Professional Documents
Culture Documents
Introduction
This Excel workbook provides spreadsheet models for calculating revenues and costs of wafer fabrication.
The intent is to provide the engineering analyst with the means to evaluate the economic impacts of
changes to process and equipment, changes in the timing of when process or equipment are installed and
qualified, changes in the time to ramp up die yield, and changes in manufacturing cycle time. Cash flows
for both expenditures and revenues from fabrication are computed.
At present, the models assume the fabrication line operates a single process technology consisting
of up to 300 major process steps utilizing up to 50 major types of process equipment. The user may
compute costs and revenues for one of two basic cases: (1) wafer start volumes are pre-specified over time,
or (2) equipment counts are pre-specified over time. In case (1), higher equipment efficiencies or reduced
process times result in reduced investment in equipment and facilities to accommodate the pre-specified
wafer starts. Higher yields in this case result in reduced investment costs as well as higher revenues for
the given wafer start volumes. In case (2), higher equipment efficiencies or reduced process times result in
higher wafer throughput for the given equipment set and hence both higher revenues and lower costs per
wafer. Higher yields in this case result in higher die throughput for the given equipment set and both higher
revienues and lower costs per wafer.
The calculation of fab expenses uses an enhanced version of SEMATECH's Cost-Resource Model (CRM).
This model accounts for expenses of fab construction and operation. In order to compute wafer and die costs,
all wafers and die produced over the life of the technology are burdened equally with capital expenses.
Important differences compared to CRM include (1) staffing costs are computed for varying levels of fab
automation, and (2) equipment performance is defined by the user in terms of theoretical throughput
rates and capability for equipment efficiency (CEE), rather than average throughput rates and equipment
availability as is traditionally done using CRM.
The calculation of fab revenues accounts for a user-specified decline of die prices over time. Delays for
fab construction, process development and qualification, equipment installation and qualification, yield ramp,
and manufacturing cycle time depress revenues obtained from the process technology over its life. Our Delay
Cost Model expresses a die cost equivalent to the foregone revenues resulting from delays for process
development and qualification, equipment installation and qualification, factory construction, time to ramp die
yield, and manufacturing cycle time.
These models are explained in detail for the static wafer-starts case in the Competitive Semiconductor
Manufacturing (CSM) Program Report "Understanding Fab Economics", CSM-47, authored by Robert C.
Leachman, John Plummer and Nancy Sato-Misawa. This report may be ordered at
http://euler.berkeley.edu/esrc/csm/csmreports.html
The important mathematical formulas also are displayed below.
This workbook is organized into seven spreadsheets to facilitate data input and visualization of results:
1. The "Introduction" spreadsheet briefly explains these cost models, summarizes the required input data
and provides the formulae used in the calculations.
2. The "Input Data" spreadsheet includes shaded cells where the user defines the parameters in the cost models
that can be modified to simulate different situations. These input parameters include unit costs of equipment,
masks, staff and space; space consumption by equipment and staff; equipment efficiencies and lifetimes;
wafer start rates or tool counts; yields and yield ramp times; process lifetime; factory life; time until process
qualification; total cycle time; initial revenue per die (at start of process development), and rate of revenue decline.
The user must define additional more detailed input parameters for the Expense Model in the "Process Data"
spreadsheet (discussed below).
3. The "Process Data" spreadsheet contains the detailed process data. Input parameters for each step of the
process, including machine type, mask type (if any), theoretical wafer throughput for the step, direct and indirect
material costs for the step, and actual step cycle times (or step batch size and handling time). These factors
should be input in the appropriate shaded cell . The only allowable machine types and mask types are those
appearing in the tables of machine types and mask types appearing on the "Input Data" spreadsheet.
SEMATECH nomenclature for tool types and mask types is used. At present it is not possible to include more
than 300 process steps or more than 50 tool types in the spreadsheet. It is possible to rename the tool types from
the names given in the sample data. Renaming of a tool type is allowed in the "Tool Set" table (any name change
in this list will be automatically updated in the "Expense Cost Calculation" and "Number of tools" spreadsheets).
After modifying tool type names or other input data, be sure to press "control-n" to make the changes take effect.
