Professional Documents
Culture Documents
48 001
Technical Reference and Operating Manual
USM 35X
Unfold this page. You will find an overview of the USM 35X function groups and operators controls.
This information will help you to quickly find your way through the operating manual.
This issue 01, 04/2005 applies to the following software versions:
USM 35X V.01.00.3x with Data Logger option: V.01.01.3x
USM 35X DAC V.01.10.3x with Data Logger option: V.01.11.3x
USM 35X S V.01.20.3x with Data Logger option: V.01.21.3x
Subject to change without notice.
Contents
1 Introduction ........................................ 1-1 1.3 The USM 35X family .................................. 1-8
The different instrument versions ................ 1-8
1.1 Safety information ..................................... 1-2
Special features .......................................... 1-9
Batteries ...................................................... 1-2
Software ...................................................... 1-2 1.4 How to use this manual .......................... 1-10
Defects/errors and exceptional stresses ..... 1-3 1.5 Layout and presentation in this
manual ..................................................... 1-11
1.2 Important information on
ultrasonic testing ...................................... 1-3 Attention and Note symbols ...................... 1-11
Preconditions for testing with Listings ..................................................... 1-11
ultrasonic test equipment ............................ 1-3 Operating steps ......................................... 1-11
Operator training .......................................... 1-4
Technical test requirements ........................ 1-4 2 Standard package and
Limits of testing .......................................... 1-5 accessories ........................................ 2-1
Ultrasonic wall thickness measurement ...... 1-5
2.1 Standard package ..................................... 2-3
Effect of the test objects material .............. 1-5
Effect of temperature variations .................. 1-6 2.2 Recommended accessories ..................... 2-5
Measurement of remaining wall
thickness .................................................... 1-6
Ultrasonic evaluation of flaws ..................... 1-6
Flaw boundary method ................................ 1-6
Echo display comparison method ............... 1-7
Contents
1 Introduction ........................................ 1-1 1.3 The USM 35X family .................................. 1-8
The different instrument versions ................ 1-8
1.1 Safety information ..................................... 1-2
Special features .......................................... 1-9
Batteries ...................................................... 1-2
Software ...................................................... 1-2 1.4 How to use this manual .......................... 1-10
Defects/errors and exceptional stresses ..... 1-3 1.5 Layout and presentation in this
manual ..................................................... 1-11
1.2 Important information on
ultrasonic testing ...................................... 1-3 Attention and Note symbols ...................... 1-11
Preconditions for testing with Listings ..................................................... 1-11
ultrasonic test equipment ............................ 1-3 Operating steps ......................................... 1-11
Operator training .......................................... 1-4
Technical test requirements ........................ 1-4 2 Standard package and
Limits of testing .......................................... 1-5 accessories ........................................ 2-1
Ultrasonic wall thickness measurement ...... 1-5
2.1 Standard package ..................................... 2-3
Effect of the test objects material .............. 1-5
Effect of temperature variations .................. 1-6 2.2 Recommended accessories ..................... 2-5
Measurement of remaining wall
thickness .................................................... 1-6
Ultrasonic evaluation of flaws ..................... 1-6
Flaw boundary method ................................ 1-6
Echo display comparison method ............... 1-7
3 Initial start-up ...................................... 3-1 4.3 Keys and rotary knobs .............................. 4-6
Function keys ............................................. 4-6
3.1 Power supply ............................................. 3-2
On/Off key .................................................. 4-6
Operation using the power supply unit ........ 3-2
Special keys ............................................... 4-7
Operation using batteries ............................ 3-3
Rotary knobs ............................................... 4-8
Charging the batteries ................................. 3-5
4.4 Operational concept .................................. 4-8
3.2 Connecting a probe .................................. 3-7
Setting the functions ................................... 4-9
3.3 Starting the USM 35X ................................ 3-8
4.5 Important basic settings ......................... 4-10
Switching on ................................................ 3-8
Selecting the language .............................. 4-10
Reset .......................................................... 3-8
Selecting units .......................................... 4-11
Information lines in the startup screen ........ 3-8
Setting the date ......................................... 4-12
Setting the time ......................................... 4-13
4 Principles of operation ...................... 4-1
4.6 Basic settings of the display .................. 4-14
4.1 Operators controls ................................... 4-2
Selecting the color scheme ....................... 4-14
4.2 Screen display ........................................... 4-3 Setting the lighting .................................... 4-14
Functions on the display ............................. 4-4
Other displays ............................................. 4-5
Contents
3 Initial start-up ...................................... 3-1 4.3 Keys and rotary knobs .............................. 4-6
Function keys ............................................. 4-6
3.1 Power supply ............................................. 3-2
On/Off key .................................................. 4-6
Operation using the power supply unit ........ 3-2
Special keys ............................................... 4-7
Operation using batteries ............................ 3-3
Rotary knobs ............................................... 4-8
Charging the batteries ................................. 3-5
4.4 Operational concept .................................. 4-8
3.2 Connecting a probe .................................. 3-7
Setting the functions ................................... 4-9
3.3 Starting the USM 35X ................................ 3-8
4.5 Important basic settings ......................... 4-10
Switching on ................................................ 3-8
Selecting the language .............................. 4-10
Reset .......................................................... 3-8
Selecting units .......................................... 4-11
Information lines in the startup screen ........ 3-8
Setting the date ......................................... 4-12
Setting the time ......................................... 4-13
4 Principles of operation ...................... 4-1
4.6 Basic settings of the display .................. 4-14
4.1 Operators controls ................................... 4-2
Selecting the color scheme ....................... 4-14
4.2 Screen display ........................................... 4-3 Setting the lighting .................................... 4-14
Functions on the display ............................. 4-4
Other displays ............................................. 4-5
Contents
5.7 Calibrating the USM 35X ......................... 5-17 ANGLE (Angle of incidence) ................... 5-32
Calibrating the display range ..................... 5-17 X-VALUE (X-value of the probe) ................ 5-32
Choosing the measuring point ................... 5-17 COLOR ..................................................... 5-33
Calibration with straight- and THICKNE (Material thickness) .................. 5-33
angle-beam probes .................................... 5-18 DIAMET (Outside diameter of the test
Calibration with dual-element (TR) object) ....................................................... 5-33
probes ....................................................... 5-21
5.12 Data saving
5.8 Measuring ................................................ 5-23 (function group MEM) ............................. 5-34
General notes ............................................ 5-23 Storing a data set ...................................... 5-35
Deleting a data set .................................... 5-35
5.9 Measurement of dB difference
(function group REF) .............................. 5-25 Deleting all data set .................................. 5-36
Recording a reference echo ...................... 5-26 Recalling a stored data set ....................... 5-36
Deleting a reference echo ......................... 5-26 5.13 Dataset management
Echo comparison ...................................... 5-27 (function group DATA) ............................. 5-38
TESTINF (Storing additional
5.10 Classification of welds
information) ............................................... 5-39
(function group AWS) .............................. 5-28
PREVIEW (Dataset preview) .................... 5-41
Rating of welds according to AWS ............ 5-28
DIR (Dataset directory) ............................. 5-42
5.11 Calculation of flaw position SETTING (Function list) ............................ 5-42
(function group TRIG) ............................. 5-31
Contents
5.7 Calibrating the USM 35X ......................... 5-17 ANGLE (Angle of incidence) ................... 5-32
Calibrating the display range ..................... 5-17 X-VALUE (X-value of the probe) ................ 5-32
Choosing the measuring point ................... 5-17 COLOR ..................................................... 5-33
Calibration with straight- and THICKNE (Material thickness) .................. 5-33
angle-beam probes .................................... 5-18 DIAMET (Outside diameter of the test
Calibration with dual-element (TR) object) ....................................................... 5-33
probes ....................................................... 5-21
5.12 Data saving
5.8 Measuring ................................................ 5-23 (function group MEM) ............................. 5-34
General notes ............................................ 5-23 Storing a data set ...................................... 5-35
Deleting a data set .................................... 5-35
5.9 Measurement of dB difference
(function group REF) .............................. 5-25 Deleting all data set .................................. 5-36
Recording a reference echo ...................... 5-26 Recalling a stored data set ....................... 5-36
Deleting a reference echo ......................... 5-26 5.13 Dataset management
Echo comparison ...................................... 5-27 (function group DATA) ............................. 5-38
TESTINF (Storing additional
5.10 Classification of welds
information) ............................................... 5-39
(function group AWS) .............................. 5-28
PREVIEW (Dataset preview) .................... 5-41
Rating of welds according to AWS ............ 5-28
DIR (Dataset directory) ............................. 5-42
5.11 Calculation of flaw position SETTING (Function list) ............................ 5-42
(function group TRIG) ............................. 5-31
5.14 Configuring the USM 35X for a test TIME/DATE (Setting the time and date) .... 5-56
application ............................................... 5-43 ANAMOD .................................................. 5-57
TOF (Selecting the measuring point) ......... 5-44 HORN ........................................................ 5-58
S-DISP (Zoomed display of reading) ......... 5-46 EVAMOD (Echo evaluation) ...................... 5-58
MAGNIFY (Gate spreading) ...................... 5-48
5.16 Other functions with special keys .......... 5-59
A-Scan (Setting the A-scan) ..................... 5-48
Freeze ....................................................... 5-59
Configuring the measurement line ............. 5-49
Zooming the echo display ......................... 5-59
Setting the display .................................... 5-50
FILLED (Echo display mode) .................... 5-51 The key ............................................... 5-59
VGA .......................................................... 5-51 5.17 Status symbols and LEDs ...................... 5-60
SCHEME .................................................. 5-51 Status symbols ......................................... 5-60
LIGHT (LCD backlight) .............................. 5-52 LEDs ......................................................... 5-60
SCALE (Configuring the measurement
line) ........................................................... 5-52 5.18 Distance-amplitude curve
(only USM 35X DAC and USM 35S) ........ 5-61
5.15 General configuration ............................. 5-53 DACMOD (Activating DAC/TCG) ............... 5-62
DIALOG (Selecting the language) ............. 5-53 DACECHO (Recording reference curve) .... 5-63
UNIT (Selecting units of measurement) .... 5-54 T-CORR (Sensitivity correction) ................ 5-64
BAUD-R (Baud rate for transmission) ........ 5-55 OFFSET (Distance of multiple DAC) ......... 5-65
PRINTER (Printer for test report) .............. 5-55 Echo evaluation with DAC ......................... 5-65
COPYMOD (Assignment of the key) ... 5-55
Contents
5.14 Configuring the USM 35X for a test TIME/DATE (Setting the time and date) .... 5-56
application ............................................... 5-43 ANAMOD .................................................. 5-57
TOF (Selecting the measuring point) ......... 5-44 HORN ........................................................ 5-58
S-DISP (Zoomed display of reading) ......... 5-46 EVAMOD (Echo evaluation) ...................... 5-58
MAGNIFY (Gate spreading) ...................... 5-48
5.16 Other functions with special keys .......... 5-59
A-Scan (Setting the A-scan) ..................... 5-48
Freeze ....................................................... 5-59
Configuring the measurement line ............. 5-49
Zooming the echo display ......................... 5-59
Setting the display .................................... 5-50
FILLED (Echo display mode) .................... 5-51 The key ............................................... 5-59
VGA .......................................................... 5-51 5.17 Status symbols and LEDs ...................... 5-60
SCHEME .................................................. 5-51 Status symbols ......................................... 5-60
LIGHT (LCD backlight) .............................. 5-52 LEDs ......................................................... 5-60
SCALE (Configuring the measurement
line) ........................................................... 5-52 5.18 Distance-amplitude curve
(only USM 35X DAC and USM 35S) ........ 5-61
5.15 General configuration ............................. 5-53 DACMOD (Activating DAC/TCG) ............... 5-62
DIALOG (Selecting the language) ............. 5-53 DACECHO (Recording reference curve) .... 5-63
UNIT (Selecting units of measurement) .... 5-54 T-CORR (Sensitivity correction) ................ 5-64
BAUD-R (Baud rate for transmission) ........ 5-55 OFFSET (Distance of multiple DAC) ......... 5-65
PRINTER (Printer for test report) .............. 5-55 Echo evaluation with DAC ......................... 5-65
COPYMOD (Assignment of the key) ... 5-55
Contents
Contents
Introduction 1
that the required functions operate perfectly in the in- 1.2 Important information on
tended combination.
ultrasonic testing
If you have any questions about the use of your test
equipment, please contact your nearest representative Please read the following information before using your
of GE Inspection Technologies. USM 35X. It is important that you understand and ob-
serve this information to avoid any operator errors that
Defects/errors and exceptional stresses might lead to false test results. This could result in per-
sonal injuries or damages to property.
