 15, 20, and 40 nm has also been reported [85].

Fracture toughness of thin films has been calculated based


on the analysis of the energy release rate from the load-
displacement curve during nanoindentation. For
indentation techniques, radial cracks are produced during
the unloading cycle when brittle materials are indented by
a sharp indenter. The length of radial cracks is known to
correlate with the fracture toughness and is used to
calculate fracture toughness based on various equations
which have been reported [86], [87]. The fracture process
has been shown to progress in three stages [86]: (1) first
ring-like through-thickness cracks from around the indenter
result from high stresses in the contact area; (2)
delamination and buckling occur around the contact area
at the film/substrate interface by high lateral pressure; and
Figure 9: Hardness as a function of contact depth for (3) second ring-like through-thickness cracks and spalling
etched (0001)ZnO with sample illumination (circles) and in are generated by high bending stresses at the edges of the
darkness (squares). Error bars denote maximum and buckled film. The same model has been used to study the
minimum of the data [71]. fracture toughness of multilayer hard coatings deposited
on cemented carbide [88]. In this study, the changes in
In addition to the surfaces of bulk materials, the physical slope of plots of load-penetration depth squared were
behaviour of thin films is also of significant interest. shown to reveal the changes of the coating/substrate
Although there are several techniques used to system. Two other methods based on correlating crack
characterize the mechanical properties of thin layers on lengths emanating from the corners of the indentation
the order of 100 nm in thickness including for example, when the indenter and load are removed, and correlating
ultra short surface waves [73], nanoindentation has been fracture toughness have been reported [89]. A new
successfully used to characterize the mechanical mechanical test, the cross-sectional nanoindentation test,
properties (elastic modulus and hardness) of thin films as has recently been developed for measuring fracture
a function of film thickness, growth condition, chemical toughness [89]. In this test, indentations are made normal
composition and residual stress state. For example, the to the wafer cross-section within the substrate and close to
elastic modulus and constitutive behaviour of electron the interface of interest. From the results of this test a
beam PVD deposited zirconia have recently been model based on elastic plate theory was developed to
reported [74]. In another study, the mechanical properties numerically calculate the interfacial critical energy release
of sol-gel zirconia deposited on polished disks of 316 rate [90]. Inputs to the model are the thin film elastic
stainless steel were measured as a function of film properties, thin film thickness, interfacial crack area and
thickness from 0 nm (as polished) to 900 nm, for different maximum thin film deflection during the test. The
values of load [75]. Similar work has been done on sol- interfacial delamination area (crack area) was measured
gel-deposited titania (TiO2) on glass and copper with by optical and scanning electron microscopy. The
thicknesses from 50 nm to over 200 nm [76], on aluminum maximum thin film deflection during the test can be
deposited on glass with thicknesses between 240-1700 obtained from the load versus displacement curves and
nm [77], and on sol-gel-derived hard coatings on the Berkovich diamond-tip geometry assuming that the
polyester [78]. In this last study, the influence of UV indenter shaft does not tilt during the test. The wear
irradiation and low temperature heating on the thickness resistance of brittle materials has been shown to be
and the hardness of the film was reported. The hardness principally determined by its fracture toughness as well as
of the films was evaluated not only as a function of film elastic modulus and hardness [88].
thickness but also as a function of the deposition
temperature of the film, since deposition temperature was 3.3 Chemical properties
shown to be related to the thickness of the TiN and TiCN Heterogeneous catalysts are typically multiphase systems
coatings [79]. A correlation between the resulting and the structural and chemical states of the active
hardness of silicon oxinitride (SiOxNy) films and species depend intimately on process conditions. Particles
processing temperature has also been reported [80]. The ranging in size from roughly 1 to 50 nm exhibit physical
effects on measured elastic modulus and hardness of the and chemical properties that are intermediate between
substrate bias voltage and nitrogen partial pressure in the those of the smallest element from which they can be
deposition of titanium nitride (TiNx) thin films [81], and composed (such as a metal atom, the stoichiometric unit of
vacuum annealing time in the deposition of Mo-Si-N/SiC a metal oxide) and those of the bulk material [48]. Catalyst
[82] have also been studied. The influence of the carbon- performance can be sensitive to particle size because the
to-nitrogen composition ratio, x, in TiCxN1-x thin films surface structure and electronic properties can change
deposited on cemented carbide substrates on the greatly in this size range. Theoretical calculations have
mechanical properties including hardness and elastic been successfully attempted of adsorption properties,
modulus has also been reported [83]. In this study, reaction pathways, and activation energies for surface
TiCxN1-x thin films were grown with x=0 (TiN) to x=1 (TiC) chemical reactions [91]. The approach taken in surface
by varying the flow ratio between the reaction gases CH4 science has been to study elementary reactions on well
defined single crystal surfaces. Single crystal surfaces are Electron Microscope (TEM) with in situ capabilities [92],
only crude models of the high surface area catalysts used [95]. The electrons passing through the sample in the TEM
industrially. Catalysts need to have a high surface area, provide information not only about particle size and shape
and they often consist of a mixture of phases, some of but also about the lattice structure and the chemical
which have the catalytically active surface, while others composition of individual particles. Also STM and AFM
support the small particles of active phases or keep them have been used to examine the nanostructure of model
from sintering. Recently, it has become possible to catalyst systems. Using STM, for example, it has been
produce and study models of supported catalysts and to possible to explain why the addition of small amounts of
study them under realistic high pressure and temperature Au to Ni catalysts used for the steam reforming of methane
conditions. It was shown that catalysis is decisively reduces the tendency of such catalysts to deactivate
affected by atomic steps on the surface. Fig. 10 illustrates because of C deposition [96]. The STM image in Fig. 11
the fact that chemical activity is tremendously reduced shows Au atoms located on a Ni surface. The presence of
when surface steps are covered with gold using PVD [92]. the Au atoms near a Ni atom reduces the tendency of C to
bond to the Ni, and hence to initiate the formation of
carbonaceous deposits that deactivate the catalyst.
Ea = 36 5 kJ/mol

4. SURFACE FABRICATION IN PRECISION


-10
ENGINEERING, MICROSYSTEMS AND
NANOTECHNOLOGY
log s0

-11 In this section, different manufacturing processes are


reviewed with respect to surface fabrication. The
processes are grouped according to the following three
-12 main areas:
Conventional machining (encompassing precision
-13 engineering material removal operations as well as
EDM and laser machining)
Ea = 126 21 kJ/mol Microfabrication (encompassing silicon micro-
-14 machining as well as polymer replication processes)
Nanomanipulation (encompassing positioning and
0.0015 0.0020 0.0025 0.0030 0.0035 manipulation as well as modification and patterning on
1/T (K-1) micrometre and nanometre scales using localized
Fig. 10: Dissociative N2 Adsorption on Ru(0001). The tools).
energy Ea required for dissociation increases from 36
kJ/mol to 126 kJ/mol, if surface steps are covered with Au 4.1 Machining
atoms [92]. A number of processes are particularly relevant for the
manufacture of ultra-precise microstructures: diamond
turning, diamond milling, contour boring (Figure 12), micro
grinding and ultrasonic assisted processes such as
diamond cutting as well as ultrasonic lapping. For the
ultraprecision manufacturing of complex surfaces and
microstructures diamond turning and fly-cutting are
commonly employed. However, for certain tasks these
processes have geometric and kinematic limitations.
Diamond contour boring and ball-end milling extend the
types of surfaces which can be generated to almost
arbitrarily shaped mirror arrays and profiles with high
aspect ratio, being suitable machining methods for the
fabricating of microstructures [57], [97-102].

Fig. 11: STM image of a Ni(111) surface with 2% of a


monolayer of Au. The Au atoms appear black in the
images. The Ni atoms next to the Au atoms appear
brighter because of a change in geometry and electronic
structure, indicating that the chemical activity of the Ni
atoms may be modified by nearest-neighbor Au atoms
[96].