4. The "Expense Cost Calculation" spreadsheet contains the model that calculates the fab expense per wafer. This
spreadsheet uses the data in the "Input Data" spreadsheet and process data in the '"Process" spreadsheet.
After modifying data in this spreadhseet, press "control-u" to update calculations of required numbers of tools.
Cells shaded in 'blue' provide partial cost totals.
5. The "Total Cost" spreadsheet summarizes the results of cost and revenue calculations. First it presents
a table of cost components (fab expenses) for four possible levels of automation and for two calculation
assumptions (fractional and integer numbers of tools). Below this table is shown the number of die
produced over the life of the factory (TD). This is used to calculate the Expense Cost per die and the
Delay Cost per die which are shown next. Finally, the Total Cost per die (the sum of these two costs) is shown.
6. The "Number of Tools" spreadsheet presents a table of the calculated number of tools per type, for the two
cases (fractional numbers of process tools and integer numbers of tools). It also shows the CEE and OEE factors.
7. The "Personnel Requirements" spreadsheet presents the caculated numbers of each personnel type, for each of
the four alternative automation levels. One table corresponds to the case in which fractional tools are assumed
and the other case corresponds to the assumption of integer tools.
8. The "Phased Capacity" spreadsheet presents the results for each of the capacity phases. The expense related
cost table shows the expense in each phase. The revenue related cost table calculates the fab's real die output
andrevenue over product life. And the tool requirement table shows the number of tools and OEE in each phase.
Automation Levels
We classify automation into two major types, material handling automation (MHA) and information handling
automation (IHA). Possible combinations of information and material handling automation are indicated
as an ordered pair (MHA,IHA) with values as defined below.
Material handling automation refers to wafer and reticle movement, both within processing bays, as well as
between bays. The four possible levels of MHA are as follows.
Information handling automation involves automation of the download of processing instructions and upload
results to/from processing equipment. The four levels of IHA evaluated here are as follows.
Fab expenses are automatically computed for the automation levels (0, 0), (1, 1), (1.5, 1.5) and (2, 2).
At present, capital and maintenance expenses for automation are excluded from cost calculations.
Summary of Sample Input Data
The default values for the input variables considered in the calculation of fab expenses were taken from
SEMATECH's CRM dataset for a 0.25um logic process as well as from data collected by the CSM program.
These default values are summarized below.
* NOTE: The yield learning rate is the fraction of the total yield improvement completed halfway through the ramp.
For example, 0.67 means that 2/3 of the yield improvement is completed in time 0.5 RT.
**NOTE: The discount factor per year indicates how fast the revenue per wafer is decreasing. For example,
if R0=10,000 and the discount factor is 0.25, then the revenue per wafer after one year is 7,500.
Cost Model Formulae
In option 2 (fixed equipment set), the number of process tools of type i, Ni, is pre-specified. In option 1 (fixed wafer
starts), Ni is computed from the given wafer starts as follows:
j1
( W ) ( LY )
1
Ni =
ji
( UPH )
J
(720 )(CEE i )
where W is the given wafer starts per month, LY is the line yield of the process flow, jei denotes that process step j
is performed using equipment type i, UPHj is the theoretical wafers-per-hour processing rate for step j, and CEEi is
the capability for equipment efficiency of tool type i. In the case that the integer tools options is specified,
the expression for Ni is rounded up to an integer.
When time-varying wafer starts and equipment efficiencies are specified by phase under option 1, Ni is computed
each phase. However, the number of process tools of each type is not allowed to decline in subsequent for phases.
In option 1, the number of wafer starts per 30-day month is pre-specified by the user for each phase. In option 2,
the number of wafer starts is calculated from the pre-specified numbers of tools as follows:
W = W max =
i
[
min ( 720 ) ( N i )( CEE i )
ThPT j
ji
]
where ThPTj is the theoretical process time per wafer for step j (i.e., the reciprocal of UPHj).
Fab expense
Fab expenses are calculated in terms of four basic expense pools: process tools, staff, factory space, and materials.
Staffing requirements are assumed to be linear functions of the number of wafer starts and the numbers of process
tools, added to a certain minimum fixed staff. Space requirements also are assumed to be a linear function of the
numbers of the process tools and the number of wafer starts, added to a certain minimum fixed space requirement.