If you have reason to believe that a safe operation of
your USM 35X is no longer possible, you have to dis-
connect the instrument and secure it against uninten- Preconditions for testing with ultrasonic
tional reconnection. Remove the batteries if necessary. test equipment
A safe operation is e.g. no longer possible This operating manual contains essential information on
how to operate your test equipment. In addition, there
if the instrument shows visible damages, are a number of factors which affect the test results. A
if the instrument no longer operates perfectly, description of these factors would go beyond the scope
of an operating manual. The following list therefore only
after prolonged storage under adverse conditions mentions the three most important conditions for a safe
(e.g. exceptional temperatures and/or especially high and reliable ultrasonic inspection:
air humidity, or corrosive environmental conditions),
the operator training
after being subjected to heavy stresses during trans-
portation. the knowledge of special technical test requirements
and limits
the choice of appropriate test equipment.
that the required functions operate perfectly in the in- 1.2 Important information on
tended combination.
ultrasonic testing
If you have any questions about the use of your test
equipment, please contact your nearest representative Please read the following information before using your
of GE Inspection Technologies. USM 35X. It is important that you understand and ob-
serve this information to avoid any operator errors that
Defects/errors and exceptional stresses might lead to false test results. This could result in per-
sonal injuries or damages to property.
If you have reason to believe that a safe operation of
your USM 35X is no longer possible, you have to dis-
connect the instrument and secure it against uninten- Preconditions for testing with ultrasonic
tional reconnection. Remove the batteries if necessary. test equipment
A safe operation is e.g. no longer possible This operating manual contains essential information on
how to operate your test equipment. In addition, there
if the instrument shows visible damages, are a number of factors which affect the test results. A
if the instrument no longer operates perfectly, description of these factors would go beyond the scope
of an operating manual. The following list therefore only
after prolonged storage under adverse conditions mentions the three most important conditions for a safe
(e.g. exceptional temperatures and/or especially high and reliable ultrasonic inspection:
air humidity, or corrosive environmental conditions),
the operator training
after being subjected to heavy stresses during trans-
portation. the knowledge of special technical test requirements
and limits
the choice of appropriate test equipment.
A proper training comprises for example adequate the definition of the scope of inspection
knowledge of: the choice of the appropriate test method
the theory of sound propagation the consideration of material properties
the effects of sound velocity in the test material the determination of limits for recording and
the behavior of the sound wave at interfaces be- evaluation.
tween different materials It is the task of those with overall responsibility for test-
the propagation of the sound beam ing to ensure that the inspector is fully informed about
these requirements. The best basis for such information
the influence of sound attenuation in the test object is experience with identical test objects. It is also es-
and the influence of surface quality of the test ob- sential that the relevant test specifications be clearly
ject. and completely understood by the inspector.
Lack of such knowledge could lead to false test results
with unforeseeable consequences. You can contact for GE Inspection Technologies regularly holds specialized
example NDT societies or organizations in your country training courses in the field of ultrasonic testing. The
(DGZfP in Germany; ASNT in the USA), or also GE scheduled dates for these courses will be given to you
Inspection Technologies, for information concerning on request.
existing possibilities for the training of ultrasonic in-
spectors as well as on the qualifications and certifi-
cates that can finally be obtained.
A proper training comprises for example adequate the definition of the scope of inspection
knowledge of: the choice of the appropriate test method
the theory of sound propagation the consideration of material properties
the effects of sound velocity in the test material the determination of limits for recording and
the behavior of the sound wave at interfaces be- evaluation.
tween different materials It is the task of those with overall responsibility for test-
the propagation of the sound beam ing to ensure that the inspector is fully informed about
these requirements. The best basis for such information
the influence of sound attenuation in the test object is experience with identical test objects. It is also es-
and the influence of surface quality of the test ob- sential that the relevant test specifications be clearly
ject. and completely understood by the inspector.
Lack of such knowledge could lead to false test results
with unforeseeable consequences. You can contact for GE Inspection Technologies regularly holds specialized
example NDT societies or organizations in your country training courses in the field of ultrasonic testing. The
(DGZfP in Germany; ASNT in the USA), or also GE scheduled dates for these courses will be given to you
Inspection Technologies, for information concerning on request.
existing possibilities for the training of ultrasonic in-
spectors as well as on the qualifications and certifi-
cates that can finally be obtained.
Echo display comparison method The ultrasonic wave is attenuated in any material. This
sound attenuation is very low, e.g. in parts made of
The echo from a small, natural flaw is usually smaller fine-grained steel, likewise in many small parts made of
than the echo from an artificial comparison flaw, e.g. other materials. However, if the sound wave travels
circular disc flaw of the same size. This is due, for in- larger distances through the material, a high cumulative
stance, to the roughness of the surface of a natural sound attenuation can result even with small attenua-
flaw, or to the fact that the beam does not impinge on it tion coefficients. There is then a danger that echoes
at right angles. from natural flaws appear too small. For this reason, an
If this fact is not taken into account when evaluating estimate must always be made of the effects of attenu-
natural flaws, there is a danger of underestimating their ation on the evaluation result and taken into account if
magnitude. applicable.
In the case of very jagged or fissured flaws, e.g. shrink If the test object has a rough surface, part of the inci-
holes in castings, it may be that the sound scattering dent sound energy will be scattered at its surface and
occurring at the boundary surface of the flaw is so is not available for the test. The larger this initial scat-
strong that no echo at all is produced. In such cases, a tering, the smaller the flaw echoes appear, and the
different evaluation method should be chosen, e.g. use more errors occur in the evaluation result.
of the backwall echo attenuation in the evaluation. It is therefore important to take the effect of the test
The distance sensitivity of the flaw echo plays an im- objects surfaces on the height of the echo into account
portant part when testing large components. Attention (transfer correction).
should be paid here to choosing artificial comparison
flaws which are as far as possible governed by the
same distance laws as the natural flaws to be evalu-
ated.
Echo display comparison method The ultrasonic wave is attenuated in any material. This
sound attenuation is very low, e.g. in parts made of
The echo from a small, natural flaw is usually smaller fine-grained steel, likewise in many small parts made of
than the echo from an artificial comparison flaw, e.g. other materials. However, if the sound wave travels
circular disc flaw of the same size. This is due, for in- larger distances through the material, a high cumulative
stance, to the roughness of the surface of a natural sound attenuation can result even with small attenua-
flaw, or to the fact that the beam does not impinge on it tion coefficients. There is then a danger that echoes
at right angles. from natural flaws appear too small. For this reason, an
If this fact is not taken into account when evaluating estimate must always be made of the effects of attenu-
natural flaws, there is a danger of underestimating their ation on the evaluation result and taken into account if
magnitude. applicable.
In the case of very jagged or fissured flaws, e.g. shrink If the test object has a rough surface, part of the inci-
holes in castings, it may be that the sound scattering dent sound energy will be scattered at its surface and
occurring at the boundary surface of the flaw is so is not available for the test. The larger this initial scat-
strong that no echo at all is produced. In such cases, a tering, the smaller the flaw echoes appear, and the
different evaluation method should be chosen, e.g. use more errors occur in the evaluation result.
of the backwall echo attenuation in the evaluation. It is therefore important to take the effect of the test
The distance sensitivity of the flaw echo plays an im- objects surfaces on the height of the echo into account
portant part when testing large components. Attention (transfer correction).
should be paid here to choosing artificial comparison
flaws which are as far as possible governed by the
same distance laws as the natural flaws to be evalu-
ated.
H Note:
Note contains e.g. references to other chapters or spe-
cial recommendations for a function.
H Note:
Note contains e.g. references to other chapters or spe-
cial recommendations for a function.
It describes
accessories included in the standard package,
recommended accessories.
It describes
accessories included in the standard package,
recommended accessories.
or
or
or
or
Initial start-up 3
You can connect the USM 35X to the mains supply Push the Lemo plug of the power supply unit into the
system even if it carries batteries. The battery power is plug receptacle until it snaps into place with a clearly
then automatically interrupted. audible click.
You can connect the USM 35X to the mains supply Push the Lemo plug of the power supply unit into the
system even if it carries batteries. The battery power is plug receptacle until it snaps into place with a clearly
then automatically interrupted. audible click.
When pulling off the Lemo plug, withdraw the metal Lift the lid off upward. To the right in the open battery
bushing on the plug first in order to release the lock. compartment, you will see two springs and several
connection pins.
The power supply unit is automatically set to any nomi-
nal voltage between 90 VAC and 240 VAC.
When pulling off the Lemo plug, withdraw the metal Lift the lid off upward. To the right in the open battery
bushing on the plug first in order to release the lock. compartment, you will see two springs and several
connection pins.
The power supply unit is automatically set to any nomi-
nal voltage between 90 VAC and 240 VAC.
H Note:
If the icon for low battery charge appears, you should
urgently close your test job and exchange the batteries.
You should take replacement batteries with you if you
aim to carry out measurements on site.
In the measurement line of the USM 35X, an inverted B Power supply/charger unit, order number 102 163
appears if the battery charge is low.
If a battery is located in the instrument, the charging
process is started automatically when you connect the
plug-in power supply unit. You can carry out ultrasonic
inspections and charge a battery at the same time.
H Note:
If the icon for low battery charge appears, you should
urgently close your test job and exchange the batteries.
You should take replacement batteries with you if you
aim to carry out measurements on site.
In the measurement line of the USM 35X, an inverted B Power supply/charger unit, order number 102 163
appears if the battery charge is low.
If a battery is located in the instrument, the charging
process is started automatically when you connect the
plug-in power supply unit. You can carry out ultrasonic
inspections and charge a battery at the same time.
The start display of the USM 35X appears; here you The cold start message Basic Initialization is dis-
will also see the current software version of the instru- played. The instrument is initialized and reset to its
ment. The instrument carries out a self-check and then basic setup (dialog language: English, for more details
switches over to stand-by mode. on how to select the language, please refer to chapter 4).
The start display of the USM 35X appears; here you The cold start message Basic Initialization is dis-
will also see the current software version of the instru- played. The instrument is initialized and reset to its
ment. The instrument carries out a self-check and then basic setup (dialog language: English, for more details
switches over to stand-by mode. on how to select the language, please refer to chapter 4).
Principles of operation 4
H Note:
The screen display always shows the gain and the ad-
justed dB step value. All other functions are locked in
zoom mode.
H Note:
The screen display always shows the gain and the ad-
justed dB step value. All other functions are locked in
zoom mode.
Other displays
The measurement line below the screen display shows
values of settings, measured values, and status indica-
tions. As an alternative, a scale can be shown here,
giving an overview of the echo positions.
H Note:
Every measurement value can also be shown in an
enlarged display at the top right corner of the A-scan
(setting in the function group MEAS, function S-DISP).
Other displays
The measurement line below the screen display shows
values of settings, measured values, and status indica-
tions. As an alternative, a scale can be shown here,
giving an overview of the echo positions.
H Note:
Every measurement value can also be shown in an
enlarged display at the top right corner of the A-scan
(setting in the function group MEAS, function S-DISP).
Function keys
For changing between operation levels (below),
On/Off key
For turning the device on or off.
Function keys
For changing between operation levels (below),
On/Off key
For turning the device on or off.
Special keys
To directly activate individual instrument functions:
Special keys
To directly activate individual instrument functions:
Setting the functions The following functions offer a choice between coarse
and fine adjustment:
Shown below the A-scan are five function groups that
you can directly select using the corresponding key. Function Function group
The selected function group is highlighted and the cor-
responding four functions are displayed next to the RANGE BASE
A-scan on the right. You can likewise directly select the MTLVEL BASE
individual functions using the corresponding keys. D-DELAY BASE
aSTART aGAT
Functions with double assignments aWIDTH aGAT
bWIDTH bGAT
Some functions have double assignments. You will rec- S-REF1 CAL
ognize the functions with double assignments by an S-REF2 CAL
arrow (icon >) after the function name. ANGLE TRIG
THICKNE TRIG
Toggle between the two functions by repeatedly press-
DIAMET TRIG
ing the corresponding key .
For more details on the adjustment possibilities, please
Coarse and fine adjustment of functions read from page 5-5 onward.
You can choose between coarse and fine adjustment
for some functions. You can toggle between these two
adjustment modes by pressing the corresponding
key several times. The fine adjustment is identified
by an asterisk preceding the function value.
Setting the functions The following functions offer a choice between coarse
and fine adjustment:
Shown below the A-scan are five function groups that
you can directly select using the corresponding key. Function Function group
The selected function group is highlighted and the cor-
responding four functions are displayed next to the RANGE BASE
A-scan on the right. You can likewise directly select the MTLVEL BASE
individual functions using the corresponding keys. D-DELAY BASE
aSTART aGAT
Functions with double assignments aWIDTH aGAT
bWIDTH bGAT
Some functions have double assignments. You will rec- S-REF1 CAL
ognize the functions with double assignments by an S-REF2 CAL
arrow (icon >) after the function name. ANGLE TRIG
THICKNE TRIG
Toggle between the two functions by repeatedly press-
DIAMET TRIG
ing the corresponding key .
For more details on the adjustment possibilities, please
Coarse and fine adjustment of functions read from page 5-5 onward.