Through in situ studies, it is possible to obtain a detailed


atomic-scale description of the nanostructures and the
sites where the catalysis takes place, i.e., the active sites
under reaction conditions. In situ methods have been Fig. 12: Contour boring with half-arc monocrystalline
diamond tool. Left: Details of machining a mould for
successfully applied to elucidate the properties of a large
lenses; Right: tool details [102].
number of heterogeneous catalysts, recently with the
development of a novel high resolution Transmission
A number of ultra-precision machine tools has been demonstrate a measured Ra value of 2.3 nm and 5.4 nm
developed over the last twenty years in order to meet the for each surface [109].
ever growing demand for reduced dimensional tolerances,
together with high surface and subsurface integrity Error! Important research work has been carried out by CIRP
Reference source not found.. For many industries the members concerning computer simulation of the
above requirements, coupled with the advent of new mechanisms involved in chip formation and surface
advanced materials, including glasses and ceramics, is generation in single crystal nanoscale cutting [110-119].
leading to the capabilities of conventional machining
methods and machine tools being eclipsed by new Manufacturing of lenses by an alternative precision
processes and machine systems currently at the research polishing method called magnetorheological finishing
stage. The design of these machines is fundamental in (MRF) has demonstrated ability to produce optical
improving machining performance by, for example, surfaces with an accuracy better than 30 nm peak to valley
designing for high loop stiffness, the minimalisation of and surface roughness less than 1 nm on optical glasses,
thermal effects [103] and friction, and the incorporation of single crystals (calcium fluoride, silicon), and glass
advanced measurement and control systems. In addition, ceramics [120]. In MRF, see Figure 14, material removal is
for highest accuracy, automatic control and software accomplished through hydrodynamical forces resulting
compensation methods are becoming increasingly from the flow of magnetorheological fluid. In contrast to
important. Past examples of ultra precision machine tools conventional polishing, a quasi-solid boundary in the
include the Large Optics Diamond Turning Machine, magnetorheological fluid produces a high shear stress, but
developed at Lawrence Livermore National Laboratory in no normal load, resulting in material removal with a
the USA [105], and the Cranfield Nanocentre diamond minimum of material damage.
turning and grinding machine [106] developed in the UK.
More recently, an ultra precision double disk grinding
machine aimed at 'ductile' grinding of 400 mm diameter
silicon wafers, within a flatness of 100 nm has been
developed in Japan [107]. The machine has achieved
extremely high quality ductile mode grinding of the silicon
wafers with very low (sub micron) dislocation damage. A
further recent development has been the realisation, in
the UK, of another ultra precision grinding machine tool
Tetraform 'C'. Tetraform includes a combination of novel
concepts for the design of machine tool structures, which
have been developed to provide a very high dynamic Fig. 14: Polishing mechanism in MRF [120].
stiffness, which is required to machine, directly, brittle
Another example of precision finishing, Zeeko's
materials with extremely low levels of subsurface
Precessions polishing process uses a spinning, inflated
damage. The machine utilises a passively damped space
frame, with all loads being carried in closed loops. The membrane tool, which is pushed against the part to create
resulting structural design, coupled with the use of a variable-sized polishing spot [121-124]. The tool rotation-
axis is precessed to create a near-Gaussian removal-
hydrostatic leadscrews and guideways for each axis,
profile, and the spot traverses the part under control of a 7-
provides very high static and dynamic stiffnesses [108].
axis CNC machine-tool. A numerical optimiser interprets
measured metrology data and computes the optimum
spot-sizes and dwell-times across the part to minimise
form-errors. Nanometric surface textures are possible
using such a technique with good control of waviness.