Materials consumption at each process step is assumed to be proportional to wafer throughput of that step. These
linear functions are stored as coefficients in the spreadsheets. Capital expenses for process tools and factory
space are annualized uniformly over pre-specified lifetimes.
where Cei denotes the annualized installation and purchase cost of tool type i, Lei denotes the portion of annual
labor cost that is proportional to the number of tools of type i (per tool), Sei denotes the annualized cost of factory
space per tool of type i, Ni denotes the number of tools of type i, Lw denotes the portion of total labor cost that is
proportional to wafer starts (per wafer start), Mw denotes the total materials and mask costs per wafer start, Sw
denotes the factory space cost per wafer start, Lf denotes the portion of total labor cost that is fixed, and Sf
denotes the portion of total space cost that is fixed. In the case that wafer starts are held constant at rate W per
month, the fab expense per wafer, EPW, is calculated by dividing EPY by 12W.
The total die output over the process life in the case of constant wafer starts is calculated as
TD=
(W )
30 [
Y F H +RT (Y F Y 0 )(1
1
1ebRT
+
1
bRT
)
]
where Y0 is the die yield times line yield at the time of process qualification, YF is the mature die yield times line
yield, H is the process lifetime, RT is the duration from process qualification until mature die yield is attained,
and b is the yield learning rate. The fab expense per die is calculated as the total fab expense over the process
life divided by the total die output.
The ideal revenue realized over the process life is calculated in the case of constant wafer starts as
Y F R0 1eaH
IR= W
30 a
where R0 is the initial selling price for a 100%-yielding wafer, and a is the rate of sales price decline. Considering
the delays for process qualification, yield ramp and manufacturing cycle, the total revenue actually realized over
the process life is
TR=
(
ea VT+CT R0
) (W )
30 [YF
eaRT eaH
a
+ Y0
[1 eaRT
a
+
](
1 ebRT a )[
Y F Y 0 1 eaRT 1 e( a+b) RT
a+b ]]
where VT is the duration until salable wafer starts commence and CT is the manufacturing cycle time.
TDC = IRTR
=R 0
(W ) 1eaH
30 a
{ Y Fe
a (VT +CT )
[Y F
eaRT eaH
a
+ Y0
1 eaRT
a [ ]
)[ ]
Y F Y 0 1 eaRT 1 e a+b) RT
(
(
+ ]}
1 ebRT a a+b
Extension to time-varying wafer starts
The input formats allow the user to specify up to eight phases of process life. Either the wafer starts rate in each
phase is pre-specified (option 1), or the wafer starts rate is calculated from the pre-specified number of tools in
each phase (option 2). To illustrate, suppose the process life is divided into n phases spanning the intervals
[ti-1, ti], i=1, 2, , n, and suppose the wafer starts rate in phase i is aiW, where an = 1.
The summation of the actually realized revenue for all the phases is the total realized revenue. Thus the total delay
cost is calculated as the total realized revenue subtracted from the ideal revenue .
For multi-machine, general inter-arrival distribution and general service time distribution, an easy estimation
of cycle time for each equipment in each step can be done by Heavy-traffic approximation. The formula is
CT = 1+
[ (
1
c 2 2a + 2s
) 2cs 2
s
]
s = (# wafers in one load) / (tool UPH)
(utilizaion ) is taken to be CEE /0 . 9
c is number of machines
For semiconductor equipment with production scheduling, the varances are quite small and the following values
are used:
2s = 2a =0. 1s 2
To the value of CT derived using the above formulae, we add the handling time specified by the user to determine
the total step cycle time.
(This approach is applied only in the case the user does not specify actual step cycle times.)
Input data
Space Costs Life (years) Construction ($) Occupancy cost ($/yr) space/person (sq.ft.)
Direct
Cleanroom 25 3500 175
Non-cleanroom 25 175 50
Indirect
Non-manufacturing 25 175 50 150
* NOTE: The yield learning rate is the fraction of the total yield improvement completed halfway through the yield ramp.
For example, 0.67 means that 2/3 of the yield improvement is completed at time 0.5 RT.
