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A7
SENSE AMPS
A6
ROW DECODER
A5
A4 64K x 16
I/O0I/O7
A3 RAM Array
A2 I/O8I/O15
A1
A0
COLUMN DECODER
BHE
WE
A9
A10
A11
A12
A13
A14
A8
A15
CE
OE
BLE
Cypress Semiconductor Corporation 198 Champion Court San Jose, CA 95134-1709 408-943-2600
Document Number: 38-05460 Rev. *H Revised November 24, 2014
CY7C1021DV33
Contents
Selection Guide ................................................................ 3 Ordering Information ...................................................... 12
Pin Configurations ........................................................... 3 Ordering Code Definitions ......................................... 12
Maximum Ratings ............................................................. 4 Package Diagrams .......................................................... 13
Operating Range ............................................................... 4 Acronyms ........................................................................ 15
Electrical Characteristics ................................................. 4 Document Conventions ................................................. 15
DC Electrical Characteristics ....................................... 4 Units of Measure ....................................................... 15
Capacitance ...................................................................... 5 Document History Page ................................................. 16
Thermal Resistance .......................................................... 5 Sales, Solutions, and Legal Information ...................... 18
AC Test Loads and Waveforms ....................................... 5 Worldwide Sales and Design Support ....................... 18
Data Retention Characteristics ....................................... 6 Products .................................................................... 18
Data Retention Waveform ................................................ 6 PSoC Solutions ...................................................... 18
Switching Characteristics ................................................ 7 Cypress Developer Community ................................. 18
Switching Waveforms ...................................................... 8 Technical Support ..................................................... 18
Truth Table ...................................................................... 11
Selection Guide
-10 (Industrial /
Description Unit
Automotive-A)
Maximum access time 10 ns
Maximum operating current 60 mA
Maximum CMOS standby current 3 mA
Pin Configurations
SOJ, TSOP II and VFBGA pinouts are as follows. [1]
Note
1. NC pins are not connected on the die.
Electrical Characteristics
Over the Operating Range
DC Electrical Characteristics
Over the Operating Range
-10 (Industrial /
Parameter Description Test Conditions Automotive-A) Unit
Min Max
VOH Output HIGH voltage VCC = Min, IOH = 4.0 mA 2.4 V
VOL Output LOW voltage VCC = Min, IOL = 8.0 mA 0.4 V
VIH Input HIGH voltage 2.0 VCC + 0.3 V
VIL Input LOW voltage [2]
0.3 0.8 V
IIX Input leakage current GND < VI < VCC 1 +1 A
IOZ Output leakage current GND < VI < VCC, Output Disabled 1 +1 A
ICC VCC operating supply current VCC = Max, IOUT = 0 mA, 100 MHz 60 mA
f = fMAX = 1/tRC
83 MHz 55 mA
66 MHz 45 mA
40 MHz 30 mA
ISB1 Automatic CE Power-Down Max VCC, CE > VIH, 10 mA
Current TTL Inputs VIN > VIH or VIN < VIL, f = fMAX
ISB2 Automatic CE Power-Down Max VCC, CE > VCC 0.3 V, 3 mA
Current CMOS Inputs VIN > VCC 0.3 V or VIN < 0.3 V, f = 0
Note
2. VIL(min) = 2.0 V and VIH(max) = VCC + 1 V for pulse durations of less than 5 ns.
Capacitance
Parameter [3] Description Test Conditions Max Unit
CIN Input capacitance TA = 25 C, f = 1 MHz, VCC = 3.3 V 8 pF
COUT Output capacitance 8 pF
Thermal Resistance
Parameter [3] Description Test Conditions SOJ TSOP II VFBGA Unit
JA Thermal resistance Still Air, soldered on a 3 4.5 59.52 53.91 36 C/W
(junction to ambient) inch, four-layer printed circuit
board
JC Thermal resistance 36.75 21.24 9 C/W
(junction to case)
(c)
Notes
3. Tested initially and after any design or process changes that may affect these parameters.
4. AC characteristics (except High Z) are tested using the load conditions shown in Figure 1 (a). High Z characteristics are tested for all speeds using the test load
shown in Figure 1 (c).