You can choose between coarse and fine adjustment
for some functions. You can toggle between these two
adjustment modes by pressing the corresponding
key several times. The fine adjustment is identified
by an asterisk preceding the function value.
H Note:
Double assignment of the function DIALOG/UNIT
(icon >). Toggle between the two functions by repeatedly
pressing the corresponding key .
Selecting units
In the function UNIT (function group CFG1) you can
choose your favorite units between mm or inch.
H Note:
If necessary, go to the third operating level.
Double assignment of the function DIALOG/UNIT
In the function group CFG1 select the function UNIT. (icon >). Toggle between the two functions by repeatedly
pressing the corresponding key .
A Attention:
Select your units immediately when you start working
with the USM 35X because if you change the unit, all
the current settings are deleted, and the basic setup is
loaded again.
Krautkramer USM 35X Issue 01, 04/2005 4-11
H Note:
Double assignment of the function DIALOG/UNIT
(icon >). Toggle between the two functions by repeatedly
pressing the corresponding key .
Selecting units
In the function UNIT (function group CFG1) you can
choose your favorite units between mm or inch.
H Note:
If necessary, go to the third operating level.
Double assignment of the function DIALOG/UNIT
In the function group CFG1 select the function UNIT. (icon >). Toggle between the two functions by repeatedly
pressing the corresponding key .
A Attention:
Select your units immediately when you start working
with the USM 35X because if you change the unit, all
the current settings are deleted, and the basic setup is
loaded again.
Krautkramer USM 35X Issue 01, 04/2005 4-11
Principles of operation Important basic settings
In order not to delete anything by accident, a safety If necessary, change to the third operation level.
prompt is displayed in the measurement line.
Select the function DATE in the function group
If you are sure that you want to change the unit, CFG2.
press the key belonging to the function UNIT one
more time.
In order not to delete anything by accident, a safety If necessary, change to the third operation level.
prompt is displayed in the measurement line.
Select the function DATE in the function group
If you are sure that you want to change the unit, CFG2.
press the key belonging to the function UNIT one
more time.
A Attention:
You should always make sure that you are using the
correct time settings. Test results may otherwise be
falsified.
A Attention:
You should always make sure that you are using the
correct time settings. Test results may otherwise be
falsified.
4.6 Basic settings of the display If necessary, change to the third operation level.
All color schemes are suitable for indoor use. For out- Use the right-hand rotary knob to set the required
door use, we recommend the color schemes 3 and 4. lighting.
4.6 Basic settings of the display If necessary, change to the third operation level.
All color schemes are suitable for indoor use. For out- Use the right-hand rotary knob to set the required
door use, we recommend the color schemes 3 and 4. lighting.
Operation 5
5.1 Overview of the functions Each operating level contains five function groups. You
will recognize your currently active operating level by
the number on the separation line between the first and
The functions of the USM 35X are combined to form
the second function group.
function groups on three operating levels.
First operating level
If the instrument has the option Data Logger, there is an
additional fourth operation level.
Press the key to select the function shown next Third operating level
to it. The setting of the selected function is carried
out via the right-hand rotary knob.
You can carry out important functions (switch on/off, If the instrument is equipped with the Data Logger op-
dB-step, freeze, zoom and report printout) by pressing tion, a fourth operating level is added. For this, refer to
the special keys (ref. chapter 4). the corresponding chapter Option Data Logger.
5.1 Overview of the functions Each operating level contains five function groups. You
will recognize your currently active operating level by
the number on the separation line between the first and
The functions of the USM 35X are combined to form
the second function group.
function groups on three operating levels.
First operating level
If the instrument has the option Data Logger, there is an
additional fourth operation level.
Press the key to select the function shown next Third operating level
to it. The setting of the selected function is carried
out via the right-hand rotary knob.
You can carry out important functions (switch on/off, If the instrument is equipped with the Data Logger op-
dB-step, freeze, zoom and report printout) by pressing tion, a fourth operating level is added. For this, refer to
the special keys (ref. chapter 4). the corresponding chapter Option Data Logger.
Function groups first operating level Function groups second operating level
BASE The functions that you find here are re- CAL This function group makes functions for the
quired for the basic adjustment of the semiautomatic calibration available to you.
screen displays.
REF This function group serves for measuring
PULS Combined in this group are the functions the dB difference between a reference
that serve for the adjustment of pulser. echo and the reflector echo.
or
Function groups first operating level Function groups second operating level
BASE The functions that you find here are re- CAL This function group makes functions for the
quired for the basic adjustment of the semiautomatic calibration available to you.
screen displays.
REF This function group serves for measuring
PULS Combined in this group are the functions the dB difference between a reference
that serve for the adjustment of pulser. echo and the reflector echo.
or
MEM These functions serve for storing, loading LCD This is the function group where you can
and deleting of data sets. set the LCD contrast and backlight as well
as the echo display mode on the screen.
DATA The functions of this group serve for the
dataset management and documentation. CFG1 Functions for the configuration: unit, dialog
language, printer driver and assignment of
the key
MEM These functions serve for storing, loading LCD This is the function group where you can
and deleting of data sets. set the LCD contrast and backlight as well
as the echo display mode on the screen.
DATA The functions of this group serve for the
dataset management and documentation. CFG1 Functions for the configuration: unit, dialog
language, printer driver and assignment of
the key
H Note:
The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.
You can determine the step size of the sixth step using
the function dBSTEP in the function group RECV.
H Note:
The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.
You can determine the step size of the sixth step using
the function dBSTEP in the function group RECV.
Fine adjustment:
up to 9.99 mm in steps of 0.01 mm
up to 99.9 mm in steps of 0.1 mm
up to 999 mm in steps of 1 mm
H Note:
The adjustment range for the display range depends on
the frequency range setting (function FREQU in func-
tion group RECV).
Fine adjustment:
up to 9.99 mm in steps of 0.01 mm
up to 99.9 mm in steps of 0.1 mm
up to 999 mm in steps of 1 mm
H Note:
The adjustment range for the display range depends on
the frequency range setting (function FREQU in func-
tion group RECV).
If the display should for example start from the surface of P-DELAY (Probe delay)
the test object, the value in D-DELAY must be set to 0.
Every probe has a delay line between the transducer
Coarse adjustment element and the coupling face. This means that the
10 mm ... 1024 mm/0.3" ... 40" in even steps initial pulse must first pass through this delay line be-
fore the sound wave can enter the test object. You can
Fine adjustment compensate for this influence of the delay line in the
up to 99.9 mm/9.999" in steps of 0.01 mm/0.001" function P-DELAY.
up to 1024 mm/10" in steps of 0.1 mm/0.001"
If required, toggle between coarse and fine adjust- If the value for P-DELAY is not known, read the section
ment. Calibrating the USM 35X, chapter 5.7, in order to deter-
mine this value.
Adjust the value for the display starting point by
means of the right-hand rotary knob. Select the function P-DELAY.
If the display should for example start from the surface of P-DELAY (Probe delay)
the test object, the value in D-DELAY must be set to 0.
Every probe has a delay line between the transducer
Coarse adjustment element and the coupling face. This means that the
10 mm ... 1024 mm/0.3" ... 40" in even steps initial pulse must first pass through this delay line be-
fore the sound wave can enter the test object. You can
Fine adjustment compensate for this influence of the delay line in the
up to 99.9 mm/9.999" in steps of 0.01 mm/0.001" function P-DELAY.
up to 1024 mm/10" in steps of 0.1 mm/0.001"
If required, toggle between coarse and fine adjust- If the value for P-DELAY is not known, read the section
ment. Calibrating the USM 35X, chapter 5.7, in order to deter-
mine this value.
Adjust the value for the display starting point by
means of the right-hand rotary knob. Select the function P-DELAY.
high
This setting reduces the echo height but mostly also
produces narrow echoes with higher resolution.
high
This setting reduces the echo height but mostly also
produces narrow echoes with higher resolution.
The larger your workpiece, the smaller PRF values are Select the function group RECV.
needed in order to avoid phantom echoes. In the case
of smaller PRF values, however, the A-scan update
rate becomes lower; for this reason, high values are
required if a workpiece should be scanned fast.
The larger your workpiece, the smaller PRF values are Select the function group RECV.
needed in order to avoid phantom echoes. In the case
of smaller PRF values, however, the A-scan update
rate becomes lower; for this reason, high values are
required if a workpiece should be scanned fast.
H Note:
Error alarms can be triggered unter certain circum-
stances. These are caused by intermediate conditions
in instrument operation occuring when the instrument is
H Note:
Error alarms can be triggered unter certain circum-
stances. These are caused by intermediate conditions
in instrument operation occuring when the instrument is
used, i.e. when function parameters are changed. Pos- off Evaluation logic off
sible alarms occuring during instrument operation The alarm and measurement capability are switched
(setting of functions) are to be ignored. off. The gate is not visible.
pos Coincidence
Display of gates
The alarm (LED A) is on if the preset response
To make the assignment easier, the gates are displayed threshold of the gate is exceeded within the dis-
in different colors. You cannot vary the colors of gates played range.
because they are fixed as follows:
neg Anticoincidence
Gate A red The alarm (LED A) is on if the preset response
threshold of the gate is not reached within the
Gate B green displayed range.
Gate C blue a trig Triggering by interface echo
When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
Select the function aLOGIC or bLOGIC.
aLOGIC/bLOGIC
(Evaluation logic of the gates) Set the required alarm logic by means of the right-
hand rotary knob.
This function allows you to choose the method for trig-
gering the gate alarm. The alarm is output to the LED A
H Note:
on the front panel of the USM 35X. There are four set-
ting options available: The alarm and measurement function of the gates is
only active within the display range.
used, i.e. when function parameters are changed. Pos- off Evaluation logic off
sible alarms occuring during instrument operation The alarm and measurement capability are switched
(setting of functions) are to be ignored. off. The gate is not visible.
pos Coincidence
Display of gates
The alarm (LED A) is on if the preset response
To make the assignment easier, the gates are displayed threshold of the gate is exceeded within the dis-
in different colors. You cannot vary the colors of gates played range.
because they are fixed as follows:
neg Anticoincidence
Gate A red The alarm (LED A) is on if the preset response
threshold of the gate is not reached within the
Gate B green displayed range.
Gate C blue a trig Triggering by interface echo
When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
Select the function aLOGIC or bLOGIC.
aLOGIC/bLOGIC
(Evaluation logic of the gates) Set the required alarm logic by means of the right-
hand rotary knob.
This function allows you to choose the method for trig-
gering the gate alarm. The alarm is output to the LED A
H Note:
on the front panel of the USM 35X. There are four set-
ting options available: The alarm and measurement function of the gates is
only active within the display range.
Set the known material velocity in MTLVEL (function Set RANGE to 100 mm/5".
group BASE).
Set the known material velocity of 5920 m/s
Couple the probe to the calibration block. (233 "/ms) in MTLVEL.
Set the required display range in RANGE (function Set the gate so that it is positioned on the first
group BASE). The calibration echo must be dis- calibration echo (from 25 mm/1").
played on the screen.
Read the sound path in the measurement line. If this
Position the gate on one of the calibration echoes value is not equal to 25 mm/1", change the adjust-
until the sound path of the echo is indicated in the ment for the function P-DELAY until it is at 25 mm/1".
measurement line.
This completes the calibration of the USM 35X to the
After this, change the adjustment of the function material velocity of 5920 m/s (233 "/ms) with a calibra-
P-DELAY (function group BASE) until the correct tion range of 100 mm/5" for the probe used.
sound path for the selected calibration echo is
indicated in the measurement line.
Set the known material velocity in MTLVEL (function Set RANGE to 100 mm/5".
group BASE).
Set the known material velocity of 5920 m/s
Couple the probe to the calibration block. (233 "/ms) in MTLVEL.
Set the required display range in RANGE (function Set the gate so that it is positioned on the first
group BASE). The calibration echo must be dis- calibration echo (from 25 mm/1").
played on the screen.
Read the sound path in the measurement line. If this
Position the gate on one of the calibration echoes value is not equal to 25 mm/1", change the adjust-
until the sound path of the echo is indicated in the ment for the function P-DELAY until it is at 25 mm/1".
measurement line.
This completes the calibration of the USM 35X to the
After this, change the adjustment of the function material velocity of 5920 m/s (233 "/ms) with a calibra-
P-DELAY (function group BASE) until the correct tion range of 100 mm/5" for the probe used.
sound path for the selected calibration echo is
indicated in the measurement line.
The distances between 2 calibration echoes must be The recording of the first calibration echo is con-
entered as default data. The USM 35X will then carry firmed by the message Echo is recorded, and the
out a plausibility check, calculate the material velocity function CAL indicates the value 1.
and the probe delay, and automatically set the parame-
ters. Move the gate to the second calibration echo.