**NOTE: The discount factor per year indicates how fast the revenue per wafer is decreasing.
For example, if R0=10,000 and the discount factor is 0.25, then the revenue per wafer one year after start of process developme
***NOTE: VT is the time when wafers that will be sold are first started, accounting for all delays for process development
and qualification, factory construction, equipment installation and qualification.
NOTE: Time 0 in this table is right after process qualification, i.e., after the duratio
A Phase is a time interval with either a fixed wafer start rate or a fixed eq
Time before and after RT must be placed in different phases.
The last phase is automatically assumed to end at the process life time H.
Calculation Type
ess development
er starts case only Tool CEE and Tool Quantities by Phase of Wafer Starts
DO NOT RESORT THIS TABLE. ALSO, PHASES MUST MATCH THOSE IN THE
Phase Numb 1 2 3 4
Tool Type CEE CEE CEE CEE
CMP_Ins 0.23
CMP_Ins(C) 0.23
CMP_Ins(I) 0.23
CMP_Met 0.23
CVD_Ins 0.64
CVD_Ins(C) 0.64
CVD_Ins(I) 0.64
CVD_Ins_Th 0.64
ualification, i.e., after the duration 'VT'. CVD_Met 0.48
xed wafer start rate or a fixed equipment set. CVD_Met(C) 0.48
in different phases. CVD_MetW 0.48
to end at the process life time H. CVD_MetW(C 0.48
Dry_Etch 0.59
Dry_Etch(A) 0.53
Dry_Etch(C) 0.53
Dry_Etch(I) 0.53
Dry_Etch_Me 0.59
Dry_Strip 0.65
Click to Run Dry_Strip(D) 0.65
Dry_Strip(I) 0.65
Furn_FastRm 0.5
Furn_Nitr 0.5
Furn_OxAn 0.5
Furn_OxAn(I 0.5
Furn_Poly 0.5
Furn_TEOS 0.5
Implant_HiE 0.37
Implant_LoE 0.42
Click to Run Insp_PLY 0.3
Insp_Visual 0.35
Litho_248 0.8
Litho_I 0.8
Litho_Iw 0.8
Meas_CD 0.35
Meas_Film 0.35
Meas_Overla 0.3
PVD_Met 0.51
PVD_Met(C) 0.51
RTP_OxAn(C 0.57
Test 0.39
VP_HF_Clea 0.45
Wet_Bench 0.54
Wet_Bench(I 0.54
Space consumed per tool
tool life Cleanroom(sq.ft.) non-cleanroom(sq.ft.)
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 400 1600
5 280 1120
5 280 1120
5 280 1120
5 240 960
5 240 960
5 240 960
5 240 960
5 240 960
5 240 960
5 1400 5600
5 800 3200
5 120 480
5 120 480
5 500 2000
5 400 1600
5 400 1600
5 120 480
5 120 480
5 120 480
5 500 2000
5 500 2000
5 400 1600
5 120 480
5 320 1280
5 500 2000
5 500 2000
Tool quantities
MUST MATCH THOSE IN THE TABLE AT LEFT.
5 6 7 8 1 2
CEE CEE CEE CEE Tool Type Quantity Quantity
CMP_Ins 1 2
CMP_Ins(C) 5 10
CMP_Ins(I) 1 2
CMP_Met 4 7
CVD_Ins 1 2
CVD_Ins(C) 3 5
CVD_Ins(I) 1 2
CVD_Ins_Thin 1 1
CVD_Met 1 1
CVD_Met(C) 2 3
CVD_MetW 1 1
CVD_MetW(C) 2 3
Dry_Etch 1 2
Dry_Etch(A) 1 2
Dry_Etch(C) 4 7
Dry_Etch(I) 2 4
Dry_Etch_Met 3 5
Dry_Strip 1 1
Dry_Strip(D) 1 1
Dry_Strip(I) 2 3
Furn_FastRmp 3 5
Furn_Nitr 1 2
Furn_OxAn 4 7
Furn_OxAn(I) 1 2
Furn_Poly 1 2
Furn_TEOS 1 2
Implant_HiE 1 1
Implant_LoE 1 2
Insp_PLY 7 13
Insp_Visual 1 1
Litho_248 1 2
Litho_I 3 6
Litho_Iw 3 6
Meas_CD 4 8
Meas_Film 3 6
Meas_Overlay 3 6
PVD_Met 1 1
PVD_Met(C) 3 5
RTP_OxAn(C) 1 2
Test 6 11
VP_HF_Clean 2 3
Wet_Bench 3 6
Wet_Bench(I) 3 5
Fixed eqpt counts case only
3 4 5 6 7 8
Quantity Quantity Quantity Quantity Quantity Quantity
3 3
15 20
3 3
10 13
3 4
8 10
3 3
2 2
2 2
4 5
2 2
4 5
3 3
3 3
11 14
6 7
8 10
2 2
2 2
5 6
7 9
3 3
11 14
3 4
3 3
3 3
2 2
3 4
19 25
1 1
3 4
9 11
9 11
12 15
9 12
9 11
2 2
7 9
3 3
17 22
4 5
9 11
8 10
Input data Macros: To sort by step: ctrl-f
partial cost total To sort by Tool Name: ctrl-r
Please change input data only in the cells shaded this color.