Laser micromachining has established itself as a means


for manufacturing of microsystems for various applications
during the past years. These new applications demand for
the quality of micromachined devices combined with more
functionality. The short pulse duration, high pulse energy
and extremely small penetration depth of excimer laser
radiation into irradiated surfaces facilitate the machining of
Fig.13: Optical quality machining of M50 bearing steel brittle-rigid materials as ceramics and glass. Another
special characteristic is the large beam profile of this kind
There is a growing interest in the production of optical of laser. Thus, it is possible to modify large surface areas
quality surfaces on metallic components, particularly to at one time or, by the use of a mask, it is possible to create
control tribological properties. The ability to machine many differently shaped structures [116], [125-127].
metallic surfaces to optical quality (< 10 nm Ra) has a
significant impact on both the time and economics of 4.2 Microfabrication
manufacture, particularly when slow polishing and lapping Microfabrication encompasses operations such as
processes can be eliminated. However, to achieve lithography, oxidation, etching, wafer bonding,
realistic material removal rates the machine tool must electroplating, deposition of silicon wafers, etc. involved in
have a high dynamic stiffness. As an example, Tetraform the micromachining of silicon as well as polymer
C has been used to grind M50 bearing steel. Figure 13 replication processing by hot embossing or imprinting,
illustrates a stepped workpiece where the upper surface injection molding, laser ablation, soft lithography, x-ray
was ground using a 200 m wheel depth of cut and the photolithography, etc.
lower region a 500 m wheel depth of cut. A 76 m CBN
cup wheel was used in association with electrolytic in- Much importance is currently given to solving the stiction
process dressing (ELID). Wyko plots for both surfaces problem during micromachining of silicon for the fabrication
of microsystems. Release related stiction in MEMS can be
minimized by several engineering approaches: microstructures have been attempted as well. Lithographic
sublimation-drying and supercritical CO2 drying and vapor patterning of polymides and SU-8 are employed to
HF etching preventing meniscus formation were produce polymer microstructures on a wafer substrate,
successfully applied. Another approach is to perform a using x-ray lithography aspect ratios of 100:1 can be
partial undercutting of the surface microstructure and fill obtained [12]. Other approaches reported in the literature
the voids with a polymer layer. Physical surface are liquid crystal polymers [132], and etching techniques.
modification: the surfaces are roughened to reduce the Fluoropolymers are inert to most solvents and chemicals,
effective contact areas, selective etching is typically hence micromachining of these polymers offer great
employed to change the surface topography [128], [129]. potential for use in microdevices containing corrosive fluids
Chemical surface modification methods have been or gases. The low surface energy makes the fabrication of
attempted, including low surface energy plasma microstructures from these substrates most difficult when
polymerized fluorocarbon film deposited in the field-free using conventional micromachining techniques. Low
zone of plasma reactors. A more effective chemical energy ion beam treatments on fluoropolymer surfaces
surface modification involves the formation of a self- have been demonstrated to enhance the wetting
assembled monolayer (SAM). Several classes of organic characteristics of photoresists with a minimal surface
films have been explored, including alkyl- and modification (Rsq 40 nm) [11]. An alternative method using
perfluoroalkyl-trichlorosylane SAMs, dichlorosilane- and direct plasma etching has recently been proposed. This
alkene-based molecular films. Among these classes of approach is known as deep reactive ion silicon etching
films, the most widely used is the octadecyltrichlorosilane- (DRIE). It allows the fabrication of high aspect ratio
based SAM. Despite the progress made so far, some structures with a smaller minimum feature size than replica
crucial issues concerning their manufacturability have not techniques and the ability to integrate devices with
been addressed yet such as: reproducibility, scale up associated CMOS electronics [133]. MEMS membranes
from single dies to whole wafers and eventually multi- patterned with polymer lines have been fabricated, with
wafer cassettes are currently engineering challenges. potential application in microfluidics. Localized stiffening is
Durability of monolayer coatings is still a concern. Non achieved due to the polymer lines, making possible the
organic coatings as DLC and Me-DLC films were selective actuation of separate regions of the membrane.
fabricated via PECDV methods. The deposition Unfortunately, roughness and footing in the bottom edge of
temperature below 200C has allowed the use of the polymer microstructure were evident. Thin parylene
polymers (SU-8 for instance) as substrate. Adhesion to films are suitable for manufacturing elastic membranes
the substrate was also proved to be acceptable. owing to its low Youngs modulus and can be used for the
Extensive research work is going on to develop polymer fabrication of check valves in microfluidics. In this
microdevices, particularly for microfluidic and biomedical application, gas phase BrF3 is used to roughen the valve
applications. seat surface. This process reduces stiction and surface
tension in the valve by minimizing contact area between
Process conditions using replica techniques such as hot the mating surfaces. The roughened valve seat surface
embossing, microinjection moulding and soft lithography also leads to enhancement of the adhesion of the parylene
of elastomeric polymers should be chosen to take account anchors. Surface modification techniques to improve
of the design of the microstructures to be manufactured. wetting properties in microchannels are currently being
The critical dimensions that can be replicated by injection addressed. As an example sulfunation of PCA micro-
moulding with an acceptable quality are mainly channel surfaces was demonstrated to influence the
determined by the aspect ratio of the microstructures electro-osmotic flow as well as surface topography, the
[130]. For aspect ratios lower than unity, these minimal effects of sulfunation lead to a smoother PCA surface and
dimensions reach values in the submicrometre scale, for a significantly higher electro-osmotic flow for pH values
example in the manufacturing of CDs. In the case of below 8 [134]. Replication has been used for the mass
higher aspect ratios, the conventional injection moulding production of CDs, optical components, as well as
process no longer achieves a sufficient replication quality roughness calibration standards [135], to mention some
mainly because the resin hardens before complete filling examples.
of the mould. By using special microinjection moulding
techniques, polymeric microstructures with minimum wall As the semiconductor industry progresses towards
thicknesses of 10 m, structural details in the range of extreme ultraviolet (EUV) lithography there is an increased
0.2 m and surface roughness of about Rz<50 nm can be demand for ultraprecision surfaces with surface roughness
manufactured. The greatest advantage of this approach values less than 1 nm. Mirrors for x-ray optics and
consists in the aspect ratios that can reach values up to synchrotron radiation sources also require nanometre level
20. Hot embossing [131] of high aspect ratio peak-to-valley roughness. In addition to surface
microstructures requires control over properties such as roughness, the crystallinity of the near surface may also be
sidewall roughness of the embossing master and the important, e.g., Bragg diffraction optics. A few examples of
chemical interface between the tool and the polymer. With the many different physical and chemical processes used
respect to friction minimization during the de-embossing to generate ultraprecision surfaces are discussed below. In
phase, 80 nm rms is an empirical limit for the fabrication a series of papers Mori et al. [136-138] demonstrated the
of structures with an aspect ratio larger than 0.5. The use of plasma chemical vaporization machining (CVM) to
LIGA process and ASE silicon etching allow sidewall rms achieve nanometre level surface roughness. In plasma
values in the order of 10 and 8 nm respectively. CVM, a plasma is generated between an electrode and the
Therefore, they are perfectly suited to high aspect ratio sample in the presence of a gas, typically helium with SF6,
replication. Addition of release agents to the polymer or CF4 at nearly atmospheric pressure. The shape of
allows replication of aspect ratios up to 50. Replica electrodes which have been used include a hollow cylinder
techniques allow fabrication of polymer independent [139], a rotating disk [138], a rotating cylinder [137] and an
components such as fluidic conduits. These elements are inner-diameter saw [136]. Mori et al. [137] claimed that the
then aligned and assembled with CMOS electronics into removal of material is by the chemical interaction of the
sensors and actuators. Approaches based on parallel plasma and the sample resulting in no mechanical damage
fabrication of aligned electronics and polymer to the sample. Plasma CVM using a rotating cylinder for
the electrode reduced the surface roughness of a Si wafer 4.3 Nanomanipulation
from 2.2 nm P-V to 1.4 nm P-V over a length of 250 m Since the invention of scanning tunneling microscopy
[137]. The technique has also been used with fused (STM) and atomic force microscopy (AFM) nearly two
silica, polycrystalline molybdenum, polycrystalline decades ago, these instruments have been used to
tungsten and polycrystalline silicon carbide. Okamoto et fabricate surface structures ranging from ~100 nm down to
al. [140] demostrated the use of plasma CVM in the atomic dimensions. Examples of atomic and molecular
production of amorphous silicon solar cells. They used a manipulation include the positioning of individual atoms on
multi-wire electrode to create a series of grooves in the a surface using low temperature STM, as well as the
solar cells which were approximately 30 cm x 40 cm in removal/deposition of atoms at room temperature due to
size. Solar cells produced with plasma CVM had similar electric field or mechanical processes. Experiments that
performance as ones produced by laser patterning. use such processes to carry out larger-scale material
transfer and/or surface modification include field-
Elastic emission machining (EEM) is another technique in evaporation of hundreds of atoms from Au tips, electron-
which the material is thought to be removed by a chemical stimulated processes in STM chemical vapor deposition,
mechanism [141], [142]. The technique has been revised and miscellaneous mechanical and thermal processes. An
since first introduced [143]. The elastic sphere previously extensive review with more than 200 references on this
used has been replaced by a nozzle that directs ultrapure area can be found in [151]. STM/AFM nanolithography
water mixed with powder onto the surface. The powder, ranges from manipulation of single atoms using low
SiO2, Al2O3, or ZrO2, reacts with the sample and then is temperature STM (Figure 15) to memory storage using
washed away by the fluid. The technique is very sensitive AFM thermoindentation. The forces between an STM tip
to organic impurities and dissolved oxygen in the and an adsorbed atom can be used to move the atom to a
ultrapure water which can oxidize the surface of the new location on the surface. Usually, metal surfaces are
sample. EEM was used to reduce the roughness of a used as substrates because the surface corrugations are
silicon workpiece from 3.2 nm P-V value to 0.98 nm P-V small and, therefore, smaller forces are necessary to move
value for a 21 mm x 25 mm measurement area [142]. adsorbed atoms. Unfortunately, the atoms can also more
The technique has also been used on germanium [141] easily diffuse on such metal surfaces, so STM
and quartz [142]. manipulation of such atoms is usually done at low
temperatures where thermal diffusion is minimized. STM
can then be used to either laterally move an atom on the
In contrast to the chemical action of plasma CVM and
surface, or vertically relocate it by transferring the atom to
EEM, ion beam machining and figuring use the kinetic the tip and then redepositing it in another location. Another
energy of ions to remove material. The technique has system where low temperatures are not required for STM
been used for the planarization of samples [144] as well manipulation is the restructuring of atoms on a
as for the production of an off-axis ellipsoidal mirror [145].
semiconductor surface. These experiments are typically
Fechner et al. [144] optimized an ion planarization carried out at room temperature and under ultra-high
technique introduced by Johnson and Ingersoll [146] for vacuum conditions to maintain surface cleanliness.
many different materials. In this planarization technique Individual surface atoms can be removed and/or deposited
photoresist was spun onto the workpiece surface with a by direct tip-sample contact, high tunneling currents, or
spin coater. The photoresist coated workpiece was then
voltage pulses. Field evaporation occurs when surface
ion milled with the angle of the ion source at the atoms are ionized and extracted by a high electric field.
planarization angle, the angle at which the material
removal rate for the photoresist and the workpiece was
the same. This technique was used to reduce the
roughness of OFHC copper from 24.7 nm rms to 2.95 nm
rms for a 40 m x 40 m measurement area [144]. The
technique was also used to planarize fused silica, CaF2,
silicon, garnet, and electroless nickel. In addition, the
technique was applied to smooth the surface of a 103 mm
diameter CaF2 convex lens with a 248.4 mm curvature.
The roughness at the center of the lens was reduced from
3.38 nm rms to 0.5 nm rms for a 1 mm measurement
length [144]. Because of the curvature of the lens, the
centre was smoother than the outer portions of the lens.
Schindler et al. [147] used ion beam milling without a
planarization film to reduce the roughness of a 200 mm
diameter SiC mirror from 208 nm P-V to 41 nm P-V
measured over the entire mirror surface. The technique
can also be used to machine a specific shape into the
workpiece. Often this is accomplished by inserting a
mask in the path of the ion beam which is then raster
scanned across the part. Mercier et al. [145] used this
technique with a specially designed mask to create an off-
axis ellipsoidal shape from a cube of silica. Further
examples of recent developments in the science and
technology used for the creation of perfect surfaces can
be found in the proceedings of a recent international Fig. 15:Sequence of low-temperature STM images (49 nm
conference on production engineering [148]. 49 nm) showing the construction of a triangular corral
composed of Ag atoms on a Ag(111) substrate [152].
Historically, this process was initially performed using the new fields of observation but also offered hitherto unknown
single-electrode tip geometry of a field ion microscope possibilities to locally influence and transform matter at the
(FIM). More recently, however, evaporation has been level of large atoms, single molecules, and atomic clusters
observed at lower field values using the double-electrode [6].
tip/sample geometry of STM. Because evaporation
usually occurs from the tip (vs. the sample) due to the
higher field there, the choice of tip material is important.
The fabrication of nanoscale structures using STM and
AFM has been a field of relatively active research since
the inception of these techniques. A unique advantage of
these scanning probe techniques is the ability to
manipulate matter down to the atomic level and to form
structures not possible by other means. More recently,
attempts have been made to develop more
technologically interesting structures for use in device
production. Unfortunately, the serial nature of the writing
process makes it time consuming and not economical for
commercial applications. One solution to this problem has
been the introduction of multiple tip arrays. Techniques
such as dip-pen lithography or thermomechanical
indentation are adaptable to such an array geometry and
may eventually yield viable device applications. For
example, in current magnetic data storage the
superparamagnetic effect will ultimately limit room
2
temperature magnetic data density near 100 Gb/in [149]. Wavelength
Thermomechanical data storage using AFM tip arrays has
already demonstrated data densities higher than this limit Fig. 16: Diagram of wavelength vs. amplitude for different
[150]. At present, however, it is still an open question as surface roughness instruments (courtesy of the PTB).
to whether these specialized lithography techniques will
eventually mature into technologies of widespread
application.