The distances between 2 calibration echoes must be The recording of the first calibration echo is con-
entered as default data. The USM 35X will then carry firmed by the message Echo is recorded, and the
out a plausibility check, calculate the material velocity function CAL indicates the value 1.
and the probe delay, and automatically set the parame-
ters. Move the gate to the second calibration echo.
H Note:
If the instrument is not able to carry out any valid cali-
bration on the basis of the input values and the echoes
recorded, a corresponding error message is displayed.
In that case, please check the values of your calibra-
Position the gate on the first calibration echo.
tion lines and repeat the process of recording the cali-
bration echoes. Press to record the first calibration echo.
H Note:
If the instrument is not able to carry out any valid cali-
bration on the basis of the input values and the echoes
recorded, a corresponding error message is displayed.
In that case, please check the values of your calibra-
Position the gate on the first calibration echo.
tion lines and repeat the process of recording the cali-
bration echoes. Press to record the first calibration echo.
Position the gate on the second calibration echo: Calibration with dual-element (TR) probes
Dual-element (TR) probes are especially used for wall
thickness measurement. The following peculiarities
must be taken into account when using these probes:
Echo flank
Most dual-element (TR) probes have a roof angle
(transducer elements with inclined orientation toward
the test surface). This causes mode conversions both
at beam index (sound entry into the material) and at the
Press . reflection from the backwall, which can result in very
The second echo is stored, the calibration is carried jagged echoes.
out, and the CAL function is reset to 0. The valid cali-
bration is briefly confirmed and carried out. V-path error
Dual-element (TR) probes produce a v-shaped sound
If you select the function group BASE, you can read path from the pulser via the reflection from the backwall
the material velocity and probe delay. to the receiver element. This so-called V-path error
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.
Position the gate on the second calibration echo: Calibration with dual-element (TR) probes
Dual-element (TR) probes are especially used for wall
thickness measurement. The following peculiarities
must be taken into account when using these probes:
Echo flank
Most dual-element (TR) probes have a roof angle
(transducer elements with inclined orientation toward
the test surface). This causes mode conversions both
at beam index (sound entry into the material) and at the
Press . reflection from the backwall, which can result in very
The second echo is stored, the calibration is carried jagged echoes.
out, and the CAL function is reset to 0. The valid cali-
bration is briefly confirmed and carried out. V-path error
Dual-element (TR) probes produce a v-shaped sound
If you select the function group BASE, you can read path from the pulser via the reflection from the backwall
the material velocity and probe delay. to the receiver element. This so-called V-path error
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.
Higher material velocity Set the pulser and receiver functions according to
the probe used and the test application.
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, es- Set the function TOF (function group MEAS) to
pecially with small thicknesses. This is typical of dual- flank.
element (TR) probes and serves for compensation of
the V-path error. Vary the gain so that the highest echo reaches
approximately the full screen height.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe- Set the gate threshold to the required height for
cially taken into account with thicknesses less than measuring the sound paths at the echo flanks.
2 mm/0.08".
Select the function group CAL.
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses Enter the distances of the two calibration echoes in
must be selected so that they cover the expected read- S-REF1 and S-REF2.
ings. Position the gate (function aSTART) on the first
calibration echo.
Calibration process:
We recommend to use the semiautomatic calibration Press to record the first calibration echo.
function for the calibration with T/R probes. Couple the probe to the calibration block containing
Set the required test range. the second calibration line, and set the height so that
its about as high as the first calibration echo.
Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range. Move the gate to the second calibration echo.
Higher material velocity Set the pulser and receiver functions according to
the probe used and the test application.
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, es- Set the function TOF (function group MEAS) to
pecially with small thicknesses. This is typical of dual- flank.
element (TR) probes and serves for compensation of
the V-path error. Vary the gain so that the highest echo reaches
approximately the full screen height.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe- Set the gate threshold to the required height for
cially taken into account with thicknesses less than measuring the sound paths at the echo flanks.
2 mm/0.08".
Select the function group CAL.
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses Enter the distances of the two calibration echoes in
must be selected so that they cover the expected read- S-REF1 and S-REF2.
ings. Position the gate (function aSTART) on the first
calibration echo.
Calibration process:
We recommend to use the semiautomatic calibration Press to record the first calibration echo.
function for the calibration with T/R probes. Couple the probe to the calibration block containing
Set the required test range. the second calibration line, and set the height so that
its about as high as the first calibration echo.
Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range. Move the gate to the second calibration echo.
H Note:
The point of amplitude measurement is marked with a
small upward triangle on the corresponding gate bar.
The point of distance measurement is marked with a
small downward triangle.
Gate threshold at 80 %
measured sound path: 24.91 mm
Gate threshold at 20 %
measured sound path: 24.44 mm
5-24 Issue 01, 04/2005 Krautkramer USM 35X
Operation Measuring
H Note:
The point of amplitude measurement is marked with a
small upward triangle on the corresponding gate bar.
The point of distance measurement is marked with a
small downward triangle.
Gate threshold at 80 %
measured sound path: 24.91 mm
Gate threshold at 20 %
measured sound path: 24.44 mm
5-24 Issue 01, 04/2005 Krautkramer USM 35X
Measurement of dB difference (function group REF) Operation
A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.
A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.
Echo comparison
You can compare the echo of any reflector of your
choice with the reference echo. The displayed result is
the dB difference of the two echoes.
H Note:
The dB difference is independent of any possible gain
variation.
Echo comparison
You can compare the echo of any reflector of your
choice with the reference echo. The displayed result is
the dB difference of the two echoes.
H Note:
The dB difference is independent of any possible gain
variation.
If necessary, change to the second operation level. Depending on the setting in the function EVAMOD
(function group CFG2), one of the function groups REF,
Select the function group AWS. DAC, JDAC, or DGS may also be displayed at this
point. Please also refer to chapter 5.15 General configu-
ration.
If necessary, change to the second operation level. Depending on the setting in the function EVAMOD
(function group CFG2), one of the function groups REF,
Select the function group AWS. DAC, JDAC, or DGS may also be displayed at this
point. Please also refer to chapter 5.15 General configu-
ration.
D=ABC H Notes:
with: Make sure that all instrument options for the special
test are calibrated before starting with the rating ac-
A = Indication (in dB) cording to AWS.
Absolute instrument gain with which the maximum
flaw echo is at 50 % (5 %) echo height Pay attention to peaking an echo with an amplitude
between 45 % and 55 % screen height. A rating is not
B = Reference (in dB) possible with other amplitudes.
Absolute instrument gain with which the maximum
reference echo (1.5 mm side-drilled hole from the Apply couplant, and couple the probe to the refer-
reference block 1) is at 50 % (5 %) echo height ence block 1. Peak the echo from the 1.5 mm side-
drilled hole.
C = Attenuation (in dB)
This value is calculated according to the formula Select the function aSTART, and set up the A gate
C = 0.079 dB/mm (s 25.4 mm). With s = sound on the reference echo.
path of the flaw echo.
Vary the gain so that the reference echo is displayed
The sound attenuation correction is automatically at 50 % screen height.
calculated and displayed by the instrument. For
Choose the function REFRNCE, and confirm the
sound paths smaller than or equal to 25.4 mm
choice in order to save the reference gain.
(1 inch), the value is set to zero.
D=ABC H Notes:
with: Make sure that all instrument options for the special
test are calibrated before starting with the rating ac-
A = Indication (in dB) cording to AWS.
Absolute instrument gain with which the maximum
flaw echo is at 50 % (5 %) echo height Pay attention to peaking an echo with an amplitude
between 45 % and 55 % screen height. A rating is not
B = Reference (in dB) possible with other amplitudes.
Absolute instrument gain with which the maximum
reference echo (1.5 mm side-drilled hole from the Apply couplant, and couple the probe to the refer-
reference block 1) is at 50 % (5 %) echo height ence block 1. Peak the echo from the 1.5 mm side-
drilled hole.
C = Attenuation (in dB)
This value is calculated according to the formula Select the function aSTART, and set up the A gate
C = 0.079 dB/mm (s 25.4 mm). With s = sound on the reference echo.
path of the flaw echo.
Vary the gain so that the reference echo is displayed
The sound attenuation correction is automatically at 50 % screen height.
calculated and displayed by the instrument. For
Choose the function REFRNCE, and confirm the
sound paths smaller than or equal to 25.4 mm
choice in order to save the reference gain.
(1 inch), the value is set to zero.
Depth d:
Distance between flaw position and surface
Depth d:
Distance between flaw position and surface
When using angle-beam probes, the instrument can X-VALUE (X-value of the probe)
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound The function X-VALUE enables you to set the X-value
path section or leg can be displayed as the measured (distance between the probes leading face and probe
value La, Lb, or Lc. index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
When using angle-beam probes, the instrument can X-VALUE (X-value of the probe)
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound The function X-VALUE enables you to set the X-value
path section or leg can be displayed as the measured (distance between the probes leading face and probe
value La, Lb, or Lc. index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
5.12 Data saving A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
(function group MEM) stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
You will find all functions for storing, recalling and delet- was stored. This makes each one of your tests repro-
ing complete data sets in the function group MEM. ducible.
If required, go to the second operating level. You will find the following functions:
Select the function group MEM. SET-# selecting number of a data set
5.12 Data saving A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
(function group MEM) stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
You will find all functions for storing, recalling and delet- was stored. This makes each one of your tests repro-
ing complete data sets in the function group MEM. ducible.
If required, go to the second operating level. You will find the following functions:
Select the function group MEM. SET-# selecting number of a data set
Storing a data set All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored
You can save your current setup to a data set. (see chapter 5.13 Dataset management).
Select the function SET-#.
Deleting a data set
Use the right-hand rotary knob to set the number
where you would want to store the current data set An occupied data set is marked with an asterisk (*)
(1 to 200). before the data set number. You can delete these data
sets if you no longer need them.
Select the function STORE.
Select the function SET-#.
Use the right-hand rotary knob to set it to on.
Use the right-hand rotary knob to set the number of
The USM 35X stores the current data set. When the the data set that you want to delete.
storage process is completed, the function STORE is
automatically reset to off. Select the function DELETE.
Storing a data set All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored
You can save your current setup to a data set. (see chapter 5.13 Dataset management).
Select the function SET-#.
Deleting a data set
Use the right-hand rotary knob to set the number
where you would want to store the current data set An occupied data set is marked with an asterisk (*)
(1 to 200). before the data set number. You can delete these data
sets if you no longer need them.
Select the function STORE.
Select the function SET-#.
Use the right-hand rotary knob to set it to on.
Use the right-hand rotary knob to set the number of
The USM 35X stores the current data set. When the the data set that you want to delete.
storage process is completed, the function STORE is
automatically reset to off. Select the function DELETE.
Deleting all data set Use the right-hand rotary knob to set it to on. The
measurement line will then prompt: Delete all data
You can delete all data sets if you no longer need them. sets?
Select the function DELETE. Confirm by pressing the corresponding key one
more time (all other keys would abort the process).
H Note: A Attention:
Double assignment of the function DELETE/DELALL.
If a saved data set is loaded, the current instrument
Press the corresponding key repeatedly to toggle
setup is lost. If necessary, save the current instrument
between the functions.
setup to a new data set before loading a saved data
set.
Deleting all data set Use the right-hand rotary knob to set it to on. The
measurement line will then prompt: Delete all data
You can delete all data sets if you no longer need them. sets?
Select the function DELETE. Confirm by pressing the corresponding key one
more time (all other keys would abort the process).
H Note: A Attention:
Double assignment of the function DELETE/DELALL.
If a saved data set is loaded, the current instrument
Press the corresponding key repeatedly to toggle
setup is lost. If necessary, save the current instrument
between the functions.
setup to a new data set before loading a saved data
set.
H Note:
The gate for surveying the echo can be moved in the
recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
0.5 % of the adjusted calibration range.
H Note:
The gate for surveying the echo can be moved in the
recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
0.5 % of the adjusted calibration range.
5.13 Dataset management The functions in the function group DATA enable you to
easily manage the data sets stored in the USM 35X.
(function group DATA)
The following functions are available:
The USM 35X offers comprehensive functions for an
TESTINF You can save a lot of additional informa-
easy dataset management.
tion for every data set, e.g. data on the
If required, go to the second operating level. test object, on the flaw detected, or com-
ments.
Select the function group DATA.
PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
date of each data set.
5.13 Dataset management The functions in the function group DATA enable you to
easily manage the data sets stored in the USM 35X.
(function group DATA)
The following functions are available:
The USM 35X offers comprehensive functions for an
TESTINF You can save a lot of additional informa-
easy dataset management.
tion for every data set, e.g. data on the
If required, go to the second operating level. test object, on the flaw detected, or com-
ments.
Select the function group DATA.
PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
date of each data set.
H Note:
You cannot edit the field SET-#. The number of the cur-
rent data set is displayed here.
H Note:
You cannot edit the field SET-#. The number of the cur-
rent data set is displayed here.