Notes: Make sure that step numbers are distinct consecutive integer numbers. In column J, only use the exact
tool and mask names appearing in the "Input Data" spreadsheet. (For convenience, these are listed at lower left.)
The reciprocal of theoretical process time for each step is entered in column L (Wafers/hour).
There are two options for step cycle time data. One option is to enter actual cycle times in column O, including
all waiting, process and material handling times. The other option is to enter step batch size in column P and step
handling time in column Q, and let the system calculate step cycle times.
If data for Actual CT is entered, it must be entered for every step. If some are left blank, they will be assumed
to be zero. If Actual CT is left blank for ALL steps, then CT will be calculated automatically for all steps based on
queuing analysis of equipment counts and CEE factors and the user input data from columns P and Q. If the total
of step cycle times is different from the "CT TOTAL" entry on the "Input Data" page, then step cycle times will
be automatically re-scaled to be consistent with "CT TOTAL". If "CT TOTAL" is left blank, no re-scaling is performed.
Process ID :250_Al_82
50.85
Integer Tools
tool maintenance
169.49
Personnel Type
Level (0,0) Operator Supervisor
Fixed 273 16
Per wafer s 0.0095 0.00057
Total Numb 510.5 30.25
Total Number of Engineer/Technicians 84.33 178.29 90.15 186.43 92.40 202.32 96.98
206.32 Total Number of Engineer/Technicians 85.05 183.09 90.96 191.14 93.21 206.95 97.88
Rounding up the Number of personnel (fractional tools) Annual Cost per Personnel Type
level (0,0) level ( level (1.5,1.5) level (2,2) Personnel Salary level (0,0) level (1,1) level (1.5,1.5)
511 410 366 285 Operator 60000 30660000 24600000 21960000
31 25 23 17 Supervisor 80000 2480000 2000000 1840000
15 15 15 15 Manager 125000 1875000 1875000 1875000
15 14 13 12 Overhead st 70000 1050000 980000 910000
85 91 93 97 Engineer 125000 10625000 11375000 11625000
179 187 203 207 Technician 70000 12530000 13090000 14210000
Total Direct 45670000 39690000 38010000
Total Indirect 13550000 14230000 14410000
Total Personnel 59220000 53920000 52420000
Rounding up the Number of personnel (integer tools) Annual Cost per Personnel Type
level (0,0) level ( level (1.5,1.5) level (2,2) Personnel Salary level (0,0) level (1,1) level (1.5,1.5)
511 410 366 285 Operator 60000 30660000 24600000 21960000
31 25 23 17 Supervisor 80000 2480000 2000000 1840000
15 15 15 15 Manager 125000 1875000 1875000 1875000
15 14 13 12 Overhead st 70000 1050000 980000 910000
86 91 94 98 Engineer 125000 10750000 11375000 11750000
184 192 207 211 Technician 70000 12880000 13440000 14490000
Total Direct 46020000 40040000 38290000
Total Indirect 13675000 14230000 14535000
Total Personnel 59695000 54270000 52825000
Personnel Cost per wafer
level (0,0) level (1,1) level (1.5,1.5)
Fractional Tools
Direct Personnel 155.34 135.00 129.29
Indirect Personnel 46.09 48.40 49.01
total 201.43 183.40 178.30
Integer Tools
Direct Personnel 156.53 136.19 130.24
Indirect Personnel 46.51 48.40 49.44
total 203.04 184.59 179.68
Space in sq.ft. Non-manufacturing (sq. ft.)