5. SURFACE METROLOGY AT MICRO AND


NANOSCALE
Surface metrology has been the object of the 2002
keynote paper [5] and is not specifically considered in this
paper, but its fundamental importance is emphasized.
Metrology is a prerequisite for the success of any modern
production technology, including precision engineering,
micro engineering and nanotechnology.

The present situation concerning surface metrology can


be illustrated with respect to the traceability of surface
topography measurements: Fig. 16 shows the range of
different measuring instruments while Fig. 17 a similar
diagram regarding calibration standards. Comparing the
present possibilities with requirements from production
mentioned in other sections of this paper, the need for
Wavelength
developments in the nanometre range appears clear.
Another clear challenge is the true 3-dimensional Fig. 17: Diagram of wavelength vs. amplitude for different
characterization of surface details involving re-entrances, surface roughness calibration standards (courtesy of the
as discussed in [4] and [5]. In general, the need for PTB).
measurement and testing in nanotechnology has been
considered by a position paper compiled by the High 6. CONCLUSIONS
Level Expert Group on Measurement and Testing under
the European Framework Programme for Research and Surfaces act as interfaces governing the functional
Development [153]. The report addresses nanometrology behaviour of a product, the controlling mechanisms often
from the following perspectives: involving surface details on a micrometre or nanometre
scale. Many emerging products are based on achieving
Written standards these small scales, as is the case in precision engineering,
microengineering, and nanotechnology. This paper,
Scientific instrumentation
providing a schematic overview of applications, functional
Validated measurement procedures
behaviour, and manufacturing technologies, clearly shows
Measurement standards that the surface properties are of decisive importance for
Chemical analysis an increasing number of modern products. Advances have
Biology been made in tailoring surfaces for different high-end
applications. Advances have been made towards better
In this context, it is also worth remembering that it was characterization of surfaces at sub-micrometre levels and
actually the invention of the scanning probing understanding of the mechanisms that involve surface
microscopes during the 1980s, which not only opened up geometry, together with physical and chemical material
properties. As the scale is reduced, the role of different [16] Meyer, J. U., 2002, Retina implant-a bioMEMS
mechanisms is affected, and several mechanisms of challenge, Sensors and Actuators A: Physical,
different nature may strongly influence each other. Finally, Vol.97-98, 1-9.
the fundamental importance of metrology in connection [17] Desai, T. A., Hansford, Derek J., Ferrari, M., 2000,
with surfaces at micrometre and nanometre scales is Micromachined interfaces: new approaches in cell
strongly emphasized. immunoisolation and biomolecular separation,
Biomolecular Engineering, Vol.17 Issue 1, 23-36.
7. REFERENCES
[18] Kasemo, B., Gold, J., Implant Surfaces and Interface
[1] Evans, C.J., Bryan, J.B., 1999, Structured, Processes, Adv. in dental research, Vol.13, 8-20.
textured or engineered surfaces, Annals of the
CIRP, 48/2:541-556. [19] Ponsonnet, L., Comte, V., Othmane, A., Lagneau,
C., Charbonnier, M., Lissac, M., Jaffrezic, N., 2002,
[2] Corbett J., McKeown, P.A., Peggs, G.N., Effect of surface topography and chemistry on
Whatmore, R., 2000, Nanotechnology: International adhesion, orientation and growth of fibroblasts on
developments and emerging products, Annals of the nickel-titanium substrates, Materials Science and
CIRP, 49/2:523-546. Engineering: C, Vol.21, Issue 1-2, 157-165.
[3] Masuzawa, T., 2000, State of the art of [20] Rnold, H. J., Ellingsen, J. E., 2002, Effect of micro-
micromachining, Annals of the CIRP, 49/2:473-488. roughness produced by TiO2 blasting-tensile testing
[4] De Chiffre, L., Lonardo, P.M., Trumpold, H., Lucca, of bone attachment by using coin-shaped implants,
D.A., Goch, G., Brown, C.A., Raja, J., Hansen, H.N., Biomaterials, Vol.23, Issue 21, 4211-4219.
2000, Quantitative characterisation of surface [21] Sul, Y. T., Johansson, C. B., Roser, K., Albrektsson,
texture, Annals of the CIRP, 49/2:635-652. T., 2002, Qualitative and quantitative observations of
[5] Lonardo, P.M., Lucca, D.A., De Chiffre, L., 2002, bone tissue reactions to anodised implants,
Emerging trends in surface metrology, Annals of the Biomaterials, Vol.23, Issue 8, 1809-1817.
CIRP, 51/2:701-723. [22] Mitura, S., Mitura, A., Niedzielski, P., Couvrat, P.,
[6] Swiss National Research Program Nanosciences 1999, Nanocrystalline Diamond Coatings, Chaos,
National Research Program Nr. 36. Final Solitons & Fractals, Vol.10, Issue 12, 2165-2176.
Summary, 2000. The report is available on
http://www.snf.ch. [23] Onate, J. I., Comin, M., Braceras, I., Garcia, A.,
Viviente, J. L., Brizuela, M., Garagorri, N., Peris, J.
[7] Semiconductor Industry Association (2001). L., Alava, J. I., 2001, Wear reduction effect on ultra-
"International Technology Roadmap for high-molecular-weight polyethylene by application of
Semiconductors (ITRS)." hard coatings and ion implantation on cobalt
http://public.itrs.net/Files/2001ITRS/Home.htm. chromium alloy, as measured in a knee wear
[8] Komvopoulos, K., 1996, Surface engineering and simulation machine, Surface and Coatings
microtribology for microelectromechanical systems, Technology, Vol.142-144, 1056-1062.
Wear, Vol.200, 305-327. [24] Gaggl, A., Schultes, G., Mller, W. D., Krcher, H.,
[9] Bandorf, R.,Luthje, H., Schiffmann, K., Staedler, T., 2000, Scanning electron microscopical analysis of
Wortmann, A., 2002, Sub-micron coatings with low laser-treated titanium implant surfaces*a
friction and wear for micro actuators, Microsystem comparative study, Biomaterials, Vol.21, Issue 10,
Technologies, 51-54. 1067-1073.
[10] Kazemo, B., 2002, Biological surface science, [25] Hbler, R., 1999, Hardness and corrosion protection
Surface Science, Vol. 500, 656-677. enhancement behaviour of surgical implant surfaces
[11] Lee, L. P., Berger, S. A., Liepmann, D., Pruitt, L., treated with ceramic thin films, Surface and Coatings
1998, High aspect ratio polymer microstructures and Technology, Vol. 116119, 11111115.