Use the right-hand rotary knob to set the function to Use the right-hand rotary knob to set the function to
on. on. The list of the currently set functions is displayed.
The directory list of the stored data sets is displayed Turn the right-hand rotary knob to have other lines
(dataset numbers and names). The display shows displayed. The list is advanced by one line each.
12 data sets at a time. Occupied data sets are
marked with an asterisk (*). If necessary, press one of the keys , or to
go back to the currently active A-scan.
Turn the right-hand rotary knob to have other data
sets displayed. The list always advances by one line
each.
Use the right-hand rotary knob to set the function to Use the right-hand rotary knob to set the function to
on. on. The list of the currently set functions is displayed.
The directory list of the stored data sets is displayed Turn the right-hand rotary knob to have other lines
(dataset numbers and names). The display shows displayed. The list is advanced by one line each.
12 data sets at a time. Occupied data sets are
marked with an asterisk (*). If necessary, press one of the keys , or to
go back to the currently active A-scan.
Turn the right-hand rotary knob to have other data
sets displayed. The list always advances by one line
each.
5.14 Configuring the USM 35X for If required, go to the third operating level.
a test application Select the function group MEAS.
5.14 Configuring the USM 35X for If required, go to the third operating level.
a test application Select the function group MEAS.
TOF (Selecting the measuring point) When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
The sound path measurement in the calibration process monitor gate with the rising flank of the highest echo in
or in the subsequent echo evaluation process depends the gate.
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.
A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!
TOF (Selecting the measuring point) When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
The sound path measurement in the calibration process monitor gate with the rising flank of the highest echo in
or in the subsequent echo evaluation process depends the gate.
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.
A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!
In order to identify the points of measurement and to In TOF mode jflank the sound path measurement is
avoid misinterpretation two indicators were introduced made at the point of intersection of the monitor gate
per gate: The first triangle pointing downwards indicates with the rising flank of the first echo in the gate. The
the position of the measured sound path (distance), amplitude is measured at the maximum of the first
whereas the triangle pointing upwards marks the posi- echo in the gate even if there are further signals with
tion of the measured amplitude. higher amplitudes in the gate.
In order to identify the points of measurement and to In TOF mode jflank the sound path measurement is
avoid misinterpretation two indicators were introduced made at the point of intersection of the monitor gate
per gate: The first triangle pointing downwards indicates with the rising flank of the first echo in the gate. The
the position of the measured sound path (distance), amplitude is measured at the maximum of the first
whereas the triangle pointing upwards marks the posi- echo in the gate even if there are further signals with
tion of the measured amplitude. higher amplitudes in the gate.
In principle, the peak measurement should be preferred S-DISP (Zoomed display of reading)
because the measured distances do not depend on the
echo height in that case. However, there are application You can have a selected reading zoomed in the A-scan
cases in which the flank measurement is either specified, display. The following readings can be selected for the
or it must be applied for technical reasons, e.g. in many zoomed display (in the second column the indication of
tests using dual-element (TR) probes. the readings in the measurement line):
Sa Sa Sound path for gate A
A Attention: Sb Sb Sound path for gate B
In any case, the adjustment of the measuring point for Sb-a ba Difference of single measurements for
calibration and for the subsequent test use must al- sound path gate B gate A
ways be identical. Otherwise measurement errors may Ha % Ha Echo height gate A in % screen height
occur. Hb % Hb Echo height gate B in % screen height
Select the TOF function. Ha dB ha Echo height gate A in dB
Hb dB hb Echo height gate B in dB
Use the right-hand rotary knob to select the required R-start Rs Range start
setting.
R-end Re Range end
La La Number of legs in gate A
Lb Lb Number of legs in gate B
Lc Lc Number of legs in gate C
Only for flaw position calculation:
Da Da Depth for gate A
In principle, the peak measurement should be preferred S-DISP (Zoomed display of reading)
because the measured distances do not depend on the
echo height in that case. However, there are application You can have a selected reading zoomed in the A-scan
cases in which the flank measurement is either specified, display. The following readings can be selected for the
or it must be applied for technical reasons, e.g. in many zoomed display (in the second column the indication of
tests using dual-element (TR) probes. the readings in the measurement line):
Sa Sa Sound path for gate A
A Attention: Sb Sb Sound path for gate B
In any case, the adjustment of the measuring point for Sb-a ba Difference of single measurements for
calibration and for the subsequent test use must al- sound path gate B gate A
ways be identical. Otherwise measurement errors may Ha % Ha Echo height gate A in % screen height
occur. Hb % Hb Echo height gate B in % screen height
Select the TOF function. Ha dB ha Echo height gate A in dB
Hb dB hb Echo height gate B in dB
Use the right-hand rotary knob to select the required R-start Rs Range start
setting.
R-end Re Range end
La La Number of legs in gate A
Lb Lb Number of legs in gate B
Lc Lc Number of legs in gate C
Only for flaw position calculation:
Da Da Depth for gate A
All measured values which have also been described Setting the display
for the zoomed display of the function S-DISP are
availabe to you at each position. In the function group LCD, you will find setting options
for the display screen itself and for the echo display.
H Note:
Double assignment of the function FILLED/VGA. Toggle
between the two functions by repeatedly pressing the
corresponding key .
All measured values which have also been described Setting the display
for the zoomed display of the function S-DISP are
availabe to you at each position. In the function group LCD, you will find setting options
for the display screen itself and for the echo display.
H Note:
Double assignment of the function FILLED/VGA. Toggle
between the two functions by repeatedly pressing the
corresponding key .
H Note:
Double assignment of the functions DIALOG/UNIT and
DATE/TIME. Toggle between the two functions by re-
peatedly pressing the corresponding key .
H Note:
Double assignment of the functions DIALOG/UNIT and
DATE/TIME. Toggle between the two functions by re-
peatedly pressing the corresponding key .
meas P1 H Note:
The measured value given at position 1 in the
Please also refer to chapter 6 Documentation.
measurement line
pardump Select the function COPYMOD.
All instrument functions with the current settings
PCX Use the right-hand rotary knob to set the required
Screen contents as a PCX-format file. To transfer the assignment for the key.
data to the PC, you will need a terminal program.
store TIME/DATE (Setting the time and date)
The current instrument setting is stored to the
selected (free) data set, and the data set number You have to check the current date and time and, if
(DAT-#) is automatically increased. required, set them so that these data are correctly
saved together with the test results.
datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
off
The key is deactivated.
special
as setting hardcpy. After printout of the screen
contents no form feed, every press on the key prints
out the next hardcopy on the same page (three or
four hardcopies depending on the printer).
meas P1 H Note:
The measured value given at position 1 in the
Please also refer to chapter 6 Documentation.
measurement line
pardump Select the function COPYMOD.
All instrument functions with the current settings
PCX Use the right-hand rotary knob to set the required
Screen contents as a PCX-format file. To transfer the assignment for the key.
data to the PC, you will need a terminal program.
store TIME/DATE (Setting the time and date)
The current instrument setting is stored to the
selected (free) data set, and the data set number You have to check the current date and time and, if
(DAT-#) is automatically increased. required, set them so that these data are correctly
saved together with the test results.
datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
off
The key is deactivated.
special
as setting hardcpy. After printout of the screen
contents no form feed, every press on the key prints
out the next hardcopy on the same page (three or
four hardcopies depending on the printer).
H Note: ANAMOD
Double assignment of the function DATE/TIME (icon >). You can output results of measurements at the analog
Toggle between the two functions by repeatedly press- output for external further processing. Use the function
ing the corresponding key . ANAMOD to configure the analog output in case there
is no echo in the evaluation gate and the analog voltage
A Attention: has been selected for the sound path at the output.
Always make sure that you are using correctly set You have the following setting options:
time and date values. Otherwise test results might be
corrupted. Be aware that the USM 35X displays the lo volt
year as a two digit number! The analog output supplies 0 volt.
Use the right-hand rotary knob to change the high- Use the right-hand rotary knob to choose the required
lighted value. value.
H Note: ANAMOD
Double assignment of the function DATE/TIME (icon >). You can output results of measurements at the analog
Toggle between the two functions by repeatedly press- output for external further processing. Use the function
ing the corresponding key . ANAMOD to configure the analog output in case there
is no echo in the evaluation gate and the analog voltage
A Attention: has been selected for the sound path at the output.
Always make sure that you are using correctly set You have the following setting options:
time and date values. Otherwise test results might be
corrupted. Be aware that the USM 35X displays the lo volt
year as a two digit number! The analog output supplies 0 volt.
Use the right-hand rotary knob to change the high- Use the right-hand rotary knob to choose the required
lighted value. value.
AWS
H Note:
Rating of welds according to AWS
Error alarms can be triggered unter certain circum-
stances. These are caused by intermediate conditions DAC (only USM 35X DAC and USM 35X S)
in instrument operation occuring when the instrument is Evaluation using the Distance-Amplitude Curve
used, i.e. when function parameters are changed. Pos-
JISDAC (only USM 35X DAC and USM 35X S)
sible alarms occuring during instrument operation
Evaluation using the Distance-Amplitude Curve
(setting of functions) are to be ignored.
according to JIS Z3060-2002
AWS
H Note:
Rating of welds according to AWS
Error alarms can be triggered unter certain circum-
stances. These are caused by intermediate conditions DAC (only USM 35X DAC and USM 35X S)
in instrument operation occuring when the instrument is Evaluation using the Distance-Amplitude Curve
used, i.e. when function parameters are changed. Pos-
JISDAC (only USM 35X DAC and USM 35X S)
sible alarms occuring during instrument operation
Evaluation using the Distance-Amplitude Curve
(setting of functions) are to be ignored.
according to JIS Z3060-2002
5.18 Distance-amplitude curve You will find the functions for the distance-amplitude
curve in the function group DAC. If required, select the
(only USM 35X DAC and setting DAC in the function group EVAMOD first.
USM 35S)
If required, go to the third operating level.
H Note: Select the function group CFG2.
The DAC function is available as a fixed function in the Switch the function EVA-MOD over to the setting
second operating level on the USM 35X DAC. With the DAC.
USM 35X S, the DAC function can be additionally
switched over to DGS evaluation mode. Go to the second operating level.
Due to the angle of the sound beam spread and to the Select the function group DAC.
sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.
Distance-amplitude curve (only USM 35X DAC and USM 35S) Operation
5.18 Distance-amplitude curve You will find the functions for the distance-amplitude
curve in the function group DAC. If required, select the
(only USM 35X DAC and setting DAC in the function group EVAMOD first.
USM 35S)
If required, go to the third operating level.
H Note: Select the function group CFG2.
The DAC function is available as a fixed function in the Switch the function EVA-MOD over to the setting
second operating level on the USM 35X DAC. With the DAC.
USM 35X S, the DAC function can be additionally
switched over to DGS evaluation mode. Go to the second operating level.
Due to the angle of the sound beam spread and to the Select the function group DAC.
sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.
H Note: H Note:
Double assignment of the function T-CORR/OFFSET. No reference echoes can be recorded with
Toggle between the two functions by repeatedly press- DACMODE = TCG. TCG can only be activated if the
ing the corresponding key . reference echoes recorded are situated within a dynam-
ic range of 40 dB. Otherwise an error message is out-
put. If the TCG setting should be nevertheless be used
DACMOD (Activating DAC/TCG) in this case, then the DAC must be reduced (by delet-
You can use this function to activate the DAC. The fol- ing the last reference points) until TCG can be switched
lowing settings are available: on.
Operation Distance-amplitude curve (only USM 35X DAC and USM 35S)
H Note: H Note:
Double assignment of the function T-CORR/OFFSET. No reference echoes can be recorded with
Toggle between the two functions by repeatedly press- DACMODE = TCG. TCG can only be activated if the
ing the corresponding key . reference echoes recorded are situated within a dynam-
ic range of 40 dB. Otherwise an error message is out-
put. If the TCG setting should be nevertheless be used
DACMOD (Activating DAC/TCG) in this case, then the DAC must be reduced (by delet-
You can use this function to activate the DAC. The fol- ing the last reference points) until TCG can be switched
lowing settings are available: on.
DACECHO (Recording reference curve) Press to record the first reference echo. The
instrument gain will automatically change until the
A Attention: DAC echo in gate A reaches 80% screen height
(+/0,3 dB). The function DACECHO is set to 1 to
Before starting to record a reference curve, the instru- indicate that the first reference echo has been
ment must be correctly calibrated (ref. section successfully recorded. Simultaneously the status
5.7 Calibrating the USM 35X). symbol R appears (= reference echo stored).
The moment a new curve is recorded, a possibly al- Peak the next reference echo, and repeat the record-
ready existing curve must be deleted. If necessary, ing process for other curve points. The number in the
make sure that the old curve has been stored in a free function DACECHO is increased by 1 with each
data set before starting to record a new curve! recording.
Select the function DACMOD.