CE
Notes
5. Tested initially and after any design or process changes that may affect these parameters.
6. Full device operation requires linear VCC ramp from VDR to VCC(min) > 50 s or stable at VCC(min) > 50 s.
Switching Characteristics
Over the Operating Range
-10 (Industrial /
Parameter [7] Description Automotive-A) Unit
Min Max
Read Cycle
tpower[8] VCC(typical) to the first access 100 s
tRC Read cycle time 10 ns
tAA Address to data valid 10 ns
tOHA Data hold from address change 3 ns
tACE CE LOW to data valid 10 ns
tDOE OE LOW to data valid 5 ns
[9]
tLZOE OE LOW to low Z 0 ns
[9, 10]
tHZOE OE HIGH to high Z 5 ns
[9]
tLZCE CE LOW to low Z 3 ns
tHZCE CE HIGH to high Z [9, 10] 5 ns
tPU[11] CE LOW to power-up 0 ns
tPD[11] CE HIGH to power-down 10 ns
tDBE Byte Enable to data valid 5 ns
tLZBE Byte Enable to low Z 0 ns
tHZBE Byte Disable to high Z 6 ns
[12, 13]
Write Cycle
tWC Write cycle time 10 ns
tSCE CE LOW to write end 8 ns
tAW Address set-up to write end 8 ns
tHA Address hold from write end 0 ns
tSA Address set-up to write start 0 ns
tPWE WE pulse width 7 ns
tSD Data set-up to write end 5 ns
tHD Data hold from write end 0 ns
[9]
tLZWE WE HIGH to low Z 3 ns
tHZWE WE LOW to high Z [9, 10] 5 ns
tBW Byte enable to end of write 7 ns
Notes
7. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V.
8. tPOWER gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access can be performed.
9. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
10. tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in (c) of Figure 1 on page 5. Transition is measured when the outputs enter a high impedance state.
11. This parameter is guaranteed by design and is not tested.
12. The internal Write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE/BLE LOW. CE, WE and BHE/BLE must be LOW to initiate a Write and
the transition of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates
the Write.
13. The minimum write pulse width for Write Cycle No. 3 (WE Controlled, OE LOW) should be equal to the sum of tSD and tHZWE.
Switching Waveforms
Figure 3. Read Cycle No. 1 (Address Transition Controlled) [14, 15]
tRC
RC
ADDRESS
tAA
tOHA
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE tLZOE
tHZCE
tDBE
tLZBE
tHZBE
HIGH
HIGH IMPEDANCE IMPEDANCE
DATA OUT DATA VALID
tLZCE
tPD
VCC tPU ICC
SUPPLY 50% 50%
ISB
CURRENT
Notes
14. Device is continuously selected. OE, CE, BHE and/or BLE = VIL.
15. WE is HIGH for Read cycle.
16. Address valid prior to or coincident with CE transition LOW.
tWC
ADDRESS
tSA tSCE
CE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD tHD
tWC
ADDRESS
tSA tBW
BHE, BLE
tAW
tHA
tPWE
WE
tSCE
CE
tSD tHD
Notes
17. Data I/O is high impedance if OE or BHE and/or BLE = VIH.
18. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tLZWE
Note
19. The minimum write pulse width should be equal to the sum of tSD and tHZWE.
Truth Table
CE OE WE BLE BHE I/O0I/O7 I/O8I/O15 Mode Power
H X X X X High-Z High-Z Power-down Standby (ISB)
L L H L L Data Out Data Out Read All bits Active (ICC)
L H Data Out High-Z Read Lower bits only Active (ICC)
H L High-Z Data Out Read Upper bits only Active (ICC)
L X L L L Data In Data In Write All bits Active (ICC)
L H Data In High-Z Write Lower bits only Active (ICC)
H L High-Z Data In Write Upper bits only Active (ICC)
L H H X X High-Z High-Z Selected, outputs disabled Active (ICC)
L X X H H High-Z High-Z Selected, outputs disabled Active (ICC)
Ordering Information
Speed Package Operating
Package Type
(ns) Ordering Code Diagram Range
10 CY7C1021DV33-10VXI 51-85082 44-pin (400-Mil) Molded SOJ (Pb-free) Industrial
CY7C1021DV33-10ZSXI 51-85087 44-pin TSOP Type II (Pb-free)
CY7C1021DV33-10BVXI 51-85150 48-ball VFBGA (Pb-free)
10 CY7C1021DV33-10ZSXA 51-85087 44-pin TSOP Type II (Pb-free) Automotive-A
Please contact your local Cypress sales representative for availability of these parts.
CY 7 C 1 02 1 D V33 - XX XX X X
Temperature Range: X = I or A or E
I = Industrial; A = Automotive-A; E = Automotive-E
Pb-free
Package Type: XX = V or ZS or BV
V = 44-pin Molded SOJ
ZS = 44-pin TSOP Type II
BV = 48-ball VFBGA
Speed: XX = 10 ns or 12 ns
V33 = Voltage range (3 V to 3.6 V)
D = C9, 90 nm Technology
1 = Data width 16-bits
02 = 1-Mbit density
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Package Diagrams
Figure 8. 44-pin SOJ (400 Mils) V44.4 Package Outline, 51-85082
51-85082 *E
51-85087 *E
51-85150 *H
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