cantilevers for bioMEMS using low energy ion beam [26] Born, M. and Wolf, E., Principles of optics,
and photolithography, Sensors and Actuators A: Cambridge University Press, 6th edition 1980 section
Physical, Vol.71, Issue.1-2, 144-149. 9.1
[12] Ruhmann, R., Pfeiffer, K., Falenski, M., Reuther, F., [27] Bennett, J.M., Mattsson, L., 1989, Introduction to
Engelke, R., Grutzner, G., 2002, SU-8 - a high Surface Roughness and Scattering, Optical Society
performance material for MEMS applications, MST of America.
News, Issue 1-2, 45-46. [28] http://www.astro.lu.se/~torben/euro50/technical_note
[13] Pan, Y. V., Hanein, Y., Leach-Scampavia, D., s/New_Study_Report_V_26.pdf.
Bohringer, K. F., Ratner, B. D., Denton, D. D., 2001, [29] Wolter, H. Mirror systems with grazing incidence as
A precision technology for controlling protein image-forming optics for x-rays. Ann. Phys. 6th
adsorption and cell adhesion in bioMEMS, MEMS Series, 10, 94-114.
2001. The 14th IEEE International Conference on
Micro Electro Mechanical Systems, 435-438. [30] Franks, A., 1977, X-ray optics, Sci. Prog. Oxf., 64,
371-422.
[14] www.advalytix.de
[31] Engdahl, R.E., Chemical vapour deposited (CVD)
[15] Maillefer, D., Gamper, S., Frehner, B., Balmer, P., silicon carbide mirror technology, Reflecting Optics
Van Lintel, H., Renaud, P., 2001, A high- for Synchrotron Radiation, 1981, Proc. SPIE, 315,
performance silicon micropump for disposable drug 123-130.
delivery systems, Micro Electro Mechanical
Systems, 2001. MEMS 2001. The 14th IEEE [32] Lindsey, K., 1984, The attainable limits in x-ray
International Conference on Micro Electro mirror fabrication, Nuc. Instrum. Meth. Phys. Res., A,
Mechanical Systems 413 -417. Vol.221, Issue 1, 14-19.
[33] Downs, M.J., Mason, N.M. and Nelson, J.C.C., 1989,
Measurement of the profiles of super-smooth
surfaces using optical interferometry, Proc. SPIE, [49] http://www.fuelcells.org
1009, 14-17. [50] Fei Li, Hai-yan Chen, Chun-ming Wang, Ke-ao Hu,
[34] Underwood, J.H. and Attwood, D.T., 1984, The 2002, A novel modified NiO cathode for molten
renaissance of x-ray optics, Physics Today, 44-52. carbonate fuel cells, Journal of Electroanalytical
[35] Rudolph, D., Niemann, B., Schmahl, G. and Christ, Chemistry, 531, 53 /60.
O. The Gottingen x-ray microscope and x-ray [51] http://www.botanik.uni-
microscopy experiments at the BESSY storage ring, bonn.de/system/bionik_flash.html
1984, in: X-ray Microscopy, Eds. G. Schmahl and D. [52] Yu, J., and Namba, Y., 1998, Atomic surface
Rudolph, Springer Series in Optical sciences, 43, roughness, Appl. Physics Letters, Vol. 73, Issue 24,
192-202. 3607-3609.
[36] Morris, D., Buckley, C.J., Morrison, G.R., Michette, [53] Namba, Y., Yu J., Bennett, J., Yamashita, K., 2000,
A.G., Anastasi, P.A.F., Browne, M.T., Burge, R.E., Modeling and measurements of atomic surface
Charalambous, P.S., Foster, G.F., Palmer, J.R. and roughness, Appl. Optics, Vol. 39, Issue 16, 2705-
Duke, P.J., 1991, Recent advances in scanning x- 2718.
ray microscopy, Scanning, 13, 7-12.
[54] Kning, R., Jusko, O., Koenders, L., 1996,
[37] Jacobsen, C., Abend, S., Beetz, T., Carlucci- Systematic investigations of nanostructuring by
Dayton, M., Fezer, M., Kaznacheyev, K., Kirz, J., scanning tunneling microscopy, J. Vac. Sci.
Maser, J., Neuhausler, U., Osanna, A., Stein, A., Technol., Vol. 14, Issue 1, 48-53.
Vaa, C., Wang, Y., Winn, B. and Wirick, S., 2000,
Recent developments in scanning microscopy at [55] Koenders, L., Sbosny, H., Hietschold, M., in Ed. M.
Stony Brook, X-ray Microscopy: Proceedings of the Bonis, Y. Alayli, P. Revel, P. A: McKeown, J. Corbett:
Sixth International Conference, Eds: W. Meyer-Ilse, Proc. of 8th IPES, Compiegne, France, May 1995,
T. Warwick and D. Attwood. CP507,American 199.
Institute of Physics, 12-18. [56] Koenders, L., Moriarty, P., Hughes, G., Jusko, O.,
[38] Schneider, G., 1998, Cryo x-ray microscopy with 1993, Vacancy creation on the Si (111) 7 x 7
high spatial resolution in amplitude and phase surface due to sulphur desorption studied by
contrast, Ultramicroscopy, 75, 85-104. scanning tunnelling microscopy, Surface Science
Letters, 297/3, L113- L118.
[39] Meyer-Ilse, W., Medecki, H., Brown, J.T., Heck,
J.M., Anderson, E.H., Stead, A., Ford, T., Balhorn, [57] Lucca, D.A., Brinksmeier, E., Goch, G., 1998,
R., Petersen, C., Magowan, C., Attwood, D.T., Progress in assessing surface and subsurface
1998, X-ray Microscopy at Berkeley, X-ray integrity, Annals of the CIRP, 47/2:669-693.
Microscopy and Spectromicroscopy, Eds: J. [58] Tromas, C., Colin, J., Coupeau, C., Girard, J. C.,
Thieme, G. Schmahl, D. Rudolph and E. Umbach, Woirgard, J. and Grilhe, J., 1999, Pop-in
Springer-Verlag, 13-112. Phenomenon During Nanoindentation in MgO, The
[40] Jacobsen, C., 1999, Soft x-ray microscopy, Trends European Physical Journal, 8: 123-128.
in Cell Biology, 9, 44-47. [59] Gerberich, W. W., Nelson, J. C., Killeodden, E. T.,
Anderson, P. and Wyrobek, J. T., 1996, Indentation
[41] Berglund, M., Rymell, L., Peuker, M., Wilhein, T. Induced Dislocation Nucleation: The Initial Yield
and Hertz, 2000, H.M. Compact water-window Point, Acta Materiala, 44: 3585-3598.
transmission x-ray microscopy. J. Microscopy, 197, [60] Leipner, H. S., Lorenz, D., Zeckzer, A. and Grau, P.,
268-273. 2001, Dislocation-Related Pop-in Effect in Gallium
[42] Rarback, H., Kenny, J.M., Kirz, M, Howells, M.R., Arsenide, Physica Status Solidi (A), 183: R4-R6.
Chang, P., Coane, P.J., Fedrer, R., Houzego, P.J., [61] Lucca, D.A., Klopfstein, M.J., Ghisleni, R. and
Kern, D.P. and Sayre, D., 1984, Some recent Cantwell, G., 2002, Investigation of Polished Single
results from the Stony Brook scanning microscope, Crystal ZnO by Nanoindentation, Annals of the CIRP,
in: X-ray Microscopy, Eds. G. Schmahl and D. 51/1: 483-486.
Rudolph, Springer Series in Optical Sciences, 43, [62] Gken, M. and Kempf, M., 1999, Microstructural
203-216. Properties of Superalloys Investigated by
[43] Barbee, T.W., 1984, Multilayers for x-ray optical Nanoindentations in an Atomic Force Microscope,
applications, X-ray Microscopy, Eds. G. Schmahl Acta Materiala, 47: 1043-1052.
and D. Rudolph, Springer Series in Optical [63] Bouzakis, K., Michailidis, N., Hadjiyiannis, S.,
Sciences, 43, 144-162. Skordaris, G., Erkens, G., 2002, A continuous FEM
simulation of the nanoindentation to determine actual
[44] Spiller, E. Evapourated multilayer dispersion indenter tip geometries, material elastoplastic