H Note:
Use the right-hand rotary knob to set the function to
DAC. The function DACECHO is set to 0 since there If the message Echo is not valid appears, the refer-
is no previously recorded echo. ence point could not be recorded. Check the gate posi-
tion as well as the height of the reference echo and
Couple the probe to the reference block, and peak repeat the recording.
the first reference echo. Use the left-hand rotary knob
to bring the echo to an amplitude between 70 % and As soon as you have recorded at least two curve refer-
100 % screen height. ence points. Your DAC is already active (please see
previous section). You can record a maximum of
Select the function aSTART, and then move the gate 10 curve reference points.
so that the selected echo is the highest of the echo
sequence within the gate range.
Distance-amplitude curve (only USM 35X DAC and USM 35S) Operation
DACECHO (Recording reference curve) Press to record the first reference echo. The
instrument gain will automatically change until the
A Attention: DAC echo in gate A reaches 80% screen height
(+/0,3 dB). The function DACECHO is set to 1 to
Before starting to record a reference curve, the instru- indicate that the first reference echo has been
ment must be correctly calibrated (ref. section successfully recorded. Simultaneously the status
5.7 Calibrating the USM 35X). symbol R appears (= reference echo stored).
The moment a new curve is recorded, a possibly al- Peak the next reference echo, and repeat the record-
ready existing curve must be deleted. If necessary, ing process for other curve points. The number in the
make sure that the old curve has been stored in a free function DACECHO is increased by 1 with each
data set before starting to record a new curve! recording.
Select the function DACMOD.
H Note:
Use the right-hand rotary knob to set the function to
DAC. The function DACECHO is set to 0 since there If the message Echo is not valid appears, the refer-
is no previously recorded echo. ence point could not be recorded. Check the gate posi-
tion as well as the height of the reference echo and
Couple the probe to the reference block, and peak repeat the recording.
the first reference echo. Use the left-hand rotary knob
to bring the echo to an amplitude between 70 % and As soon as you have recorded at least two curve refer-
100 % screen height. ence points. Your DAC is already active (please see
previous section). You can record a maximum of
Select the function aSTART, and then move the gate 10 curve reference points.
so that the selected echo is the highest of the echo
sequence within the gate range.
Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S)
Distance-amplitude curve (only USM 35X DAC and USM 35S) Operation
Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
DACMOD (Activating DAC according to JIS) Use the right-hand rotary knob to select the DAC
setting.
You can use this function to activate the DAC. The fol-
lowing settings are available: If there is a DAC stored, it will now be active.
off Select the TCG setting.
No DAC is active.
The TCG function is activated so that the DAC
DAC becomes a horizontal recording threshold. This
DAC according to JIS with 6 curves. The first 4 curves means: all reference echoes recorded are brought
are identified with the letters L, M, H and U dedicated (lifted or lowered) to the same echo height.
to these curves, and therefore move with any gain
change.
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) Operation
DACMOD (Activating DAC according to JIS) Use the right-hand rotary knob to select the DAC
setting.
You can use this function to activate the DAC. The fol-
lowing settings are available: If there is a DAC stored, it will now be active.
off Select the TCG setting.
No DAC is active.
The TCG function is activated so that the DAC
DAC becomes a horizontal recording threshold. This
DAC according to JIS with 6 curves. The first 4 curves means: all reference echoes recorded are brought
are identified with the letters L, M, H and U dedicated (lifted or lowered) to the same echo height.
to these curves, and therefore move with any gain
change.
DACECHO (Recording reference curve) Couple the probe to the reference block, and peak
the first reference echo. Use the left-hand rotary knob
A Attention: to bring the echo to an amplitude between 70 % and
100 % screen height.
Before starting to record a reference curve, the instru-
ment must be correctly calibrated (ref. section 5.7 Select the function aSTART, and then move the gate
Calibrating the USM 35X). so that the selected echo is the highest of the echo
sequence within the gate range.
The moment a new curve is recorded, a possibly al-
ready existing curve must be deleted. If necessary, Press to record the first reference echo. The
make sure that the old curve has been stored in a free instrument gain will automatically change until the
data set before starting to record a new curve! DAC echo in gate A reaches 80% screen height
(+/ 0,3 dB). The function DACECHO is set to 1 to
Select the function DACMOD. indicate that the first reference echo has been
successfully recorded. Simultaneously the status
Use the right-hand rotary knob to set the function to
symbol R appears (= reference echo stored).
DAC. The function DACECHO is set to 0 since there
is no previously recorded echo.
H Note:
The dB-value by which the gain has been changed re-
lated to the reference gain can be displayed using the
new parameter DAC dB.
Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
DACECHO (Recording reference curve) Couple the probe to the reference block, and peak
the first reference echo. Use the left-hand rotary knob
A Attention: to bring the echo to an amplitude between 70 % and
100 % screen height.
Before starting to record a reference curve, the instru-
ment must be correctly calibrated (ref. section 5.7 Select the function aSTART, and then move the gate
Calibrating the USM 35X). so that the selected echo is the highest of the echo
sequence within the gate range.
The moment a new curve is recorded, a possibly al-
ready existing curve must be deleted. If necessary, Press to record the first reference echo. The
make sure that the old curve has been stored in a free instrument gain will automatically change until the
data set before starting to record a new curve! DAC echo in gate A reaches 80% screen height
(+/ 0,3 dB). The function DACECHO is set to 1 to
Select the function DACMOD. indicate that the first reference echo has been
successfully recorded. Simultaneously the status
Use the right-hand rotary knob to set the function to
symbol R appears (= reference echo stored).
DAC. The function DACECHO is set to 0 since there
is no previously recorded echo.
H Note:
The dB-value by which the gain has been changed re-
lated to the reference gain can be displayed using the
new parameter DAC dB.
The function DACECHO displays the number 1. Deleting reference points or the complete DAC
You can delete the reference point which was recorded
last in each case, or the complete DAC.
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) Operation
The function DACECHO displays the number 1. Deleting reference points or the complete DAC
You can delete the reference point which was recorded
last in each case, or the complete DAC.
You have to find out the adjustment value for the com- Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB
pensation of transfer losses by experiments. The gain Select the function OFFSET.
is varied accordingly in this connection, the curve line
remains the same. Use the right-hand rotary knob to select the required
setting.
Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
You have to find out the adjustment value for the com- Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB
pensation of transfer losses by experiments. The gain Select the function OFFSET.
is varied accordingly in this connection, the curve line
remains the same. Use the right-hand rotary knob to select the required
setting.
It only applies to the same probe that was used Measuring with DGS
when recording the curve. Not even another probe of
the same type must be used! Using the DGS function (Distance Gain Size), you can
compare the reflecting power of a natural flaw in the
The DAC only apply to the material corresponding to test object with that of a theoretical flaw (circular disk-
the material of the reference block. shaped equivalent reflector) at the same depth.
All functions affecting the echo amplitude must be
set the same way as they were when the curve was A Attention:
recorded. This applies in particular to the following You are comparing the reflecting power of a natural flaw
functions: POWER, FREQU, RECTIFY, MTLVEL and with that of a theoretical flaw. No definite conclusions
REJECT. may be drawn on the natural flaw (roughness, inclined
position, etc.).
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) Operation
It only applies to the same probe that was used Measuring with DGS
when recording the curve. Not even another probe of
the same type must be used! Using the DGS function (Distance Gain Size), you can
compare the reflecting power of a natural flaw in the
The DAC only apply to the material corresponding to test object with that of a theoretical flaw (circular disk-
the material of the reference block. shaped equivalent reflector) at the same depth.
All functions affecting the echo amplitude must be
set the same way as they were when the curve was A Attention:
recorded. This applies in particular to the following You are comparing the reflecting power of a natural flaw
functions: POWER, FREQU, RECTIFY, MTLVEL and with that of a theoretical flaw. No definite conclusions
REJECT. may be drawn on the natural flaw (roughness, inclined
position, etc.).
Distance D between the probe and circular disk- The following probe parameters affect the curve shape:
shaped equivalent reflector
element or crystal diameter
Difference in gain G between various large circular
disk-shaped equivalent reflectors and an infinitely frequency
large backwall delay length
Size S of the circular disk-shaped equivalent reflec-
delay velocity
tor. The influencing variable S always remains
constant for one curve of the set of curves You can adjust these parameters on the USM 35X S in
such a way that you can use the DGS method with
The advantage of the DGS method lies in the fact that
many different probes and on different materials.
you can carry out reproducible evaluations of small
discontinuities. The reproducibility is most of all impor-
tant, for example, whenever you aim to carry out an H Note:
acceptance test. Before setting the DGS function, the instrument must
Apart from the influencing variables already mentioned, first be calibrated because all functions affecting the
there are other factors determining the curve shape: DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
sound attenuation changed after the reference echo has been recorded.
probe.
Distance D between the probe and circular disk- The following probe parameters affect the curve shape:
shaped equivalent reflector
element or crystal diameter
Difference in gain G between various large circular
disk-shaped equivalent reflectors and an infinitely frequency
large backwall delay length
Size S of the circular disk-shaped equivalent reflec-
delay velocity
tor. The influencing variable S always remains
constant for one curve of the set of curves You can adjust these parameters on the USM 35X S in
such a way that you can use the DGS method with
The advantage of the DGS method lies in the fact that
many different probes and on different materials.
you can carry out reproducible evaluations of small
discontinuities. The reproducibility is most of all impor-
tant, for example, whenever you aim to carry out an H Note:
acceptance test. Before setting the DGS function, the instrument must
Apart from the influencing variables already mentioned, first be calibrated because all functions affecting the
there are other factors determining the curve shape: DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
sound attenuation changed after the reference echo has been recorded.
probe.
MB 2 S 3.0 4.5 8 12
MB 4 S 1.5 2.3 15 23
MB 5 S 1.2 1.8 20 30
MB 2 S 3.0 4.5 8 12
MB 4 S 1.5 2.3 15 23
MB 5 S 1.2 1.8 20 30
Documentation 6
H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.
Printing
If you have connected, prepared and activated the
printer, just press the key.
H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.
Printing
If you have connected, prepared and activated the
printer, just press the key.
water,
A Attention:
Do not use any methyl alcohol, solvents, or dye pen-
etrant cleaners!
The plastic parts can be damaged or embrittled by this.
water,
A Attention:
Do not use any methyl alcohol, solvents, or dye pen-
etrant cleaners!
The plastic parts can be damaged or embrittled by this.
after a storage time of 3 months or longer Start by fully discharging the batteries. You can use
the discharging function of the charger for this. For
after frequent partial discharge more details, please read the notes on the operation
of the battery charger.
Charging the batteries The batteries are automatically charged after that.
You can charge the lithium-ion battery either directly in
Charging of exhausted NiCd batteries
the instrument or by means of the external battery
charger DR36 (order number 35 297) recommended by If batteries are exhausted, e.g. after a prolonged stor-
us. You always need an external battery charger to age time in empty state, they often reach their full ca-
charge standard C-cells. In this regard, please pay at- pacity only after repeated discharge/charge cycles.
tention to the information on the operation of the battery
charger.
after a storage time of 3 months or longer Start by fully discharging the batteries. You can use
the discharging function of the charger for this. For
after frequent partial discharge more details, please read the notes on the operation
of the battery charger.
Charging the batteries The batteries are automatically charged after that.
You can charge the lithium-ion battery either directly in
Charging of exhausted NiCd batteries
the instrument or by means of the external battery
charger DR36 (order number 35 297) recommended by If batteries are exhausted, e.g. after a prolonged stor-
us. You always need an external battery charger to age time in empty state, they often reach their full ca-
charge standard C-cells. In this regard, please pay at- pacity only after repeated discharge/charge cycles.
tention to the information on the operation of the battery
charger.
The charger identifies defective batteries. In that case, How to handle alkaline batteries
replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities Please remove the batteries from the instrument if it
so that you will no longer obtain the normal operating has not been operated for a longer time.
time with the instrument in battery operation.
A Attention:
Leaking batteries may cause severe damages to the
instrument! You should always only use leak-proof
batteries and remove them from the instrument after
turning it off.
H Note:
Used batteries are special waste and have to be
disposed of according to legal requirements!
The charger identifies defective batteries. In that case, How to handle alkaline batteries
replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities Please remove the batteries from the instrument if it
so that you will no longer obtain the normal operating has not been operated for a longer time.
time with the instrument in battery operation.
A Attention:
Leaking batteries may cause severe damages to the
instrument! You should always only use leak-proof
batteries and remove them from the instrument after
turning it off.
H Note:
Used batteries are special waste and have to be
disposed of according to legal requirements!
7.3 Maintenance
The USM 35X requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of
authorized Service staff of GE Inspection Technologies.
7.3 Maintenance
The USM 35X requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of
authorized Service staff of GE Inspection Technologies.