Technicians level (0,0) level (1,1) level (1.5,1 level (2,2)
128 Fixed 15450 16350 17400 18300
26.25 Per wafer 0.34866 0.36183 0.38061 0.39105
Per Tool
0.759418561 CMP_Ins 25.59 25.56 25.15 22.70
5.062790407 CMP_Ins(C) 25.59 25.56 25.15 22.70
0.759418561 CMP_Ins(I) 25.59 25.56 25.15 22.70
3.290813764 CMP_Met 25.59 25.56 25.15 22.70
0.607534849 CVD_Ins 16.54 16.67 16.43 15.10
1.518837122 CVD_Ins(C) 16.54 16.67 16.43 15.10
0.303767424 CVD_Ins(I) 16.54 16.67 16.43 15.10
0.506279041 CVD_Ins_Thin 25.59 25.56 25.15 22.70
0.405023233 CVD_Met 21.07 21.11 20.79 18.90
1.012558081 CVD_Met(C) 21.07 21.11 20.79 18.90
0.405023233 CVD_MetW 21.07 21.11 20.79 18.90
1.012558081 CVD_MetW(C) 21.07 21.11 20.79 18.90
0.455651137 Dry_Etch 19.51 20.01 19.77 18.81
0.455651137 Dry_Etch(A) 19.51 20.01 19.77 18.81
2.126371971 Dry_Etch(C) 19.51 20.01 19.77 18.81
1.063185985 Dry_Etch(I) 19.51 20.01 19.77 18.81
1.518837122 Dry_Etch_Met 19.51 20.01 19.77 18.81
0.202511616 Dry_Strip 12.02 12.23 12.07 11.31
0.202511616 Dry_Strip(D) 12.02 12.23 12.07 11.31
0.607534849 Dry_Strip(I) 12.02 12.23 12.07 11.31
0.911302273 Furn_FastRmp 12.02 12.23 12.07 11.31
0.303767424 Furn_Nitr 12.02 12.23 12.07 11.31
1.417581314 Furn_OxAn 12.02 12.23 12.07 11.31
0.405023233 Furn_OxAn(I) 12.02 12.23 12.07 11.31
0.303767424 Furn_Poly 12.02 12.23 12.07 11.31
0.303767424 Furn_TEOS 12.02 12.23 12.07 11.31
0.506279041 Implant_HiE 34.50 35.58 35.17 33.83
1.215069698 Implant_LoE 39.02 40.02 39.54 37.63
6.328488008 Insp_PLY 28.56 28.90 28.49 26.41
0.506279041 Insp_Visual 51.18 51.11 50.31 45.39
1.012558081 Litho_248 28.56 28.90 28.49 26.41
2.784534724 Litho_I 28.56 28.90 28.49 26.41
2.784534724 Litho_Iw 28.56 28.90 28.49 26.41
2.278255683 Meas_CD 19.51 20.01 19.77 18.81
1.822604546 Meas_Film 19.51 20.01 19.77 18.81
1.670720834 Meas_Overlay 19.51 20.01 19.77 18.81
0.506279041 PVD_Met 25.59 25.56 25.15 22.70
2.278255683 PVD_Met(C) 25.59 25.56 25.15 22.70
0.303767424 RTP_OxAn(C) 12.02 12.23 12.07 11.31
2.227627779 Test 23.89 25.59 25.43 26.15
0.759418561 VP_HF_Clean 19.51 20.01 19.77 18.81
1.670720834 Wet_Bench 19.51 20.01 19.77 18.81
1.518837122 Wet_Bench(I) 19.51 20.01 19.77 18.81
210.35
level (2,2)
17100000
1360000
1875000
840000
12125000
14490000
32950000
14840000
47790000
level (2,2)
17100000
1360000
1875000
840000
12250000
14770000
33230000
14965000
48195000
level (2,2)
112.07
50.48
162.55
113.03
50.90
163.93
Coeff for annual spaNon-manufacturing (sq. ft.) Cleanroom(sq.