elements for soft x-rays, 1981, in: Low Energy X-ray deformation laws and universal hardness. Z.
Diagnostics, Eds: D.T. Attwood and B.L. Henke, AIP Metallkd. 93, 9, 862-869.
Conference Proceedings 75, 124-130, AIP, New
York. [64] Fleck, N. A. and Hutchinson, J. W., 2001, A
Reformulation of Strain Gradient Plasticity, Journal of
[45] Windt, D.L., Waskiewicz, W.K. and Griffith, J.E. the Mechanics and Physics of Solids, 49: 2245-2271.
Surface finish requirements for soft x-ray mirrors. [65] Fleck, N. A., Muller, G. M., Ashby, M. F. and
Appl.Opt. 1994, 33, (10), 2025-2031. Hutchinson, J. W., 1994, Strain Gradient Plasticity:
[46] Moller S., Forrest , 2002, Microlens arrays for OLED Theory and Experiment, Metallurgica Materialia, 42:
display and lighting applications, MST News, 1-2, 475-487.
39-40. [66] Ma, Q. and Clarke, D. R., 1995, Size Dependent
[47] http://www.topsoe.dk/ Hardness of Silver Single Crystals, Journal of
Materials Research, 10: 853-563.
[48] Bell, A.T., 2003, The impact of nanoscience on
[67] Nix, W. D. and Gao, H., 1998, Indentation Size
heterogeneous catalysis, Science, Vol. 299, 1688-
1691. Effects in Crystalline Materials: A Law for Strain
Gradient Plasticity, Journal of the Mechanics and [83] Karlsson, L., Hultman, L., Johansson, M. P.,
Physics of Solids, 46: 411-425. Sundgren, J.-E., Ljungcrantz, H., Growth, 2000,
[68] Elmustafa, A.A., Stone, D.S., 2003, Nanoindentation Microstructure, and Mechanical Properties of Arc
and the Indentation Size Effect: Kinetics of Evaporated TiCxN1-X(0<=x<=1) Films; Surface and
Deformation and Strain Gradient Plasticity, J. of the Coatings Technology 126, 1-14.
Mechanics and Physics of Solids, 51: 357-381. [84] Karlsson, L., Hultman, L., Sundgren, J.-E., 2000,
[69] Wolf, B., Belger, A., Meyer, D. C. and Paufler, P., Influence of Residual Stresses on the Mechanical
2001, On the Impact of Light on Nanoindentation of Properties of TiCxN1-X (x=0, 0.15, 0.45) Thin Films
Znse, Physica Status Solidi A, 187: 415-426. Deposited by Arc Evaporation; Thin Solid Films, 371,
[70] Wolf, B., Meyer, D., Belger, A. and Paufler, P., 167-177.
2002, Photoplastic Effects in Nanoindentation [85] Kusano, E., Kitagawa, M., Nanto, H., Kinbara, 1998,
Experiments, Philosophical Magazine A, 82: 1865- A., Hardness Enhancement by Compositionally
1872. Modulated Structure of Ti/TiN Multilayer Films;
[71] Klopfstein, M. J., Lucca, D. A. and Cantwell, G., Journal of Vacuum Sicence Technology A, 16, 1272-
2003, Effects of Illumination on the Response of 1276.
(0001)ZnO to Nanoindentation, physica status solidi [86] Li, X., Diao, D., Bhushan, B., 1997, Fracture
(a), 196: R1-R3. Mechanisms of Thin Amorphous Carbon Films in
[72] Osip'Yan, Y. A., Petrenko, V. F., Zaretskii, A. V. and Nanoindentation; Acta Materialia, 45, 4453-4461.
Whitworth, R. W., 1986, Properties of II-VI [87] Li, X., Bhushan, B., 1999, Evaluation of Fracture
Semiconductors Associated with Moving Toughness of Ultra-Thin Amorphous Carbon
Dislocations, Advances In Physics, 35: 115-188. Coatings Deposited by Different Deposition
[73] Schneider, D., Schultrich, B., 1996, Dnne Techniques; Thin Solid Films, 355-356, 330-336
Schichten zerstrungsfrei prfen, Metalloberflche, [88] Ding, J., Meng, Y., Wen, S., 2000, Mechanical
50, 43-48. Properties and Fracture Toughness of Multilayer
[74] Bouzakis, K.-D., Lontos, A., Michailidis, N., Knotek, Hard Coatings Using Nanoindentation; Thin Solid
O., Lugscheider, E., Bobzin, K., Etzkorn, (in press), Films, 371, 178-182.
Determination of mechanical properties of electron [89] Scharf, T. W., Deng, H., Barnard, J. A., 1997,
beam-physical vapour deposition-thermal barrier Mechanical and Fracture Toughness Studies of
coatings (EB-PVD-TBCs) by means of Amorphous SiC-N Hard Coatings Using
nanoindentation and impact testing, Surface and Nanoindentation; Journal of Vacuum Science and
Coatings Technology. Technology A, 15, 963-967
[75] Paterson, M. J., Paterson, P. J. K., Ben-Nissan, B., [90] Sanchez, J. M., El-Mansy, S., Sun, B., Scherban, T.,
1998, The Dependence of Structural and Fang, N., Pantuso, D., Ford, W., Elizalde, M. R.,
Mechanical Properties on Film Thickness in Sol-Gel Martinez-Esnaola, J. M., Martin-Meizoso, A., Gil-
Zirconia Films; Journal of Materials Research 13, Sevillano, J., Fuentes, M., Maiz, J., 1999, Cross-
388-395. Sectional Nanoindentation: A New Technique for
[76] Olofinjana, A. O., Bell, J. M., Jamting, A. K., 2000, Thin Film Interfacial Adhesion Characterization; Acta
Evaluation of the Mechanical Properties of Sol-Gel- Materialia, 47, 4405-4413.
Deposited Titania Films Using Ultra-Micro- [91] Hammer, B., Nrskov, J.K., 2000, Theoretical
Indentation Method; Wear 241, 174-179. surface science and catalysis calculations and
[77] Tsui, T. Y., Pharr, G. M., 1999, Substrate Effects on concepts, Advances in Catalysis, 45, 71.
Nanoindentation Mechanical Property Measurment [92] Dahl, S., Logadottir, A., Egeberg, R.C., Larsen, J.H.,
of Soft Films on Hard Substrates; Journal of Chorkendorff, I., Trnqvist, E., Nrskov, J.K.,1999,
Materials Research 14, 292-301. Phys. Rev. Lett. 83, 1814.
[78] Chan, C. M., Cao, G. Z., Fong, H., Sarikaya, M., [93] Hansen, P.L., Wagner, J.B., Helveg, S., Rostrup-
Robinson, T., Nelson, L.; 2000, Nanoindentation Nielsen, J.R., Clausen, B.S., Topse, H., 2002,
and Adhesion of Sol-Gel-Derived Hard Coatings on Atom-Resolved Imaging of Dynamic Shape Changes
Polyester; Journal of Materials Research 15, 148- in Supported Copper Nanocrystals Science, 295,
154. 2053.
[79] Lugscheider, E., Barimani, C., Lake, M., 1998, [94] Lauritsen, J. V., Helveg, S., Lgsgaard, E.,
Mechanical Properties of Ti(C,N) and TiN Thin Films Steensgaard, I., Clausen, B. S., Topse, H., and
on Cutting Tools Measured by Nanoindentation; Besenbacher F., 2001, Atomic-Scale Structure of
Materials Research Society Symposium CoMoS Nanoclusters , Hydrotreating Catalysts J.
Proceedings 522, 311-316. Catal 197/1.
[80] Shima, Y., Hasuyama, H., Kondoh, T., Imaoka, Y., [95] Topse, H., 2000, In Situ Characterization of
Watari, T., Baba, K., Hatada, R., 1999, Mechanical Catalysts Stud. Surf. Sci. Catal. 130, 1.
Properties of Silicon Oxynitride Thin Films Prepared [96] Besenbacher, F., Chorkendorff, I., Clausen, B. S.,
by Low Energy Ion Beam Assisted Deposition; Hammer, B., Molenbroek, A. M., Nrskov, J. K.,
Nuclear Instruments and Methods in Physics Stensgaard, I., 1998, Design of a Surface Alloy
Research B 148, 599-603. Catalyst for Steam Reforming, Science 279, 20,