7.4 Recycling
7.4 Recycling
Total 2.20
* Materials/components, which cannot be separated into mono materials by destructive mechanical processes
Total 2.20
* Materials/components, which cannot be separated into mono materials by destructive mechanical processes
8.1 Interfaces
The USM 35X presents different interfaces for the con-
nection of external units and for the data exchange. All
interfaces are located at the instrument front. The fol-
lowing figure gives an overview of the position of inter-
faces.
8.1 Interfaces
The USM 35X presents different interfaces for the con-
nection of external units and for the data exchange. All
interfaces are located at the instrument front. The fol-
lowing figure gives an overview of the position of inter-
faces.
3 RS 232
serial interface, 9-way Sub-D socket
4 I/O
analog interface, 8-way LEMO-1-B socket
5 RGB-OUT
VGA interface, 10-way LEMO-1-B socket
6 12V DC
Mains connection socket, 4-way LEMO-0-B socket
3 RS 232
serial interface, 9-way Sub-D socket
4 I/O
analog interface, 8-way LEMO-1-B socket
5 RGB-OUT
VGA interface, 10-way LEMO-1-B socket
6 12V DC
Mains connection socket, 4-way LEMO-0-B socket
H Note:
View of the 8-way LEMO-1-B socket
You are able to externally process the alarm condition
with the alarm output, e.g. for sorting and other control
purposes. Error alarms can be triggered under certain
circumstances. These are caused by intermediate con-
ditions in instrument operation occuring when the in-
strument is used, i.e. when function parameters are
changed. Possible alarms occuring during instru-
ment operation (setting of functions) are to be ig-
nored.
H Note:
View of the 8-way LEMO-1-B socket
You are able to externally process the alarm condition
with the alarm output, e.g. for sorting and other control
purposes. Error alarms can be triggered under certain
circumstances. These are caused by intermediate con-
ditions in instrument operation occuring when the in-
strument is used, i.e. when function parameters are
changed. Possible alarms occuring during instru-
ment operation (setting of functions) are to be ig-
nored.
H Note:
Switch off the instrument before connecting a cable to
the RS 232 socket or before withdrawing any plugs.
H Note:
Switch off the instrument before connecting a cable to
the RS 232 socket or before withdrawing any plugs.
H Note:
For technical reasons it is unfortunately not possible to
maintain a stable synchronisation of both displays if
the VGA output is active. The external signal for the
connected monitor or beamer is entirely synchronised.
A flickering of the internal display has to be accepted
though. The internal display will be synchronous as
soon as the VGA output has been deactivated.
H Note:
For technical reasons it is unfortunately not possible to
maintain a stable synchronisation of both displays if
the VGA output is active. The external signal for the
connected monitor or beamer is entirely synchronised.
A flickering of the internal display has to be accepted
though. The internal display will be synchronous as
soon as the VGA output has been deactivated.
transfer instrument settings in ASCII format, The data transmission parameters are as follows:
transfer reports from stored datasets, Baud rate: 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
transfers Datalogger jobs in ASCII format (option) 38400, and 57600
Word length: 8 data bits (fixed)
read and write datasets in binary format. Parity: none (fixed)
Stop bits: 2 (fixed)
Connecting a printer or a PC The baud rate can be set in the function BAUD-R in
You can connect the USM 35X to a printer or a PC the menu CFG1 from the third operating level.
using the special Krautkramer cables:
The settings on the USM 35X apply to most of the
PC: UD 20 (25-way) or UD 31 (9-way) printers and PCs. To ensure a perfect communication,
Printer: UD 31 (Seiko DPU) or UD 32 (Epson) please check the settings of the connected peripherals
and adjust them to the parameters of the USM 35X.
Please refer to chapter 2.
transfer instrument settings in ASCII format, The data transmission parameters are as follows:
transfer reports from stored datasets, Baud rate: 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
transfers Datalogger jobs in ASCII format (option) 38400, and 57600
Word length: 8 data bits (fixed)
read and write datasets in binary format. Parity: none (fixed)
Stop bits: 2 (fixed)
Connecting a printer or a PC The baud rate can be set in the function BAUD-R in
You can connect the USM 35X to a printer or a PC the menu CFG1 from the third operating level.
using the special Krautkramer cables:
The settings on the USM 35X apply to most of the
PC: UD 20 (25-way) or UD 31 (9-way) printers and PCs. To ensure a perfect communication,
Printer: UD 31 (Seiko DPU) or UD 32 (Epson) please check the settings of the connected peripherals
and adjust them to the parameters of the USM 35X.
Please refer to chapter 2.
To do this, select the printer driver in the function The data transfer is carried out by means of a remote
PRINTER (function group CFG1) and just press the control program and the corresponding remote control
key after having initialized and activated the printer. commands. These commands represent instructions
The data selected by you in the function COPYMOD referring to the individual functions of the USM 35X.
(function group CFG1) are printed. The program Crosstalk can for example be used as
For more details on this, please refer to chapter 6. remote control program under DOS. In Windows based
systems it is possible to use e.g. the Terminal program.
To do this, select the printer driver in the function The data transfer is carried out by means of a remote
PRINTER (function group CFG1) and just press the control program and the corresponding remote control
key after having initialized and activated the printer. commands. These commands represent instructions
The data selected by you in the function COPYMOD referring to the individual functions of the USM 35X.
(function group CFG1) are printed. The program Crosstalk can for example be used as
For more details on this, please refer to chapter 6. remote control program under DOS. In Windows based
systems it is possible to use e.g. the Terminal program.
Entry of a new value or state of a function using the Setting of the display width to 192 mm:
command structure:
<ESC>dw 19200 <RETURN>
<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN> A resolution of 0.1 means:
All values are entered or transmitted by the USM 35X
The USM 35X transmits the value of a function multi-
without a comma or a point. The resolution of the func-
plied by the factor of 10. The entry of a value must be
tion should therefore be observed with all values. The
done multiplied by the factor of 10.
resolution of a function applies to the entire value
range of that function. Example:
A resolution of 0.01 means: Setting of the gain to 51.5 dB
The USM 35X transmits the value of a function multi- <ESC>db 515 <RETURN>
plied by the factor of 100. The entry of a value must be
done multiplied by the factor of 100. A resolution of 1 means:
Entry of a new value or state of a function using the Setting of the display width to 192 mm:
command structure:
<ESC>dw 19200 <RETURN>
<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN> A resolution of 0.1 means:
All values are entered or transmitted by the USM 35X
The USM 35X transmits the value of a function multi-
without a comma or a point. The resolution of the func-
plied by the factor of 10. The entry of a value must be
tion should therefore be observed with all values. The
done multiplied by the factor of 10.
resolution of a function applies to the entire value
range of that function. Example:
A resolution of 0.01 means: Setting of the gain to 51.5 dB
The USM 35X transmits the value of a function multi- <ESC>db 515 <RETURN>
plied by the factor of 100. The entry of a value must be
done multiplied by the factor of 100. A resolution of 1 means:
With:
With:
Transmission timing
As soon as the instrument has received the ESC
command, is will return the * which then will be
displayed on PC screen.
Transmission timing
As soon as the instrument has received the ESC
command, is will return the * which then will be
displayed on PC screen.
Example:
Request RANGE value from the USM 35X
Example:
Request reading at position 2 in the measurement line
Example:
Request RANGE value from the USM 35X
Example:
Request reading at position 2 in the measurement line
Alphanumerical entries
Key in [ESC] DN [Space] Weld inspection B 45/2
[CR] in order to enter the dataset name (DATNAME)
Weld inspection B 45/2. All alphanumerical entries
may have a maximum length of 24 characters. In case
the string length exceeds 24 characters, it will auto-
matically be cut to 24 characters.
Alphanumerical entries
Key in [ESC] DN [Space] Weld inspection B 45/2
[CR] in order to enter the dataset name (DATNAME)
Weld inspection B 45/2. All alphanumerical entries
may have a maximum length of 24 characters. In case
the string length exceeds 24 characters, it will auto-
matically be cut to 24 characters.
Transfer of datasets
A total of 800 datasets (complete instrument setup
including A-scan) can be stored in the instrument. The
stored datasets including the actual setting (dataset # 0)
can be transferred to the PC in compressed binary
format for archiving purposes. If required, the datasets
may be downloaded back to the insturment for re-use
or echo comparison. This bi-directional dataset trans-
fer is part of the software UltraDOC.
Transfer of datasets
A total of 800 datasets (complete instrument setup
including A-scan) can be stored in the instrument. The
stored datasets including the actual setting (dataset # 0)
can be transferred to the PC in compressed binary
format for archiving purposes. If required, the datasets
may be downloaded back to the insturment for re-use
or echo comparison. This bi-directional dataset trans-
fer is part of the software UltraDOC.
Presettings are in bold-face type. You will find a brief aLOGIC AM 0 = off 1
description of all functions in chapter 9.1 Function 1 = pos
2 = neg
directory.
If not otherwise stated, all values refer to steel, AMPLCOR** AC -25 to +25 dB / 0 0.1
C = 5920 m/s. ANAMODE AQ 0 = 0 volt
1 = 5 volts
The functions marked with * are only available in the
USM 35X DAC and USM 35X S (DAC evaluation), the ANGLE PA 0 - 90 / 0 0.1
functions marked with ** are only available in the
USM 35X S (DGS evaluation). A-SCAN AS 0 = stndard 1
1 = compare
Functions which are only availabe in connection with 2 = envelop
the Data Logger option are marked with *** (please 3 = peak b
4 = afreeze
also refer to the section Remote control in chapter
5 = bfreeze
Option Data Logger on this subject). 6 = cfreeze***
aTHRSH AT 10 - 90 % / 40 1
-90 - -10 % additionally with rf
Presettings are in bold-face type. You will find a brief aLOGIC AM 0 = off 1
description of all functions in chapter 9.1 Function 1 = pos
2 = neg
directory.