non-cleanroom(sq.ft.) Annual Space Cost (fractional Non-manufacturing (sq. ft
level (0,0) level (1,1) level (1.5,1. level (2,2) level (0,0)
Fixed 880650 931950 991800 1043100 Fixed 880650
Per wafer 19.87362 20.62431 21.69477 22.28985 Per wafer 496840.5
Per Tool Per Tool
CMP_Ins 1458.63 1456.75 1433.73 1293.71 126000 91200 CMP_Ins 3639.54
CMP_Ins(C) 1458.63 1456.75 1433.73 1293.71 126000 91200 CMP_Ins(C) 28946.45
CMP_Ins(I) 1458.63 1456.75 1433.73 1293.71 126000 91200 CMP_Ins(I) 3664.83
CMP_Met 1458.63 1456.75 1433.73 1293.71 126000 91200 CMP_Met 18094.67
CVD_Ins 942.87 950.20 936.39 860.84 126000 91200 CVD_Ins 3297.77
CVD_Ins(C) 942.87 950.20 936.39 860.84 126000 91200 CVD_Ins(C) 8732.16
CVD_Ins(I) 942.87 950.20 936.39 860.84 126000 91200 CVD_Ins(I) 1021.84
CVD_Ins_Thin 1458.63 1456.75 1433.73 1293.71 126000 91200 CVD_Ins_Thin 2345.94
CVD_Met 1200.75 1203.48 1185.06 1077.28 126000 91200 CVD_Met 1434.39
CVD_Met(C) 1200.75 1203.48 1185.06 1077.28 126000 91200 CVD_Met(C) 5704.10
CVD_MetW 1200.75 1203.48 1185.06 1077.28 126000 91200 CVD_MetW 1229.39
CVD_MetW(C) 1200.75 1203.48 1185.06 1077.28 126000 91200 CVD_MetW(C) 4888.88
Dry_Etch 1112.10 1140.59 1126.77 1072.39 126000 91200 Dry_Etch 2616.44
Dry_Etch(A) 1112.10 1140.59 1126.77 1072.39 126000 91200 Dry_Etch(A) 2888.42
Dry_Etch(C) 1112.10 1140.59 1126.77 1072.39 126000 91200 Dry_Etch(C) 14956.66
Dry_Etch(I) 1112.10 1140.59 1126.77 1072.39 126000 91200 Dry_Etch(I) 7728.65
Dry_Etch_Met 1112.10 1140.59 1126.77 1072.39 126000 91200 Dry_Etch_Met 10749.81
Dry_Strip 684.99 696.93 687.72 644.41 88200 63840 Dry_Strip 1217.80
Dry_Strip(D) 684.99 696.93 687.72 644.41 88200 63840 Dry_Strip(D) 1355.68
Dry_Strip(I) 684.99 696.93 687.72 644.41 88200 63840 Dry_Strip(I) 3643.66
Furn_FastRmp 684.99 696.93 687.72 644.41 75600 54720 Furn_FastRmp 5696.92
Furn_Nitr 684.99 696.93 687.72 644.41 75600 54720 Furn_Nitr 1585.28
Furn_OxAn 684.99 696.93 687.72 644.41 75600 54720 Furn_OxAn 8970.67
Furn_OxAn(I) 684.99 696.93 687.72 644.41 75600 54720 Furn_OxAn(I) 2700.32
Furn_Poly 684.99 696.93 687.72 644.41 75600 54720 Furn_Poly 1580.20
Furn_TEOS 684.99 696.93 687.72 644.41 75600 54720 Furn_TEOS 1576.71
Implant_HiE 1966.32 2027.90 2004.88 1928.34 441000 319200 Implant_HiE 3681.33
Implant_LoE 2224.20 2281.18 2253.55 2144.77 252000 182400 Implant_LoE 7319.98
Insp_PLY 1627.86 1647.14 1624.11 1505.25 37800 27360 Insp_PLY 40037.69
Insp_Visual 2917.26 2913.51 2867.46 2587.43 37800 27360 Insp_Visual 2877.22
Litho_248 1627.86 1647.14 1624.11 1505.25 157500 114000 Litho_248 5617.91
Litho_I 1627.86 1647.14 1624.11 1505.25 126000 91200 Litho_I 16307.61