[81] Shojaei, O. R., Karimi, A., 1998, Comparison of 1913.
Mechanical Properties of Tin Thin Films Using [97] Brinksmeier, E., Preu, W., Schmtz, J., 1998,
Nanoindentation and Bulge Test; Thin Solid Films Manufacture of microstructures by ultrasonic lapping.
332, 202-208. Proceedings of the 13th Annual Meeting of the
[82] Torri, P., Hirvonen, J.-P., Kung, H., Lu, Y.-C., ASPE, S. 169-172.
Nastasi, M., Gibson, P. N., 1999, Mechanical [98] Brinksmeier, E., Malz, R., Preu, W., 2000,
Properties, Stress Evolution and High-Temperature Investigation of a novel tool concept for ductile
Thermal Stability of Nanolayered Mo-Si-N/SiC Thin grinding of optical glass. Proceedings ASPE, Annual
Films; Journal of Vacuum Science Technology B 17, Meeting, S. 74-77.
1329-1335.
[99] Brinksmeier, E., Schmtz, J., 2000, Dynamic forces [113] Inamura, T., Shimada, S., Takezawa, N., Ikawa, N.,
and energy dissipation in vibration diamond cutting 1999, Crack initiation in machining monocrystalline
of copper. Proceedings of the 15th ASPE Annual silicon, Annals of the CIRP, 48/1: 81-84.
Meeting, Vol. 22, S. 592 - 595. [114] Inamura, T., ,Feng, G.Y., Takezawa, N., Mohri, N.,
[100] Brinksmeier, E., Preu, W., Gessenharter, A., 2001, Effect of surface oxidation on
Trumpold, H., Frenzel, C., 2001, Ultraprzise micromachinability of monocrystalline silicon, Annals
Fertigung von Kalibriernormalen fr of the CIRP, 50/1: 393-396.
Oberflchenmesssys-teme, Hrterei-Technische [115] Inamura, T, Takezawa, N, Shimada, S., 2002,
Mitteilungen 56, 134. Importance of micro/macro interaction in the
[101] Brinksmeier, E., Riemer, O., Stern, R., 2001, mechanism of brittle mode cutting, Annals of the
Machining of precision parts and microstructures. CIRP, 51/1: 487-500.
Proceedings of the 10th International Conference on [116] Shimada, S., Ikawa, N., Tanaka, H., 1994, Structure
Precision Engineering (ICPE), Initiatives of of micromachined surface simulated by molecular
Precision Engineering at the Beginning of a dynamics analysis, CIRP 43/1: 51-54.
Millennium, Japan, 3 11.
[117] Shimada, S., Inoue, R., Uchikoshi, J., Ikawa, N.,
[102] Brinksmeier, E., Preu, W., Autschbach, L., 2002, 1995, Molecular dynamics analysis on microstructure
Diamond Contour Boring and Ball-end Milling of of diamond-turned surfaces, SPIE Vol. 2576, 396-
Microstructures. Proceedings of the 3rd euspen Int. 405.
Conf. - Eindhoven, The Netherlands, 2, 423-426.
[118] Shimada, S., Tanaka, H., Ikawa, N., 1999, Atomistic
[103] Ikawa, N., Donaldson, R.R., Komanduri, R., Knig, Mechanism of Surface Generation in Micromachining
W., McKeown, P.A., Moriwaki, T., Stowers, I.F., of Monocrystalline Silicon, Proceedings of 1st
1991, Ultraprecision metal cutting The past, the International Conference of the European Society for
present and the future, Annals of the CIRP, Precision Engineering and Nanotechnology
40/2:587-594. (euspen), Bremen, Germany, 230-233.
[104] Bryan, J, 1990, International Status of Thermal Error [119] Tanaka, H., Shimada, S., Ikawa, N., 2000, An ideal
Research. Annals of the CIRP, 39/2, 645-656. surface processing of monocrystalline silicon for
[105] Donaldson, R.R., Patterson, S.R., 1983, Design and minimal surface roughness and damage predicted by
rd
Construction of a Large Vertical Axis Diamond molecular dynamics analysis, Proceedings of the 3
Turning Machine (LODTM), Proc. SPIE Tech. Int. Symposium on Advances in abrasive technology,
Symposium, 433-438, UCRL. 89738. Honolulu, 205-210.
[106] Corbett, J., D.J. Stephenson, J. Sweet, W.J. Wills- [120] Golini, D., DeMarco, M., Kordonski, W., Bruning, J.,
Moren, 1999, An Ultra Precision Machine Tool 2001, MRF polishes calcium fluoride to high quality,
Structure Demonstrating a Novel Vibration Resistant July 2001 edition of Optoelectronics World, a
Structure. Proceedings of 1st International supplement to Laser Focus World, Penn Well
Conference of the European Society for Precision corporation.
Engineering and Nanotechnology (euspen), [121] Walker, D.D., Freeman, R., Mc Cavana, G., Morton,
Bremen, Germany, 159-162. R., Riley, D., Simms, J., Brooks, D., King, A., The
[107] Abe, K., Sho I., Yoshiyuri T., 2000, Development of First Aspheric Form and Texture Results From a
a Ductile Mode Double Disk Grinding Machine with Production Machine Embodying the Precession
Trigonal Prism Type Pentahedral Structure for Process, Proc. SPIE, Vol. 4451, 267-276.
Super-Large and Super-Flat Silicon Wafer. [122] Walker,D.D., Freeman, R., Mc Cavana, G., Morton,
Proceedings of the 1st Topical Conference on R., Riley, D., Simms, J., Brooks, D., King, A., 2001,
Fabrication and Metrology in Nanotechnology, The Zeeko/UCL Process for Polishing Large Lenses
Copenhagen, Technical University of Denmark, and Prisms, Proc. Large Lenses and Mirrors
IPT.028.00, 1, 26-33. Conference, London, March 27-30, 106-111.
[108] Stephenson, D.J., D. Veselovac, S. Manley and J. [123] Walker, D.D., Beaucamp, A.T.H., Bingham, R.G.,
Corbett , 2001, Ultra precision grinding of hard Brooks, D., Freeman, R., Kim, S.W., King, A.,
steels, Precision Engineering, Vol. 25, Issue 4, 336- McCavana, G., Morton, R., Riley, D., Simms, J.,
345. 2002, The Precessions process for efficient
[109] McKeown, P.A., K. Carlisle, P. Shore, and R.F.J. production of aspheric optics for large telescopes
Read, 1990, Ultra-precision High Stiffness CNC and their instrumentation, Proc. SPIE, Vol. 4842, 73-
Grinding Machines for Ductile Mode Grinding of 84.
Brittle Materials, SPIE, 1320, Infrared Technology [124] Walker, D.D., Beaucamp, A.T.H., Brooks, D.,
and Application, 301-313. Freeman, R., King, A., McCavana, G., Morton, R.,
[110] Inamura, T. and Takezawa, N. and Taniguchi, Riley, D., Simms, J., Novel CNC polishing process
N.,1992, Atomic-scale cutting in a computer using for control of form and texture on aspheric surfaces
crystal models of copper and diamond, Annals of Proc. SPIE, Vol. 4767, 99-105.
the CIRP, 41/1: 121-124. [125] Roth, S., Geiger, M., 2000, Novel technique for high-
[111] Inamura, T. and Takezawa, N. and Sata, T., 1993, quality microstructuring with excimer lasers. SPIE
Mechanics and energy dissipation in nanoscale Vol. 3933: Laser Applications in Microelectronic and
cutting, Annals of the CIRP, 42/1: 79-82. Optoelectronic Manufacturing, 338-346.
[112] Inamura, T., Takezawa, N., Kumaki, Y. and Sata, T., [126] Eer, G., Dietel, C., Roth, S., Glasmacher, M.,