If not otherwise stated, all values refer to steel, AMPLCOR** AC -25 to +25 dB / 0 0.1
C = 5920 m/s. ANAMODE AQ 0 = 0 volt
1 = 5 volts
The functions marked with * are only available in the
USM 35X DAC and USM 35X S (DAC evaluation), the ANGLE PA 0 - 90 / 0 0.1
functions marked with ** are only available in the
USM 35X S (DGS evaluation). A-SCAN AS 0 = stndard 1
1 = compare
Functions which are only availabe in connection with 2 = envelop
the Data Logger option are marked with *** (please 3 = peak b
4 = afreeze
also refer to the section Remote control in chapter
5 = bfreeze
Option Data Logger on this subject). 6 = cfreeze***
aTHRSH AT 10 - 90 % / 40 1
-90 - -10 % additionally with rf
DGSMENU T5 0 = off
DATE DE numerical input
1 = on
e.g. 26-01-99
DGSMOD** DS 0 = off 1
DATNAME DN alphanumerical input 1 = on
DGSMENU T5 0 = off
DATE DE numerical input
1 = on
e.g. 26-01-99
DGSMOD** DS 0 = off 1
DATNAME DN alphanumerical input 1 = on
HD Editable header data from report transferred as UR Read data set as binary data
ASCII-format data
TF Freeze on/off:
0 = off
1 = on
HD Editable header data from report transferred as UR Read data set as binary data
ASCII-format data
TF Freeze on/off:
0 = off
1 = on
Control codes for the rotary knobs/ Function Key Code Range
function keys
ENTER R off / on
Function Key Code Range
Right-hand K+ increment
rotary knob K- decrement
dB-STEP P 0 = 0.0
1 = 0.5
2 = 1.0
3 = 2.0
4 = 6.0
5 = 6.5 20
FREEZE F off / on
ZOOM Z off / on
COPY C off / on
Control codes for the rotary knobs/ Function Key Code Range
function keys
ENTER R off / on
Function Key Code Range
Right-hand K+ increment
rotary knob K- decrement
dB-STEP P 0 = 0.0
1 = 0.5
2 = 1.0
3 = 2.0
4 = 6.0
5 = 6.5 20
FREEZE F off / on
ZOOM Z off / on
COPY C off / on
BASE 5 MEAS 5
PULS 6 MSEL 6
RECV 7 LCD 7
aGAT 8 CFG1 8
bGAT 9 CFG2 9
CAL 5
Function Key Code
REF/DAC/ 6
DGS/JDAC
first 1
TRIG 7
second 2
MEM 8
third 3
DATA 9
fourth 4
BASE 5 MEAS 5
PULS 6 MSEL 6
RECV 7 LCD 7
aGAT 8 CFG1 8
bGAT 9 CFG2 9
CAL 5
Function Key Code
REF/DAC/ 6
DGS/JDAC
first 1
TRIG 7
second 2
MEM 8
third 3
DATA 9
fourth 4
Appendix 9
COPYMOD CFG1 Assignment of the key DGS-CRV** DGS Recording curve for DGS
evaluation mode
DACECHO* DAC/JDAC Recording of a reference echo
for the DAC DGSMENU** DGS Activating/Deactivating the DGS
menu table for selecting the
DACMODE* DAC/JDAC Activating/Deactivating the DAC probe and further DGS settings
DELALL MEM Deleting all stored data sets DIR DATA Dataset directory
DELETE MEM Deleting a stored data set DUAL PULS Separation of pulser and
receiver
DEL-VEL** DGS Material velocity for probe delay
EVAMOD CFG2 Switchover REF DAC DGS
JDAC
COPYMOD CFG1 Assignment of the key DGS-CRV** DGS Recording curve for DGS
evaluation mode
DACECHO* DAC/JDAC Recording of a reference echo
for the DAC DGSMENU** DGS Activating/Deactivating the DGS
menu table for selecting the
DACMODE* DAC/JDAC Activating/Deactivating the DAC probe and further DGS settings
DELALL MEM Deleting all stored data sets DIR DATA Dataset directory
DELETE MEM Deleting a stored data set DUAL PULS Separation of pulser and
receiver
DEL-VEL** DGS Material velocity for probe delay
EVAMOD CFG2 Switchover REF DAC DGS
JDAC
FILLED LCD Selecting the echo display mode MEAS-P1 MSEL Selection of measured values
(filled or normal) MEAS-P2 at four positions of the
MEAS-P3 measurment line
FINE G RECV Fine adjustment of gain within a MEAS-P4
range of approx. 4 dB in 40 steps
MTLVEL BASE Setting of the material sound
FLAWLEN DATA Flawlength velocity
FREQU RECV Selecting the frequency range OBJECT DATA Object description
for the connected probe
OFFSET* DAC/JDAC Offset for multiple DAC
GAIN left-hand Setting of the gain
rotary knob OPERAT DATA Name of the operator
HORN CFG2 Switching the acoustic alarm P-DELAY BASE Compensating for the probe
signal on/off delay line
INDICA AWS Flaw gain in dB POWER PULS Setting the power of the initial
for AWS evaluation pulse
FILLED LCD Selecting the echo display mode MEAS-P1 MSEL Selection of measured values
(filled or normal) MEAS-P2 at four positions of the
MEAS-P3 measurment line
FINE G RECV Fine adjustment of gain within a MEAS-P4
range of approx. 4 dB in 40 steps
MTLVEL BASE Setting of the material sound
FLAWLEN DATA Flawlength velocity
FREQU RECV Selecting the frequency range OBJECT DATA Object description
for the connected probe
OFFSET* DAC/JDAC Offset for multiple DAC
GAIN left-hand Setting of the gain
rotary knob OPERAT DATA Name of the operator
HORN CFG2 Switching the acoustic alarm P-DELAY BASE Compensating for the probe
signal on/off delay line
INDICA AWS Flaw gain in dB POWER PULS Setting the power of the initial
for AWS evaluation pulse
PRF-MOD PULS Setting the pulse repetition REFRNCE AWS Reference gain in dB
frequency for AWS evaluation
PROBE-#** DGS Probe number REFSIZE** DGS Size of the reference reflector
PRINTER CFG1 Selecting the printer for the test REJECT RECV Suppression of unwanted or
report spurious echo indications
RANGE BASE Setting of the range in which the SCALE LCD Choice of display mode
measurement is made. for the measurement line
RATING AWS Flaw rating as dB value SCHEME LCD Choice of a color scheme for
the screen display
RECALL MEM Retrieving a stored data set
S-DISP MEAS Zoomed display of a selected
RECTIFY RECV Selection of rectification parameter
REFECHO REF For storing a reference echo SET-# MEM Number of the data set
for the measurement of
dB difference SETTING DATA Display of a function list
REFECHO** DGS Type of the reference reflextor S-REF1 CAL Reference echo 1 for calibration
used S-REF2 Reference echo 2 for calibration
REFMOD REF Activation of echo comparison STO-INF DATA Saving the current additional
information
PRF-MOD PULS Setting the pulse repetition REFRNCE AWS Reference gain in dB
frequency for AWS evaluation
PROBE-#** DGS Probe number REFSIZE** DGS Size of the reference reflector
PRINTER CFG1 Selecting the printer for the test REJECT RECV Suppression of unwanted or
report spurious echo indications
RANGE BASE Setting of the range in which the SCALE LCD Choice of display mode
measurement is made. for the measurement line
RATING AWS Flaw rating as dB value SCHEME LCD Choice of a color scheme for
the screen display
RECALL MEM Retrieving a stored data set
S-DISP MEAS Zoomed display of a selected
RECTIFY RECV Selection of rectification parameter
REFECHO REF For storing a reference echo SET-# MEM Number of the data set
for the measurement of
dB difference SETTING DATA Display of a function list
REFECHO** DGS Type of the reference reflextor S-REF1 CAL Reference echo 1 for calibration
used S-REF2 Reference echo 2 for calibration
REFMOD REF Activation of echo comparison STO-INF DATA Saving the current additional
information
STORE MEM Saving the data set X-VALUE TRIG Entry of the distance between
probe index (sound exit point)
SURFACE DATA Condition of surface and leading face of the
angle-beam probe
T-CORR* DAC/AVG/ Sensitivity correction, e.g. to
JDAC compensate for transfer losses Y-POS DATA Y-position coordinate
STORE MEM Saving the data set X-VALUE TRIG Entry of the distance between
probe index (sound exit point)
SURFACE DATA Condition of surface and leading face of the
angle-beam probe
T-CORR* DAC/AVG/ Sensitivity correction, e.g. to
JDAC compensate for transfer losses Y-POS DATA Y-position coordinate
EN 61000-6-2: 1997
EN 61000-6-4: 1997.
EN 61010-1: 2001.
EN 61000-6-2: 1997
EN 61000-6-4: 1997.
EN 61010-1: 2001.
9.3 Manufacturer/ If there is anything special that you would like to know
about the use, handling, operation and specifications of
Service addresses the instruments, please contact your nearest GE
Inspection Technologies representative or directly:
The Krautkramer USM 35X is manufactured by:
GE Inspection Technologies GmbH
GE Inspection Technologies GmbH
Robert-Bosch-Str. 3 Service-Center
D 50354 Hrth Robert-Bosch-Str. 3
D 50354 Hrth
Phone +49 (0) 22 33 - 601 111
Fax +49 (0) 22 33 - 601 402 or:
9.3 Manufacturer/ If there is anything special that you would like to know
about the use, handling, operation and specifications of
Service addresses the instruments, please contact your nearest GE
Inspection Technologies representative or directly:
The Krautkramer USM 35X is manufactured by:
GE Inspection Technologies GmbH
GE Inspection Technologies GmbH
Robert-Bosch-Str. 3 Service-Center
D 50354 Hrth Robert-Bosch-Str. 3
D 50354 Hrth
Phone +49 (0) 22 33 - 601 111
Fax +49 (0) 22 33 - 601 402 or:
France USA
Great Britain
GE Inspection Technologies
892 Charter Avenue
Canley
GB Coventry CV4 8AF
France USA
Great Britain
GE Inspection Technologies
892 Charter Avenue
Canley
GB Coventry CV4 8AF
4
33
24
35
25
34
4
33
24
35
25
34
10
11
38
54
2
53
30
3 6
10
11
38
54
2
53
30
3 6
1
21
27
51
20
26
28 7
9
36
52 8
22
29
1
21
27
51
20
26
28 7
9
36
52 8
22
29
9-13
9-13
Appendix
Appendix
9-14 Issue 01, 04/2005 Krautkramer USM 35X
Changes 10
Changes
Index 11
Index
Index
Index
E FREQU
Frequency range ................................................. 5-13
EC declaration .......................................................... 9-7
Frequency range ..................................................... 5-13
Echo display ........................................................... 5-51
Function directory ..................................................... 9-2
Enlarged echo display ......................................... 5-59
Zoom mode ........................................................... 4-3 Function groups ........................................ 4-4, 4-8, 5-3
Enlarged display Functions .................................................................. 4-4
Measurement value .............................................. 4-5 Function directory ................................................. 9-2
Overview ............................................................... 5-2
Errors ........................................................................ 1-3
Setting the functions ............................................. 4-9
Evaluation logic of the gates .................................. 5-15 Special keys ....................................................... 5-59
EVAMOD ................................................................ 5-58
G
F Gain .......................................................................... 5-5
FILLED Fine adjustment .................................................. 5-12
Echo display ....................................................... 5-51 Incrementation ...................................................... 5-5
FINE G (Fine adjustment of gain) ........................... 5-11 Gate setting ............................................................ 5-14
Index
E FREQU
Frequency range ................................................. 5-13
EC declaration .......................................................... 9-7
Frequency range ..................................................... 5-13
Echo display ........................................................... 5-51
Function directory ..................................................... 9-2
Enlarged echo display ......................................... 5-59
Zoom mode ........................................................... 4-3 Function groups ........................................ 4-4, 4-8, 5-3
Enlarged display Functions .................................................................. 4-4
Measurement value .............................................. 4-5 Function directory ................................................. 9-2
Overview ............................................................... 5-2
Errors ........................................................................ 1-3
Setting the functions ............................................. 4-9
Evaluation logic of the gates .................................. 5-15 Special keys ....................................................... 5-59
EVAMOD ................................................................ 5-58
G
F Gain .......................................................................... 5-5
FILLED Fine adjustment .................................................. 5-12
Echo display ....................................................... 5-51 Incrementation ...................................................... 5-5
FINE G (Fine adjustment of gain) ........................... 5-11 Gate setting ............................................................ 5-14
H K
HORN Keys ......................................................................... 4-6
Acoustic alarm .................................................... 5-58 Special keys ....................................................... 5-59
I L
Instrument Language ................................................................ 4-10
Care of the instrument .......................................... 7-2
LCD
Instrument versions .................................................. 1-8 Color scheme ...................................................... 4-14
Intefaces LCD (function group) ............................................... 5-50
RS 232 interface ................................................... 8-6
Lemo socket ............................................................. 8-5
Interface echo ........................................................ 5-15
LIGHT
Interfaces LCD backlight ..................................................... 5-52
I/O interface .......................................................... 8-4
Limits ........................................................................ 1-5
Line ........................................................................... 4-5
J
JDAC (function group) ............................................ 5-66 M
MAGNIFY
Gate spreading ................................................... 5-48
Index
H K
HORN Keys ......................................................................... 4-6
Acoustic alarm .................................................... 5-58 Special keys ....................................................... 5-59
I L
Instrument Language ................................................................ 4-10
Care of the instrument .......................................... 7-2
LCD
Instrument versions .................................................. 1-8 Color scheme ...................................................... 4-14
Intefaces LCD (function group) ............................................... 5-50
RS 232 interface ................................................... 8-6
Lemo socket ............................................................. 8-5
Interface echo ........................................................ 5-15
LIGHT
Interfaces LCD backlight ..................................................... 5-52
I/O interface .......................................................... 8-4
Limits ........................................................................ 1-5
Line ........................................................................... 4-5
J
JDAC (function group) ............................................ 5-66 M
MAGNIFY
Gate spreading ................................................... 5-48
Index
Index
Index
U
Ultrasonic testing ...................................................... 1-3
Z
UNIT Zoom mode .............................................................. 4-3
Units of measurement ......................................... 5-54
Units ....................................................................... 4-11
Index
U
Ultrasonic testing ...................................................... 1-3
Z
UNIT Zoom mode .............................................................. 4-3
Units of measurement ......................................... 5-54
Units ....................................................................... 4-11
USM 35X
USM 35X DAC
USM 35X S
USM 35X
USM 35X DAC
USM 35X S
- - - Spike pulse
Spectrum Picture: 1
Spectrum Picture: 2
Spectrum Picture: 3
Spectrum Picture: 4
Damping - - DUAL = off
342 DAMPING = low
45 DAMPING = high
DUAL = on
1000 DAMPING = low
50 DAMPING = high
Capacity pF - 220 - POWER = low
1000 POWER = high
Pulse Repetition Frequency Hz 20% 4-1000 20%
PRF Mode - - - Manual,
automatically linked
to range in 10 steps
PRF step Hz - 4 - >1,5m
100 <1,5m
Operating Modes - - - Single-,
dual mode
through
Characteristics of Transmitter Pulse - - -
Pulse voltage V -346 -315 -283 1000 Hz
DAMPING = low
POWER = high
- - - Spike pulse
Spectrum Picture: 1
Spectrum Picture: 2
Spectrum Picture: 3
Spectrum Picture: 4
Damping - - DUAL = off
342 DAMPING = low
45 DAMPING = high
DUAL = on
1000 DAMPING = low
50 DAMPING = high
Capacity pF - 220 - POWER = low
1000 POWER = high
Pulse Repetition Frequency Hz 20% 4-1000 20%
PRF Mode - - - Manual,
automatically linked
to range in 10 steps
PRF step Hz - 4 - >1,5m
100 <1,5m
Operating Modes - - - Single-,
dual mode
through
Characteristics of Transmitter Pulse - - -
Pulse voltage V -346 -315 -283 1000 Hz
DAMPING = low
POWER = high