Litho_Iw 1627.86 1647.14 1624.11 1505.25 126000 91200 Litho_Iw 17488.42
Meas_CD 1112.10 1140.59 1126.77 1072.39 37800 27360 Meas_CD 16373.88
Meas_Film 1112.10 1140.59 1126.77 1072.39 37800 27360 Meas_Film 13138.92
Meas_Overlay 1112.10 1140.59 1126.77 1072.39 37800 27360 Meas_Overlay 11463.49
PVD_Met 1458.63 1456.75 1433.73 1293.71 157500 114000 PVD_Met 1642.53
PVD_Met(C) 1458.63 1456.75 1433.73 1293.71 157500 114000 PVD_Met(C) 12238.76
RTP_OxAn(C) 684.99 696.93 687.72 644.41 126000 91200 RTP_OxAn(C) 1656.02
Test 1361.91 1458.46 1449.25 1490.58 37800 27360 Test 28643.59
VP_HF_Clean 1112.10 1140.59 1126.77 1072.39 100800 72960 VP_HF_Clean 4843.04
Wet_Bench 1112.10 1140.59 1126.77 1072.39 157500 114000 Wet_Bench 11840.46
Wet_Bench(I) 1112.10 1140.59 1126.77 1072.39 157500 114000 Wet_Bench(I) 10255.96
1809823.19 1891698.77 1936034.63 29026046.91 21009329.19 Total Annual Space C1759851.76 ### 1918403.32
50035376.10 Total Direct
level (1,1) level (1.5,1.5)level (2,2) Space Cost per Waf level (0,0) level (1,1) level (1.5,1.5
Integer tools
170.188354 170.188354 170.188354 Direct Space 185.728163 185.72816 185.728163
6.15586118 6.43434956 6.5851518 Indirect Space 5.98589034 6.2479386 6.52518137
176.344215 176.622704 176.773506 Total Space Cost 191.714054 191.9761 192.253345
Cleanroom(sq.fnon-cleanroom(sq.ft.)
level (2,2)
1043100
557246.25
level (2,2)
185.728163
6.66988317
192.398046
Expense-Related Costs Cost per Wafer Levels of Automation(using fractional tools) Levels of Automation(using Integer tools)
Cost Components level (0,0) level (1,1) level (1.5,1.5) level (2,2) level (0,0) level (1,1) level (1.5,1.5)
Tool Depreciation 601.25 601.25 601.25 601.25 653.76 653.76 653.76
Tool Maintenance 155.88 155.88 155.88 155.88 169.49 169.49 169.49
Tool Leasing 0.00 0.00 0.00 0.00 0.00 0.00 0.00
Direct Personnel 155.34 135.00 129.29 112.07 156.53 136.19 130.24
Indirect Personnel 46.09 48.40 49.01 50.48 46.51 48.40 49.44
Direct Space 170.19 170.19 170.19 170.19 185.73 185.73 185.73
Indirect Space 5.90 6.16 6.43 6.59 5.99 6.25 6.53
Direct Material 200.00 200.00 200.00 200.00 200.00 200.00 200.00
Indirect Material 0.00 0.00 0.00 0.00 0.00 0.00 0.00
Cost Centers 0.00 0.00 0.00 0.00 0.00 0.00 0.00
Facilities 0.00 0.00 0.00 0.00 0.00 0.00 0.00
CIM System 0.00 0.00 0.00 0.00 0.00 0.00 0.00
Control Units 0.00 0.00 0.00 0.00 0.00 0.00 0.00
Total Cost 1334.64 1316.87 1312.05 1296.45 1418.01 1399.82 1395.18
DCPD= 684.62
level (2,2)
1379.58
413874033
1467.49
level (2,2)
2152.11
Tool Requirement
Revenue-Related Costs
2044243016.75 2021488233.39
enue 7555846709.876
y Cost 1236124805.733
420049934.9477 415374294.5317
1483.39 1466.88
2380.38 2363.87