1994, On a possible mechanism of shear Renner, G., Kickelhain, J., 1998, Laser Assisted
deformation in nanoscale cutting, Annals of the Techniques for Patterning of Conductive tracks on
CIRP, 43/1: 47-50. Molded Interconnect Devices. In: Proceedings of the
3rd PanPacific Microelectronics Symposium 1998,
Hawaii, 225-233.
[127] Eer, G., Geiger, M., 2002, Laser assisted [141] Mori, Y., Yamauchi, K., Sugiyama, K., Inagaki, K.,
generation of electronic circuits on tailored Shimada, S., Uchikoshi, J., Mimura, H., Imai, T. and
thermoplastics, Proceedings of the SPIE, Vol. 4831, Kanemura, K., 1999, Development of Numerically
517-525. Controlled EEM (Elastic Emission Machining)
[128] Maboudian, R., Ashurst, W. R., Carraro, C., 2002, System for Ultraprecision Figuring and Smoothing of
Tribological Challenges in Micromechanical Aspherical Surfaces, in Precision Science and
Systems Vol.12, Issue 2, 95-100. Technology for Perfect Surfaces, Eds. Y. Furukawa,
Y. Mori and T. Kataoka, 9th International Conference
[129] Maboudian, R., Howe, R. T., 1997, Stiction on Production Engineering (9th ICPE), Osaka,
reduction processes for surface micromachines,
Japan, 207-212.
Tribology Letters, Vol.3, Issue 3, 215-221. [142] Yamauchi, K., Mimura, H., Inagaki, K. and Mori, Y.,
[130] Piotter, V., Hanemann, T., Ruprecht, R., Hausselt, 2002, Figuring with Subnanometre-Level Accuracy
J., 2002, Micro injection moulding of medical by Numerically Controlled Elastic Emission
devices components, Medical Devices Machining, Review of Scientific Instruments, 73:
Manufacturing & Technology, 1-4. 4028-4033.
[131] Becker, H., Heim, U., 2000, Hot embossing as a [143] Mori, Y., Yamauchi, K. and Endo, K., 1987, Elastic
method for the fabrication of polymer high aspect Emission Machining, Prec. Eng., 9: 123-128.
ratio structures, Vol.83, Issue 1-3, 130-135. [144] Fechner, R., Schindler, A., Haensel, T. and Bigl, F.,
1999, Sub-Nanometre Polishing of Optical Surfaces
[132] Xuefeng, W., Liang-Hsuan, L., Chang, L., 2001,
by Ion Beam Planarization Technique, in Precision
Micromachining techniques for liquid crystal
Science and Technology for Perfect Surfaces, Eds.
polymer, The 14th IEEE International Conference
MEMS 2001, 126-130. Y. Furukawa, Y. Mori and T. Kataoka, 9th
International Conference on Production Engineering
[133] Zahn, J. D., Gabriel, K. J., Fedder, G. K., 2002, A (9th ICPE), Osaka, Japan, 249-254.
direct plasma etch approach to high aspect ratio [145] Mercier, R., Mullot, M., Lamare, M. and Tissot, G.,
polymer micromachining with applications in 2001, Ion Beam Milling Fabrication of a Small Off-
BIOMEMS and CMOS-MEMS, The Fifteenth IEEE Axis Ellipsoidal Mirror, Difraction Limited to 1 M
International Conference MEMS 2002, 137-140. Resolution at 14 nm, Review of Scientific
[134] Vaidya, B., Soper, S. A., McCarley, R. L., 2002, Instruments, 72: 1559-1564.
Surface modification and characterization of [146] Johnson, L. F. and Ingersoll, K. A., 1983, Ion
microfabricated poly(carbonate) devices: Polishing with the Aid of a Planarizing Film, Applied
manipulation of electroosmotic flow, The Analyst, Optics, 22: 1165-1167.
Vol.127, Issue10, 1289-1292. [147] Schindler, A., Haensel, T., Flamm, D., Nickel, A.,
[135] Trumpold, H., Frenzel, C., Chetwynd, D.G., Anghel, Thomas, H. J. and Bigl, F., 1999, Nanometre
V., Konejung, K., Reitze, B., Preu, W., Precision (Reactive) Ion Beam Figuring of
Gessenharter, A., De Chiffre, L., Andreasen, J.L., (Aspherical) Optical Surfaces, in Precision Science
Sammartini-Malberg, M.P., Rubert, P., Leach, R., and Technology for Perfect Surfaces, Eds. Y.
Schreiter, S., Breger, P., 2001, Calibration Furukawa, Y. Mori and T. Kataoka, 9th International
standards for surface topography measuring Conference on Production Engineering (9th ICPE),
systems down to the nanometric range, Final report Osaka, Japan, 243-248.
on EC-project SMT4-CT97-2176. [148] Furukawa, Mori, Y. and Kataoka, T., Eds., 1999,
Proceedings of the 9th International Conference on
[136] Mori, Y., Yamamura, K. and Sano, Y., 1999, Slicing Production Engineering (9th ICPE), Osaka, Japan.
of Functional Materials by Plasma CVM (Chemical [149] Thompson, D.A., Best, J.S., 2000, Future of
Vaporization Machining), in Precision Science and magnetic data storage technology, IBM J. Res. Dev.,
Technology for Perfect Surfaces, Eds. Y. Furukawa, Vol. 44, Issue 3, 311-322.
Y. Mori and T. Kataoka, 9th International
Conference on Production Engineering (9th ICPE), [150] Binnig, G., Despont, M., Dechsler, U., Hberle, W.,
Osaka, Japan, 225-230. Lutwyche, M.I., Vettiger, P., Mamin, H.J., Chui, B.W.,
[137] Mori, Y., Yamauchi, K., Yamamura, K. and Sano, Kenny, T.W., 1999, Ultrahigh-Density Atomic Force
Y., 2000, Development of Plasma Chemical Microscopy Data Storage with Erase Capability,
Vaporization Machining, Review of Scientific Appl. Phys. Lett., 74, 1329-1331.
Instruments, 71, 4627-4632. [151] Baski, A. A., 2002, Fabrication of Nanoscale
[138] Mori, Y., Yamamura, K. and Sano, Y., 2000, The Structures using STM and AFM, To be published in
Study of Fabrication of the X-Ray Mirror by Advanced Semiconductor and Organic Nano-
Numerically Controlled Plasma Chemical techniques, Part 3 (edited by Morkoc), Academic
Vaporization Machining: Development of the Press.
Machine for the X-Ray Mirror Fabrication, Review of [152] From K.-F. Braun, K.-H. Rieder, Phys. Rev. Lett. 88,
Scientific Instruments, 71, 4620-4626. 096801 (2002). See also: Braun, K.-F., (2000).
[139] Takino, H., Shibata, N., Itoh, H., Kobayashi, T., Surface Investigations and Atomic Manipulation with
Tanaka, H., Ebi, M., Yamamura, K., Sano, Y. and a Scanning Tunneling Microscope at Low
Mori, Y., 1998, Plasma Chemical Vaporization Temperatures (in German), Ph.D. dissertation, Freie
Machining for Fabrication of Optics, Japanese Universitt Berlin.
Journal of Applied Physics, 37, L894-L896.
[140] Okamoto, S., Maruyama, E., Terakawa, A., [153] The need for measurement and testing in
nanotechnology, 2002, Position paper by the High
Shinohara, W., Nakano, S., Hishikawa, Y.,
Level Expert Group on Measurement and Testing
Wakisaka, K. and Kiyama, S., 2001, Towards
under the European Framework Programme for
Large-Area, High-Efficiency a-Si/a-SiGe Tandem
Solar Cells, Solar Energy Materials & Solar Cells, Research and Development. The report is available
on http://europa.eu.int/comm/research/fp5/eag.html.
66, 85-94.

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